CN215005681U - Automatic assembly line test equipment for optical chip - Google Patents
Automatic assembly line test equipment for optical chip Download PDFInfo
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- CN215005681U CN215005681U CN202121225383.4U CN202121225383U CN215005681U CN 215005681 U CN215005681 U CN 215005681U CN 202121225383 U CN202121225383 U CN 202121225383U CN 215005681 U CN215005681 U CN 215005681U
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- optical chip
- spring
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- movable carrier
- conveyor
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Abstract
The utility model discloses an automatic assembly line test equipment of optical chip relates to optical chip test field. The automatic assembly line testing equipment for the optical chips comprises a conveyor, wherein a fixed seat is fixedly arranged on the side surface of the conveyor, the upper surface of the conveyor is rotatably connected with a rotating stop lever, and a testing machine is fixedly arranged on the upper surface of the fixed seat; a movable carrier plate is arranged in the fixed seat, a first spring is arranged on the lower surface of the movable carrier plate, a reset barrier strip is connected to the upper surface of the movable carrier plate in a sliding mode, and a second spring is arranged on the back face of the reset barrier strip. This automatic assembly line test equipment of optical chip, through the inside with optical chip inserts the fixing base, optical chip can closely laminate with the test machine under the effect of first spring this moment, and optical chip conveniently shifts out from the fixing base is inside under the effect of the blend stop that resets simultaneously.
Description
Technical Field
The utility model relates to an optical chip tests technical field, specifically is an automatic assembly line test equipment of optical chip.
Background
The optical chip is used for completing photoelectric signal conversion, is equivalent to an information transfer station, belongs to a core device on a mobile device, and has the working principle that the light-emitting property of indium phosphide and the optical routing capability of silicon are integrated into a single chip, and other silicon photonic devices can be driven to operate by light beams generated when voltage is applied to the indium phosphide.
At present, testing and packaging of optical chips after production are operated in a streamlined manner, and workers operating on a production line need to take the optical chips from a conveyor belt and insert the optical chips into a testing machine for testing when testing the optical chips, but during testing, the optical chips belong to precise elements and need to be connected with the testing machine very precisely, so that more time is consumed, and meanwhile, during testing, the optical chips need to be pressed by hands, so that pins on the optical chips can be perfectly matched with the testing machine, otherwise, poor contact is easy to occur, and therefore, an automatic assembly line testing device for the optical chips is needed to be provided to solve the problems.
SUMMERY OF THE UTILITY MODEL
Technical problem to be solved
Not enough to prior art, the utility model discloses an automatic assembly line test equipment of optical chip to solve the problem that proposes in the above-mentioned background art.
(II) technical scheme
In order to achieve the above purpose, the utility model discloses a following technical scheme realizes: an optical chip automatic pipeline test apparatus, comprising:
the testing machine comprises a conveyor, wherein a fixed seat is fixedly arranged on the side surface of the conveyor, the upper surface of the conveyor is rotatably connected with a rotating stop lever, and a testing machine is fixedly arranged on the upper surface of the fixed seat;
the movable support plate, the lower surface of movable support plate is equipped with first spring, the upper surface sliding connection of movable support plate has the blend stop that resets, the back of the blend stop that resets is equipped with the second spring.
Preferably, the articulated seat is fixedly connected to one side of the upper surface of the conveyor, one end of the rotary stop lever is movably articulated inside the articulated seat, and the lower surface of the other end of the rotary stop lever is in contact with the other side of the upper surface of the conveyor.
Preferably, the conveyer's inside is equipped with the conveyer belt, the middle part lower surface that rotates the pin contacts with the upper surface of conveyer belt, the upper surface fixed mounting who rotates the pin has the handle.
Preferably, an equipment groove is formed in the fixed seat, the movable carrier plate is connected to the inside of the equipment groove in a sliding mode, and the upper surface of the movable carrier plate faces the testing machine.
