CN217428124U - Test system of light emission receiving assembly on-board equipment - Google Patents
Test system of light emission receiving assembly on-board equipment Download PDFInfo
- Publication number
- CN217428124U CN217428124U CN202221261980.7U CN202221261980U CN217428124U CN 217428124 U CN217428124 U CN 217428124U CN 202221261980 U CN202221261980 U CN 202221261980U CN 217428124 U CN217428124 U CN 217428124U
- Authority
- CN
- China
- Prior art keywords
- optical
- light
- test
- coupled
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The application is suitable for equipment testing technical field, provides a test system of subassembly is received in transmission of light at board equipment, includes: the environment temperature case, at least a set of test equipment and photoswitch device, wherein, the inside at least one emission of light receiving element that awaits measuring that sets up of environment temperature case is at board equipment, at least a set of test equipment with at least one emission of light receiving element that awaits measuring is coupled through the light path at board equipment for to the emission of light receiving element that awaits measuring tests at board equipment, photoswitch device is used for the alternative to switch on one the light path of emission of light receiving element that awaits measuring between board equipment and a set of test equipment. This application switches different light emission receiving component and tests at board equipment through control light switch device, improves efficiency of software testing greatly to await measuring light emission receiving component sets up inside the environmental temperature case at board equipment, can obtain the test result under the different ambient temperature, effectively promotes the calibration test effect to light emission receiving component at board equipment.
Description
Technical Field
The application belongs to the technical field of equipment testing, and particularly relates to a test system of an optical transmission receiving assembly on-board equipment.
Background
With the rapid development of communication networks, the demand for communication devices is increasing, and the performance requirements are also increasing. Therefore, most of the conventional Optical Network Units (ONUs) use Bi-Directional Optical Sub-assembly On Board (BOB) devices.
In the test of the light emitting and receiving component in the development stage of the board device, the performance parameters of the light emitting and receiving component in the board device need to be calibrated and tested, so that the light emitting and receiving component is in a standard working state. However, at present, for batch calibration test of the light emitting and receiving components in the development stage of the board device, a tester is usually required to connect the light emitting and receiving components with the device to be tested one by one on the board device, the test mode has low efficiency, the calibration test effect is not ideal, and the tester cannot find out the reason of the non-ideal situation.
SUMMERY OF THE UTILITY MODEL
The embodiment of the application provides a test system of a light emission receiving component on board equipment, which can solve the problem that the test effect of the light emission receiving component in the research and development stage of the board equipment is not ideal at present.
The embodiment of the application provides a test system of light emission receiving component at board equipment, includes:
the environment temperature box can be provided with a plurality of environment temperatures, and at least one light emitting and receiving component to be tested is arranged in the environment temperature box;
the at least one group of test equipment is coupled with the at least one light emitting and receiving component to be tested on the board equipment through a light path; and
and the optical switch device is used for selecting and conducting an optical path of the light emitting and receiving component to be tested between the board equipment and a group of testing equipment.
Optionally, the optical switching device includes:
the input end is respectively coupled with each light emitting and receiving component to be tested on the board equipment through a light path;
the output ends are respectively coupled with the groups of test equipment through optical paths; and
and one end of the light path conversion element is connected with the input end, and the other end of the light path conversion element is connected with the output end.
Optionally, the system for testing the board device of the light emitting and receiving assembly further includes:
and the combining end of the optical splitter is coupled with the output end of the optical switch device through an optical path, and the light splitting end of the optical splitter is coupled with each group of test equipment through an optical path respectively.
Optionally, the test apparatus includes: a receiving end test instrument, the receiving end test instrument comprising:
the variable optical attenuator is coupled with the light splitting end of the light splitter through a light path;
and the optical line terminal is coupled with the variable optical attenuator through an optical path.
Optionally, the test apparatus includes:
and the long-luminescence tester is coupled with the light splitting end of the light splitter through a light path.
Optionally, the long luminescence tester includes:
and the optical eye pattern instrument is coupled with the light splitting end of the light splitter through a light path.
Optionally, the long luminescence tester includes:
and the optical power meter is coupled with the light splitting end of the optical splitter through an optical path.
Optionally, the optical splitter is a one-to-four optical splitter, and the test apparatus further includes:
a long-luminescence test instrument, comprising: the variable optical attenuator, the optical eye pattern instrument, the optical power meter and the spectrometer are respectively coupled with four light splitting ports of the one-to-four optical splitter through optical paths.
