CN218298448U - Precision chip testing seat - Google Patents
Precision chip testing seat Download PDFInfo
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- CN218298448U CN218298448U CN202222722315.XU CN202222722315U CN218298448U CN 218298448 U CN218298448 U CN 218298448U CN 202222722315 U CN202222722315 U CN 202222722315U CN 218298448 U CN218298448 U CN 218298448U
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- roof
- spring
- test seat
- chip
- slide bar
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Abstract
The utility model belongs to the technical field of chip test seat technique and specifically relates to an accurate chip test seat, including test seat and roof, the top of test seat is rotated with the roof through the round pin axle and is linked to each other, the top of roof links to each other with the bracing piece is fixed, the middle part of roof slides with the clamp plate and links to each other, the inside of clamp plate is fixed with the one end of third spring and links to each other. Through pressing the slide bar downwards, the slide bar drives the friction block and the laminating of bracing piece contact, the slide bar drives first spring compression along the sleeve simultaneously, then rotate the slide bar, the slide bar drives the telescopic rotation, the sleeve drives the eccentric wheel through bevel gear group and rotates, the eccentric wheel drives the clamp plate and moves down, the clamp plate moves down along the roof, the accurate chip of clamp plate downward extrusion, thereby realize fixing the accurate chip, prevent that the accurate chip from appearing the condition that the contact is not in place easily with the probe of test seat, thereby improved the precision chip test effect.
Description
Technical Field
The utility model relates to a chip test seat technical field specifically is an accurate chip test seat.
Background
The chip test socket is a standard test equipment for testing the electrical performance and electrical connection of IC devices to check for manufacturing defects and poor components.
For example, patent No. CN211478392U, although a chip test socket can be used in combination with multiple test sockets, the test efficiency is high, in the use process of the precision chip test socket in the above documents, the air cylinder is used in cooperation with the air control suction pen to perform adsorption and transportation of the test chip, and the test chip is placed in the limit hole of the test socket.
SUMMERY OF THE UTILITY MODEL
The utility model aims at solving prior art because precision chip appears contacting the problem that the error appears easily in precision chip test equipment to precision chip test in-process through the test seat in the probe with the test seat easily and the precision chip test seat that proposes.
In order to achieve the above object, the utility model provides a following technical scheme:
the utility model provides a precision chip test seat, includes test seat and roof, the top of test seat rotates with the roof through the round pin axle and links to each other, the top of roof links to each other with the bracing piece is fixed, the middle part of roof slides with the clamp plate and links to each other, the inside of clamp plate is fixed with the one end of third spring and is linked to each other, and is a plurality of the other end of third spring links to each other with the roof is fixed, the inside of test seat links to each other with a plurality of probe needles down are fixed, the outside processing of test seat has a plurality of screw holes, the bottom of bracing piece is equipped with hold-down mechanism.
Preferably, the pressing mechanism comprises an eccentric wheel, the rear end of a shaft body of the eccentric wheel is rotationally connected with the supporting rod, the front end of the eccentric wheel is rotationally connected with the sleeve through a bevel gear set, the top of the sleeve is rotationally connected with the supporting rod, the inside of the sleeve is slidably connected with the sliding rod, the bottom end of the sliding rod is fixedly connected with one end of the first spring, the other end of the first spring is fixedly connected with the sleeve, the top of the sliding rod is fixedly connected with the friction block, and the top end of the friction block is tightly attached to the supporting rod.
Preferably, the bevel gear set is formed by meshing two bevel gears, one bevel gear is fixedly connected with the eccentric wheel fixing connecting rod, and the other bevel gear is fixedly connected with the sleeve.
Preferably, the bottom end of the eccentric wheel is attached to the pressing plate, and the bottom of the pressing plate is attached to the precision chip.
Preferably, the inside of lower probe is fixed with the one end of second spring and links to each other, the other end of second spring and last probe are fixed continuous, the bottom of going up the probe slides with lower probe and links to each other, the top of going up the probe is laminated with accurate chip mutually.
