CN215575504U

CN215575504U - High-efficient test fixture of computer chip

Info

Publication number: CN215575504U
Application number: CN202121391098.XU
Authority: CN
Inventors: 蔡颖
Original assignee: Tianjin Baijunxing Technology Co ltd
Current assignee: Tianjin Baijunxing Technology Co ltd
Priority date: 2021-06-22
Filing date: 2021-06-22
Publication date: 2022-01-18
Anticipated expiration: 2031-06-22

Abstract

The utility model discloses a high-efficiency test fixture for a computer chip, which comprises a test box, wherein a plurality of movable plates are vertically and movably arranged at the bottom end in the test box, test pieces are arranged on the side walls of the opposite sides of the plurality of movable plates, partition plates are fixedly arranged between the front side wall and the rear side wall of the two sides in the test box, electric cylinders are transversely arranged on the outer side walls of the two partition plates, and the output ends of the two electric cylinders penetrate through the side walls of the partition plates of the corresponding sides and are fixedly connected with the side walls of the movable plates of the corresponding sides. The utility model discloses a high-efficiency testing jig for computer chips, which is provided with a plurality of moving plates, wherein a testing sheet is arranged between the moving plates, so that a plurality of testing grooves are formed, the computer chips can be tested in batches, the testing efficiency is higher, and the moving plates are pushed by an electric cylinder, so that the testing sheet is pushed to clamp and fix the chips, and the testing result is more accurate.

Description

High-efficient test fixture of computer chip

Technical Field

The utility model relates to the field of computer chips, in particular to a high-efficiency test fixture for a computer chip.

Background

A computer chip is an electronic component, and one computer chip includes millions of resistors, capacitors, and other small components. The computer has many chips, the black strip on the memory strip is the chip, the mainboard, the hard disk, the display card and the like have many chips, the CPU is also a computer chip, and the computer chip is more complex and more precise than the common computer chip. After the production of the chip is finished, the performance of the chip needs to be tested, and the chip can be marketed after the test is passed.

At present, current computer chip testing arrangement once can only carry out test work to a chip, and efficiency of software testing is lower, because the chip is less, places after test groove inside, if not fix its position, can lead to the test result error to appear, and the test is finished the back and is taken inconveniently moreover, consequently, needs design a computer chip high efficiency test fixture and solves above-mentioned problem.

SUMMERY OF THE UTILITY MODEL

The utility model aims to solve the defects in the prior art and provides a high-efficiency test fixture for a computer chip.

In order to achieve the purpose, the utility model adopts the following technical scheme: a high-efficiency testing jig for a computer chip comprises a testing box, wherein a plurality of movable plates are vertically and movably arranged at the bottom end inside the testing box, testing pieces are arranged on the side walls of the opposite sides of the plurality of movable plates, partition plates are fixedly arranged between the front side wall and the rear side wall of the two sides inside the testing box, electric cylinders are transversely arranged on the outer side walls of the two partition plates, the output ends of the two electric cylinders penetrate through the side walls of the partition plates of the corresponding sides and are fixedly connected with the side walls of the movable plates of the corresponding sides, first connecting rods are movably arranged between the middle parts of the front side and the rear side of the plurality of movable plates, a plurality of first reset springs are sleeved outside the two first connecting rods, and the plurality of first reset springs are respectively positioned between the two movable plates;

a plurality of the activity is provided with the second connecting rod between the below middle part of movable plate, the outside cover of second connecting rod is equipped with a plurality of sliding sleeve, a plurality of the sliding sleeve is located respectively between two movable plates, the outside cover of sliding sleeve is equipped with a plurality of second reset spring, a plurality of second reset spring is located the both sides of sliding sleeve respectively, a plurality of the top of sliding sleeve is all fixed and is provided with support, a plurality of the top of support is all fixed and is provided with magnet push jack, a plurality of the top of magnet push jack is all movable and is provided with the electro-magnet, the magnetism of magnet push jack and electro-magnet is the same.

As a further description of the above technical solution:

and sliding wheels are fixedly arranged in the middle parts of the front end and the rear end of the plurality of moving plates.

As a further description of the above technical solution:

all transversely seted up the spout on the inside front and back both sides wall of test box, a plurality of the movable pulley all slides and sets up the inside at the spout that corresponds the side.

As a further description of the above technical solution:

and a plurality of protective pads are fixedly arranged above the electromagnets.

As a further description of the above technical solution:

and limiting rods are fixedly arranged on two sides below the electromagnets.

