CN217866835U - Electronic equipment test system - Google Patents

Abstract

The embodiment of the utility model discloses electronic equipment test system, electronic equipment test system includes frame, test assembly line, backward flow assembly line, testing arrangement and handling device, each in test assembly line and the backward flow assembly line sets up in the frame, testing arrangement sets up in frame or testing arrangement and frame integrated into one piece through spacing subassembly, handling device sets up in the frame, each cooperation among handling device and test assembly line, backward flow assembly line and the testing arrangement is so that transport electronic equipment and/or carrier between test assembly line, backward flow assembly line and testing arrangement. The utility model discloses electronic equipment test system has testing arrangement and handling device rigidity, and handling device's removal parameter need not frequent calibration setting to convenient to use's advantage.

Description

Electronic equipment test system

Technical Field

The utility model relates to a test equipment technical field, concretely relates to electronic equipment test system.

Background

The electronic equipment testing system in the related art comprises a manipulator arranged on a rack, a production line used for conveying the electronic equipment and a carrier, and a testing device matched with the rack, wherein when the system runs, the electronic equipment on the production line is grabbed into the testing device by the manipulator to be tested. However, the testing device and the rack in the related art are separately arranged, and under the shaking action of movement and use of the device, the distance between the testing device and the manipulator changes, so that the distance between the testing device and the manipulator needs to be calibrated before each test and use, and then parameters required by the manipulator when the manipulator grabs the mobile electronic device are reset, so that the electronic device testing system in the related art has the problem of inconvenient use.

SUMMERY OF THE UTILITY MODEL

The present invention aims at solving at least one of the technical problems in the related art to a certain extent.

Therefore, the embodiment of the utility model provides an electronic equipment test system is provided. The electronic equipment testing system has the advantages that the testing device and the carrying device are fixed in position, and the moving parameters of the carrying device do not need to be calibrated and set frequently, so that the electronic equipment testing system is convenient to use.

The utility model discloses electronic equipment test system includes:

a frame;

a test pipeline and a reflow pipeline, each of the test pipeline and the reflow pipeline disposed at the rack;

the testing device is arranged on the rack through a limiting assembly or is integrally formed with the rack;

a handling device disposed in the rack, the handling device cooperating with each of the test line, the reflow line, and the test device to handle electronic equipment and/or carriers between the test line, the reflow line, and the test device.

The utility model discloses electronic equipment test system sets up testing arrangement in the frame or with testing arrangement and frame integrated into one piece through spacing subassembly, makes testing arrangement for the rigidity of frame, and then makes relative position and relative distance between testing arrangement and the handling device fixed, consequently the utility model discloses electronic equipment test system only need carry out once to set for handling device's removal parameter when initial use can use for a long time, need not frequent calibration and sets for handling device's removal parameter, makes the utility model discloses electronic equipment test system convenient to use.

In some embodiments, the limiting assembly includes a buckling portion, a first limiting portion and a second limiting portion, the first limiting portion and the second limiting portion are disposed on the rack relatively along a preset direction, each of the buckling portion and the testing device is located between the first limiting portion and the second limiting portion in the preset direction, wherein the testing device is adjacent to or abutted against each of the first limiting portion and the second limiting portion, and the buckling portion is buckled on the testing device.

In some embodiments, the preset direction is parallel to an extending direction of the test line, and each of the first and second position-limiting portions extends in a horizontal direction perpendicular to the preset direction.

In some embodiments, the rack comprises:

a frame body, each of the test flow line and the reflow flow line being disposed at the frame body; and

a support plate disposed on the frame body, each of the buckling portion, the first limiting portion, and the second limiting portion being disposed on the support plate, wherein the testing device is disposed on the support plate; and

the roller is arranged on the supporting plate, and the testing device is matched with the roller.

In some embodiments, the handling device comprises:

the body is arranged on the rack;

the first moving piece is movably arranged on the body along a first direction;

the second moving piece is movably arranged on the first moving piece along a second direction;

a third moving member movably disposed on the second moving member along a third direction, wherein the first direction is one of a vertical direction, a first horizontal direction and a second horizontal direction, the second direction is the other of the vertical direction, the first horizontal direction and the second horizontal direction, the third direction is the other of the vertical direction, the first horizontal direction and the second horizontal direction, and the first horizontal direction is perpendicular to the second horizontal direction;

a clamping jaw disposed on the third moving member.

