CN213875947U - Testing device - Google Patents

Abstract

The utility model relates to a battery piece check out test set technical field especially relates to a testing arrangement. The utility model provides a testing arrangement includes that supporting mechanism and multiunit probe arrange the subassembly, and multiunit probe arranges the subassembly and sets up side by side. Wherein, the supporting mechanism includes two supporting components and spacing posts that set up relatively, the supporting component includes a plurality of joint portions, the both ends of probe bank subassembly can with joint portion joint, all can dismantle on every supporting component and be connected with spacing post, spacing post can restrict probe bank subassembly and deviate from the joint direction and remove, when the probe bank subassembly of different models is switched to needs on the supporting mechanism, only need to dismantle spacing post from the supporting component, probe bank subassembly that will need to be changed is along deviating from joint direction roll-off supporting mechanism, probe bank subassembly joint with the replacement can on the supporting mechanism, not only can guarantee that probe bank subassembly is firm joint on the supporting mechanism, the time of switching probe bank subassembly has also been saved, efficiency of software testing is improved.

Description

Testing device

Technical Field

The utility model relates to a battery piece check out test set technical field especially relates to a testing arrangement.

Background

In the battery piece go-no-go test, because of the battery piece of different models of needs test, often need switch the probe of different models and arrange the subassembly on supporting mechanism, satisfy the test demand of testing different models battery piece. At the present stage, for example, the MBB probe row assembly cuts 5BB probe row assembly and the like, the detection to a plurality of main grid number cells can be realized only by installing a plurality of groups of probe row assemblies arranged side by side on the supporting mechanism, and each group of probe row assemblies are detachably connected on the supporting mechanism through the fixing piece, in the switching process, each group of probe row assemblies to be replaced needs to be detached from the supporting mechanism one by one, and then each group of probe row assemblies to be replaced is fixed on the supporting mechanism one by one through the fixing piece, so that a large amount of time needs to be consumed for replacing the probe row assemblies, and the testing efficiency is reduced.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a testing arrangement not only can guarantee that the joint of probe bank subassembly is firm on supporting mechanism, has also saved the time of switching probe bank subassembly, has improved efficiency of software testing.

To achieve the purpose, the utility model adopts the following technical proposal:

the utility model provides a testing arrangement, includes supporting mechanism and multiunit probe bank subassembly, multiunit the probe bank subassembly sets up side by side, supporting mechanism includes:

the probe row component comprises two oppositely arranged support components, each support component comprises a plurality of clamping parts, and two ends of each probe row component can be clamped with the clamping parts; and

spacing post, every all can be dismantled on the supporting component and be connected with spacing post, spacing post can restrict the subassembly is arranged to the probe deviates from the joint direction and removes.

As preferred scheme, be provided with a plurality of accommodation spaces on the supporting component, accommodation space runs through supporting component's top surface and orientation another one side of supporting component, every all be provided with in the accommodation space joint portion, probe row subassembly includes body and joint spare, the both ends of body all are connected with joint spare, the both ends of body stretch into in the accommodation space, joint spare with joint portion joint.

Preferably, the clamping portion includes a first plate, a second plate and a third plate, the first plate, the second plate and the third plate are sequentially connected to form a U-shaped structure, and a protrusion is disposed on an inner wall of the first plate;

the joint spare is provided with the recess, the joint spare can slide in between first board and the third board, and respectively with first board, third board and the looks butt of second board, the arch can the card is gone into in the recess.

Preferably, the limit column is located on one side of the probe bank assembly, which is far away from the clamping direction.

Preferably, the limit column penetrates through the support assembly and the probe bank assemblies.

Preferably, the support mechanism further includes:

a fixing plate;

the sliding parts are connected with both ends of the fixed plate,

the supporting component comprises a plurality of supporting pieces, the supporting pieces are arranged on the sliding pieces in a sliding mode, and each supporting piece is connected with the clamping portion.

Preferably, the support mechanism further comprises a locking member configured to secure the support member to the slider.

