CN211954261U - Intelligent test instrument - Google Patents
Intelligent test instrument Download PDFInfo
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- CN211954261U CN211954261U CN202021002750.XU CN202021002750U CN211954261U CN 211954261 U CN211954261 U CN 211954261U CN 202021002750 U CN202021002750 U CN 202021002750U CN 211954261 U CN211954261 U CN 211954261U
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Abstract
The utility model relates to an intelligent test instrument, include: a master processor; the power supply module is connected with the main control processor and used for providing working voltage; the probe detection module is connected with the main control processor and used for carrying out data testing, and comprises a plurality of test probes detachably connected with the main control processor; the control module is connected with the main control processor and is used for carrying out function selection control; and the display module is connected with the main control processor and used for displaying the detection parameters. The probe testing module is controlled by the control module to perform detection actions, the testing probe sends detection data to the main control processor, the testing result is displayed through the display module after calculation and processing are performed by the main control processor, different testing requirements are met by replacing different testing probes, different instrument tools are not needed, the size of an instrument is reduced, and the convenience in use is improved.
Description
Technical Field
The utility model relates to an electronic test instrument technical field, in particular to intelligent test instrument.
Background
Various testing instrument tools such as universal meters, oscilloscopes, signal generators, load instruments and the like are used in the processes of scientific research, teaching, experiments and the like, the instruments are single in function and large in size, different instruments need to be replaced when different testing works are carried out, and the use process is troublesome.
SUMMERY OF THE UTILITY MODEL
In order to solve the technical problem, the utility model provides an intelligent test instrument has the advantage that uses more conveniently.
In order to achieve the above purpose, the technical scheme of the utility model is as follows:
an intelligent test instrument, comprising:
a master processor for performing data processing;
the power supply module is connected with the main control processor and used for providing working voltage;
the probe detection module is connected with the main control processor and used for carrying out data testing, and comprises a plurality of test probes detachably connected with the main control processor;
the control module is connected with the main control processor and is used for carrying out function selection control; and the number of the first and second groups,
and the display module is connected with the main control processor and is used for displaying the detection parameters.
Realize above-mentioned technical scheme, during the use, provide operating voltage for main control processor through power module, because probe detection module includes a plurality of test probes of dismantling the connection with main control processor, consequently can select corresponding test probe to be connected with main control processor according to the demand of test, test module carries out the detection action through controlling module control probe, test probe will detect data transmission to main control processor, calculate through main control processor, show test result through display module after handling, the person of facilitating the use obtains test result, satisfy different test demands through changing different test probes, and need not to use different instrument and tool, the volume of instrument has been reduced, improve the convenience of use.
As a preferred aspect of the present invention, the test probe includes: a power output probe for realizing power output control, a signal generation probe for realizing signal generation, a parameter test probe for realizing circuit parameter detection, a device test probe for realizing electronic device characteristic detection, an optical measurement probe for realizing optical characteristic detection, an acoustic test probe for realizing acoustic characteristic detection, an object test probe for realizing object characteristic detection, a load adjustment probe for realizing load connection, an analysis test probe for realizing logic analysis, a gas test probe for realizing gas characteristic detection, a liquid test probe for realizing liquid characteristic detection, an electromagnetic wave test probe for realizing electromagnetic wave detection, a waveform test probe for realizing oscillometric detection, a trajectory test probe for realizing object movement trajectory detection, a bacteria test probe for realizing bacteria characteristic detection, a power supply control system, a power, And the wind test probe is used for realizing wind characteristic detection.
