CN214503755U - Dielectric constant measuring device based on waveguide structure - Google Patents

Dielectric constant measuring device based on waveguide structure Download PDF

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CN214503755U
CN214503755U CN202120094708.3U CN202120094708U CN214503755U CN 214503755 U CN214503755 U CN 214503755U CN 202120094708 U CN202120094708 U CN 202120094708U CN 214503755 U CN214503755 U CN 214503755U
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洪涛
种传印
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China West Normal University
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Abstract

The utility model relates to a microwave measurement technical field just discloses a dielectric constant measuring device based on waveguide structure, including six port reflectometers, the last fixed surface of six port reflectometers installs rectangular waveguide, rectangular waveguide's side fixed mounting has port seven. The utility model discloses a, constitute by two way microwave transmission line couplings through directional coupler, the microwave that will have certain proportion from the thread input is coupled to the subline on, trompil on rectangular waveguide, place the cuboid metal strip between aperture higher authority and the upper cover plate, this project design six port reflection timing uses rectangular waveguide, consequently trompil on rectangular waveguide broad face, couple the stripline with the microwave through the aperture, then transmit to the stripline both ends and connect on the coaxial line, transmit the power meter through the coaxial line, this just constitutes waveguide-stripline-coaxial line type directional coupler, thereby the complexity of greatly reduced system and the purpose of cost have been reached.

Description

Dielectric constant measuring device based on waveguide structure
Technical Field
The utility model relates to a microwave measurement technical field specifically is a dielectric constant measuring device based on waveguide structure.
Background
The microwave application is mainly in the application of information transmission and microwave energy, the microwave measurement technology is one of the main applications of microwave, which is the basis and important component of microwave application, electromagnetic materials are widely applied in the civil, industrial and national defense fields, the electromagnetic parameters of the electromagnetic materials have important influence on the performance and indexes of devices, wherein the dielectric constant is the most important parameter in the electromagnetic parameters, so the dielectric constant of the materials is more important to measure, a plurality of methods for measuring the dielectric constant are provided, the method is spread in various fields of industry, civil use and national defense, at present, in the electromagnetic theory and the microwave network theory, the scattering parameters are generally adopted to derive the dielectric constant, the measurement of the scattering parameters needs to be realized by microwave measurement, more advanced network measurement technology and measurement instrument are needed, 1934 Bell laboratory firstly starts the measurement research of the network parameters and develops a measurement method for the transmission parameters, the method can display a polar coordinate graph of transmission parameters on an oscilloscope, and the microwave measurement technology is continuously innovated and divided into the traditional microwave measurement technology and the modern microwave measurement technology.
Although the dielectric constant measuring method is various, the dielectric property of the material that the change of temperature will influence to influence the information transmission performance of the antenna on the shield cover, bring very big interference for signal transmission, but not can be once and for all, move hard cover, different systems, measure different materials, the measuring method who chooses for use is also different under the frequency of difference, it is less to measure the scheme of dielectric constant under the powerful microwave, and generally the cost is expensive, and the structure is complicated, can't realize the complex dielectric constant real-time measurement function of while heating measurement, for this reason, the utility model provides a dielectric constant measuring device based on waveguide structure.
SUMMERY OF THE UTILITY MODEL
The not enough to prior art, the utility model provides a dielectric constant measuring device based on waveguide structure, possess the microwave measurement and realize the complex dielectric constant of measuring material under high-power microwave, so as to realize the complex dielectric constant of material under the different temperatures of limit heating limit real-time measurement, low in cost, moreover, the steam generator is simple in structure, the accuracy is high, applicable solid, liquid, gaseous polymorphic measurement, adopt double-deck evacuation silicon pipe and ridge waveguide to make the heating more even, introduce computer neural network, improve the advantage that calculation precision reduces the calculation degree of difficulty, the dielectric property of the material that microwave measurement temperature's change probably influences has been solved, thereby influence the information transmission performance of the antenna on the shield cover, bring the problem of very big interference for signal transmission.