Preferably, the support mechanism further includes:

the supporting seat is fixed below the supporting piece and used for supporting the supporting piece.

Preferably, the probe row assembly includes:

a body;

the contact conductive piece is embedded in the body, and two ends of the contact conductive piece extend out of the body and are clamped with the clamping part; and

and one ends of the probes are embedded in the body and electrically connected with the contact conductive piece, and the other ends of the probes extend out of the body and are used for being abutted with the piece to be detected.

Preferably, the testing apparatus further comprises:

the resistance detection assemblies are electrically connected with each group of probe bank assemblies and are configured to detect the resistance values of the probe bank assemblies; and

and the alarm device is electrically connected with the resistance detection assembly, and when the detection resistance value is greater than the preset value of the resistance detection assembly, the resistance detection assembly triggers the alarm device.

The utility model has the advantages that:

the utility model provides a testing device, two supporting components and spacing post that the supporting mechanism set up including relatively, the supporting component includes a plurality of joint portions, the both ends of probe bank subassembly can with joint portion joint, and all can dismantle on every supporting component and be connected with spacing post, spacing post can restrict probe bank subassembly and deviate from the joint direction and remove, when the probe bank subassembly of different models is switched on the supporting mechanism to needs, only need to dismantle spacing post from the supporting component, the probe bank subassembly that will need to be changed is along deviating from joint direction roll-off supporting mechanism, the probe bank subassembly joint that will replace can on the supporting mechanism, not only can guarantee that probe bank subassembly stabilizes the joint on the supporting mechanism, the time of switching probe bank subassembly has also been saved, the efficiency of software testing is improved.

Drawings

Fig. 1 is a schematic structural diagram of a testing apparatus according to a first embodiment of the present invention;

fig. 2 is a schematic structural diagram of a support assembly according to a first embodiment of the present invention;

FIG. 3 is a schematic structural diagram of a probe bank assembly according to an embodiment of the present invention;

fig. 4 is a partially enlarged view of a portion a in fig. 3.

In the figure:

1. a support mechanism; 11. a support assembly; 111. a clamping part; 1111. a first plate; 11111. a protrusion; 1112. a second plate; 1113. a third plate; 112. a support member; 1121. a support body; 1122. a side wall panel; 11221. a first mounting hole; 12. a limiting column; 13. a fixing plate; 14. a slider; 15. a locking member; 16. a supporting seat;

2. a probe bank assembly; 21. a body; 211. a second mounting hole; 22. a clamping piece; 221. a groove; 23. contacting the conductive member; 24. and (3) a probe.

Detailed Description

In order to make the technical problem solved by the present invention, the technical solution adopted by the present invention and the technical effect achieved by the present invention clearer, the technical solution of the present invention will be further explained by combining the drawings and by means of the specific implementation manner.

In the description of the present invention, unless expressly stated or limited otherwise, the terms "connected," "connected," and "fixed" are to be construed broadly, e.g., as meaning permanently connected, detachably connected, or integral to one another; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.

In the present disclosure, unless expressly stated or limited otherwise, the first feature "on" or "under" the second feature may comprise direct contact between the first and second features, or may comprise contact between the first and second features not directly. Also, the first feature being "on," "above" and "over" the second feature includes the first feature being directly on and obliquely above the second feature, or merely indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.

In the description of the present embodiment, the terms "upper", "lower", "left", "right", and the like are used in the orientation or positional relationship shown in the drawings only for convenience of description and simplicity of operation, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed in a specific orientation, and be operated, and thus should not be construed as limiting the present invention. Furthermore, the terms "first" and "second" are used only for descriptive purposes and are not intended to have a special meaning.

Example one

As shown in fig. 1, the testing device provided in this embodiment is mainly used for performing a sorting test on battery pieces, and includes a supporting mechanism 1 and a plurality of groups of probe card row assemblies 2, wherein the plurality of groups of probe card row assemblies 2 are arranged side by side on the supporting mechanism 1, the supporting mechanism 1 is used for supporting the plurality of groups of probe card row assemblies 2, and the plurality of groups of probe card row assemblies 2 can be electrically connected with a plurality of rows of main grid lines on the battery pieces to realize the electrical detection on the battery pieces.

