CN212905260U

CN212905260U - IGBT module frequency sweep test bench

Info

Publication number: CN212905260U
Application number: CN202021409941.8U
Authority: CN
Inventors: 杨种南
Original assignee: Heritage Electronic Technology Jiangsu Co ltd
Current assignee: Heritage Electronic Technology Jiangsu Co ltd
Priority date: 2020-07-16
Filing date: 2020-07-16
Publication date: 2021-04-06
Anticipated expiration: 2030-07-16

Abstract

The utility model discloses a IGBT module frequency sweep testboard, including test stage body, brace table, put thing platform, frequency sweep test piece and positioning mechanism, one side on test stage body top is fixed with a brace table, and the turning position department of test stage body bottom all is fixed with the support column, the top of brace table is provided with puts the thing platform, and all is provided with positioning mechanism on the outer wall of putting thing platform both sides, the top of putting the thing platform is provided with the frequency sweep test piece, and the bottom of frequency sweep test piece all is fixed with equidistant test column, the brace table top of putting thing platform one side is fixed with the mount, and the top of mount is fixed with the cylinder, the output of cylinder and the top fixed connection of frequency sweep test piece, be fixed with control panel on the outer wall of mount one side. The utility model discloses the skew of IGBT module when not only having reduced the test has improved the efficiency of software testing of IGBT module, has improved the accurate nature of test moreover.

Description

IGBT module frequency sweep test bench

Technical Field

The utility model relates to a IGBT frequency sweep test technical field specifically is an IGBT module frequency sweep testboard.

Background

An IGBT and an insulated gate bipolar transistor are composite fully-controlled voltage-driven power semiconductor devices composed of BJTs (bipolar junction transistors) and MOS (insulated gate field effect transistors), have the advantages of both high input impedance of the MOSFET and low conduction voltage drop of GTR, the GTR saturation voltage is reduced, the current-carrying density is high, the driving current is high, the MOSFET driving power is low, the switching speed is high, the conduction voltage drop is high, the current-carrying density is low, the IGBT integrates the advantages of the two devices, the driving power is low, the saturation voltage is reduced, and in the production process of an IGBT module, frequency sweep testing needs to be carried out on the IGBT module to reduce the reject ratio of products, so that the frequency sweep testing platform of the IGBT module is needed.

The frequency scanning test tables on the market are various in types and can basically meet the use requirements of people, but certain defects still exist, and the following problems exist.

(1) The existing sweep frequency test bench is inconvenient for positioning the IGBT module during use, and the IGBT module is easy to deviate during test, so that the test result has errors, and certain defects exist;

(2) when the existing frequency sweep test bench is used, the next IGBT module can be tested only after the previous IGBT module is tested, so that the testing efficiency is greatly reduced;

(3) when the existing frequency sweep test bench is used, deviation easily occurs in the movement of the frequency sweep test block, so that the test is not accurate enough, and an improved space exists.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a IGBT module frequency sweep testboard to propose the frequency sweep testboard in solving above-mentioned background art and squint easily when using IGBT module, the efficiency of test remains to improve and test not accurate enough problem.

In order to achieve the above object, the utility model provides a following technical scheme: the utility model provides a IGBT module frequency sweep testboard, includes the test stage body, a supporting bench, puts thing platform, frequency sweep test block and positioning mechanism, one side on test stage body top is fixed with a supporting bench, and the corner position department of test stage body bottom all is fixed with the support column, a supporting bench's top is provided with puts the thing platform, and all is provided with positioning mechanism on the outer wall of putting thing platform both sides, the top of putting the thing platform is provided with the frequency sweep test block, and the bottom of frequency sweep test block all is fixed with equidistant test column, a supporting bench top of putting thing platform one side is fixed with the mount, and the top of mount is fixed with the cylinder, the output of cylinder and the top fixed connection of frequency sweep test block, be fixed with control panel on the outer wall of mount one side, and the input electric connection of the inside singlechip of control panel and cylinder.

Preferably, one side on brace table top all is provided with the slide rail, and the inside sliding connection of slide rail has the slider, the top of slider and the bottom fixed connection who puts the thing platform for the supplementary sliding work who puts the thing platform.

