CN218036901U - Turnover mechanism of chip testing machine - Google Patents
Turnover mechanism of chip testing machine Download PDFInfo
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- CN218036901U CN218036901U CN202221965239.9U CN202221965239U CN218036901U CN 218036901 U CN218036901 U CN 218036901U CN 202221965239 U CN202221965239 U CN 202221965239U CN 218036901 U CN218036901 U CN 218036901U
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- testing machine
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Abstract
The utility model discloses a tilting mechanism of chip test machine, including supporting base, backup pad and detection mechanism, the top fixed surface who supports the base installs the backup pad, and the bottom fixed surface of backup pad installs detection mechanism, the top fixed surface who supports the base installs the support backplate. The utility model discloses a be provided with stopper and supporting rod, it is spacing to carry out the centre gripping with the chip through two sets of supporting rods, can drive four group's stoppers and rotate, when the stopper receives the extrusion, can contract the inside of advancing the dwang, thereby can make the fixed plate overturn, effectual convenience overturns fast the chip, improve detection efficiency, the device is through being provided with third spring and second horizontal pole, through the elasticity of third spring self, can make the second horizontal pole keep inconsistent with the surface of chip, at this moment, can conveniently clear up the surface of chip through the second horizontal pole, thereby improve the accuracy that the chip detected.
Description
Technical Field
The utility model relates to a chip testing technical field especially relates to a tilting mechanism of chip test machine.
Background
In the production process of the chip, the chip needs to be detected by a chip tester, and due to the unique test method of the chip tester, the chip needs to be turned over and moved in the test process, so that the chip is tested.
When the existing chip testing machine detects a chip, the chip needs to be held by rotating the screw rod, and when the chip needs to be turned over, the screw rod needs to be rotated to turn over the chip, so that the detection time is greatly prolonged, and the detection efficiency is reduced.
To solve the above problem, we propose a flipping mechanism of a chip tester.
SUMMERY OF THE UTILITY MODEL
The utility model aims at solving the defects existing in the prior art and providing a turnover mechanism of a chip testing machine.
In order to realize the purpose, the utility model adopts the following technical scheme:
the turnover mechanism comprises a supporting base, a supporting plate and a detection mechanism, wherein the supporting plate is fixedly mounted on the top surface of the supporting base, the detection mechanism is fixedly mounted at the bottom end of the supporting plate, a supporting guard plate is fixedly mounted on the top surface of the supporting base, a turnover mechanism body is fixedly mounted on the inner side surface of the supporting guard plate, the fixed outer side surface of the fixed plate is fixedly connected with the inner side surface of the supporting guard plate, a fixed sleeve is fixedly connected with the inner side surface of the fixed plate, a rotating rod is inserted into the fixed sleeve through a bearing, the rotating rod is inserted into the upper end and the lower end of the fixed sleeve and symmetrically inserted into the upper end and the lower end of the fixed sleeve and provided with a limiting block, the limiting block is connected with the inner wall of the rotating rod through a first spring, the fixed inner side surface of the rotating rod is fixedly connected with a fixed plate, a fixed rod is inserted into the inner side surface of the fixed plate, a second spring is sleeved at the upper end and the lower end of the fixed rod, a cleaning mechanism is fixedly connected with a third spring, and a clamping rod is sleeved on the bottom end surface of the first cross rod.
Preferably, the surface of the rotating rod is provided with cylindrical grooves corresponding to the first springs in an annular array, and the first springs are inserted into the cylindrical grooves.
Preferably, the limiting block is of a semi-arc structure, the surface of the fixed sleeve is in an annular shape, limiting grooves corresponding to the limiting block are evenly formed in the surface of the fixed sleeve, the limiting block is inserted into the limiting grooves, and the limiting block and the fixed sleeve are connected in a clamping mode.
Preferably, the front and the back of the clamping rod are arc-shaped surfaces from the outer side to the inner side.
Preferably, the fixed plate is provided with two sets of, and the rectangular channel has been seted up to two sets of the inboard surface symmetry of fixed plate, the supporting rod is inserted and is established in the inside of rectangular channel, the supporting rod is sliding connection with the fixed plate.
Preferably, the third springs are provided with two groups, the bottom ends of the two groups of third springs are fixedly connected with the top end surface of the second cross rod, and the top ends of the third springs are fixedly connected with the bottom end surface of the first cross rod.