In the battery piece sorting test, because of the need to test the battery pieces of different models, the probe row assembly 2 of different models often needs to be switched on the supporting mechanism 1 to meet the test requirements of testing the battery pieces of different models. In order to save the time for switching the probe card row component 2 and improve the testing efficiency, as shown in fig. 1-2, the supporting mechanism 1 comprises two supporting components 11 and a limiting column 12 which are arranged relatively, the supporting components 11 comprise a plurality of clamping parts 111, the two ends of the probe card row component 2 can be clamped with the clamping parts 111, the supporting components 11 can be detachably connected with the limiting column 12, and the limiting column 12 can limit the probe card row component 2 to move away from the clamping direction. When the probe row subassembly 2 of different models is changed on supporting mechanism 1 to needs, only need to dismantle spacing post 12 from supporting component 11, the probe row subassembly 2 that will change is along deviating from joint direction roll-off supporting mechanism 1, with the probe row subassembly 2 joint of replacement can on supporting mechanism 1, not only can guarantee that probe row subassembly 2 joint is firm on supporting mechanism 1, also saved the time of switching probe row subassembly 2, improved efficiency of software testing.

Referring to fig. 3, a specific structure of the probe row assembly 2 will be described, as shown in fig. 3, the probe row assembly 2 includes a body 21, a contact conductive member 23 and a plurality of probes 24, the contact conductive member 23 is embedded in the body 21, two ends of the contact conductive member 23 extend out of the body 21 and are clamped with the clamping portion 111, one end of each probe 24 is embedded in the body 21 and electrically connected to the contact conductive member 23, and the other end of each probe 24 extends out of the body 21 and is electrically connected to a main grid line of a battery piece. When the probe row assembly 2 performs electrical detection on the battery piece, the main grid line of the battery piece transmits an electrical signal to the probe 24, the probe 24 transmits the signal to the contact conductive piece 23, and two ends of the contact conductive piece 23 are connected with the tester through the wires, so that the electrical detection on the battery piece is realized.

In order to ensure that the probe 24 is electrically connected to the main grid line on the battery piece, as shown in fig. 1, the supporting mechanism 1 further includes a fixing plate 13 and a sliding member 14, the two ends of the fixing plate 13 are both connected to the sliding member 14, the supporting assembly 11 includes a plurality of supporting members 112, the plurality of supporting members 112 are slidably disposed on the sliding member 14, and each supporting member 112 is connected to a clamping portion 111. By finely adjusting the positions of the supporting members 112 on the sliding member 14, it is ensured that the probes 24 on the probe row assembly 2 are electrically connected with the multiple rows of main grid lines of the battery piece, and the structure is also suitable for detecting battery pieces with main grid lines of different widths. Specifically, the sliding member 14 may be a sliding shaft, the plurality of supporting members 112 may be directly slidably sleeved on the sliding shaft, and the sliding shaft has a simple structure, so as to facilitate the sliding connection between the plurality of supporting members 112 and the sliding shaft.

In addition, as shown in fig. 1, the supporting mechanism 1 further includes a locking member 15, and when the position of the supporting member 112 on the sliding member 14 is adjusted, the locking member 15 can fix the supporting member 112 on the sliding member 14, so as to ensure the stable connection between the supporting member 112 and the sliding member 14. Particularly, the locking member 15 may be a positioning pin having advantages of simple structure and easy installation. In other embodiments, the locking member 15 may also be a screw, and the screw connection has the advantages of reliable connection and strong stability.

Preferably, as shown in fig. 1, the supporting mechanism 1 further includes a supporting seat 16, the supporting seat 16 is fixed below the supporting member 112, the supporting seat 16 is used for supporting the supporting member 112, and by providing the supporting seat 16, the contact area between the supporting mechanism 1 and the placing position is increased, so as to improve the stability of the supporting mechanism 1.