As a further description of the above technical solution:

a plurality of the lower end of the limiting rod movably penetrates through the protective pad and is fixedly provided with a limiting block.

As a further description of the above technical solution:

and a test port is formed in the upper side wall of the test box.

As a further description of the above technical solution:

the front end of one side of the top of the test box is provided with a controller, and one side of the top of the test box, which is close to the controller, is provided with a display screen.

The utility model has the following beneficial effects:

compared with the existing device, when the device is used, the test piece is arranged between the moving plates through the plurality of moving plates, so that a plurality of test slots are formed, the computer chips can be tested in batches, and the test efficiency is higher.

Compare in current device, the device promotes the movable plate through being provided with electronic jar when using to promote the test piece and press from both sides the fastening with the chip and fix, make the test result more accurate, through being provided with a reset spring, can cushion the pressure of test piece to the chip.

Compare in current device, the device is when using, through being provided with the magnet push jack, and the chip test finishes the back, to the circular telegram of magnet push jack, upwards promotes the electro-magnet to release the chip from the device is inside, make things convenient for the chip to take out.

Drawings

FIG. 1 is a front cross-sectional view of a computer chip high-efficiency testing fixture according to the present invention;

FIG. 2 is a cross-sectional view of a computer chip high-efficiency testing fixture according to the present invention;

FIG. 3 is an enlarged view taken at A in FIG. 1;

FIG. 4 is a side sectional view of a magnet pusher of the computer chip high-efficiency testing fixture according to the present invention;

FIG. 5 is a top view of a computer chip high-efficiency testing fixture according to the present invention;

fig. 6 is a perspective view of a computer chip high-efficiency testing fixture according to the present invention.

Illustration of the drawings:

1. a test box; 2. moving the plate; 3. testing the sheet; 4. a partition plate; 5. an electric cylinder; 6. a first connecting rod; 7. a first return spring; 8. a sliding wheel; 9. a chute; 10. a second connecting rod; 11. a sliding sleeve; 12. a second return spring; 13. a support; 14. a magnet push sheet; 15. an electromagnet; 16. a protective pad; 17. a test port; 18. a controller; 19. a display screen; 20. a limiting rod; 21. and a limiting block.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc., indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, but do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be construed as limiting the present invention; the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance, and furthermore, unless otherwise explicitly stated or limited, the terms "mounted," "connected," and "connected" are to be construed broadly and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.

Referring to fig. 1-6, one embodiment of the present invention is provided: a high-efficiency test fixture for a computer chip comprises a test box 1, wherein a plurality of movable plates 2 are vertically and movably arranged at the bottom end inside the test box 1, test pieces 3 are respectively arranged on the side walls of the opposite sides of the plurality of movable plates 2, partition plates 4 are respectively and fixedly arranged between the front side wall and the rear side wall of each of the two sides inside the test box 1, electric cylinders 5 are respectively and transversely arranged on the outer side walls of the two partition plates 4, the output ends of the two electric cylinders 5 respectively penetrate through the side walls of the partition plates 4 of the corresponding sides and are fixedly connected with the side walls of the movable plates 2 of the corresponding sides, first connecting rods 6 are movably arranged between the middle parts of the front side and the rear side of each of the plurality of movable plates 2, a plurality of first reset springs 7 are respectively sleeved outside the two first connecting rods 6 to buffer the pressure of the test pieces 3 on the chip, the plurality of first reset springs 7 are respectively positioned between the two movable plates 2, and sliding wheels 8 are respectively and fixedly arranged in the middle parts of the front ends and the rear ends of the plurality of the movable plates 2, all transversely seted up spout 9 on the both sides wall around the inside of test box 1, a plurality of movable pulley 8 all slides and sets up in the inside of the spout 9 that corresponds the side for the removal of supplementary movable plate 2, the stability of reinforcing device.

A second connecting rod 10 is movably arranged between the middle parts below the plurality of moving plates 2, a plurality of sliding sleeves 11 are sleeved outside the second connecting rod 10, the plurality of sliding sleeves 11 are respectively positioned between the two moving plates 2, a plurality of second reset springs 12 are sleeved outside the sliding sleeves 11, the plurality of second reset springs 12 are respectively positioned on two sides of the sliding sleeves 11, brackets 13 are fixedly arranged above the plurality of sliding sleeves 11, magnet push pieces 14 are fixedly arranged above the plurality of brackets 13, electromagnets 15 are movably arranged above the plurality of magnet push pieces 14, the magnet push pieces 14 and the electromagnets 15 have the same magnetism, the electromagnets 15 can be pushed upwards after the magnet push pieces 14 are electrified, protective pads 16 are fixedly arranged above the plurality of electromagnets 15, and limiting rods 20 are fixedly arranged on two sides below the plurality of electromagnets 15 to prevent the electromagnets 15 from shifting in the lifting process, the lower extreme of a plurality of gag lever post 20 is all movable to run through protection pad 16 and fixed stopper 21 that is provided with, plays spacing effect to rising of electro-magnet 15, has seted up test port 17 on the last lateral wall of test box 1, and top one side front end of test box 1 is provided with controller 18 for controlling means operation, and one side that the top of test box 1 is close to controller 18 is provided with display screen 19 for show test result.

