CN213364966U

CN213364966U - Connection structure of chip tester host and chip load board

Info

Publication number: CN213364966U
Application number: CN202022329221.7U
Authority: CN
Inventors: 许传庆; 许元君
Original assignee: Suzhou Kaiqing Precision Electronics Co ltd
Current assignee: Suzhou Kaiqing Precision Electronics Co ltd
Priority date: 2020-10-19
Filing date: 2020-10-19
Publication date: 2021-06-04
Anticipated expiration: 2030-10-19

Abstract

The utility model discloses a chip testing machine host computer and chip load board's connection structure, including the L template, L template bottom fixedly connected with handle, L template bottom is connected with places the board, L template lateral wall fixedly connected with test host, the last accredited testing organization that is equipped with of test host, place and seted up the mounting groove on the board, the bottom rotates in the mounting groove and is connected with the axis of rotation, the one end fixedly connected with sucking disc of bottom in the mounting groove is kept away from to the axis of rotation, mounting groove inside wall sliding connection has the lifter plate, the lifter plate passes through meshing mechanism and is connected with the axis of rotation, the lifter plate is the setting of L type, be equipped with supporting mechanism in the mounting groove, supporting mechanism is connected with the lifter plate. The utility model discloses a mounting groove, axis of rotation, meshing mechanism, sucking disc, supporting mechanism, accredited testing organization and the cooperation of expansion joint are used, have realized the quick test to chip load board, have improved work efficiency.

Description

Connection structure of chip tester host and chip load board

Technical Field

The utility model relates to a chip load board test technical field especially relates to a chip testing machine host computer and chip load board's connection structure.

Background

Design and manufacture manufacturers of integrated circuit chips often need to use a chip tester to test the integrated circuit chips, the chip tester mainly comprises a chip tester host and a chip load board, and during testing, a test pin on the chip tester host is connected with the chip load board to transmit signals so as to realize a chip test function.

The existing testing mode is to contact the test slots on the chip load board with the testing needles to test the performance of the chip load board, the test slots on the chip load board correspond to the testing needles manually in the prior art, the working efficiency is low, and meanwhile, the testing needles are exposed outside for a long time and easily adhere to dust, so that the testing precision can be influenced.

SUMMERY OF THE UTILITY MODEL

The utility model aims at solving the existing problems in the prior art and providing a connection structure of a chip tester host computer and a chip load board.

In order to achieve the above purpose, the utility model adopts the following technical scheme:

the utility model provides a chip testing machine host computer and chip load board's connection structure, includes the L template, L template bottom fixedly connected with handle, L template bottom is connected with places the board, L template lateral wall fixedly connected with test host computer, the last accredited testing organization that is equipped with of test host computer, place and seted up the mounting groove on the board, the bottom rotates in the mounting groove and is connected with the axis of rotation, the one end fixedly connected with sucking disc of bottom in the mounting groove is kept away from to the axis of rotation, mounting groove inside wall sliding connection has the lifter plate, the lifter plate passes through meshing mechanism and rotation axis connection, the lifter plate is the setting of L type, be equipped with supporting mechanism in the mounting groove, supporting mechanism is connected with the lifter plate, it is equipped with the expansion joint that is linked together with the mounting groove to.

Preferably, accredited testing organization includes that two are seted up and are accomodate the groove on test host, accomodate the first telescopic link that two symmetries of inslot bottom fixedly connected with set up, first telescopic link tip fixedly connected with fly leaf, the test needle that two symmetries of fly leaf lateral wall fixedly connected with set up, first telescopic link lateral wall cover is equipped with first reset spring, first reset spring's both ends respectively with accomodate inslot bottom and fly leaf lateral wall fixed connection.

Preferably, the outer side wall of the test host is fixedly connected with a rotating shaft, the outer side wall of the rotating shaft is rotatably connected with a sealing plate, two limiting grooves are formed in the test host, limiting holes are formed in the sealing plate, and the same limiting rod is inserted into the limiting holes and the corresponding limiting grooves.

Preferably, the supporting mechanism comprises a second telescopic rod fixedly connected to the inner side wall of the mounting groove, the top of the second telescopic rod is fixedly connected to the bottom of the lifting plate, a second reset spring is sleeved on the outer side wall of the second telescopic rod, and two ends of the second reset spring are fixedly connected to the bottom of the lifting plate and the inner side wall of the mounting groove respectively.

Preferably, the meshing mechanism comprises a gear sleeved on the outer side wall of the rotating shaft, and a tooth groove matched with the gear is formed in the lifting plate.

Preferably, the placing plate is provided with a sliding opening, and the inner side wall of the sliding opening is in sliding connection with the outer side wall of the bottom of the L-shaped plate.

Compared with the prior art, the utility model has the following advantage:

1. the utility model discloses a mounting groove, axis of rotation, meshing mechanism, sucking disc, supporting mechanism, accredited testing organization and the cooperation of expansion joint are used, have realized the quick test to chip load board, have improved work efficiency.

