CN212965016U - Test panel suitable for different pin definitions - Google Patents
Test panel suitable for different pin definitions Download PDFInfo
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- CN212965016U CN212965016U CN202020491922.8U CN202020491922U CN212965016U CN 212965016 U CN212965016 U CN 212965016U CN 202020491922 U CN202020491922 U CN 202020491922U CN 212965016 U CN212965016 U CN 212965016U
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Abstract
The utility model relates to a module test technical field, concretely relates to survey test panel suitable for different pin definitions, include: a patch panel and a main board; the adapter plate comprises a first adapter interface and a second adapter interface, and pins of the first adapter interface and pins of the second adapter interface are defined as mirror images and share a row of pins; pins with the same definition in the first adapter interface and the second adapter interface are communicated through a circuit board lead; the pin of the first interface is connected with the module to be tested through a signal line to be tested; the mainboard comprises a third switching port, and the mainboard is detachably connected with the first switching port or the second switching port through the third switching port. When the to-be-tested modules with two different interfaces need to be tested, a user can select the first adapter interface or the second adapter interface which is matched with the adapter plate to conduct signal switching, the universality of the adapter plate is improved, only one adapter plate needs to be manufactured, and the manufacturing cost of the adapter plate is reduced.
Description
Technical Field
The utility model relates to a technical field of module test, concretely relates to survey test panel suitable for different pin definitions.
Background
Along with the rapid development of the mobile internet era, the labor cost is higher and higher, and the manual work of manufacturers for manufacturing products is changed into the machine automation. However, because the manufacturing cost of the jig is high, manual testing is still selected for manufacturing small batches of samples, and automatic testing is selected for large-batch production.
At present, there are two kinds of adapter boards, one is shown in fig. 1, the definition of PINs (PINs) switched from the motherboard is consistent with the interface of the motherboard (1 to 1, 2 to 2 … …), and the other is shown in fig. 2, the definition of PINs switched from the motherboard is mirrored with the interface of the motherboard (1 to 2, 2 to 1 … …). Each adapter plate is only suitable for one interface of a module to be tested, so that the universality of the adapter plate is poor, and the two adapter plates cannot be used as substitute materials; when two types of modules to be tested need to be tested, two adapter plates need to be manufactured, and manufacturing cost of the adapter plates is increased.
Therefore, the prior art has a technical problem of how to improve the universality of the adapter plate.
SUMMERY OF THE UTILITY MODEL
The utility model aims at providing a survey test panel suitable for different pin definitions to solve the technical problem who how to improve the keysets commonality among the prior art.
The embodiment of the utility model provides a following scheme:
in a first aspect, an embodiment of the present invention provides a test panel suitable for different pin definitions, include: a patch panel and a main board;
the adapter plate comprises a first adapter interface and a second adapter interface, and pins of the first adapter interface and pins of the second adapter interface are defined as mirror images and share a row of pins;
pins with the same definition in the first adapter interface and the second adapter interface are communicated through a circuit board lead;
the pin of the first interface is connected with the module to be tested through a signal line to be tested;
the mainboard comprises a third switching port, and the mainboard is detachably connected with the first switching port or the second switching port through the third switching port.
Preferably, a first row of pin definitions of the first adapter interface is the same as a second row of pin definitions of the second adapter interface, and the second row of pin definitions of the first adapter interface is the first row of pin definitions of the second adapter interface.
Preferably, the main board is provided with: and the plurality of test modules are electrically connected with the third adapter interface respectively.
Preferably, the main board is further provided with: a power supply module; the power module is connected with the test module.
Preferably, the test module is a fingerprint test module or a bluetooth test module.
Preferably, a connection interface is further disposed on the main board.
Preferably, the adapter plate is provided with: a plurality of locating holes.
Compared with the prior art, the utility model, following advantage and beneficial effect have:
the utility model discloses a survey test panel suitable for different pin definitions, include: the test board suitable for different pin definitions comprises: a patch panel and a main board; the adapter plate comprises a first adapter interface and a second adapter interface, and pins of the first adapter interface and pins of the second adapter interface are defined as mirror images and share a row of pins; pins with the same definition in the first adapter interface and the second adapter interface are communicated through a circuit board lead; the pin of the first interface is connected with the module to be tested through a signal line to be tested; the mainboard comprises a third switching port, and the mainboard is detachably connected with the first switching port or the second switching port through the third switching port. When the to-be-tested modules with two different interfaces need to be tested, a user can select the first adapter interface or the second adapter interface which is matched with the adapter plate to conduct signal switching, the universality of the adapter plate is improved, only one adapter plate needs to be manufactured, and the manufacturing cost of the adapter plate is reduced.
Drawings
In order to more clearly illustrate the embodiments of the present specification or the technical solutions in the prior art, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present specification, and it is obvious for those skilled in the art that other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a diagram illustrating the consistency of the definition of the motherboard and the pins of the interposer in the prior art;
FIG. 2 is a diagram illustrating a motherboard and interposer pin definition mirror image in the prior art;
FIG. 3 is a functional block diagram of a test board for different pin definitions according to an embodiment of the present invention;
fig. 4 is a schematic structural diagram of a test board suitable for different pin definitions according to an embodiment of the present invention.
