CN213875910U - Medium response analysis device - Google Patents

Medium response analysis device Download PDF

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Publication number
CN213875910U
CN213875910U CN202022666511.0U CN202022666511U CN213875910U CN 213875910 U CN213875910 U CN 213875910U CN 202022666511 U CN202022666511 U CN 202022666511U CN 213875910 U CN213875910 U CN 213875910U
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interface
frequency dielectric
dielectric response
signal input
input interface
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史俊
李文亮
聂瑛
王宏峰
杨旋
李学妨
吴国天
陈仕骄
史翠红
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Puer Supply Power Bureau of Yunnan Power Grid Co Ltd
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Puer Supply Power Bureau of Yunnan Power Grid Co Ltd
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Abstract

The application discloses medium response analytical equipment includes: a processor disposed within the housing; the processor is respectively and electrically connected with the alternating voltage signal generating module, the direct voltage signal generating module, the low-frequency dielectric response current receiving module and the high-frequency dielectric response current receiving module. When the device is used, the direct-current voltage output interface applies the voltage generated by the direct-current voltage signal generating module to the high-voltage device to be tested and receives the low-frequency dielectric response current of the high-voltage device to be tested. Then, the alternating voltage output interface applies the voltage generated by the alternating voltage signal generating module to the high-voltage equipment to be tested and receives the high-frequency dielectric response current of the high-voltage equipment to be tested. And transmitting the low-frequency dielectric response current and the high-frequency dielectric response current stored in the storage module to a corresponding computer through a USB (universal serial bus), so that the insulation aging condition of the high-voltage equipment can be further analyzed.

