CN214011351U

CN214011351U - Embedded SMU four-port rapid I-V testing system

Info

Publication number: CN214011351U
Application number: CN202022785251.9U
Authority: CN
Inventors: 赵先成
Original assignee: Zhejiang Lide Instrument Co Ltd
Current assignee: Zhejiang Lide Instrument Co Ltd
Priority date: 2020-11-27
Filing date: 2020-11-27
Publication date: 2021-08-20
Anticipated expiration: 2030-11-27

Abstract

The utility model relates to a quick I-V test system technical field, and disclose a quick I-V test system of four ports based on embedded SMU, including the main control chip module, main control chip module bottom fixed mounting has display module, this quick I-V test system of four ports based on embedded SMU makes the SMU module read external voltage electric current through send instruction, makes AWG module output fast pulse, then reads the ADC return data to carry out real-time processing with the data of returning, make the corresponding voltage electric current of power module output carry out the current-limiting simultaneously and handle, make data transmission have high synchronism, the high accuracy: adopt 32bit high accuracy ADC to read data, peripheral circuit and signal processing that the cooperation interference killing feature promoted, data processing has the high accuracy, the characteristic of low time delay, and the interference killing feature is strong: the AWG module adopts a peripheral circuit with strong anti-interference capability and software to perform denoising processing, and reads voltage through ADC difference, so that the influence of interference noise on data is greatly reduced.

Description

Embedded SMU four-port rapid I-V testing system

Technical Field

The utility model relates to a quick I-V test system technical field specifically is a quick I-V test system of four ports based on embedded SMU.

Background

The fast I-V test has wide application range, and relates to the fields of sensors, materials and microelectronics, the traditional fast I-V test needs to depend on large-scale semiconductor parameter analyzer equipment or a plurality of SMU equipment for matching use, the four-port fast I-V test has complex use and low matching degree, complex programming processing needs to be carried out but the real-time performance and the precision are not high, output pulses are easily influenced by external interference noise and can not meet the test requirements, in order to solve the existing I-V test problem, an idea based on an embedded SMU four-port fast I-V test system is generated, the implementation scheme is to use an embedded SMU four-port I-V test system, and the embedded SMU four-port I-V test system comprises an SMU module, a power supply module, an AWG module, an ADC module, a display module and a main control chip module, so that the utility model can process data in real time with higher speed and higher precision, has strong anti-interference capability of output pulse, completes more accurate test function of external circuit I-V, is also the key point of the utility model,

based on the above consideration, we propose an embedded-based SMU four-port fast I-V test system, which has the advantages of strong anti-interference capability of output pulses and more accurate I-V test function of an external circuit, so as to solve the above problems.

SUMMERY OF THE UTILITY MODEL

For the purpose that realizes that above-mentioned output pulse interference killing feature is strong and external circuit I-V test function is more accurate, the utility model provides a following technical scheme: the utility model provides a quick I-V test system of four ports based on embedded SMU, includes the main control chip module, main control chip module bottom fixed mounting has the display module, main control chip module bottom fixed mounting has power module, the equal fixed mounting in both sides has the SMU module about the main control chip module, main control chip module left side fixed mounting has the ADC module, ADC module left side fixed mounting has the AWG module.

And as optimization, DUT modules are fixedly arranged on the opposite sides of the tops of the two SMU modules.

As optimization, the main control chip module is electrically connected with the SMU module in a bidirectional mode, the main control chip module is in bidirectional signal connection with the display module, the input end of the main control chip module is electrically connected with the output end of the power supply module, the output end of the main control chip module is in signal connection with the input end of the ADC module, the output end of the main control chip module is in signal connection with the input end of the AWG module, and the ADC module is in bidirectional signal connection with the AWG module.

And as optimization, the main control chip module uses an MCU main control chip module which takes an STM32 series as a chip.

Preferably, the power module is a programmable direct current power supply.

Preferably, the SMU module is a programmable current and voltage acquisition module.

For optimization, the ADC module is a 32-bit high-precision ADC.

Preferably, the display module is an LCD high-resolution display.

The utility model has the advantages that:

this quick I-V test system of four ports based on embedded SMU makes the SMU module read outside voltage electric current through sending instruction, makes AWG module output fast pulse, then reads ADC return data to carry out real-time processing with the data that will return, make power module output corresponding voltage electric current simultaneously and carry out the current-limiting processing, make data transmission have high synchronism, high accuracy: adopt 32bit high accuracy ADC to read data, peripheral circuit and signal processing that the cooperation interference killing feature promoted, data processing has the high accuracy, the characteristic of low time delay, and the interference killing feature is strong: the AWG module adopts a peripheral circuit with strong anti-interference capability and software to perform denoising processing, and reads voltage through ADC difference, so that the influence of interference noise on data is greatly reduced, and the effects of strong anti-interference capability of output pulse and more accurate I-V test function of an external circuit are achieved.

