CN211402521U - Sampling circuit for high-voltage direct current voltage and current - Google Patents
Sampling circuit for high-voltage direct current voltage and current Download PDFInfo
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- CN211402521U CN211402521U CN201922092725.9U CN201922092725U CN211402521U CN 211402521 U CN211402521 U CN 211402521U CN 201922092725 U CN201922092725 U CN 201922092725U CN 211402521 U CN211402521 U CN 211402521U
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Abstract
The utility model discloses a sampling circuit of high voltage direct current voltage, electric current, include: the voltage sampling unit comprises a first operational amplifier, the input end of the first operational amplifier inputs the voltage to be detected, the output end of the first operational amplifier is connected with a first linear optocoupler, and the output end of the first linear optocoupler is connected with the processor; the current sampling unit comprises a second operational amplifier, the input end of the second operational amplifier inputs current to be detected, the output end of the second operational amplifier is connected with a second linear optocoupler, and the output end of the second linear optocoupler is connected with the processor; the reference unit comprises a third linear optocoupler, wherein the input end of the third linear optocoupler inputs reference voltage, and the output end of the third linear optocoupler is connected with the processor; the sampling circuit calculates the difference value by using the high-precision voltage stabilizing source and the same circuit as a reference, can eliminate the influences of inconsistent amplification factors of the optical coupler and the ambient temperature, improves the measurement precision and simplifies the steps of factory calibration.
Description
Technical Field
The utility model relates to a sampling field of high voltage direct current voltage, electric current, in particular to sampling circuit of high voltage direct current voltage, electric current.
Background
The voltage and current values of the high-voltage output part need to be acquired when the high-voltage power supply is subjected to closed-loop control, and a direct sampling mode cannot be adopted because sensitive electronic components can be broken down by high voltage. Normally, sampling is isolated through a linear optical coupler, but the consistency of linear amplification coefficients of the optical coupler is poor, and the influence of environmental temperature is large. If it is desired to improve the measurement accuracy, it is necessary to specify the AD values of a plurality of sampling points for interpolation calculation at the time of shipment, and a temperature measuring element is necessary for temperature compensation. The utility model provides a differential circuit utilizes high accuracy steady voltage source and the same circuit to calculate the difference value as the reference, can eliminate the influence that the opto-coupler amplification factor is inconsistent and ambient temperature, improves measurement accuracy and simplifies the step of dispatching from the factory demarcation.
SUMMERY OF THE UTILITY MODEL
In order to achieve the above object, the utility model provides a sampling circuit of high voltage direct current voltage, electric current, include: the voltage sampling unit comprises a first operational amplifier, the input end of the first operational amplifier inputs the voltage to be detected, the output end of the first operational amplifier is connected with a first linear optocoupler, and the output end of the first linear optocoupler is connected with the processor; the current sampling unit comprises a second operational amplifier, the input end of the second operational amplifier inputs current to be detected, the output end of the second operational amplifier is connected with a second linear optocoupler, and the output end of the second linear optocoupler is connected with the processor; and the reference unit comprises a third linear optocoupler, wherein the input end of the third linear optocoupler inputs a reference voltage, and the output end of the third linear optocoupler is connected with the processor.
In the sampling circuit, the input terminal of the first operational amplifier is connected to a first voltage dividing resistor and a second voltage dividing resistor which are connected in parallel.
In the above sampling circuit, as a preferred embodiment, the second voltage-dividing resistor is an adjustable resistor, one end of the adjustable resistor is connected to the input end of the first operational amplifier, and the other end of the adjustable resistor is grounded.
Further, the input end of the second operational amplifier is connected with a third voltage dividing resistor and a fourth voltage dividing resistor which are connected in parallel.
In the above sampling circuit, preferably, the fourth voltage dividing resistor is an adjustable resistor, one end of the fourth voltage dividing resistor is connected to the input end of the second operational amplifier, and the other end of the fourth voltage dividing resistor is grounded.
In the sampling circuit, the reference voltage is from a high-precision voltage stabilizing source.
The utility model discloses beneficial effect for prior art is: the sampling circuit calculates the difference value by using the high-precision voltage stabilizing source and the same circuit as a reference, can eliminate the influences of inconsistent amplification factors of the optical coupler and the ambient temperature, improves the measurement precision and simplifies the steps of factory calibration.
Drawings
Fig. 1 is a circuit diagram of a voltage sampling unit in the middle sampling circuit of the present invention;
fig. 2 is a circuit diagram of a current sampling unit in the sampling circuit of the present invention;
fig. 3 is a circuit diagram of a reference unit in the sampling circuit of the present invention;
Detailed Description
The following describes the present invention with reference to the accompanying drawings. It should be noted that the description of the embodiments is provided to help understanding of the present invention, but the present invention is not limited thereto. In addition, the technical features related to the embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.
The utility model provides a sampling circuit of high voltage direct current voltage, electric current, include: the device comprises a voltage sampling unit, a current sampling unit and a reference unit.
