CN216082871U - Probe row adjusting device and probe testing device - Google Patents
Probe row adjusting device and probe testing device Download PDFInfo
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- CN216082871U CN216082871U CN202122439648.7U CN202122439648U CN216082871U CN 216082871 U CN216082871 U CN 216082871U CN 202122439648 U CN202122439648 U CN 202122439648U CN 216082871 U CN216082871 U CN 216082871U
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Abstract
The utility model belongs to the technical field of solar cells and discloses a probe row adjusting device and a probe testing device. The probe test device comprises the probe row adjusting device, so that the probe row position adjusting operation is also simplified, and the accuracy of the probe row position adjustment is improved.
Description
Technical Field
The utility model relates to the technical field of solar cells, in particular to a probe row adjusting device and a probe testing device.
Background
When the solar cell is produced, the solar cell needs to be tested, the electrode of the cell is usually tested by using a probe row distributed with a plurality of probes in actual work, and a plurality of probe rows are needed in each test. The test positions of the battery pieces of different models are different, so that the distance between two adjacent probe rows is different for the battery pieces of different models.
When different battery piece products are switched, the probe testing device in the prior art needs to manually adjust the distance between two adjacent probe banks, the position accuracy of the adjusted probe banks is low, usually after manual adjustment, multiple pretests need to be carried out, namely whether the data tested by the probe banks is abnormal or not is checked, and formal testing is started again after the data tested by the probe banks are adjusted and pretested for multiple times until the data tested by the probe banks are abnormal. Thus, manually adjusting the probe bank is cumbersome and time consuming.
Therefore, how to simplify the adjustment of the position of the probe bank and improve the accuracy of the adjustment of the position of the probe bank is a technical problem that needs to be solved by those skilled in the art.
SUMMERY OF THE UTILITY MODEL
An object of the present invention is to provide a probe bar adjusting apparatus capable of simplifying a probe bar position adjusting operation and also capable of improving the accuracy of the probe bar position adjustment.
In order to achieve the purpose, the utility model adopts the following technical scheme:
a probe row adjustment apparatus comprising:
the first guide moving part comprises a first guide part and a first moving part, the first guide part is movably connected with the first moving part, the first moving part can move along the length direction of the first guide part, the first moving part can be fixedly connected with the probe row, and the length direction is the position adjusting direction of the probe row;
the transmission assembly comprises a gear and a rack, the gear is meshed with the rack, and the rack is connected with the first moving piece;
the driving device can drive the gear to rotate so as to drive the rack, the first moving piece and the probe row to move;
and the controller is in signal connection with the driving device and is used for controlling the starting and stopping of the driving device.
Optionally, the first guide member includes a rolling groove, and the first moving member is a rolling bearing, and the rolling groove is in rolling fit with the rolling bearing.
Optionally, one of the first guide member and the first moving member is provided with a slide rail, and the other is provided with a slide groove, and the slide rail is in sliding fit with the slide groove.
Optionally, the probe row further comprises a second guide moving part, the second guide moving part comprises a second guide part and a second moving part, the second guide part is movably connected with the second moving part, the second moving part can move along the length direction of the second guide part, the length direction of the second guide part is the same as the length direction of the first guide part, the first moving part can be fixedly connected with one end of the probe row, and the second moving part can be fixedly connected with the other end of the probe row.
Optionally, one of the second guide member and the second moving member is provided with a slide rail, and the other is provided with a slide groove, and the slide rail is in sliding fit with the slide groove.
Optionally, the second guide member includes a rolling groove, and the second moving member is a rolling bearing, and the rolling groove is in rolling fit with the rolling bearing.
Optionally, the first moving parts, the transmission assembly and the driving device are arranged in groups, and the multiple groups of first moving parts are movably connected with the same first guide part.
Another object of the present invention is to provide a probe test apparatus, which can also simplify the operation of adjusting the position of the probe bar and improve the accuracy of adjusting the position of the probe bar.
In order to achieve the purpose, the utility model adopts the following technical scheme:
a probe testing device comprises a probe row and the probe row adjusting device, wherein the probe row is fixedly connected with a first moving member of the probe row adjusting device.
