CN215641550U

CN215641550U - High-voltage test fixture for filter

Info

Publication number: CN215641550U
Application number: CN202121157274.3U
Authority: CN
Inventors: 王友龙; 王广; 王琪
Original assignee: Kunshan Keils Electronic O Ltd
Current assignee: Kunshan Keils Electronic O Ltd
Priority date: 2021-05-27
Filing date: 2021-05-27
Publication date: 2022-01-25
Anticipated expiration: 2031-05-27

Abstract

The utility model discloses a high-voltage test fixture for a filter, which comprises a bottom plate, wherein two positioning blocks are fixedly arranged at the front end and the rear end of the bottom plate, a filter body is arranged between the two positioning blocks, a fixed plate is fixedly arranged at the left end of each positioning block, a sliding plate is slidably arranged at the right end of each positioning block through a sliding chute, the right end of each sliding plate is fixedly connected with an adjusting device, two first probes for being connected with a terminal are symmetrically arranged on the fixed plate and the sliding plate, and a second probe for being connected with a grounding end is also arranged on the sliding plate; the utility model controls the sliding plate to be far away from or close to the fixed plate through the adjusting device, thereby positioning the filter body through the sliding plate and the fixed plate, avoiding the problem that the filter to be tested cannot be positioned and detected, increasing the yield, fully contacting the terminal, the grounding end and the probe under the action of the elasticity of the spring, and ensuring the correctness of test data.

Description

High-voltage test fixture for filter

Technical Field

The utility model relates to the technical field of filters, in particular to a high-voltage test fixture for a filter.

Background

In the middle of the manufacturing of wave filter, need carry out test operation to the wave filter after assembling in batches, current wave filter is when testing, test after carrying out the power switch on with the terminal of wave filter direct with PCB board pin contact usually, can't fix a position the detection to the wave filter that needs the test, simultaneously, still often can lead to the test effect to have the deviation because of contact is not abundant between terminal and pin, influence the exactness of test data, can cause the damage to the wave filter even, thereby it increases to cause the defective index.

SUMMERY OF THE UTILITY MODEL

The present invention is directed to a high voltage testing fixture for a filter, so as to solve the problems mentioned in the background art.

In order to achieve the purpose, the utility model provides the following technical scheme:

a high-voltage test fixture for a filter comprises a bottom plate, wherein two positioning blocks are fixedly mounted at the front end and the rear end of the bottom plate, a filter body is placed between the two positioning blocks, a fixed plate is fixedly arranged at the left end of each positioning block, a sliding plate is slidably mounted at the right end of each positioning block through a sliding chute, the right end of each sliding plate is fixedly connected with an adjusting device, two first probes for being connected with terminals are symmetrically mounted on the fixed plate and the sliding plate, and a second probe for being connected with a grounding terminal is further mounted on the sliding plate;

the adjusting device comprises an adjusting base, a sleeve is arranged at the upper left end of the adjusting base, a supporting frame is arranged at the upper right end of the adjusting base, a sliding pin is arranged in the sleeve in a sliding mode, the left end of the sliding pin is fixedly connected with a sliding plate, the front end and the rear end of the right end of the sliding pin are rotatably connected with two connecting frames through pin shafts, the right end of each connecting frame is rotatably installed on a rocker arm through the pin shafts, a connecting plate is arranged at the left end of each rocker arm, and the left end of each connecting plate is rotatably installed on the supporting frame through the pin shafts.

Preferably, the distance between the two positioning blocks is equal to the width of the filter body.

Preferably, the right end of the rocker arm is fixedly connected with the handle.

Preferably, the connecting plate and the rocker arm are integrally formed, an obtuse angle is formed between the connecting plate and the rocker arm, and the rocker arm is arranged between the two connecting frames.

Preferably, the first probe is slidably mounted in the mounting groove, a pressing plate is arranged on the first probe, a spring is sleeved on the first probe and fixed between the mounting groove and the pressing plate, and a limiting block is arranged at one end, far away from the filter body, of the first probe.

Preferably, the second probe and the first probe are mounted in the same manner.

Compared with the prior art, the utility model has the beneficial effects that:

1. according to the utility model, through the arrangement of the two positioning blocks, the fixed plate and the sliding plate and the control of the sliding plate to be far away from or close to the fixed plate through the adjusting device, the filter body can be positioned through the sliding plate and the fixed plate, the problem that the filter to be tested cannot be positioned and detected is avoided, and the yield is increased.

2. According to the utility model, the first probe and the second probe are respectively connected with the terminal and the grounding terminal under the action of the elastic force of the spring through the arrangement of the spring and the pressing plate, so that the terminal and the grounding terminal are fully contacted with the probes, and the correctness of test data is ensured.

3. The device can test high voltage and low voltage simultaneously, and improves the test efficiency and reduces the cost compared with the traditional test jig which needs to test high voltage and low voltage respectively.

Drawings

FIG. 1 is a perspective view of the overall structure of the present invention;

FIG. 2 is a perspective view of the overall structure of the present invention in a working state;

FIG. 3 is a front view of the overall structure of the present invention;

FIG. 4 is a schematic view of a first probe mounting structure of the present invention;

FIG. 5 is a front view of the working state structure of the present invention;

FIG. 6 is a schematic top view of the working structure of the present invention;

fig. 7 is a schematic structural diagram of the adjusting device of the present invention.

