CN216696548U - Testing device and testing system - Google Patents
Testing device and testing system Download PDFInfo
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- CN216696548U CN216696548U CN202122681922.1U CN202122681922U CN216696548U CN 216696548 U CN216696548 U CN 216696548U CN 202122681922 U CN202122681922 U CN 202122681922U CN 216696548 U CN216696548 U CN 216696548U
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Abstract
The application discloses testing arrangement and test system. The testing device is used for detecting different types of elements to be tested or different functions of the elements to be tested, and comprises: the test board and the adapter board are detachably connected, and the adapter board corresponds to at least one type of element to be tested; the test board comprises a plurality of functional interfaces, a first circuit and a connecting component, wherein the first circuit is electrically connected with each functional interface and the connecting component respectively; the adapter plate is provided with a component mounting part and a second circuit electrically connected with the component mounting part; the component mounting part is used for mounting a component to be tested so as to electrically connect the component to be tested with the second circuit; the connecting assembly is used for butting the first circuit and the second circuit so that the element to be tested is electrically connected with at least one functional interface to test the element to be tested. By the test device, different functions of different types of system-in-package can be tested, and the adaptability of the test device can be improved.
Description
Technical Field
The application belongs to the technical field of chip testing equipment, and particularly relates to a testing device and a testing system.
Background
With the development of the semiconductor industry in China, various SiP (System in Package) module products are developed, and meanwhile, the testing of the SiP module products is also the key point of research, development and production.
When testing the functions and performances of different SiP module products, different testing devices need to be developed, which causes waste of manpower and time for many developers.
SUMMERY OF THE UTILITY MODEL
The present application provides a testing apparatus and a testing system to solve the above technical problems.
In order to solve the technical problem, the application adopts a technical scheme that: there is provided a test apparatus for testing different types of components to be tested or different functions of the components to be tested, the test apparatus comprising: the test board and the adapter board are detachably connected, and the adapter board corresponds to at least one type of element to be tested;
the test board comprises a plurality of functional interfaces, a first circuit and a connecting component, wherein the first circuit is electrically connected with each functional interface and the connecting component respectively;
the adapter plate is provided with a component mounting part and a second circuit electrically connected with the component mounting part; the component mounting part is used for mounting the component to be tested so as to electrically connect the component to be tested with the second circuit;
the connecting assembly is used for butting the first circuit and the second circuit so that the element to be tested is electrically connected with at least one functional interface to test the element to be tested.
Optionally, the multiple functional interfaces include a first type functional interface and a second type functional interface;
the first type of functional interface is used for being electrically connected with a first testing mechanism, and the first testing mechanism can send a testing signal to the element to be tested through the first type of functional interface;
the second type functional interface is used for being electrically connected with a second testing mechanism, and the second testing mechanism is electrically connected with the second testing mechanism and can respond to the element to be tested so as to realize at least one function of the element to be tested.
Optionally, the second type of function interface includes: the device comprises at least two of a high-definition multimedia interface, a serial hard disk interface, a controller local area network interface, a serial bus interface, a universal asynchronous receiving and transmitting transmitter interface, a flash memory chip interface and a double-rate synchronous dynamic random access memory interface.
Optionally, the multiple functional interfaces further include a general functional interface.
Optionally, the component mounting part is an adapter, and the adapter is fixedly mounted on a surface of one side of the adapter plate;
a conductive connecting part is arranged on the other side surface of the adapter plate and is electrically connected with the second circuit;
the connecting assembly comprises a butting part which is electrically connected with the conductive connecting part.
Optionally, the number of adaptors is at least two.
Optionally, a switch is disposed on the interposer, one end of the switch is electrically connected to the first circuit, and the other end of the switch is selectively electrically connected to one of the adapters.
Optionally, the adapter plate and the test plate are fixedly connected by a fastener.
Optionally, the fastener includes the connecting rod, connecting rod one end run through in proper order the keysets, coupling assembling and survey the board.
In order to solve the above technical problem, another technical solution adopted by the present application is: there is provided a test system comprising a test apparatus as described hereinbefore.