The utility model provides a following technical scheme: a dielectric constant measuring device based on a waveguide structure comprises a reflectometer, wherein a rectangular waveguide is fixedly arranged on the upper surface of the reflectometer, a first port is fixedly arranged on the side surface of the rectangular waveguide, a second port is fixedly arranged at one end, far away from the first port, of the rectangular waveguide, a directional coupler of a waveguide-strip line-coaxial line structure is arranged on the wide surface of the rectangular waveguide, a fourth port is arranged on the upper surface of the directional coupler, a coaxial line is fixedly arranged on one side of the fourth port, a power meter is fixedly arranged at one end, far away from the fourth port, of the coaxial line, a probe is fixedly arranged on the side surface of the rectangular waveguide, a third port is arranged on the upper surface of the probe, a fifth port is arranged on one side, far away from the fifth port, of the probe, a sixth port is arranged on one side, far away from the fifth port, of the reflectometer, a ridge waveguide is fixedly connected to one side of the reflectometer, the device comprises a ridge waveguide, a first connecting block, a second connecting block, a first cut-off waveguide and a second cut-off waveguide, wherein the first connecting block is arranged on one side of the ridge waveguide, the second connecting block is arranged at one end, away from the first connecting block, of the ridge waveguide, the first cut-off waveguide is fixedly arranged on one side of the ridge waveguide, and the second cut-off waveguide is fixedly arranged at one end, away from the first cut-off waveguide, of the ridge waveguide.
Preferably, the two sides of the ridge waveguide are a wide surface and a narrow surface, the wide surface of the ridge waveguide is provided with two openings and is provided with a first cut-off waveguide, and the narrow surface of the ridge waveguide is also provided with two openings and is provided with a second cut-off waveguide.
Preferably, the reflectometer and the ridge waveguide are both arranged in a rectangular shape and are fixedly installed through the first connecting block and the second connecting block.
Preferably, the wide-surface-mounted cut-off waveguide of the ridge waveguide can be used for measuring the temperature, and the narrow-surface-mounted cut-off waveguide of the ridge waveguide is used for observing the form of the material.
Preferably, the sides of the reflectometer are tangent to the sides of the ridge waveguide.
Preferably, the port three, the port five and the port six three are combined into a probe structure.
Compared with the prior art, the utility model discloses possess following beneficial effect:
1. the dielectric constant measuring device based on the waveguide structure is a microwave measuring technology with an early origin and relatively mature source through a six-port measuring technology, has high measuring precision, low manufacturing cost and simple structure, is rapidly developed, utilizes the six-port measuring technology to accurately measure the reflection coefficient and the phase, obtains a neural network model between a microwave parameter S11 and a complex dielectric constant by means of a BP neural network, further obtains the complex dielectric constant of a material, and introduces the neural network technology to greatly reduce the calculation process, has simpler structure and higher flexibility and precision, can establish a mathematical model between the measuring power of a measuring power meter and the reflection coefficient of a load to be measured through a microwave network analysis theory in a given six-port measuring system, the mathematical model is the theoretical basis of the six-port reflectometer, and the relative power theory of the six ports is the most commonly used method for deriving the mathematical model of the six-port measuring system, the general equation for any six-port reflectometer is:
Figure DEST_PATH_GDA0003261778410000031
according to the analysis of the six-port mathematical model and the geometric model, the six-port reflectometer needs to meet the following design criteria:
1.1, the reference port 4 (directional coupler) is ideally coupled with only the incident wave b2 of the measured piece, but not coupled with the reflected wave a2 of the measured piece, generally the coupling degree of the port is required to be controlled to be about-40 dB, the isolation degree is about-60 dB, and the port is used for sampling the input power of the microwave source, so the stability of the system is directly influenced by the quality of the isolation degree.
1.2, three central points qk of the six-port reflectometer are uniformly distributed, the phase difference is 120 degrees, and the qk distribution directly influences the measurement precision.
1.3, the distance from the center of the three circles to the origin should be between 0.5 and 1.5 and cannot be equal to 1, and the qk amplitude influences the dynamic range of the power meter.
2. The dielectric constant measuring device based on the waveguide structure is formed by coupling two microwave transmission lines through a directional coupler, and is a four-port microwave component, microwaves input from a main line are coupled to a secondary line in a certain proportion and only propagate in one direction, the microwaves which propagate reversely are basically avoided, the directional coupler has various forming modes and types, mature technology and high measurement precision, the directional coupler is designed by adopting a single-hole coupling method, a hole is formed in a rectangular waveguide, a cuboid metal strip is arranged between the upper side of the small hole and an upper cover plate and is not contacted with the upper surface and the lower surface, P1 and P2 are respectively input and output of the rectangular waveguide, P3 is a coupling port, the other port is a coupling load, and the project designs a six-port reflection timing mode to use the rectangular waveguide, so that the hole is formed in the wide surface of the rectangular waveguide, microwave is coupled to the strip line through the small hole, then transmitted to the two ends of the strip line to be connected with the coaxial line, and transmitted to the power meter through the coaxial line, so that the waveguide-strip line-coaxial line type directional coupler is formed, and the purposes of greatly reducing the complexity and the cost of the system are achieved.