Optionally, the first moving member, the transmission assembly, the driving device and the probe card of the probe card adjusting device are arranged in groups, and the first moving members of the multiple groups are movably connected with the first guide member of the same probe card adjusting device.
Optionally, the number of the second moving members of the probe row adjusting device is multiple, the multiple second moving members correspond to the multiple groups of probe rows one to one, one end of each group of probe rows is fixedly connected with the first moving member of the same group, and the other end of each group of probe rows is fixedly connected with the corresponding second moving member.
Has the advantages that:
the probe row adjusting device comprises a first guide moving part, a transmission assembly, a driving device and a controller, wherein the controller is in signal connection with the driving device, the driving device drives a first moving member to move along the length direction of the first guide member through transmission of the transmission assembly, and the probe row is connected with the first moving member, so that the probe row can move along the length direction of the first guide member under the driving of the driving device, the moving distance of the probe row is controlled by controlling the rotation of the driving device through the controller, the probe row position adjusting operation is simplified, and the accuracy of the probe row position adjustment is effectively improved. When the test device corresponds to different battery piece products, the test position of the probe row can be switched rapidly and accurately. Simultaneously, first guide has played the guide effect for the removal of first moving member and probe row, has further improved the degree of accuracy of probe row position adjustment.
Drawings
Fig. 1 is a schematic structural diagram of a probe bank adjustment apparatus according to an embodiment.
In the figure:
100. a first guide moving part; 110. a first guide member; 120. a first moving member; 200. a transmission assembly; 210. a gear; 220. a rack; 300. a drive device; 400. a second guide moving part; 410. a second guide member; 420. a second moving member; 500. and (4) probe rows.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the utility model and are not limiting of the utility model. It should be further noted that, for the convenience of description, only some of the structures related to the present invention are shown in the drawings, not all of the structures.
In the description of the present invention, unless expressly stated or limited otherwise, the terms "connected," "connected," and "fixed" are to be construed broadly, e.g., as meaning permanently connected, removably connected, or integral to one another; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
In the present invention, unless otherwise expressly stated or limited, "above" or "below" a first feature means that the first and second features are in direct contact, or that the first and second features are not in direct contact but are in contact with each other via another feature therebetween. Also, the first feature being "on," "above" and "over" the second feature includes the first feature being directly on and obliquely above the second feature, or merely indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.
In the description of the present embodiment, the terms "upper", "lower", "right", etc. are used in an orientation or positional relationship based on that shown in the drawings only for convenience of description and simplicity of operation, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first" and "second" are used only for descriptive purposes and are not intended to have a special meaning.
Example one
The embodiment provides a probe row adjusting device, which can simplify the operation of adjusting the position of a probe row and can effectively improve the accuracy of adjusting the position of the probe row.
Specifically, as shown in fig. 1, the probe row adjusting device includes a first guiding and moving part 100, the first guiding and moving part 100 includes a first guiding element 110 and a first moving element 120, the first guiding element 110 is movably connected to the first moving element 120, the first moving element 120 can be fixedly connected to the probe row 500, and the first moving element 120 can move along a length direction of the first guiding element 110, the length direction is a direction in which the probe row 500 needs to be adjusted, and is an up-down direction in fig. 1. The probe row adjusting device further comprises a transmission assembly 200, wherein the transmission assembly 200 comprises a gear 210 and a rack 220, the gear 210 is meshed with the rack 220, and the rack 220 is connected with the first moving part 120 through a connecting shaft. The probe row adjusting device further comprises a controller and a driving device 300, the controller is in signal connection with the driving device 300, the driving device 300 is fixedly arranged at the fixed ends of a support or a workbench and the like, the driving device 300 is connected with a gear 210 through a connecting shaft, the driving device 300 can drive the gear 210 to rotate so as to drive a rack 220 to move linearly, the rack 220 drives a first moving piece 120 and a probe row 500 to move linearly along the direction to be adjusted of the probe row 500 while moving linearly, and the controller controls the start and stop of the driving device 300 and the driving device 300 to drive the gear 210 to rotate at an angle and a number of turns.
The driving device 300 may be a servo motor and a reducer connected by a connecting shaft, or may be a reduction motor, or may be a rotary cylinder, or may be another device or a combination device capable of driving the gear 210 to rotate, which is not listed here.