As shown in fig. 1, the voltage sampling unit includes a first operational amplifier U1, the first divider resistor R1 and the second divider resistor R2 that the input of the first operational amplifier U1 is connected in parallel, the second divider resistor R2 is an adjustable resistor, one end is connected at the input of the first operational amplifier U1, the other end is grounded, the first linear optical coupler OP1 is connected at the output of the first operational amplifier U1, the single-chip microcomputer is connected at the output of the first linear optical coupler OP1, in this embodiment, the single-chip microcomputer can adopt a single-chip microcomputer whose model is STM32F103, it needs to be explained here, although in this embodiment, the single-chip microcomputer of this model is adopted, but the protection scope of the present invention is not limited thereto, and single-chip microcomputers of other models or processors having the same function as the single-chip microcomputer are all within the protection scope of the present invention.
As shown in fig. 2, the current sampling unit includes a second operational amplifier U2, the input end of the second operational amplifier U2 inputs a third voltage dividing resistor R6 and a fourth voltage dividing resistor R5 which are connected in parallel, the fourth voltage dividing resistor R5 is an adjustable resistor, one end of the adjustable resistor is connected to the input end of the second operational amplifier U2, the other end of the adjustable resistor is grounded, the output end of the second operational amplifier U2 is connected to a second linear optical coupler OP2, and the output end of the second linear optical coupler OP2 is connected to the single chip microcomputer.
As shown in FIG. 3, the reference unit comprises a third linear optical coupler OP3, a reference voltage is input at the input end of the third linear optical coupler OP3, the reference voltage comes from a high-precision voltage stabilizing source, and the output end of the third linear optical coupler OP3 is connected with the single chip microcomputer.
The high direct current voltage is divided by a large resistor and a small resistor to obtain VF1, wherein the large resistor is in a hundred mega ohm level, and the small resistor is in a dozen kilo ohm level. The large resistor for voltage division is contained in the high-voltage package, one end of the resistor is connected with high voltage, and the other end of the resistor is led out to the PCB board by an insulated wire. The voltage division can not directly drive the linear optocoupler, and the drive capability is required to be achieved later through the operational amplifier. When the output is rated voltage, VF2 is made equal to Vref2 by adjusting adjustable resistor R2.
The resistor R5 is connected in series in a current loop of high-voltage output to obtain a primary current sampling value IF1, the voltage cannot directly drive a linear optical coupler, and the linear optical coupler needs to be driven by an operational amplifier and then has driving capacity. When the output is full, IF2 is made equal to Vref2 by adjusting the adjustable resistor R5.
The difference value is calculated by using the high-precision voltage stabilizing source and the same circuit as a reference, so that the influences of inconsistent amplification coefficients of the optical coupler and the ambient temperature can be eliminated, the measurement precision is improved, and the steps of factory calibration are simplified.
The embodiments of the present invention have been described in detail with reference to the accompanying drawings, but the present invention is not limited to the described embodiments. It will be apparent to those skilled in the art that various changes, modifications, substitutions and alterations can be made in the embodiments without departing from the principles and spirit of the invention, and the scope of the invention is to be accorded the full scope of the claims.
Claims (6)
1. A sampling circuit of high voltage direct current voltage, electric current characterized in that includes:
the voltage sampling unit comprises a first operational amplifier, the input end of the first operational amplifier inputs the voltage to be detected, the output end of the first operational amplifier is connected with a first linear optical coupler,
the output end of the first linear optocoupler is connected with the processor;
the current sampling unit comprises a second operational amplifier, the input end of the second operational amplifier inputs the current to be detected, the output end of the second operational amplifier is connected with a second linear optocoupler,
the output end of the second linear optocoupler is connected with the processor;
and the reference unit comprises a third linear optocoupler, wherein the input end of the third linear optocoupler inputs a reference voltage, and the output end of the third linear optocoupler is connected with the processor.
2. The sampling circuit of claim 1, wherein: the input end of the first operational amplifier is connected with a first voltage-dividing resistor and a second voltage-dividing resistor which are connected in parallel.
3. The sampling circuit of claim 2, wherein: the second voltage-dividing resistor is an adjustable resistor, one end of the second voltage-dividing resistor is connected to the input end of the first operational amplifier, and the other end of the second voltage-dividing resistor is grounded.
4. The sampling circuit of claim 1, wherein: and the input end of the second operational amplifier is connected with a third voltage dividing resistor and a fourth voltage dividing resistor which are connected in parallel.
5. The sampling circuit of claim 4, wherein: the fourth voltage-dividing resistor is an adjustable resistor, one end of the fourth voltage-dividing resistor is connected to the input end of the second operational amplifier, and the other end of the fourth voltage-dividing resistor is grounded.
6. The sampling circuit of claim 1, wherein: the reference voltage is from a high-precision voltage regulator.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922092725.9U CN211402521U (en) | 2019-11-28 | 2019-11-28 | Sampling circuit for high-voltage direct current voltage and current |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922092725.9U CN211402521U (en) | 2019-11-28 | 2019-11-28 | Sampling circuit for high-voltage direct current voltage and current |
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| CN211402521U true CN211402521U (en) | 2020-09-01 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110824231A (en) * | 2019-11-28 | 2020-02-21 | 南京汇凯顺电子科技有限公司 | Sampling circuit and sampling method for high-voltage direct current voltage and current |
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2019
- 2019-11-28 CN CN201922092725.9U patent/CN211402521U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110824231A (en) * | 2019-11-28 | 2020-02-21 | 南京汇凯顺电子科技有限公司 | Sampling circuit and sampling method for high-voltage direct current voltage and current |
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