Optionally, the optical splitter is a one-to-two optical splitter, and the test apparatus further includes: a long-luminescence test instrument, comprising: the test system of the optical emission receiving component on-board device further comprises:
one end of the three-terminal switching connector is respectively coupled with the optical eye diagram instrument, the optical power meter and the spectrometer through an optical path, and the other end of the three-terminal switching connector is coupled with one light splitting port of the one-to-two light splitter through an optical path;
the adjustable optical attenuator is connected with the other optical splitting port of the one-to-two optical splitter.
Optionally, the system for testing the board device of the light emitting and receiving assembly further includes:
and the upper computer is coupled with the light emitting and receiving component to be tested on the board equipment through a light path, and is respectively connected with the test equipment and the optical switch device through serial ports.
Compared with the prior art, the embodiment of the application has the advantages that:
the embodiment of the application provides a test system of light emission receiving component at board equipment, includes: the environment temperature case, at least a set of test equipment and optical switch device, wherein, the inside at least one emission of light receiving element that awaits measuring that sets up of environment temperature case is at board equipment, at least a set of test equipment with at least one emission of light receiving element that awaits measuring is coupled through the light path at board equipment for to the emission of light receiving element that awaits measuring tests at board equipment, and optical switch device is used for the alternative to switch on one the light path of emission of light receiving element that awaits measuring between board equipment and a set of test equipment. This application switches different light emission receiving component and tests at board equipment through control light switch device, improves efficiency of software testing greatly to await measuring light emission receiving component sets up inside the environmental temperature case at board equipment, can obtain the test result under the different ambient temperature, effectively promotes the calibration test effect to light emission receiving component at board equipment.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
FIG. 1 is a system diagram of an optical transceiver module on-board test system according to an embodiment of the present application;
FIG. 2 is a schematic diagram of an optical switching device according to an embodiment of the present application;
FIG. 3 is a system diagram of an optical transceiver module on-board test system according to yet another embodiment of the present application;
FIG. 4 is a system diagram of an optical transceiver module on-board test system according to another embodiment of the present application;
FIG. 5 is a system diagram of an optical transceiver module on-board test system according to another embodiment of the present application;
FIG. 6 is a system diagram of an optical transceiver module on-board test system according to another embodiment of the present application.
Wherein, in the figures, the respective reference numerals:
10-an environment temperature box; 11-the light emitting and receiving component to be tested is on-board equipment; 20-an optical switching device; 21-an input terminal; 22-an output terminal; 23-an optical path conversion element; 30-a test device; 31-a receiving end test instrument; 311-variable optical attenuator; 312-optical line terminal; 32-long luminescence tester; 321-an optical eye chart; 322-optical power meter; 323-a spectrometer; 40-a light splitter; 50-a three-terminal switching connector; 60-an upper computer; 70-switch.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.
The technical solution of the present invention will be described in detail with reference to the accompanying drawings. The embodiments described below with reference to the drawings are exemplary and intended to be used for explaining the present invention, and should not be construed as limiting the present invention.
The embodiment of the application provides a test system of a light emitting and receiving component on-board device, referring to a system schematic diagram shown in fig. 1, the test system includes:
the system comprises an environment temperature box 10, a plurality of environment temperatures, and at least one light emitting and receiving component to be tested arranged in the board device 11, wherein the environment temperature box 10 is provided with a plurality of environment temperatures;
at least one set of test equipment 30 optically coupled to the at least one light emitting and receiving component to be tested at the board device 11; and
and an optical switch device 20 for selectively conducting an optical path of one of the light emitting and receiving components to be tested between the board device 11 and a group of the test devices 30.
Wherein, environment incubator 10 is one kind of environmental test case, can simulate out ambient temperature for detect the performance of product under high temperature or low temperature, the emission of light receiving element that awaits measuring sets up inside environment incubator 10 at board equipment 11, can obtain different ambient temperature for the follow-up, and the emission of light receiving element that awaits measuring is at the test result of board equipment 11, effectively promotes the calibration test effect to emission of light receiving element at board equipment.
