CN218003628U - Cabinet for radio frequency front-end chip ATE (automatic test equipment) volume production test - Google Patents
Cabinet for radio frequency front-end chip ATE (automatic test equipment) volume production test Download PDFInfo
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- CN218003628U CN218003628U CN202220921219.5U CN202220921219U CN218003628U CN 218003628 U CN218003628 U CN 218003628U CN 202220921219 U CN202220921219 U CN 202220921219U CN 218003628 U CN218003628 U CN 218003628U
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Abstract
The utility model discloses a cabinet for the mass production test of radio frequency front end chip ATE, which comprises a cabinet body (1) and a connector arranged on the wall plate of the cabinet body; one end of the connector is positioned at the outer side of the cabinet body wall plate, and the other end of the connector is positioned at the inner side of the cabinet body wall plate. The utility model discloses a rack for radio frequency front end chip ATE volume production test has following beneficial effect: the set height of the cabinet is convenient for a sealing and testing factory to be matched with the erection of a sorting machine, and a testing instrument can be flexibly integrated in the cabinet; all external interfaces of the cabinet adopt an inwards concave design, so that the damage of the interfaces can be avoided during movement, and the front panel can be detached and is adaptive to the mass production test of various chips; the problem of heat dissipation inside the cabinet is optimized, and stability of a test system is guaranteed.
Description
Technical Field
The utility model relates to a chip test field, concretely relates to rack that is used for radio frequency front end chip ATE volume production to test.
Background
Various instruments and cables need be used to radio frequency front end chip when volume production test, guarantees that each item index of chip satisfies the design demand, simultaneously in order to can batch production, need produce the instrument with the help of sorter equivalent, this just involves can carry out convenient and stable connection between chip, test instrument, cable and the sorter, still needs the convenience to remove simultaneously. In addition, the traditional mass production test instrument needs to be placed on a trolley, the instrument is stacked and placed, and the poor stability and the connection cable are easy to touch by an operator to cause connection problems.
Therefore, a cabinet is urgently needed to be designed, various instruments are placed in the cabinet, various interfaces of the instruments are led out through a front panel of the cabinet, and due to the fact that connecting cables between the instruments are arranged inside the cabinet, the connecting cables are not easily influenced by the outside, the connecting stability of the instruments is guaranteed to the maximum degree, and the mobility of the whole set of equipment is considered.
SUMMERY OF THE UTILITY MODEL
The utility model aims at providing a rack that is used for radio frequency front end chip ATE volume production to test.
The utility model provides a cabinet for the radio frequency front end chip ATE volume production test, which comprises a cabinet body (1) and a connector arranged on the wall plate of the cabinet body; one end of the connector is positioned at the outer side of the cabinet body wall plate, and the other end of the connector is positioned at the inner side of the cabinet body wall plate.
The utility model provides a rack for radio frequency front end chip ATE volume production test still is equipped with first layer board (2) and second layer board (3), first layer board (2) and the equal level of second layer board (3) are fixed in the cabinet body (1). The utility model provides a rack for radio frequency front end chip ATE volume production test still includes first crossbeam (7), second crossbeam (9), third crossbeam and fourth crossbeam (14); and two ends of the first cross beam (7), the second cross beam (9), the third cross beam and the fourth cross beam (14) are fixed with the box body. The utility model provides a rack for radio frequency front end chip ATE volume production test still includes first erection column (8), second erection column (10), third erection column and fourth erection column; the first assembling column (8), the second assembling column (10), the third assembling column and the fourth assembling column are arranged at positions close to four corners in the box body; the first assembling column (8) and the second assembling column (10) are fixed with the first cross beam (7) and the second cross beam (9); the third assembling column and the fourth assembling column are fixed with the third cross beam and the fourth cross beam (14); the first assembling column (8), the second assembling column (10), the third assembling column and the fourth assembling column are provided with a plurality of first assembling holes (11) which are uniformly distributed along the length direction of the first assembling column, the second assembling column and the third assembling column. The first supporting plate (2) is fixed on the inner sides of the first assembling column (8), the second assembling column (10), the third assembling column and the fourth assembling column, and the first cross beam (7) and the second cross beam (9) are fixed on the outer sides of the first assembling column (8) and the second assembling column (10); the third cross beam and the fourth cross beam (14) are fixed on the outer sides of the third assembling column and the fourth assembling column; the second supporting plate (3) is positioned at the top of the first supporting plate (2), a first U-shaped flanging edge and a second U-shaped flanging edge are respectively arranged on two sides of the second supporting plate (3), and the cross sections of the second