The utility model provides a pair of precision chip test seat, beneficial effect lies in: through pressing the slide bar downwards, the slide bar drives the friction block and laminates with the bracing piece contact, the slide bar drives first spring compression along the sleeve simultaneously, then rotate the slide bar, the slide bar drives the sleeve and rotates, the sleeve drives the eccentric wheel through the bevel gear group and rotates, the eccentric wheel drives the clamp plate and moves down, the clamp plate moves down along the roof, the accurate chip of clamp plate downward extrusion, probe drive second spring compresses down on the accurate chip atress extrusion, make the core in probe and the accurate chip closely laminate, then slowly loosen the slide bar, the slide bar receives the elasticity influence of first spring and makes the friction block closely laminate with the bracing piece, thereby realize fixing the accurate chip, prevent that the accurate chip from appearing the condition that the contact is not in place easily at the probe with the test seat, thereby improved the accurate chip test effect.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a schematic view of the structure A in FIG. 1;
FIG. 3 is a schematic view of the structure B in FIG. 1;
fig. 4 is a schematic top view of the structure of fig. 1.
In the figure: 1. the test device comprises a test seat, 2, a top plate, 3, a supporting rod, 4, a pressing mechanism, 4a1, a bevel gear set, 4a2, a first spring, 4a3, a sleeve, 4a4, a sliding rod, 4a5, a friction block, 4a6, an eccentric wheel, 4b1, a rubber pad, 5, a precision chip, 6, an upper probe, 7, a lower probe, 8, a second spring, 9, a pressing plate, 10, a third spring, 11 and a threaded hole.
Detailed Description
The present invention will be further explained with reference to the accompanying drawings:
example 1:
referring to figures 1-4: in the embodiment, a precision chip test seat, including test seat 1 and roof 2, the top of test seat 1 rotates with roof 2 through the round pin axle and links to each other, the bottom left side of roof 2 and the top left side of test seat 1 are fixed with the magnetic block respectively, the magnetic block through both sides realizes the spacing to roof 2 and test seat 1, the top and the bracing piece 3 of roof 2 are fixed continuous, the middle part and the clamp plate 9 of roof 2 slide and link to each other, the inside of clamp plate 9 is fixed continuous with the one end of third spring 10, the elasticity coefficient of third spring 10 can be selected according to the in-service use condition, the other end of a plurality of third springs 10 is fixed continuous with roof 2, the inside and a plurality of lower probes 7 of test seat 1 are fixed continuous, the outside processing of test seat 1 has a plurality of screw holes, the bottom of bracing piece 3 is equipped with hold-down mechanism 4, current precision chip test seat is in the use, utilize air cylinder cooperation gas accuse pen to test the chip and adsorb, put into the spacing hole of test seat, because certain error appears in the core thickness of chip in the course easily in the unfixed test seat, thereby precision chip contact position leads to the easy test chip and the influence of the precision chip appears the test seat, thereby the precision chip.
