CN213181818U - High-temperature aging test equipment for frequency shift pulse transmitter and receiver - Google Patents
High-temperature aging test equipment for frequency shift pulse transmitter and receiver Download PDFInfo
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- CN213181818U CN213181818U CN202021853121.8U CN202021853121U CN213181818U CN 213181818 U CN213181818 U CN 213181818U CN 202021853121 U CN202021853121 U CN 202021853121U CN 213181818 U CN213181818 U CN 213181818U
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Abstract
The utility model relates to a high temperature aging testing equipment for frequency shift pulse transmitter and receiver, the await measuring send the ware and the receiver is arranged in the rack to the examination, and equipment includes: load box and be used for holding the high temperature environment adjusting device of load box and rack, wherein the load box includes: the box, locate load resistance and sampling resistor in the box to and be used for connecting binding post's on the rack cooperation terminal, load resistance and sampling resistor establish ties, and the cooperation terminal passes through the wire and connects load resistance and sampling resistor. Compared with the prior art, the utility model discloses utilize the load box of rack and setting, accomplish a plurality of senders and take the year aging testing simultaneously with the receiver, the principle is simple, and energy saving and raw and other materials improve efficiency of software testing.
Description
Technical Field
The utility model relates to an equipment high temperature aging testing technique especially relates to a high temperature aging testing equipment for frequency shift pulse transmitter and receiver.
Background
The frequency shift pulse transmitter and receiver belong to the railway signal electronic product, and are the core unit for controlling and commanding train, and the stability of its quality will directly affect the safety and reliability of the automatic block system track circuit.
In the prior art, an aging cabinet and a control panel are often configured independently to carry out high-temperature aging tests on a ZPW.F type transmitter and a ZPW.J type receiver, but for small-batch products such as the ZPW.FM-K type transmitter and the ZPW.JM-K type receiver, the independently configured aging cabinet of the transmitter or the aging cabinet of the receiver is high in manufacturing cost, complex in wiring and long in time consumption.
SUMMERY OF THE UTILITY MODEL
The utility model aims at providing a high temperature aging testing equipment for shifting frequency impulse sender and receiver in order to overcome the defect that above-mentioned prior art exists, utilize the load box of rack and setting, accomplish a plurality of senders and receiver and carry aging testing simultaneously, the principle is simple, and energy saving and raw and other materials improve efficiency of software testing.
The purpose of the utility model can be realized through the following technical scheme:
a high temperature burn-in test apparatus for frequency-shifted pulse transmitters and receivers, the transmitters and receivers to be tested being disposed within a cabinet, the apparatus comprising: load box and be used for holding load box and rack's high temperature environment adjusting device, the load box includes: the box, locate load resistance and sampling resistor in the box to and be used for connecting binding post's on the rack cooperation terminal, load resistance and sampling resistor establish ties, cooperation terminal passes through the wire and connects load resistance and sampling resistor.
Furthermore, an attenuation redundant isolator is further arranged in the cabinet and connected with the receiver.
Furthermore, the wiring terminals are provided with four types, namely a first wiring terminal, a second wiring terminal, a third wiring terminal and a fourth wiring terminal, the first wiring terminal and the second wiring terminal are connected with the transmitter, the third wiring terminal and the fourth wiring terminal are connected with the attenuation redundancy isolator, and one group of wiring terminals consists of four different wiring terminals;
the matching terminals are provided with four types, namely a first matching terminal, a second matching terminal, a third matching terminal and a fourth matching terminal, the first matching terminal is connected to one end of the load resistor, the third matching terminal is connected to the other end of the load resistor and one end of the sampling resistor, the second matching terminal and the fourth matching terminal are connected to the other end of the sampling resistor, and the group of matching terminals consists of four different matching terminals.
Further, equipment includes 2 load boxes, be equipped with 10 load resistance and 10 sampling resistor in the load box, be equipped with 10 group's cooperation terminals on the load box, be equipped with 20 in the rack and send the ware installation position, 10 redundant isolator installation positions of subsides and 10 receiver installation positions, be equipped with 10 group's binding post on the rack to and be used for connecting 10 first binding post and 10 second binding post of another load box.