In some embodiments, the first moving member is movably disposed on the body along the vertical direction, the second moving member is movably disposed on the first moving member along the first horizontal direction, and the third moving member is movably disposed on the second moving member along the second horizontal direction, wherein the first horizontal direction is perpendicular to an extending direction of each of the test line and the backflow line, and the second horizontal direction is parallel to the extending direction of each of the test line and the backflow line.

In some embodiments, the body includes a first ball screw extending in the first direction, the first moving member is disposed on the first ball screw, the first moving member includes a second ball screw extending in the second direction, the second moving member is disposed on the second ball screw, the second moving member includes a third ball screw extending in the third direction, and the third moving member is disposed on the third ball screw.

In some embodiments, the electronic device testing system further comprises a pressure regulating assembly, the pressure regulating assembly is arranged on the third moving member, and the pressure regulating assembly is connected with the clamping jaw so as to change the clamping force of the clamping jaw and/or the size of the clamping space.

In some embodiments, the testing apparatus includes a plurality of test cases arranged in a vertical orientation, and the handling apparatus cooperates with each of the test line, the reflow line, and the plurality of test cases to handle electronic devices and/or carriers between the test line, the reflow line, and the plurality of test cases.

In some embodiments, each of the test cassettes includes a plurality of test drawers for holding electronic devices, the plurality of test drawers being arranged in a vertical orientation, and the handling device cooperates with each of the test line, the reflow line, and the plurality of test drawers to handle electronic devices and/or carriers between the test line, the reflow line, and the plurality of test drawers.

Drawings

Fig. 1 is a schematic structural diagram of an electronic device testing system according to an embodiment of the present invention;

FIG. 2 is a schematic view of the frame of FIG. 1;

FIG. 3 is a schematic top view of the support plate and stop assembly of FIG. 2;

FIG. 4 is a schematic bottom view of the support plate and stop assembly of FIG. 2;

FIG. 5 is a schematic diagram of the structure of the test pipeline and the reflow pipeline of FIG. 1;

FIG. 6 is a schematic view of the structure of the carrying device in FIG. 1;

fig. 7 is a schematic structural diagram of the test apparatus in fig. 1.

10. A frame; 11. a frame body; 12. a support plate; 13. a roller; 14. a second limiting part; 15. a first limiting part; 16. a fastening part; 17. a clamping part; 20. testing the assembly line; 21. a drive wheel assembly; 22. jacking and pressing block components; 23. a blocking member; 24. a jacking mechanism; 30. a reflux pipeline; 40. a testing device; 41. a box body; 42. a first test drawer; 43. a second test drawer; 50. a carrying device; 51. a voltage regulating component; 52. a clamping jaw; 53. a second moving member; 54. a first moving member; 55. a body.

Detailed Description

Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings. The embodiments described below with reference to the drawings are exemplary and intended to be used for explaining the present invention, and should not be construed as limiting the present invention.

An electronic device testing system according to an embodiment of the present invention is described below with reference to fig. 1 to 7.

As shown in fig. 1-7, an electronic device testing system according to an embodiment of the present invention includes a rack 10, a testing line 20, a reflow line 30, a testing device 40, and a handling device 50.

Each of the test line 20 and the return line 30 is disposed in the rack 10. Specifically, as shown in fig. 1, the front end of the rack 10 is provided with a platform for arranging a test line 20 and a reflow line 30, the test line 20 and the reflow line 30 both extend in the left-right direction, and the conveying direction of the test line 20 is opposite to the conveying direction of the reflow line 30, the test line 20 is used for moving the electronic equipment and the carrier for carrying the electronic equipment from the starting position to the carrying device 50, and the reflow line 30 is used for moving the carrier from the carrying device 50 back to the starting position. It is understood that in other embodiments, test line 20 and reflow line 30 are not limited to being oriented in the same direction, as long as test line 20 is capable of moving electronic devices to handler 50 and reflow line 30 moves carriers back from handler 50.

