CN215005052U

CN215005052U - Double-station test fixture for integrated test of multiple functions of PCB (printed circuit board)

Info

Publication number: CN215005052U
Application number: CN202121207924.0U
Authority: CN
Inventors: 姬海丰
Original assignee: Kunshan Shengchang Electronics Co ltd
Current assignee: Kunshan Shengchang Electronics Co ltd
Priority date: 2021-06-01
Filing date: 2021-06-01
Publication date: 2021-12-03
Anticipated expiration: 2031-06-01

Abstract

The utility model discloses a duplex position test fixture of integrated integrative test of PCB circuit board multinomial function, the on-line screen storage device comprises a base, a column, the crossbeam, test support plate one, test support plate two, horizontal adjustment mechanism, pressing mechanism and scanning device, the stand sets up on the base perpendicularly, the crossbeam sets up on the stand, test support plate one and test support plate two all through elastic component parallel mount on the base, the below that lies in test support plate one and test support plate two on the base is equipped with flexible probe, horizontal adjustment mechanism sets up on the crossbeam, pressing mechanism and scanning device all are connected with horizontal adjustment mechanism. During testing, the two circuit boards to be tested can be placed on the first test carrier plate and the second test carrier plate for testing, so that the working efficiency is greatly improved; and moreover, the function test of the circuit board to be tested and the comprehensive detection of the surface welding condition of the circuit board can be realized, and the condition that the function test of the circuit board passes and the pin of the element on the circuit board to be tested is not welded to the position and the false welding occurs is avoided.

Description

Double-station test fixture for integrated test of multiple functions of PCB (printed circuit board)

Technical Field

The utility model relates to a circuit board detects technical field, specifically is duplex position test fixture of integrated integrative test of PCB circuit board multinomial function.

Background

The PCB circuit board is a provider of electrical connection of electronic components, the main advantages of the circuit board are that errors of wiring and assembly are greatly reduced, automation level and production efficiency are provided, after the PCB circuit board is manufactured, tests are usually required to be carried out for ensuring the processing quality of the PCB circuit board, and the connection and electrical property of each electrical circuit are checked to ensure the production quality of the PCB circuit board; in the prior art, most circuit board test fixtures are mostly tested by manual pressing plates, so that the automation is low, the operation is laborious, potential safety hazards exist, and the test fixtures can only test one circuit board at a time, so that the workload is large, and the test efficiency is low; after the circuit board passes the functional test, the circuit board needs to be taken down and sent to a next detection jig to check the condition that the pin on the circuit board has the insufficient solder so as to ensure the service life of the outgoing PCB and reduce the repair probability; and the circuit board is taken down from different jigs and is sent to the next jig for detection, thus prolonging the test time of the PCB circuit board and having low test efficiency.

SUMMERY OF THE UTILITY MODEL

Utility model purpose: the utility model aims at providing a duplex position test fixture of the integrative test of PCB circuit board multinomial function integration. During testing, the two circuit boards to be tested can be placed on the first test carrier plate and the second test carrier plate for testing, so that the working efficiency is greatly improved; and moreover, the function test of the circuit board to be tested and the comprehensive detection of the surface welding condition of the circuit board can be realized, and the condition that the function test of the circuit board passes and the pin of the element on the circuit board to be tested is not welded to the position and the false welding occurs is avoided.

The technical scheme is as follows: in order to achieve the above object, PCB circuit board multinomial function integration integrative test's duplex position test fixture, including base, stand, crossbeam, test support plate one, test support plate two, horizontal adjustment mechanism, pressing mechanism and scanning device, the stand sets up perpendicularly on the base, and the crossbeam setting is on the stand, test support plate one and test support plate two are all through elastic component parallel mount on the base, the below that lies in test support plate one and test support plate two on the base is equipped with flexible probe, horizontal adjustment mechanism sets up on the crossbeam, and pressing mechanism and scanning device all are connected with horizontal adjustment mechanism.

Furthermore, the transverse adjusting mechanism comprises a first motor, a first screw rod, a first sliding seat and a second sliding seat, the first motor is installed on the cross beam, the first screw rod is installed on the cross beam through a fixed seat, and the first sliding seat and the second sliding seat are in threaded connection with the first screw rod. The transverse adjusting mechanism drives the pressing mechanism and the scanning device to move on the cross beam, and when the pressing mechanism descends, the circuit boards to be tested placed on the first test carrier plate and the second test carrier plate are slowly pressed down, so that the circuit boards to be tested are contacted with the telescopic probes, and then the function detection of the two circuit boards to be tested is realized; after the detection is finished, the pressing mechanism ascends, the scanning device is horizontally moved to the positions above the first test carrier plate and the second test carrier plate, and image collection is carried out on the welding condition of the element pins on the circuit board to be detected.

