CN218412641U

CN218412641U - Automatic chip test bench

Info

Publication number: CN218412641U
Application number: CN202222569614.4U
Authority: CN
Inventors: 李勇; 刘湘鹏; 刘振华
Original assignee: Shenzhen Juxinli Technology Co ltd
Current assignee: Shenzhen Juxinli Technology Co ltd
Priority date: 2022-09-27
Filing date: 2022-09-27
Publication date: 2023-01-31
Anticipated expiration: 2032-09-27

Abstract

The utility model relates to a chip testing field specifically is a chip automatic test platform. The device comprises a guide post, a slide glass assembly, a guide assembly, a test assembly and a support seat; the guide post is vertically arranged; the slide glass components are uniformly arranged in a plurality of groups in a circular shape and are arranged on the guide post in a sliding manner along the vertical direction; the guide component is provided with a guide channel for the slide glass component to pass through; the testing component is arranged at the top of the guide component; the supporting seat is arranged at the bottom of the guide assembly, and a driving device used for driving the guide columns to rotate so that chips placed on the multiple groups of slide glass assemblies sequentially rotate to the test assembly for testing is arranged on the supporting seat. The utility model discloses thereby can continuity test chip improve efficiency of software testing.

Description

Automatic chip test bench

Technical Field

The utility model relates to a chip test field especially relates to a chip automatic test platform.

Background

After the chips are produced in a large scale, basic functions of the chips need to be tested, such as an electrical performance test, a Hi-pot high voltage impact test, an environmental safety reliability test, an aging life test, a mechanical performance test, a welding performance test and the like, so that unqualified chips are selected, and qualified chips are reserved.

Chinese patent publication No. CN212160007U discloses an automated chip testing device, which includes a testing machine body provided with a sliding slot along a length direction, and a chip mounting seat disposed on the sliding slot and movably connected with the sliding slot; the testing machine body is provided with a feeding port and a detection port which are communicated with the sliding groove along the vertical direction, and the upper end of the detection port is provided with a chip testing seat; the chip mounting seat is connected with the push rod of the stroke air cylinder, the upper end of the chip mounting seat is provided with the lower chip testing seat, the lower chip testing seat is provided with a placing opening for containing a chip to be tested and circumferentially fixing the chip to be tested, when the upper chip testing seat and the lower chip testing seat are covered, the upper chip testing seat is used for testing the chip to be tested, and the scheme aims at achieving the purpose of high-efficiency testing of the chip.

When the scheme is used for testing, the upper chip testing seat and the lower chip testing seat are covered under the action of the cylinder, and the upper chip testing seat can test a chip to be tested, so that the aim of automatic detection is fulfilled. However, the action of the cylinder is intermittent, so that the testing process is intermittent and time-consuming, and the testing efficiency of the scheme is required to be further improved.

SUMMERY OF THE UTILITY MODEL

The utility model discloses the purpose is to the problem that exists among the background art, thereby provides a chip automatic test platform that can continuity test chip improves efficiency of software testing.

The technical scheme of the utility model is that the automatic chip test bench comprises a guide post, a slide glass assembly, a guide assembly, a test assembly and a support seat; the guide post is vertically arranged; the slide glass components are uniformly arranged in a plurality of groups in a circular shape and are arranged on the guide post in a sliding manner along the vertical direction; the guide component is provided with a guide channel for the slide glass component to pass through; the testing component is arranged at the top of the guide component; the supporting seat is arranged at the bottom of the guide assembly, and a driving device used for driving the guide columns to rotate so that chips placed on the multiple groups of slide glass assemblies sequentially rotate to the test assembly for testing is arranged on the supporting seat.

Preferably, the slide glass assembly comprises a chip holder, a connecting rod and a sliding block, wherein two ends of the connecting rod are respectively connected with the chip holder and the sliding block, sliding grooves are formed in the guide post in the vertical direction, the sliding grooves are in the shape of a circular ring and are evenly provided with multiple groups, the sliding grooves correspond to the sliding blocks one to one, the sliding blocks are arranged in the sliding grooves in a sliding mode, and the connecting rod penetrates through a guide channel and is in sliding connection with the guide channel.

Preferably, chip seat upper portion is provided with the standing groove, and standing groove top edge is provided with the chamfer, and the standing groove horizontal outside is the ring shape and is provided with a plurality of breachs that run through.

Preferably, the guide assembly comprises an upper shell, a lower shell and a connecting frame, the upper shell and the lower shell are sequentially distributed from top to bottom, the guide channel is located between the upper shell and the lower shell and is an oval channel obliquely arranged, and two ends of the connecting frame are respectively connected with the upper shell and the lower shell.

Preferably, the test assembly comprises a plurality of test boards, probes, a mounting frame and a test box, the probes are arranged at the bottom of the test boards in an array mode, the test boards are arranged on the mounting frame, the mounting frame and the test box are arranged at the top of the upper shell, the probes are electrically connected with the test box, and the probes are located on one side of the highest point on the inclined guide channel.