The testing device 40 is arranged on the frame 10 through a limiting component or the testing device 40 and the frame 10 are integrally formed. As shown in fig. 1 and 2, a space for accommodating the testing device 40 is provided at the rear end of the rack 10, one testing device 40 may be provided only at the upper portion of the rear end of the rack 10, two testing devices 40 sequentially arranged in the up-down direction may also be provided at the rear end of the rack 10, the testing device 40 may be integrally formed with the rack 10, or a limiting component may be provided on the rack 10, and the testing device 40 is fixed on the rack 10 by the limiting component.

A handling device 50 is provided to the rack 10, the handling device 50 cooperating with each of the test line 20, the reflow line 30 and the test device 40 for handling electronic equipment and/or carriers between the test line 20, the reflow line 30 and the test device 40. Specifically, as shown in fig. 1, the carrying device 50 is provided on the rack 10, the carrying device 50 is located between the test line 20 and the reflow line 30, and the test device 40, and the carrying device 50 carries the carrier for holding the electronic device among the test line 20, the reflow line 30, and the test device 40.

In the embodiment shown in fig. 1, the test line 20 moves the electronic devices and carriers from left to right, the carrying device 50 picks up the electronic devices and carriers at the right end of the test line 20 and moves them to the test device 40 for testing, when the electronic devices are tested successfully, the electronic devices are picked up by the next process equipment, the carrying device 50 picks up the carriers at the test device 40 and moves them to the right side of the reflow line 30 to reflow the carriers to the left end of the reflow line 30, when the electronic devices are tested ineligibly, the carrying device 50 picks up the carriers with unqualified electronic devices at the test device 40 and moves them to the right side of the reflow line 30 to reflow the electronic devices and carriers together to the left end of the reflow line 30.

The utility model discloses electronic equipment test system with testing arrangement 40 through spacing subassembly setting on frame 10 or with testing arrangement 40 and frame 10 integrated into one piece, make testing arrangement 40 for the rigidity of frame 10, and then make relative position and relative distance between testing arrangement 40 and the handling device 50 fixed, consequently the utility model discloses electronic equipment test system only need carry out once to set for handling device 50's removal parameter when initial use can use for a long time, need not frequent calibration and sets for handling device 50's removal parameter, makes the utility model discloses electronic equipment test system convenient to use.

In some embodiments, the position limiting assembly includes a buckling portion 16, a first position limiting portion 15 and a second position limiting portion 14, the first position limiting portion 15 and the second position limiting portion 14 are oppositely disposed on the rack 10 along a preset direction (a left-right direction shown in fig. 1), each of the buckling portion 16 and the testing device 40 is located between the first position limiting portion 15 and the second position limiting portion 14 in the preset direction, wherein the testing device 40 is adjacent to or abutted against each of the first position limiting portion 15 and the second position limiting portion 14, and the buckling portion 16 is buckled on the testing device 40.

As shown in fig. 2 to 4, the rack 10 includes a supporting plate 12 for carrying the testing device 40, a first limiting portion 15 extending for a distance along the front-back direction is disposed at the left end of the supporting plate 12, a second limiting portion 14 extending for a distance along the front-back direction is disposed at the right end of the supporting plate 12, tops of the first limiting portion 15 and the second limiting portion 14 are higher than the top surface of the supporting plate 12, a buckling portion 16 extending upwards is disposed at the front end of the supporting plate 12, the buckling portion 16 is located between the first limiting portion 15 and the second limiting portion 14 in the left-right direction, the buckling portion 16 extends for a distance along the left-right direction, and a clamping boss protruding backwards is disposed at the top of the buckling portion 16. The testing device 40 is supported on the supporting plate 12, the left end and the right end of the testing device 40 are respectively adjacent to or abut against the first limiting part 15 and the second limiting part 14 on one corresponding side, the front end of the testing device 40 is connected with the buckling part 16 in a clamping mode, so that the relative position of the testing device 40 relative to the supporting plate is limited through the first limiting part 15 and the second limiting part 14, the testing device 40 is connected with the supporting plate 12 through the buckling part 16, and the testing device 40 is fixed on the machine frame 10 and cannot move relatively.