cross beam (9) and the fourth cross beam (14) are U-shaped; the first U-shaped flanging edge and the second U-shaped flanging edge are respectively overlapped on the second cross beam (9) and the fourth cross beam (14). The cabinet for the radio frequency front end chip ATE (automatic test equipment) volume production test further comprises a first line groove plate and a second line groove plate, wherein the first line groove plate and the second line groove plate are L-shaped, and the cabinet body wall plate comprises a first side wall plate and a second side wall plate; the first line slot plate and the second line slot plate are respectively fixed on the inner sides of the first side wall plate and the second side wall plate. The first wire groove plate and the first side wall plate enclose a first wire distributing groove because the first wire groove plate and the second wire groove plate are both L-shaped; the second wiring groove plate and the second side wall plate are enclosed to form a second wiring groove. The cabinet for the radio frequency front end chip ATE mass production test further comprises a PCB circuit board, the cabinet body wall board further comprises a front cabinet door, and the PCB circuit board is arranged on the inner side of the front cabinet door; the connector is fixed with the PCB circuit board and is in circuit connection with the PCB circuit board. The front cabinet door comprises a first front cabinet door (16), a second front cabinet door (17) and a third front cabinet door (18), the first front cabinet door (16) and the second front cabinet door (17) are downward-turning doors, and the PCB comprises a first circuit board and a second circuit board; the first circuit board is fixed on the inner side of the first front cabinet door (16); the second circuit board is fixed on the inner side of the second front cabinet door (17); the peripheries of the first front cabinet door (16) and the second front cabinet door (17) are provided with convex edges (19), and the third front cabinet door (18) is of a flat plate structure; the outer surface of the convex edge (19) is flush with the outer surface of the third front cabinet door (18). The cabinet wall panels further comprise a first rear wall panel (20) and a second rear wall panel (21), the first rear wall panel (20) being located on top of the second rear wall panel (21). The utility model provides a rack for radio frequency front end chip ATE volume production test still is equipped with a shield cover (23), shield cover (23) include U-shaped bent plate (231), top turn over folded plate (232) and bottom turn over folded plate (233), U-shaped bent plate (231), top turn over folded plate (232) and bottom turn over folded plate (233) structure as an organic whole; the U-shaped bent plate (231) is buckled at the inner side of the first rear wall plate (20); the top turnover plate (232) and the bottom turnover plate (233) are fixedly attached to the inner side of the first rear wall plate (20) through screws.
The utility model provides a rack for radio frequency front end chip ATE volume production test has following beneficial technological effect:
1. the set height of the cabinet is convenient for a sealing and testing factory to be matched with the erection of a sorting machine, and a testing instrument can be flexibly integrated in the cabinet;
2. all external interfaces of the cabinet adopt an inwards concave design, so that the damage of the interfaces can be avoided during movement, and the front panel can be detached and is adaptive to the mass production test of various chips;
3. the problem of heat dissipation inside the cabinet is optimized, and stability of a test system is guaranteed.
Drawings
Fig. 1 is a schematic top view of a cabinet for testing the ATE mass production of the rf front-end chip according to an embodiment of the present invention;
fig. 2 is a schematic diagram of an internal structure of a cabinet for testing the ATE mass production of the rf front-end chip according to an embodiment of the present invention;
fig. 3 is a schematic front structural diagram of a cabinet for radio frequency front end chip ATE mass production test according to an embodiment of the present invention;
fig. 4 is a schematic side structural view of a cabinet for testing the ATE mass production of the rf front-end chip according to an embodiment of the present invention;
fig. 5 is a schematic rear structure diagram of a cabinet for testing the ATE mass production of the rf front-end chip according to an embodiment of the present invention;
fig. 6 is a second front cabinet door schematic diagram of the cabinet for testing the ATE mass production of the rf front-end chip.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
As shown in fig. 1 to fig. 6, the cabinet for testing the mass production of the radio frequency front end chip ATE provided in this embodiment includes a cabinet body 1 and a connector disposed on a wall plate of the cabinet body; one end of the connector is located on the outer side of the wall plate of the cabinet body, and the other end of the connector is located on the inner side of the wall plate of the cabinet body. Those skilled in the art can understand that various test instruments for the radio frequency front end chip ATE mass production test can be placed in the cabinet body 1, and the test instruments are electrically connected with the connector in the cabinet body 1 through power cables or data cables; the test fixture passes through power cable or data cable at cabinet body 1 outside with the circuit connection is realized to the connector, alright realize test instrument and test fixture's circuit connection like this, and the radio frequency front end chip is fixed and with test fixture circuit connection, finally realizes test instrument and test chip's circuit connection and signal transmission to realize radio frequency front end chip ATE volume production test.