In one embodiment of the present application, the optical switching device 20 includes:
the input end 21 is respectively coupled with each light emitting and receiving component to be tested on the board device 11 through a light path;
the output end 22 is respectively coupled with each group of test equipment 30 through an optical path; and
and the optical path conversion element 23, one end of the optical path conversion element is connected with the input end 21, and the other end of the optical path conversion element 23 is connected with the output end 22.
In some embodiments of the present application, referring to the schematic structural diagram shown in fig. 2, the optical switch device 20 is an optical path switching device, and by controlling the optical path switching element 23 of the optical switch device 20, any light emitting and receiving component to be tested is conducted between the board device 11 and one group of test devices 30, so as to implement automatic switching test of multiple light emitting and receiving components to be tested on the board device 11. It should be understood that only four input terminals 21 are shown in fig. 2, the input terminals 21 can be flexibly selected according to the number of the light emitting and receiving components to be tested in the board device 11 in the practical application scenario, and the number of the input terminals 21 is not limited in this embodiment. By controlling the optical switch device 20, different light emitting and receiving assemblies are switched to test on the board device, so that the test efficiency is greatly improved.
In an embodiment of the present application, the testing system of the board-on-board device for the light emitting and receiving assembly further includes:
and a light splitter 40, wherein a combining end of the light splitter 40 is coupled to the output end 22 of the optical switch device 20 through a light path, and a light splitting end of the light splitter 40 is coupled to each group of test equipment 30 through a light path respectively.
Referring to the system diagram shown in fig. 3, the optical splitter 40 can realize the function of combining two paths of light sources, and directly control to perform corresponding test items without manually switching the test equipment 30. It should be understood that only two sets of test devices 30 are shown in fig. 3, and the number of sets of test devices 30 may be flexibly selected according to the test items in the actual application scenario, which is not limited in this embodiment.
The optical path coupling described in the embodiment of the present application may be implemented by an optical fiber line, or may be implemented by other devices capable of implementing optical path coupling.
In the embodiment of the present application, the test apparatus 30 includes: a receiving end test instrument 31, the receiving end test instrument 31 comprising:
and the adjustable optical attenuator 311 is coupled with the light splitting end of the light splitter 40 through a light path.
And an optical line terminal 312, coupled to the adjustable optical attenuator 311 through an optical path.
Referring to the system diagram shown in fig. 4, the adjustable optical attenuator 311 is used to adjust the optical power of the receiving end emitted from the optical line terminal 312. The optical line terminal 312 and the variable optical attenuator 311 are used to perform a normal operation test, a Digital diagnostic interface (DDMI) test, and a responsiveness test. The normal working test requires that no packet is lost in the optical power of the to-be-tested optical transceiver module on the board device 11, and the digital diagnostic test is performed by using the actual temperature and the actual optical power of the to-be-tested optical transceiver module on the board device 11, and the reported temperature and the reported optical power of the to-be-tested device. The responsivity test comprises a warning removing test, a warning test, an overload point test and a sensitivity test, wherein a warning removing value, a warning value, an overload point and sensitivity are respectively determined, and the responsivity is evaluated according to the warning removing value, the warning value, the overload point and the sensitivity, wherein the overload point refers to a test point at which the maximum optical power of the light emitting and receiving component to be tested is allowed to not lose package at the board device 11, and the sensitivity refers to a test point at which the minimum optical power of the light emitting and receiving component to be tested is allowed to not lose package at the board device 11. The adjustable optical attenuator 311 and the optical line terminal 312 are combined with the ambient temperature box 10, so that test results of a normal operation test, a digital diagnosis test and a responsiveness test at different temperatures can be obtained respectively.
In one possible embodiment, between the optical line terminal 312 and the variable optical attenuator 311, and between the optical attenuator and the optical splitter 40, and between the optical splitter 40 and the optical switching device 20. The optical switch device 20 and the to-be-tested optical transceiver module are in a bidirectional transmission process of optical signals between the board devices 11, and are configured to transmit signals sent by the optical line terminal 312 to the to-be-tested optical transceiver module on-board devices 11 when performing a normal operation test, a digital diagnosis test, and a responsiveness test on the received optical power of the to-be-tested optical transceiver module on-board devices 11.
In the embodiment of the present application, the test apparatus 30 includes:
a long luminescence test instrument 32, wherein the long luminescence test instrument 32 is optically coupled to the light splitting end of the light splitter 40.