The technical scheme is realized, the adjustment of voltage, current and power output by the power supply, the selection of direct current and alternating current output and the selection of positive power supply or negative power supply can be realized through the power supply output probe;
the function of a signal generator is realized through a signal generating probe, different waveforms can be generated, and the pulse width and the amplitude of the waveforms are adjusted;
the function of the multimeter is realized through the parameter test probe, the voltage, current, power and current types of other electronic equipment can be measured, and the detected signals are converted into signals to be processed by the main control processor and are sent to the main control processor;
the device test probe can detect the conventional resistance value, high-frequency impedance, capacitance value, inductance value, diode characteristic, triode characteristic, MOS characteristic, crystal characteristic, battery characteristic and the like of the electronic device, converts test data into signals needing to be processed by the main control processor and sends the signals to the main control processor;
the detection of light characteristics such as illuminance, light intensity, light color spectrum, light wavelength, light temperature and the like is realized through the light measurement probe, and test data is converted into a signal to be processed by the main control processor and is sent to the main control processor;
the sound test probe can detect parameters such as frequency, decibel and sound type of sound, convert test data into signals to be processed by the main control processor and send the signals to the main control processor for audio curve analysis and audio data analysis;
the height, depth, inclination, area size, volume size, surface smoothness, hardness, internal shape, external shape and other data of the object can be detected through the object test probe, and the test data is converted into signals required to be processed by the main control processor and sent to the main control processor;
the load adjusting probe is used as a target load required by the tested equipment, and the load parameters can be manually or automatically adjusted;
the function of the logic analyzer is realized by analyzing the test probe, and all detected buses such as I2C, UART, I2S, RS232, RS485, SPI, CAN, USB and the like or other logic states CAN be sent to a main control processor;
the gas test probe can detect the gas characteristics such as the type, concentration, pressure or intensity, PH value, temperature and danger degree of the gas, and converts the test data into signals to be processed by the main control processor and sends the signals to the main control processor;
the liquid testing probe can detect the liquid characteristics such as the type, the depth or the height of the liquid, the density, the hydraulic pressure, the temperature and the PH value of the liquid, and converts the test data into signals to be processed by the main control processor and sends the signals to the main control processor;
the electromagnetic wave test probe can detect the frequency, carrier type, intensity, harmful electromagnetic wave, harmless electromagnetic wave and other electromagnetic wave characteristics of the electromagnetic wave, converts the test data into a signal to be processed by the main control processor and sends the signal to the main control processor.
The function of the oscilloscope is realized through the waveform test probe, and various detected waveform signals are sent to the main control processor.
The track test probe can detect the front-back, left-right, upper-lower, left-right two-dimensional space motion track of an object and the front-back, left-right, upper-lower three-dimensional space motion track of the object, converts test data into signals to be processed by the main control processor and sends the signals to the main control processor;
the bacterial test probe can detect the bacterial species, the bacterial density, the characteristics of harmful or harmless bacteria and other bacteria, converts test data into signals to be processed by the main control processor and sends the signals to the main control processor;
the wind test probe can detect wind characteristics such as wind speed, wind power and the like, converts test data into signals needing to be processed by the main control processor and sends the signals to the main control processor.
As a preferred embodiment of the present invention, the control module is connected to the main control processor by one or more of the following structures: the device comprises a wired connection module, a Bluetooth module, a WiFi module, a Zigbee module, a nonstandard 2.4G module, a 3G module, a 4G module, a 5G module or a UHF module.
As an optimal scheme of the utility model, display module chooses for use one or more in LCD screen, OLED screen, E-ink screen, cell-phone, panel computer or PC.
As an optimized scheme of the utility model, probe detection module with the master control treater carries out communication connection through wired connection or wireless connection mode.
As an optimized scheme of the utility model, the master control treater still is connected with the communication interface module, passes through between the different intelligent test instrument communication interface module interconnect.
As an optimized scheme of the utility model, the master control treater still is connected with the simulation function module, the simulation function module is used for carrying out the simulation parameter test.