The rack that is used for radio frequency front end chip ATE volume production test that this embodiment provided still is equipped with the layer board, the layer board level is fixed in cabinet body 1. It will be appreciated by those skilled in the art that the trays divide the space within the cabinet 1 into a plurality of longitudinally arranged chambers, each of which may be used to house test instruments of different heights. Those skilled in the art will appreciate that the number of trays and the height of each chamber may be set according to the number and height of the test instruments.
Preferably, the cabinet for the radio frequency front end chip ATE mass production test provided by the embodiment is provided with a first supporting plate 2 and a second supporting plate 3. Thus, the cabinet 1 is divided into a first chamber 4, a second chamber 5 and a third chamber 6 arranged from top to bottom. It will be appreciated by those skilled in the art that the first chamber 4 may be configured to have a smaller height dimension and the second and third chambers 5, 6 may be configured to have a larger height dimension such that a 2U chassis may be disposed within the first chamber 4 and a 4U chassis may be disposed within the second and third chambers 5, 6.
The cabinet for the ATE mass production test of the rf front-end chip further includes a first beam 7, a second beam 9, a third beam (not shown in the figure), and a fourth beam 14; and two ends of the first cross beam 7, the second cross beam 9, the third cross beam and the fourth cross beam 14 are fixed with the box body. Those skilled in the art can understand that various testing instruments and various accessories arranged in the box body can be fixed with the first cross beam 7, the second cross beam 9, the third cross beam and the fourth cross beam 14, so that the testing instruments and the accessories are stably arranged in the box body, the stability and the accuracy of the test are ensured, and meanwhile, an operator can conveniently maintain the box body.
The cabinet for the ATE mass production test of the rf front-end chip further includes a first mounting column 8, a second mounting column 10, a third mounting column (not shown in the figure), and a fourth mounting column (not shown in the figure); the first assembling column 8, the second assembling column 10, the third assembling column and the fourth assembling column are arranged at positions close to four corners in the box body; the first assembling column 8 and the second assembling column 10 are fixed with the first cross beam 7 and the second cross beam 9; the third assembling column and the fourth assembling column are both fixed with the third cross beam and the fourth cross beam 14. It will be appreciated by those skilled in the art that the provision of the first mounting post 8, the second mounting post 10, the third mounting post and the fourth mounting post may further facilitate the securing of test instruments and accessories within the housing.
The first assembling column 8, the second assembling column 10, the third assembling column and the fourth assembling column are provided with a plurality of first assembling holes 11 which are uniformly distributed along the length direction. As can be understood by those skilled in the art, different testing instruments and accessories can be fixed to the first mounting post 8, the second mounting post 10, the third mounting post or the fourth mounting post through the first mounting holes 11 with different heights according to the height requirement, and the fixing positions of the testing instruments and accessories can be adjusted conveniently.
The first supporting plate 2 is fixed on the inner sides of the first assembling column 8, the second assembling column 10, the third assembling column and the fourth assembling column, and the first cross beam 7 and the second cross beam 9 are fixed on the outer sides of the first assembling column 8 and the second assembling column 10; the third cross beam and the fourth cross beam 14 are fixed on the outer sides of the third assembling column and the fourth assembling column. It will be appreciated by those skilled in the art that, on the one hand, the dimension of the first pallet 2 in the horizontal direction can be set to be larger than the distance between the first mounting post 8 and the second mounting post 10, which can have a larger holding area; on the other hand, this may allow a first clearance 12 between the first pallet 2 and the first beam 7 and a second clearance between the first pallet 2 and the third beam, which first clearance 12 and second clearance may facilitate the passage of cables.