It is understood that in other embodiments, the left end of the supporting plate 12 is provided with a plurality of first limiting portions 15 arranged at intervals in the front-back direction, the right end of the supporting plate 12 is provided with a plurality of second limiting portions 14 arranged at intervals in the front-back direction, and the front end of the supporting plate 12 is provided with a plurality of buckling portions 16 arranged at intervals in the left-right direction.

It is understood that the fastening portion 16, the first position-limiting portion 15 and the second position-limiting portion 14 are not limited to be disposed on the support plate 12, in other embodiments, the frame 10 includes the frame body 11 and does not include the support plate 12, the fastening portion 16, the first position-limiting portion 15 and the second position-limiting portion 14 are disposed on the frame body 11, and the testing device 40 is directly carried on the frame body 11.

In some embodiments, the predetermined direction is parallel to the extending direction of the test line 20, and each of the first position-limiting portion 15 and the second position-limiting portion 14 extends along a horizontal direction perpendicular to the predetermined direction.

As shown in fig. 1, the test line 20 extends in the left-right direction, the first position-limiting portion 15 and the second position-limiting portion 14 are arranged on the rack 10 at intervals in the left-right direction, and the first position-limiting portion 15 and the second position-limiting portion 14 protrude from the support plate 12 in the up-down direction and extend in the front-back direction.

It is understood that, in other embodiments, the first position-limiting portion 15 and the second position-limiting portion 14 may be disposed in a manner of being protruded in the up-down direction and being inclined relatively close to each other.

In some embodiments, the rack 10 includes a frame body 11, a supporting plate 12, and a roller 13, each of the testing line 20 and the reflow line 30 is disposed on the frame body 11, the supporting plate 12 is disposed on the frame body 11, each of the snapping portion 16, the first position limiting portion 15, and the second position limiting portion 14 is disposed on the supporting plate 12, wherein the testing device 40 is disposed on the supporting plate 12, the roller 13 is disposed on the supporting plate 12, and the testing device 40 is engaged with the roller 13.

As shown in fig. 1 and 3, a testing assembly line 20 and a backflow assembly line 30 are disposed at the front end of the frame body 11, a support plate 12 is disposed at the rear end of the frame body 11, a buckling portion 16, a first limiting portion 15 and a second limiting portion 14 are disposed at the top of the support plate 12, an L-shaped buckling portion 17 extending downward is disposed at the bottom of the front end of the support plate 12, a clamping groove is formed between the buckling portion 17 and the bottom surface of the support plate 12, and a portion of the frame body 11 is embedded in the clamping groove, so that the support plate 12 and the frame body 11 are stably connected. The supporting plate 12 is provided with a plurality of mounting grooves, a plurality of rollers 13 are correspondingly arranged in the mounting grooves one by one, the tops of the rollers 13 protrude out of the top surface of the supporting plate 12, and the rollers 13 can rotate in the left-right direction, so that the testing device 40 is mounted in the supporting plate 12, the rollers 13 are abutted against the testing device 40 to reduce the resistance of the testing device 40 in the moving process, and the testing device 40 is mounted conveniently.

It is understood that in other embodiments, the roller 13 may not be disposed on the supporting plate 12; the frame 10 may not include the support plate 12 and the roller 13, and the fastening portion 16, the first limiting portion 15, and the second limiting portion 14 may be provided on the frame body 11.

In some embodiments, the reflow pipeline 30 is located directly below the test pipeline 20.