Preferably, the inner bottom of the equipment groove is fixedly connected with a fixed pipe, the first spring is movably clamped inside the fixed pipe, the lower surface of the movable carrier plate is fixedly connected with a sliding insertion rod, the bottom end of the sliding insertion rod is movably inserted into the inner bottom of the fixed pipe, and the bottom end of the sliding insertion rod is abutted against the top end of the first spring.
Preferably, the upper surface of the movable carrier plate is provided with a sliding groove, the inside of the sliding groove is fixedly connected with a sliding rail, the lower surface of the reset barrier strip is fixedly connected with a sliding ring, and the sliding ring and the second spring are movably sleeved on the outer surface of the sliding rail.
Preferably, the front end of the movable carrier plate is fixedly connected with a triangular plate, the side surface of the conveyor is provided with a feeding port, and the triangular plate is opposite to the feeding port.
The utility model discloses an automatic assembly line test equipment of optical chip, its beneficial effect who possesses as follows:
1. this automatic assembly line test equipment of optical chip, through the inside of taking up optical chip and inserting the fixing base to fix a position rapidly under the effect of set-square between test machine and the activity support plate, then inwards insert optical chip, will move about this moment the support plate extrudees downwards, make first spring compressed, the lower surface at the test machine is hugged closely with optical chip extrusion to the activity support plate this moment, the convenience can fix a position rapidly when testing, guarantee simultaneously that optical chip can closely laminate with the test machine.
2. This automatic assembly line test equipment of optical chip, when optical chip inserted the inside of fixing base, the blend stop that resets was extruded to the rear side, and the slip ring slides to the rear side at the surface of slide rail this moment for the second spring is compressed, after the test, the hand of pressing optical chip this moment slowly outwards removes, and under the effect of second spring, the blend stop that resets outwards ejecting with optical chip simultaneously, conveniently takes out optical chip from the fixing base is inside after the test.
Drawings
FIG. 1 is a schematic view of the main structure of the present invention;
FIG. 2 is an exploded view of the internal structure of the fixing base of the present invention;
FIG. 3 is a schematic view of the outer surface structure of the movable carrier plate of the present invention;
fig. 4 is the schematic view of the structure of the outer surface of the rotating stop lever of the present invention.
In the figure: 1. a conveyor; 2. a fixed seat; 3. rotating the stop lever; 4. a testing machine; 5. an equipment groove; 6. A movable carrier plate; 7. a fixed tube; 8. a first spring; 9. a sliding insertion rod; 10. a set square; 11. resetting the barrier strip; 12. a chute; 13. a slide rail; 14. a slip ring; 15. a second spring; 16. a handle; 17. A hinged seat.
Detailed Description
The embodiment of the utility model discloses automatic assembly line test equipment of optical chip, as shown in fig. 1-4, include:
the testing machine comprises a conveyor 1, wherein a fixed seat 2 is fixedly mounted on the side surface of the conveyor 1, the upper surface of the conveyor 1 is rotatably connected with a rotating stop lever 3, and a testing machine 4 is fixedly mounted on the upper surface of the fixed seat 2;
the movable carrier plate 6, the lower surface of the movable carrier plate 6 is provided with a first spring 8, the upper surface of the movable carrier plate 6 is connected with a reset barrier strip 11 in a sliding manner, and the back of the reset barrier strip 11 is provided with a second spring 15.
Further, the articulated seat 17 of upper surface one side fixedly connected with of conveyer 1, the one end activity of rotating pin 3 articulates in the inside of articulated seat 17, the other end lower surface of rotating pin 3 contacts with the upper surface opposite side of conveyer 1, work when conveyer 1, the optical chip who processes this moment constantly moves forward from the conveyer belt in conveyer 1, this moment through rotating pin 3 and rotating 180 degrees, make to rotate pin 3 and keep off the upper surface at the conveyer belt, the optical chip who does not test this moment is blockked rotating pin 3 position.