Preferably, the supporting seat comprises a base and supporting legs, the driving device is arranged on the base, the driving device is located on the inner side of the lower shell, and the base is arranged on the supporting legs.

Preferably, a control panel is arranged on the base and is in control connection with the driving device, and the test box is electrically connected with the control panel.

Preferably, the driving device comprises a motor and a speed reducer, the output end of the motor is connected with the input end of the speed reducer, and the output end of the speed reducer is connected with the guide column.

Compared with the prior art, the utility model discloses following profitable technological effect has:

the utility model discloses thereby can continuity test chip improve efficiency of software testing. When the chip testing device is used, the driving device continuously drives the guide post to rotate, the chip to be tested is placed on the slide glass assembly, the slide glass assembly gradually moves to the testing assembly and is tested through the testing assembly when the slide glass assembly moves to the testing assembly, after the test is finished, the slide glass assembly is rotated away, the chip which is tested is taken down, and the subsequent classified collection is carried out according to whether the chip is qualified or not. The process of placing the chip, testing the chip and taking the chip is continuous, so that the testing time is saved, and the testing efficiency is effectively improved.

Drawings

FIG. 1 is a schematic structural diagram of an embodiment of the present invention;

fig. 2 is a partial structural sectional view of an embodiment of the present invention;

fig. 3 is an enlarged view of a structure at a in fig. 2.

Reference numerals: 1. a chip holder; 101. a placement groove; 1011. chamfering; 1012. a notch; 2. a connecting rod; 3. a slider; 4. a guide post; 401. a chute; 5. a drive device; 6. a test board; 61. a probe; 7. a mounting frame; 8. a test box; 9. an upper shell; 10. a lower case; 100. a guide channel; 11. a connecting frame; 12. a base; 13. a control panel; 14. and (7) supporting legs.

Detailed Description

Example one

As shown in fig. 1 to fig. 3, the automatic test platform for chips according to the embodiment includes a guide post 4, a slide assembly, a guide assembly, a test assembly, and a support seat; the guide post 4 is vertically arranged; the slide glass components are uniformly arranged in a plurality of groups in a circular ring shape, and are arranged on the guide post 4 in a sliding manner along the vertical direction; the guide component is provided with a guide channel 100 for the slide component to pass through; the testing component is arranged at the top of the guide component; the supporting seat is arranged at the bottom of the guide assembly, and a driving device 5 used for driving the guide posts 4 to rotate so that chips placed on the multiple groups of slide glass assemblies sequentially rotate to the test assembly for testing is arranged on the supporting seat. The driving device 5 comprises a motor and a speed reducer, the output end of the motor is connected with the input end of the speed reducer, and the output end of the speed reducer is connected with the guide post 4, so that the guide post 4 can be driven to rotate continuously along the same direction.

The embodiment can continuously test the chips so as to improve the test efficiency. When the chip testing device is used, the driving device 5 continuously drives the guide post 4 to rotate, a chip to be tested is placed on the slide glass assembly firstly, the slide glass assembly gradually moves to the testing assembly and is tested through the testing assembly when the slide glass assembly moves to the testing assembly, after the test is finished, the slide glass assembly is rotated away, the chip which is tested is taken down, and the subsequent classified collection is carried out according to whether the chip is qualified or not. The process of placing the chip, testing the chip and taking the chip is continuous, so that the testing time is saved, and the testing efficiency is effectively improved.

Example two

As shown in fig. 2-3, compared with the first embodiment, in the first embodiment, the slide glass assembly includes a chip holder 1, a connecting rod 2 and a sliding block 3, two ends of the connecting rod 2 are respectively connected to the chip holder 1 and the sliding block 3, sliding grooves 401 are vertically formed in a guiding column 4, the sliding grooves 401 are uniformly formed in a circular ring shape and are in multiple groups, the sliding grooves 401 correspond to the sliding blocks one to one, the sliding blocks 3 are slidably disposed at the sliding grooves 401, the connecting rod 2 penetrates through the guiding channel 100 and is slidably connected to the guiding channel 100, when the guiding column 4 rotates, the guiding column 4 drives the sliding blocks 3 to slide up and down in the revolution process around the guiding column 4 through the sliding grooves 401, the connecting rod 2 slides at the guiding channel 100 and drives the chip holder 1 to revolve around the guiding column 4, and the chip holder 1 periodically rotates to the testing assembly to test a chip placed at the chip holder 1.

Chip seat 1 upper portion is provided with standing groove 101, and standing groove 101 top edge is provided with chamfer 1011, and standing groove 101 horizontal direction outer end is that the ring shape is provided with a plurality of breach 1012 that run through, and the chip is placed in standing groove 101 department, and the process is conveniently placed to chamfer 1011, and the process is conveniently taken out to breach 1012, and the chip is got and is put the operation and can be manual operation, also can be mechanical operation, for example the mechanical hand operation.