Compared with the prior art, the utility model discloses following beneficial effect has:
(1) utilize the load box of rack and setting, accomplish a plurality of senders and the ageing test of carrying simultaneously of receiver, the principle is simple, saves energy consumption and raw and other materials, improves efficiency of software testing.
(2) A plurality of transmitter mounting positions, receiver mounting positions and attenuation redundancy isolator mounting positions are arranged in the machine cabinet, and a wiring terminal is arranged on the machine cabinet and used for being connected with a load box, so that the wire arrangement is convenient, and the operation is easy.
(3) The load box is internally provided with a plurality of groups of load resistors and a plurality of groups of sampling resistors, the sampling resistors are not only used for controlling the voltage of the attenuation redundant isolator, but also are connected with the load resistors in series to serve as the load of the transmitter, the structure is simple, and the load effect is good.
Drawings
Fig. 1 is a schematic structural diagram of the present invention.
Reference numerals: 1. high temperature environment adjusting device, 2, load box, 201, first cooperation terminal, 202, second cooperation terminal, 203, third cooperation terminal, 204, fourth cooperation terminal, 205, box, 3, rack, 301, first binding post, 302, second binding post, 303, third binding post, 304, fourth binding post, 4, the sender, 5, decay redundant isolator, 6, receiver, 601, main receiver, 602, and receiver, 7, load resistance, 8, sampling resistor.
Detailed Description
The present invention will be described in detail below with reference to the accompanying drawings and specific embodiments. The embodiment is implemented on the premise of the technical solution of the present invention, and a detailed implementation manner and a specific operation process are given, but the scope of the present invention is not limited to the following embodiments.
Example 1:
a high-temperature aging test device for a frequency shift pulse transmitter and a receiver has a specific structure shown in figure 1, a load box 2 and a cabinet 3 are placed in a high-temperature environment adjusting device 1, and a transmitter 4 and a receiver 6 to be tested are placed in the cabinet 3. The cabinet 3 further comprises a loss-reducing redundant isolator 5 connected with the receiver 6, and the receiver 6 comprises a main receiver 601 and a combined receiver 602 which are respectively connected with the loss-reducing redundant isolator 5.
The load box 2 is provided with a first mating terminal 201, a second mating terminal 202, a third mating terminal 203 and a fourth mating terminal 204, and one set of mating terminals is composed of four different mating terminals. The load resistor 7 and the sampling resistor 8 are arranged in the box body 205 of the load box 2, and the load resistor 7 is connected with the sampling resistor 8 in series. The first mating terminal 201 is connected to one end of the load resistor 7, the third mating terminal 203 is connected to the other end of the load resistor 7 and one end of the sampling resistor 8, and the second mating terminal 202 and the fourth mating terminal 204 are connected to the other end of the sampling resistor 8.
A first wiring terminal 301, a second wiring terminal 302, a third wiring terminal 303 and a fourth wiring terminal 304 are arranged on the cabinet 3, the first wiring terminal 301 and the second wiring terminal 302 are connected with the transmitter 4, the third wiring terminal 303 and the fourth wiring terminal 304 are connected with the attenuation redundancy isolator 5, and one group of wiring terminals comprise four different wiring terminals.
During testing, 20 transmitters 4, 10 attenuation redundant isolators 5 and 10 receivers 6 are placed in the cabinet 3, and 10 load resistors 7 and 10 sampling resistors 8 are respectively arranged in the two load boxes 2.
The 10 transmitters 4 are selected as main transmitters, the CAN address of the main transmitter is set as a standby address, and the system works in a standby mode. One transmitter 4 is connected to one first mating terminal 201 and one second mating terminal 202 of the load box 2 via one first connection terminal 301 and one second connection terminal 302 on the cabinet 3, up to 20 transmitters 4 all connected to two load boxes 2.