3. In the dielectric constant measuring device based on the waveguide structure, a BP neural network is a multilayer forward neural network trained based on an error back propagation algorithm (BP algorithm), and structurally, the BP neural network is provided with an input layer, a hidden layer and an output layer; in essence, the BP algorithm is that the square of a network error is used as a target function, a gradient descent method is adopted to calculate the minimum value of the target function, the error propagated each time is reversely propagated from an output layer, weight values of all layers are continuously adjusted through the gradient descent method, a neuron adopts a sigmoid activation function, the nonlinear mapping relation of input and output during network training can be realized, the neural network is applied to deducing a mathematical model between an S parameter and a complex dielectric constant, the application of the technology is not limited by the shape and the physical state of a material to be measured, in addition, the use of the neural network not only greatly simplifies the calculation process, but also has higher accuracy than the traditional formula deduction and approximate value, and the aim of higher accuracy is fulfilled.
4. The dielectric constant measuring device based on the waveguide structure has the advantages that the system measurement in the design needs to realize the function of heating while measuring, if the heating is uneven, the measurement precision can be affected, because the ridge of the ridge waveguide has the capability of focusing an electric field, the ridge waveguide is generally used as a core device for heating and measuring, two ridge surfaces with optimized shapes are added at the upper end and the lower end of the ridge waveguide mainly on the basis of a standard BJ22 waveguide, two cut-off waveguides are respectively positioned at the upper surface and the lower surface and penetrate through the whole waveguide to place a silicon tube, the other two cut-off waveguides at the left side and the right side are used for observing and measuring the temperature of a test sample in a high-temperature environment, and due to the ridge of the ridge waveguide, compared with a common waveguide, the ridge of the ridge waveguide has wider transmission bandwidth, longer cut-off wavelength and smaller characteristic impedance, which is a common advantage in a broadband test system, the microwave heating uniformity can be improved, and the aim of reducing the multi-value problem in the BP neural network by changing the length, the width and the height of the ridge is fulfilled.
Drawings
FIG. 1 is a schematic view of the structure of the reflectometer of the present invention;
fig. 2 is a schematic diagram of the ridge waveguide structure of the present invention;
FIG. 3 is a schematic view of the overall structure of the present invention;
FIG. 4 is a flow chart of the mathematical calculation structure of the system of the present invention;
FIG. 5 is a schematic view of the structure flow of the six-port reflectometer of the present invention;
fig. 6 is a schematic structural diagram of the directional coupler of the present invention.
In the figure: 1. a reflectometer; 2. a rectangular waveguide; 3. a third port; 4. a fifth port; 5. port six; 6. A port four; 11. a probe; 12. a directional coupler; 13. a power meter; 14. a coaxial line; 15. a ridge waveguide; 21. cutting off the first waveguide; 22. a second cut-off waveguide; 101. a first port; 102. a second port; 201. a first connecting block; 202. and a second connecting block.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Referring to fig. 1-6, a dielectric constant measuring device based on a waveguide structure,
the method comprises the following steps: modeling and simulation analysis are carried out in CST, model structure is adjusted, data reasonability is tested, devices are manufactured according to a simulation model, an experiment platform is built,
step two: firstly, calibrating the reflectometer 1, calculating the calibration constant of the reflectometer 1, wherein four calibration pieces are connected to the load end of the reflectometer 1 at one time and are respectively a fully matched load and three short-circuit devices with phase angles different by 90 degrees, the power of four power meters 13 is measured, so that the system constant of the calibration pieces is calculated through software, the measurement technology of the reflectometer 1 is taken as a microwave measurement technology with earlier origin and relatively mature, the microwave measurement technology has high measurement precision, low manufacturing cost and simple structure, is rapidly developed, the reflection coefficient and the phase are accurately measured by using the measurement technology of the reflectometer 1, a neural network model between a microwave parameter S11 and a complex dielectric constant is obtained by using a BP neural