As shown in fig. 5, the reflow line 30 and the test line 20 are disposed on the same support, the support extends in the left-right direction, the test line 20 is disposed at the upper end of the support, the reflow line 30 is disposed at the lower end of the support, and the test line 20 and the reflow line 30 have opposite transmission directions, the test line 20 includes multiple sets of driving wheel assemblies 21 disposed at the rear side of the support and multiple driven wheels disposed at the front side of the support, the multiple sets of driving wheel assemblies 21 and the multiple driven wheels are respectively disposed at intervals in the left-right direction, the driving wheel assemblies 21 include two driving wheels disposed at intervals in the left-right direction and a transmission belt sleeved on the two driving wheels, a carrier bearing electronic equipment is disposed on the transmission belt of the driving wheel assemblies 21 and the driven wheels, the carrier bearing electronic equipment moves in the left-right direction under the friction force of the transmission belt, the test line 20 further includes a blocking member 23 disposed on the support and between the multiple sets of driving wheel assemblies 21 and the multiple driven wheels, the blocking member 23 is disposed at the right side of the test line 20 for blocking the carrier bearing the electronic equipment, and the carrier is captured by the carrying device 50.

Simultaneously, still be equipped with a plurality of climbing mechanisms 24 of arranging along left right direction interval in the front side of support, climbing mechanism 24 can be followed upper and lower direction for the support and removed, still be equipped with a plurality of jacking briquetting subassemblies 22 of arranging along left right direction interval in the rear side of support, the top of jacking briquetting subassembly 22 extends to the top of test assembly line 20 forward, test assembly line 20 is located between a plurality of climbing mechanisms 24 and a plurality of jacking briquetting subassemblies 22 and cooperates with a plurality of climbing mechanisms 24 and a plurality of jacking briquetting subassemblies 22.

The backflow line 30 includes a belt conveying mechanism disposed at the front side of the bracket and a belt conveying mechanism disposed at the rear side of the bracket, the two belt conveying mechanisms extend along the left and right directions, and the conveying directions of the two belt conveying mechanisms are the same, and the conveying speeds are the same, so that carriers placed on the two belt conveying mechanisms at the same time can move smoothly.

The reflow assembly line 30 is located right below the test assembly line 20, so that the arrangement space of the reflow assembly line 30 and the test assembly line 20 is compact, and the space utilization rate of the electronic device test system is high.

It is understood that the structure of test line 20 is not limited to the inclusion of multiple sets of drive pulley assemblies 21 and multiple driven pulleys, nor is the structure of reflow line 30 limited to the inclusion of two belt conveyors, and in other embodiments, test line 20 and reflow line 30 may also be conveyor or conveyor assemblies, so long as the transport is enabled for the electronic devices and the carriers used to hold the electronic devices.

It will be appreciated that the return line 30 is not limited to being positioned directly below the test line 20, and in other embodiments, the return line 30 and the test line 20 may extend in a front-to-back direction and be positioned side-by-side in a left-to-right direction on the rack 10, or the test line 20 may extend in a front-to-back direction and the return line 30 may extend in a left-to-right direction.

In some embodiments, the carrying device 50 includes a body 55, a first moving member 54, a second moving member 53, a third moving member, and a clamping jaw 52, the body 55 is disposed on the frame 10, the first moving member 54 is movably disposed on the body 55 along a first direction (a vertical direction as shown in fig. 1), the second moving member 53 is movably disposed on the first moving member 54 along a second direction (a front-back direction as shown in fig. 1), and the third moving member is movably disposed on the second moving member 53 along a third direction (a left-right direction as shown in fig. 1), wherein the first direction is one of a vertical direction, a first horizontal direction, and a second horizontal direction, the second direction is the other of the vertical direction, the first horizontal direction, and the second horizontal direction, the third direction is the other of the vertical direction, the first horizontal direction, and the second horizontal direction, the first horizontal direction is perpendicular to the second horizontal direction, and the clamping jaw 52 is disposed on the third moving member.

In some embodiments, the first moving member 54 is movably disposed on the body 55 in a vertical direction, the second moving member 53 is movably disposed on the first moving member 54 in a first horizontal direction (a front-back direction as shown in fig. 1) which is perpendicular to an extending direction of each of the test line 20 and the return line 30, and the third moving member 53 is movably disposed on the second moving member 53 in a second horizontal direction (a left-right direction as shown in fig. 1) which is parallel to the extending direction of each of the test line 20 and the return line 30.

In some embodiments, the body 55 includes a first ball screw extending in a first direction, the first moving member 54 is disposed on the first ball screw, the first moving member 54 includes a second ball screw extending in a second direction, the second moving member 53 is disposed on the second ball screw, the second moving member 53 includes a third ball screw extending in a third direction, and the third moving member is disposed on the third ball screw.