Preferably, be fixed with spacing lug on the outer wall of putting thing platform one side, and articulated on the supporting bench outer wall of spacing lug position department have the activity location to press from both sides to the inside that the activity location pressed from both sides is provided with spacing hole, and spacing hole and spacing lug are mutually supported, are convenient for fix the position of putting the thing platform.

Preferably, the mount top of cylinder both sides all is provided with the round hole, and the inside of round hole is provided with the gag lever post to the top of gag lever post extends to the top of mount and is fixed with the fixed block, the bottom of gag lever post with extend to the below of mount and with the top fixed connection of frequency sweep test block, be convenient for restrict the moving range of frequency sweep test block.

Preferably, screw hole, location splint, actuating lever, threaded rod and connecting block have been set gradually to positioning mechanism's inside, and the both sides of putting the thing platform inside all are provided with the screw hole for the rotation work of supplementary threaded rod.

Preferably, the threaded hole position department puts and is provided with the actuating lever on the thing platform outer wall, and the top of actuating lever extends to the top of putting the thing platform and is fixed with the locating splint, is convenient for carry out the centre gripping location to the IGBT module.

Preferably, the internal thread of screw hole is connected with the threaded rod, and the one end of threaded rod extends to the outside of screw hole and is equipped with the connecting block with the cover, and the top of connecting block and the bottom fixed connection of actuating lever are convenient for promote the removal of location splint.

Compared with the prior art, the beneficial effects of the utility model are that: the IGBT module frequency sweep test bench not only reduces the deviation of the IGBT module during testing, improves the testing efficiency of the IGBT module, but also improves the testing accuracy;

(1) the IGBT module is clamped by the positioning clamping plate, so that the positioning function of the IGBT module is realized, and the deviation of the IGBT module during testing is reduced;

(2) the object placing table at the top end of the supporting table can be provided with a plurality of groups of objects not shown in the drawing, after the last IGBT module is tested, the object placing table can be slid to drive the sliding block to slide in the sliding rail, the object placing table is moved to the position below the sweep frequency testing block, the limiting protruding block is clamped into the limiting hole in the movable positioning clamp on the outer wall of the supporting table, the position of the object placing table is fixed, the next IGBT module is tested rapidly, and therefore the testing efficiency of the IGBT module is improved;

(3) through being provided with round hole, gag lever post and fixed block, the gag lever post on frequency sweep test block top slides in the round hole at mount top, and round hole and gag lever post are mutually supported, restrict the moving range of frequency sweep test block, and the fixed block restricts the moving range of gag lever post simultaneously to the precision of test has been improved.

Drawings

FIG. 1 is a schematic sectional view of the present invention;

fig. 2 is a schematic top view of the supporting table of the present invention;

fig. 3 is an enlarged schematic structural view of a point a in fig. 1 according to the present invention;

fig. 4 is an enlarged schematic structural view of the utility model at the position B in fig. 1;

fig. 5 is an enlarged schematic view of the positioning mechanism of the present invention.

In the figure: 1. a test bench body; 2. a support table; 3. a support pillar; 4. a placing table; 5. a frequency sweep test block; 6. a fixed mount; 7. a cylinder; 8. a control panel; 9. testing the column; 10. a positioning mechanism; 1001. a threaded hole; 1002. positioning the clamping plate; 1003. a drive rod; 1004. a threaded rod; 1005. connecting blocks; 11. a movable positioning clamp; 12. a slide rail; 13. a slider; 14. a limiting hole; 15. a limiting bump; 16. a circular hole; 17. a limiting rod; 18. and (5) fixing blocks.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1-5, the present invention provides an embodiment: a frequency sweep test bench for an IGBT module comprises a test bench body 1, a support table 2, an object placing table 4, a frequency sweep test block 5 and a positioning mechanism 10, wherein the support table 2 is fixed on one side of the top end of the test bench body 1, and support columns 3 are fixed at corner positions of the bottom end of the test bench body 1;

