CN215068215U

CN215068215U - Type-C interface auxiliary test and switching circuit

Info

Publication number: CN215068215U
Application number: CN202121483282.7U
Authority: CN
Inventors: 李振乐; 刘文庆; 廖飞军
Original assignee: Shenzhen KTC Commercial Technology Co Ltd
Current assignee: Shenzhen KTC Commercial Technology Co Ltd
Priority date: 2021-07-01
Filing date: 2021-07-01
Publication date: 2021-12-07
Anticipated expiration: 2031-07-01

Abstract

The embodiment of the utility model provides a Type-C interface auxiliary test and switching circuit relates to Type-C interface technical field. The circuit includes: the test pin header comprises a first Type-C interface, a test pin header unit, a DP interface and a USB-A interface; the test pin header unit is connected with the first Type-C interface and used for testing Type-C equipment accessed to the first Type-C interface; the DP interface is connected with the first Type-C interface and used for accessing DP interface equipment; the USB-A interface is connected with the first Type-C interface and used for being connected with USB-A interface equipment. The test pin of the Type-C interface is led out through the test pin header unit, so that convenience is brought to testing, the time consumption of testing is reduced, and the testing efficiency is improved; through increasing DP interface and USB-A interface as the extended interface, make the Type-C interface can insert DP interface device and USB interface device, improve the adaptability of Type-C interface.

Description

Type-C interface auxiliary test and switching circuit

Technical Field

The utility model relates to a Type-C interface technical field especially relates to a Type-C interface auxiliary test and switching circuit.

Background

Along with the continuous development of USB interface technique, the Type-C interface is as a neotype USB interface, and is fast based on Type-C interface, "strong, little" characteristic, and the signal of transferable multiple different grade Type, is often used for electronic product such as cell-phone, panel computer, phone wrist-watch. In the test of Type-C interface device, the wave form of each pin needs to be tested usually, and the pin of Type-C interface is denser, and the mistake very easily leads to the test result incorrect or adjacent pin short circuit leads to the equipment chip to burn out, to having the Type-C interface product of shell to pull the shell and remove the test, consume a large amount of time, lead to the efficiency of software testing low, and can not communicate between Type-C interface and other interface devices.

SUMMERY OF THE UTILITY MODEL

The utility model provides a Type-C interface auxiliary test and switching circuit aims at solving Type-C interface test consuming time, and the problem that test efficiency is low and Type-C interface and other interface devices can not communicate.

The utility model provides a Type-C interface auxiliary test and switching circuit, this Type-C interface auxiliary test and switching circuit include: the test pin header comprises a first Type-C interface, a test pin header unit, a DP interface and a USB-A interface; the test pin header unit is connected with the first Type-C interface and used for testing Type-C equipment accessed to the first Type-C interface; the DP interface is connected with the first Type-C interface and used for accessing DP interface equipment; the USB-A interface is connected with the first Type-C interface and used for being connected with USB-A interface equipment.

The technical scheme is that the test pin header further comprises a second Type-C interface, and the second Type-C interface is connected with the first Type-C interface through the test pin header unit.

The technical scheme is that the test pin arranging device further comprises an electrostatic protection unit, and the DP interface, the USB-A interface, the test pin arranging unit and the second Type-C interface are connected through the electrostatic protection unit and the first Type-C interface.

The further technical scheme is that the test pin header unit comprises a power pin header, a signal pin header and an auxiliary pin header; the power row needle the signal row needle and supplementary row needle all passes through the electrostatic protection unit with first Type-C interface connection.

The technical scheme is that the device further comprises a signal conversion unit, and the signal conversion unit is connected with the DP interface and the first Type-C interface respectively.

The signal conversion unit comprises a voltage stabilizer and a signal conversion chip, wherein the voltage stabilizer is connected with the signal conversion chip, and the signal conversion chip is connected with the DP interface.

The USB-A interface is connected with the electrostatic protection unit through the current limiting unit.

The current limiting unit comprises a current limiting resistor and a current limiting chip, the current limiting resistor is connected with the current limiting chip, the current limiting resistor is connected with a current limiting pin of the current limiting chip, and the current limiting chip is respectively connected with the electrostatic protection unit and the USB-A interface.