The reference numbers illustrate:
| reference numerals | Name (R) | Reference numerals | Name (R) |
| 10 | |
20 | |
| 101 | |
201 | |
| 102 | |
202 | |
| 103 | Conducting |
30 | Module to be tested |
| 104 | Locating hole |
Detailed Description
The technical solution in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, rather than all embodiments, and all other embodiments obtained by those skilled in the art based on the embodiments of the present invention belong to the protection scope of the embodiments of the present invention.
First embodiment
Referring to fig. 3-4, the test board suitable for different pin definitions includes: the adapter board 10 and the main board 20; the motherboard 20 is used for testing the functions of the module to be tested 30, and the adapter board 10 is used for adapting the test signals between the motherboard 20 and the module to be tested 30.
The interposer 10 includes a first interposer 101 and a second interposer 102, where pins of the first interposer 101 and the second interposer 102 are defined as mirror images of each other and share a row of pins.
Further, a first row of pin definitions of the first adapter 101 is the same as a second row of pin definitions of the second adapter 102, and a second row of pins of the first adapter 101 is the first row of pins of the second adapter 102. For example, the pins of the first interposer 101 are divided into two rows in a left-to-right sequence, the pins of the second interposer 102 are also divided into two rows in a left-to-right sequence, and the first row of pins of the first interposer 101 and the second row of pins of the second interposer 102 have the same definition and are all 1, 3, 5, … …, and 15. The first adapter 101 and the second adapter 102 share a column of pins 2, 4, 6, … …, 16, which is both the second column of pins of the first adapter 101 and the first column of pins of the second adapter 102, wherein numerals 1, 2, 3, … …, 16, etc. represent definitions of pins, and the same numeral represents the same definition.
The same defined pins in the first adapter 101 and the second adapter 102 are connected through a circuit board wire 103. For example, as shown in fig. 4, pin "1" in the first interface 101 and pin "1" in the second interface 102 are connected through a circuit board wire 103, pin "3" in the first interface 101 and pin "3" in the second interface 102 are connected … … through a circuit board wire 103, pin "15" in the first interface 101 and pin "15" in the second interface 102 are connected through a circuit board wire 103, until the same defined pins in the first interface 101 and the second interface 102 are all connected through a circuit board wire 103. The pins defined in the first adapter 101 and the second adapter 102 are connected through a circuit board wire 103, and a row of pins is shared by the first adapter 101 and the second adapter 102, so that a signal received by the first adapter 101 can be transmitted to the second adapter 102, and a signal received by the second adapter 102 can be transmitted to the first adapter 101, thereby realizing signal transmission between the first adapter 101 and the second adapter 102.
The pins of the first interface 101 are connected to the module to be tested 30 through the signal lines to be tested, so that the test signals are transferred to the module to be tested 30 through the first interface 101.
The main board 20 includes a third adapter 201, the main board 20 is detachably connected to the first adapter 101 or the second adapter 102 through the third adapter 201, and a user selects an adapter matching with an interface of the module to be tested 30 from the first adapter 101 and the second adapter 102 according to actual requirements for testing. When the interface of the module to be tested 30 is matched with the first adapter 101, the motherboard 20 is detachably connected to the first adapter 101 through the third adapter 201, and the test signal of the motherboard 20 is transferred to the signal line to be tested through the first adapter 101 and transmitted to the module to be tested 30 through the signal line to be tested. When the interface of the module to be tested 30 is matched with the second adapter interface 102, the motherboard 20 is detachably connected to the second adapter interface 102 through the third adapter interface 201, and the test signal of the motherboard 20 is transferred to the first adapter interface 101 through the second adapter interface 102, transmitted to the signal line to be tested through the first adapter interface 101, and transmitted to the module to be tested 30 through the signal line to be tested. In this embodiment, when the to-be-tested module 30 with two different interfaces needs to be tested, a user can select the first adapter 101 or the second adapter 102 adapted to the adapter board 10 to perform signal switching, so that the versatility of the adapter board 10 is improved, and only one adapter board 10 needs to be manufactured, thereby reducing the manufacturing cost of the adapter board 10.
Further, the main board 20 is provided with: a plurality of test modules 202, a plurality of test modules 202 with third interface 201 electricity is connected respectively, be provided with the functional circuit that tests a certain function in the test module 202, this function corresponds to the function of awaiting measuring module 30, the test module is fingerprint test module or bluetooth test module, is used for testing fingerprint module or bluetooth module's function respectively. For example, when the module to be tested 30 is a fingerprint module, the testing module 202 is provided with a functional circuit for testing a fingerprint acquisition function, a fingerprint identification function, and an extended function module (e.g., a lock driving module). The integration of the test module 202 as the functional circuit of the test board determines the test functions that can be implemented by the test board, and in the specific implementation, the test module 202 with the adapted function is selected according to the function of the module to be tested 30.
Further, still be provided with on the mainboard: a power supply module; the power module is connected with the test modules and used for providing power for the test modules.