Drawings

FIG. 1 is a schematic view of the system of the present invention;

fig. 2 is a system control diagram of the present invention.

In the figure: 1. a main control chip module; 2. a display module; 3. a power supply module; 4. an SMU module; 5. an ADC module; 6. and an AWG module.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1-2, a rapid I-V test system based on embedded SMU four-port includes a main control chip module, a display module is fixedly installed at the bottom end of the main control chip module, a power module is fixedly installed at the bottom end of the main control chip module, SMU modules are fixedly installed at the left and right sides of the main control chip module, an ADC module is fixedly installed at the left side of the main control chip module, and an AWG module is fixedly installed at the left side of the ADC module.

Referring to fig. 1-2, DUT modules are fixedly mounted on opposite sides of the tops of the two SMU modules.

Referring to fig. 1-2, the main control chip module is electrically connected to the SMU module in both directions, the main control chip module is connected to the display module in both directions by signals, the input terminal of the main control chip module is electrically connected to the output terminal of the power supply module, the output terminal of the main control chip module is connected to the input terminal of the ADC module in signals, the output terminal of the main control chip module is connected to the input terminal of the AWG module in signals, and the ADC module is connected to the AWG module in both directions by signals.

The main control chip module uses an MCU main control chip module which takes STM32 series as chips.

Wherein the power module is a programmable DC power supply.

The SMU module is a programmable current and voltage acquisition module.

Wherein the ADC module is a 32bit high precision ADC.

Wherein the display module is an LCD high-resolution display.

When the device is used, please refer to fig. 1-2, the SMU module 4 reads external voltage and current by sending an instruction, the AWG module 6 outputs a fast pulse, then the ADC returns data, and processes the returned data in real time, and the power module 3 outputs corresponding voltage and current for current limiting, so that data transmission has high synchronism, data processing has high precision and low time delay, meanwhile, the AWG outputs a peripheral circuit with strong anti-jamming capability and software de-noising processing, and reads voltage by ADC difference, so that the overall precision is greatly improved, and meanwhile, the device is matched with the instruction of the 32-bit ARM processor, so that data can reflect the fast I-V characteristic of four ports in real time in a high-precision processing project, and display the current parameters and voltage and current in real time through the display module.

In summary, the SMU module 4 reads the external voltage and current by sending the command, the AWG module 6 outputs the fast pulse, then reads the ADC return data, and performs real-time processing on the return data, and the power module 3 outputs the corresponding voltage and current for current limiting processing, so that the data transmission has high synchronization and high accuracy: adopt 32bit high accuracy ADC to read data, peripheral circuit and signal processing that the cooperation interference killing feature promoted, data processing has the high accuracy, the characteristic of low time delay, and the interference killing feature is strong: the AWG module 6 adopts a peripheral circuit with strong anti-interference capability and software to perform denoising processing, and reads voltage through ADC difference, so that the influence of interference noise on data is greatly reduced, and the effects of strong output pulse anti-interference capability and more accurate external circuit I-V test function are achieved.

Above, only be the concrete implementation of the preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any person skilled in the art is in the technical scope of the present invention, according to the technical solution of the present invention and the design of the present invention, equivalent replacement or change should be covered within the protection scope of the present invention.

Claims

1. The utility model provides a four port quick I-V test system of SMU based on it is embedded, includes main control chip module (1), its characterized in that: the utility model discloses a main control chip module, including main control chip module (1), main control chip module (1) bottom fixed mounting has display module (2), main control chip module (1) bottom fixed mounting has power module (3), the equal fixed mounting in the main control chip module (1) left and right sides has SMU module (4), main control chip module (1) left side fixed mounting has ADC module (5), ADC module (5) left side fixed mounting has AWG module (6).

2. The embedded SMU based four-port fast I-V test system of claim 1, wherein: and DUT modules are fixedly arranged on the opposite sides of the tops of the two SMU modules (4).

3. The embedded SMU based four-port fast I-V test system of claim 1, wherein: main control chip module (1) is connected with SMU module (4) two-way electricity, main control chip module (1) and display module (2) two-way signal connection, main control chip module (1) input is connected with power module (3) output electricity, main control chip module (1) output and ADC module (5) input signal connection, main control chip module (1) output and AWG module (6) input signal connection, ADC module (5) and AWG module (6) two-way signal connection.

4. The embedded SMU based four-port fast I-V test system of claim 1, wherein: the MCU master control chip module (1) using STM32 series as chips is used in the master control chip module (1).

5. The embedded SMU based four-port fast I-V test system of claim 1, wherein: the power supply module (3) is a programmable direct current power supply.

6. The embedded SMU based four-port fast I-V test system of claim 1, wherein: the SMU module (4) is a programmable current and voltage acquisition module.

7. The embedded SMU based four-port fast I-V test system of claim 1, wherein: the ADC module (5) is a 32-bit high-precision ADC.

8. The embedded SMU based four-port fast I-V test system of claim 1, wherein: the display module (2) is used for high-resolution display of an LCD.