CN212706302U - Multifunctional clamp for optical device - Google Patents

Multifunctional clamp for optical device Download PDF

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Publication number
CN212706302U
CN212706302U CN202021130892.4U CN202021130892U CN212706302U CN 212706302 U CN212706302 U CN 212706302U CN 202021130892 U CN202021130892 U CN 202021130892U CN 212706302 U CN212706302 U CN 212706302U
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CN
China
Prior art keywords
conducting plate
temperature measuring
plate
heat conducting
mounting
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Active
Application number
CN202021130892.4U
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Chinese (zh)
Inventor
徐鹏嵩
郭孝明
朱晶
张文刚
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Suzhou Lianxun Instrument Co ltd
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Stelight Instrument Inc
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Priority to CN202021130892.4U priority Critical patent/CN212706302U/en
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Abstract

The utility model discloses a multifunctional clamp for optical devices, which comprises a base plate, a test socket, a heat conducting plate, a PCB plate and a cover plate, wherein the PCB plate is positioned below the base plate, the heat conducting plate and the cover plate are arranged above the base plate, the test socket is arranged on the base plate, a device to be tested is arranged between the heat conducting plate and the cover plate, and the device to be tested passes through the heat conducting plate and is electrically connected with the test socket; the heat conducting plate is provided with a convex block, the substrate and the PCB are provided with a first through hole and a second through hole, and the convex block passes through the first through hole and the second through hole and extends out of the second through hole; the heat conducting plate is provided with a mounting through hole, the inner wall of the mounting through hole is provided with a flange part, and a device to be tested is mounted in the mounting through hole; one end of the heat conducting plate is provided with a temperature measuring circuit board, the heat conducting plate is also provided with a temperature measuring groove, and a temperature measuring sensor is arranged in the temperature measuring groove. The utility model discloses both improved the efficiency of software testing to the device, guaranteed the stability and the precision to the device test, guaranteed the homogeneity to the heat-conducting plate heating again.

