CN214310112U - Infrared spectrum gas analysis device - Google Patents
Infrared spectrum gas analysis device Download PDFInfo
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- CN214310112U CN214310112U CN202022677739.XU CN202022677739U CN214310112U CN 214310112 U CN214310112 U CN 214310112U CN 202022677739 U CN202022677739 U CN 202022677739U CN 214310112 U CN214310112 U CN 214310112U
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Abstract
The disclosure relates to an infrared spectrum gas analysis device, and belongs to the field of oil exploitation. The infrared spectrum gas analysis device comprises a first gas chamber, a second gas chamber, a Michelson interferometer, a detection unit, a first reflector, a second reflector, a third reflector and a fourth reflector; the first air chamber is located between the Michelson interferometer and the detection unit, the first light ray inlet faces to a light outlet of the Michelson interferometer, and the first light ray outlet faces to a light inlet of the detection unit. The reflecting surface of the first reflector faces the second light inlet, and the reflecting surface of the second reflector faces the second light outlet. When the third reflector is positioned between the first light inlet and the light outlet of the michelson interferometer and the fourth reflector is positioned between the first light outlet and the light inlet of the detection unit, light sequentially passes through the third reflector, the first reflector, the second air chamber, the second reflector, the fourth reflector and the detection unit, and the optical path of the light in the second air chamber is different from that in the first air chamber.
Description
Technical Field
The disclosure relates to the field of oil exploitation, in particular to an infrared spectrum gas analysis device.
Background
In oil production, a concentration test of hydrocarbon gas separated from drilling fluid is required to determine the content of oil and gas in an oil-gas-containing interval. In the field of oil exploitation, an infrared spectrum gas analysis device is often adopted to test the concentration of hydrocarbon gas.
An infrared spectroscopic gas analysis device is a device for measuring the concentration of a gas. The infrared spectrum gas analysis device comprises a Michelson interferometer, a gas chamber and a detector, wherein the gas chamber is located between the Michelson interferometer and the detector. The gas that awaits measuring is located the air chamber, and the infrared light becomes interference light behind the michelson interferometer, and interference light gets into the air chamber, and interference light gets into the detector after passing the air chamber, and the concentration of hydrocarbon gas is different in the gas, and interference light energy loss is different in the air chamber, and the detector carries out energy analysis to the interference light through the air chamber, reachs the concentration of hydrocarbon gas in the gas that awaits measuring.
The concentration of the gas that can detect through the different gas chambers of experimental verification is limited, among the correlation technique, infrared spectroscopy gas analysis device only includes a gas chamber, the gas concentration interval that can analyze is limited, can not satisfy formation gas full-scale coverage in the oil drilling, and the gas of different concentration ranges needs the gas chamber of different optical distances, make infrared spectroscopy gas analysis device only can detect the gas of concentration in the concentration range that this gas chamber corresponds, when the gas of other concentrations of needs measurement, need change the gas chamber, inefficiency.
SUMMERY OF THE UTILITY MODEL
Embodiments of the present disclosure provide an infrared spectroscopy gas analysis apparatus that can measure the concentration of hydrocarbon gases in a gas over a plurality of concentration ranges. The technical scheme is as follows:
the present disclosure provides an infrared spectroscopy gas analysis apparatus, comprising: the device comprises a first air chamber, a second air chamber, a Michelson interferometer, a detection unit, a first reflector, a second reflector, a third reflector and a fourth reflector;
the first air chamber is located between the michelson interferometer and the detection unit, and the michelson interferometer, the first air chamber and the detection unit are arranged along a first direction, the first direction is a light-emitting direction of the michelson interferometer, the first air chamber is provided with a first light ray inlet and a first light ray outlet, the first light ray inlet faces a light-emitting port of the michelson interferometer, and the first light ray outlet faces a light-entering port of the detection unit;
the second air chamber is positioned at one side of the first air chamber, the first air chamber and the second air chamber are arranged along a second direction, the second direction and the first direction are mutually vertical, and the second air chamber is provided with a second light ray inlet and a second light ray outlet;
the reflecting surface of the first reflector faces the second light inlet, and the reflecting surface of the second reflector faces the second light outlet;
the third reflector and the fourth reflector are movably arranged along the second direction, when the third reflector is located between the first light ray inlet and the light outlet of the michelson interferometer and the fourth reflector is located between the first light ray outlet and the light inlet of the detection unit, the light emitted by the michelson interferometer sequentially passes through the third reflector, the first reflector, the second air chamber, the second reflector, the fourth reflector and the detection unit; and the optical path of the light emitted by the Michelson interferometer in the second air chamber is different from the optical path of the light emitted by the Michelson interferometer in the first air chamber.