Preferably, as shown in fig. 1-2, a plurality of accommodating spaces are provided on the supporting component 11, the accommodating spaces penetrate through the top surface of the supporting component 11 and one side of another supporting component 11, a clamping portion 111 is provided in each accommodating space, the probe row component 2 further includes a clamping member 22, two ends of the contact conductive member 23 are connected with the clamping member 22, two ends of the body 21 extend into the accommodating spaces, and the clamping member 22 is clamped with the clamping portion 111. Through set up accommodation space on supporting component 11, for the joint of joint spare 22 provides the guide effect on joint portion 111, be convenient for joint spare 22 slide in accommodation space and then the joint is to joint portion 111 on.

Specifically, as shown in fig. 2, the supporting member 112 includes a supporting body 1121 and two sets of side wall plates 1122, the supporting body 1121 has the side wall plates 1122 extending toward the direction of the clamping member 22, the two sets of side wall plates 1122 are symmetrically arranged to form an accommodating space, and the clamping portion 111 is disposed on an inner wall of one set of side wall plates 1122.

Referring to fig. 2 to 4, a specific structure of the clamping connection between the clamping connection member 22 and the clamping connection portion 111 is described, as shown in fig. 2 to 4, the clamping connection portion 111 includes a first plate 1111, a second plate 1112, and a third plate 1113, the first plate 1111, the second plate 1112, and the third plate 1113 are sequentially connected to form a U-shaped structure, a protrusion 11111 is disposed on an inner wall of the first plate 1111, the clamping connection member 22 is provided with a groove 221, the clamping connection member 22 can slide between the first plate 1111 and the third plate 1113, and respectively abut against the first plate 1111, the third plate 1113, and the second plate 1112, the protrusion 11111 can be clamped into the groove 221, and the clamping connection portion 111 has a simple structure and is convenient for processing and production. Specifically, the protrusion 11111 may be a cylinder or a rectangular parallelepiped, and the embodiment does not specifically limit the specific structure of the protrusion 11111, and the protrusion 11111 may be clamped in the embodiment as long as the shape of the protrusion 11111 can match the shape of the groove 221.

In this embodiment, as shown in fig. 2 to 4, the limiting column 12 penetrates through the supporting component 11 and the plurality of probe bank components 2, specifically, the two sets of sidewall plates 1122 are both provided with first mounting holes 11221, the body 21 is provided with second mounting holes 211, the second mounting holes 211 are located on one side of the clamping member 22 away from the clamping direction, and the limiting column 12 penetrates through the first mounting holes 11221 and the second mounting holes 211 to fix the supporting component 11 on the body 21. Specifically, the limiting column 12 may be a positioning pin, which has the advantages of simple structure and convenient installation. In other embodiments, the position-limiting column 12 may be a screw, the position-limiting column 12 is in threaded connection with the first mounting hole 11221, and the position-limiting column 12 is fastened to the sidewall plate 1122 by a nut.

In addition, testing arrangement still includes multiunit resistance detection subassembly and alarm device, every group probe row subassembly 2 homogeneous electricity is connected with the resistance detection subassembly, the resistance detection subassembly is used for detecting the resistance of probe row subassembly 2, the resistance detection subassembly is connected with alarm device electricity, when detecting the default that the resistance is greater than the resistance detection subassembly, the resistance detection subassembly can trigger alarm device and report to the police, thereby realize the control to every group probe row subassembly 2 resistance, can not in time be discover when avoiding certain probe row subassembly 2 to take place unusually, guarantee testing arrangement test ground stability. Specifically, the resistance detection component may be a resistance tester, and since the resistance tester is in the prior art, the detailed structure and the working principle of the resistance tester are not described herein in too much detail.

Example two

The testing apparatus provided in this embodiment is substantially the same as the first embodiment, and the difference between the testing apparatus provided in this embodiment and the first embodiment is that: the mounting positions of the restraining posts 12 are different.

