CN214409204U

CN214409204U - Memory chip test fixture

Info

Publication number: CN214409204U
Application number: CN202120234869.8U
Authority: CN
Inventors: 袁嘉玲; 孔凡平; 杨京; 谢棋; 杨松青
Original assignee: Xiamen Atom Tong Electronic Technology Co ltd
Current assignee: Xiamen Atom Tong Electronic Technology Co ltd
Priority date: 2021-01-27
Filing date: 2021-01-27
Publication date: 2021-10-15
Anticipated expiration: 2031-01-27

Abstract

The utility model discloses a memory chip test fixture, include the chip test mainboard, be used for the mainboard mounting fixture of fixed chip test mainboard and be used for compressing tightly a plurality of chip buckles of the memory chip that awaits measuring. The chip testing mainboard comprises a mainboard body and a golden finger part arranged on one side of the mainboard body, the mainboard body is fixed in the mainboard fixing clamp, and the golden finger part extends out of the mainboard fixing clamp. At least one side of mainboard body is provided with a plurality of chip probes along length direction interval, and mainboard mounting fixture offers the storage tank that is used for holding the internal storage chip that awaits measuring on the position that each chip probe corresponds. One end of the chip clamp is hinged with the main board fixing clamp, and the other end of the chip clamp is connected with the main board fixing clamp in a buckling manner through the lock catch piece. The utility model discloses a tool can test a plurality of memory chips simultaneously, and space design is reasonable, and is laborsaving when the chip clip is opened, easy operation, and the lock is stable when the chip clip is closed, and the steadiness is strong, and taking out and putting into of memory chip are convenient.

Description

Memory chip test fixture

Technical Field

The utility model relates to a chip test technical field, in particular to memory chip test fixture.

Background

A PCB, i.e., a printed wiring board, which is called a printed board for short, is one of important parts in the electronic industry. Almost every electronic device has electronic components such as integrated circuits, and a printed board is used to electrically interconnect the components. The printed circuit board generally comprises a board body and a plurality of memory chips welded on the board body, and the performance of the memory chips needs to be tested before the memory chips are welded on the board body. The existing memory chip test fixture generally has the problems of inconvenient operation and low test efficiency, so a memory chip test fixture with convenient operation and high test efficiency needs to be designed.

Disclosure of Invention

To the technical problem who exists among the background art, the utility model aims to provide a convenient operation and memory chip test fixture that efficiency of software testing is high.

In order to realize the purpose, the utility model discloses a technical scheme as follows:

a memory chip test fixture comprises a chip test mainboard, a mainboard fixing clamp for fixing the chip test mainboard and a plurality of chip clamps for pressing a memory chip to be tested. The chip testing mainboard comprises a mainboard body and a golden finger part arranged on one side of the mainboard body, the mainboard body is fixed in the mainboard fixing clamp, and the golden finger part extends outwards from the mainboard fixing clamp. At least one side of the mainboard body is provided with a plurality of chip probes at intervals along the length direction, and the mainboard fixing clamp is provided with a containing groove for containing a memory chip to be tested at the position corresponding to each chip probe. One end of the chip clamp is hinged to the main board fixing clamp, and the other end of the chip clamp is connected with the main board fixing clamp in a buckling mode through a lock catch piece.

Further, the mainboard mounting fixture has seted up the hasp groove in the one side of being close to golden finger portion, the one end of chip clip through first torsional spring with mainboard mounting fixture keeps away from one side of golden finger portion and is connected. The locking fastener comprises a locking fastener sheet which is clamped into the locking fastener groove, a push rod which is abutted against the inner side surface of the locking fastener sheet, and a pressing block which is used for driving the push rod to move back and forth so as to unlock the locking fastener sheet. The locking buckle piece is arranged at one end of the chip clamp buckle far away from the first torsion spring through the second torsion spring, and the inner side of the locking buckle piece is provided with a clamping hook. The pressing block is arranged on the top of the chip clamp buckle through a rotating shaft and is abutted against the push rod.