The pressing mechanism 4 comprises an eccentric wheel 4a6, the rear end of the shaft body of the eccentric wheel 4a6 is rotatably connected with the supporting rod 3, the front end of the eccentric wheel 4a6 is rotatably connected with a sleeve 4a3 through a bevel gear set 4a1, the elastic coefficient of a first spring 4a2 can be selected according to actual use conditions, the top end of a friction block 4a5 is processed to be rough, the friction block 4a5 is rubbed with the contact surface of the supporting rod 3 to prevent the sliding rod 4a4 from rotating, the top end of the sleeve 4a3 is rotatably connected with the supporting rod 3, the inside of the sleeve 4a3 is slidably connected with the sliding rod 4a4, the bottom end of the sliding rod 4a4 is fixedly connected with one end of the first spring 4a2, the top end of the sliding rod 4a4 is slidably connected with the supporting rod 3, a handle is processed at the top end of the sliding rod 4a4, a user can conveniently rotate the sliding rod 4a4 through the handle, the other end of the first spring 4a2 is fixedly connected with the sleeve 4a2, the top end of the sliding rod 4a4 is fixedly connected with the friction block 4a5, and the top end of the friction block 4a5 is tightly attached to the supporting rod 3, the bevel gear group 4a1 is formed by meshing two bevel gears, a sliding rod 4a4 is pressed downwards, the sliding rod 4a4 drives a friction block 4a5 to be contacted and attached with a supporting rod 3, meanwhile, the sliding rod 4a4 drives a first spring 4a2 to be compressed along a sleeve 4a3, a key groove is processed inside the sleeve 4a3, the sliding rod 4a4 drives the sleeve 4a3 to rotate while the sliding rod 4a4 slides, the sleeve 4a3 drives an eccentric wheel to rotate through the bevel gear group 4a1, the eccentric wheel 4a6 drives a pressing plate 9 to move, when the pressing plate 9 moves downwards along a top plate 2, a third spring 10 is driven to stretch, one bevel gear is fixedly connected with the eccentric wheel 4a6, the other bevel gear is fixedly connected with the sleeve 4a2, the bottom end of the eccentric wheel 4a6 is attached with the pressing plate 9, the bottom of the pressing plate 9 is attached with a precision chip 5, the inside of a lower probe 7 is fixedly connected with one end of a second spring 8, the other end of the second spring is fixedly connected with an upper probe 6, and the bottom of the upper probe 6 is slidably connected with the lower probe 7, the top end of the upper probe 6 is attached to the precision chip 5;
the slide bar 4a4 is pressed downwards, the slide bar 4a4 drives the friction block 4a5 to contact and attach with the support rod 3, meanwhile, the slide bar 4a4 drives the first spring 4a2 to compress along the sleeve 4a3, then the slide bar 4a4 is rotated, the slide bar 4a4 drives the sleeve 4a3 to rotate, the sleeve 4a3 drives the eccentric wheel 4a6 to rotate through the bevel gear set 4a1, the eccentric wheel 4a6 drives the pressing plate 9 to move downwards, the pressing plate 9 moves downwards along the top plate 2, the pressing plate 2 presses the precision chip 5 downwards, the precision chip 5 is pressed by force to press the upper probe 6 to drive the second spring 8 to compress downwards, so that the upper probe 6 is tightly attached to a core plate in the precision chip 5, then the slide bar 4a4 is slowly loosened, the slide bar 4a4 is affected by the elastic force of the first spring 4a2, so that the friction block 4a5 is tightly attached to the support rod 3, thereby fixing of the precision chip 5 is realized, and the situation that the precision chip is not in place in contact with the probe of the test seat easily occurs is prevented, thereby improving the precision chip test effect.
The working principle is as follows:
when the precision chip testing seat is used, firstly, a user fixes a testing seat 1 on chip testing equipment through a threaded hole 11 by using a bolt, then a circuit is connected, then the top plate 2 is pulled, so that the top plate 2 rotates along the right side of the testing seat 1, then a cylinder is used for matching with a pneumatic suction pen to carry a testing chip to the inside of the testing seat 1 in an adsorption mode, then the top plate 2 is reset, then the sliding rod 4a4 is pressed downwards, the sliding rod 4a4 drives a friction block 4a5 to be in contact and attached with a supporting rod 3, meanwhile, the sliding rod 4a4 drives a first spring 4a2 to be compressed along a sleeve 4a3, then the sliding rod 4a4 is rotated, the sleeve 4a4 drives the sleeve 4a3 to rotate, the sleeve 4a3 drives an eccentric wheel 4a6 to rotate through a bevel gear set 4a1, the eccentric wheel 4a6 drives a pressing plate 9 to move downwards, the pressing plate 9 moves downwards along the top plate 2, the pressing plate 2 downwards presses the precision chip 5, the precision chip 5 is pressed by an upper probe 6 to drive a second spring 8 to be compressed downwards, so that the upper probe 6 is tightly attached with the core plate 5, then the eccentric wheel 4a4 slowly loosens, the precision chip 4a4 is slowly, the precision chip seat, the precision chip is prevented from being in contact and being in place, and the chip 5, and the precision chip is prevented from being easily, and the chip testing effect of the chip is not being affected by the chip, and the chip is easily, and the chip is prevented from being fixed on the precision testing seat, and the precision testing chip.