As shown in fig. 1 and 6, the body 55 includes a first mounting seat provided on the frame 10 and a first ball screw provided on the first mounting seat, the first mounting seat is a bar-shaped plate extending in the up-down direction, the first ball screw extends in the up-down direction and is rotatable around its axis, the first moving member 54 includes a second mounting seat and a second ball screw, the second mounting seat is a bar-shaped vertical plate extending in the front-rear direction, and the second mounting seat is provided on a nut of the first ball screw, the second mounting base is driven by the first ball screw to move up and down relative to the first mounting base, the second ball screw is arranged on the second mounting base and extends along the front-back direction, the second ball screw can rotate around the axis of the second ball screw, the second moving member 53 comprises a third mounting seat and a third ball screw, the third mounting seat is a strip-shaped vertical plate extending along the left-right direction, the right end of the third mounting seat is arranged on a nut of the second ball screw, the third installation seat can move along the front-back direction relative to the second installation seat under the drive of the second ball screw, the third ball screw is arranged on the third installation seat and extends along the left-right direction, and the third ball screw can rotate around the axis of the third ball screw, the third moving piece comprises a mounting frame arranged on a nut of the third ball screw, the mounting bracket is movable in the left-right direction with respect to the third mounting base by the third ball screw, the holding claw 52 is provided on the mounting bracket of the third moving member, so that the holding jaw 52 can move in the up-down direction, the front-back direction and the left-right direction with respect to the frame 10 by the driving of the first ball screw, the second ball screw and the third ball screw, which in turn grips the carrier by the jaws 52 and enables the carrier to be transferred between the reflow line 30, the test line 20 and the test apparatus 40.

The structure that the clamping jaw 52 is driven to move along the up-down direction, the front-back direction and the left-right direction by the body 55, the first moving part 54, the second moving part 53 and the third moving part has high moving precision, so that the clamping jaw 52 can accurately grab electronic equipment and carriers and place the electronic equipment and the carriers to corresponding positions.

It is understood that in other embodiments, the carrying device 50 may respectively replace the first ball screw, the second ball screw and the third ball screw with linear guide rails, in other words, the first moving member 54 is disposed on the slider of the first linear guide rail extending in the up-down direction and located on the first mounting seat, the second moving member 53 is disposed on the slider of the second linear guide rail extending in the front-back direction and located on the second mounting seat, and the third moving member is disposed on the slider of the third linear guide rail extending in the left-right direction and located on the third mounting seat.

It is understood that the structure of the conveying device 50 is not limited to the third moving member, the second moving member 53, the first moving member 54 and the body 55 being sequentially arranged, in other embodiments, the conveying device 50 may also be arranged with the third moving member on the first moving member 54, the first moving member 54 on the second moving member 53 and the second moving member 53 on the body 55.

It is understood that the structure of the handling device 50 is not limited to include the body 55, the first moving member 54, the second moving member 53, the third moving member, and the clamping jaw 52, and in other embodiments, the handling device 50 may be a robot arm provided with the clamping jaw 52.

In some embodiments, the electronic device testing system of the embodiment of the present invention further includes a pressure regulating assembly 51, the pressure regulating assembly 51 is disposed on the third moving member, and the pressure regulating assembly 51 is connected to the clamping jaw 52 so as to change the clamping force of the clamping jaw 52 and/or the size of the clamping space.

As shown in fig. 6, a pressure regulating assembly 51 and a clamping jaw 52 are simultaneously arranged on a mounting frame of the third moving member, the pressure regulating assembly 51 is connected with the clamping jaw 52, the clamping jaw 52 comprises two jaw bodies arranged at intervals along the left-right direction, the clamping jaw 52 moves relatively close to or away from each other under the driving of a hydraulic or pneumatic telescopic cylinder, so as to realize the grabbing and releasing of the electronic equipment and the carrier, the pressure regulating assembly 51 comprises a liquid supply pipe or an air supply pipe connected with the telescopic cylinder, and further comprises a pressure sensor and a switch, the pressure regulating assembly 51 controls the hydraulic or pneumatic pressure in the telescopic cylinder to control the grabbing and releasing actions of the clamping jaw 52, and meanwhile, the clamping force of the clamping jaw 52 in the grabbing process can be controlled, so as to avoid the electronic equipment and the carrier from being separated from the clamping jaw 52.

