CN212514675U

CN212514675U - Test probe and electronic equipment

Info

Publication number: CN212514675U
Application number: CN202020884038.0U
Authority: CN
Inventors: 盘龙; 戴路; 许维全
Original assignee: Shanghai Dianlian Xusheng Communication Technology Co ltd
Current assignee: Shanghai Dianlian Xusheng Communication Technology Co ltd
Priority date: 2020-05-22
Filing date: 2020-05-22
Publication date: 2021-02-09
Anticipated expiration: 2030-05-22

Abstract

The utility model provides a test probe and electronic equipment relates to signal test technical field, the utility model provides a test probe, include: the probe comprises an insulating part and a metal part, wherein the insulating part is inserted with the probe, and the metal part is arranged on the insulating part and is isolated from the probe by the insulating part. The utility model provides a test probe can shield external interference through the metalwork, and can form ground circuit through metalwork ground connection to the technical problem of the high frequency resonance of signal to be measured is alleviated to the signal of this protection probe, makes test probe be applicable to the high frequency signal test.

Description

Test probe and electronic equipment

Technical Field

The utility model belongs to the technical field of the signal test technique and specifically relates to a test probe and electronic equipment are related to.

Background

When a multi-channel signal is tested, a plurality of metal probes are installed by adopting the insulating socket and are connected with an object to be tested through the metal probes, so that a tested signal is obtained. In the test process, the socket lacks stable ground connection, and can not shield the influence of external electromagnetic environment to the metal probe. When the high-frequency signal passes through the probe, resonance can be generated, and therefore the high-frequency performance of the signal to be detected is subjected to misdetection.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a test probe to alleviate the technical problem that high frequency signal can produce the resonance through the probe among the prior art.

In a first aspect, the present invention provides a test probe, including: the probe inserting device comprises an insulating part inserted with a probe and a metal part installed on the insulating part;

the metal piece is isolated from the probe by the insulator.

In combination with the first aspect, the present invention provides a first possible implementation manner of the first aspect, wherein the metal member is used to connect with a grounding terminal of the object to be tested.

With reference to the first possible implementation manner of the first aspect, the present invention provides a second possible implementation manner of the first aspect, wherein the metal member is mounted at an end of the insulating member close to the object to be measured;

and under the condition that the test end of the probe is contacted with the object to be tested, the metal piece is abutted against the grounding end of the object to be tested.

In combination with the first aspect, the present invention provides a third possible implementation manner of the first aspect, wherein the metal member is configured to be connected to the grounding end of the adaptor, and the adaptor is connected to an end of the probe deviating from the testing end.

In combination with the third possible implementation manner of the first aspect, the present invention provides a fourth possible implementation manner of the first aspect, wherein the adaptor is configured as an adaptor plate.

In combination with the third possible implementation manner of the first aspect, the present invention provides a fifth possible implementation manner of the first aspect, wherein the adaptor is configured as a patch cord.

In combination with the first aspect, the present invention provides a sixth possible implementation manner of the first aspect, wherein the metal member includes a first block and a second block that are isolated from each other, and an object-to-be-tested mounting area is formed between the first block and the second block.

With reference to the sixth possible implementation manner of the first aspect, the present invention provides a seventh possible implementation manner of the first aspect, wherein the insulating member is provided with a first notch for mounting the first block and a second notch for mounting the second block;

when the first block body is arranged in the first notch and the second block body is arranged in the second notch, the end faces of the first block body, the second block body and the insulating part are flush.

With reference to the seventh possible implementation manner of the first aspect, the present invention provides an eighth possible implementation manner of the first aspect, wherein the inner side of the first block body has a first groove, and the inner side of the second block body has a second groove;

one end of the object to be measured is matched with the first groove, and the other end of the object to be measured is matched with the second groove.

In combination with the first aspect, the present invention provides a ninth possible implementation manner of the first aspect, wherein the metal member is configured as an annular structure, and an object-to-be-tested installation area is formed inside the annular structure.

In combination with the first aspect, the present invention provides a tenth possible implementation manner of the first aspect, wherein the probe is extendable into or retractable from the test object mounting area.

In combination with the ninth possible implementation manner of the first aspect, the present invention provides an eleventh possible implementation manner of the first aspect, wherein the insulating member is provided with an embedding slot for installing the metal member, the metal member is installed in the embedding slot, and the end surface of the metal member is flush with the end surface of the insulating member.

In a second aspect, the present invention provides an electronic device configured with a test probe provided by the first aspect.

The embodiment of the utility model provides a following beneficial effect has been brought: the metal piece is arranged on the insulating piece inserted with the probe, can shield external interference, and can form a grounding loop through the grounding of the metal piece, so that the signal of the probe is protected, the technical problem that the high-frequency signal to be tested generates resonance through the probe is relieved, and the test probe is suitable for high-frequency signal testing.