In the figure: the filter comprises a base plate 1, a positioning block 2, a fixing plate 3, a sliding plate 4, a sliding groove 5, an adjusting device 6, an adjusting base 61, a sleeve 62, a supporting frame 63, a sliding pin 64, a connecting frame 65, a rocker arm 66, a connecting plate 67, a handle 68, a first probe 71, a second probe 72, a mounting groove 73, a spring 74, a pressing plate 75, a limiting block 76, a filter body 8, a terminal 81 and a grounding end 82.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

Referring to fig. 1-7, the present invention provides a technical solution:

the utility model provides a wave filter high pressure test fixture, its includes bottom plate 1, and fixed mounting has two locating pieces 2 on the front and back both ends of bottom plate 1, and wave filter body 8 places between two locating pieces 2, and the distance between two locating pieces 2 equals with wave filter body 8's width. The left end of the positioning block 2 is fixedly provided with a fixed plate 3, the right end of the fixed plate is slidably provided with a sliding plate 4 through a sliding chute 5, the right end of the sliding plate 4 is fixedly connected with an adjusting device 6, the fixed plate 3 and the sliding plate 4 are symmetrically provided with two first probes 71 used for being connected with a terminal 81, and the sliding plate 4 is also provided with a second probe 72 used for being connected with a grounding terminal 82.

Adjusting device 6 is including adjusting base 61, the upper left end of adjusting base 61 is equipped with sleeve 62, the upper right end is equipped with support frame 63, slidable mounting has sliding pin 64 in sleeve 62, sliding pin 64's left end and sliding plate 4 fixed connection, both ends rotate with two link 65 through the round pin axle around its right-hand member are connected, the right-hand member of link 65 rotates through the round pin axle and installs on rocking arm 66, the left end of rocking arm 66 is provided with connecting plate 67, the right-hand member and the handle 68 fixed connection of rocking arm 66, the left end of connecting plate 67 rotates through the round pin axle and installs on support frame 63, connecting plate 67 and rocking arm 66 are integrated into one piece, become the obtuse angle between connecting plate 67 and the rocking arm 66, rocking arm 66 sets up between two link 65.

Rotating the rocker arm 66 to the left, the connecting plate 67 rotates with the supporting frame 63 as a dot, the connecting frame 65 moves to the left under the pushing of the rocker arm 66, and pushes the sliding plate 4 to approach the fixed plate 3 through the sliding pin 64, so as to cooperate with the fixed plate 3 to fix and position the filter body 8, otherwise, rotating the rocker arm 66 to the right to take down the filter body 8.

The first probe 71 is slidably mounted in the mounting groove 73, a pressing plate 75 is arranged on the first probe 71, a spring 74 is sleeved on the first probe 71, the spring 74 is fixed between the mounting groove 73 and the pressing plate 75, a limiting block 76 is arranged at one end of the first probe 71, which is far away from the filter body 8, and the mounting modes of the second probe 72 and the first probe 71 are the same.

The working principle of the utility model is as follows:

through the setting of two locating pieces 2, fixed plate 3 and sliding plate 4 to keep away from or be close to fixed plate 3 through 6 control sliding plate 4 of adjusting device, thereby can fix a position filter body 8 through sliding plate 4 and fixed plate 3, avoid the unable problem that fixes a position the detection of the wave filter that needs the test, increased the yields.

The first probe 71 and the second probe 72 are respectively connected with the terminal 81 and the grounding terminal 82 through the arrangement of the spring 74 and the pressure plate 75 under the elastic force of the spring 74, so that the terminal 81 and the grounding terminal 82 are fully contacted with the probes, and the correctness of test data is ensured.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.

Claims

1. The utility model provides a wave filter high pressure test fixture, its includes bottom plate (1), its characterized in that:

two positioning blocks (2) are fixedly mounted at the front end and the rear end of the bottom plate (1), a filter body (8) is placed between the two positioning blocks (2), a fixed plate (3) is fixedly arranged at the left end of each positioning block (2), a sliding plate (4) is slidably mounted at the right end of each positioning block through a sliding groove (5), the right end of each sliding plate (4) is fixedly connected with an adjusting device (6), two first probes (71) used for being connected with terminals (81) are symmetrically mounted on the fixed plate (3) and the sliding plate (4), and a second probe (72) used for being connected with a grounding terminal (82) is further mounted on the sliding plate (4);

adjusting device (6) are including adjusting base (61), the upper left end of adjusting base (61) is equipped with sleeve (62), and the upper right end is equipped with support frame (63), slidable mounting has sliding pin (64) in sleeve (62), the left end and sliding plate (4) fixed connection of sliding pin (64), both ends rotate with two link (65) through the round pin axle around its right-hand member and are connected, the right-hand member of link (65) is installed on rocking arm (66) through the round pin axle rotation, the left end of rocking arm (66) is provided with connecting plate (67), the left end of connecting plate (67) is installed on support frame (63) through the round pin axle rotation.

2. The jig for testing high voltage of filter according to claim 1, wherein: the distance between the two positioning blocks (2) is equal to the width of the filter body (8).

3. The jig for testing high voltage of filter according to claim 1, wherein: the right end of the rocker arm (66) is fixedly connected with the handle (68).

4. The jig for testing high voltage of filter according to claim 1, wherein: the connecting plate (67) and the rocker arm (66) are integrally formed, an obtuse angle is formed between the connecting plate (67) and the rocker arm (66), and the rocker arm (66) is arranged between the two connecting frames (65).

5. The jig for testing high voltage of filter according to claim 1, wherein: first probe (71) slidable mounting is provided with clamp plate (75) on it in mounting groove (73), the cover is equipped with spring (74) on first probe (71), spring (74) are fixed between mounting groove (73) and clamp plate (75), the one end of keeping away from filter body (8) of first probe (71) is equipped with stopper (76).

6. The jig for testing high voltage of filter according to claim 1, wherein: the second probe (72) and the first probe (71) are mounted in the same manner.