CN216845936U - Micrometer scribing calibrator - Google Patents

Abstract

The utility model relates to a micrometer scribing calibrator; the problems that in the prior art, the measurement result is not visual and the line pressing and off-line mixing is easy to occur in the detection by using a tool microscope are solved; the calibrator specifically comprises a support, a reticle and an amplifying part; the support comprises a lapping cylinder; an observation hole is axially formed in the lapping cylinder; the reticle is installed in the observation hole; the line scribing plate is made of transparent glass, and first scale marks are engraved on the line scribing plate; the first scale lines comprise horizontal scale lines and vertical scale lines; the range of the vertical scale lines is 0-0.30 mm; the range of the horizontal scale lines is-0.05-0.30 mm; the width between any adjacent scribed lines in the horizontal scale lines and the vertical scale lines is 0.01 mm; the part between the scribed line at the position 0.08 and the scribed line at the position 0.20, the part between the scribed line at the position 0.20 and the scribed line at the position 0.30, and the part between the scribed line at the position-0.05 and the scribed line at the position 0.10 of the transverse scale mark are respectively connected by thin lines; the magnifying piece is coaxially mounted above the viewing aperture.

Description

Micrometer scribing calibrator

Technical Field

The utility model relates to an accurate measurement device, concretely relates to micrometer groove calibrator and groove calibration method.

Background

According to JJG21-2008 micrometer verification regulation, the examined item 6 is as follows: reticle width and width difference; the items to be examined 9 are: the end face of the micro-cylinder conical surface is opposite to the millimeter-scale line of the fixed sleeve.

When the item 6 to be examined is developed, the "micrometer calibration procedure" requires: the reticle width of the micro-drum is 0.08-0.20 mm, the difference between the reticle width on the fixed sleeve and the reticle width on the micro-drum is not more than 0.03mm, the reticle width with the dial is 0.20-0.30 mm, and the reticle width difference is not more than 0.05 mm; the assay method given in the simultaneous assay protocol is: testing on a tool microscope; at least 3 scribed lines are randomly sampled and checked for width on a micro-drum or a scribing disk, and other methods meeting the uncertainty requirement can also be adopted for the detection.

When the item 9 to be examined is developed, the "micrometer calibration procedure" requires: when the lower measurement limit of the micrometer is adjusted correctly, and a zero scale line on the micro-cylinder is aligned with a longitudinal scale line of the fixed sleeve, the end face of the micro-cylinder is tangent to the right edge of the millimeter scale line of the fixed sleeve, if the end face of the micro-cylinder is not tangent, the pressing line is not more than 0.05mm, and the off-line is not more than 0.1 mm; the assay method given in the simultaneous assay protocol is: and after the lower measurement limit of the micrometer is adjusted correctly, when the end surface of the conical surface of the micro-cylinder is tangent to the right edge of any millimeter scribed line of the fixed sleeve, reading the offset of a zero scribed line of the micro-cylinder and a longitudinal scribed line of the fixed sleeve.

However, in the actual working process, the operation is carried out according to the verification method given by the verification rule, which is not particularly intuitive, and particularly, the line pressing and off-line mixing is easy to be carried out, so that the verification quality is influenced.

SUMMERY OF THE UTILITY MODEL

The utility model aims at solving the use tool microscope examination that exists among the prior art, measuring result is not directly perceived, to the problem of mixing easily of line ball, off-line, and provide a micrometer groove calibrator.