In one implementation of the disclosed embodiment, the optical path length of the light emitted by the michelson interferometer in the second gas cell is greater than the optical path length in the first gas cell.
In one implementation manner of the embodiment of the present disclosure, the infrared spectroscopic gas analysis apparatus further includes a first planar reflector, a second planar reflector, a first concave reflector, a second concave reflector, and a third concave reflector located in the second gas chamber;
the first plane reflector is positioned at the second light ray inlet, and the reflecting surface of the first plane reflector faces the second light ray inlet;
the second plane reflector is positioned at the second light ray outlet, and the reflecting surface of the second plane reflector faces the second light ray outlet;
the first concave reflecting mirror is positioned between the first plane reflecting mirror and the second plane reflecting mirror, the reflecting surface of the second concave reflecting mirror and the reflecting surface of the third concave reflecting mirror are respectively opposite to the reflecting surface of the first concave reflecting mirror, the reflecting surface of the second concave reflecting mirror is also opposite to the reflecting surface of the first plane reflecting mirror, and the reflecting surface of the third concave reflecting mirror is also opposite to the reflecting surface of the second plane reflecting mirror;
the light incident from the second light inlet sequentially passes through the first planar reflector, the second concave reflector, the first concave reflector, the third concave reflector, the first concave reflector, the second concave reflector, the first concave reflector, the third concave reflector, the second planar reflector, the second reflector, the fourth reflector and the detection unit; alternatively, the first and second electrodes may be,
the light incident from the second light inlet passes through the first planar reflector, the second concave reflector, the first concave reflector, the third concave reflector, the second planar reflector, the second reflector, the fourth reflector and the detection unit in sequence.
In one implementation of the disclosed embodiment, the infrared spectroscopic gas analysis apparatus further comprises: a transmission assembly and a motor;
the third reflector and the fourth reflector are respectively connected with a driving shaft of the motor through the transmission assembly.
In an implementation manner of the embodiment of the present disclosure, the infrared spectroscopic gas analysis apparatus further includes a motor controller, and an output end of the motor controller is connected to a control end of the motor.
In one implementation of the disclosed embodiment, the optical path length of the light emitted by the michelson interferometer in the first gas cell is between 1 meter and 3 meters.
In one implementation of the disclosed embodiment, the optical path length of the light emitted by the michelson interferometer in the second gas cell is between 3 cm and 7 cm.
In one implementation of the disclosed embodiment, the first plenum has a first air inlet and a first air outlet, and the second plenum has a second air inlet and a second air outlet.
In one implementation of the disclosed embodiment, the infrared spectroscopic gas analysis device further comprises a sample pump;
the outlet of the sample pump is communicated with the first air inlet and the second air inlet respectively.
In an implementation manner of the embodiment of the present disclosure, the housing of the first air chamber and the housing of the second air chamber are both stainless steel housings, and the first light inlet, the first light outlet, the second light inlet, and the second light outlet are all provided with light-transmitting window pieces.
The technical scheme provided by the embodiment of the disclosure has the following beneficial effects:
in the infrared spectrum gas analysis device provided by the embodiment of the disclosure, both the first gas chamber and the second light chamber can be used for containing a gas to be detected, infrared light becomes interference light after passing through the michelson interferometer, the interference light is emitted from a light outlet of the michelson interferometer, the interference light enters the first gas chamber or the second light chamber, the gas to be detected absorbs energy of the interference light, the interference light enters the detection unit after being emitted from the first gas chamber or the second light chamber, and the detection unit determines the concentration of the hydrocarbon gas in the gas to be detected by detecting the energy of the interference light.