The pressing block comprises a pressing part and a rotating part which are integrally formed, and the pressing part penetrates through the chip clamp and is abutted against one end of the push rod. The rotating part is arranged on the upper part of the pressing part close to the end face on one side of the locking piece, and a through hole for the rotating shaft to pass through is formed in the rotating part.

Preferably, in order to better fix the memory chip to be tested, the left side and the right side of the bottom of the chip clip are respectively provided with a pressing block for pressing the memory chip to be tested, and the pressing blocks and the accommodating grooves are arranged in a one-to-one correspondence manner.

Preferably, in order to prevent the memory chip to be tested from being damaged due to overlarge extrusion force, the bottom of the pressing block is sleeved with a buffer rubber block.

Preferably, in order to better achieve the guiding effect on the push rod, a guide seat is fixedly arranged at the bottom of the chip clamp, and a guide hole for the push rod to pass through is formed in the guide seat.

Preferably, the number of the chip probes on each surface of the main board body is 8 or 9.

The utility model discloses following beneficial effect has: the memory chip testing jig is reasonable in space design, labor-saving when the chip clamp is opened, simple to operate, stable in buckling when the chip clamp is closed, strong in stability, convenient to take out and put in memory chips and high in testing efficiency. The chip clip realizes unlocking through the pressing block arranged at the top of the chip clip, and has the advantages of reasonable structure, convenience, labor saving, convenient and fast unlocking and simple operation.

Drawings

Fig. 1 is a schematic perspective view of the present invention.

Fig. 2 is an unlocking schematic diagram of the chip clip.

Description of the main component symbols: 1. a chip test mainboard; 11. a main board body; 110. a chip probe; 12. a gold finger portion; 2. The main board is fixed with a clamp; 20. a containing groove; 21. a locking groove; 3. chip clamping; 30. a first torsion spring; 301. a locking piece; 302. A push rod; 303. a pressing block; 304. a second torsion spring; 305. a hook; 306. a rotating shaft; 307. a pressing part; 308. a rotating part; 31. a compression block; 310. a buffer rubber block; 32. a guide seat; 320. and (4) a guide hole.

Detailed Description

The present invention will be further described with reference to the accompanying drawings and the following detailed description.

As shown in fig. 1 and 2, a memory chip testing jig includes a chip testing motherboard 1, a motherboard fixing fixture 2 for fixing the chip testing motherboard 1, and a plurality of chip clips 3 for compressing a memory chip to be tested. Chip test mainboard 1 includes mainboard body 11 and establishes golden finger portion 12 in mainboard body 11 one side, and mainboard body 11 is fixed in mainboard mounting fixture 2, and golden finger portion 12 outwards stretches out mainboard mounting fixture 2. At least one surface of the main board body 11 is provided with a plurality of chip probes 110 at intervals along the length direction, and the main board fixing clamp 2 is provided with a containing groove 20 for containing a memory chip to be tested at a position corresponding to each chip probe 110. Preferably, the number of the chip probes 110 on each side of the main board body 11 is 8. One end of the chip clamp 3 is hinged with the main board fixing clamp 2, and the other end is buckled and connected with the main board fixing clamp 2 through a lock catch piece.

The mainboard fixing clamp 2 is provided with a locking groove 21 at one side close to the golden finger part 12, and one end of the chip clamp 3 is connected with one side of the mainboard fixing clamp 2 far away from the golden finger part 12 through a first torsion spring 30. The locking piece comprises a locking piece 301 which is used for being clamped into the locking groove 21, a push rod 302 which is abutted against the inner side surface of the locking piece 301, and a pressing block 303 which is used for driving the push rod 302 to move back and forth so as to realize unlocking of the locking piece 301. The locking piece 301 is mounted on one end of the chip clip 3 far away from the first torsion spring 30 by the second torsion spring 304, and a hook 305 is disposed on the inner side of the locking piece 301. The pressing block 303 is mounted on the top of the chip clip 3 through a rotating shaft 306 and abuts against the push rod 302.