Preferably, the two sides of the surface of the second cross rod are symmetrically provided with hole grooves corresponding to the connecting rods, the connecting rods are inserted in the hole grooves, the connecting rods are in sliding connection with the second cross rod, and the bottom end surface of the second cross rod is uniformly provided with multiple groups of brushes.
Compared with the prior art, the beneficial effects of the utility model are that:
the device is provided with the limiting blocks and the clamping rods, the chip can be clamped and limited through the two groups of clamping rods, the four groups of limiting blocks can be driven to rotate by rotating the fixed plate, and when the limiting blocks are extruded, the limiting blocks can be contracted into the rotating rod, so that the fixed plate can be turned, the chip can be effectively and conveniently turned quickly, and the detection efficiency is improved;
the device is through being provided with third spring and second horizontal pole, through inserting the chip when establishing the inside of supporting rod, through the elasticity of third spring self, can make the second horizontal pole keep inconsistent with the surface of chip, can conveniently clear up the surface of chip through the second horizontal pole this moment to improve the accuracy that the chip detected.
Drawings
Fig. 1 is a schematic three-dimensional partial cross-sectional view of a turnover mechanism of a chip testing machine according to the present invention;
fig. 2 is a three-dimensional section of the turnover mechanism body of the present invention;
FIG. 3 is a schematic perspective view of the cleaning mechanism of the present invention;
fig. 4 is an enlarged schematic view of the mechanism at a in fig. 2 according to the present invention.
In the figure: 1. a support base; 2. a support plate; 3. a detection mechanism; 4. supporting the guard plate; 5. a turnover mechanism body; 51. fixing the disc; 52. fixing a sleeve; 53. rotating the rod; 54. a limiting block; 55. a first spring; 56. fixing the rod; 57. a second spring; 58. a clamping rod; 59. a fixing plate; 6. a cleaning mechanism; 61. a first cross bar; 62. a connecting rod; 63. a third spring; 64. a second cross bar.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments.
Referring to fig. 1-4, a flip mechanism of a chip testing machine, as can be known with reference to fig. 2 and 3, the flip mechanism includes a support base 1, a support plate 2 and a detection mechanism 3, the top surface of the support base 1 is fixedly provided with the support plate 2, and the bottom surface of the support plate 2 is fixedly provided with the detection mechanism 3, the top surface of the support base 1 is fixedly provided with a support guard plate 4, and the inner side surface of the support guard plate 4 is fixedly provided with a flip body 5, and the inner side surface of the support guard plate 4 is fixedly provided with a fixed sleeve 52, and the inside of the fixed sleeve 52 is inserted with a rotating rod 53 through a bearing, the upper and lower ends of the rotating rod 53 inserted inside the fixed sleeve 52 are symmetrically inserted with stoppers 54, and the stoppers 54 are connected with the inner wall of the rotating rod 53 through a first spring 55, the inner side surface of the rotating rod 53 is fixedly connected with a fixed plate 59, and the inner side surface of the fixed plate 59 is fixedly inserted with a fixed rod 56, the upper and lower ends of the fixed rod 56 are sleeved with second springs 57, and the one ends of the second springs 57 are fixedly connected with clamping rods 58, the top surface of the guard plate 4 is fixedly connected with a cleaning mechanism 6, the top surface of the first spring guard plate 61, and the cleaning mechanism 6, and the bottom surface of the connecting rod 61 is mounted on the bottom surface of the first spring 62, and the second spring 62, and the bottom surface of the third spring guard plate 61, and the bottom surface of the support guard plate 61, and the bottom surface of the third spring 62, and the connecting rod 62 are sleeved with a third spring 62.
Further, as can be known from fig. 2 and 4, cylindrical grooves corresponding to the first springs 55 are uniformly formed in the surface of the rotating rod 53 in an annular array, the first springs 55 are inserted into the cylindrical grooves, and the limiting blocks 54 can freely slide in the cylindrical grooves under the action of the contraction force and the elastic force of the first springs 55, so that the clamping rods 58 can rotate.
Further, as can be known by referring to fig. 2 and 3, the limiting block 54 is of a semi-arc structure, the surface of the fixing sleeve 52 is in an annular shape, and a limiting groove corresponding to the limiting block 54 is uniformly formed in the surface of the fixing sleeve 52, the limiting block 54 is inserted into the limiting groove, the limiting block 54 and the fixing sleeve 52 are connected in a clamping manner, and the fixing sleeve 52 and the limiting block 54 are clamped with each other, so that the clamping rod 58 can be fixed conveniently, and the chip is fixed and detected.