network of a computer, the complex dielectric constant of a material is further obtained, the introduction of the neural network technology enables the calculation process to be greatly reduced, the structure to be simpler, and the flexibility and the accuracy to be higher, in a given reflectometer 1 measurement system, a mathematical model between the measurement power of the detection power meter 13 and the reflection coefficient of a load to be measured can be established through a microwave network analysis theory, the mathematical model is the theoretical basis of the reflectometer 1, the relative power theory of the reflectometer 1 is the most commonly used method for deducing the mathematical model of the reflectometer 1 measurement system, and the general equation of any reflectometer 1 is as follows: from the analysis of the mathematical model of the reflectometer 1 as well as the geometric model, the reflectometer 1 needs to satisfy the following design criteria:
1.1, the reference port 4 (directional coupler 12) is ideally coupled with only the incident wave b2 of the tested piece and not coupled with the reflected wave a2 of the tested piece, generally, the coupling degree of the port is required to be controlled to be about-40 dB, the isolation degree is required to be about-60 dB, and the port is used for sampling the input power of a microwave source, so the stability of the system is directly influenced by the quality of the isolation degree,
1.2, three central points qk of a reflectometer 1 are uniformly distributed, the phase difference is 120 degrees, the qk distribution directly influences the measurement precision,
1.3, the distance from the center of the three circles to the origin should be between 0.5 and 1.5 and not equal to 1, qk amplitude affects the dynamic range of the power meter 13,
step three: the microwave source is transmitted through a coaxial line 14, the microwave source is fed into a first port 101 of the reflectometer 1 through a wave co-conversion interface, a second port 102 of the reflectometer 1 is connected with a first connecting block 201 of the ridge waveguide 15 through a flange, a matching load is connected on a second connecting block 202 of the ridge waveguide 15, a double-layer evacuated silicon tube filled with a material to be tested is inserted into a cut-off waveguide along the wide surface of the ridge waveguide 15, three SMA interfaces and a directional coupler 12 are connected with a power meter 13 through the coaxial line 14,
step four: preparing mixed solution with different concentrations, deducing complex dielectric constant of the mixed solution by using a Bruggeman formula, extending an infrared thermometer into an observation hole, putting the solution with different concentrations into a silicon tube for measurement,
step five: reading power through four ports of the reflectometer 1, calculating S parameters of the system by using a general mathematical model and a calibration technology of the reflectometer 1, recording the S parameters corresponding to dielectric constants of different solutions by using a data acquisition card, inputting the obtained data into a neural network as a sample space for network training,
step six: the known complex dielectric constant material is put in again for measurement, the complex dielectric constant of the material is obtained by back-pushing the S parameter, the complex dielectric constant is compared with the actual complex dielectric constant, the calculation flow process of the whole system is shown in figure 4, the directional coupler 12 is formed by coupling two paths of microwave transmission lines and is a four-port microwave component, microwaves input from a main line have a certain proportion and are coupled to a secondary line and only propagate in one direction, and back propagation microwaves are basically avoided, the directional coupler 12 has a plurality of forming modes, a plurality of types and mature technology and higher measurement precision, the directional coupler 12 is designed by adopting a single-hole coupling method, a hole is formed in the rectangular waveguide 2, a cuboid metal strip is arranged between the upper edge of the small hole and the upper cover plate and is not contacted with the upper surface and the lower surface, and P1 and P2 are respectively input and output of the rectangular waveguide 2, p3 is a coupling port, the other port is a coupling load, the project designs the reflectometer 1 by using the rectangular waveguide 2, therefore, the rectangular waveguide 2 is provided with a hole on the wide surface, the microwave is coupled to the strip line through the small hole, then transmitted to the two ends of the strip line to be connected with the coaxial line 14, and transmitted to the power meter 13 through the coaxial line 14, thus forming the waveguide-strip line-coaxial line 14 type directional coupler 12, thereby achieving the purpose of greatly reducing the complexity and the cost of the system,