Description

Medium response analysis device
Technical Field
The utility model relates to an electric power tech field, in particular to medium response analytical equipment.
Background
For high voltage equipment, such as power transformers, circuit breakers, disconnectors, current transformers, voltage transformers, rotating electrical machines and cables, the insulation system is subjected to various stresses throughout its lifetime, including high temperatures, vibrations, electrical fields and exposure to moisture, oxidation, acid corrosion and other chemical contaminants. As a result, its mechanical and electrical properties gradually deteriorate and ultimately affect the reliability of the device. The performance degradation process is mainly a chemical and physical process, and the degradation speed is greatly influenced by heat, oxidation and a humid environment. Moisture has a particularly large influence on solid insulating materials such as paper and the like, and is also an index of the aging degree.
The insulating structure of a high voltage device can be represented by a dielectric model consisting of series and parallel connected resistors and capacitors representing polarization and conductance losses in the insulating material. The dielectric response is a unique characteristic for any particular insulation system. The increase in moisture content in insulation causes a change in dielectric strength and thus a change in dielectric response characteristics. However, the existing insulation aging detection means of the high-voltage equipment can only be carried out in a narrow frequency range, and the measurement accuracy of the dielectric response measurement analysis carried out on the insulation of the high-voltage equipment is not high.
SUMMERY OF THE UTILITY MODEL
In order to solve the above problem, the utility model provides a dielectric response analytical equipment, it can measure the insulating dielectric response of high-tension apparatus in a wider frequency range, assesses moisture content in the insulation and analyzes insulating state to judge high-tension apparatus's ageing state.
The technical scheme of the utility model is specifically as follows:
a media response analysis device, comprising: a processor disposed within the housing;
the processor is respectively and electrically connected with the alternating voltage signal generating module, the direct voltage signal generating module, the low-frequency dielectric response current receiving module and the high-frequency dielectric response current receiving module; the low-frequency dielectric response current receiving module is electrically connected with the low-frequency dielectric response information storage module, and the high-frequency dielectric response current receiving module is electrically connected with the high-frequency dielectric response information storage module;
the alternating voltage signal generating module is electrically connected with the alternating voltage output interface through the alternating voltage output switch; the direct-current voltage signal generation module is electrically connected with the direct-current voltage output interface; the low-frequency dielectric response current receiving module is electrically connected with the first signal input interface; the high-frequency dielectric response current receiving module is electrically connected with the second signal input interface.
Further, the housing comprises a first interface surface and a second interface surface;
the first interface surface is provided with a power switch, a power input interface, an equipotential grounding port, a direct-current voltage output interface and a USB interface;
the second interface surface is provided with an alternating voltage output interface, an alternating voltage output switch, a first signal input interface, a second signal input interface and a protection line interface.
In the preferred embodiment of the present invention, the power input interface is electrically connected to the power switch, the alternating current voltage signal generating module, the direct current voltage signal generating module, the processor, the low frequency dielectric response current receiving module, the low frequency dielectric response information storage module, the high frequency dielectric response current receiving module, and the high frequency dielectric response information storage module.
It can be understood that, when in use, a 10V-24V direct current power supply can be used as a power supply of the whole medium response analysis device and is connected to the power input interface. Therefore, power is supplied to the alternating voltage signal generating module, the direct voltage signal generating module, the processor, the low-frequency dielectric response current receiving module, the low-frequency dielectric response information storage module, the high-frequency dielectric response current receiving module and the high-frequency dielectric response information storage module in the dielectric response analysis device.
In the preferred embodiment of the present invention, the low frequency dielectric response information storage module and the high frequency dielectric response information storage module are both electrically connected to the USB interface.
It can be understood that after the low-frequency dielectric response current and the high-frequency dielectric response current of the high-voltage equipment to be tested are collected, the low-frequency dielectric response current and the high-frequency dielectric response current can be transmitted to a corresponding computer through a USB, and the aging condition of the high-voltage equipment can be further analyzed. The dielectric response analysis device disclosed by the application can measure the dielectric response of the high-voltage equipment in a wider frequency range, evaluate the moisture content in the insulation and analyze the insulation state, thereby judging the aging state of the high-voltage equipment.
In the preferred embodiment of the present invention, the ac voltage output interface, the first signal input interface and the second signal input interface are all provided with a dust-blocking sheet, and the dust-blocking sheet is rotationally fixed on the second interface surface.
It can be understood that the alternating voltage output interface, the first signal input interface and the second signal input interface are often exposed to the outside when not in use, and dust in the external environment can easily enter the interior of the dielectric response analysis device through the interfaces, so that the service life of the device is influenced. Therefore, the arrangement of the dust blocking sheet can effectively block the dust from entering and prolong the service life of the device. When the interface needs to be used, the dust blocking sheet can be rotated to avoid the corresponding interface, so that the interface is convenient to wire; when the interface does not need to be used, the connection wire can be pulled out, and the dust blocking sheet is rotated again to shield the corresponding interface again.
In the preferred embodiment of the present invention, the second interface surface is close to the ac voltage output interface, the first signal input interface and the second signal input interface are all provided with a rotation hole, the dust-blocking piece faces to one side of the second interface surface, and a rotation rod is provided, and the rotation rod is inserted into the rotation hole.
In a preferred embodiment of the present invention, the ac voltage output interface, the first signal input interface and the second signal input interface are all provided with a first magnet ring; and a second magnet ring is arranged on the dust blocking sheet facing the second interface surface, and the magnetism of the first magnet ring is opposite to that of the second magnet ring.