The further technical scheme is that the device further comprises an anti-interference unit, and the anti-interference unit is respectively connected with the DP interface and the signal conversion unit.

The further technical scheme is that the model of the voltage stabilizer is AS 1117.

The utility model provides a Type-C interface auxiliary test and switching circuit, this Type-C interface auxiliary test and switching circuit draws forth the test pin of Type-C interface through the test pin header unit, facilitates the test, reduces the time spent of test, improves the efficiency of test; through increasing DP interface and USB-A interface as the extended interface, make the Type-C interface can insert DP interface device and USB interface device, improve the adaptability of Type-C interface.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without any creative effort.

Fig. 1 is a schematic block diagram of a Type-C interface auxiliary test and transfer circuit according to an embodiment of the present invention;

fig. 2 is a partial circuit diagram of a test pin header unit according to an embodiment of the present invention;

fig. 3 is a partial circuit diagram of a first Type-C interface and an electrostatic protection unit according to an embodiment of the present invention;

fig. 4 is a partial circuit diagram of a signal conversion unit according to an embodiment of the present invention;

fig. 5 is a partial circuit diagram of an electrical current limiting unit and a USB-a interface according to an embodiment of the present invention;

fig. 6 is a partial circuit diagram of the DP interface and the anti-interference unit according to the embodiment of the present invention.

Reference numerals

A first Type-C interface 1; an electrostatic protection unit 2; a test pin header unit 3; a power pin header 31; a signal pin header 32; an auxiliary pin header 33; a second Type-C interface 4; a signal conversion unit 5; a DP interface 6; a current limiting unit 7; a USB-A interface 8; and an anti-interference unit 9.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, wherein like component numbers represent like components. It is obvious that the embodiments to be described below are only a part of the embodiments of the present invention, and not all of them. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.

It will be understood that the terms "comprises" and/or "comprising," when used in this specification and the appended claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.

It is also to be understood that the terminology used in the description of the embodiments of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the embodiments of the invention. As used in the description of the embodiments of the present invention and the appended claims, the singular forms "a," "an," and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise.

Referring to fig. 1-6, the embodiment of the utility model provides a Type-C interface auxiliary test and switching circuit is proposed, this circuit includes: the test pin header comprises a first Type-C interface 1, a test pin header unit 3, a DP interface 6 and a USB-A interface 8; the test pin header unit 3 is connected with the first Type-C interface 1 and used for testing Type-C equipment connected with the first Type-C interface 1. Specifically, in an embodiment, the Type-C interface to be tested is connected to the first Type-C interface 1, and the test pin of the Type-C interface to be tested is led out through the test pin arranging unit 3, so that convenience is provided for testing, the test time is reduced, and the test efficiency is improved. The situation that the test result is incorrect due to the fact that the test pins are connected in a wrong mode or an equipment chip is burnt out due to the fact that adjacent pins are short-circuited is avoided.

The DP interface 6 is connected with the first Type-C interface 1 and is used for accessing DP interface equipment; and the USB-A interface 8 is connected with the first Type-C interface 1 and is used for accessing USB interface equipment. Specifically, in an embodiment, the DP interface 6 and the USB-a interface 8 are added as extension interfaces, so that the Type-C interface can be connected to the DP interface device and the USB interface device, and the adaptability of the Type-C interface is improved.

Further, Type-C interface auxiliary test and switching circuit still include second Type-C interface 4, second Type-C interface 4 passes through the test pin header unit 3 with first Type-C interface 1 is connected. Specifically, in an embodiment, the second Type-C interface 4 is connected to the first Type-C interface 1, and is used to access a Type-C interface device, so as to implement communication between the Type-C interface devices.

Further, Type-C interface auxiliary test and switching circuit still include electrostatic protection unit 2, DP interface 6 USB-A interface 8 the test row needle unit 3 and second Type-C interface 4 all passes through electrostatic protection unit 2 with first Type-C interface 1 is connected. Specifically, in one embodiment, as shown in fig. 3, the first Type-C interface 1 is an interface chip CON2, and the power pin and the signal transmission pin are connected to the esd protection unit 2 (D1-D6). The electrostatic protection unit 2 is arranged to protect the equipment connected to the interface, and particularly to prevent the equipment from being damaged by instantaneous high voltage generated when the equipment is connected or pulled out.