the BP neural network is a multilayer forward neural network trained based on an error back propagation algorithm (BP algorithm), and structurally, the BP neural network is provided with an input layer, a hidden layer and an output layer; in essence, the BP algorithm calculates the minimum value of the target function by using the square of the network error as the target function and adopting a gradient descent method, the error propagated each time is reversely propagated from an output layer, each layer continuously adjusts the weight by the gradient descent method, the neuron adopts a sigmoid activation function, thus realizing the nonlinear mapping relation of input and output during network training, and the neural network is applied to derive a mathematical model between an S parameter and a complex dielectric constant, the application of the technology is not limited by the shape and the physical state of a material to be measured, in addition, the use of the neural network not only greatly simplifies the calculation process, but also has higher precision than the traditional formula derivation, thereby achieving the purpose of higher precision,
the system measurement in design needs to realize the function of heating while measuring, if the heating is uneven, the measurement precision will be affected, because the ridge of the ridge waveguide has the capability of focusing the electric field, therefore, the ridge waveguide is usually used as the core device for heating and measuring, the ridge waveguide is mainly based on the standard BJ22 waveguide, two ridge surfaces with optimized shapes are added at the upper and lower ends, two cut-off waveguides are respectively located at the upper and lower surfaces and penetrate through the whole waveguide to place the silicon tube, the other two cut-off waveguides at the left and right sides are used for observing and measuring the temperature of the test sample under the high temperature environment, because of the ridge waveguide 15, compared with the common waveguide, the ridge waveguide has wider transmission bandwidth, longer cut-off wavelength and smaller characteristic impedance, which is the common advantage in the broadband test system, not only can improve the uniformity of microwave heating, thereby achieving the aim of reducing the multivalue problem in the BP neural network by changing the length, the width and the height of the ridge,
the device comprises a reflectometer 1, a rectangular waveguide 2 is fixedly arranged on the upper surface of the reflectometer 1, a first port 101 is fixedly arranged on the side surface of the rectangular waveguide 2, a second port 102 is fixedly arranged at one end, far away from the first port 101, of the rectangular waveguide 2, a directional coupler 12 with a waveguide-strip line-coaxial line 14 structure is arranged on the wide surface of the rectangular waveguide 2, a fourth port 6 is arranged on the upper surface of the directional coupler 12, a coaxial line 14 is fixedly arranged on one side of the fourth port 6, a power meter 13 is fixedly arranged at one end, far away from the fourth port 6, of the coaxial line 14, a probe 11 is fixedly arranged on the side surface of the rectangular waveguide 2, a third port 3 is arranged on one side of the probe 11, a fifth port 4 is arranged on one side, far away from the third port 3, of the probe 11, a sixth port 5 is arranged on one side, far away from the fifth port 4, of the probe 11, three ports of the third port 3, the fifth port 4 and the sixth port 5 are combined to form a probe 11 structure, and one side of the reflectometer 1 is fixedly connected with a ridge waveguide 15, the side surface of the reflectometer 1 is tangent to the side surface of the ridge waveguide 15, one side of the ridge waveguide 15 is provided with a first connecting block 201, one end of the ridge waveguide 15 far away from the first connecting block 201 is provided with a second connecting block 202, the reflectometer 1 and the ridge waveguide 15 are both arranged in a rectangle, the reflectometer 1 and the ridge waveguide 15 are fixedly installed through a first connecting block 201 and a second connecting block 202, a first cut-off waveguide 21 is fixedly installed on one side of the ridge waveguide 15, a second cut-off waveguide 22 is fixedly installed on one end, far away from the first cut-off waveguide 21, of the ridge waveguide 15, two sides of the ridge waveguide 15 are a wide surface and a narrow surface, the wide surface of the ridge waveguide 15 is provided with two openings, a first cut-off waveguide 21 is arranged, the narrow surface of the ridge waveguide 15 is also provided with two openings and is provided with a second cut-off waveguide 22, the first cut-off waveguide 21 arranged on the wide surface of the ridge waveguide 15 can measure the temperature, and the second cut-off waveguide 22 installed on the narrow surface of the ridge waveguide 15 observes the morphology of the material.