one side of the top end of the support table 2 is provided with a slide rail 12, the slide rail 12 is connected with a slide block 13 in a sliding manner, and the top end of the slide block 13 is fixedly connected with the bottom end of the object placing table 4 and is used for assisting the sliding operation of the object placing table 4;

the top end of the support table 2 is provided with a placing table 4, and the outer walls of two sides of the placing table 4 are provided with positioning mechanisms 10;

a threaded hole 1001, a positioning clamp plate 1002, a driving rod 1003, a threaded rod 1004 and a connecting block 1005 are sequentially arranged in the positioning mechanism 10, threaded holes 1001 are formed in two sides of the interior of the object placing table 4, the driving rod 1003 is arranged on the outer wall of the object placing table 4 at the position of the threaded hole 1001, the top end of the driving rod 1003 extends to the upper side of the object placing table 4 and is fixedly provided with the positioning clamp plate 1002, the threaded rod 1004 is connected with the interior of the threaded hole 1001 in a threaded manner, one end of the threaded rod 1004 extends to the exterior of the threaded hole 1001 and is sleeved with the connecting block 1005, and the top end;

the threaded rod 1004 rotates in the threaded hole 1001 by rotating the threaded rod 1004, the threaded rod 1004 drives the driving rod 1003 to move through the connecting block 1005 so that the driving rod 1003 slowly approaches the object placing table 4 and pushes the positioning clamp plate 1002 to move at the top end of the object placing table 4, and the IGBT module is clamped by the positioning clamp plate 1002, so that the positioning function of the IGBT module is realized, and the deviation of the IGBT module during testing is reduced;

a limiting lug 15 is fixed on the outer wall of one side of the object placing table 4, a movable positioning clamp 11 is hinged on the outer wall of the supporting table 2 at the position of the limiting lug 15, a limiting hole 14 is formed in the movable positioning clamp 11, and the limiting hole 14 is matched with the limiting lug 15, so that the position of the object placing table 4 can be conveniently fixed;

a sweep frequency testing block 5 is arranged above the object placing table 4, testing columns 9 with equal intervals are fixed at the bottom end of the sweep frequency testing block 5, a fixing frame 6 is fixed at the top end of the supporting table 2 at one side of the object placing table 4, an air cylinder 7 is fixed at the top of the fixing frame 6, the type of the air cylinder 7 can be SC160-25, and the output end of the air cylinder 7 is fixedly connected with the top end of the sweep frequency testing block 5;

the top parts of the fixing frames 6 on the two sides of the cylinder 7 are provided with round holes 16, the round holes 16 are internally provided with limit rods 17, the top ends of the limit rods 17 extend to the upper part of the fixing frames 6 and are fixed with fixing blocks 18, and the bottom ends of the limit rods 17 extend to the lower part of the fixing frames 6 and are fixedly connected with the top ends of the sweep frequency testing blocks 5, so that the moving range of the sweep frequency testing blocks 5 is limited conveniently;

the outer wall of the fixing frame 6 on one side is fixed with a control panel 8, the type of the control panel 8 can be DL203, and the output end of the singlechip in the control panel 8 is electrically connected with the input end of the air cylinder 7.

The working principle is as follows: when the device is used, a worker firstly places an IGBT module to be tested on the surface of the object placing table 4, then the IGBT module is rotated in the threaded hole 1001 by rotating the threaded rod 1004, the threaded rod 1004 drives the driving rod 1003 to move through the connecting block 1005 so as to be slowly close to the object placing table 4 and push the positioning clamp plate 1002 to move on the top end of the object placing table 4, the IGBT module is clamped by the positioning clamp plate 1002, thereby realizing the positioning function of the IGBT module, reducing the deviation of the IGBT module during testing, then the control panel 8 is operated to control the cylinder 7 to work, the cylinder 7 drives the sweep frequency testing block 5 to move downwards, the testing column 9 at the bottom end of the sweep frequency testing block 5 carries out sweep frequency testing on the IGBT module, in the process that the sweep frequency testing block 5 moves downwards, the limiting rod 17 at the top end of the sweeping frequency testing block 5 slides in the round hole 16 at the top of the fixing frame 6, and the round, the moving range of the sweep frequency test block 5 is limited, meanwhile, the moving range of the limiting rod 17 is limited by the fixing block 18, the test accuracy is improved, finally, the object placing table 4 on the top end of the support table 2 can be provided with a plurality of groups of objects not shown in the drawing, after the last IGBT module is tested, the object placing table 4 can be slid to drive the sliding block 13 to slide in the sliding rail 12, the object placing table 4 is moved to the lower part of the sweep frequency test block 5, the limiting lug 15 is clamped into the limiting hole 14 in the movable positioning clamp 11 on the outer wall of the support table 2, the position of the object placing table 4 is fixed, the next IGBT module is rapidly tested, the test efficiency of the IGBT module is improved, and the work of the IGBT module sweep frequency test table is completed.