Further, the conveyor 1 is internally provided with a conveyor belt, the lower surface of the middle of the rotary stop rod 3 is in contact with the upper surface of the conveyor belt, and the upper surface of the rotary stop rod 3 is fixedly provided with a handle 16.
Further, an equipment groove 5 is formed in the fixed seat 2, the movable carrier plate 6 is slidably connected to the inside of the equipment groove 5, and the upper surface of the movable carrier plate 6 faces the testing machine 4.
Further, the fixed pipe 7 of the interior bottom fixedly connected with of equipment groove 5, first spring 8 activity joint is in the inside of fixed pipe 7, the lower surface fixedly connected with of activity support plate 6 slides inserted bar 9, the bottom activity of sliding inserted bar 9 is pegged graft at the interior bottom of fixed pipe 7, the bottom of sliding inserted bar 9 offsets with the top of first spring 8, through picking up optical chip and inserting the inside of fixing base 2, and fix a position rapidly under the effect of set-square 10 between test machine 4 and the activity support plate 6, then inwards insert optical chip, push activity support plate 6 downwards this moment, make the inside removal of sliding inserted bar 9 to fixed pipe 7, make first spring 8 compressed.
Furthermore, the upper surface of the movable carrier plate 6 is provided with a sliding groove 12, the sliding groove 12 is fixedly connected with a sliding rail 13 inside, the lower surface of the reset barrier strip 11 is fixedly connected with a sliding ring 14, and the sliding ring 14 and the second spring 15 are movably sleeved on the outer surface of the sliding rail 13.
Furthermore, the front end of the movable carrier plate 6 is fixedly connected with a triangular plate 10, a feeding port is formed in the side face of the conveyor 1, and the triangular plate 10 is opposite to the feeding port.
The working principle is as follows: the utility model discloses an automatic assembly line test device for optical chips, which is characterized in that a fixed seat 2 is arranged on the side surface of a conveyor 1 in an initial state, a stop lever 3 is rotated at one side of the conveyor 1, a first spring 8 and a second spring 15 are both in a stretching state at the moment, and a reset stop bar 11 is arranged on the upper surface of a movable support plate 6 and is close to one side of the conveyor 1;
in use, when the conveyor 1 starts to work, the processed optical chip is continuously moved forward from the conveying belt in the conveyor 1, and at the moment, by rotating the rotating stop lever 3 by 180 degrees, so that the rotary blocking rod 3 blocks the upper surface of the conveyor belt, the optical chip which is not tested is blocked at the position of the rotary blocking rod 3, the operator takes up the optical chip and inserts the optical chip into the fixed seat 2, and is quickly positioned between the testing machine 4 and the movable carrier 6 by the set square 10, the optical chip is then inserted inwardly, whereupon the movable carrier plate 6 is pressed downwardly, so that the sliding plunger 9 moves towards the inside of the fixed tube 7, the first spring 8 is compressed, the movable carrier plate 6 presses the optical chip to be tightly attached to the lower surface of the testing machine 4, and the testing machine 4 tests the optical chip to check whether the optical chip can be normally used;
simultaneously optical chip will reset blend stop 11 backward side extrusion, the slip ring 14 slides at the surface of slide rail 13 backward side this moment for second spring 15 is compressed, after the test, the hand of pressing optical chip this moment is outwards removed slowly, simultaneously under the effect of second spring 15, reset blend stop 11 outwards ejecting optical chip, conveniently take out optical chip from fixing base 2 is inside after the test, then place optical chip and convey on the conveyer belt downwards, and carry out the test of the optical chip of second group.
The basic principles and the main features of the invention and the advantages of the invention have been shown and described above. It will be understood by those skilled in the art that the present invention is not limited to the above embodiments, and that the foregoing embodiments and descriptions are provided only to illustrate the principles of the present invention without departing from the spirit and scope of the present invention. The scope of the invention is defined by the appended claims and equivalents thereof.