Furthermore, the pressing mechanism comprises a first lifting cylinder, a fixing plate, a buffer plate and an insulating pressing plate, the telescopic rod of the first lifting cylinder is connected with the fixing plate, a guide rod is arranged between the buffer plate and the fixing plate, a spring is arranged on the guide rod, and the insulating pressing plate is arranged below the buffer plate.

Furthermore, circuit board holding tanks are arranged on the first test carrier plate and the second test carrier plate, probe through holes are formed in the circuit board holding tanks, and circuit board taking and placing grooves are formed in the periphery of the circuit board holding tanks.

Further, scanning device includes second, mounting panel, front and back adjustment mechanism and CCD camera of lift cylinder, second installs on second sliding seat, second lift cylinder's telescopic link is connected with the mounting panel, and front and back displacement adjustment mechanism fixes on the mounting panel, and the CCD camera is connected with front and back displacement adjustment mechanism. The transverse adjusting mechanism drives the sliding seat to move left and right, the lifting cylinder II drives the front and rear adjusting mechanism to descend to a certain height, the front and rear adjusting mechanism drives the CCD camera to move front and rear, all-dimensional scanning of the circuit board to be detected is achieved, pin welding images of the circuit board to be detected are collected, then image information of the pin welding images is sent to the PC to be compared, analyzed, checked and judged with standardized image information of the circuit board to be detected, the circuit board which is welded unqualified is detected, the detection speed is improved, and the labor cost is saved.

Further, the front and back displacement adjusting mechanism comprises a second motor, a second screw rod and a third sliding seat, the second motor is arranged on the mounting plate, the second screw rod is arranged on the mounting plate, the third sliding seat is connected with the second screw rod, and the CCD camera is arranged on the third sliding seat.

Further, the elastic member comprises a compression spring and connecting blocks, and the connecting blocks are arranged at two ends of the compression spring. The elastic piece is arranged below the first test carrier plate and the second test carrier plate, the first test carrier plate and the second test carrier plate are pressed downwards by the insulating pressing plate, the elastic piece is in contact with the base, the first test carrier plate and the second test carrier plate slowly descend, and the telescopic probes penetrate out of the first test carrier plate and the second test carrier plate and are in contact connection with the circuit board to be tested.

Above-mentioned technical scheme can see out, the beneficial effects of the utility model are that:

(1) the utility model discloses a duplex position test fixture of integrated test of PCB circuit board multinomial function not only can place two circuit boards to be tested on test support plate one and test support plate two during the test, improve work efficiency greatly; and moreover, the function test of the circuit board to be tested and the image acquisition of the surface welding condition of the circuit board can be realized, and the condition that the function test of the circuit board passes and the false welding occurs when the pins of the element on the circuit board to be tested are not welded in place can be avoided, so that the condition that the circuit board after leaving the factory has poor contact in the later use process.

(2) Duplex position test fixture of integrated integrative test of PCB circuit board multinomial function, during the test, pressing mechanism pushes down test support plate one and test support plate two, elastic component and base contact for test support plate one slowly descends with test support plate two, flexible probe is worn out from test support plate one and test support plate two and is connected with the circuit board contact that awaits measuring and carry out the functional test.

Drawings

Fig. 1 is a schematic structural view of the present invention;

fig. 2 is a schematic structural view of the pressing mechanism of the present invention;

fig. 3 is a schematic structural diagram of the scanning device of the present invention;

fig. 4 is a schematic structural diagram of the base, the first test carrier and the second test carrier of the present invention.

Detailed Description

The invention will be further elucidated with reference to the drawings and the specific embodiments.

The double-station test fixture for the integrated test of multiple functions of the PCB comprises a base 1, a stand column 2, a cross beam 3, a first test carrier plate 4, a second test carrier plate 5, a transverse adjusting mechanism 6, a pressing mechanism 7 and a scanning device 8, wherein the stand column 2 is vertically arranged on the base 1, the cross beam 3 is arranged on the stand column 2, the first test carrier plate 4 and the second test carrier plate 5 are both arranged on the base 1 in parallel through elastic pieces 9, a telescopic probe 10 is arranged below the first test carrier plate 4 and the second test carrier plate 5 on the base 1, the transverse adjusting mechanism 6 is arranged on the cross beam 3, and the pressing mechanism 7 and the scanning device 8 are both connected with the transverse adjusting mechanism 6.

The transverse adjusting mechanism 6 comprises a first motor 61, a first screw rod 62, a first sliding seat 63 and a second sliding seat 64, the first motor 61 is installed on the cross beam 3, the first screw rod 62 is installed on the cross beam 3 through a fixed seat, and the first sliding seat 63 and the second sliding seat 64 are in threaded connection with the first screw rod 62.

In this embodiment, the pressing mechanism 7 includes a first lifting cylinder 71, a fixing plate 72, a buffer plate 73 and an insulating pressing plate 74, an expansion rod of the first lifting cylinder 71 is connected to the fixing plate 72, a guide rod 75 is disposed between the buffer plate 73 and the fixing plate 72, a spring 751 is disposed on the guide rod 72, and the insulating pressing plate 74 is disposed below the buffer plate 73.