Example 2:
referring to figures 1 and 3: in this embodiment, a precision chip testing seat, wherein hold-down mechanism 4 can also include that the top of rubber pad 4b1 is fixed with clamp plate 9 and links to each other, and when rubber pad 4b1 supported tightly with the top of precision chip 5, the elastic characteristic through rubber pad 4b1 makes the rigid contact that has reduced clamp plate 9 and precision chip 5 to play the guard action to precision chip 5.
While the invention has been shown and described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes in form and detail may be made therein without departing from the scope of the appended claims.
Claims (5)
1. The utility model provides a precision chip test seat, includes test seat (1) and roof (2), the top of test seat (1) is rotated with roof (2) through the round pin axle and is linked to each other its characterized in that: the top of roof (2) is fixed continuous with bracing piece (3), the middle part and clamp plate (9) of roof (2) slide continuously, the inside of clamp plate (9) is fixed continuous with the one end of third spring (10), and is a plurality of the other end and the roof (2) of third spring (10) are fixed continuous, the inside and a plurality of lower probe (7) of test seat (1) are fixed continuous, the outside processing of test seat (1) has a plurality of screw holes (11), the bottom of bracing piece (3) is equipped with hold-down mechanism (4).
2. The precision chip testing socket according to claim 1, wherein: hold-down mechanism (4) include eccentric wheel (4 a 6), the axis body rear end and bracing piece (3) rotation of eccentric wheel (4 a 6) link to each other, eccentric wheel (4 a 6) front end passes through bevel gear group (4 a 1) and sleeve (4 a 3) rotation and links to each other, the top and the bracing piece (3) rotation of sleeve (4 a 3) link to each other, the inside and slide bar (4 a 4) of sleeve (4 a 3) slide and link to each other, the bottom of slide bar (4 a 4) is fixed with the one end of first spring (4 a 2) and is linked to each other, the other end and sleeve (4 a 2) of first spring (4 a 2) are fixed and link to each other, the top and the clutch blocks (4 a 5) of slide bar (4 a 4) are fixed and link to each other, the top and the bracing piece (3) of clutch blocks (4 a 5) closely laminate.
3. The precision chip testing socket according to claim 2, wherein: the bevel gear set (4 a 1) is formed by meshing two bevel gears, one bevel gear is fixedly connected with the eccentric wheel (4 a 6) through a connecting rod, and the other bevel gear is fixedly connected with the sleeve (4 a 2).
4. The precision chip testing socket according to claim 2, wherein: the bottom end of the eccentric wheel (4 a 6) is attached to the pressing plate (9), and the bottom of the pressing plate (9) is attached to the precision chip (5).
5. The precision chip testing socket according to claim 1, wherein: the inside of lower probe (7) is fixed continuous with the one end of second spring (8), the other end of second spring is fixed continuous with last probe (6), the bottom of going up probe (6) slides with lower probe (7) and links to each other, the top and the precision chip (5) of going up probe (6) are laminated mutually.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202222722315.XU CN218298448U (en) | 2022-10-17 | 2022-10-17 | Precision chip testing seat |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202222722315.XU CN218298448U (en) | 2022-10-17 | 2022-10-17 | Precision chip testing seat |
Publications (1)
Publication Number | Publication Date |
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CN218298448U true CN218298448U (en) | 2023-01-13 |
Family
ID=84807602
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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CN202222722315.XU Active CN218298448U (en) | 2022-10-17 | 2022-10-17 | Precision chip testing seat |
Country Status (1)
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CN (1) | CN218298448U (en) |
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2022
- 2022-10-17 CN CN202222722315.XU patent/CN218298448U/en active Active
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