EXAMPLE III

As shown in fig. 1-3, compared to the second embodiment, in the second embodiment, the guiding assembly includes an upper shell 9, a lower shell 10 and a connecting frame 11, the upper shell 9 and the lower shell 10 are sequentially distributed from top to bottom, the guiding channel 100 is located between the upper shell 9 and the lower shell 10, the guiding channel 100 is an inclined oval channel, two ends of the connecting frame 11 are respectively connected with the upper shell 9 and the lower shell 10, the connecting rods 2 can periodically slide along the inclined oval channel, and the height of the connecting rods 2 periodically changes, but the horizontal state of the chip holders 1 can be maintained.

The test assembly comprises a test board 6, a probe 61, a mounting rack 7 and a test box 8, the probe 61 is arranged at the bottom of the test board 6 in an array mode, the test board 6 is arranged on the mounting rack 7, the mounting rack 7 and the test box 8 are arranged at the top of an upper shell 9, the probe 61 is electrically connected with the test box 8, and the probe 61 is located on one side of the highest point on the inclined guide channel 100. When connecting rod 2 removed the peak to guide way 100, chip holder 1 position was highest, and the chip on the chip holder 1 removed to the highest position, and probe 61 contacts with the pin on the chip, realizes the test to the chip to with test data transmission to test box 8, test box 8 processing data and output test result, along with connecting rod 2's continuation rotation, the chip can break away from the contact with probe 61 at once after the test finishes.

The supporting seat comprises a base 12 and supporting legs 14, the driving device 5 is arranged on the base 12, the driving device 5 is arranged on the inner side of the lower shell 10, the overall structure is tidier, and the base 12 is arranged on the supporting legs 14.

A control panel 13 is arranged on the base 12, the control panel 13 is in control connection with the driving device 5, the test box 8 is electrically connected with the control panel 13, and the test box 8 transmits a test result of whether the chip is qualified to the control panel 13.

The embodiments of the present invention have been described in detail with reference to the drawings, but the present invention is not limited thereto, and various changes can be made without departing from the gist of the present invention within the knowledge of those skilled in the art.

Claims

1. An automatic test bench for chips, comprising:

a guide post (4) vertically disposed;

the slide glass components are uniformly arranged in a plurality of groups in a circular ring shape and are arranged on the guide post (4) in a sliding manner along the vertical direction;

a guide assembly having a guide channel (100) therethrough for the slide assembly to pass through;

the testing assembly is arranged on the top of the guide assembly;

and the supporting seat is arranged at the bottom of the guide assembly, and is provided with a driving device (5) for driving the guide columns (4) to rotate so as to enable the chips placed on the multiple groups of slide glass assemblies to sequentially rotate to the test assembly for testing.

2. The automatic chip test bench according to claim 1, wherein the slide glass assembly comprises a chip holder (1), a connecting rod (2) and a sliding block (3), two ends of the connecting rod (2) are respectively connected with the chip holder (1) and the sliding block (3), sliding grooves (401) are vertically arranged on the guide posts (4), the sliding grooves (401) are uniformly arranged in a plurality of groups in a circular shape, the sliding grooves (401) correspond to the sliding blocks one to one, the sliding blocks (3) are slidably arranged at the sliding grooves (401), and the connecting rod (2) penetrates through the guide channel (100) and is slidably connected with the guide channel (100).

3. The automatic chip testing table according to claim 2, wherein a placing groove (101) is formed in the upper portion of the chip base (1), a chamfer (1011) is formed at the top edge of the placing groove (101), and a plurality of through notches (1012) are formed in the outer end of the placing groove (101) in the horizontal direction in a circular ring shape.

4. The automatic chip test bench according to claim 2, wherein the guiding assembly comprises an upper shell (9), a lower shell (10) and a connecting frame (11), the upper shell (9) and the lower shell (10) are sequentially distributed from top to bottom, the guiding channel (100) is located between the upper shell (9) and the lower shell (10), the guiding channel (100) is an oval channel which is obliquely arranged, and two ends of the connecting frame (11) are respectively connected with the upper shell (9) and the lower shell (10).

5. The automatic chip test bench according to claim 4, wherein the test assembly comprises a plurality of test boards (6), a plurality of probes (61), a mounting rack (7) and a plurality of test boxes (8), the probes (61) are arrayed at the bottom of the test boards (6), the test boards (6) are arranged on the mounting rack (7), the mounting rack (7) and the test boxes (8) are both arranged at the top of the upper shell (9), the probes (61) are electrically connected with the test boxes (8), and the probes (61) are located on one side of the highest point on the inclined guide channel (100).

6. An automatic test bench for chips according to claim 4 characterized in that the supporting base comprises a base (12) and legs (14), the driving device (5) is disposed on the base (12), the driving device (5) is located inside the lower casing (10), and the base (12) is disposed on the legs (14).

7. An automatic test bench of chip according to claim 6, characterized in that the base (12) is provided with a control panel (13), the control panel (13) is in control connection with the driving device (5), and the test box (8) is electrically connected with the control panel (13).

8. An automatic chip test bench according to claim 1, wherein the driving device (5) comprises a motor and a speed reducer, the output end of the motor is connected with the input end of the speed reducer, and the output end of the speed reducer is connected with the guide post (4).