In order to achieve the above object, the utility model adopts the following technical scheme:

a micrometer reticle calibrator is characterized in that:

comprises a support, a reticle and an amplifying piece;

the support comprises a lapping cylinder;

the lapping cylinder is used for lapping with the micrometer, and an observation hole is axially arranged on the lapping cylinder; the reticle is installed in the observation hole and is vertical to the axis of the observation hole;

the line scribing plate is made of transparent glass, and first scale marks are engraved on the line scribing plate;

the first scale marks comprise second scale marks used for fixing the sleeve on the micrometer, fourth scale marks on a dial of the micrometer, transverse scale marks used for calibrating the width of a third scale mark of a micro-cylinder on the micrometer, and vertical scale marks used for calibrating the offset of a zero scale mark of the third scale mark on the micro-cylinder and the second scale marks of the fixing sleeve; the range of the vertical scale lines is 0-0.30 mm; the range of the horizontal scale lines is-0.05-0.30 mm;

the width between any adjacent scribed lines in the horizontal scale lines and the vertical scale lines is 0.01 mm;

the part between the scribed line at the position 0.08 and the scribed line at the position 0.20, the part between the scribed line at the position 0.20 and the scribed line at the position 0.30, and the part between the scribed line at the position-0.05 and the scribed line at the position 0.10 of the transverse scale mark are respectively connected by thin lines;

the magnifying piece is coaxially installed above the observation hole and used for magnifying and observing the first scale mark, the second scale mark, the third scale mark and the fourth scale mark.

Further, the magnifying piece is a 15-time magnifying glass.

Furthermore, the lower end of the lapping cylinder is provided with a slot with an opening on the side surface;

the slot is communicated with the observation hole, and the reticle is inserted into the slot from outside to inside and enters the observation hole.

Further, the support also comprises a hollow adjusting cylinder;

the adjusting cylinder is in threaded connection with the upper end of the lapping cylinder;

the amplifying part is arranged in the adjusting cylinder.

Further, the holder further comprises a light source assembly;

the light source component comprises a light source, a switch and a power supply;

the light source is arranged inside the lapping cylinder;

the switch is arranged on the lapping barrel and used for controlling the switch of the light source;

the power supply is arranged on the lapping barrel and used for supplying power to the light source.

Furthermore, the lower end surface of the lap joint cylinder is an inwards concave cylindrical surface; the concave cylindrical surface is matched with the cylindrical surface at the large end of the micro-cylinder of the micrometer;

or the lower end surface of the lap joint cylinder is a plane surface; the plane surface is contacted with the dial surface of the dial micrometer in the micrometer.

The utility model has the advantages that:

1. the utility model discloses a micrometer groove calibrator installs the back on the micrometer, can accomplish the measurement work of item 6 and item 9 examined simultaneously through the scale plate that sets up to accurately give fast: reticle width and width difference; the end face of the micro-cylinder conical surface is opposite to the millimeter-scale line of the fixed sleeve.

2. The utility model discloses a micrometer groove calibrator, it is lower to operating personnel's requirement, the last hand of being convenient for.

3. The utility model discloses a micrometer groove calibrator, simple structure, convenient to use are suitable for and promote on a large scale.

Drawings

FIG. 1 is a schematic structural view of an embodiment of a micrometer scribing calibration method of the present invention;

FIG. 2 is a schematic structural view (dial micrometer) of an embodiment of the micrometer scribing calibration method of the present invention;

fig. 3 is a schematic structural diagram (a) of an embodiment of a micrometer scribing calibrator of the present invention;

FIG. 4 is a cross-sectional view taken along the plane A-A in FIG. 3;

fig. 5 is a schematic external structural diagram (ii) of an embodiment of the micrometer scribing calibrator of the present invention;

fig. 6 is a schematic structural diagram of a reticle in an embodiment of the present invention;

fig. 7 is a schematic diagram of a first scale mark in an embodiment of the present invention;

FIG. 8 is a cross-sectional view of an embodiment of the micrometer scale reticle marker of the present invention;

FIG. 9 is a schematic structural view of an observation window of the micrometer according to an embodiment of the present invention;

fig. 10 is a schematic structural view of the observation window of the micrometer scale in the embodiment of the present invention.

In the figure, 1-magnifying glass; 2-adjusting the cylinder; 3-a lap joint cylinder; 31. an observation window; 32. a barrel; 33. a slot; 4-a light source; 5-a line scribing board; 6-concave cylindrical surface; 7-a switch; 8-a power supply; 9-micrometer; 10-fixing the sleeve; 11-micro-cartridges; 12-reticle calibrator; 13-a viewing aperture; 14-horizontal scale line; 15-vertical scale lines; 16. a planar surface.