In the probe row adjusting device provided by this embodiment, the driving device 300 is connected to the gear 210 through the connecting shaft, the gear 210 is engaged with the rack 220, the rack 220 is connected to the first moving member 120 through the connecting shaft, the first moving member 120 is movably connected to the first guide member 110, and the first moving member 120 can move along the length direction of the first guide member 110, so as to realize transmission through the gear 210 and the rack 220, the driving device 300 drives the first moving member 120 to move along the length direction of the first guide member 110, and fixedly connects the first moving member 120 to the probe row 500, so that the first moving member 120 drives the probe row 500 to move together while moving, the driving device 300 is connected to the controller, the controller controls the start and stop of the driving device 300, thereby realizing the automatic operation of adjusting the position of the probe row 500, and controlling the rotation angle and the number of rotations of the driving gear 210 by the controller, the automatic operation of the position adjustment distance of the probe line 500 is realized. Compared with the manual adjustment mode in the prior art, the adjustment operation of the position of the probe bank 500 is effectively simplified, and the adjustment precision of the position of the probe bank 500 is improved. When the test position of the probe card row 500 is switched rapidly and accurately corresponding to different battery piece products. On the other hand, the first guide 110 is provided such that the first moving member 120 and the probe bank 500 can move along the length direction of the first guide 110 (i.e., the adjustment direction of the probe bank 500), thereby further improving the accuracy of the adjustment of the position of the probe bank 500.
It is understood that in other embodiments, a piston cylinder may be further provided, and the driving end of the piston cylinder is directly connected to the first moving member 120, and the piston cylinder is connected to the controller by a signal, and the first moving member 120 is driven by the piston cylinder to move linearly in the length direction of the first guide member 110. Of course, other driving devices 300 capable of replacing the piston cylinder may be provided and directly connected to the first moving member 120 to drive the first moving member 120 to perform a linear motion.
Preferably, in practical application, corresponding test position parameters of different battery piece products can be preset in the controller, when the battery piece products are replaced, the corresponding battery piece product models are selected on the controller, and the controller controls the driving device 300 according to preset values, so that the operation of adjusting the positions of the probe row 500 is further simplified, the product switching time is shortened, and the probe row adjusting device can well meet the detection requirements of high-frequency and diversified battery piece products.
Optionally, the probe bank adjusting device provided in this embodiment further includes a bracket, and the rack 220 is disposed on the bracket, so that the height of the rack 220 is adapted to the height of the first moving member 120. As an optimal scheme, the height of the support can be adjusted according to the height of the first moving member 120, so that the probe row adjusting device is suitable for different working conditions, and the universality of the probe row adjusting device is improved.
Optionally, as shown in fig. 1, the first moving parts 120, the transmission assembly 200, and the driving devices 300 are arranged in groups, and multiple groups of the first moving parts 120 are all movably connected to the same first guide 110, so that multiple probe banks 500 can be connected to the same probe bank adjusting device, and the positions of the multiple probe banks 500 are adjusted by controlling each driving device 300, thereby further simplifying the operation of adjusting the positions of the probe banks 500. On the other hand, the plurality of first moving parts 120 connected to the probe card 500 are movably connected to the same first guide part 110, so that the consistency of the displacement directions of the plurality of probe card 500 can be improved, the problem of low moving precision of the probe card 500 due to inconsistent guide directions can be avoided, and the effect of improving the position adjustment precision of the probe card 500 can be achieved.
Optionally, the first guide member 110 includes a rolling groove, the first moving member 120 is a rolling bearing, the rolling groove is in rolling fit with the rolling bearing, the rolling bearing is connected to the rack 220 through a connecting shaft, when the rack 220 moves, the rolling bearing is driven to roll in the rolling groove, and after the probe bank 500 is connected to the connecting shaft, the rolling bearing can drive the probe bank 500 to linearly move along the rolling groove direction while rolling in the rolling groove. The arrangement of the rolling bearing can reduce the frictional resistance between the first moving part 120 and the first guide part 110, thereby reducing the input amount of the driving kinetic energy of the driving device 300, and simultaneously, the service lives of the first moving part 120 and the first guide part 110 can be prolonged.