Description

Multifunctional clamp for optical device
Technical Field
The utility model relates to a multifunctional clamp for optical device belongs to optical communication test technical field.
Background
At present, TO tests in the industry only have normal temperature test clamps, TO high-temperature and low-temperature batch test clamps do not exist, the speed of a TO packaged laser reaches 25G and 50G along with the development of optical communication, high-speed commercial TO needs high-temperature and low-temperature tests, no adaptive batch clamp is available in the industry at present, the existing scheme is single chip testing, the temperature control precision is high, but the batch production efficiency is low, and the TO high-temperature and low-temperature batch test clamps cannot be compatible with aging equipment.
SUMMERY OF THE UTILITY MODEL
The utility model aims at providing a multi-functional anchor clamps for optical device, it has both improved the efficiency of software testing to the device, has guaranteed the stability and the precision to the device test, has guaranteed the homogeneity to the heat-conducting plate heating again.
In order to achieve the above purpose, the utility model adopts the technical scheme that: a multifunctional clamp for an optical device comprises a base plate, a plurality of test sockets, a heat conducting plate, a PCB and a cover plate, wherein the PCB is positioned below the base plate, the heat conducting plate and the cover plate are sequentially arranged above the base plate, the test sockets are respectively arranged on the base plate and are electrically connected with the PCB, a device to be tested is arranged between the heat conducting plate and the cover plate, and the lower end of the device to be tested penetrates through the heat conducting plate to be electrically connected with the test sockets;
the lower surface of the heat conducting plate is provided with a plurality of convex blocks at intervals, the substrate and the PCB are respectively provided with a plurality of first through holes and second through holes corresponding to the convex blocks, and the lower ends of the convex blocks sequentially penetrate through the first through holes and the second through holes and extend out of the second through holes;
the upper surface of the heat conducting plate is provided with a plurality of mounting through holes corresponding to the test socket, the inner wall of the upper part of the mounting through hole is provided with a flange part which extends inwards in the radial direction, and the device to be tested is mounted in the mounting through hole and is in contact connection with the upper surface of the flange part;
the temperature measurement circuit board is arranged at one end of the lower surface of the heat conduction plate, the plurality of temperature measurement grooves are formed in the lower surface of the heat conduction plate, and temperature measurement sensors electrically connected with the temperature measurement circuit board are respectively installed in the plurality of temperature measurement grooves.
The further improved scheme in the technical scheme is as follows:
1. in the scheme, the two sides of the mounting through hole are respectively provided with a strip-shaped groove communicated with the mounting through hole.
2. In the above scheme, the lower surface of the heat conducting plate is provided with a mounting groove, and the temperature measuring circuit board is embedded in the mounting groove.
3. In the above scheme, the mounting groove is respectively communicated with the plurality of temperature measuring grooves.
4. In the scheme, the lengths of the temperature measuring grooves are different.
5. In the above scheme, the number of the temperature measuring grooves is 8.
Because of above-mentioned technical scheme's application, compared with the prior art, the utility model have the following advantage:
1. the utility model discloses a multi-functional anchor clamps for optical device, it is through adopting the multilayer design, and structural design is ingenious, when possessing good compatibility, but most normal atmospheric temperature of adaptation, aging testing system, can place many examination devices that await measuring, can also be applicable to multiple test mode such as high temperature ageing, low temperature test, normal atmospheric temperature test, high temperature test, has improved efficiency of software testing, reduce cost to the device greatly.
2. The utility model discloses a multifunctional clamp for optical device, it not only is convenient for place the device, but also can cooperate with the apron to realize the fixed to the device to guarantee to the stability and the precision of device test; due to the arrangement of the strip-shaped grooves, devices in the mounting through holes can be taken and placed conveniently, and the testing efficiency is improved; through a plurality of temperature measurement sensors, the temperature of different positions of the heat conducting plate is monitored in real time, and is fed back to the temperature controller, so that the heating uniformity of the heat conducting plate is ensured, and the precision and the repeatability of the device test are improved.
Drawings
FIG. 1 is a schematic structural view of a multifunctional clamp for optical devices according to the present invention;
FIG. 2 is a first schematic diagram of the heat conducting plate of the present invention;
FIG. 3 is a schematic diagram of a second heat-conducting plate structure of the present invention;
figure 4 is the utility model discloses installation through-hole structure sketch map.
In the above drawings: 1. a substrate; 101. a first through hole; 2. a test socket; 3. a heat conducting plate; 301. a bump; 4. a PCB board; 401. a second through hole; 5. a cover plate; 6. mounting a through hole; 601. a flange portion; 7. a strip-shaped groove; 8. a temperature measuring circuit board; 9. a temperature measuring tank; 10. a device to be tested; 11. a temperature measuring sensor; 12. and installing a groove.
Detailed Description
In the description of this patent, it is noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like, indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience in describing the present invention and simplifying the description, but do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore should not be construed as limiting the present invention; the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance; furthermore, unless expressly stated or limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, as they may be fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The meaning of the above terms in this patent may be specifically understood by those of ordinary skill in the art.