Detailed Description

To make the objects, advantages and features of the present invention clearer, the micrometer scale marking device provided by the present invention will be described in further detail with reference to the accompanying drawings and specific embodiments. The advantages and features of the present invention will become more apparent from the following detailed description. It should be noted that: the drawings are in a very simplified form and are not to precise scale, and are provided solely for the purpose of facilitating and distinctly aiding in the description of the embodiments of the present invention; second, the structures shown in the drawings are often part of actual structures.

In the description of the present invention, it should be noted that the terms "first" and "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.

The present invention will be described in detail with reference to the accompanying drawings and specific embodiments.

The micrometer reticle calibrator disclosed by the embodiment comprises a support, a reticle 5, a light source assembly, a reticle 5 and an amplifying piece 1 adopting a 15-time magnifier as shown in fig. 3, 4 and 5, wherein the reticle 5 is made of transparent glass;

the support comprises a lapping cylinder 3 and an adjusting cylinder 2, wherein the lapping cylinder 3 comprises an observation window 31 and a cylinder body 32 which are connected with each other; the light source assembly comprises a light source 4, a switch 7 and a power supply 8.

First scale marks are marked on the line scribing plate 5 according to the verification principles of JJG21-2008 micrometer verification regulations, the item 6 to be detected (the width and the width difference of the scribed line) and the item 9 to be detected (the relative position of the end face of the conical surface of the micro-cylinder and the millimeter scribed line of the fixed sleeve), and the first scale marks comprise horizontal scale marks 14 and vertical scale marks 15; the scale line spacing of the first scale line covers the scale line sizes of the item 6 to be detected and the item 9 to be detected, the scale division value of the scale line is 0.01mm, and the scale line precision is not more than 3 mu m.

According to the requirements of micrometer calibration regulation: the width of the scribed line of the fixed sleeve is 0.08-0.20 mm; the width of the scribed line with the dial is 0.20-0.30 mm, so that a section of 0.08-0.20 mm and a section of 0.20-0.30 mm on the horizontal scale line 14 are designed, and all the sections are connected by thin lines; when two measurement lower limits of the micrometer 9 are adjusted correctly, the zero scale line on the micro-cylinder is aligned with the longitudinal scale line of the fixed sleeve, the end face of the micro-cylinder is tangent to the right edge of the millimeter scale line of the fixed sleeve, if the zero scale line is not tangent, the pressing line is not more than 0.05mm, and the off-line is not more than 0.1mm, so that the designed-0.05-0.10 mm section on the transverse scale line 14 is connected by a thin line.

According to the requirements of micrometer calibration regulation: the reticle width of the micro-drum is 0.08-0.20 mm; the width of the reticle with the dial plate is 0.20-0.30 mm. Therefore, the range of the vertical scale line 15 is designed to be 0-0.30 mm, and in conclusion, the first scale line of fig. 6 is obtained.

As shown in fig. 3-5, the specific connection relationship of the components is as follows:

the overlap joint section of thick bamboo 3 is last to be opened there is observation hole 13, and slot 33 is seted up to observation window 31, and slot 33 is inserted from outside-in to reticle 5, and reticle 5 installs in observation hole 13 and perpendicular with observation hole 13 axis, and 3 upper end threaded connection hollow regulation section of thick bamboo 2 of overlap joint section of thick bamboo are adjusted and are connected amplification piece 1 on 2, can realize the regulation of the distance between amplification piece 1 and the reticle 5 through the height of adjusting regulation section of thick bamboo 2.

As shown in fig. 6 and 7, the range of the vertical scale line 15 is 0-0.30 mm; the range of the horizontal scale line 14 is-0.05-0.30 mm; the width between any adjacent marked lines in the horizontal scale lines 14 and the vertical scale lines 15 is 0.01 mm; the positions between the reticle at 0.08 and 0.20, between the reticle at 0.20 and the reticle at 0.30, and between the reticle at-0.05 and the reticle at 0.10 of the horizontal scale line 14 are respectively connected by thin lines.