It is understood that the first guide member 110 may be a guide plate, a guide block, a guide strip, or the like, and the rolling groove may be formed on the structure.
Preferably, as shown in fig. 1, the probe bank adjusting apparatus provided in this embodiment further includes a second guiding and moving part 400, the second guiding and moving part 400 includes a second guiding element 410 and a second moving element 420, the second guiding element 410 is movably connected to the second moving element 420, the second moving element 420 can move along a length direction of the second guiding element 410, the length direction of the second guiding element 410 is the same as the length direction of the first guiding element 110, the first moving element 120 can be fixedly connected to one end of the probe bank 500, and the second moving element 420 can be fixedly connected to the other end of the probe bank 500. Through setting up second direction removal portion 400, for probe card 500 provides second support and second direction, improved probe card adjusting device and moved the stability of probe card 500 and the precision of probe card 500 position adjustment. On the other hand, the first moving part 120 and the second moving part 420 are configured to be respectively connected to two ends of the probe row 500, and provide supporting force for the probe row 500 at the two ends, which has the effects of improving supporting stability and improving guiding effect.
Optionally, one of the second guiding element 410 and the second moving element 420 is provided with a sliding rail, and the other is provided with a sliding groove, and the sliding rail is in sliding fit with the sliding groove. The manufacturing method of the sliding chute and the sliding rail is simple, the requirement on the machined part is low, and the production cost and the production requirement can be reduced.
In the technical scheme that this embodiment provided, second guide 410 has seted up the spout for the deflector on, second moving member 420 is the slider, and the slider can be connected with probe row 500's the other end, and probe row 500 removes, drives the slider and slides in the spout on the deflector.
It is understood that in other embodiments, the second guiding element 410 may be a block or strip structure with a sliding slot, and the second moving element 420 may also be another structure, such as a plate, a block or a strip structure with a sliding rail. It is also understood that in other embodiments, the sliding rail may be disposed on the second guiding element 410 (e.g., a guiding plate, a guiding block, or a guiding bar provided with the sliding rail), and the sliding groove may be disposed on the second moving element 420 (e.g., a sliding plate, a sliding block, or a sliding bar provided with the sliding groove), which are not listed here.
In one embodiment, the second guiding element 410 includes a rolling groove, and the second moving element 420 is a rolling bearing, and the rolling groove is in rolling engagement with the rolling bearing. The rolling bearing can be connected with the other end of the probe card 500, and when the probe card 500 moves, the probe card 500 drives the rolling bearing to roll in the rolling groove. The arrangement of the rolling bearing can reduce the frictional resistance between the second moving member 420 and the second guide member 410, thereby reducing the input amount of the driving kinetic energy of the driving device 300, and at the same time, can prolong the service life of the second moving member 420 and the second guide member 410.
It is understood that the second guide 410 may be a guide plate, a guide block, a guide strip, or the like, and the rolling groove may be formed on the above structure.
In the probe row adjusting device provided by this embodiment, the driving device 300 is connected with the gear 210 through the connecting shaft, the gear 210 is engaged with the rack 220, the rack 220 is connected with the first moving member 120 through the connecting shaft, the first moving member 120 is movably connected with the first guiding member 110, and the first moving member 120 can move along the length direction of the first guiding member 110, so as to realize transmission through the gear 210 and the rack 220, the driving device 300 drives the first moving member 120 to move along the length direction of the first guiding member 110, and connects the first moving member 120 with the probe row 500, so that the first moving member 120 drives the probe row 500 to move together while moving, the driving device 300 is connected with the controller, the controller controls the start and stop of the driving device 300, so as to realize the automatic operation of adjusting the position of the probe row 500, and the controller controls the rotation angle and the rotation number of the gear 210 of the driving device 300, the automatic operation of the position adjustment distance of the probe line 500 is realized. Compared with the manual adjustment mode in the prior art, the adjustment operation of the position of the probe bank 500 is effectively simplified, and the adjustment precision of the position of the probe bank 500 is improved. When the test position of the probe card row 500 is switched rapidly and accurately corresponding to different battery piece products. On the other hand, the first guide 110 is provided such that the first moving member 120 and the probe bank 500 can move along the length direction of the first guide 110 (i.e., the adjustment direction of the probe bank 500), thereby further improving the accuracy of the adjustment of the position of the probe bank 500.