The working principle is that the reflectometer 1 measuring technology is used as a microwave measuring technology with earlier origin and relatively mature, the measuring precision is high, the manufacturing cost is low, the structure is simple, the rapid development is achieved, the reflectometer 1 measuring technology is used for accurately measuring the reflection coefficient and the phase, a neural network model between the microwave parameter S11 and the complex dielectric constant is obtained by means of a BP neural network of a computer, the complex dielectric constant of the material is further obtained, the introduction of the neural network technology enables the calculation process to be greatly reduced, the structure is simpler, the flexibility and the accuracy are higher, a mathematical model between the measuring power of a detecting power meter 13 and the reflection coefficient of a load to be measured is established through a microwave network analysis theory in a given reflectometer 1 measuring system, the directional coupler 12 is formed by coupling of microwave transmission lines, the microwave measuring device is a four-port microwave component, microwaves input from a main line are coupled to a secondary line in a certain proportion, the directional coupler 12 is designed by adopting a single-hole coupling method, a hole is formed in the rectangular waveguide 2, a cuboid metal strip is arranged between the upper edge of the hole and the upper cover plate and is not contacted with the upper surface and the lower surface, P1 and P2 are respectively input and output of the rectangular waveguide 2, P3 is a coupling port, the other port is a coupling load, the rectangular waveguide 2 is used when the reflectometer 1 is designed by the project, therefore, the hole is formed in the wide surface of the rectangular waveguide 2, the microwave is coupled to a strip line through the hole, then transmitted to the two ends of the strip line to be connected with a coaxial line 14 and transmitted to a power meter 13 through the coaxial line 14, and the waveguide-strip line-coaxial line 14 type directional coupler 12 is formed, due to the ridge of the ridge waveguide 15, compared with the common waveguide, the ridge waveguide has wider transmission bandwidth, longer cut-off wavelength and smaller characteristic impedance, which is a common advantage in a broadband test system, and improves the uniformity of microwave heating.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims (6)

1. A dielectric constant measuring device based on a waveguide structure, comprising a reflectometer (1), characterized in that: the device comprises a reflectometer (1), a rectangular waveguide (2) is fixedly installed on the upper surface of the reflectometer (1), a port I (101) is fixedly installed on the side surface of the rectangular waveguide (2), a port II (102) is fixedly installed at one end, far away from the port I (101), of the rectangular waveguide (2), a directional coupler (12) of a wide-surface installation waveguide-strip line-coaxial line (14) structure of the rectangular waveguide (2), a port IV (6) is arranged on the upper surface of the directional coupler (12), a coaxial line (14) is fixedly installed on one side of the port IV (6), a power meter (13) is fixedly installed at one end, far away from the port IV (6), of the coaxial line (14), a probe (11) is fixedly installed on the side surface of the rectangular waveguide (2), a port III (3) is arranged on the upper surface of the probe (11), a port V (4) is arranged on one side, far away from the port III (3), of the probe (11), one side that port five (4) were kept away from in probe (11) has seted up port six (5), one side fixedly connected with spine waveguide (15) of reflectometer (1), connecting block one (201) have been seted up to one side of spine waveguide (15), connecting block two (202) have been seted up to one end that spine waveguide (15) kept away from connecting block one (201), one side fixed mounting of spine waveguide (15) has end waveguide one (21), and the one end fixed mounting that spine waveguide (15) kept away from end waveguide one (21) has end waveguide two (22).
2. A waveguide structure-based permittivity measurement device according to claim 1, wherein: the two sides of the ridge waveguide (15) are a wide surface and a narrow surface, the wide surface of the ridge waveguide (15) is provided with two openings, a first cut-off waveguide (21) is installed, and the narrow surface of the ridge waveguide (15) is also provided with two openings and a second cut-off waveguide (22).
3. A waveguide structure-based permittivity measurement device according to claim 1, wherein: the reflectometer (1) and the ridge waveguide (15) are both arranged in a rectangular mode, and the reflectometer (1) and the ridge waveguide (15) are fixedly installed through a first connecting block (201) and a second connecting block (202).
4. A waveguide structure-based permittivity measurement device according to claim 1, wherein: the wide-surface-mounted first cut-off waveguide (21) of the ridge waveguide (15) can be used for measuring the temperature, and the narrow-surface-mounted second cut-off waveguide (22) of the ridge waveguide (15) is used for observing the form of the material.
5. A waveguide structure-based permittivity measurement device according to claim 1, wherein: the sides of the reflectometer (1) are tangent to the sides of the ridge waveguide (15).
6. A waveguide structure-based permittivity measurement device according to claim 1, wherein: and the three ports of the port three (3), the port five (4) and the port six (5) are combined into a probe (11) structure.
CN202120094708.3U 2021-01-14 2021-01-14 Dielectric constant measuring device based on waveguide structure Active CN214503755U (en)

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