In this embodiment, the first test carrier plate 4 and the second test carrier plate 5 are provided with a circuit board accommodating groove a, the circuit board accommodating groove a is provided with a probe penetration hole a1, and a circuit board taking and placing groove a2 is formed around the circuit board accommodating groove a.

In this embodiment, the scanning device 8 includes a second lifting cylinder 81, a mounting plate 82, a front-back adjusting mechanism 83 and a CCD camera 84, the second lifting cylinder 81 is mounted on the second sliding seat 64, an expansion rod of the second lifting cylinder 81 is connected with the mounting plate 82, the front-back displacement adjusting mechanism 83 is fixed on the mounting plate 82, and the CCD camera 84 is connected with the front-back displacement adjusting mechanism 83.

In this embodiment, the front-rear displacement adjusting mechanism 83 includes a second motor 831, a second screw rod and a third sliding seat 833, the second motor 831 is disposed on the mounting plate 82, the second screw rod is disposed on the mounting plate 82, the third sliding seat 833 is connected to the second screw rod, and the CCD camera 84 is mounted on the third sliding seat 833.

The elastic member 9 in this embodiment includes a compression spring 91 and connection blocks 92, and the connection blocks 92 are disposed at both ends of the compression spring 91.

The examples are given solely for the purpose of illustration and are not intended to limit the scope of the invention, which is to be determined by those skilled in the art after reading the present disclosure, and all such equivalents are intended to fall within the scope of the invention as defined in the claims appended hereto.

Claims

The double-station test fixture for the integrated test of multiple functions of the PCB is characterized in that: the testing device comprises a base (1), a stand column (2), a cross beam (3), a first testing carrier plate (4), a second testing carrier plate (5), a transverse adjusting mechanism (6), a pressing mechanism (7) and a scanning device (8), wherein the stand column (2) is vertically arranged on the base (1), the cross beam (3) is arranged on the stand column (2), the first testing carrier plate (4) and the second testing carrier plate (5) are both arranged on the base (1) in parallel through elastic pieces (9), a telescopic probe (10) is arranged below the first testing carrier plate (4) and the second testing carrier plate (5) on the base (1), the transverse adjusting mechanism (6) is arranged on the cross beam (3), and the pressing mechanism (7) and the scanning device (8) are both connected with the transverse adjusting mechanism (6).
2. The double-station test fixture for the integrated test of the multiple functions of the PCB according to claim 1, characterized in that: the transverse adjusting mechanism (6) comprises a first motor (61), a first screw rod (62), a first sliding seat (63) and a second sliding seat (64), the first motor (61) is installed on the cross beam (3), the first screw rod (62) is installed on the cross beam (3) through a fixed seat, and the first sliding seat (63) and the second sliding seat (64) are in threaded connection with the first screw rod (62).
3. The double-station test fixture for the integrated test of the multiple functions of the PCB according to claim 2, characterized in that: the pressing mechanism (7) comprises a first lifting cylinder (71), a fixing plate (72), a buffer plate (73) and an insulating pressing plate (74), a telescopic rod of the first lifting cylinder (71) is connected with the fixing plate (72), a guide rod (75) is arranged between the buffer plate (73) and the fixing plate (72), a spring (751) is arranged on the guide rod (75), and the insulating pressing plate (74) is arranged below the buffer plate (73).
4. The PCB circuit board multi-function integrated test double-station test fixture of claim 3, which is characterized in that: be equipped with circuit board holding tank (a) on test support plate (4) and test support plate two (5), be equipped with probe through hole (a 1) on circuit board holding tank (a), it gets to put recess (a 2) to be equipped with the circuit board around circuit board holding tank (a).
5. The PCB circuit board multi-function integrated test double-station test fixture of claim 4, which is characterized in that: scanning device (8) are including two (81) of lift cylinder, mounting panel (82), front and back displacement adjustment mechanism (83) and CCD camera (84), two (81) of lift cylinder are installed on sliding seat two (64), the telescopic link of two (81) of lift cylinder is connected with mounting panel (82), and front and back displacement adjustment mechanism (83) are fixed on mounting panel (82), and CCD camera (84) are connected with front and back displacement adjustment mechanism (83).
6. The PCB circuit board multi-function integrated test double-station test fixture of claim 5, which is characterized in that: the front-back displacement adjusting mechanism (83) comprises a second motor (831), a second screw rod and a third sliding seat (833), the second motor (831) is arranged on the mounting plate (82), the second screw rod is arranged on the mounting plate (82), the third sliding seat (833) is connected with the second screw rod, and the CCD camera (84) is arranged on the third sliding seat (833).
7. The double-station test fixture for the integrated test of the multiple functions of the PCB according to claim 1, characterized in that: the elastic piece (9) comprises a compression spring (91) and connecting blocks (92), wherein the connecting blocks (92) are arranged at two ends of the compression spring (91).