To sum up, the utility model discloses following beneficial effect has:
the embodiment of the utility model provides a through providing an intelligent test instrument, include: a master processor for performing data processing; the power supply module is connected with the main control processor and used for providing working voltage; the probe detection module is connected with the main control processor and used for carrying out data testing, and comprises a plurality of test probes detachably connected with the main control processor; the control module is connected with the main control processor and is used for carrying out function selection control; and the display module is connected with the main control processor and used for displaying the detection parameters. During the use, provide operating voltage for the main control processor through power module, because probe detection module includes a plurality of test probes of dismantling the connection with the main control processor, consequently can select corresponding test probe and be connected with the main control processor according to the demand of test, detect the action through control module control probe test module, test probe sends detected data to the main control processor, calculate through the main control processor, show the test result through display module after handling, the person of facilitating the use acquires the test result, satisfy different test demands through changing different test probes, and need not to use different instrument, the volume of instrument has been reduced, improve the convenience of use.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is an exploded view of an embodiment of the present invention.
Fig. 2 is a schematic structural diagram of an embodiment of the present invention.
The corresponding part names indicated by the numbers and letters in the drawings:
1. a master processor; 11. a communication interface module; 12. a simulation function module; 2. a power supply module; 3. a probe detection module; 4. a control module; 5. and a display module.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.
Examples
An intelligent test instrument, as shown in fig. 1 and 2, comprising: a main control processor 1 for performing data processing; the power supply module 2 is connected with the main control processor 1 and used for providing working voltage; the probe detection module 3 is connected with the main control processor 1 and used for carrying out data testing, and the probe detection module 3 comprises a plurality of test probes detachably connected with the main control processor 1; a control module 4 connected with the main control processor 1 and used for carrying out function selection control; and a display module 5 connected with the main control processor 1 and used for displaying the detection parameters.
Specifically, the power module 2 comprises a strong current power supply and a battery power supply, the strong current power supply is preferentially used when the strong current power supply and the battery power supply are simultaneously selected, the battery power supply is used only when the strong current power supply is turned off, meanwhile, the battery power supplies can be connected with each other, and long-time use of the equipment is facilitated when the equipment is out.
The test probe comprises: a power output probe for realizing power output control, a signal generation probe for realizing signal generation, a parameter test probe for realizing circuit parameter detection, a device test probe for realizing electronic device characteristic detection, an optical measurement probe for realizing optical characteristic detection, an acoustic test probe for realizing acoustic characteristic detection, an object test probe for realizing object characteristic detection, a load adjustment probe for realizing load connection, an analysis test probe for realizing logic analysis, a gas test probe for realizing gas characteristic detection, a liquid test probe for realizing liquid characteristic detection, an electromagnetic wave test probe for realizing electromagnetic wave detection, a waveform test probe for realizing oscillometric detection, a trajectory test probe for realizing object movement trajectory detection, a bacteria test probe for realizing bacteria characteristic detection, a power supply control system, a power, And the wind test probe is used for realizing wind characteristic detection.