The light source 4 is arranged in the lap joint barrel 3, and the power supply 8 and the switch 7 are arranged outside the barrel body 32, so that the power supply to the light source 4 can be realized, and the switch of the light source 4 can be controlled.

As shown in fig. 9, the lower end surface of the observation window 31 is an inner concave cylindrical surface 6; the concave cylindrical surface 6 is matched with the cylindrical surface of the large end of the micro-cylinder of the micrometer 9.

Alternatively, as shown in fig. 8 and 10, the lower end surface of the observation window 31 is a plane surface 16; the plane surface 16 is in contact with the dial surface of the dial micrometer in the micrometer 9.

The micrometer reticle calibration method using the calibrator of the embodiment, as shown in fig. 1 and fig. 2, includes the following steps:

the method comprises the following steps: lapping a micrometer reticle calibrator 12 on the micrometer 9;

step two: measuring the micrometer 9 according to the detected item 6

2.1) measuring a second scale mark and recording data, wherein the second scale mark comprises a longitudinal scale line and a millimeter scale line;

aligning the 0 scale line of the horizontal scale line 14 to the left end of any scale line on the second scale line, simultaneously observing the position of the right end of the scale line on the horizontal scale line 14, recording data and judging whether the scale line width meets the requirement; wherein, the second scale mark is a scale line on the fixed sleeve 10;

if the width of the second scale mark of the fixed sleeve 10 on the micrometer 9 is within 0.08-0.20 mm of the transverse scale mark 14; the width of the scribed line can be judged to meet the requirement; randomly sampling at least three scribed lines on the second scale line to measure;

2.2) measuring the third scale mark or the fourth scale mark and recording data

Aligning the 0 scale line of the vertical scale line 15 to the left end of any scale line on the third scale line, simultaneously observing the position of the right end of the scale line on the vertical scale line 15, recording data and judging whether the scale line width meets the requirement;

if the width of the third scale mark on the micro-drum 11 is within 0.08-0.20 mm of the vertical scale mark 15, the width of the third scale mark can be judged to meet the requirement;

or aligning the 0-scale line of the vertical scale mark 15 or the 0-scale line of the horizontal scale mark 14 to the left end of any scale line on the fourth scale mark, simultaneously observing the position of the right end of the scale line on the vertical scale mark 15 or the horizontal scale mark 14, recording data and judging whether the scale line width meets the requirement;

if the width of the second scale mark of the dial on the dial micrometer 9 is within 0.20-0.30 mm of the vertical scale mark 15 or the horizontal scale mark 14, the width of the scale mark can be judged to meet the requirement;

2.3) judging whether the reticle width difference of the second scale mark, the third scale mark and the fourth scale mark meets the requirement

2.3.1) repeating the steps 2.1 and 2.2 for a plurality of times, and recording the obtained data;

2.3.2) making a difference between the maximum value and the minimum value in the data measured by the second scale mark, and judging whether the standard requirement of the scale line width difference of the second scale mark is met or not;

the scale line width difference standard of the second scale line is as follows: the width difference is not more than 0.03 mm;

the maximum value and the minimum value in the data measured by the third scale mark are differentiated, and whether the standard requirement of the scale line width difference of the third scale mark is met or not is judged;

the scale line width difference standard of the third scale line is as follows: the width difference is not more than 0.03 mm;

the maximum value and the minimum value in the data measured by the fourth scale mark are differentiated, and whether the standard requirement of the scale line width difference of the fourth scale mark is met or not is judged;

the scale line width difference standard of the fourth scale line is as follows: the width difference is not more than 0.05 mm;

randomly sampling at least three scribed lines on the second scale mark, the third scale mark or the fourth scale mark to measure;