Claims (7)
1. An optical chip automatic pipeline test device, comprising:
the testing machine comprises a conveyor (1), wherein a fixed seat (2) is fixedly mounted on the side surface of the conveyor (1), the upper surface of the conveyor (1) is rotatably connected with a rotating stop lever (3), and a testing machine (4) is fixedly mounted on the upper surface of the fixed seat (2);
the movable carrier plate (6), the lower surface of movable carrier plate (6) is equipped with first spring (8), the upper surface sliding connection of movable carrier plate (6) has the blend stop (11) that resets, the back of the blend stop (11) that resets is equipped with second spring (15).
2. The automatic in-line optical chip testing apparatus of claim 1, wherein: the upper surface of conveyer (1) one side fixedly connected with articulates seat (17), the one end activity of rotating pin (3) articulates in the inside of articulating seat (17), the other end lower surface of rotating pin (3) contacts with the upper surface opposite side of conveyer (1).
3. The automatic in-line optical chip testing apparatus of claim 2, wherein: the inside of conveyer (1) is equipped with the conveyer belt, the middle part lower surface that rotates pin (3) contacts with the upper surface of conveyer belt, the upper surface fixed mounting who rotates pin (3) has handle (16).
4. The automatic in-line optical chip testing apparatus of claim 1, wherein: the testing machine is characterized in that an equipment groove (5) is formed in the fixed seat (2), the movable carrier plate (6) is connected to the inside of the equipment groove (5) in a sliding mode, and the upper surface of the movable carrier plate (6) is opposite to the testing machine (4).
5. The automatic in-line optical chip testing apparatus of claim 4, wherein: the inner bottom of the equipment groove (5) is fixedly connected with a fixed pipe (7), the first spring (8) is movably clamped inside the fixed pipe (7), the lower surface of the movable carrier plate (6) is fixedly connected with a sliding insertion rod (9), the bottom end of the sliding insertion rod (9) is movably inserted into the inner bottom of the fixed pipe (7), and the bottom end of the sliding insertion rod (9) is abutted to the top end of the first spring (8).
6. The automatic in-line optical chip testing apparatus of claim 1, wherein: the upper surface of activity support plate (6) has seted up spout (12), the inside fixedly connected with slide rail (13) of spout (12), the lower fixed surface of fender strip (11) that resets is connected with slip ring (14), slip ring (14) and second spring (15) are all movable to be cup jointed at the surface of slide rail (13).
7. The automatic in-line optical chip testing apparatus of claim 1, wherein: the front end fixedly connected with set-square (10) of activity support plate (6), the material loading mouth has been seted up to the side of conveyer (1), set-square (10) just are to the material loading mouth.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121225383.4U CN215005681U (en) | 2021-06-02 | 2021-06-02 | Automatic assembly line test equipment for optical chip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121225383.4U CN215005681U (en) | 2021-06-02 | 2021-06-02 | Automatic assembly line test equipment for optical chip |
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| Publication Number | Publication Date |
|---|---|
| CN215005681U true CN215005681U (en) | 2021-12-03 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202121225383.4U Active CN215005681U (en) | 2021-06-02 | 2021-06-02 | Automatic assembly line test equipment for optical chip |
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| CN (1) | CN215005681U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116499715A (en) * | 2023-05-18 | 2023-07-28 | 深圳市卓兴半导体科技有限公司 | MiNi LED automatic spectrum detection correction machine |
-
2021
- 2021-06-02 CN CN202121225383.4U patent/CN215005681U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116499715A (en) * | 2023-05-18 | 2023-07-28 | 深圳市卓兴半导体科技有限公司 | MiNi LED automatic spectrum detection correction machine |
| CN116499715B (en) * | 2023-05-18 | 2024-03-22 | 深圳市卓兴半导体科技有限公司 | MiNi LED automatic spectrum detection correction machine |
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