In order to make the aforementioned and other objects, features and advantages of the present invention comprehensible, preferred embodiments accompanied with figures are described in detail below.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention or the related art, the drawings required to be used in the description of the embodiments or the related art will be briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.

Fig. 1 is an exploded view of a test probe and an object to be tested according to an embodiment of the present invention;

fig. 2 is a cross-sectional view of a test probe and an object to be tested according to an embodiment of the present invention;

fig. 3 is a first bottom view of the test probe and the object to be tested provided by the embodiment of the present invention;

fig. 4 is an exploded view of a test probe and an object to be tested according to an embodiment of the present invention;

fig. 5 is a second bottom view of the test probe and the object to be tested provided by the embodiment of the present invention;

fig. 6 is a schematic view of a test probe according to an embodiment of the present invention.

Icon: 100-an insulator; 200-a metal part; 210-a first block; 220-a second block; 300-a probe; 400-an adaptor; 1' -analyte.

Detailed Description

The technical solution of the present invention will be described clearly and completely with reference to the accompanying drawings, and obviously, the described embodiments are some, but not all embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplification of description, but do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance. The term "physical quantity" in the formula, unless otherwise noted, is understood to mean a basic quantity of a basic unit of international system of units, or a derived quantity derived from a basic quantity by a mathematical operation such as multiplication, division, differentiation, or integration.

In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.

At present, when different terminals of a test probe transmit signals with different frequencies, the signals are easily interfered, and particularly, when a multi-channel high-frequency signal test is carried out, the high-frequency signals generate resonance through a probe, so that the high-frequency performance of the signals to be tested is subjected to misdetection. Wherein the high frequency signals comprise radio wave signals between 3MHz and 30MHz and the low frequency signals comprise radio wave signals less than 3 MHz.

Example one

As shown in fig. 1, the embodiment of the present invention provides a test probe, including: an insulating member 100 in which the probe 300 is inserted and a metal member 200 mounted to the insulating member 100; the metal piece 200 is isolated from the probe 300 by the insulating member 100.

Wherein, a plurality of probes 300 are installed in the insulating member 100, the plurality of probes 300 are arranged in parallel and at intervals, and any two adjacent probes 300 are isolated by the insulating member 100 to realize the insulation between the adjacent probes.

The probe 300 is installed in the insulating member 100, and the metal member 200 is embedded in the insulating member 100. The metal piece 200 can be grounded to form a complete grounding loop, and the grounded metal piece 200 can protect signals transmitted by the probe 300, so that the signal transmission quality is stable, and the test probe is suitable for high-frequency signal detection.

Regarding the scheme of forming a complete grounding loop by grounding the metal piece 200, specifically: the metal element 200 may be connected to the ground terminal of the object 1', or the metal element 200 is connected to the ground terminal of the adaptor 400.

In the first mode, the metal element 200 is connected to the ground terminal of the object 1':

referring to fig. 2 and fig. 3, the metal member 200 is disposed at the end of the lower side (direction z) of the insulating member 100, and the middle of the metal member 200 has an installation space for installing the object 1 ', when the object 1' is installed in the installation space, the sidewall of the object 1 'is abutted against the inner sidewall of the metal member, in this case, the grounding terminal of the object 1' can be disposed on the sidewall thereof, and when the sidewall of the object is in contact with the inner sidewall of the metal member, the conduction of the grounding loop is realized.

As shown in fig. 1, 2, 3 and 4, the metal element 200 is mounted at the end of the insulating element 100 near the object 1' to be measured; in a state where the test end of the probe 300 contacts the object 1 ', the metal member 200 contacts the ground end of the object 1'. The test end of the probe 300 is connected with the object 1 'to be tested, meanwhile, the metal piece 200 is contacted with the grounding end of the object 1' to be tested, and the metal piece 200 is grounded to form a grounding loop during signal test, so that the metal piece 200 is grounded without independent wiring, wiring steps can be simplified, and the convenience of signal test is improved. In addition, the metal element 200 can be connected to the ground terminal of the object 1 'through a wire, so that the metal element 200, the wire and the ground terminal of the object 1' form a ground loop.

In the second method, the metal member 200 is connected to the ground terminal of the adaptor 400:

referring to fig. 1 and 4, the metal member 200 is used to connect to a ground terminal of the adapter 400, and the adapter 400 is connected to an end of the probe 300 facing away from the testing terminal. The metal member 200 is connected to the ground terminal of the adaptor 400 through a wire, and the metal member 200, the wire and the ground terminal of the adaptor 400 form a ground loop.