step three: measuring the micrometer 9 according to the detected item 9

After the lower limit adjustment of the micrometer 9 is correct, aligning the 0 scale line on the third scale line with the longitudinal scale line of the second scale line, checking whether the end surface of the micro-cylinder 11 is tangent to the right edge of the millimeter scale line of the second scale line of the fixed sleeve 10, recording data and judging whether the requirements of judgment standards are met;

if the end surface of the micro-drum 11 is tangent to the right edge of the millimeter scale line of the second scale mark of the fixed sleeve 10, the item to be detected meets the requirement;

if the two-dimensional micro-cylinder is not tangent, aligning the 0 scale line on the second scale line with the 0 scale line on the transverse scale line 14, and observing whether the end surface of the micro-cylinder is in the range of-0.05-0.10 mm, if so, judging that the detected item meets the requirement.

Claims (6)

1. The utility model provides a micrometer graduation mark ware which characterized in that:

comprises a support, a reticle (5) and an amplifying piece (1);

the support comprises a lapping barrel (3);

the lapping cylinder (3) is used for lapping with the micrometer (9), and an observation hole (13) is axially formed in the lapping cylinder (3); the reticle (5) is installed in the observation hole (13) and is vertical to the axis of the observation hole (13);

the line scribing plate (5) is made of transparent glass, and first scale marks are engraved on the line scribing plate (5);

the first scale mark comprises a second scale mark for fixing the sleeve (10) on the micrometer (9), a fourth scale mark on a dial of the micrometer (9), a transverse scale mark (14) for calibrating the width of a third scale mark of a micro-drum (11) on the micrometer (9), and a vertical scale mark (15) for calibrating the marking zero of the third scale mark on the micro-drum (11) and the offset of the second scale mark of the fixing sleeve (10); the range of the vertical scale mark (15) is 0-0.30 mm; the range of the horizontal scale mark (14) is-0.05-0.30 mm;

the width between any adjacent marked lines in the horizontal scale lines (14) and the vertical scale lines (15) is 0.01 mm;

the part between the 0.08 position of the horizontal scale mark (14) and the 0.20 position of the horizontal scale mark, the part between the 0.20 position of the horizontal scale mark and the 0.30 position of the horizontal scale mark, and the part between the-0.05 position of the horizontal scale mark and the 0.10 position of the horizontal scale mark are respectively connected by thin lines;

the magnifying piece (1) is coaxially installed above the observation hole (13) and used for magnifying and observing the first scale mark, the second scale mark, the third scale mark and the fourth scale mark.

2. The micrometer reticle calibrator according to claim 1, wherein: the magnifying piece (1) is a 15-time magnifying glass.

3. The micrometer reticle calibrator according to claim 2, wherein:

the lower end of the lapping barrel (3) is provided with a slot (33) with an opening on the side surface;

the slot (33) is communicated with the observation hole (13), and the reticle (5) is inserted into the slot (33) from outside to inside and enters the observation hole (13).

4. A micrometer scribe line marker according to claim 1, 2 or 3, wherein:

the support also comprises a hollow adjusting cylinder (2);

the adjusting cylinder (2) is in threaded connection with the upper end of the lapping cylinder (3);

the amplifying part (1) is arranged in the adjusting cylinder (2).

5. The micrometer reticle calibrator according to claim 4, wherein:

the holder further comprises a light source assembly;

the light source assembly comprises a light source (4), a switch (7) and a power supply (8);

the light source (4) is arranged inside the lapping cylinder (3);

the switch (7) is arranged on the lapping barrel (3) and is used for controlling the switch of the light source (4);

the power supply (8) is arranged on the overlapping cylinder (3) and used for supplying power to the light source (4).

6. The micrometer reticle calibrator according to claim 5, wherein:

the lower end surface of the lapping cylinder (3) is an inner concave cylindrical surface (6); the concave cylindrical surface (6) is matched with a large-end cylindrical surface of a micro-cylinder (11) of the micrometer (9);

or the lower end surface of the lapping cylinder (3) is a plane surface (16); the plane surface (16) is contacted with the dial surface of the dial micrometer in the micrometer (9).

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