Since the third reflector and the fourth reflector are movably arranged along the second direction, when the first optical chamber is required to be used, the third reflector is removed from the first light ray inlet, the fourth reflector is removed from the first light ray outlet, the interference light emitted from the light outlet of the michelson interferometer enters the first optical chamber from the first light ray inlet, the interference light propagates in the first optical chamber, and enters the detection unit from the first light ray outlet. When the second light chamber needs to be used, the third reflector is placed between the first light inlet and the light outlet of the michelson interferometer, the fourth reflector is placed between the first light outlet and the light inlet of the detection unit, and interference light emitted from the light outlet of the michelson interferometer sequentially passes through the third reflector, the first reflector, the second air chamber, the second reflector, the fourth reflector and the detection unit. Because the optical path of the interference light emitted by the Michelson interferometer in the second air chamber is different from the optical path in the first air chamber, the infrared spectrum gas analysis device can detect the concentration of gas in a plurality of concentration ranges, and when the gas with different concentrations is measured, the air chambers can be directly replaced by controlling the positions of the third reflector and the fourth reflector, so that the detection efficiency is improved, and the detection method is quicker and more convenient.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present disclosure, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present disclosure, and it is obvious for those skilled in the art to obtain other drawings based on the drawings without creative efforts.
FIG. 1 is a schematic diagram of an infrared spectroscopy gas analysis apparatus according to an embodiment of the present disclosure;
FIG. 2 is a diagram illustrating a propagation path of a light ray in a second optical chamber according to an embodiment of the present disclosure;
fig. 3 is a propagation path diagram of a light ray in a second optical chamber according to an embodiment of the disclosure.
Detailed Description
To make the objects, technical solutions and advantages of the present disclosure more apparent, embodiments of the present disclosure will be described in detail with reference to the accompanying drawings.
Fig. 1 is a schematic structural diagram of an infrared spectroscopic gas analysis apparatus provided in an embodiment of the present disclosure. Referring to fig. 1, an infrared spectroscopic gas analysis apparatus includes: first gas cell 10, second gas cell 20, michelson interferometer 30, detection unit 40, first mirror 50, second mirror 60, third mirror 70, and fourth mirror 80.
The first air chamber 10 is located between the michelson interferometer 30 and the detection unit 40, and the michelson interferometer 30, the first air chamber 10 and the detection unit 40 are arranged along a first direction a, the first direction a is an optical outgoing direction of the michelson interferometer 30, the first air chamber 10 has a first light ray inlet 101 and a first light ray outlet 102, the first light ray inlet 101 faces an optical outgoing opening 301 of the michelson interferometer 30, and the first light ray outlet 102 faces an optical incoming opening 401 of the detection unit 40. The second air cell 20 is located at one side of the first air cell 10, and the first air cell 10 and the second air cell 20 are arranged in a second direction, which is perpendicular to the first direction, and the second air cell 20 has a second light inlet 201 and a second light outlet 202. The reflective surface of the first mirror 50 faces the second light inlet 201 and the reflective surface of the second mirror 60 faces the second light outlet 202. The third reflector 70 and the fourth reflector 80 are movably arranged along the second direction, when the third reflector 70 is located between the first light inlet 101 and the light outlet 301 of the michelson interferometer 30, and the fourth reflector 80 is located between the first light outlet 102 and the light inlet 401 of the detecting unit 40, the light emitted from the michelson interferometer 30 passes through the third reflector 70, the first reflector 50, the second air chamber 20, the second reflector 60, the fourth reflector 80 and the detecting unit 40 in sequence; the optical path length of the light emitted from the michelson interferometer 30 in the second gas cell 20 is different from the optical path length in the first gas cell 10.
In the infrared spectrum gas analysis device provided by the embodiment of the disclosure, both the first gas chamber and the second light chamber can be used for containing a gas to be detected, infrared light becomes interference light after passing through the michelson interferometer, the interference light is emitted from a light outlet of the michelson interferometer, the interference light enters the first gas chamber or the second light chamber, the gas to be detected absorbs energy of the interference light, the interference light enters the detection unit after being emitted from the first gas chamber or the second light chamber, and the detection unit determines the concentration of the hydrocarbon gas in the gas to be detected by detecting the energy of the interference light.
Since the third reflector and the fourth reflector are movably arranged along the second direction, when the first optical chamber is required to be used, the third reflector is removed from the first light ray inlet, the fourth reflector is removed from the first light ray outlet, the interference light emitted from the light outlet of the michelson interferometer enters the first optical chamber from the first light ray inlet, the interference light propagates in the first optical chamber, and enters the detection unit from the first light ray outlet. When the second light chamber needs to be used, the third reflector is placed between the first light inlet and the light outlet of the michelson interferometer, the fourth reflector is placed between the first light outlet and the light inlet of the detection unit, and interference light emitted from the light outlet of the michelson interferometer sequentially passes through the third reflector, the first reflector, the second air chamber, the second reflector, the fourth reflector and the detection unit. Because the optical path of the interference light emitted by the Michelson interferometer in the second air chamber is different from the optical path in the first air chamber, the infrared spectrum gas analysis device can detect the concentration of gas in a plurality of concentration ranges, and when the gas with different concentrations is measured, the air chambers can be directly replaced by controlling the positions of the third reflector and the fourth reflector, so that the detection efficiency is improved, and the detection method is quicker and more convenient.