It is understood that in other embodiments, the electronic device testing system may not have the voltage regulating assembly 51.

In some embodiments, testing device 40 includes a plurality of test cases arranged in a vertical orientation, and handling device 50 cooperates with each of test line 20, reflow line 30, and the plurality of test cases to handle electronic devices and/or carriers between test line 20, reflow line 30, and the plurality of test cases.

As shown in fig. 1, two receiving spaces arranged in the vertical direction are provided at the rear end of the rack 10, a testing box is provided in each receiving space, the carrying device 50 can cooperate with the two testing boxes to sequentially send the electronic devices and the carriers on the testing assembly line 20 into the two testing boxes, so that the two testing boxes simultaneously test different electronic devices, thereby improving the testing efficiency, and carriers no longer bearing electronic devices after testing in the two testing boxes or carriers bearing defective products are moved to the reflow assembly line 30 by the carrying device 50 to reflow.

It will be appreciated that in other embodiments, the test device 40 may include more than two test pods or only one test pod.

In some embodiments, each test cassette includes a plurality of test drawers for holding electronic devices, the plurality of test drawers being arranged in a vertical orientation, and the handling device 50 cooperates with each of the test line 20, the return line 30, and the plurality of test drawers to handle electronic devices and/or carriers between the test line 20, the return line 30, and the plurality of test drawers.

As shown in fig. 7, the test box includes a box body 41 disposed on the support plate 12, and a first test drawer 42 and a second test drawer 43 disposed on the box body 41, the first test drawer 42 and the second test drawer 43 are arranged at intervals in an up-down direction, and the first test drawer 42 and the second test drawer 43 are movable in a front-back direction with respect to the box body 41, so that the receiving positions of the first test drawer 42 and the second test drawer 43 for receiving the electronic devices and carriers are located outside the box body 41 or inside the box body 41, when the receiving positions of the first test drawer 42 and the second test drawer 43 are located outside the box body 41, the carrying device 50 can move the electronic devices and carriers picked from the test line 20 to the receiving positions, and can pick and move the tested carriers or both the electronic devices and carriers from the receiving positions to the return line 30 by the carrying device 50, when the receiving positions of the first test drawer 42 and the second test drawer 43 are located inside the box body 41, the test box 41 can perform the test for efficiency by respectively setting the test box body 41, for example, and perform the ultrasonic testing efficiency by setting the test instrument.

In the description of the present invention, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience of description and simplification of description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.

Furthermore, the terms "first", "second" and "first" are used merely to distinguish one element from another, and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.

In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," and "fixed" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally formed; may be mechanically coupled, may be electrically coupled or may be in communication with each other; they may be directly connected or indirectly connected through intervening media, or they may be connected internally or in any other suitable relationship, unless expressly stated otherwise. The specific meaning of the above terms in the present invention can be understood according to specific situations by those skilled in the art.

In the present application, unless expressly stated or limited otherwise, a first feature "on" or "under" a second feature may be directly contacting the second feature or the first and second features may be indirectly contacting the second feature through intervening media. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.

In the present disclosure, the terms "one embodiment," "some embodiments," "an example," "a specific example," or "some examples" or the like mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present disclosure. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples and features of different embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.

Although embodiments of the present invention have been shown and described, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention, and that variations, modifications, substitutions and alterations can be made to the above embodiments by those of ordinary skill in the art without departing from the scope of the present invention.

Claims (10)

1. An electronic device testing system, comprising:

a frame (10);

a test line (20) and a return line (30), each of the test line (20) and the return line (30) being disposed at the rack (10);

the testing device (40) is arranged on the rack (10) through a limiting component, or the testing device (40) and the rack (10) are integrally formed;

a handling device (50), said handling device (50) being arranged to said rack (10), said handling device (50) cooperating with each of said test line (20), said reflow line (30) and said test device (40) for handling electronic equipment and/or carriers between said test line (20), said reflow line (30) and said test device (40).