The embodiment also provides a probe testing device which can be conveniently used for testing battery piece products of different models. As shown in fig. 1, the probe test apparatus includes a probe bank 500 and the above-mentioned probe bank adjusting apparatus, and the probe bank 500 is fixedly connected to the first moving member 120 of the probe bank adjusting apparatus. The controller controls the driving device 300 to drive the probe card 500 to move, thereby simplifying the operation of adjusting the position of the probe card 500 and improving the accuracy of adjusting the position of the probe card 500. When the test position of the probe card row 500 is switched rapidly and accurately corresponding to different battery piece products. It should be noted that, the specific way of controlling the driving device 300 by the controller belongs to the mature prior art in the field, for example, the controller may store the corresponding relationship between different types of battery piece products and the position where the probe bar 500 should be located during testing, or store a program for calculating the moving distance of the probe bar 500 according to the type of the battery piece product, and an operator only needs to input a parameter representing the type of the battery piece product to be tested into the controller, and the controller can automatically control the start and stop of the driving device 300, so as to move the probe bar 500 to the position to be tested.
Preferably, with continued reference to fig. 1, in the solution provided in this embodiment, the first moving parts 120 of the probe card row adjusting apparatus, the transmission assembly 200, the driving apparatus 300, and the probe card row 500 are arranged in groups, and the multiple groups of first moving parts 120 are all movably connected to the first guiding parts 110 of the same probe card row adjusting apparatus. Therefore, the purpose that the position of the probe bank 500 can be automatically adjusted through the controller is achieved, the operation of adjusting the position of the probe bank 500 is further simplified, the first moving parts 120 are movably connected with the first guide part 110, the consistency of the displacement directions of the probe banks 500 can be improved, the problem that the movement precision of the probe bank 500 is low due to the fact that the guide directions are inconsistent is avoided, and the effect of improving the position adjustment precision of the probe bank 500 is achieved.
Preferably, with reference to fig. 1, in the technical solution provided in this embodiment, the number of the second moving parts 420 of the probe row adjusting device is multiple, the multiple second moving parts 420 correspond to multiple groups of probe rows 500 one to one, one end of each group of probe rows 500 is fixedly connected to the same group of first moving parts 120, and the other end of each group of probe rows 500 is fixedly connected to the corresponding second moving part 420, so that the effect that both ends of each probe row 500 are supported and guided by the first guiding and moving part 100 and the second guiding and moving part 400 is achieved, and the stability and accuracy of the probe row 500 moved by the probe testing device are effectively improved.
In the probe testing apparatus provided in this embodiment, the probe bank 500 is connected to the first moving member 120 of the probe bank adjusting apparatus, and the controller controls the driving apparatus 300 to drive the probe bank 500 to move, so that the position adjustment operation of the probe bank 500 is simplified and the position adjustment accuracy of the probe bank 500 is improved. When the test position of the probe card row 500 is switched rapidly and accurately corresponding to different battery piece products.
Example two
The present embodiment provides a probe row adjusting device, which is different from the probe row adjusting device provided in the first embodiment in that:
one of the first guiding element 110 and the first moving element 120 is provided with a sliding rail, and the other one is provided with a sliding groove, and the sliding rail is in sliding fit with the sliding groove. The manufacturing method of the sliding chute and the sliding rail is simple, the requirement on the machined part is low, and the production cost and the production requirement can be reduced.
In the technical scheme that this embodiment provided, first guide 110 is the deflector, has seted up the spout on the deflector, and first moving member 120 is the slider, and the slider is connected with rack 220, and rack 220 drives the slider and slides in the spout on the deflector when removing, is connected the back with probe bank 500 and slider, then can realize that the slider drives probe bank 500 along spout direction rectilinear movement when sliding in the spout.
It is understood that in other embodiments, the first guiding element 110 may be a block or strip structure with a sliding slot, and the first moving element 120 may also be another structure, such as a plate, a block or a strip structure with a sliding rail. It is also understood that in other embodiments, a sliding rail may be disposed on the first guiding element 110 (e.g., a guiding plate, a guiding block, or a guiding bar provided with a sliding rail), and a sliding groove may be disposed on the first moving element 120 (e.g., a sliding plate, a sliding block, or a sliding bar provided with a sliding groove), which are not listed here.