As shown in fig. 1, the light source 200 emits infrared light into the michelson interferometer 30, and the michelson interferometer 30 changes the infrared light into interference light.
In the disclosed embodiment, the optical path length of the light emitted by the michelson interferometer 30 is greater in the second gas cell 20 than in the first gas cell 10. That is, when the first gas chamber 10 is used, the infrared spectroscopic gas analysis apparatus can be used to detect a gas to be measured having a low hydrocarbon gas concentration. When the second gas chamber 20 is used, the infrared spectroscopic gas analysis apparatus can be used to detect a gas to be detected having a relatively high hydrocarbon gas concentration.
The infrared spectrum gas analysis device provided by the embodiment of the disclosure utilizes a Fourier transform infrared spectrum analysis technology to analyze gas concentration.
The infrared spectrum gas analysis device provided by the embodiment of the disclosure can detect the concentration and components of methane, ethane, propane, n-butane, isobutane, n-pentane and isopentane in gas, and also can perform qualitative and quantitative analysis on the gas to be detected.
Referring again to fig. 1, the infrared spectroscopic gas analysis apparatus further comprises: a drive assembly 100 and a motor 110. The third and fourth reflection mirrors 70 and 80 are respectively connected to a driving shaft of a motor 110 through a transmission assembly 100.
The motor 110 rotates, and the transmission assembly 100 converts the rotation of the motor 110 into a linear movement, thereby controlling the third mirror 70 and the fourth mirror 80 to move in the second direction b, which is more convenient.
In the disclosed embodiment, the transmission assembly 100 may perform the above-mentioned transmission through a lead screw, a gear or a belt, which is not limited by the present disclosure.
In the disclosed embodiment, the motor 110 may be a stepper motor.
Referring again to fig. 1, the infrared spectroscopic gas analyzer further includes a motor controller 120, and an output terminal of the motor controller 120 is electrically connected to a control terminal of the motor 110.
The rotation direction and the number of turns of the motor are controlled by the motor controller 120, so that the moving direction and the distance of the lead screw are controlled, the third reflector 70 and the fourth reflector 80 are controlled to move in the second direction b, and the position accuracy of the third reflector 70 and the fourth reflector 80 is ensured.
Illustratively, the motor controller 120 is a stepper motor controller.
As shown in fig. 1, the detection unit 40 includes a photodetector 402, a signal processing unit 403, and a computer 404, the photodetector 402 is electrically connected to the signal processing unit 403, and the signal processing unit 403 is electrically connected to the computer 404.
The photodetector 402 is configured to receive an optical signal and convert the optical signal into an electrical signal, the signal processing unit 403 is configured to perform preprocessing, such as filtering and amplifying, on the electrical signal, the computer 404 has spectrum analysis software, the electrical signal is converted by the spectrum analysis software to obtain an infrared absorption spectrum, and then the infrared absorption spectrum is analyzed to obtain the gas type and concentration of the component to be detected.
As shown in fig. 1, the motor controller 120 is electrically connected to a computer 404.
A control instruction is output to the motor controller 120 through the computer 404, so that the motor controller 120 controls the distance that the third mirror 70 and the fourth mirror 80 move.
In the embodiment of the present disclosure, the photodetector 402 and the signal processing unit 403, the signal processing unit 403 and the computer 404, and the motor controller 120 and the computer 404 may be electrically connected through an RS232 serial port line, and send a switching instruction through a serial port, or transmit through a network.
In the disclosed embodiment, the concentrations of the hydrocarbon gases in the gases that the first gas cell 10 and the second gas cell 20 are capable of detecting each have a limit. When the first gas cell 10 is used, if the concentration of the hydrocarbon gas in the detected gas is lower than the lower limit value of the first gas cell 10, the computer 404 may output a control command to the motor controller 120, so that the motor controller 120 controls the third mirror 70 and the fourth mirror 80 to move, so that the third mirror 70 is located between the first light ray inlet 101 and the light outlet 301 of the michelson interferometer 30, and the fourth mirror 80 is located between the first light ray outlet 102 and the light inlet 401 of the detection unit 40, so that the interference light may enter the second gas cell 20, and the concentration of the hydrocarbon gas in the gas may be detected again. In the above scenario, the first air chamber 10 and the second air chamber 20 are filled with the same gas to be measured.