In the third mode, the grounding end of the adaptor 400 and the grounding end of the object to be tested 1' are respectively connected with the metal piece 200:

referring to fig. 5 and 6, the metal member 200 is wrapped outside the insulating member 100, and one end of the metal member 200 extends in a direction away from the testing end and is connected to the grounding end of the adaptor 400; the other end of the metal piece 200 extends to the test end and is connected to the ground end of the object 1 'to be tested, and the ground end of the adapter 400, the metal piece 200 and the ground end of the object 1' to be tested form a ground loop.

In the embodiment of the present invention, the probe 300 is connected to the adaptor 400, and the metal member 200 is connected to the grounding end of the adaptor 400.

Specifically, the probe 300 extends from one end of the insulating member 100 and is used for abutting against the object 1' to be tested; the adaptor 400 is located at the other end of the insulating member 100, the adaptor 400 is connected to the probe 300, and the signal to be detected can be transmitted to the adaptor 400 through the probe 300. The grounding end of the adaptor 400 is connected to the metal member 200, and the signal transmitted by the probe 300 is protected by the grounded metal member 200. The adaptor 400 is used to connect to a signal testing device, and the signal of the object 1' to be tested is transmitted to the signal testing device through the probe 300 and the adaptor 400, and is further processed by the signal testing device.

The adaptor 400 referred to above is described in detail below:

as shown in fig. 1, in one embodiment, the adapter 400 is provided as an adapter plate.

The adapter plate is connected to the end of the insulating member 100 away from the object 1' to be tested, and the probe 300 is externally connected with a signal testing device through the adapter plate. The probes 300 are respectively connected to the adapter plate, multi-channel test signals are integrated through the adapter plate, and the signal test equipment is connected with the adapter plate to achieve multi-channel signal acquisition.

As shown in fig. 4, the transition piece 400 is provided as a transition line.

The plurality of patch cords are connected with the plurality of probes 300 in a one-to-one correspondence manner, the plurality of patch cords extend in a direction away from the object to be tested 1', and the probes 300 can be externally connected with signal testing equipment through the patch cords. In addition, the ends of the patch cord may be connected to a connector that mates with the signal testing equipment to connect the patch cord to the signal testing equipment.

The shape and structure of the metal piece 200 is explained in detail below:

as shown in fig. 1, 2, 3 and 4, the metal part 200 includes a first block 210 and a second block 220 isolated from each other, the first block 210 and the second block 220 are respectively mounted on the insulating member 100, and an object-to-be-tested mounting region is formed between the first block 210 and the second block 220.

Specifically, the first block 210 and the second block 220 are respectively used for connecting the ground terminals of the object to be tested 1', or the first block 210 and the second block 220 are respectively connected to the ground terminals of the adaptor 400. The probe 300 is located between the first block 210 and the second block 220, and is grounded together through the first block 210 and the second block 220, and forms a ground loop respectively, so that the first block 210 and the second block 220 prevent the probe 300 from being interfered by the outside together, and further ensure the stability and reliability of the high-frequency signal transmitted by the probe 300.

In one embodiment, the first block 210 and the second block 220 form an dut mounting area therebetween.

Specifically, the object 1 ' is inserted into the object mounting region between the first block 210 and the second block 220, and the object 1 ' is contacted with the testing end of the probe 300, so as to test the signal of the object 1 ' through the probe 300. The slot formed between the first block 210 and the second block 220 is used as an object mounting area, and the object 1 'to be tested is inserted into the slot, so that the test probe is stably butted with the object 1' to be tested. The contact part of the object to be tested 1 'and the probe 300 is positioned between the first block 210 and the second block 220, and the first block 210 and the second block 220 are respectively grounded, so that the contact part of the object to be tested 1' and the probe 300 can be prevented from being interfered by the outside, and the signal stability is further ensured.

As shown in fig. 1, 3 and 4, the insulating member 100 is provided with a first notch for mounting the first block 210 and a second notch for mounting the second block 220; in a state where the first block 210 is mounted in the first gap and the second block 220 is mounted in the second gap, the end surfaces of the first block 210, the second block 220, and the insulating member 100 are flush. The first block 210 and the second block 220 are respectively embedded into the insulating member 100, the insulating member 100 and the metal member 200 form a socket, and the socket is grounded through the metal member 200, so that the socket has a stable ground loop.

Preferably, the first block 210 has a first groove on the inner side, and the second block 220 has a second groove on the inner side; one end of the object to be measured 1' is matched with the first groove, and the other end is matched with the second groove. One end of the object to be tested 1 ' is inserted into the first groove, the other end of the object to be tested is inserted into the second groove, and the inner side wall of the first groove and the inner side wall of the second groove are respectively attached to the side walls of the object to be tested 1 ', so that the object to be tested 1 ' is ensured to be stably matched between the first groove and the second groove.