In the embodiment of the present application, the long luminescence tester 32 includes:
an optical eye pattern device 321, wherein the optical eye pattern device 321 is coupled to the light splitting end of the light splitter 40 through an optical path.
Specifically, the optical eye pattern instrument 321 is configured to obtain optical eye pattern parameters, and the optical eye pattern instrument 321, in combination with the environmental temperature chamber 10, can obtain optical eye pattern parameters corresponding to the light emitting and receiving component to be measured at different temperatures of the board device 11.
In the embodiment of the present application, the long luminescence tester 32 includes:
an optical power meter 322, wherein the optical power meter 322 is coupled to the splitting end of the optical splitter 40 through an optical path.
Specifically, the optical power meter 322 is configured to obtain the emitted optical power, and the optical power meter 322, in combination with the ambient temperature box 10, can obtain the emitted optical power of the light emitting and receiving component to be measured when the board device 11 is at different temperatures.
In the embodiment of the present application, the long luminescence tester 32 includes:
a spectrometer 323, wherein the spectrometer 323 is optically coupled to the splitting end of the splitter 40.
Specifically, the spectrometer 323 is used to obtain spectral parameters, and the spectrometer 323, in combination with the ambient temperature chamber 10, can obtain spectral parameters corresponding to the light emitting and receiving component to be measured when the plate device 11 is at different temperatures.
In some embodiments of the present application, an optical eye diagram 321, an optical power meter 322, and a spectrometer 323 are used to perform long luminescence tests.
The long light emitting fault is a fault type of the light emitting and receiving component to be tested in the board device 11, and means that the light emitting and receiving component emits light at the emitting end of the board device for a long time, so that the light emitting and receiving component under the whole network port cannot normally communicate in the board device.
In one possible embodiment, the result of the long-time light emission test is determined by the corresponding optical eye pattern parameters, emitted optical power and spectral parameters of the light emitting and receiving component to be tested when the board device 11 is at different temperatures.
In a possible embodiment, referring to the schematic system diagram shown in fig. 4, the optical splitter 40 is a one-to-four optical splitter, and the testing apparatus 30 further includes:
a long luminescence tester 32, said long luminescence tester 32 comprising: the optical attenuator 311, the optical eye pattern instrument 321, the optical power meter 322, and the spectrometer 323 are optically coupled to four optical splitting ports of the one-to-four optical splitter respectively.
In a possible embodiment, referring to the schematic system diagram shown in fig. 5, the optical splitter 40 is a one-to-two optical splitter, and the testing apparatus 30 further includes: a long-luminescence tester 32, the long-luminescence tester 32 comprising: an optical eye chart 321, an optical power meter 322 and a spectrometer 323, wherein the test system of the optical emission receiving assembly on-board device further comprises:
and a three-terminal switching connector 50, wherein one end of the three-terminal switching connector 50 is respectively coupled to the optical eye diagram instrument 321, the optical power meter 322 and the spectrometer 323 through an optical path by an optical fiber line, and the other end of the three-terminal switching connector 50 is coupled to one optical splitting port of the one-to-two optical splitter through an optical path.
The adjustable optical attenuator 311 is optically coupled to the other optical splitting port of the one-to-two optical splitter.
Specifically, the three-terminal switching connector 50 may be a three-to-one connector for one-to-one connection with the optical eye diagram instrument 321, the optical power meter 322 and the spectrometer 323, and the three-to-one connector may be switched manually or controlled by the upper computer 60, so that many ports may be saved, the device is suitable for complex scenes of various test items, and the rapid switching connection between the optical transceiver module to be tested and different devices in the board device 11 is realized. It should be understood that when the number of the instruments exceeds three, the three-terminal switching connector 50 may be correspondingly switched to a one-out-of-many connector, and the three-terminal switching connector 50 may be flexibly adjusted according to the actual application scenario.
In a possible embodiment, referring to the system schematic diagram shown in fig. 6, the testing system of the light emitting and receiving assembly on-board device further includes:
and the upper computer 60 is coupled with the light emitting and receiving component to be tested on the board device 11 through a light path, and is respectively connected with the testing device 30 and the optical switch device 20 through serial ports.
Illustratively, the host computer 60 is respectively connected to the light emitting and receiving components to be tested on the board device 11, the testing devices 30, the optical switch device 20 and the three-terminal switching connector 50, so that unified control and switching can be realized, and testing of different items can be performed on each light emitting and receiving component to be tested on the board device 11. The upper computer 60 can issue an instruction to switch the to-be-tested light emitting and receiving assembly to read the data of each instrument on the board device 11 and automatically store the generated data.