The second supporting plate 3 is positioned at the top of the first supporting plate 2, a first U-shaped flanging edge and a second U-shaped flanging edge are respectively arranged at two sides of the second supporting plate 3, and the cross sections of the second cross beam 9 and the fourth cross beam 14 are U-shaped; the first U-shaped flanging edge and the second U-shaped flanging edge are respectively overlapped on the second cross beam 9 and the fourth cross beam 14. It will be understood by those skilled in the art that the second cross member 9 and the fourth cross member 14 are formed in a U-shape in cross section, and can be buckled with the first U-shaped turned edge and the second U-shaped turned edge, so as to stably fix the second supporting plate 3. Because the second supporting plate 3 is erected on the second cross beam 9 and the fourth cross beam 14 and is not fixed with the first assembling column 8, the second assembling column 10, the third assembling column or the fourth assembling column, the second supporting plate 3 can be set to be smaller in area, so that a space can be flowed out from the position, close to the top, of the inner wall of the box body, and accessories such as a shielding cover 23, a circuit board and a wiring groove can be arranged at the positions.
The rack that is used for radio frequency front end chip ATE volume production test that this embodiment provided still includes radiator fan 13, be equipped with the fan pilot hole on the cabinet body wallboard, radiator fan 13 fix the wallboard inboard and with fan pilot hole assorted position. As can be understood by those skilled in the art, the heat can be dissipated from the cabinet 1, and the temperature of the cabinet 1 at which the test instrument can normally work can be maintained.
The cabinet for the radio frequency front end chip ATE mass production test provided by the embodiment further comprises a first line slot plate and a second line slot plate, wherein the first line slot plate and the second line slot plate are both L-shaped, and the cabinet body wall plate comprises a first side wall plate and a second side wall plate; the first wire groove plate and the second wire groove plate are fixed on the inner sides of the first side wall plate and the second side wall plate respectively. The first wire groove plate and the first side wall plate enclose a first wire distributing groove because the first wire groove plate and the second wire groove plate are both L-shaped; the second wiring groove plate and the second side wall plate are enclosed to form a second wiring groove. Those skilled in the art can understand that the first side wall plate and the second side wall plate are respectively provided with a wiring groove, so that a power cable or a data cable of the tester and the accessories in the cabinet body 1 can be conveniently arranged, and the cable is prevented from being wound in the cabinet body 1 disorderly and is inconvenient to maintain.
The cabinet wall board further comprises a cabinet bottom board 15, and the cabinet bottom board 15 is provided with a plurality of radiating holes which are uniformly distributed. As can be understood by those skilled in the art, the heat dissipation holes formed in the floor can further enhance the heat dissipation performance of the cabinet body 1, and ensure stable operation of the cabinet.
The cabinet for the radio frequency front end chip ATE mass production test further comprises a PCB, the cabinet wall plate further comprises a front cabinet door, and the PCB is arranged on the inner side of the front cabinet door; the connector is fixed with the PCB circuit board and is in circuit connection with the PCB circuit board.
The front cabinet doors comprise a first front cabinet door 16, a second front cabinet door 17 and a third front cabinet door 18, the first front cabinet door 16 and the second front cabinet door 17 are downward-turning doors, and the PCB comprises a first circuit board and a second circuit board; the first circuit board is fixed on the inner side of the first front cabinet door 16; the second circuit board is fixed to the inner side of the second front cabinet door 17. Those skilled in the art will appreciate that the connectors on the first front cabinet door 16 may be provided as SMA connectors and be 48 in number; the connectors on the second front cabinet door 17 can be set to 32 SMA connectors and 8N-shaped rf connectors to match with the ATE mass production test of the rf front-end chip.
The peripheries of the first front cabinet door 16 and the second front cabinet door 17 are provided with convex edges 19, and the third front cabinet door 18 is of a flat plate structure; the outer surface of the ledge 19 is flush with the outer surface of the third front cabinet door 18. Skilled person in the art can understand, because protruding edge 19 has all around of first preceding cabinet door 16 and second preceding cabinet door 17, the position that is used for installing the connector in first preceding cabinet door 16 and the second preceding cabinet door 17 is the indent structure, like this, can avoid the connector to receive outside and collide with to ensure test stability, promote the rack life who is used for radio frequency front end chip ATE volume production test that this embodiment provided, reduce the maintenance cost.
Those skilled in the art can understand that the first front cabinet door 16 and the second front cabinet door 17 can be configured to be a structure convenient for disassembly, so that PCB circuit boards provided with different connectors can be designed according to different test requirements, and the PCB circuit boards are assembled with a plurality of front cabinet doors in advance, so that when tests with different requirements are performed, the assembled front cabinet doors can be conveniently installed on the cabinet body 1. Therefore, the universality of the cabinet provided by the embodiment can be enhanced, the chip testing efficiency is improved, and higher testing cost caused by purchasing or equipping multiple cabinets is avoided.