The electrostatic protection unit 2 comprises a plurality of electrostatic impeders, and the plurality of electrostatic impeders are connected with the first Type-C interface 1. Specifically, in one embodiment, as shown in FIG. 3, the ESD protection unit 2 comprises 6 electrostatic discharge resistors (ESD) D1-D6, wherein D1-D3 are integrated electrostatic discharge resistors that can be connected to 4 pins of the first Type-C interface 1. Wherein D5-D6 are single electrostatic impedance devices, and only 1 pin can be connected.

Further, the test pin header unit 3 includes a power pin header 31, a signal pin header 32, and an auxiliary pin header 33; power arrange needle 31 signal arrange needle 32 and supplementary row needle 33 all passes through electrostatic protection unit 2 with first Type-C interface 1 connects. Specifically, in one embodiment, as shown in fig. 2, power pin header 31 is pin header PCON1, signal pin header 32 is pin header PCON3, and auxiliary pin header 33 is pin header PCON 2. Each pin of Type-C interface is drawn out respectively and is linked to each other with power pin 31, signal pin 32 and supplementary pin 33 of arranging, facilitates for the test of Type-C interface, avoids connecing wrong test pin. All arrange needle and signal all have silk screen printing one-to-one, and the testing tool only needs to insert row needle alright test simple quick safe again. The user may also only extract pins of a part of the Type-C interface as needed, which is not specifically limited in this embodiment.

Further, Type-C interface auxiliary test and switching circuit still includes signal conversion unit 5, signal conversion unit 5 respectively with DP interface 6 and first Type-C interface 1 connects. Specifically, in an embodiment, the DP interface device is accessed through the DP interface 6 to implement signal transmission between the DP interface device and the first Type-C interface 1.

Further, the signal conversion unit 5 includes a voltage regulator U2 and a signal conversion chip U1, the voltage regulator U2 is connected to the signal conversion chip U1, and the signal conversion chip U1 is connected to the DP interface 6. Specifically, in one embodiment, since the power supply voltage of the Type-C interface is 5V and the power supply voltage of the signal conversion chip U1 is 3.3V, the voltage regulator U2 needs to convert the 5V voltage into 3.3V to supply power to the signal conversion chip U1. As shown IN fig. 4, the input pin IN of the voltage regulator U2 is connected to the 5V power supply, and the 3.3V power output pin OUT is connected to the VDDD1, VDDD2 and VDDIO pins of the signal conversion chip U1 to supply power to the signal conversion chip U1.

Pin P1.5 of signal conversion chip U1 and pin Hot Plug Detect of DP interface CON1 in FIG. 6

(DP _ HPD) connection for detecting the access of the DP interface device, the CC1 and CC2 pins of the signal conversion chip U1 are connected to the CC1 and CC2 pins of the first Type-C interface CON2 through the electrostatic protection unit 2, respectively; the signal conversion chip U1 sends the detected information of the DP interface device to the first Type-C interface CON2 through the CC1 and the CC2 pins, and the first Type-C interface CON2 controls the transmission of signals according to the information of the DP interface device to realize the signal transmission between the DP interface device and the Type-C interface.

Furthermore, the Type-C interface auxiliary test and switching circuit further comprises a current limiting unit 7, and the USB-A interface 8 is connected with the electrostatic protection unit 2 through the current limiting unit 7. Specifically, in an embodiment, the currents of the USB-a interface 8 and the Type-C interface are not matched, and the current needs to be limited to about 1A by the current limiting unit 7, so as to prevent the connected USB interface device from being burned out due to an excessive current. When the USB interface equipment is connected into the USB-A interface 8, the communication between the USB interface equipment and the Type-C equipment is realized.

Further, the current limiting unit 7 includes a current limiting resistor R2 and a current limiting chip U3, the current limiting resistor R2 is connected to a current limiting pin ILIM of the current limiting chip U3, and the current limiting chip U3 is connected to the electrostatic protection unit 2 and the USB-a interface 8, respectively. Specifically, IN one embodiment, as shown IN fig. 5, the input pin IN of the current limiting chip U3 is connected to the 5V power supply, and the current limiting resistor R2 is connected to the current limiting pin ILIM of the current limiting chip U3 and grounded. In this embodiment, the resistance of the current limiting resistor R2 is selected to be 6.8K Ω to control the current of the circuit to be 1A.