The pressing block 303 includes a pressing portion 307 and a rotating portion 308, which are integrally formed, and the pressing portion 307 penetrates through the chip clip 3 and abuts against one end of the push rod 302. The rotating portion 308 is disposed on the upper portion of the pressing portion 307 near the end surface of the locking tab 301, and the rotating portion 308 is provided with a through hole for the rotating shaft 306 to pass through. Preferably, the left side and the right side of the bottom of the chip clip 3 are respectively provided with a compressing block 31 for compressing the memory chip to be tested, and the compressing blocks 31 and the accommodating grooves 20 are arranged in a one-to-one correspondence manner. Preferably, the bottom of the pressing block 31 is sleeved with a buffer rubber block 310. Preferably, a guide seat 32 is fixedly disposed at the bottom of the chip clip 3, and a guide hole 320 for the push rod 302 to pass through is formed in the guide seat 32.

The utility model discloses a theory of operation does: after the chip testing main board 1 is fixed in the main board fixing clamp 2 by screw locking and the like, a plurality of memory chips to be tested are placed in the accommodating groove 20, the chip clamp buckles 3 are closed, and the memory chips to be tested are pressed and fixed by the clamping and matching of the tail end clamping hooks 305 and the locking groove 21; after the test is completed, the pressing portion 307 is pressed to drive the push rod 302 to move forward, the push rod 302 pushes the locking piece 301 to open outward to achieve unlocking, the chip clamp 3 opens upward under the action force of the first torsion spring 30, the memory chip after the test is taken out, and the whole test process is completed.

While the invention has been particularly shown and described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes in form and detail may be made therein without departing from the spirit and scope of the invention as defined by the appended claims.

Claims

1. A memory chip test fixture is characterized in that: including chip test mainboard, be used for fixing the mainboard mounting fixture of chip test mainboard and be used for compressing tightly a plurality of chip presss from both sides of awaiting measuring the memory chip, chip test mainboard include the mainboard body and establish the golden finger portion in mainboard body one side, the mainboard body fix in the mainboard mounting fixture, golden finger portion outwards stretch out mainboard mounting fixture, at least one side of mainboard body is provided with a plurality of chip probes along the length direction interval, mainboard mounting fixture offers the storage tank that is used for the holding to await measuring the memory chip on the position that each chip probe corresponds, the one end that the chip pressed from both sides was detained with mainboard mounting fixture is articulated, the other end pass through the snap close piece with mainboard mounting fixture lock connects.

2. The memory chip testing fixture of claim 1, wherein: mainboard mounting fixture has seted up the hasp groove in one side that is close to golden finger portion, the one end of chip fastener through first torsional spring with mainboard mounting fixture keeps away from one side of golden finger portion and is connected, hasp piece including being used for the card to go into hasp piece in the hasp groove, with the push rod of the medial surface looks butt of hasp piece and being used for the drive the push rod back-and-forth movement is in order to realize the pressing block of hasp piece unblock, the hasp piece install in the one end of keeping away from first torsional spring in the chip fastener through the second torsional spring, the inboard of hasp piece is equipped with the pothook, the pressing block install through the pivot chip fastener top and with push rod looks butt.

3. The memory chip testing jig according to claim 2, wherein: the pressing block comprises a pressing part and a rotating part which are integrally formed, the pressing part penetrates through the chip clamp and is abutted to one end of the push rod, the rotating part is arranged on the upper part of the pressing part, which is close to the end face on one side of the lock catch piece, and a through hole for the rotating shaft to penetrate through is formed in the rotating part.

4. The memory chip testing jig according to claim 2, wherein: the left side and the right side of the bottom of the chip clamp buckle are respectively provided with a pressing block used for pressing the memory chip to be tested, and the pressing blocks and the accommodating grooves are arranged in a one-to-one correspondence mode.

5. The memory chip testing fixture of claim 4, wherein: and a buffer rubber block is sleeved at the bottom of the compression block.

6. The memory chip testing jig according to claim 2, wherein: the bottom of the chip clamp is fixedly provided with a guide seat, and the guide seat is provided with a guide hole for the push rod to pass through.

7. The memory chip testing fixture of claim 1, wherein: the number of the chip probes on each surface of the main board body is 8 or 9.