CN215005543U

CN215005543U - Primary-secondary probe card assembling structure

Info

Publication number: CN215005543U
Application number: CN202120864029.XU
Authority: CN
Inventors: 赵坤鹏; 杨征
Original assignee: Wuxi Weishi Semiconductor Technology Co ltd
Current assignee: Wuxi Weishi Semiconductor Technology Co ltd
Priority date: 2021-04-25
Filing date: 2021-04-25
Publication date: 2021-12-03
Anticipated expiration: 2031-04-25

Abstract

The utility model discloses a primary and secondary formula probe card assembly structure, include two circuit boards of connecting through the winding displacement, be provided with insulating spliced pole between two circuit boards, the both ends of spliced pole all are equipped with latch device, and the spliced pole passes through latch device and can dismantle with the circuit board and be connected. The utility model discloses fall into the circuit board two, set up the probe and the peripheral circuit of probe card respectively on two circuit boards, make the design preparation of two circuit boards go on simultaneously, shortened the preparation cycle of probe card greatly, in the probe card use, if peripheral circuit or probe go wrong, only need can continue the effect with a circuit board replacement of wherein breaking down, but the work efficiency of probe card has been improved greatly to the maintenance alone of trouble circuit board.

Description

Primary-secondary probe card assembling structure

Technical Field

The utility model belongs to the technical field of the semiconductor, especially, relate to a primary and secondary formula probe card assembly structure.

Background

The traditional probe card is characterized in that probes and peripheral circuits are arranged on a circuit board, the probes and components can be additionally arranged only after the circuit board is designed and processed in the whole probe card manufacturing process, the whole period is long, the probe card is complex to maintain, the whole probe card cannot be used when any part of the probe card is in trouble and is maintained, and the testing efficiency is influenced.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a primary and secondary formula probe card assembly structure to solve the probe card and make the technical problem who maintains the difficulty.

In order to achieve the above object, the technical solution of the assembly structure of the mother-son probe card of the present invention is as follows:

the utility model provides a primary and secondary formula probe card assembly structure, includes two circuit boards through winding displacement connection, two be provided with insulating spliced pole between the circuit board, the both ends of spliced pole all are equipped with latch device, the spliced pole pass through latch device with the circuit board can be dismantled and be connected.

Preferably, the latch device is including seting up connecting hole and two settings on the circuit board are in couple on the spliced pole terminal surface, two the couple is about the axial lead symmetry of spliced pole sets up, the couple runs through the connecting hole, the hook portion of couple with deviating from of circuit board the side of spliced pole supports and leans on.

Preferably, two it has the location inserted block to peg graft between the couple, supports through the location inserted block and leans on the couple, can prevent that the couple from taking place to drop.

Preferably, the positioning insertion block has elasticity, and the surface of the positioning insertion block is serrated, so that the positioning insertion block and the hook can be prevented from being separated.

Preferably, be connected with the protective cover on the location inserted block, through the protective cover covers the hook portion of couple can protect the couple and prevent that couple hook portion from taking place to damage.

Preferably, two be equipped with insulating heat-conducting layer on the opposite side of circuit board, two be equipped with the backup pad between the insulating heat-conducting layer, the through hole has been seted up in the backup pad, the spliced pole runs through the through hole, can realize the support to the circuit board, improves circuit board anti-seismic performance.

Preferably, the supporting plate is an aluminum alloy corrugated plate, so that the anti-seismic performance of the circuit board is further improved, and the heat dissipation effect of the circuit board is improved.

Preferably, the insulating heat-conducting layer is a heat-conducting silica gel sheet, and the heat-conducting silicon wafer is good in insulating property, has a good heat-conducting effect and can ensure the insulating property and the heat-radiating property of the circuit board.

The utility model discloses a primary and secondary formula probe card assembly structure has following advantage: the circuit board is divided into two circuit boards, the probes and the peripheral circuits of the probe card are respectively arranged on the two circuit boards, so that the design and manufacture of the two circuit boards can be carried out simultaneously, the manufacture period of the probe card is greatly shortened, if the peripheral circuits or the probes have problems in the use process of the probe card, the circuit board with the fault can continue to function only by replacing the circuit board with the fault, the fault circuit board can be independently maintained, and the working efficiency of the probe card is greatly improved.

Drawings

Fig. 1 is a schematic structural view of a primary-secondary probe card assembly structure of the present invention;

fig. 2 is a cross-sectional view of the mother-son probe card assembly structure of the present invention;

FIG. 3 is an enlarged view of portion A of FIG. 2;

the notation in the figure is: 1. connecting columns; 2. an insulating heat-conducting layer; 3. a support plate; 4. a circuit board; 5. a protective cover; 6. arranging wires; 7. hooking; 8. positioning the insert block; 9. a through hole; 10. and connecting the holes.