Preferably, in this embodiment, the spacing column 12 is located the one side that deviates from the joint direction of the probe bank component 2, and can avoid the probe bank component 2 from sliding out of the supporting mechanism 1 along the joint direction, and ensure that the probe bank component 2 is firmly clamped on the supporting mechanism 1. Specifically, the spacing posts 12 sequentially pass through the first mounting holes 11221 of the plurality of supporting members 112 to limit the probe bank assembly 2 in the accommodating space.

It is obvious that the above embodiments of the present invention are only examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. Any modification, equivalent replacement, and improvement made within the spirit and principle of the present invention should be included in the protection scope of the claims of the present invention.

Claims (10)

1. The utility model provides a testing arrangement, includes supporting mechanism (1) and multiunit probe card row subassembly (2), multiunit probe card row subassembly (2) set up side by side, its characterized in that, supporting mechanism (1) includes:

the probe row component comprises two oppositely arranged support components (11), wherein each support component (11) comprises a plurality of clamping parts (111), and two ends of each probe row component (2) can be clamped with the clamping parts (111); and

spacing post (12), every all can be dismantled on supporting component (11) and be connected with spacing post (12), spacing post (12) can restrict probe bank subassembly (2) deviate from the joint direction and remove.

2. The testing device according to claim 1, wherein a plurality of accommodating spaces are arranged on the supporting component (11), the accommodating spaces penetrate through the top surface of the supporting component (11) and face one side of the other supporting component (11), each accommodating space is internally provided with the clamping portion (111), the probe bank component (2) comprises a body (21) and a clamping piece (22), the two ends of the body (21) are connected with the clamping piece (22), the two ends of the body (21) extend into the accommodating spaces, and the clamping piece (22) is clamped with the clamping portion (111).

3. The testing device according to claim 2, wherein the clamping portion (111) comprises a first plate (1111), a second plate (1112) and a third plate (1113), the first plate (1111), the second plate (1112) and the third plate (1113) are sequentially connected to form a U-shaped structure, and a protrusion (11111) is arranged on the inner wall of the first plate (1111);

joint spare (22) are provided with recess (221), joint spare (22) can slide in first board (1111) with between third board (1113), and respectively with first board (1111), third board (1113) and second board (1112) looks butt, arch (11111) can be gone into in recess (221).

4. Testing device according to claim 1, characterized in that the spacing columns (12) are located on the side of the probe bank assembly (2) facing away from the clamping direction.

5. The testing device according to claim 1, characterized in that the spacing posts (12) are arranged through the support assembly (11) and the plurality of probe card assemblies (2).

6. The testing device according to claim 1, characterized in that the support mechanism (1) further comprises:

a fixed plate (13);

a sliding part (14), wherein the sliding part (14) is connected with both ends of the fixing plate (13),

the supporting component (11) comprises a plurality of supporting pieces (112), the supporting pieces (112) are arranged on the sliding piece (14) in a sliding mode, and each supporting piece (112) is connected with the clamping portion (111).

7. The testing device according to claim 6, characterized in that the support mechanism (1) further comprises a locking member (15) configured to fix the support member (112) on the slider (14).

8. The testing device according to claim 6, characterized in that the support mechanism (1) further comprises:

the supporting seat (16) is fixed below the supporting piece (112), and the supporting seat (16) is used for supporting the supporting piece (112).

9. The testing device according to claim 1, wherein the probe bank assembly (2) comprises:

a body (21);

the contact conductive piece (23) is embedded in the body (21), and two ends of the contact conductive piece (23) extend out of the body (21) and are clamped with the clamping part (111); and

and one ends of the probes (24) are embedded in the body (21) and electrically connected with the contact conductive piece (23), and the other ends of the probes (24) extend out of the body (21) and are used for being abutted against a piece to be tested.

10. The testing device of claim 1, further comprising:

a plurality of sets of resistance detection assemblies, each set of probe bank assemblies (2) being electrically connected with the resistance detection assembly, the resistance detection assembly being configured to detect a resistance value of the probe bank assembly (2); and

and the alarm device is electrically connected with the resistance detection assembly, and when the detection resistance value is greater than the preset value of the resistance detection assembly, the resistance detection assembly triggers the alarm device.

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