It can be understood that when the interface is not needed to be used, the first magnet ring and the second magnet ring are mutually adsorbed by rotating the dust blocking sheet, and the corresponding interface is shielded by the dust blocking sheet.
In a preferred embodiment of the present invention, a third magnet ring is disposed on the second interface surface near the ac voltage output interface, the first signal input interface, and the second signal input interface, and the third magnet ring and the second magnet ring have opposite magnetism.
It can be understood that when the interface needs to be used, the third magnet ring and the second magnet ring are mutually adsorbed by rotating the dust-blocking sheet, and the corresponding interface shielded by the dust-blocking sheet is exposed.
In a preferred embodiment of the present invention, the first magnet ring, the second magnet ring and the third magnet ring are the same in size.
Compared with the prior art, the beneficial effects of the utility model are specifically as follows:
the application discloses a medium response analysis device. When the low-frequency dielectric response current receiving module is used, the output conducting wire is connected with the direct-current voltage output interface, the processor controls the direct-current voltage signal generating module to be started, voltage generated by the direct-current voltage signal generating module is applied to high-voltage equipment to be detected, and the input conducting wire is connected with the high-voltage equipment to be detected and the first signal input interface, so that the low-frequency dielectric response current receiving module receives low-frequency dielectric response current of the high-voltage equipment to be detected and stores the low-frequency dielectric response current through the corresponding storage module. Then, the output conducting wire is connected with the alternating voltage output interface, the processor controls the alternating voltage signal generating module to be started, voltage generated by the alternating voltage signal generating module is applied to the high-voltage equipment to be tested, and the input conducting wire is connected with the high-voltage equipment to be tested and the second signal input interface, so that the high-frequency dielectric response current receiving module receives the high-frequency dielectric response current of the high-voltage equipment to be tested and stores the high-frequency dielectric response current through the corresponding storage module. The low-frequency dielectric response current and the high-frequency dielectric response current stored in the storage module are transmitted to a corresponding computer through a USB, and the aging condition of the high-voltage equipment can be further analyzed. The dielectric response analysis device disclosed by the application can measure the dielectric response of the high-voltage equipment insulation in a wider frequency range, evaluate the moisture content in the insulation and analyze the insulation state, thereby judging the aging state of the high-voltage equipment.
In order to make the aforementioned and other objects, features and advantages of the present invention comprehensible, preferred embodiments accompanied with figures are described in detail below.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are required to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention, and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.
Fig. 1 is a schematic structural diagram of an appearance of a medium response analyzer provided by the present invention;
FIG. 2 is a schematic illustration of a first interface surface and a second interface surface of the media response analysis device shown in FIG. 1;
FIG. 3 is a cross-sectional view of the media response analyzer device shown in FIG. 1;
FIG. 4 is a schematic perspective view of an interface of the media response analysis apparatus shown in FIG. 1;
FIG. 5 is a schematic view of the interface shown in FIG. 4 being blocked by a dust patch;
FIG. 6 is a schematic external view of the interface shown in FIG. 4;
wherein:
10-shell, 11-first interface surface, 12-second interface surface, 13-power switch, 14-power input interface, 15-equipotential grounding port, 16-direct current voltage output interface, 17-USB interface, 18-alternating current voltage output interface, 19-alternating current voltage output switch, 20-protection line interface, 21-first signal input interface, 22-second signal input interface, 31-alternating current voltage signal generation module, 32-direct current voltage signal generation module, 33-processor, 34-low-frequency dielectric response current receiving module, 35-low-frequency dielectric response information storage module, 36-high-frequency dielectric response current receiving module, 37-high-frequency dielectric response information storage module, 40-dust-blocking sheet, 41-first magnet ring, 42-second magnet ring, 43-third magnet ring, 50-rotating hole.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
As shown in fig. 1 to 3, the medium response analyzing apparatus of the present embodiment includes a housing 10, and the housing 10 includes a first interface surface 11 and a second interface surface 12.
As shown in fig. 2, the first interface surface 11 is provided with a power switch 13, a power input interface 14, an equipotential ground port 15, a dc voltage output interface 16, and a USB interface 17; the second interface surface 12 is provided with an alternating voltage output interface 18, an alternating voltage output switch 19, a first signal input interface 21, a second signal input interface 22 and a guard line interface 20.
As shown in fig. 3, an ac voltage signal generating module 31, a dc voltage signal generating module 32, a processor 33, a low-frequency dielectric response current receiving module 34, a low-frequency dielectric response information storing module 35, a high-frequency dielectric response current receiving module 36, and a high-frequency dielectric response information storing module 37 are further provided in the housing 10.
The processor 33 is electrically connected with the alternating voltage signal generating module 31, the direct voltage signal generating module 32, the low-frequency dielectric response current receiving module 34 and the high-frequency dielectric response current receiving module 36 respectively; the low-frequency dielectric response current receiving module 34 is electrically connected to the low-frequency dielectric response information storage module 35, and the high-frequency dielectric response current receiving module 36 is electrically connected to the high-frequency dielectric response information storage module 37.
The alternating voltage signal generating module 31 is electrically connected with the alternating voltage output interface 18 through the alternating voltage output switch 19; the direct-current voltage signal generating module 32 is electrically connected with the direct-current voltage output interface 16; the low-frequency dielectric response current receiving module 34 is electrically connected with the first signal input interface 21; the high frequency dielectric response current receiving module 36 is electrically connected to the second signal input interface 22.