The beneficial effect of this application is: according to the scheme of the application, by arranging the multiple adapter plates, each adapter plate can be used for correspondingly installing one type of element to be tested, when different types of elements to be tested need to be tested, only different adapter plates need to be replaced (and the adapter plates can correspondingly install the preset types of elements to be tested), and then the adapter plates are butted with the test plates, so that the preset types of elements to be tested can be electrically connected with multiple functional interfaces on the test plates, and the elements to be tested can be tested. The scheme can ensure that the testing device can be used for testing various different types of elements to be tested, and the adaptability of the testing board is improved; in addition, a plurality of different functional interfaces can be arranged on the test board, so that different functions of the element to be tested can be tested.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, it is obvious that the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without inventive efforts, wherein:
FIG. 1 is a schematic structural diagram of an embodiment of a testing apparatus provided in the present application;
fig. 2 is a top view of a test board in the test apparatus of fig. 1.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
It should be noted that if directional indications (such as up, down, left, right, front, and back … …) are referred to in the embodiments of the present application, the directional indications are only used to explain the relative positional relationship between the components, the movement situation, and the like in a specific posture (as shown in the drawings), and if the specific posture is changed, the directional indications are changed accordingly.
In addition, if there is a description of "first", "second", etc. in the embodiments of the present application, the description of "first", "second", etc. is for descriptive purposes only and is not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In addition, technical solutions between various embodiments may be combined with each other, but must be realized by a person skilled in the art, and when the technical solutions are contradictory or cannot be realized, such a combination should not be considered to exist, and is not within the protection scope of the present application.
Please refer to fig. 1-2. FIG. 1 is a schematic structural diagram of an embodiment of a testing apparatus provided in the present application; fig. 2 is a top view of a test board in the test apparatus of fig. 1.
The test device 10 can be used for testing different types of components to be tested or different functions of components to be tested.
Wherein, testing arrangement 10 includes: the adapter plate 120 and the test plate 110 can be detachably connected, and the adapter plate 120 can correspond to at least one type of element to be tested.
The test board 110 includes a multi-function interface 111, a first circuit (not shown), and a connecting component 113.
The first circuit may include a plurality of conductive traces disposed on the surface and/or inside the test board 110, and the first circuit may form a connection circuit, through which the functional interfaces 111 and the connection components 113 may be electrically connected.
The interposer 120 is provided with a component mounting portion 121 and a second circuit (not shown in the figure) electrically connected to the component mounting portion 121; the component mounting part 121 is used for mounting a component to be tested to electrically connect the component to be tested with the second circuit; the second circuit may include a plurality of conductive traces disposed on the surface and/or inside the interposer 120.
The first circuit and the second circuit can be connected by the connecting component 113, so that the element to be tested is electrically connected to the at least one functional interface 111 to test the element to be tested.
Therefore, in the scheme of the application, multiple adapter plates 120 may be adopted, each adapter plate 120 may be used to correspondingly mount one type of element to be tested, when different types of elements to be tested need to be tested, only different adapter plates 120 need to be replaced (and the adapter plates 120 may correspondingly mount preset types of elements to be tested), and then the adapter plates 120 are butted with the test plate 110, so that the preset types of elements to be tested may be electrically connected with the multiple functional interfaces 111 on the test plate 110, and thus the element to be tested may be tested. The scheme can ensure that the testing device 10 can be used for testing various different types of elements to be tested, and the adaptability of the testing board 110 is improved; in addition, a plurality of different functional interfaces 111 can be provided on the test board 110, so that different functions of the components to be tested can be tested.
Alternatively, the element to be tested may be a Sip packaged device. The Sip package device may generally package a plurality of chips with different functions, and the plurality of functional interfaces 111 may correspond to the plurality of chips with different functions, respectively.
In this embodiment, the multiple function interfaces 111 include a first type function interface and a second type function interface.
The first type of functional interface 114 may be configured to electrically connect to a first testing mechanism, which is capable of sending a test signal to a device under test through the first type of functional interface 114. The first type of functional interface may be a PCI-E (peripheral component interconnect express) interface.
The second type functional interface is used for being electrically connected with a second testing mechanism, and the second testing mechanism is electrically connected with a to-be-tested element so as to respond to the to-be-tested element to realize at least one function of the to-be-tested element.