The working principle is as follows: the device is when using, place the computer chip that will need the test in the top of protection pad 16, promote the movable plate 2 on both sides in proper order through the electronic jar 5 of both sides afterwards and remove to the centre, press from both sides the chip tightly to fix between test piece 3, slide in the inside of spout 9 through movable pulley 8, the removal of supplementary movable plate 2, can slow down the pressure of test piece 3 to the chip through first reset spring 7, after the test, reset the electronic jar 5 of both sides, movable plate 2 resumes the position originally under the effect of electronic jar 5 and first reset spring 7, later to the circular telegram of magnet push jack 14, magnet push jack 14 upwards promotes electro-magnet 15, thereby upwards promote the chip, through be provided with gag lever post 20 in the below of electro-magnet 15, can prevent that electro-magnet 15 from taking place the position skew in the process of rising, it can to take out the chip at last.

Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that modifications may be made to the embodiments or portions thereof without departing from the spirit and scope of the utility model.

Claims

1. The utility model provides a high-efficient test fixture of computer chip, includes test box (1), its characterized in that: a plurality of moving plates (2) are vertically and movably arranged at the bottom end in the test box (1), test pieces (3) are arranged on the side walls of the opposite sides of the moving plates (2), partition plates (4) are fixedly arranged between the front side wall and the rear side wall of the two sides in the test box (1), electric cylinders (5) are transversely arranged on the outer side walls of the two partition plates (4), the output ends of the two electric cylinders (5) penetrate through the side walls of the partition plates (4) on the corresponding sides, the movable plate is fixedly connected with the side wall of the movable plate (2) on the corresponding side, first connecting rods (6) are movably arranged between the middle parts of the front side and the rear side of the plurality of movable plates (2), a plurality of first reset springs (7) are sleeved outside the two first connecting rods (6), and the plurality of first reset springs (7) are respectively positioned between the two movable plates (2);

a plurality of the activity is provided with second connecting rod (10) between the below middle part of movable plate (2), the outside cover of second connecting rod (10) is equipped with a plurality of sliding sleeve (11), a plurality of sliding sleeve (11) are located respectively between two movable plates (2), the outside cover of sliding sleeve (11) is equipped with a plurality of second reset spring (12), a plurality of second reset spring (12) are located the both sides of sliding sleeve (11), a plurality of the top of sliding sleeve (11) is all fixed and is provided with support (13), a plurality of the top of support (13) is all fixed and is provided with magnet push jack (14), a plurality of the top of magnet push jack (14) is all movable and is provided with electro-magnet (15), the magnetism of magnet push jack (14) and electro-magnet (15) is the same.

2. The efficient testing jig for computer chips according to claim 1, characterized in that: sliding wheels (8) are fixedly arranged in the middle of the front end and the rear end of each of the plurality of moving plates (2).

3. The efficient testing jig for computer chips according to claim 2, characterized in that: all transversely seted up spout (9), a plurality of on the inside front and back both sides wall of test box (1) the inside of the equal slip setting of movable pulley (8) in spout (9) of corresponding side.

4. The efficient testing jig for computer chips according to claim 1, characterized in that: protective pads (16) are fixedly arranged above the electromagnets (15).

5. The efficient testing jig for computer chips according to claim 1, characterized in that: limiting rods (20) are fixedly arranged on two sides below the electromagnets (15).

6. The efficient testing jig for computer chips according to claim 5, characterized in that: the lower ends of the limiting rods (20) penetrate through the protective pad (16) movably and are fixedly provided with limiting blocks (21).

7. The efficient testing jig for computer chips according to claim 1, characterized in that: the upper side wall of the test box (1) is provided with a test port (17).

8. The efficient testing jig for computer chips according to claim 1, characterized in that: the test box is characterized in that a controller (18) is arranged at the front end of one side above the test box (1), and a display screen (19) is arranged on one side, close to the controller (18), above the test box (1).