The medium response analyzing apparatus of the present embodiment. When the low-frequency dielectric response current testing device is used, the output conducting wire is connected with the direct-current voltage output interface 16, the processor 33 controls the direct-current voltage signal generating module 32 to be started, voltage generated by the direct-current voltage signal generating module 32 is applied to high-voltage equipment to be tested, and the input conducting wire is connected with the high-voltage equipment to be tested and the first signal input interface 21, so that the low-frequency dielectric response current receiving module 34 receives low-frequency dielectric response current of the high-voltage equipment to be tested and stores the low-frequency dielectric response current through the corresponding storage module. Then, the output wire is connected to the ac voltage output interface 18, the processor 33 controls the ac voltage signal generating module 31 to turn on, applies the voltage generated by the ac voltage signal generating module 31 to the high-voltage device to be tested, and the input wire is connected to the high-voltage device to be tested and the second signal input interface 22, so that the high-frequency dielectric response current receiving module 36 receives the high-frequency dielectric response current of the high-voltage device to be tested and stores the high-frequency dielectric response current through the corresponding storage module. The low-frequency dielectric response current and the high-frequency dielectric response current stored in the storage module are transmitted to a corresponding computer through a USB, and the aging condition of the high-voltage equipment can be further analyzed.
The dielectric response analysis device disclosed in this embodiment can measure the dielectric response of the high-voltage equipment in a relatively wide frequency range, evaluate the moisture content in the insulation and analyze the state of the insulation, thereby judging the aging state of the high-voltage equipment.
As shown in fig. 3, in the preferred embodiment, the power input interface 14 is electrically connected to the ac voltage signal generating module 31, the dc voltage signal generating module 32, the processor 33, the low-frequency dielectric response current receiving module 34, the low-frequency dielectric response information storing module 35, the high-frequency dielectric response current receiving module 36 and the high-frequency dielectric response information storing module 37 through the power switch 13.
It will be appreciated that, in use, a 10V-24V dc power supply may be connected to the power input interface 14 as the power supply for the entire dielectric response analysis apparatus. Thereby supplying power to the alternating voltage signal generating module 31, the direct voltage signal generating module 32, the processor 33, the low-frequency dielectric response current receiving module 34, the low-frequency dielectric response information storing module 35, the high-frequency dielectric response current receiving module 36, and the high-frequency dielectric response information storing module 37 in the dielectric response analyzing apparatus.
In the preferred embodiment, both the low frequency dielectric response information storage module 35 and the high frequency dielectric response information storage module 37 are electrically connected to the USB interface 17.
It can be understood that after the low-frequency dielectric response current and the high-frequency dielectric response current of the high-voltage equipment to be tested are collected, the low-frequency dielectric response current and the high-frequency dielectric response current can be transmitted to a corresponding computer through a USB, and the aging condition of the high-voltage equipment can be further analyzed. The dielectric response analysis device disclosed by the application can measure the dielectric response of the high-voltage equipment in a wider frequency range, evaluate the moisture content in the insulation and analyze the insulation state, thereby judging the aging state of the high-voltage equipment.
As shown in fig. 4 to 6, in the preferred embodiment, the dust-proof sheet 40 is disposed on each of the ac voltage output interface 18, the first signal input interface 21 and the second signal input interface 22, and the dust-proof sheet 40 is rotatably fixed on the second interface surface 12.
It can be understood that the ac voltage output interface 18, the first signal input interface 21 and the second signal input interface 22 are often exposed to the outside when not in use, and dust in the external environment can easily enter the interior of the medium response analysis device through the interfaces, which affects the service life of the device. Therefore, the dust blocking sheet 40 can effectively block the dust from entering, and the service life of the device is prolonged. When the interface needs to be used, the dust blocking sheet 40 can be rotated to avoid the corresponding interface, so that the interface is convenient to wire, as shown in fig. 4; when the interface is not needed, the connection wire can be pulled out, and the dust-guard sheet 40 is rotated again to shield the corresponding interface again, as shown in fig. 5 and 6.
In the preferred embodiment of the present invention, the second interface surface 12 is provided with a rotation hole 50 near the ac voltage output interface 18, the first signal input interface 21 and the second signal input interface 22, and a rotation rod (not shown) is provided on one side of the dust guard sheet 40 facing the second interface surface 12 and inserted into the rotation hole 50.
In the preferred embodiment of the present invention, the first magnet ring 41 is disposed on the ac voltage output interface 18, the first signal input interface 21 and the second signal input interface 22; the dust guard sheet 40 is provided with a second magnet ring 42 facing the second interface surface 12, and the first magnet ring 41 and the second magnet ring 42 have opposite magnetism.
It can be understood that when the interface is not needed, the dust guard 40 is rotated to make the first magnet ring 41 and the second magnet ring 42 attract each other, so that the dust guard 40 shields the corresponding interface.
In the preferred embodiment of the present invention, a third magnet ring 43 is disposed on the second interface surface 12 near the ac voltage output interface 18, the first signal input interface 21 and the second signal input interface 22, and the third magnet ring 43 has a magnetic property opposite to that of the second magnet ring 42.
It can be understood that when the interface is needed to be used, the dust-blocking sheet 40 is rotated to make the third magnet ring 43 and the second magnet ring 42 attract each other, so that the corresponding interface shielded by the dust-blocking sheet 40 is exposed.
In the preferred embodiment of the present invention, the first magnet ring 41, the second magnet ring 42, and the third magnet ring 43 are the same size.
When the low-frequency dielectric response current testing device is used, the output conducting wire is connected with the direct-current voltage output interface 16, the processor 33 controls the direct-current voltage signal generating module 32 to be started, voltage generated by the direct-current voltage signal generating module 32 is applied to high-voltage equipment to be tested, and the input conducting wire is connected with the high-voltage equipment to be tested and the first signal input interface 21, so that the low-frequency dielectric response current receiving module 34 receives low-frequency dielectric response current of the high-voltage equipment to be tested and stores the low-frequency dielectric response current through the corresponding storage module. Then, the output wire is connected to the ac voltage output interface 18, the processor 33 controls the ac voltage signal generating module 31 to turn on, applies the voltage generated by the ac voltage signal generating module 31 to the high-voltage device to be tested, and the input wire is connected to the high-voltage device to be tested and the second signal input interface 22, so that the high-frequency dielectric response current receiving module 36 receives the high-frequency dielectric response current of the high-voltage device to be tested and stores the high-frequency dielectric response current through the corresponding storage module. The low-frequency dielectric response current and the high-frequency dielectric response current stored in the storage module are transmitted to a corresponding computer through a USB, and the aging condition of the high-voltage equipment can be further analyzed.
The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims (9)