The adjustment of voltage, current and power output by the power supply, the selection of direct current and alternating current output and the selection of positive power supply or negative power supply output can be realized through the power supply output probe;
the function of a signal generator is realized through a signal generating probe, different waveforms can be generated, and the pulse width and the amplitude of the waveforms are adjusted;
the function of the multimeter is realized through the parameter test probe, the voltage, current, power and current types of other electronic equipment can be measured, and the detected signals are converted into signals to be processed by the main control processor 1 and are sent to the main control processor 1;
the device test probe can detect the conventional resistance value, high-frequency impedance, capacitance value, inductance value, diode characteristic, triode characteristic, MOS characteristic, crystal characteristic, battery characteristic and the like of the electronic device, converts test data into signals needing to be processed by the main control processor 1 and sends the signals to the main control processor 1;
the detection of the light characteristics such as illuminance, light intensity, light color spectrum, light wavelength, light temperature and the like is realized through the light measurement probe, and the test data is converted into a signal to be processed by the main control processor 1 and is sent to the main control processor 1;
the sound test probe can detect parameters such as frequency, decibel and sound type of sound, convert the test data into signals to be processed by the main control processor 1 and send the signals to the main control processor 1 for audio curve analysis and audio data analysis;
the height, depth, inclination, area size, volume size, surface smoothness, hardness, internal shape, external shape and other data of the object can be detected through the object test probe, and the test data is converted into signals to be processed by the main control processor 1 and sent to the main control processor 1;
the load adjusting probe is used as a target load required by the tested equipment, and the load parameters can be manually or automatically adjusted;
the function of the logic analyzer is realized by analyzing the test probe, and all detected buses such as I2C, UART, I2S, RS232, RS485, SPI, CAN, USB and the like or other logic states CAN be sent to the main control processor 1;
the gas test probe can detect the gas characteristics such as the type, concentration, pressure or intensity, PH value, temperature and danger degree of the gas, and converts the test data into signals to be processed by the main processor 1 and sends the signals to the main processor 1;
the liquid testing probe can detect the liquid characteristics such as the type, the depth or the height of the liquid, the density of the liquid, the hydraulic pressure, the temperature of the liquid, the pH value of the liquid and the like, converts the test data into a signal which needs to be processed by the main control processor 1 and sends the signal to the main control processor 1;
the electromagnetic wave test probe can detect the frequency, carrier type, intensity of electromagnetic wave, and the characteristics of electromagnetic wave such as harmful electromagnetic wave or harmless electromagnetic wave, and converts the test data into a signal to be processed by the main control processor 1 and sends the signal to the main control processor 1.
The function of the oscilloscope is realized through the waveform test probe, and various detected waveform signals are sent to the main control processor 1.
The two-dimensional space motion trail of the object in front, back, left, right, up, down, left and right or the three-dimensional space motion trail of the object in front, back, left, right, up and down can be detected through the trail test probe, and test data are converted into signals which need to be processed by the main control processor 1 and are sent to the main control processor 1;
the bacterial test probe can detect the bacterial species, the bacterial density, the characteristics of harmful or harmless bacteria and other bacteria, converts test data into signals to be processed by the main processor 1 and sends the signals to the main processor 1;
the wind test probe can detect wind characteristics such as wind speed, wind power and the like, converts test data into signals needing to be processed by the main control processor 1 and sends the signals to the main control processor 1.
The control module 4 is connected with the main control processor 1 by adopting one or more of the following structures: the system comprises a wired connection module, a Bluetooth module, a WiFi module, a Zigbee module, a non-standard 2.4G module, a 3G module, a 4G module, a 5G module or a UHF module; the control module 4 may be selectively controlled in a touch control mode, such as a resistive touch mode, a capacitive touch mode, a pressure touch mode, or a voice control mode, or controlled by a mobile phone, a tablet computer, or a PC.
The probe detection module 3 and the main control processor 1 can also be in communication connection in a wired connection or wireless connection mode according to requirements.
Furthermore, the main control processor 1 is further connected with a communication interface module 11, different intelligent test instruments are connected with each other through the communication interface module 11, for some large-scale test projects and projects, a set of intelligent test instruments is difficult to test a whole set of projects, different main control processors 1 are connected with each other through the communication interface module 11, and relevant program software is configured to realize that each intelligent test instrument detects a certain parameter in the projects and performs collaborative linkage analysis with parameters detected by other intelligent test instruments, so that problems and key links can be quickly found, in the embodiment, collaborative linkage analysis functions are connected through a low-delay network, and the system can be a special network, a 4 th generation mobile communication network, a 5 th generation mobile communication network and the like.
Further, the main control processor 1 is further connected with a simulation function module 12, the simulation function module 12 is used for performing simulation parameter testing, the simulation function module 12 is used for performing function simulation, field simulation and specific environment simulation on circuits designed by designers and pre-researchers, principle frameworks, PCB frameworks and the like can be carried in the simulation function module 12, relevant parameter data can be generated only by guiding the design of a user into the module, more visual data is provided for the designers, whether the design of the users meets target requirements or not is confirmed, parameters and the like need to be replaced, and the design is more perfect. The simulation function is generally divided into principle simulation, PCBA simulation, whole machine environment simulation, laboratory simulation and special simulation.