The cabinet wall panels further comprise a first rear wall panel 20 and a second rear wall panel 21, the first rear wall panel 20 being located on top of the second rear wall panel 21.
The cabinet for testing the mass production of the radio frequency front-end chip ATE provided by the embodiment further comprises a temperature monitor, a leakage protection switch, a power socket, a USB interface, a GPIB connector, a DP connector, a network connector, a power switch and an emergency stop switch; temperature monitor, leakage protection switch, power socket, USB interface, GPIB connector, DP connector, network connector, switch and scram switch all assemble on first back wallboard 20.
The rack that is used for radio frequency front end chip ATE volume production test that this embodiment provided still includes the power that is equipped with binding post 22, the position that wallboard 21 is close to the bottom is equipped with a terminal mounting hole behind the second, binding post 22 is installed in the terminal mounting hole and certainly wallboard 21 inboard stretches out behind the second outside of wallboard 21 behind the second. It will be appreciated by those skilled in the art that external equipment may thus be connected to the power supply via the terminals 22, outside the cabinet.
As will be understood by those skilled in the art, the first rear wall 20 and the second rear wall 21 are fixed by screws and assembling holes, so that the cabinet 1 is easy to disassemble and open from the rear side of the cabinet 1 for maintenance of the test instruments and components therein.
The cabinet for the ATE mass production test of the rf front-end chip provided by this embodiment is provided with a Power Distribution Unit (PDU) Power source, and the PDU Power source is fixed at a position of the first rear wall plate 20 near the top. Those skilled in the art will appreciate that this prevents the PDU power supply from interfering with the test equipment within the cabinet 1.
The cabinet for the radio frequency front end chip ATE mass production test provided by the embodiment is further provided with a shielding cover 23, the shielding cover 23 comprises a U-shaped bending plate 231, a top folding plate 232 and a bottom folding plate 233, and the U-shaped bending plate 231, the top folding plate 232 and the bottom folding plate 233 are of an integrated structure; the U-shaped bending plate 231 is buckled at the inner side of the first rear wall plate 20; the top flap 232 and the bottom flap 233 are fastened and attached to the inner side of the first rear wall panel 20 by screws. Those skilled in the art can understand that the U-shaped bending plate 231 is buckled between the inner side of the first rear wall plate 20 and the first rear wall plate 20 to form a cavity, and the temperature monitor, the leakage protection switch, the power socket, the USB interface, the GPIB connector, the DP connector, the network connector, the power switch and the emergency stop switch are arranged in the cavity, so that the inside of the cabinet body 1 can be kept clean on one hand, and the shielding effect can be achieved on the other hand.
Further, four rollers 24 are arranged at the bottom of the cabinet. Those skilled in the art will appreciate that movement of the cabinet is facilitated.
The height of the cabinet body 1 is 939mm, the length is 600mm, and the width is 700mm. As can be understood by those skilled in the art, the size can be matched with the sorting machine more conveniently and more conveniently, and the testing efficiency is effectively improved.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present invention in its corresponding aspects.
Claims (10)
1. A cabinet for mass production test of radio frequency front end chips ATE is characterized by comprising a cabinet body (1) and a connector arranged on a wall plate of the cabinet body; one end of the connector is positioned at the outer side of the cabinet body wall plate, and the other end of the connector is positioned at the inner side of the cabinet body wall plate.
2. The cabinet for the radio frequency front end chip ATE (automatic test equipment) mass production test as claimed in claim 1, further comprising a first supporting plate (2) and a second supporting plate (3), wherein the first supporting plate (2) and the second supporting plate (3) are both horizontally fixed in the cabinet body (1).
3. The cabinet for mass production testing of radio frequency front end chips ATE of claim 2, further comprising a first beam (7), a second beam (9), a third beam and a fourth beam (14); and the two ends of the first cross beam (7), the second cross beam (9), the third cross beam and the fourth cross beam (14) are fixed with the box body.