In another embodiment, referring to fig. 5, the metal member 200 is configured as a ring structure, and the inside of the ring structure forms an object mounting area.

As shown in fig. 2 and fig. 5, the metal member 200 is enclosed to form an object mounting area with a rectangular cross section, the object 1 'is inserted into the object mounting area, and the probe 300 contacts with the object 1'. The probe 300 and the object 1' to be tested are surrounded by the metal piece 200, and are grounded through the metal piece 200 to form a grounding loop, so that external interference can be shielded, resonance can be avoided, and the test probe can be suitable for testing high-frequency signals. The insulating member 100 is provided with an embedding groove matched with the annular structure, the metal member 200 is installed in the embedding groove, and the end surface of the metal member 200 is flush with the end surface of the insulating member 100, so that the metal member 200 is tightly embedded in the insulating member 100. The socket is formed by the insulating part 100 and the metal part 200 together, and is grounded by the metal part 200, so that the socket has a stable grounding loop, resonance generated when a plurality of probes 300 in the socket transmit high-frequency signals is avoided, and stable signal transmission quality is ensured.

As shown in fig. 1 and 2, the probe 300 may extend into or retract from the object mounting area. An object mounting area is formed between the first block 210 and the second block 220, and the probe 300 is extended and retracted relative to the insulating member 100, so that the testing end is extended into or retracted from the object mounting area. When the object 1 'is engaged in the object mounting region, the probe 300 can contact the object 1' for signal detection.

In summary, the test probe has the following technical advantages:

1. the metal part 200 is embedded in the insulating part 100, a socket is formed by the insulating part 100 and the metal part 200 together, and a complete grounding loop can be formed by grounding the metal part 200;

2. the metal piece 200 can be connected with the grounding end of the object to be tested 1' and also can be connected with the grounding end of the adapter piece 400, so that the wiring and the testing are convenient;

3. external interference can be shielded by grounding the metal member 200, and resonance of high-frequency signals generated by the probe 300 can be avoided, so that the test probe can be suitable for multi-channel high-frequency signal test.

Example two

The utility model provides a pair of electronic equipment, this electronic equipment dispose above-mentioned test probe. The electronic device may be a mobile phone, a computer, or a signal detector.

Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present invention.

Claims

1. A test probe, comprising: an insulating member (100) in which a probe (300) is inserted and a metal member (200) mounted to the insulating member (100);

the metal piece (200) is isolated from the probe (300) by the insulator (100).

2. Test probe according to claim 1, characterized in that the metallic element (200) is intended to be connected to a ground terminal of the test object (1').

3. The test probe according to claim 2, characterized in that said metallic element (200) is mounted at the end of said insulating element (100) close to said object (1');

and under the condition that the testing end of the probe (300) is contacted with the object to be tested (1 '), the metal piece (200) is abutted against the grounding end of the object to be tested (1').

4. Test probe according to claim 1 or 2, characterized in that the metal piece (200) is intended to be connected to a ground terminal of an adapter piece (400), the adapter piece (400) being connected to an end of the probe (300) facing away from the test terminal.

5. The test probe according to claim 4, wherein the adapter (400) is provided as an adapter plate.

6. The test probe according to claim 4, wherein the transition piece (400) is provided as a transition wire.

7. The test probe according to claim 1, wherein the metallic member (200) comprises a first block (210) and a second block (220) isolated from each other, the first block (210) and the second block (220) forming an object mounting area therebetween.

8. The test probe according to claim 7, wherein the insulator (100) is provided with a first indentation for mounting the first block (210) and a second indentation for mounting the second block (220);

under the state that the first block body (210) is installed in the first gap and the second block body (220) is installed in the second gap, the end surfaces of the first block body (210), the second block body (220) and the insulating piece (100) are flush.

9. The test probe according to claim 8, wherein the first block (210) has a first groove on an inner side thereof and the second block (220) has a second groove on an inner side thereof;

one end of the object to be detected (1') is matched with the first groove, and the other end of the object to be detected is matched with the second groove.

10. The test probe according to claim 1, wherein the metallic member (200) is provided as a ring-shaped structure, and an interior of the ring-shaped structure forms an object mounting area.

11. The test probe according to claim 7 or 10, wherein the probe (300) is extendable into or retractable from the test object mounting area.

12. The test probe according to claim 10, wherein the insulating member (100) is provided with an insert groove for mounting the metal member (200), and an end surface of the metal member (200) is flush with an end surface of the insulating member (100) in a state where the metal member (200) is mounted in the insert groove.

13. An electronic device, characterized in that the electronic device is provided with a test probe according to any of claims 1-12.