Furthermore, the main control processor 1 can be connected with a background server, each intelligent test instrument can be connected with the background through a registered user, related data are uploaded to the server to be shared with other users according to whether the user is willing to share the parameter data, the equipment can be used for retrieving other simulation data under the shared data, abundant design resources are provided for designers, the design efficiency is improved, and errors in the simulation data can be corrected by comparing the designed simulation parameters with the final actual parameters.
During the use, provide operating voltage for main control processor 1 through power module 2, because probe detection module 3 includes a plurality of test probes of dismantling the connection with main control processor 1, consequently can select corresponding test probe and be connected with main control processor 1 according to the demand of test, detect the action through control module 4 control probe test module, test probe will detect data transmission to main control processor 1, calculate through main control processor 1, show the test result through display module 5 after handling, the person of facilitating the use obtains the test result, satisfy different test demands through changing different test probes, and need not to use different instrument and tool, the volume of instrument has been reduced, improve the convenience of use.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (7)
1. An intelligent test instrument, comprising:
a master processor for performing data processing;
the power supply module is connected with the main control processor and used for providing working voltage;
the probe detection module is connected with the main control processor and used for carrying out data testing, and comprises a plurality of test probes detachably connected with the main control processor;
the control module is connected with the main control processor and is used for carrying out function selection control; and the number of the first and second groups,
and the display module is connected with the main control processor and is used for displaying the detection parameters.
2. The intelligent test instrument of claim 1, wherein the test probe comprises: a power output probe for realizing power output control, a signal generation probe for realizing signal generation, a parameter test probe for realizing circuit parameter detection, a device test probe for realizing electronic device characteristic detection, an optical measurement probe for realizing optical characteristic detection, an acoustic test probe for realizing acoustic characteristic detection, an object test probe for realizing object characteristic detection, a load adjustment probe for realizing load connection, an analysis test probe for realizing logic analysis, a gas test probe for realizing gas characteristic detection, a liquid test probe for realizing liquid characteristic detection, an electromagnetic wave test probe for realizing electromagnetic wave detection, a waveform test probe for realizing oscillometric detection, a trajectory test probe for realizing object movement trajectory detection, a bacteria test probe for realizing bacteria characteristic detection, a power supply control system, a power, And the wind test probe is used for realizing wind characteristic detection.
3. The intelligent test instrument of claim 2, wherein the manipulation module is connected to the master processor using one or more of the following: the device comprises a wired connection module, a Bluetooth module, a WiFi module, a Zigbee module, a nonstandard 2.4G module, a 3G module, a 4G module, a 5G module or a UHF module.
4. The intelligent test instrument according to claim 2 or 3, wherein the display module is one or more of an LCD screen, an OLED screen, an E-ink screen, a mobile phone, a tablet computer or a PC.
5. The intelligent test instrument of claim 4, wherein the probe detection module is communicatively coupled to the host processor via a wired or wireless connection.
6. The intelligent test instrument of claim 1, wherein the master processor is further connected with a communication interface module, and different intelligent test instruments are connected with each other through the communication interface module.
7. The intelligent test instrument of claim 1, wherein the master processor is further connected with a simulation function module, and the simulation function module is used for performing simulation parameter tests.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202021002750.XU CN211954261U (en) | 2020-06-03 | 2020-06-03 | Intelligent test instrument |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN202021002750.XU CN211954261U (en) | 2020-06-03 | 2020-06-03 | Intelligent test instrument |
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| CN211954261U true CN211954261U (en) | 2020-11-17 |
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| CN202021002750.XU Active CN211954261U (en) | 2020-06-03 | 2020-06-03 | Intelligent test instrument |
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