Similarly, when the second gas chamber 20 is used, if the concentration of the hydrocarbon gas in the detected gas is higher than the upper limit value of the second gas chamber 20, the computer 404 may output a control command to the motor controller 120, so that the motor controller 120 controls the third mirror 70 and the fourth mirror 80 to move, so that the third mirror 70 moves away from the first light ray inlet 101, and the fourth mirror 80 moves away from the first light ray outlet 102, so that the interference light can enter the first gas chamber 10, and the concentration of the hydrocarbon gas in the gas can be detected again.
In the embodiment of the present disclosure, the detecting unit 40 obtains the absorbances of the first air chamber 10 and the second air chamber 20, that is, the logarithm of the ratio of the incident light intensity to the emergent light intensity, which is based on 10, after the light passes through the first air chamber 10 or the second air chamber 20 in the above processing process. The concentration of the hydrocarbon gas in the gas varies and the absorbance varies, and the computer 404 may store the lower absorbance limit value of the first gas cell 10 and the upper absorbance limit value of the second gas cell 20. The computer 404 can send a control instruction to the motor 110 according to the degree of absorption of the infrared light by the gas to be detected, and control the motor 110 to rotate, so as to drive the third reflector 70 and the fourth reflector 80 to displace. When the concentration of the hydrocarbon gas in the gas to be detected is higher, which means that the gas to be detected absorbs more infrared light in the second gas chamber 20, the computer controls the motor 110 to rotate forward, so that the third reflector 70 and the fourth reflector 80 can move downward, and the infrared light directly passes through the first gas chamber 10, which is suitable for analyzing the gas with higher concentration. When the concentration of the gas to be detected is reduced, which means that the absorption of the infrared light by the gas to be detected in the first air chamber 10 is low, the computer sends an instruction to control the motor 110 to rotate reversely, so that the third reflector 70 and the fourth reflector 80 can be driven to move upwards to shield the first air chamber 10, the infrared light is reflected to the first reflector 50 and then enters the second air chamber 20, and the gas to be detected is suitable for analyzing the gas with low concentration. And a switching threshold for controlling the action of the motor 110 may be set in the computer's analysis software.
In the disclosed embodiment, the threshold of absorbance switching from the second gas cell 20 to the first gas cell 10 is 2.6; the threshold for the absorbance switching from the first gas cell 10 to the second gas cell 20 is 1.0.
In an embodiment of the present disclosure, the photodetector 402 may be a DLATGS photodetector.
The infrared spectrum gas analysis device provided in the embodiments of the present disclosure is based on the fourier transform infrared spectrum technology, and analyzes a mid-infrared spectrum band in an interval between 2.5 micrometers (μm) and 25 μm in wavelength. As the mid-infrared absorption spectrum of the hydrocarbon gas is more obvious than the near-infrared absorption spectrum, the volume of the second gas chamber can be reduced, the response time of an analysis system is further shortened, the analysis period is shortened, and the requirement of timely and accurately finding thin-layer oil gas under the condition of rapid drilling is met.
Referring again to fig. 1, the first plenum 10 has a first inlet port 103 and a first outlet port 104, and the second plenum 20 has a second inlet port 203 and a second outlet port 204.
Gas to be detected is input into the first air chamber 10 through the first air inlet 103, and the gas to be detected is pumped out of the first air chamber 10 through the first air outlet 104 after the gas to be detected is finished, so that the gas to be detected can be used for detecting other gas concentrations, and is more convenient.
Similarly, the gas to be detected is input into the second gas chamber 20 through the second gas inlet 203, and after the gas to be detected is completed, the gas to be detected is extracted from the second gas chamber 20 through the second gas outlet 204.
Formation gas is continuously produced in the process of oil drilling, the formation gas can be introduced into the first gas chamber 10 and the second gas chamber 20, and the infrared spectrum gas analysis device can be used for continuously detecting the concentration of hydrocarbon gas in the formation gas, so that the real-time detection of the formation gas in the process of oil drilling is realized. Since the motor 110 can be controlled by the computer 404 to control the movement of the third mirror 70 and the fourth mirror 80, the replacement of the two gas chambers can be quickly realized without stopping the detection of the replaced gas chamber, and the loss of the detection data of the formation gas can be avoided.