It is obvious to a person skilled in the art that the invention is not restricted to details of the above-described exemplary embodiments, but that it can be implemented in other specific forms without departing from the spirit or essential characteristics of the invention. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.

Claims

1. The utility model provides a IGBT module frequency sweep testboard, includes test bench body (1), brace table (2), puts thing platform (4), frequency sweep test piece (5) and positioning mechanism (10), its characterized in that: a supporting table (2) is fixed on one side of the top end of the testing table body (1), supporting columns (3) are fixed at the corners of the bottom end of the testing table body (1), an object placing table (4) is arranged at the top end of the supporting table (2), and the outer walls of the two sides of the object placing table (4) are both provided with a positioning mechanism (10), a sweep frequency testing block (5) is arranged above the object placing table (4), and the bottom ends of the sweep frequency test blocks (5) are all fixed with test columns (9) with equal spacing, a fixed mount (6) is fixed at the top end of the supporting platform (2) at one side of the object placing platform (4), and the top of the fixed frame (6) is fixed with an air cylinder (7), the output end of the air cylinder (7) is fixedly connected with the top end of the sweep frequency testing block (5), a control panel (8) is fixed on the outer wall of one side of the fixed frame (6), and the output end of the singlechip in the control panel (8) is electrically connected with the input end of the air cylinder (7).

2. A frequency sweep test stand for an IGBT module according to claim 1 wherein: one side on brace table (2) top all is provided with slide rail (12), and the inside sliding connection of slide rail (12) has slider (13), the top of slider (13) and the bottom fixed connection of putting thing platform (4).

3. A frequency sweep test stand for an IGBT module according to claim 1 wherein: the outer wall of one side of the object placing table (4) is fixed with a limiting lug (15), the outer wall of the supporting table (2) at the position of the limiting lug (15) is hinged with a movable positioning clamp (11), a limiting hole (14) is formed in the movable positioning clamp (11), and the limiting hole (14) is matched with the limiting lug (15).

4. A frequency sweep test stand for an IGBT module according to claim 1 wherein: the top of the fixing frame (6) on two sides of the cylinder (7) is provided with a round hole (16), a limiting rod (17) is arranged inside the round hole (16), the top end of the limiting rod (17) extends to the upper portion of the fixing frame (6) and is fixed with a fixing block (18), and the bottom end of the limiting rod (17) is fixedly connected with the top end of the sweep frequency testing block (5) and extends to the lower portion of the fixing frame (6).

5. A frequency sweep test stand for an IGBT module according to claim 1 wherein: threaded holes (1001), a positioning clamping plate (1002), a driving rod (1003), a threaded rod (1004) and a connecting block (1005) are sequentially arranged in the positioning mechanism (10), and the threaded holes (1001) are formed in two sides of the inner portion of the object placing table (4).

6. A IGBT module sweep frequency test bench according to claim 5, characterized in that: the outer wall of the object placing table (4) at the position of the threaded hole (1001) is provided with a driving rod (1003), and the top end of the driving rod (1003) extends to the upper part of the object placing table (4) and is fixed with a positioning clamp plate (1002).

7. A IGBT module sweep frequency test bench according to claim 6, characterized in that: the internal thread of screw hole (1001) is connected with threaded rod (1004), and the one end of threaded rod (1004) extends to the outside of screw hole (1001) and is equipped with connecting block (1005) in the cover, the top of connecting block (1005) and the bottom fixed connection of actuating lever (1003).