2. The utility model discloses a cooperation of rotation axis, closing plate, spacing groove, spacing hole and gag lever post is used, has realized taking in to accredited testing organization, has avoided accredited testing organization to expose for a long time in the outside and has leaded to the problem that test sensitivity reduces because of the dust adhesion easily, has improved the practicality of device.

Drawings

Fig. 1 is a schematic view of a front connection structure of a chip tester host and a chip load board according to the present invention;

fig. 2 is an enlarged view of a portion a of the connection structure of the chip tester host and the chip load board according to the present invention;

fig. 3 is the utility model provides a lifting plate and tooth's socket connection structure sketch map in the connection structure of chip testing machine host computer and chip load board.

In the figure: 1. an L-shaped plate; 2. a grip; 3. placing the plate; 4. a test host; 5. a receiving groove; 6. a first telescopic rod; 7. a first return spring; 8. a movable plate; 9. a test pin; 10. a sealing plate; 11. a limiting rod; 12. mounting grooves; 13. a rotating shaft; 14. a gear; 15. a lifting plate; 16. a tooth socket; 17. a second telescopic rod; 18. a second return spring; 19. a movable opening.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments.

In the description of the present invention, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.

Referring to fig. 1-3, a connecting structure of a chip tester host and a chip load board comprises an L-shaped board 1, wherein the bottom of the L-shaped board 1 is fixedly connected with a handle 2, the bottom of the L-shaped board 1 is connected with a placing board 3, the placing board 3 is provided with a sliding opening, and the inner side wall of the sliding opening is in sliding connection with the outer side wall of the bottom of the L-shaped board 1;

the outer side wall of the L-shaped plate 1 is fixedly connected with a testing host 4, a testing mechanism is arranged on the testing host 4, the testing mechanism comprises two accommodating grooves 5 formed in the testing host 4, two first telescopic rods 6 which are symmetrically arranged are fixedly connected to the bottom in the accommodating grooves 5, a movable plate 8 is fixedly connected to the end part of each first telescopic rod 6, and two testing needles 9 which are symmetrically arranged are fixedly connected to the outer side wall of the movable plate 8, wherein the testing principle of the testing needles 9 and a chip load plate is the prior art, and detailed description is omitted;

the outer side wall of the first telescopic rod 6 is sleeved with a first return spring 7, two ends of the first return spring 7 are fixedly connected with the inner bottom of the accommodating groove 5 and the outer side wall of the movable plate 8 respectively, and the ejection and the accommodation of the testing mechanism are realized through the matching use of the first return spring 7 and the first telescopic rod 6;

the outer side wall of the test host machine 4 is fixedly connected with a rotating shaft, the outer side wall of the rotating shaft is rotatably connected with a sealing plate 10, two limiting grooves are formed in the test host machine 4, limiting holes are formed in the sealing plate 10, the same limiting rod 11 is inserted into the limiting holes and the corresponding limiting grooves, the accommodating groove 5 is sealed by rotating the sealing plate 10, the influence of dust entering the accommodating groove 5 on the sensitivity of the test needle 9 is avoided, the sealing plate 10 is fixed by matching the limiting rods 11 with the limiting holes and the limiting grooves, and the stability of the device is improved;

the placing plate 3 is provided with a mounting groove 12, the bottom in the mounting groove 12 is rotatably connected with a rotating shaft 13, one end, away from the bottom in the mounting groove 12, of the rotating shaft 13 is fixedly connected with a sucker, the sucker adsorbs a chip load plate, and a test slot matched with the test pin 9 is formed in the chip load plate, wherein the sucker adsorbs the center of the chip load plate, so that the test slot in the chip load plate can be connected with the test pin 9 when the chip load plate rotates;

the inner side wall of the mounting groove 12 is connected with a lifting plate 15 in a sliding mode, the lifting plate 15 is connected with the rotating shaft 13 through an engagement mechanism, the engagement mechanism comprises a gear 14 sleeved on the outer side wall of the rotating shaft 13, a tooth groove 16 matched with the gear 14 is formed in the lifting plate 15, the lifting plate 15 is arranged in an L shape, a supporting mechanism is arranged in the mounting groove 12 and comprises a second telescopic rod 17 fixedly connected to the inner side wall of the mounting groove 12, the top of the second telescopic rod 17 is fixedly connected with the bottom of the lifting plate 15, a second reset spring 18 is sleeved on the outer side wall of the second telescopic rod 17, two ends of the second reset spring 18 are fixedly connected with the bottom of the lifting plate 15 and the inner side wall of the mounting groove 12 respectively, and the lifting plate 15 is supported and reset through;

the supporting mechanism is connected with the lifting plate 15, the placing plate 3 is provided with a movable opening 19 communicated with the mounting groove 12, the bottom of the lifting plate 15 is positioned in the movable opening 19, and the movable opening 19 realizes the up-and-down movement of the lifting plate 15.