Further, as can be known from fig. 1 and 2, the front and back surfaces of the clamping rods 58 are arc-shaped surfaces from the outside to the inside, and the clamping phenomenon generated in the process of inserting the chip is avoided by the arc-shaped surfaces.
Further, as can be known by referring to fig. 2 and 4, the fixing plates 59 are provided with two sets, the rectangular grooves are symmetrically formed in the inner side surfaces of the two sets of fixing plates 59, the clamping rods 58 are inserted into the rectangular grooves, the clamping rods 58 are slidably connected with the fixing plates 59, and in the using process, the clamping rods 58 slide up and down in the fixing plates 59, so that chips with different thicknesses can be clamped conveniently.
Further, as can be known by referring to fig. 1 and 3, the third springs 63 are provided with two sets, the bottom ends of the two sets of third springs 63 are fixedly connected with the top end surface of the second cross rod 64, the top ends of the third springs 63 are fixedly connected with the bottom end surface of the first cross rod 61, and in the using process, the second cross rod 64 can be reset through the elastic force of the third springs 63, so that the second cross rod 64 can be repeatedly used and is inconsistent with the surface of the chip.
Further, can learn by referring to fig. 3, the corresponding hole groove with connecting rod 62 is seted up to the surface bilateral symmetry of second horizontal pole 64, connecting rod 62 inserts the inside of establishing the hole groove, connecting rod 62 is sliding connection with second horizontal pole 64, the bottom surface of second horizontal pole 64 evenly is provided with the multiunit brush, in the in-process of using, through the spring action of third spring 63 self, it is inconsistent with the surface of chip through the brush that makes second horizontal pole 64 bottom, thereby be convenient for clean the surface of chip, increase the detection accuracy of chip.
The working principle of the utility model is that when using, when needing to detect the chip, it is shown in fig. 1 and fig. 2 to have more, relevant technical personnel insert the chip between two sets of holding rod 58, at this moment, through the elasticity of dead lever 56 self, can make two sets of holding rod 58 and the surface of chip contradict, at this moment, can carry out spacing with the chip, when the chip needs to overturn, through rotating fixed plate 59, can make dwang 53 drive stopper 54 rotate, when stopper 54 receives the extrusion, can contract into the inside of dwang 53, at this moment, can make dwang 53 move in the inside of fixed cover 52, after the upset is accomplished, through the elasticity of first spring 55 self, can make stopper 54 reset, when stopper 54 inserts the inside of fixed cover 52, can carry out spacing with fixed plate 59, thereby can make fixed plate 59 overturn, effectual convenience overturns the chip fast, detection efficiency is improved, simultaneously when inserting the chip, can be according to shown in fig. 3, the table of chip is sensitive with the bottom surface of second horizontal pole 64, the second contact force of connecting rod 62 upwards, simultaneously, the second slides, the surface of the second spring 63, thereby the detection accuracy is improved, the chip is convenient for the chip, the bottom of the detection process of the chip, thereby the wiping process of the bottom of the chip is accurate mutual contact of the brush.
The utility model discloses in, above the mounting means, the connected mode or the mode that sets up of all parts are common mechanical system to the concrete structure, model and the coefficient index of all parts thereof are its from taking the technique, as long as can reach all can implementing of its beneficial effect, so do not add at much and give unnecessary detail.
The above embodiments are preferred embodiments of the present invention, but the embodiments of the present invention are not limited to the above embodiments, and any other changes, modifications, substitutions, combinations, and simplifications which do not depart from the spirit and principle of the present invention should be equivalent replacement modes, and all are included in the scope of the present invention.
In the present invention, unless stated to the contrary, the terms "upper, lower, left, right, front, back, inner, outer, vertical and horizontal" and the like contained in the terms "are used to represent the orientation of the terms in the conventional use state, or are colloquially understood by those skilled in the art, and should not be construed as limiting the terms, meanwhile, the numerical terms" first "," second "and" third "do not represent the specific number and order, but are used for the distinction of names, and the terms" include "," include "or any other variants thereof are intended to cover the non-exclusive inclusion, so that the process, method, article or apparatus including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes the elements inherent to such process, method, article or apparatus.