Referring again to fig. 1, the infrared spectroscopic gas analysis device further comprises a sample pump 130. The outlets of the sample pump 130 communicate with the first inlet port 103 and the second inlet port 203, respectively.
It is more convenient to introduce the gas to be measured into the first gas chamber 10 and the second gas chamber 20 by the sample pump 130.
As shown in fig. 1, the sample pump 130 communicates with the first inlet port 103 and the second inlet port 203 through the inlet pipe 140.
Illustratively, the air inlet duct 140 may communicate with the first and second air inlets 103 and 203 via a ZG1/8 joint having a diameter of 3 millimeters (mm).
Illustratively, the air inlet conduit 140 may be a stainless steel or flexible tube having an outer diameter of 3 millimeters and an inner diameter of 2 millimeters.
As shown in fig. 1, the first gas outlet 104 and the second gas outlet 204 are communicated with the gas outlet pipeline 150 for outputting the gas to be measured.
Illustratively, outlet conduit 150 may be a stainless steel or flexible tube having an outer diameter of 3 mm and an inner diameter of 2 mm.
In the embodiment of the present disclosure, the housing of the first air chamber 10 and the housing of the second air chamber 20 are both stainless steel housings, which ensures the strength of the first air chamber 10 and the second air chamber 20, reduces the possibility of damage to the first air chamber 10 and the second air chamber 20, and reduces the maintenance time and cost.
In the embodiment of the present disclosure, the first light inlet 101, the first light outlet 102, the second light inlet 201, and the second light outlet 202 have light-transmissive window sheets to ensure that light can enter the first air chamber 10 and the second air chamber 20.
In the embodiment of the disclosure, the transparent window sheet does not absorb infrared rays, thereby avoiding influencing the accuracy of the detection structure.
Illustratively, the light transmissive panes at the first light inlet 101, the first light outlet 102, the second light inlet 201, and the second light outlet 202 may be calcium fluoride panes.
As shown in fig. 1, the infrared spectroscopic gas analysis apparatus further includes a protective casing 160, and the first gas chamber 10, the second gas chamber 20, the first reflector 50, the second reflector 60, the third reflector 70, and the fourth reflector 80 are all located in the protective casing 160. Both sides of the protective case 160 have windows 161 through which light passes.
Fig. 2 is a propagation path diagram of a light ray in a second optical chamber according to an embodiment of the disclosure. Referring to fig. 2, the infrared spectroscopic gas analysis apparatus further comprises a first planar mirror 901, a second planar mirror 902, a first concave mirror 903, a second concave mirror 904 and a third concave mirror 905 located within the second gas cell 20.
The first plane mirror 901 is located at the second light ray inlet 201, and the reflecting surface of the first plane mirror 901 faces the second light ray inlet 201. The second planar mirror 902 is located at the second light ray outlet 202, and the reflective surface of the second planar mirror 902 faces the second light ray outlet 202. The first concave mirror 903 is located between the first planar mirror 901 and the second planar mirror 902, the reflective surface of the second concave mirror 904 and the reflective surface of the third concave mirror 905 are respectively opposite to the reflective surface of the first concave mirror 903, the reflective surface of the second concave mirror 904 is also opposite to the reflective surface of the first planar mirror 901, and the reflective surface of the third concave mirror 905 is also opposite to the reflective surface of the second planar mirror 902.
There are various ways in which light rays entering the second gas cell 20 may travel, and the following description is illustrative of the travel of light rays within the second gas cell 20.
As shown in fig. 2, a light ray incident from the second light ray inlet 201 is reflected by the first plane mirror 901 to form a first light ray 11, the first light ray 11 propagates to the second concave mirror 904, the first light ray 11 is reflected by the second concave mirror 904 to form a second light ray 12, the second light ray 12 propagates to the first concave mirror 903, the second light ray 12 is reflected by the first concave mirror 903 to form a third light ray 13, the third light ray 13 propagates to the third concave mirror 905, the third light ray 13 is reflected by the third concave mirror 905 to form a fourth light ray 14, the fourth light ray 14 propagates to the first concave mirror 903, the fourth light ray 14 is reflected by the first concave mirror 903 to form a fifth light ray 15, the fifth light ray 15 propagates to the second concave mirror 904, the fifth light ray 15 is reflected by the second concave mirror 904 to form a sixth light ray 16, the sixth light ray 16 propagates to the first concave mirror 903, the sixth light 16 is reflected by the first concave reflector 903 to form a seventh light 17, the seventh light 17 propagates to the third concave reflector 905, the seventh light 17 is reflected by the third concave reflector 905 to form an eighth light 18, the eighth light 18 propagates to the second concave reflector 902, the eighth light 18 is reflected by the second concave reflector 902 and then exits from the second light outlet 202, and then is reflected by the second reflector 60 and the fourth reflector 80 in sequence and finally enters the detection unit 40.