Detailed Description

In order to better understand the purpose, structure and function of the present invention, the following description is made in detail with reference to the accompanying drawings.

As shown in fig. 1-3, a mother-son type probe card assembly structure comprises two circuit boards 4 connected by a flat cable 6, an insulating connecting column 1 is arranged between the two circuit boards 4, two ends of the connecting column 1 are respectively provided with a clamping device, the connecting column 1 is detachably connected with the circuit boards 4 by the clamping devices, the clamping devices comprise a connecting hole 10 formed in the circuit boards 4 and two hooks 7 arranged on the end surface of the connecting column 1, the two hooks 7 are symmetrically arranged about the axial lead of the connecting column 1, the hooks 7 penetrate through the connecting hole 10, the hook parts of the hooks 7 are abutted against the side surface of the circuit board 4 away from the connecting column 1, the hooks 7 have elasticity, after the two hooks 7 are inserted into the connecting hole, the hook parts of the hooks 7 hook the circuit boards 4, when the hook parts of the two hooks 7 are pressed to be close to each other, the hook parts of the hooks 7 are separated from the circuit boards 4, and connection and separation between the two circuit boards 4 can be realized, it has location inserted block 8 to peg graft between two couples 7, circuit board 4 installation back, location inserted block 8 inserts between two couples 7, can realize leaning on to two couples 7, prevent that couple 7 and circuit board 4 from breaking away from, improve connection reliability, location inserted block 8 has elasticity and its surface is the cockscomb structure, can prevent location inserted block 8 to take place to drop, be connected with protective cover 5 on the location inserted block 8, cover the hook portion of couple 7 through protective cover 5, protective cover 5 not only helps the plug of location inserted block 8, hook portion through protective cover 8 can protect couple 7 simultaneously, extension couple 7 life.

Be equipped with the insulating heat-conducting layer 2 of making by the heat conduction silica gel piece on the side that two circuit boards 4 are relative, be equipped with backup pad 3 between two insulating heat-conducting layers 2, insulating heat-conducting layer 2 can keep circuit board 4's insulating properties, realize the support between two circuit boards 4 through backup pad 3, improve circuit board 4's antidetonation effect, backup pad 3 is aluminum alloy corrugated plate, can further improve two circuit board 4's antidetonation effect, can improve circuit board 4's radiating effect simultaneously, through hole 9 has been seted up in backup pad 3, spliced pole 1 runs through hole 9.

It is to be understood that the present invention has been described with reference to certain embodiments, and that various changes or equivalents may be substituted for elements thereof by those skilled in the art without departing from the spirit and scope of the invention. In addition, many modifications may be made to adapt a particular situation or material to the teachings of the invention without departing from the essential scope thereof. Therefore, the present invention is not limited to the specific embodiments disclosed herein, and all embodiments falling within the scope of the claims of the present application are intended to be covered by the present invention.

Claims

1. The utility model provides a primary and secondary formula probe card assembly structure, its characterized in that includes two circuit boards (4) of connecting through winding displacement (6), two be provided with insulating spliced pole (1) between circuit board (4), the both ends of spliced pole (1) all are equipped with latch device, spliced pole (1) pass through latch device with circuit board (4) can dismantle the connection.

2. The assembly structure of a primary-secondary probe card according to claim 1, wherein the clamping device comprises a connecting hole (10) formed in the circuit board (4) and two hooks (7) arranged on the end surface of the connecting column (1), the two hooks (7) are symmetrically arranged about the axial line of the connecting column (1), the hooks (7) penetrate through the connecting hole (10), and the hook parts of the hooks (7) are abutted against the side surface of the circuit board (4) departing from the connecting column (1).

3. The structure of claim 2, wherein a positioning block (8) is inserted between the two hooks (7).

4. The probe card assembly structure of claim 3, wherein the positioning insert (8) has elasticity and its surface is serrated.

5. The assembly structure of a mother-son probe card according to claim 4, wherein the positioning insert block (8) is connected with a protective cover (5), and the protective cover (5) covers the hook part of the hook (7).

6. The assembly structure of a mother-son probe card according to claim 1, wherein two opposite sides of the circuit board (4) are provided with heat-insulating and heat-conducting layers (2), a supporting plate (3) is arranged between the two heat-insulating and heat-conducting layers (2), a through hole (9) is formed in the supporting plate (3), and the connecting column (1) penetrates through the through hole (9).

7. The sub-mother probe card assembly structure according to claim 6, wherein the supporting plate (3) is an aluminum alloy corrugated plate.

8. The prober assembly according to claim 6, wherein the insulating and heat conducting layer (2) is a heat conducting silicone sheet.