Claims (7)
1. A turnover mechanism of a chip testing machine comprises a supporting base (1), a supporting plate (2) and a detection mechanism (3), and is characterized in that the supporting plate (2) is fixedly installed on the surface of the top end of the supporting base (1), the detection mechanism (3) is fixedly installed on the surface of the bottom end of the supporting plate (2), a supporting guard plate (4) is fixedly installed on the surface of the top end of the supporting base (1), a turnover mechanism body (5) is fixedly installed on the surface of the inner side of the supporting guard plate (4), the turnover mechanism body (5) comprises a fixed disk (51), the surface of the outer side of the fixed disk (51) is fixedly connected with the surface of the inner side of the supporting guard plate (4), a fixed sleeve (52) is fixedly connected with the surface of the inner side of the fixed disk (51), a rotating rod (53) is inserted in the fixed sleeve (52) through a bearing, limiting blocks (54) are inserted in the upper end and the lower end of the fixed sleeve (52) symmetrically, the limiting blocks (54) are connected with the inner wall of the rotating rod (53) through a first spring (55), a fixed plate (59) is fixedly connected with the surface of the inner side of the fixed plate (53), a fixed plate (59) is inserted in the inner side of the fixed plate (59), and a second spring (57) is inserted in the fixed rod (56), and one end fixed surface that second spring (57) are close to each other is connected with supporting rod (58), the top fixed surface who supports backplate (4) installs clearance mechanism (6), including first horizontal pole (61) of clearance mechanism (6), first horizontal pole (61) fixed mounting is on the top surface who supports backplate (4), the bottom surface symmetry fixedly connected with connecting rod (62) of first horizontal pole (61), and the surface cover of connecting rod (62) is equipped with third spring (63), the bottom fixed surface of third spring (63) is connected with second horizontal pole (64).
2. The turning mechanism of a chip testing machine as claimed in claim 1, wherein the surface of the rotating rod (53) is provided with cylindrical grooves corresponding to the first springs (55) uniformly in an annular array, and the first springs (55) are inserted into the cylindrical grooves.
3. The turning mechanism of a chip testing machine as claimed in claim 1, wherein the limiting block (54) is a semi-arc structure, the surface of the fixing sleeve (52) is formed with a circular limiting groove corresponding to the limiting block (54), the limiting block (54) is inserted into the limiting groove, and the limiting block (54) is connected with the fixing sleeve (52) in a snap-fit manner.
4. The turnover mechanism of a chip testing machine as claimed in claim 1, wherein the front and back surfaces of the holding rod (58) are curved from outside to inside.
5. The turnover mechanism of the chip testing machine as claimed in claim 1, wherein the fixing plates (59) are provided in two sets, the inner side surfaces of the two sets of fixing plates (59) are symmetrically provided with rectangular grooves, the clamping rods (58) are inserted into the rectangular grooves, and the clamping rods (58) are slidably connected with the fixing plates (59).
6. The flipping mechanism of a chip testing machine as claimed in claim 1, wherein there are two sets of the third springs (63), the bottom ends of the two sets of the third springs (63) are fixedly connected to the top end surface of the second cross bar (64), and the top ends of the third springs (63) are fixedly connected to the bottom end surface of the first cross bar (61).
7. The turning mechanism of a chip testing machine as claimed in claim 1, wherein two sides of the surface of the second cross bar (64) are symmetrically provided with holes corresponding to the connecting rods (62), the connecting rods (62) are inserted into the holes, the connecting rods (62) and the second cross bar (64) are slidably connected, and the bottom end surface of the second cross bar (64) is uniformly provided with multiple sets of brushes.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN202221965239.9U CN218036901U (en) | 2022-07-28 | 2022-07-28 | Turnover mechanism of chip testing machine |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN202221965239.9U CN218036901U (en) | 2022-07-28 | 2022-07-28 | Turnover mechanism of chip testing machine |
Publications (1)
Publication Number | Publication Date |
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CN218036901U true CN218036901U (en) | 2022-12-13 |
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CN202221965239.9U Active CN218036901U (en) | 2022-07-28 | 2022-07-28 | Turnover mechanism of chip testing machine |
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CN (1) | CN218036901U (en) |
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2022
- 2022-07-28 CN CN202221965239.9U patent/CN218036901U/en active Active
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