The rest of the structure of the probe row adjusting device provided in this embodiment is the same as that of the first embodiment, and is not described again.
It should be understood that the above-described embodiments of the present invention are merely examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention. Numerous obvious variations, adaptations and substitutions will occur to those skilled in the art without departing from the scope of the utility model. And are neither required nor exhaustive of all embodiments. Any modification, equivalent replacement, and improvement made within the spirit and principle of the present invention should be included in the protection scope of the claims of the present invention.
Claims (10)
1. A probe row adjustment device, comprising:
the first guide moving part (100) comprises a first guide part (110) and a first moving part (120), the first guide part (110) is movably connected with the first moving part (120), the first moving part (120) can move along the length direction of the first guide part (110), the first moving part (120) can be fixedly connected with a probe bank (500), and the length direction is the position adjusting direction of the probe bank (500);
the transmission assembly (200) comprises a gear (210) and a rack (220), the gear (210) is meshed with the rack (220), and the rack (220) is connected with the first moving part (120);
the driving device (300) can drive the gear (210) to rotate so as to drive the rack (220), the first moving part (120) and the probe row (500) to move;
and the controller is in signal connection with the driving device (300) and is used for controlling the start and stop of the driving device (300).
2. The probe row adjustment device according to claim 1, wherein the first guide member (110) comprises a rolling groove, and the first moving member (120) is a rolling bearing, the rolling groove being in rolling engagement with the rolling bearing.
3. The probe row adjusting apparatus according to claim 1, wherein one of the first guide member (110) and the first moving member (120) is provided with a slide rail, and the other is provided with a slide groove, the slide rail being slidably engaged with the slide groove.
4. The probe bank adjusting apparatus according to any one of claims 1 to 3, further comprising a second guiding and moving portion (400), wherein the second guiding and moving portion (400) comprises a second guiding element (410) and a second moving element (420), the second guiding element (410) is movably connected to the second moving element (420), the second moving element (420) can move along a length direction of the second guiding element (410), the length direction of the second guiding element (410) is the same as the length direction of the first guiding element (110), the first moving element (120) can be fixedly connected to one end of the probe bank (500), and the second moving element (420) can be fixedly connected to the other end of the probe bank (500).
5. The probe bank adjustment device according to claim 4, wherein one of the second guide member (410) and the second moving member (420) is provided with a slide rail, and the other is provided with a slide groove, the slide rail being slidably engaged with the slide groove.
6. The probe bank adjustment device according to claim 4, wherein the second guide member (410) comprises a rolling groove, and the second moving member (420) is a rolling bearing, the rolling groove being in rolling engagement with the rolling bearing.
7. The probe bank adjustment device according to any one of claims 1 to 3, wherein the first moving members (120), the transmission assembly (200) and the driving device (300) are arranged in groups, and a plurality of groups of the first moving members (120) are movably connected to the same first guide member (110).
8. A probe testing apparatus, comprising a probe bank (500) and a probe bank adjustment apparatus according to any one of claims 1 to 7, the probe bank (500) being fixedly connected to the first moving member (120) of the probe bank adjustment apparatus.
9. The probe testing apparatus according to claim 8, wherein the first moving member (120), the transmission assembly (200), the driving device (300) and the probe bank (500) of the probe bank adjusting apparatus are arranged in groups, and the first moving members (120) of a plurality of groups are movably connected with the first guide member (110) of the same probe bank adjusting apparatus.
10. The probe test apparatus according to claim 9, wherein the probe bank adjusting apparatus has a plurality of second moving members (420), the plurality of second moving members (420) are in one-to-one correspondence with the plurality of groups of the probe banks (500), one end of each group of the probe banks (500) is fixedly connected to the same group of the first moving members (120), and the other end is fixedly connected to the corresponding second moving member (420).
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CN202122439648.7U CN216082871U (en) | 2021-10-11 | 2021-10-11 | Probe row adjusting device and probe testing device |
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CN202122439648.7U CN216082871U (en) | 2021-10-11 | 2021-10-11 | Probe row adjusting device and probe testing device |
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