The utility model discloses specific theory of operation as follows:

in an initial state, placing a chip load board on the sucker, holding the bottom of the handle 2 and the bottom of the placing board 3 with hands, and enabling the chip load board to be in contact with the testing needles 9 by enabling the placing board 3 to be close to the handle 2, wherein the chip load board is provided with testing slots matched with the testing needles 9, and when the testing needles 9 are inserted into the corresponding testing slots, testing on the chip load board can be achieved;

when the chip load board is contacted with the end part of the test needle 9, the bottom of the lifting board 15 is scratched by fingers, the lifting board 15 moves downwards, and then the tooth grooves 16 on the lifting board 15 are driven to move, the tooth grooves 16 are matched with the gears 14, and then the gears 14 are driven to rotate, the gears 14 rotate to drive the rotating shafts 13 to rotate, and further the chip load board on the sucker is driven to rotate, so that the chip load board test slots rotate along with the chip load board, and it is worth noting that the test needle 9 is in a compression state when being matched with the first telescopic rod 6 and the first return spring 7, and when the test slot rotates to the test needle 9, the test needle 9 is immediately inserted into the test slot under the action of external force, so that the rapid detection of the chip load board is realized;

it is worth noting that the sucking position of the sucking disc is the central point of the chip load board, so that the test pin 9 can be inserted into the test slot on the chip load board to test when the chip load board rotates when the rotating shaft 13 rotates.

The above, only be the concrete implementation of the preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any person skilled in the art is in the technical scope of the present invention, according to the technical solution of the present invention and the utility model, the concept of which is equivalent to replace or change, should be covered within the protection scope of the present invention.

Claims

1. A connecting structure of a chip tester host and a chip load board comprises an L-shaped board (1) and is characterized in that a handle (2) is fixedly connected to the bottom of the L-shaped board (1), a placing board (3) is connected to the bottom of the L-shaped board (1), a testing host (4) is fixedly connected to the outer side wall of the L-shaped board (1), a testing mechanism is arranged on the testing host (4), a mounting groove (12) is formed in the placing board (3), a rotating shaft (13) is rotatably connected to the bottom in the mounting groove (12), a sucker is fixedly connected to one end, far away from the bottom in the mounting groove (12), of the rotating shaft (13), a lifting board (15) is slidably connected to the inner side wall of the mounting groove (12), the lifting board (15) is connected with the rotating shaft (13) through a meshing mechanism, the lifting board (15) is arranged in an L, the supporting mechanism is connected with the lifting plate (15), a movable opening (19) communicated with the mounting groove (12) is formed in the placing plate (3), and the bottom of the lifting plate (15) is located in the movable opening (19).

2. The connecting structure of the chip tester main unit and the chip load board according to claim 1, wherein the testing mechanism includes two storage slots (5) formed on the testing main unit (4), two symmetrically arranged first telescopic rods (6) are fixedly connected to the bottom of each storage slot (5), a movable plate (8) is fixedly connected to the end of each first telescopic rod (6), two symmetrically arranged testing needles (9) are fixedly connected to the outer side wall of each movable plate (8), a first return spring (7) is sleeved on the outer side wall of each first telescopic rod (6), and two ends of each first return spring (7) are respectively fixedly connected to the inner bottom of each storage slot (5) and the outer side wall of each movable plate (8).

3. The connecting structure of the chip tester host and the chip load board according to claim 1, wherein a rotating shaft is fixedly connected to the outer side wall of the test host (4), a sealing plate (10) is rotatably connected to the outer side wall of the rotating shaft, two limiting grooves are formed in the test host (4), a limiting hole is formed in the sealing plate (10), and the same limiting rod (11) is inserted into the limiting hole and the corresponding limiting groove.

4. The connecting structure of the host computer of the chip testing machine and the chip load board according to claim 1, wherein the supporting mechanism comprises a second telescopic rod (17) fixedly connected to the inner side wall of the mounting groove (12), the top of the second telescopic rod (17) is fixedly connected to the bottom of the lifting plate (15), a second return spring (18) is sleeved on the outer side wall of the second telescopic rod (17), and two ends of the second return spring (18) are respectively fixedly connected to the bottom of the lifting plate (15) and the inner side wall of the mounting groove (12).

5. The connecting structure of the host machine of the chip testing machine and the chip load board according to claim 1, wherein the engaging mechanism comprises a gear (14) sleeved on the outer side wall of the rotating shaft (13), and the lifting plate (15) is provided with a tooth socket (16) matched with the gear (14).

6. The connecting structure of the chip tester host and the chip load board according to claim 1, wherein the placing board (3) is provided with a sliding opening, and the inner side wall of the sliding opening is slidably connected with the outer side wall of the bottom of the L-shaped board (1).