Further, Type-C interface auxiliary test and switching circuit still includes anti-interference unit 9, anti-interference unit 9 respectively with DP interface 6 and signal conversion unit 5 is connected. Specifically, in an embodiment, as shown in fig. 6, the anti-interference unit 9 includes pull-up resistors R8 and R6 and pull-down resistors R7 and R9, the pin AXU _ ch (p) of the DP interface 6(CON1) is connected to the pull-up resistors R8 and R6 and is connected to a 3.3V power supply, the pin AXU _ ch (n) of the DP interface 6 is connected to the pull-down resistors R7 and R9 and is grounded, and the quality of signal transmission between the DP interface 6 and the first Type-C interface CON2 is improved and signal interference is avoided by the pull-up resistors R8 and R6 and the pull-down resistors R7 and R9.

Further, the voltage regulator U2 is model AS 1117. Specifically, IN one embodiment, as shown IN fig. 4, the input pin IN of the regulator U2 is connected to a 5V power supply, and the output pin outputs 3.3V after being regulated by the regulator U2. The output voltage precision of the AS1117 regulator in this embodiment is 1%.

In the above embodiments, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.

It will be apparent to those skilled in the art that various changes and modifications may be made without departing from the spirit and scope of the invention. Thus, while the invention has been described with respect to certain embodiments, it will be understood by those skilled in the art that various changes and modifications may be made without departing from the spirit and scope of the invention as defined in the appended claims.

The above description is for the specific embodiments of the present invention, but the protection scope of the present invention is not limited thereto, and any person skilled in the art can easily think of various equivalent modifications or replacements within the technical scope of the present invention, and these modifications or replacements should be covered within the protection scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

Claims

1. The utility model provides a Type-C interface auxiliary test and switching circuit which characterized in that includes: the test pin header comprises a first Type-C interface, a test pin header unit, a DP interface and a USB-A interface;

the test pin header unit is connected with the first Type-C interface and is used for testing Type-C interface equipment accessed to the first Type-C interface;

the DP interface is connected with the first Type-C interface and used for accessing DP interface equipment;

the USB-A interface is connected with the first Type-C interface and used for being connected with USB-A interface equipment.

2. The Type-C interface auxiliary testing and switching circuit of claim 1, further comprising a second Type-C interface, wherein the second Type-C interface is connected to the first Type-C interface through the test pin header unit.

3. The Type-C interface auxiliary testing and switching circuit of claim 2, further comprising an electrostatic protection unit, wherein the DP interface, the USB-A interface, the testing pin header unit and the second Type-C interface are all connected to the first Type-C interface through the electrostatic protection unit.

4. The Type-C interface auxiliary test and transfer circuit of claim 3, wherein the test pin header unit comprises a power pin header, a signal pin header and an auxiliary pin header; the power row needle the signal row needle and supplementary row needle all passes through the electrostatic protection unit with first Type-C interface connection.

5. The Type-C interface auxiliary test and transfer circuit of claim 4, further comprising a signal conversion unit, wherein the signal conversion unit is connected to the DP interface and the first Type-C interface respectively.

6. The Type-C interface auxiliary test and transfer circuit of claim 5, wherein the signal conversion unit comprises a voltage stabilizer and a signal conversion chip, the voltage stabilizer is connected with the signal conversion chip, and the signal conversion chip is connected with the DP interface.

7. The Type-C interface auxiliary test and transfer circuit of claim 6, further comprising a current limiting unit, wherein the USB-A interface is connected to the ESD protection unit through the current limiting unit.

8. The Type-C interface auxiliary test and transfer circuit of claim 7, wherein the current limiting unit comprises a current limiting resistor and a current limiting chip, the current limiting resistor is connected to a current limiting pin of the current limiting chip, and the current limiting chip is connected to the electrostatic protection unit and the USB-A interface, respectively.

9. The Type-C interface auxiliary test and transfer circuit of claim 8, further comprising an anti-interference unit, wherein the anti-interference unit is connected to the DP interface and the signal conversion unit, respectively.

10. The Type-C interface aided test and transfer circuit of claim 6, wherein the voltage regulator is of Type AS 1117.