1. A medium response analyzing apparatus, comprising:
a processor disposed within the housing;
the processor is respectively and electrically connected with the alternating voltage signal generating module, the direct voltage signal generating module, the low-frequency dielectric response current receiving module and the high-frequency dielectric response current receiving module; the low-frequency dielectric response current receiving module is electrically connected with the low-frequency dielectric response information storage module, and the high-frequency dielectric response current receiving module is electrically connected with the high-frequency dielectric response information storage module;
the alternating voltage signal generating module is electrically connected with the alternating voltage output interface through the alternating voltage output switch; the direct-current voltage signal generation module is electrically connected with the direct-current voltage output interface; the low-frequency dielectric response current receiving module is electrically connected with the first signal input interface; the high-frequency dielectric response current receiving module is electrically connected with the second signal input interface.
2. The media response analysis device of claim 1, wherein:
the housing comprises a first interface surface and a second interface surface;
the first interface surface is provided with a power switch, a power input interface, an equipotential grounding port, a direct-current voltage output interface and a USB interface;
the second interface surface is provided with an alternating voltage output interface, an alternating voltage output switch, a first signal input interface, a second signal input interface and a protection line interface.
3. The media response analysis device of claim 2, wherein:
the power input interface is electrically connected with the alternating voltage signal generating module, the direct voltage signal generating module, the processor, the low-frequency dielectric response current receiving module, the low-frequency dielectric response information storage module, the high-frequency dielectric response current receiving module and the high-frequency dielectric response information storage module through the power switch.
4. The media response analysis device of claim 2, wherein:
the low-frequency dielectric response information storage module and the high-frequency dielectric response information storage module are both electrically connected with the USB interface.
5. The media response analysis device of claim 2, wherein:
the alternating voltage output interface, the first signal input interface and the second signal input interface are all provided with dust blocking sheets, and the dust blocking sheets are rotationally fixed on the second interface surface.
6. The media response analysis device of claim 5, wherein:
the second interface surface is provided with rotating holes close to the alternating voltage output interface, the first signal input interface and the second signal input interface, and one side of the dust blocking sheet facing the second interface surface is provided with a rotating rod which is inserted into the rotating holes.
7. The media response analysis device of claim 6, wherein:
the alternating voltage output interface, the first signal input interface and the second signal input interface are all provided with a first magnet ring;
and a second magnet ring is arranged on the dust blocking sheet facing the second interface surface, and the magnetism of the first magnet ring is opposite to that of the second magnet ring.
8. The media response analysis device of claim 7, wherein:
and third magnet rings are arranged on the second interface surface and close to the alternating voltage output interface, the first signal input interface and the second signal input interface, and the magnetism of the third magnet rings is opposite to that of the second magnet rings.
9. The media response analysis device of claim 8, wherein:
the first, second, and third magnet rings are the same size.
CN202022666511.0U 2020-11-17 2020-11-17 Medium response analysis device Active CN213875910U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202022666511.0U CN213875910U (en) 2020-11-17 2020-11-17 Medium response analysis device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202022666511.0U CN213875910U (en) 2020-11-17 2020-11-17 Medium response analysis device

Publications (1)

Publication Number Publication Date
CN213875910U true CN213875910U (en) 2021-08-03

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