Example 1: a multifunctional clamp for an optical device comprises a base plate 1, a plurality of test sockets 2, a heat-conducting plate 3, a PCB 4 and a cover plate 5, wherein the PCB 4 is positioned below the base plate 1, the heat-conducting plate 3 and the cover plate 5 are sequentially arranged above the base plate 1, the test sockets 2 are respectively arranged on the base plate 1 and are electrically connected with the PCB 4, a device to be tested 10 is arranged between the heat-conducting plate 3 and the cover plate 5, and the lower end of the device to be tested 10 penetrates through the heat-conducting plate 3 and is electrically connected with the test sockets 2;
a plurality of bumps 301 are arranged on the lower surface of the heat conducting plate 3 at intervals, a plurality of first through holes 101 and second through holes 401 corresponding to the bumps 301 are respectively formed on the substrate 1 and the PCB 4, and the lower ends of the bumps 301 sequentially penetrate through the first through holes 101 and the second through holes 401 and extend out of the second through holes 401; the upper surface of the heat conducting plate 3 is provided with a plurality of mounting through holes 6 corresponding to the test socket 2, the inner wall of the upper part of the mounting through hole 6 is provided with a flange part 601 which extends inwards in the radial direction, and the device to be tested 10 is mounted in the mounting through hole 6 and is in contact connection with the upper surface of the flange part 601; one end of the lower surface of the heat conducting plate 3 is provided with a temperature measuring circuit board 8, the lower surface of the heat conducting plate 3 is also provided with a plurality of temperature measuring grooves 9, and temperature measuring sensors 11 electrically connected with the temperature measuring circuit board 8 are respectively arranged in the plurality of temperature measuring grooves 9.
Two sides of the mounting through hole 6 are respectively provided with a strip-shaped groove 7 communicated with the mounting through hole 6; the lower surface of the heat conducting plate 3 is provided with a mounting groove 12, and the temperature measuring circuit board 8 is embedded and mounted in the mounting groove 12.
Example 2: a multifunctional clamp for an optical device comprises a base plate 1, a plurality of test sockets 2, a heat-conducting plate 3, a PCB 4 and a cover plate 5, wherein the PCB 4 is positioned below the base plate 1, the heat-conducting plate 3 and the cover plate 5 are sequentially arranged above the base plate 1, the test sockets 2 are respectively arranged on the base plate 1 and are electrically connected with the PCB 4, a device to be tested 10 is arranged between the heat-conducting plate 3 and the cover plate 5, and the lower end of the device to be tested 10 penetrates through the heat-conducting plate 3 and is electrically connected with the test sockets 2;
a plurality of bumps 301 are arranged on the lower surface of the heat conducting plate 3 at intervals, a plurality of first through holes 101 and second through holes 401 corresponding to the bumps 301 are respectively formed on the substrate 1 and the PCB 4, and the lower ends of the bumps 301 sequentially penetrate through the first through holes 101 and the second through holes 401 and extend out of the second through holes 401; the upper surface of the heat conducting plate 3 is provided with a plurality of mounting through holes 6 corresponding to the test socket 2, the inner wall of the upper part of the mounting through hole 6 is provided with a flange part 601 which extends inwards in the radial direction, and the device to be tested 10 is mounted in the mounting through hole 6 and is in contact connection with the upper surface of the flange part 601; one end of the lower surface of the heat conducting plate 3 is provided with a temperature measuring circuit board 8, the lower surface of the heat conducting plate 3 is also provided with a plurality of temperature measuring grooves 9, and temperature measuring sensors 11 electrically connected with the temperature measuring circuit board 8 are respectively arranged in the plurality of temperature measuring grooves 9.
The mounting grooves 12 are respectively communicated with the plurality of temperature measuring grooves 9; the lengths of the temperature measuring grooves 9 are different; the number of the temperature measuring grooves 9 is 8.
When the multifunctional clamp for the optical device is adopted, the multifunctional clamp adopts a multilayer design, has ingenious structural design, has good compatibility, can be adapted to most normal-temperature and aging test systems, can be used for placing a plurality of devices to be tested, and can be suitable for various test modes such as high-temperature aging, low-temperature test, normal-temperature test, high-temperature test and the like, thereby greatly improving the test efficiency of the devices and reducing the cost;
in addition, the device can be conveniently placed, and can be fixed by matching with the cover plate, so that the stability and the precision of the device test are ensured; due to the arrangement of the strip-shaped grooves, devices in the mounting through holes can be taken and placed conveniently, and the testing efficiency is improved; through a plurality of temperature measurement sensors, the temperature of different positions of the heat conducting plate is monitored in real time, and is fed back to the temperature controller, so that the heating uniformity of the heat conducting plate is ensured, and the precision and the repeatability of the device test are improved.
The above embodiments are only for illustrating the technical concept and features of the present invention, and the purpose of the embodiments is to enable people skilled in the art to understand the contents of the present invention and to implement the present invention, which cannot limit the protection scope of the present invention. All equivalent changes and modifications made according to the spirit of the present invention should be covered by the protection scope of the present invention.