In one possible embodiment, the system for testing the light emitting and receiving assembly on the board device further comprises:
the switch 70, the one end of switch 70 passes through the net gape and connects each light emission receiving component that awaits measuring at board equipment 11, the other end of switch 70 passes through the net gape and connects host computer 60.
Specifically, an interface of the upper computer 60 can be expanded into a plurality of interfaces through the switch 70, a plurality of to-be-tested optical transceiver devices are connected to an output port of the upper computer 60, data transmission with the upper computer 60 can be realized, and an exclusive electrical signal path can be provided between the board device 11 and the upper computer 60 for any to-be-tested optical transceiver device through the switch 70.
The test system of the light emission receiving component on-board device disclosed by the above embodiment of the application comprises: the environment incubator 10, at least a set of test equipment 30 and optical switch device 20, wherein, the inside at least one light emission receiving component that awaits measuring that sets up of environment incubator 10 is at board equipment 11, at least a set of test equipment 30 with at least one light emission receiving component that awaits measuring is coupled at board equipment 11 through the light path for to the light emission receiving component that awaits measuring tests at board equipment 11, and optical switch device 20 is used for the alternative to switch on one the light path of the light emission receiving component that awaits measuring between board equipment 11 and a set of test equipment 30.
In the practical application process, this application switches different light emission receiving component and tests at board equipment through control light switch device 20, improves efficiency of software testing greatly to await measuring light emission receiving component sets up inside environment incubator 10 at board equipment 11, can obtain the test result under the different ambient temperature, effectively promotes the calibration test effect to light emission receiving component at board equipment.
In addition, in the present invention, unless otherwise explicitly specified or limited, the terms "connected", and the like are to be construed broadly, and may be, for example, a mechanical connection or an electrical connection; the term "connected" refers to a direct connection or an indirect connection through an intermediate medium, and refers to a connection between two elements or an interaction relationship between two elements, unless otherwise specifically defined, and the specific meaning of the terms in the present invention is understood by those skilled in the art according to specific situations.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present invention.
Claims (10)
1. A system for testing an optical transceiver module on a board device, comprising:
the environment temperature box can be provided with a plurality of environment temperatures, and at least one light emitting and receiving component to be tested is arranged in the environment temperature box;
the at least one group of test equipment is coupled with the at least one light emitting and receiving component to be tested on the board equipment through a light path; and
and the optical switch device is used for selecting and conducting an optical path of the light emitting and receiving component to be tested between the board equipment and a group of testing equipment.
2. The system for testing an on-board device of a light emitting receiving assembly of claim 1, wherein the optical switching device comprises:
the input end is respectively coupled with each light emitting and receiving component to be tested on the board equipment through a light path;
the output ends are respectively coupled with the groups of test equipment through optical paths; and
and one end of the light path conversion element is connected with the input end, and the other end of the light path conversion element is connected with the output end.
3. The system for testing an optical transceiver on-board device of claim 2, wherein the system for testing an optical transceiver on-board device further comprises:
and the combining end of the optical splitter is coupled with the output end of the optical switch device through an optical path, and the light splitting end of the optical splitter is coupled with each group of test equipment through an optical path respectively.
4. The system for testing an optical transceiver module-on-board device of claim 3, wherein the testing device comprises: a receiving end test instrument, the receiving end test instrument comprising:
the variable optical attenuator is coupled with the light splitting end of the light splitter through a light path;
and the optical line terminal is coupled with the variable optical attenuator through an optical path.
5. The system for testing an optical transceiver module-on-board device of claim 3, wherein the testing device comprises:
and the long-luminescence tester is coupled with the light splitting end of the light splitter through a light path.
6. The system for testing a light emitting receiving module on a board device as claimed in claim 5, wherein the long luminescence tester comprises:
and the optical eye pattern instrument is coupled with the light splitting end of the light splitter through a light path.
7. The system for testing an optical transmit receive assembly on-board device as claimed in claim 5, wherein said long-emitting tester comprises:
and the optical power meter is coupled with the light splitting end of the optical splitter through an optical path.