2. The electronic device testing system of claim 1, wherein the limiting assembly comprises a buckling portion (16), a first limiting portion (15) and a second limiting portion (14), the first limiting portion (15) and the second limiting portion (14) are oppositely arranged on the rack (10) along a preset direction, each of the buckling portion (16) and the testing device (40) is located between the first limiting portion (15) and the second limiting portion (14) in the preset direction, wherein the testing device (40) is adjacent to or abutted against each of the first limiting portion (15) and the second limiting portion (14), and the buckling portion (16) is buckled on the testing device (40).

3. The electronic device test system according to claim 2, wherein the predetermined direction is parallel to an extending direction of the test pipeline (20), each of the first limiting portion (15) and the second limiting portion (14) extending in a horizontal direction perpendicular to the predetermined direction.

4. The electronic device test system of claim 2, wherein the rack (10) comprises:

a frame body (11), each of the test line (20) and the reflow line (30) being provided to the frame body (11); and

a support plate (12), the support plate (12) being provided to the frame body (11), each of the buckling portion (16), the first stopper portion (15), and the second stopper portion (14) being provided to the support plate (12), wherein the test device (40) is provided to the support plate (12); and

the roller (13), the roller (13) set up in backup pad (12), testing arrangement (40) with roller (13) cooperation.

5. The electronic device test system according to any of claims 1-4, wherein the handling apparatus (50) comprises:

a body (55), the body (55) being provided to the chassis (10);

a first moving member (54), the first moving member (54) being movably provided to the body (55) in a first direction;

a second moving member (53), the second moving member (53) being movably provided to the first moving member (54) in a second direction;

a third moving member movably provided to the second moving member (53) in a third direction, wherein the first direction is one of a vertical direction, a first horizontal direction and a second horizontal direction, the second direction is the other of the vertical direction, the first horizontal direction and the second horizontal direction, the third direction is the other of the vertical direction, the first horizontal direction and the second horizontal direction, and the first horizontal direction is perpendicular to the second horizontal direction;

a clamping jaw (52), wherein the clamping jaw (52) is arranged on the third moving part.

6. The electronic device testing system of claim 5, wherein the first moving member (54) is movably disposed to the body (55) along the vertical direction, the second moving member (53) is movably disposed to the first moving member (54) along the first horizontal direction, and the third moving member is movably disposed to the second moving member (53) along the second horizontal direction, wherein the first horizontal direction is perpendicular to an extending direction of each of the testing line (20) and the return line (30), and the second horizontal direction is parallel to the extending direction of each of the testing line (20) and the return line (30).

7. The electronic device testing system according to claim 5, wherein the body (55) includes a first ball screw extending in the first direction, the first moving member (54) is provided to the first ball screw, the first moving member (54) includes a second ball screw extending in the second direction, the second moving member (53) is provided to the second ball screw, the second moving member (53) includes a third ball screw extending in the third direction, and the third moving member is provided to the third ball screw.

8. The electronic device testing system according to claim 5, further comprising a pressure regulating assembly (51), wherein the pressure regulating assembly (51) is arranged on the third moving member, and the pressure regulating assembly (51) is connected with the clamping jaw (52) so as to change the clamping force of the clamping jaw (52) and/or the size of the clamping space.

9. The electronic device testing system according to any of claims 1-4, wherein the testing device (40) comprises a plurality of test cases, a plurality of the test cases being arranged in a vertical alignment, and the handling device (50) cooperates with the test line (20), the reflow line (30) and each of the plurality of test cases for handling electronic devices and/or carriers between the test line (20), the reflow line (30) and the plurality of test cases.

10. The electronic device testing system of claim 9, wherein each of said test cassettes includes a plurality of test drawers for receiving electronic devices, said plurality of test drawers being arranged in a vertical orientation, said handling device (50) cooperating with each of said test line (20), said return line (30), and said plurality of test drawers to handle electronic devices and/or carriers between said test line (20), said return line (30), and said plurality of test drawers.

Images