Optionally, the second type of functional interface includes: high Definition Multimedia Interface (HDMI) 1151, Serial Advanced Technology Attachment (SATA) interface 1152, Controller Area Network (CAN) interface 1153, Serial Bus (USB) interface 1154, Universal Asynchronous Receiver Transmitter (UART) interface 1155, Flash memory chip (Flash) interface 1156, Double Data synchronous dynamic random access memory (DDR) interface 1157, and gigabit Network interface 1158.
In one embodiment, all the above functional interfaces may be disposed on the test board 110. When the preset function of the element to be tested needs to be detected, the preset second-type function interface 115 can be electrically connected with the corresponding second testing mechanism, the first-type function interface 114 can be used for being electrically connected with the first testing mechanism, a testing signal can be sent to the element to be tested through the first testing mechanism, and after the element to be tested receives the testing signal, the second-type function interface can be in communication connection with the second testing mechanism, so that the function corresponding to the element to be tested is detected.
Taking the second type of functional interface as the high-definition multimedia interface 1151 as an example, the high-definition multimedia interface 1151 may be configured to perform communication connection with a high-definition multimedia device (that is, a corresponding second testing mechanism), at this time, the to-be-tested element may be configured to drive the high-definition multimedia device to operate, and a test signal may be sent to the to-be-tested element by using the first testing mechanism, so that the to-be-tested element may drive the high-definition multimedia device to operate different functions (for example, playing video, sound, and the like), thereby detecting the function that the to-be-tested element drives the high-definition multimedia device to operate.
Furthermore, other second-type function interfaces may be respectively and correspondingly connected to second testing mechanisms of different types, for example, the serial hard disk interface 1152 may be connected to a corresponding serial hard disk, and the element to be tested may be connected to the serial hard disk through the serial hard disk interface 1152, so as to implement detection of functions of reading and storing data of the element to be tested. Other second type of function interface functions may be analogized in turn and are not further described herein.
Optionally, the multiple function interfaces 111 further include a third type function interface 116, wherein the third type function interface 116 may be a general function interface, wherein the general function interface may correspond to a general function of the multiple chips, such as whether the electrical connection of the chip is smooth, and functions of input and output, etc.
Please further refer to fig. 1 and 2.
In this embodiment, the component mounting portion 121 may be an adaptor, and the adaptor is fixedly mounted on a side surface of the adaptor plate 120; the other side surface of the interposer 120 is provided with a conductive connection portion 122, and the conductive connection portion 122 can be electrically connected with a first circuit; the connecting assembly 113 includes an abutting portion 1131, and the abutting portion 1131 can be electrically connected to the conductive connecting portion 122, so as to electrically connect the first circuit on the test board 110 to the second circuit on the interposer 120.
The component mounting portion 121 is detachably fixed to the interposer 120, and may be fixed to the interposer 120 by welding or by a fastener such as a screw.
Similarly, the connecting component 113 may also be a single adaptor, wherein the connecting component 113 includes a plurality of pins, and one end of each pin may be electrically connected to the first circuit, and the other end of each pin may form an abutting portion 1131, and may be electrically connected to the conductive connecting portion 122 through the abutting portion 1131.
The connecting assembly 113 may also be detachably mounted on the test board 110, and the abutting portion 1131 of the connecting assembly 113 may be abutted against the conductive connecting portion 122, or may be adhered by a conductive adhesive, or may be welded and fixed.
In the above embodiment, the interposer 120 may be provided with a component mounting portion 121. In other embodiments, the interposer 120 may be provided with at least two component mounting portions 121, and each component mounting portion 121 may be mounted with one component to be tested.
A switch may be further disposed on the adapter board 120, one end of the switch is electrically connected to the second circuit of the adapter board 120, and the other end of the switch is selectively electrically connected to one of the component mounting portions 121. That is, different component mounting parts 121 (i.e., different components to be tested) can be selectively connected to the second circuit through the switch, so that it is possible to detect functions of at least two different components to be tested by using one interposer 120.
Further, in this embodiment, the adapter plate 120 and the test plate 110 are fixedly connected by a fastener 130.
The fastening member 130 includes a connecting rod 131, and one end of the connecting rod 131 sequentially penetrates through the adapter plate 120 and the connecting assembly 113 and then is connected to the test plate 110.
The connecting rod 131 may be a screw rod, and the adapter plate 120 and the test plate 110 may be detachably and fixedly connected by fastening with a nut.