Furthermore, the main board is further provided with a connection interface for plugging the module to be tested on the adapter board, and when the adapter board is connected with the main board, the main board is plugged on the test host, so that the test host can test the module to be tested.
Further, the adapter plate 10 is provided with: the number of the positioning holes 104 is preferably three, so that the board surface is saved, the positioning effect can be realized in the testing process, and the online test is facilitated.
The technical scheme provided in the embodiment of the application at least has the following technical effects or advantages:
in this embodiment, the test board suitable for different pin definitions includes: the adapter board 10 and the main board 20; the interposer 10 includes a first adapter 101 and a second adapter 102, where pins of the first adapter 101 and the second adapter 102 are defined as mirror images of each other and share a row of pins; the pins defined in the first adapter 101 and the second adapter 102 are connected through a circuit board wire 103; the pins of the first interface 101 are connected with the module to be tested 30 through signal lines to be tested; the main board 20 includes a third adapter 201, and the main board 20 is detachably connected to the first adapter 101 or the second adapter 102 through the third adapter 201. When the two different interfaces of the module to be tested 30 need to be tested, a user can select the first adapter 101 or the second adapter 102 adapted to the adapter board 10 to perform signal transfer, so that the universality of the adapter board 10 is improved, and only one adapter board 10 needs to be manufactured, thereby reducing the manufacturing cost of the adapter board 10.
It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
The above embodiment numbers of the present invention are only for description, and do not represent the advantages and disadvantages of the embodiments.
The use of the words first, second, third, etc. do not denote any order, but rather the words are to be construed as names.
The above is only the preferred embodiment of the present invention, and not the scope of the present invention, all the equivalent structures or equivalent flow changes made by the contents of the specification and the drawings or the direct or indirect application in other related technical fields are included in the patent protection scope of the present invention.
While the preferred embodiments of the present invention have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. It is therefore intended that the appended claims be interpreted as including the preferred embodiment and all such alterations and modifications as fall within the scope of the invention.
It will be apparent to those skilled in the art that various changes and modifications may be made without departing from the spirit and scope of the invention. Thus, if such modifications and variations of the present invention fall within the scope of the claims and their equivalents, the present invention is also intended to include such modifications and variations.
Claims (7)
1. A test board suitable for different pin definitions, comprising: a patch panel and a main board;
the adapter plate comprises a first adapter interface and a second adapter interface, and pins of the first adapter interface and pins of the second adapter interface are defined as mirror images and share a row of pins;
pins with the same definition in the first adapter interface and the second adapter interface are communicated through a circuit board lead;
the pin of the first interface is connected with the module to be tested through a signal line to be tested;
the mainboard comprises a third switching port, and the mainboard is detachably connected with the first switching port or the second switching port through the third switching port.
2. The test board according to claim 1, wherein the first row of pin definitions of the first adapter interface is the same as the second row of pin definitions of the second adapter interface, and the second row of pin definitions of the first adapter interface is the first row of pin definitions of the second adapter interface.
3. The test board suitable for different pin definitions according to claim 2, wherein the main board is provided with: and the plurality of test modules are electrically connected with the third adapter interface respectively.
4. The test board suitable for different pin definitions according to claim 3, wherein the main board further comprises: a power supply module;
the power module is connected with the test module.
5. The test board for different pin definitions according to claim 3, wherein the test module is a fingerprint test module or a Bluetooth test module.
6. The test board suitable for different pin definitions according to any one of claims 1-4, wherein the motherboard further comprises a connection interface.
7. The test board for different pin definitions according to any of claims 1-4, wherein the interposer is provided with: a plurality of locating holes.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020491922.8U CN212965016U (en) | 2020-04-07 | 2020-04-07 | Test panel suitable for different pin definitions |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020491922.8U CN212965016U (en) | 2020-04-07 | 2020-04-07 | Test panel suitable for different pin definitions |
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| Publication Number | Publication Date |
|---|---|
| CN212965016U true CN212965016U (en) | 2021-04-13 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202020491922.8U Active CN212965016U (en) | 2020-04-07 | 2020-04-07 | Test panel suitable for different pin definitions |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113848463A (en) * | 2021-11-02 | 2021-12-28 | 北京京瀚禹电子工程技术有限公司 | Testing device and assembly line for impedance and diode characteristics of circuit board pins |
-
2020
- 2020-04-07 CN CN202020491922.8U patent/CN212965016U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113848463A (en) * | 2021-11-02 | 2021-12-28 | 北京京瀚禹电子工程技术有限公司 | Testing device and assembly line for impedance and diode characteristics of circuit board pins |
| CN113848463B (en) * | 2021-11-02 | 2022-06-28 | 北京京瀚禹电子工程技术有限公司 | Testing device and assembly line for impedance and diode characteristics of circuit board pins |
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Address after: No.3, Taihong Road, Kunshan high tech Industrial Development Zone, Suzhou, Jiangsu Province, 215300 Patentee after: Kunshan Qiuti Microelectronics Technology Co.,Ltd. Address before: No.3, Taihong Road, Kunshan high tech Industrial Development Zone, Suzhou, Jiangsu Province, 215300 Patentee before: KUNSHAN Q TECHNOLOGY Co.,Ltd. |