It should be noted that the above-mentioned reference numerals for the light rays are only for better explaining the propagation paths of the light rays, and the light rays are actually the same light ray.
In other implementations, the light has another propagation path, and fig. 3 is a diagram of a propagation path of a light in the second optical chamber according to an embodiment of the present disclosure. Referring to fig. 3, light incident from the second light inlet 201 is reflected by the first planar mirror 901 to form a ninth light 21, the ninth light 21 propagates to the second concave mirror 904, the ninth light 21 is reflected by the second concave mirror 904 to form a tenth light 22, the tenth light 22 propagates to the first concave mirror 903, the tenth light 22 is reflected by the first concave mirror 903 to form an eleventh light 23, the eleventh light 23 propagates to the third concave mirror 905, the eleventh light 23 is reflected by the third concave mirror 905 to form a twelfth light 24, the twelfth light 24 propagates to the second planar mirror 902, the twelfth light 24 is reflected by the second planar mirror 902 to exit from the second light outlet 202, and then reflected by the second mirror 60 and the fourth mirror 80 in sequence to finally enter the detection unit 40.
The two propagation paths can be selected by adjusting the angles of the second concave mirror 904 and the third concave mirror 905.
In the disclosed embodiment, the light emitted by the michelson interferometer 30 has an optical path length in the first gas chamber 10 of between 1 meter (m) and 3 meters.
In the disclosed embodiment, the light emitted by the michelson interferometer 30 has an optical path length in the second gas cell 20 of between 3 centimeters (cm) and 7 cm.
In the embodiment of the present disclosure, the reflector may be a gold-plated mirror.
The infrared light passes through the interference light generated by the Michelson interferometer and completely enters the first air chamber or the second air chamber without being split, so that the light intensity energy is improved, the signal-to-noise ratio of the spectrometer can be improved, and the analysis precision is further improved.
The gas to be detected enters the two air chambers in parallel through the sample pump, and when switching occurs, seamless connection of the first air chamber and the second air chamber can be achieved.
The two-channel free switching Fourier infrared absorption spectrum analysis method can cover the full-range detection of the hydrocarbon gas of 10 million parts per million concentration (ppm) to 1000000 million parts per million concentration logging. The popularization and application process of the Fourier transform infrared spectrum analysis technology in the oil and gas exploration industry is accelerated.
The above description is intended to be exemplary only and not to limit the present disclosure, and any modification, equivalent replacement, or improvement made without departing from the spirit and scope of the present disclosure is to be considered as the same as the present disclosure.
Claims (10)
1. An infrared spectroscopic gas analysis device, comprising: the gas detector comprises a first gas chamber (10), a second gas chamber (20), a Michelson interferometer (30), a detection unit (40), a first reflector (50), a second reflector (60), a third reflector (70) and a fourth reflector (80);
the first gas chamber (10) is located between the michelson interferometer (30) and the detection unit (40), and the michelson interferometer (30), the first gas chamber (10) and the detection unit (40) are arranged along a first direction, the first direction is an optical outgoing direction of the michelson interferometer (30), the first gas chamber (10) has a first light ray inlet (101) and a first light ray outlet (102), the first light ray inlet (101) faces an optical outgoing opening (301) of the michelson interferometer (30), and the first light ray outlet (102) faces an optical incoming opening (401) of the detection unit (40);
the second air chamber (20) is positioned at one side of the first air chamber (10), the first air chamber (10) and the second air chamber (20) are arranged along a second direction, the second direction and the first direction are mutually vertical, and the second air chamber (20) is provided with a second light ray inlet (201) and a second light ray outlet (202);
the reflecting surface of the first reflector (50) faces the second light inlet (201) and the reflecting surface of the second reflector (60) faces the second light outlet (202);
the third mirror (70) and the fourth mirror (80) are movably arranged along the second direction, when the third mirror (70) is located between the first light ray inlet (101) and the light outlet (301) of the michelson interferometer (30) and the fourth mirror (80) is located between the first light ray outlet (102) and the light inlet (401) of the detection unit (40), the light emitted by the michelson interferometer (30) passes through the third mirror (70), the first mirror (50), the second air chamber (20), the second mirror (60), the fourth mirror (80) and the detection unit (40) in sequence; the optical path of the light emitted by the Michelson interferometer (30) in the second gas cell (20) is different from the optical path of the light in the first gas cell (10).
2. Infrared spectroscopic gas analysis device according to claim 1, characterized in that the optical path length of the light emitted by the michelson interferometer (30) in the second gas cell (20) is larger than in the first gas cell (10).
3. The infrared spectroscopic gas analysis device according to claim 2 further comprising a first planar mirror (901), a second planar mirror (902), a first concave mirror (903), a second concave mirror (904) and a third concave mirror (905) located within the second gas cell (20);
the first plane mirror (901) is positioned at the second light ray inlet (201), and the reflecting surface of the first plane mirror (901) faces the second light ray inlet (201);
the second planar mirror (902) is located at the second light ray outlet (202), a reflective surface of the second planar mirror (902) facing the second light ray outlet (202);
the first concave reflecting mirror (903) is positioned between the first plane reflecting mirror (901) and the second plane reflecting mirror (902), the reflecting surface of the second concave reflecting mirror (904) and the reflecting surface of the third concave reflecting mirror (905) are respectively opposite to the reflecting surface of the first concave reflecting mirror (903), the reflecting surface of the second concave reflecting mirror (904) is also opposite to the reflecting surface of the first plane reflecting mirror (901), and the reflecting surface of the third concave reflecting mirror (905) is also opposite to the reflecting surface of the second plane reflecting mirror (902);
the light incident from the second light ray inlet (201) passes through the first planar mirror (901), the second concave mirror (904), the first concave mirror (903), the third concave mirror (905), the first concave mirror (903), the second concave mirror (904), the first concave mirror (903), the third concave mirror (905), the second planar mirror (902), the second mirror (60), the fourth mirror (80), and the detection unit (40) in sequence; alternatively, the first and second electrodes may be,
the light incident from the second light inlet (201) passes through the first planar mirror (901), the second concave mirror (904), the first concave mirror (903), the third concave mirror (905), the second planar mirror (902), the second mirror (60), the fourth mirror (80), and the detection unit (40) in sequence.
4. An infrared spectroscopic gas analysis device according to any one of claims 1 to 3 further comprising: a transmission assembly (100) and a motor (110);
the third reflector (70) and the fourth reflector (80) are respectively connected with a driving shaft of the motor (110) through the transmission assembly (100).
5. The infrared spectroscopic gas analysis device according to claim 4, further comprising a motor controller (120), an output of said motor controller (120) being connected to a control terminal of said motor (110).
6. An infrared spectroscopic gas analysis device according to any one of claims 1 to 3 in which the light emitted by the Michelson interferometer (30) has an optical path length in the first gas chamber (10) of between 1 and 3 metres.
7. An infrared spectroscopic gas analysis device according to any one of claims 1 to 3 in which the Michelson interferometer (30) emits light in an optical path in the second gas cell (20) of between 3 cm and 7 cm.
8. Infrared spectroscopic gas analysis device according to any of the claims 1 to 3, characterized in that the first gas chamber (10) has a first gas inlet (103) and a first gas outlet (104) and the second gas chamber (20) has a second gas inlet (203) and a second gas outlet (204).
9. The infrared spectroscopic gas analysis device as set forth in claim 8 further comprising a sample pump (130);
the outlets of the sample pumps (130) are in communication with the first inlet port (103) and the second inlet port (203), respectively.
10. An infrared spectroscopic gas analysis device according to any one of claims 1 to 3 in which the housing of the first gas chamber (10) and the housing of the second gas chamber (20) are both stainless steel housings, and in which the first light inlet (101), the first light outlet (102), the second light inlet (201) and the second light outlet (202) are provided with light transmissive louvers.
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| CN202022677739.XU CN214310112U (en) | 2020-11-17 | 2020-11-17 | Infrared spectrum gas analysis device |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113720796A (en) * | 2020-12-07 | 2021-11-30 | 中国石油天然气集团有限公司 | Logging gas analysis system, method, equipment and medium based on infrared spectroscopy |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113720796A (en) * | 2020-12-07 | 2021-11-30 | 中国石油天然气集团有限公司 | Logging gas analysis system, method, equipment and medium based on infrared spectroscopy |
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