Claims (6)

1. A multifunctional clamp for optical devices is characterized in that: the testing device comprises a base plate (1), a plurality of testing sockets (2), a heat-conducting plate (3), a PCB (4) and a cover plate (5), wherein the PCB (4) is positioned below the base plate (1), the heat-conducting plate (3) and the cover plate (5) are sequentially arranged above the base plate (1), the plurality of testing sockets (2) are respectively arranged on the base plate (1) and are electrically connected with the PCB (4), a device to be tested (10) is arranged between the heat-conducting plate (3) and the cover plate (5), and the lower end of the device to be tested (10) penetrates through the heat-conducting plate (3) and is electrically connected with the testing sockets (2);
a plurality of bumps (301) are arranged on the lower surface of the heat conducting plate (3) at intervals, a plurality of first through holes (101) and second through holes (401) corresponding to the bumps (301) are respectively formed in the substrate (1) and the PCB (4), and the lower ends of the bumps (301) sequentially penetrate through the first through holes (101) and the second through holes (401) and extend out of the second through holes (401);
the upper surface of the heat conducting plate (3) is provided with a plurality of mounting through holes (6) corresponding to the test socket (2), the inner wall of the upper part of the mounting through hole (6) is provided with a flange part (601) extending inwards in the radial direction, and the device to be tested (10) is mounted in the mounting through hole (6) and is in contact connection with the upper surface of the flange part (601);
one end of the lower surface of the heat conducting plate (3) is provided with a temperature measuring circuit board (8), the lower surface of the heat conducting plate (3) is also provided with a plurality of temperature measuring grooves (9), and temperature measuring sensors (11) electrically connected with the temperature measuring circuit board (8) are respectively arranged in the plurality of temperature measuring grooves (9).
2. The multi-functional fixture for light devices of claim 1, further comprising: and strip-shaped grooves (7) communicated with the mounting through holes (6) are respectively formed in two sides of the mounting through holes (6).
3. The multi-functional fixture for light devices of claim 1, further comprising: the lower surface of the heat conducting plate (3) is provided with a mounting groove (12), and the temperature measuring circuit board (8) is embedded and mounted in the mounting groove (12).
4. The multi-functional fixture for light devices of claim 3, characterized in that: the mounting grooves (12) are respectively communicated with the temperature measuring grooves (9).
5. The multi-functional fixture for light devices of claim 1, further comprising: the lengths of the temperature measuring grooves (9) are different.
6. The multi-functional fixture for light devices of claim 1, further comprising: the number of the temperature measuring grooves (9) is 8.
CN202021130892.4U 2020-06-17 2020-06-17 Multifunctional clamp for optical device Active CN212706302U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202021130892.4U CN212706302U (en) 2020-06-17 2020-06-17 Multifunctional clamp for optical device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202021130892.4U CN212706302U (en) 2020-06-17 2020-06-17 Multifunctional clamp for optical device

Publications (1)

Publication Number Publication Date
CN212706302U true CN212706302U (en) 2021-03-16

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN202021130892.4U Active CN212706302U (en) 2020-06-17 2020-06-17 Multifunctional clamp for optical device

Country Status (1)

Country Link
CN (1) CN212706302U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114690815A (en) * 2022-03-08 2022-07-01 深圳大学 High-temperature constant-temperature heating device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114690815A (en) * 2022-03-08 2022-07-01 深圳大学 High-temperature constant-temperature heating device

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Address after: Building 5, No. 1508, Xiangjiang Road, Suzhou High-tech Zone, Suzhou City, Jiangsu Province 215129

Patentee after: Suzhou Lianxun Instrument Co.,Ltd.

Address before: 215011 Building 5, no.1508 Xiangjiang Road, high tech Zone, Suzhou City, Jiangsu Province

Patentee before: STELIGHT INSTRUMENT Inc.