4. The cabinet for mass production testing of radio frequency front end chips ATE of claim 3, further comprising a first mounting post (8), a second mounting post (10), a third mounting post and a fourth mounting post; the first assembling column (8), the second assembling column (10), the third assembling column and the fourth assembling column are arranged at positions close to four corners in the box body; the first assembling column (8) and the second assembling column (10) are fixed with the first cross beam (7) and the second cross beam (9); the third assembling column and the fourth assembling column are both fixed with the third cross beam and the fourth cross beam (14); and a plurality of first assembling holes (11) which are uniformly distributed along the length direction of the first assembling column (8), the second assembling column (10), the third assembling column and the fourth assembling column are arranged on the first assembling column and the second assembling column.
5. The cabinet for mass production testing of radio frequency front end chips ATE of claim 4, characterized in that the first pallet (2) is fixed inside the first mounting post (8), the second mounting post (10), the third mounting post and the fourth mounting post, the first beam (7) and the second beam (9) are fixed outside the first mounting post (8) and the second mounting post (10); the third cross beam and the fourth cross beam (14) are fixed on the outer sides of the third assembling column and the fourth assembling column; the second supporting plate (3) is positioned at the top of the first supporting plate (2), a first U-shaped flanging edge and a second U-shaped flanging edge are respectively arranged on two sides of the second supporting plate (3), and the cross sections of the second cross beam (9) and the fourth cross beam (14) are U-shaped; the first U-shaped flanging edge and the second U-shaped flanging edge are respectively overlapped on the second cross beam (9) and the fourth cross beam (14).
6. The cabinet for radio frequency front end chip ATE mass production testing as claimed in claim 5, further comprising a first wire chase plate and a second wire chase plate, wherein the first wire chase plate and the second wire chase plate are L-shaped, and the cabinet wall plates comprise a first side wall plate and a second side wall plate; the first wire groove plate and the second wire groove plate are fixed on the inner sides of the first side wall plate and the second side wall plate respectively.
7. The cabinet for radio frequency front end chip ATE volume production testing as claimed in claim 6, further comprising a PCB circuit board, wherein the cabinet wall board further comprises a front cabinet door, the PCB circuit board is disposed inside the front cabinet door; the connector is fixed with the PCB circuit board and is in circuit connection with the PCB circuit board.
8. The cabinet for ATE (radio frequency front end chip) volume production testing as claimed in claim 7, wherein the front cabinet doors comprise a first front cabinet door (16), a second front cabinet door (17) and a third front cabinet door (18), the first front cabinet door (16) and the second front cabinet door (17) are flip-down doors, the PCB circuit board comprises a first circuit board and a second circuit board; the first circuit board is fixed on the inner side of the first front cabinet door (16); the second circuit board is fixed on the inner side of the second front cabinet door (17); convex edges (19) are arranged on the peripheries of the first front cabinet door (16) and the second front cabinet door (17), and the third front cabinet door (18) is of a flat plate structure; the outer surface of the convex edge (19) is flush with the outer surface of the third front cabinet door (18).
9. The cabinet for radio frequency front end chip ATE mass production testing of claim 8, wherein the cabinet wall further comprises a first back wall (20) and a second back wall (21), the first back wall (20) being located on top of the second back wall (21).
10. The cabinet for ATE (lot test) of rf front-end chips according to claim 9, further comprising a shielding cover (23), wherein the shielding cover (23) comprises a U-shaped bent plate (231), a top folded plate (232) and a bottom folded plate (233), and the U-shaped bent plate (231), the top folded plate (232) and the bottom folded plate (233) are an integral structure; the U-shaped bent plate (231) is buckled at the inner side of the first rear wall plate (20); the top turnover plate (232) and the bottom turnover plate (233) are fixedly attached to the inner side of the first rear wall plate (20) through screws.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202220921219.5U CN218003628U (en) | 2022-04-20 | 2022-04-20 | Cabinet for radio frequency front-end chip ATE (automatic test equipment) volume production test |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202220921219.5U CN218003628U (en) | 2022-04-20 | 2022-04-20 | Cabinet for radio frequency front-end chip ATE (automatic test equipment) volume production test |
Publications (1)
Publication Number | Publication Date |
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CN218003628U true CN218003628U (en) | 2022-12-09 |
Family
ID=84286649
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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CN202220921219.5U Active CN218003628U (en) | 2022-04-20 | 2022-04-20 | Cabinet for radio frequency front-end chip ATE (automatic test equipment) volume production test |
Country Status (1)
Country | Link |
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CN (1) | CN218003628U (en) |
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2022
- 2022-04-20 CN CN202220921219.5U patent/CN218003628U/en active Active
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