8. The system of claim 4, wherein the optical splitter is a one-to-four optical splitter, the testing apparatus further comprising:
a long-luminescence test instrument, comprising: the adjustable optical attenuator, the optical eye chart, the optical power meter and the spectrometer are respectively coupled with four light splitting ports of the one-to-four optical splitter through optical paths.
9. The system of claim 4, wherein the optical splitter is a one-to-two optical splitter, the testing apparatus further comprising: a long-luminescence test instrument, comprising: the test system of the optical emission receiving component on-board device further comprises:
one end of the three-terminal switching connector is respectively coupled with the optical eye diagram instrument, the optical power meter and the spectrometer through an optical path, and the other end of the three-terminal switching connector is coupled with one light splitting port of the one-to-two light splitter through an optical path;
the variable optical attenuator is coupled with the other light splitting port of the one-to-two optical splitter through an optical path.
10. The system for testing an on-board device of a light-emitting receiving assembly of claim 1, wherein the system for testing an on-board device of a light-emitting receiving assembly further comprises:
and the upper computer is coupled with the light emitting and receiving component to be tested on the board device through a light path, and is respectively connected with the test device and the optical switch device through serial ports.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202221261980.7U CN217428124U (en) | 2022-05-24 | 2022-05-24 | Test system of light emission receiving assembly on-board equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202221261980.7U CN217428124U (en) | 2022-05-24 | 2022-05-24 | Test system of light emission receiving assembly on-board equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN217428124U true CN217428124U (en) | 2022-09-13 |
Family
ID=83190731
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202221261980.7U Active CN217428124U (en) | 2022-05-24 | 2022-05-24 | Test system of light emission receiving assembly on-board equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN217428124U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116429381A (en) * | 2023-06-02 | 2023-07-14 | 成都光创联科技有限公司 | Optical path detection device of multi-port composite optical path device and assembly method |
-
2022
- 2022-05-24 CN CN202221261980.7U patent/CN217428124U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116429381A (en) * | 2023-06-02 | 2023-07-14 | 成都光创联科技有限公司 | Optical path detection device of multi-port composite optical path device and assembly method |
| CN116429381B (en) * | 2023-06-02 | 2023-08-18 | 成都光创联科技有限公司 | Optical path detection device of multi-port composite optical path device and assembly method |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102201864B (en) | Loss testing apparatus for multi-channel optical device | |
| US8583395B2 (en) | Self-testing optical transceiver | |
| CN204089820U (en) | optical module performance parameter testing device | |
| US5299293A (en) | Protection arrangement for an optical transmitter/receiver device | |
| CN101430242B (en) | Apparatus and method used for automatic test of erbium-doped fiber amplifier performance | |
| US8116638B2 (en) | Radio frequency (RF) signal receiver using optical processing and associated methods | |
| CN112422182B (en) | Multifunctional adjusting and measuring device and method for WDM (wavelength division multiplexing) optical module | |
| CN109274422B (en) | Optical module testing system and method | |
| CN217428124U (en) | Test system of light emission receiving assembly on-board equipment | |
| US20060147217A1 (en) | Self-testing optical transceiver controller using internalized loopbacks | |
| CN109239576B (en) | High-speed optical communication chip test system and method | |
| CN116684763A (en) | Optical distribution network device and signal processing method | |
| US8508237B2 (en) | Network analyzer calibrator having electrical and electrooptical components | |
| CN114895269A (en) | Multichannel phased array TR assembly amplitude-phase consistency test system and test method | |
| CN213602649U (en) | High-integration wavelength division module | |
| CN112688731A (en) | Multichannel TEC quick temperature change system | |
| CN107104727B (en) | Method and device for reporting state of optical module of optical line terminal | |
| CN113534079A (en) | Radio frequency signal delay and attenuation structure of radio height detector | |
| CN209767539U (en) | Device for generating test signal and test system | |
| CN109116484B (en) | Golden finger multiplexing circuit and optical module | |
| CN218601846U (en) | Airborne optical fiber video shunting equipment | |
| CN216751765U (en) | Device for evaluating transceiving performance parameters of optical module through multi-channel test | |
| CN115333617A (en) | Multichannel optical module evaluation board and optical module test system | |
| CN213693706U (en) | Multichannel TEC temperature change system | |
| CN110361166B (en) | Optical performance test method for coarse wavelength division multiplexer |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |