CN214250861U - In-line automatic retest device for high-gloss-surface complex-structure nanocrystalline - Google Patents
In-line automatic retest device for high-gloss-surface complex-structure nanocrystalline Download PDFInfo
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- CN214250861U CN214250861U CN202023216710.8U CN202023216710U CN214250861U CN 214250861 U CN214250861 U CN 214250861U CN 202023216710 U CN202023216710 U CN 202023216710U CN 214250861 U CN214250861 U CN 214250861U
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Abstract
The utility model relates to a testing arrangement technical field relates to an automatic retest device in line of high smooth face complex construction nanocrystalline. The utility model discloses a place the coil product on the location carrier, the carousel drives a plurality of location carriers and goes up unloading and detection operation in step, realizes the complete automation of equipment, reduces the manpower, reduces workman's intensity of labour, saves manufacturing cost, can also carry out retest to unqualified product simultaneously, reduction in production cost has satisfied a large amount of detection demands in the production; through product carrier positioning coil product, can improve detection mechanism's detection precision, provide the powerful guarantee for product quality's improvement.
Description
Technical Field
The utility model relates to a testing arrangement technical field relates to an automatic retest device in line of high smooth face complex construction nanocrystalline.
Background
The existing small electronic consumer products such as mobile phones and the like gradually start to use wireless charging to thoroughly put an end to the traditional wired connection mode. In the production process of a wireless charging coil (with a magnet nanocrystalline coil), the thickness of the coil panel is required to be tested frequently, a height gauge or an over-gauge instrument is generally adopted to check the thickness of the coil one by one at present, the testing method is low in efficiency, time and labor are wasted, the accuracy is difficult to guarantee frequently, excessive waste products are caused, the production cost is increased, and the method is not suitable for a mode of factory mass production.
SUMMERY OF THE UTILITY MODEL
The to-be-solved technical problem of the utility model is to provide a reduce workman's intensity of labour, save manufacturing cost, still can carry out retest to unqualified product, detect the high optical surface complex construction nanocrystalline in-line automatic retest device that the precision is high.
In order to solve the technical problem, the utility model provides a technical scheme that its technical problem adopted is:
an in-line automatic retest device for a high-gloss-surface complex-structure nanocrystalline comprises a rotary table, wherein a feeding station, a blanking station and a plurality of detection stations are arranged on the rotary table, positioning carriers are arranged on the feeding station, the blanking station and the plurality of detection stations, and the positioning carriers are arranged on the rotary table in an enclosing manner;
the positioning carrier comprises a detection mechanism and a product carrier, the product carrier is arranged on a carrier frame, the carrier frame is arranged on a detection frame, the detection mechanism is arranged on the detection frame, and the detection mechanism is arranged below the product carrier.
Furthermore, the material loading station comprises a material loading mechanical arm and a material loading frame, the material loading frame is arranged on one side of the turntable, and the material loading mechanical arm is arranged between the material loading frame and the turntable and used for loading coil products on the material loading frame onto the positioning carrier.
Further, the unloading station includes unloading manipulator, unloading frame and NG frame, unloading frame set up carousel one side, unloading manipulator sets up between unloading frame and the carousel for coil product transport to unloading frame or NG frame that finish to detecting.
Furthermore, a hollow-out part is arranged on the carrier frame, the product carrier is arranged on the hollow-out part, and a positioning pin used for positioning the coil product is arranged on the product carrier.
Furthermore, the product carrier edge is provided with a plurality of reference columns, carrier frame top edge is provided with a plurality of locating levers.
Further, be provided with locating component on the product carrier, locating component includes the vacuum shrouding, the vacuum shrouding sets up carrier board bottom, be provided with on the carrier board a plurality of with the absorption hole that the vacuum shrouding is linked together.
Further, detection mechanism includes a plurality of detection sensor, detection sensor sets up on the testing stand, the last detection through-hole of having seted up of carrier board, detection sensor wears to establish on the detection through-hole.
Further, the location carrier still includes elevating system, detection mechanism, product carrier all set up elevating system is last, elevating system includes crane and lower jacking cylinder, be provided with the lift slide rail on the crane, the last jacking frame that is equipped with of lift slide rail, the detection frame with the jacking frame is connected, lower jacking cylinder with the crane is connected, lower jacking cylinder piston rod end with the jacking frame drive is connected, lower jacking cylinder drives the reciprocating linear motion is along the lift slide rail to the jacking frame.
Further, the detection sensor is an LVDT linear displacement sensor provided with a ceramic detection head, and the ceramic detection head is arranged on the detection through hole in a penetrating manner.
Further, be provided with the tablet on the product carrier, be provided with on the detection station with tablet assorted proximity sensor, the tablet with proximity sensor sets up relatively.
The utility model has the advantages that:
the utility model discloses a place the coil product on the location carrier, the carousel drives a plurality of location carriers and goes up unloading and detection operation in step, realizes the complete automation of equipment, reduces the manpower, reduces workman's intensity of labour, saves manufacturing cost, can also carry out retest to unqualified product simultaneously, reduction in production cost has satisfied a large amount of detection demands in the production; through product carrier positioning coil product, can improve detection mechanism's detection precision, provide the powerful guarantee for product quality's improvement.
Drawings
Fig. 1 is a schematic diagram of the in-line automatic retest device for the nanocrystals with the complex structure and the high optical surface of the present invention.
Fig. 2 is a schematic view of the positioning carrier of the present invention.
Fig. 3 is a schematic view of the product carrier of the present invention.
Fig. 4 is a cross-sectional view of the product carrier of the present invention.
The reference numbers in the figures illustrate: 1. a turntable; 11; a feeding station; 12. a blanking station; 13. detecting a station; 2. a manipulator; 21. a feeding frame; 22. a blanking frame; 23. an NG frame; 3. positioning a carrier; 33. a product carrier; 331. an induction plate; 332. a proximity sensor; 333. an adsorption hole; 334. a vacuum suction plate; 335. detecting the through hole; 336. positioning pins; 337. a positioning column; 338. positioning a rod; 34. a lifting frame; 341. a jacking frame; 342. a lower jacking cylinder; 343. lifting the slide rail; 344. a detection frame; 345. a detection sensor; 346. a ceramic detection head;
Detailed Description
The present invention is further described with reference to the following drawings and specific embodiments so that those skilled in the art can better understand the present invention and can implement the present invention, but the embodiments are not to be construed as limiting the present invention.
Referring to fig. 1-4, an in-line automatic retest device for a high-gloss-surface complex-structure nanocrystal comprises a rotary table 1, wherein a feeding station 11, a discharging station 12 and a plurality of detection stations 13 are arranged on the rotary table 1, positioning carriers 3 are arranged on the feeding station 11, the discharging station 12 and the detection stations 13, and the positioning carriers 3 are arranged on the rotary table 1 in an enclosing manner;
the positioning carrier 3 comprises a detection mechanism and a product carrier 33, the product carrier 33 is arranged on a carrier frame, the carrier frame is arranged on a detection frame 344, the detection mechanism is arranged on the detection frame 344, and the detection mechanism is arranged below the product carrier 33.
The utility model discloses a place the coil product on location carrier 3, carousel 1 drives a plurality of location carriers 3 and goes up unloading and detection operation in step, realizes the full automation of equipment, reduces the manpower, reduces workman's intensity of labour, saves manufacturing cost, can also carry out retest to unqualified product simultaneously, reduction in production cost has satisfied a large amount of detection demands in the production; the coil product is positioned by the product carrier 33, so that the detection precision of the detection mechanism can be improved, and powerful guarantee is provided for improving the product quality.
The feeding station 11 comprises a feeding manipulator and a feeding frame 21, the feeding frame 21 is arranged on one side of the turntable 1, and the feeding manipulator is arranged between the feeding frame 21 and the turntable 1 and used for feeding coil products on the feeding frame 21 onto the positioning carrier 3.
A hollow-out part is arranged on the carrier frame, the product carrier 33 is arranged on the hollow-out part, and a positioning pin 336 used for positioning the coil product is arranged on the product carrier 33.
The edge of the product carrier 33 is provided with a plurality of positioning columns 337, the upper edge of the carrier frame is provided with a plurality of positioning rods 338, and the positioning columns 337 and the positioning rods 338 can be connected with positioning holes on the detection equipment on the detection station 13, so that the position accuracy of the coil product during detection on the detection station 13 is ensured.
The product carrier 33 is provided with a positioning component, the positioning component comprises a vacuum sealing plate, the vacuum sealing plate is arranged at the bottom of the carrier plate, and the carrier plate is provided with a plurality of adsorption holes 333 communicated with the vacuum sealing plate.
The detection mechanism comprises a plurality of detection sensors 345, the detection sensors 345 are arranged on the detection frame 344, detection through holes 335 are formed in the carrier plate, and the detection sensors 345 penetrate through the detection through holes 335.
The detecting sensor 345 is an LVDT linear displacement sensor provided with a ceramic detecting head 346, and the ceramic detecting head 346 is arranged on the detecting through hole 335 in a penetrating way.
The LVDT linear displacement sensor is adopted, the detection precision can reach 0.1 mu m, and meanwhile, the ceramic detection head 346 in contact with the product can be used for detecting the product with the magnet, so that the product cannot be damaged and magnetized, and the detection precision is ensured.
The positioning carrier 3 further comprises a lifting mechanism, the detecting mechanism and the product carrier 33 are both arranged on the lifting mechanism, the lifting mechanism comprises a lifting frame 34 and a lower lifting cylinder 342, a lifting slide rail 343 is arranged on the lifting frame 34, a lifting frame 341 is arranged on the lifting slide rail 343 in a sliding manner, the detecting frame 344 is connected with the lifting frame 341, the lower lifting cylinder 342 is connected with the lifting frame 34, the rod end of a piston rod of the lower lifting cylinder 342 is in driving connection with the lifting frame 341, and the lower lifting cylinder 342 drives the lifting frame 341 to do reciprocating linear motion along the lifting slide rail 343.
The utility model discloses a coil product detection device, including carousel 1, elevating system, coil carrier 33, detection station 13 equipment, elevating system, coil carrier 33 and detection equipment, the mounting hole has been seted up on the carousel 1, elevating system 34 wear to establish the mounting hole with carousel 1 is connected, elevating system can drive the coil product on the product carrier 33 and the detection position butt of detecting station 13 equipment for product carrier 33 and detection equipment contact completely, and the thickness information that obtains each position of coil product is more accurate.
Be provided with tablet 331 on the product carrier 33, be provided with on the detection station 13 with tablet 331 assorted proximity sensor 332, tablet 331 with proximity sensor 332 sets up relatively.
After the induction plate 331 is contacted with the proximity sensor 332, the position precision of the coil product in the detection of the detection station 13 is ensured, and the detection precision is further improved.
Through two robots go up unloading, the material loading manipulator is responsible for absorbing the product from material loading frame 21 and places on the location carrier 3 of material loading level, and the unloading manipulator will detect and place in NG frame 23 and unloading frame 22 after accomplishing the product absorption. The product starts to rotate for one circle from the feeding station 11, passes through all the detection stations 13 and finishes 1 detection process till the blanking station 12.
When the products in the feeding area are judged to be NG-poor by the detection work station, the retest program is automatically started, the retest is carried out again on the turntable 1, whether the products are real NG-poor or not is judged after the retest, and if the products are NG-poor, the feeding manipulator is placed in the NG frame 23; if false NG is not good, the material is placed in the blanking frame 22; when the retest program starts, the feeding manipulator stops placing new products on the positioning carrier 3 of the feeding station 11.
Manual retest can be completely replaced by the retest program, so that the full automation of the equipment is realized, the manpower is reduced, and the production cost is saved.
The utility model discloses still include the controller, be provided with the control circuit commonly used on the market in the controller, the controller with material loading station 11, unloading station 12, location carrier 3, detection station 13 electricity are connected for realize the detection of coil product thickness.
The above-mentioned embodiments are merely preferred embodiments for fully illustrating the present invention, and the scope of the present invention is not limited thereto. Equivalent substitutes or changes made by the technical personnel in the technical field on the basis of the utility model are all within the protection scope of the utility model. The protection scope of the present invention is subject to the claims.
Claims (10)
1. An in-line automatic retest device for a high-gloss-surface complex-structure nanocrystalline is characterized by comprising a turntable, wherein the turntable is provided with a feeding station, a discharging station and a plurality of detection stations, positioning carriers are arranged on the feeding station, the discharging station and the plurality of detection stations, and the positioning carriers surround the turntable;
the positioning carrier comprises a detection mechanism and a product carrier, the product carrier is arranged on a carrier frame, the carrier frame is arranged on a detection frame, the detection mechanism is arranged on the detection frame, and the detection mechanism is arranged below the product carrier.
2. The in-line automatic retesting device for high-gloss complicated-structure nanocrystals, as recited in claim 1, wherein the loading station comprises a loading robot and a loading frame, the loading frame is disposed at one side of the turntable, and the loading robot is disposed between the loading frame and the turntable for loading the coil products on the loading frame onto the positioning carrier.
3. The in-line automatic retest device of high gloss surface complex structure nanocrystalline of claim 1, wherein the unloading station includes unloading manipulator, unloading frame and NG frame, the NG frame, unloading frame are set up in carousel one side, the unloading manipulator sets up between unloading frame and carousel, is used for carrying to unloading frame or NG frame the coil product that finishes detecting.
4. The in-line automatic retest device for nanocrystals with a complex structure and a high optical surface as claimed in claim 1, wherein a hollow portion is disposed on the carrier frame, the product carrier is disposed on the hollow portion, and the product carrier is disposed thereon with a positioning pin for positioning the coil product.
5. The in-line automatic retest device for high optical surface area complex structured nanocrystals, as recited in claim 4, wherein the product carrier has a plurality of positioning posts disposed on an edge thereof, and a plurality of positioning posts disposed on an upper edge thereof.
6. The in-line automatic retest device for high gloss surface complex structured nanocrystals, as recited in claim 4, wherein said product carrier is provided with a positioning component, said positioning component comprises a vacuum sealing plate, said vacuum sealing plate is disposed at the bottom of said carrier plate, said carrier plate is provided with a plurality of suction holes communicating with said vacuum sealing plate.
7. The in-line automatic retest device for nanocrystals with complex structure and high optical surface as claimed in claim 4, wherein the detection mechanism comprises a plurality of detection sensors, the detection sensors are disposed on the detection frame, the carrier plate is provided with detection through holes, and the detection sensors are disposed through the detection through holes.
8. The in-line automatic retest device of high gloss surface complex structure nanocrystalline of claim 1, characterized in that, the location carrier still includes elevating system, detection mechanism, product carrier all set up on elevating system, elevating system includes crane and lower jacking cylinder, be provided with the lift slide rail on the crane, the last jacking frame that is equipped with of lift slide rail, detect the frame with the jacking frame is connected, lower jacking cylinder with the crane is connected, lower jacking cylinder piston rod end with the jacking frame drive is connected, lower jacking cylinder drives the jacking frame is along the reciprocating linear motion of lift slide rail.
9. The in-line automatic retest device for nanocrystals with complex structure and high optical surface as claimed in claim 7, wherein the detection sensor is an LVDT linear displacement sensor provided with a ceramic detection head, and the ceramic detection head is disposed through the detection through hole.
10. The in-line automatic retest device for high gloss surface complex structured nanocrystals, as recited in claim 1, wherein the product carrier is provided with a sensor board, the detection station is provided with a proximity sensor matching the sensor board, and the sensor board is disposed opposite to the proximity sensor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202023216710.8U CN214250861U (en) | 2020-12-28 | 2020-12-28 | In-line automatic retest device for high-gloss-surface complex-structure nanocrystalline |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202023216710.8U CN214250861U (en) | 2020-12-28 | 2020-12-28 | In-line automatic retest device for high-gloss-surface complex-structure nanocrystalline |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN214250861U true CN214250861U (en) | 2021-09-21 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202023216710.8U Active CN214250861U (en) | 2020-12-28 | 2020-12-28 | In-line automatic retest device for high-gloss-surface complex-structure nanocrystalline |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN214250861U (en) |
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- 2020-12-28 CN CN202023216710.8U patent/CN214250861U/en active Active
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