A dissipative redundant isolator 5 is connected to a third mating terminal 203 and a fourth mating terminal 204 of the load compartment 2 via a third connection terminal 303 and a fourth connection terminal 304 on the cabinet 3, until 10 dissipative redundant isolators 5 are all connected to the load compartment 2, either all to one load compartment 2 or both load compartments 2.
One receiver 6 includes one main receiver 601 and one parallel receiver 602, and 10 receivers 6 are connected to 10 attenuation redundant isolators 5, respectively.
The working state of the transmitter 4 is adjusted by the control device on the cabinet 3, the transmitter 4, the attenuation redundant isolator 5 and the receiver 5 start working, the temperature is adjusted by the high-temperature environment adjusting device 1, the transmitter 5 transmits a pulse signal, and the attenuation redundant isolator 5 processes the received signal and transmits the processed signal to the main receiver 601 and the receiver 602.
And after the preset test time is reached, observing whether the working states of the transmitter 4 and the receiver 6 are normal or not, and testing whether the transmitter 4 and the receiver 6 have faults or not by using the test bench.
Claims (4)
1. A high temperature burn-in test apparatus for frequency-shifted pulse transmitters and receivers, the transmitters (4) and receivers (6) being disposed within a cabinet (3), the apparatus comprising: load box (2) and be used for holding load box (2) and high temperature environment adjusting device (1) of rack (3), load box (2) includes: the power supply comprises a box body (205), a load resistor (7) and a sampling resistor (8) which are arranged in the box body (205), and a matching terminal used for connecting a wiring terminal on a cabinet (3), wherein the load resistor (7) is connected with the sampling resistor (8) in series, and the matching terminal is connected with the load resistor (7) and the sampling resistor (8) through a wire.
2. The high-temperature aging test equipment for the frequency shift pulse transmitter and receiver according to claim 1, characterized in that a decaying redundant isolator (5) is further arranged in the cabinet (3), and the decaying redundant isolator (5) is connected with the receiver (6).
3. The high-temperature aging test device for the frequency shift pulse transmitter and receiver is characterized in that the terminals are provided with four types, namely a first terminal (301), a second terminal (302), a third terminal (303) and a fourth terminal (304), the first terminal (301) and the second terminal (302) are connected with the transmitter (4), the third terminal (303) and the fourth terminal (304) are connected with the loss redundancy isolator (5), and one group of terminals consists of four different terminals;
the matching terminals are provided with four types, namely a first matching terminal (201), a second matching terminal (202), a third matching terminal (203) and a fourth matching terminal (204), the first matching terminal (201) is connected to one end of a load resistor (7), the third matching terminal (203) is connected to the other end of the load resistor (7) and one end of a sampling resistor (8), the second matching terminal (202) and the fourth matching terminal (204) are connected to the other end of the sampling resistor (8), and a group of matching terminals are composed of four different matching terminals.
4. The high-temperature aging test device for the frequency shift pulse transmitter and receiver according to claim 3, wherein the device comprises 2 load boxes (2), 10 load resistors (7) and 10 sampling resistors (8) are arranged in the load boxes (2), 10 groups of matching terminals are arranged on the load boxes (2), 20 transmitter mounting positions, 10 attenuation redundant isolator mounting positions and 10 receiver mounting positions are arranged in the cabinet (3), 10 groups of connecting terminals are arranged on the cabinet (3), and 10 first connecting terminals (301) and 10 second connecting terminals (302) are used for connecting another load box (2).
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CN202021853121.8U CN213181818U (en) | 2020-08-31 | 2020-08-31 | High-temperature aging test equipment for frequency shift pulse transmitter and receiver |
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CN202021853121.8U CN213181818U (en) | 2020-08-31 | 2020-08-31 | High-temperature aging test equipment for frequency shift pulse transmitter and receiver |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN113595835A (en) * | 2021-09-27 | 2021-11-02 | 北京全路通信信号研究设计院集团有限公司 | Ground equipment performance test system |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN113595835A (en) * | 2021-09-27 | 2021-11-02 | 北京全路通信信号研究设计院集团有限公司 | Ground equipment performance test system |
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