In order to solve the above technical problem, another technical solution adopted by the present application is: a test system is provided comprising a test apparatus 10 as hereinbefore described.
Wherein the test system may further comprise a first test mechanism and a second test mechanism as described before.
In summary, those skilled in the art can easily understand that the beneficial effects of the present application are: through setting up multiple keysets, each keyset can be used for corresponding the one type of the awaiting measuring component of installation, when the awaiting measuring component of the different grade type that needs to test, only need to change different keysets (and this keyset can correspond the awaiting measuring component of the type of installation presetting), and then dock this keyset with the survey test panel, thereby can wait the awaiting measuring component of the type that should predetermine and survey the multiple function interface on the test panel and carry out the electricity to be connected, thereby can realize testing this awaiting measuring component. The scheme can ensure that the testing device can be used for testing various different types of elements to be tested, and the adaptability of the testing board is improved; in addition, a plurality of different functional interfaces can be arranged on the test board, so that different functions of the element to be tested can be tested.
The above description is only an example of the present application and is not intended to limit the scope of the present application, and all modifications of equivalent structures and equivalent processes, which are made by the contents of the specification and the drawings, or which are directly or indirectly applied to other related technical fields, are intended to be included within the scope of the present application.
Claims (10)
1. A test device for testing different types of components to be tested or different functions of the components to be tested, the test device comprising: the test board and the adapter board are detachably connected, and the adapter board corresponds to at least one type of the element to be tested;
the test board comprises a plurality of functional interfaces, a first circuit and a connecting component, wherein the first circuit is electrically connected with each functional interface and the connecting component respectively;
the adapter plate is provided with a component mounting part and a second circuit electrically connected with the component mounting part; the component mounting part is used for mounting the component to be tested so as to electrically connect the component to be tested with the second circuit;
the connecting assembly is used for butting the first circuit and the second circuit so that the element to be tested is electrically connected with at least one functional interface to test the element to be tested.
2. The test device of claim 1,
the multiple functional interfaces comprise a first type functional interface and a second type functional interface;
the first type of functional interface is used for being electrically connected with a first testing mechanism, and the first testing mechanism can send a testing signal to the element to be tested through the first type of functional interface;
the second type functional interface is used for being electrically connected with a second testing mechanism, and the second testing mechanism is electrically connected with the second testing mechanism and can respond to the element to be tested so as to realize at least one function with the element to be tested.
3. The test device of claim 2,
the second type of functional interface comprises: the device comprises at least two of a high-definition multimedia interface, a serial hard disk interface, a controller local area network interface, a serial bus interface, a universal asynchronous receiving and transmitting transmitter interface, a flash memory chip interface and a double-rate synchronous dynamic random access memory interface.
4. The test device of claim 2,
the multiple function interface also includes a universal function interface.
5. The test device according to any one of claims 1 to 4,
the component mounting part is an adapter, and the adapter is fixedly mounted on the surface of one side of the adapter plate;
a conductive connecting part is arranged on the other side surface of the adapter plate and is electrically connected with the first circuit;
the connecting assembly comprises a butting part which is electrically connected with the conductive connecting part.
6. The test device of claim 5,
the number of the adapters is at least two.
7. The test device of claim 6,
the adapter plate is provided with a switch, one end of the switch is electrically connected with the second circuit, and the other end of the switch is selectively and electrically connected with one of the adapters.
8. The test device of claim 5,
the adapter plate is fixedly connected with the test plate through a fastener.
9. The test device of claim 8,
the fastener includes the connecting rod, connecting rod one end runs through in proper order the keysets, coupling assembling reaches survey test panel.
10. A test system, characterized in that it comprises a test apparatus according to any of claims 1-9.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122681922.1U CN216696548U (en) | 2021-11-02 | 2021-11-02 | Testing device and testing system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122681922.1U CN216696548U (en) | 2021-11-02 | 2021-11-02 | Testing device and testing system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN216696548U true CN216696548U (en) | 2022-06-07 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202122681922.1U Active CN216696548U (en) | 2021-11-02 | 2021-11-02 | Testing device and testing system |
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| CN (1) | CN216696548U (en) |
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- 2021-11-02 CN CN202122681922.1U patent/CN216696548U/en active Active
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Inventor after: Zeng Quan Inventor after: Liu Jianhui Inventor before: Zeng Quan |