CN211402214U - Automatic over-and-under type HOTDISK thermal constant analysis appearance sample platform - Google Patents
Automatic over-and-under type HOTDISK thermal constant analysis appearance sample platform Download PDFInfo
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- CN211402214U CN211402214U CN201921664730.6U CN201921664730U CN211402214U CN 211402214 U CN211402214 U CN 211402214U CN 201921664730 U CN201921664730 U CN 201921664730U CN 211402214 U CN211402214 U CN 211402214U
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- 238000012360 testing method Methods 0.000 claims abstract description 85
- 239000000523 sample Substances 0.000 claims abstract description 64
- 238000009434 installation Methods 0.000 claims abstract description 12
- 230000005540 biological transmission Effects 0.000 claims abstract description 4
- 230000003139 buffering effect Effects 0.000 claims description 3
- 238000000034 method Methods 0.000 description 4
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229920003223 poly(pyromellitimide-1,4-diphenyl ether) Polymers 0.000 description 1
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Abstract
The utility model discloses an automatic over-and-under type HOTDISK thermal constant analysis appearance sample platform, including installation base, probe assembly, test platform and height adjusting assembly, height adjusting assembly includes ball screw, servo motor, guide pillar and an upper fixed plate, ball screw and guide pillar all vertically set up on the upper portion of installation base, an upper fixed plate sets up on the upper portion of ball screw and guide pillar, servo motor sets up in the lower part of installation base and with the ball screw drive is connected, test platform respectively with ball screw and guide pillar swing joint; the upper part of the test platform is also provided with a test fixture for fixing a product; the probe assembly comprises a fixing frame, a fixing assembly and a test probe, the fixing frame is located on the side of the test platform and fixedly connected with the upper portion of the mounting base, the test probe is fixedly connected with the upper portion of the fixing frame through the fixing assembly, one end of the test probe extends even into the test fixture, and the other end of the test probe is electrically connected with an external test system through a transmission lead.
Description
Technical Field
The utility model belongs to the technical field of the thermal conductivity coefficient test technique and specifically relates to an automatic over-and-under type HOTDISK thermal constant analysis appearance sample platform is related to.
Background
The HotDisk thermal constant analyzer is a commonly used analyzer for testing the thermal conductivity of materials. Because the position of the test probe is fixed, the height of the sample table needs to be adjusted for samples to be tested with different thicknesses so as to adapt to the test probe. The sample table is lifted or lowered manually, and then is fixed by screwing screws on the left side and the right side and relying on friction force. This type of fastening has the disadvantage of being easy to slip off and requires a great deal of force to tighten. The phenomenon that the sample stage slides down frequently occurs in use (the bottom of the sample stage is padded with a support to prevent the sample stage from accidentally sliding down in the figure), and damage to the precision part of the test probe (the value of the test probe is 5000 yuan/piece) is easily caused.
Improvements are therefore needed.
SUMMERY OF THE UTILITY MODEL
Not enough to prior art exists, the utility model aims at providing an automatic over-and-under type HOTDISK thermal constant analysis appearance sample platform to solve above-mentioned problem.
In order to realize the purpose, the utility model discloses the technical scheme who adopts is:
an automatic lifting type HOTDISK thermal constant analyzer sample stage comprises an installation base, a probe assembly, a test platform and a height adjusting assembly, wherein the height adjusting assembly comprises a ball screw, a servo motor, a guide pillar and an upper fixing plate, the ball screw and the guide pillar are both vertically arranged on the upper portion of the installation base, the upper fixing plate is arranged on the upper portions of the ball screw and the guide pillar, the servo motor is arranged on the lower portion of the installation base and is in driving connection with the ball screw, and the test platform is respectively movably connected with the ball screw and the guide pillar; the upper part of the test platform is also provided with a test fixture for fixing a product; the probe assembly comprises a fixing frame, a fixing assembly and a test probe, the fixing frame is located on the side of the test platform and fixedly connected with the upper portion of the mounting base, the test probe is fixedly connected with the upper portion of the fixing frame through the fixing assembly, one end of the test probe extends even into the test fixture, and the other end of the test probe is electrically connected with an external test system through a transmission lead.
In a further technical scheme, the test fixture comprises a lower die and an upper die stacked above the lower die, and stations for fixing products are arranged on the upper portion of the lower die and the lower portion of the lower die.
In a further technical scheme, fixed subassembly includes stationary blade and fixed screw, the stationary blade sets up in the top of mount, and through the fixed screw with the mount is connected to the realization is fixed the test probe.
In a further technical scheme, a guide sleeve is arranged on the test platform and is in sliding connection with the guide pillar through the guide sleeve.
In a further technical scheme, a vertical downward-arranged compression screw is further arranged on the upper fixing plate and used for compressing the upper die and the lower die.
In a further technical scheme, a cushion block is further arranged between the mounting base and the test platform, and a buffer rubber pad is arranged on the upper portion of the cushion block.
Adopt above-mentioned structure, compared with the prior art, the utility model the advantage that has is: 1. the utility model adopts the mode of electrically adjusting the height to replace manual adjustment by arranging the servo motor and the ball screw, thereby ensuring that the test platform cannot stall and fall in the process of height adjustment, protecting the test probe from being damaged and reducing the faults of a test instrument; 2. through setting up a cushion and buffering cushion on the upper portion of installation base, when parameter input takes place the error, buffering cushion can avoid test platform and installation base direct contact, avoids drawing bad test probe.
Drawings
The present invention will be further explained with reference to the drawings and examples.
Fig. 1 is a schematic view of the overall structure of the present invention;
fig. 2 is a schematic view of the overall structure of the present invention.
Detailed Description
The technical solutions of the present invention will be described clearly and completely below, and it should be apparent that the described embodiments are some, but not all embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
The sample stage of the automatic lifting type hot tdisk thermal constant analyzer as shown in fig. 1 and fig. 2 comprises a mounting base 1, a probe assembly 2, a testing platform 3 and a height adjusting assembly 4, wherein the height adjusting assembly 4 comprises a ball screw 41, a servo motor 42, a guide post 43 and an upper fixing plate 44, the ball screw 41 and the guide post 43 are both vertically arranged on the upper portion of the mounting base 1, the upper fixing plate 44 is arranged on the upper portions of the ball screw 41 and the guide post 43, the servo motor 42 is arranged on the lower portion of the mounting base 1 and is in driving connection with the lower end of the ball screw through a bevel gear, and the testing platform 3 is respectively in movable connection with the ball screw 41 and the guide post 43; the upper part of the test platform 3 is also provided with a test fixture 5 for fixing a product; the probe assembly comprises a fixing frame 21, a fixing assembly 22 and a test probe 23, a Kapton sensor is selected for a test head, the tail end of the sensor is a flexible bar and has certain flexibility, the fixing frame 21 is located on the side of the test platform 3 and fixedly connected with the upper portion of the installation base 1, the test probe 23 is fixedly connected with the upper portion of the fixing frame 21 through the fixing assembly 22, one end of the test probe 23 extends even into the test fixture 5, and the other end of the test probe is electrically connected with an external test system through a transmission lead.
In the present embodiment, the test fixture 5 includes a lower die 51 and an upper die 52 stacked above the lower die 51, and the upper portion of the lower die 51 and the lower portion of the lower die 51 are provided with stations for fixing a product; through setting up the station that is used for installing the product, the placing of the sample of being convenient for.
In this embodiment, the fixing assembly 22 includes a fixing plate 22a and a fixing screw 22b, the fixing plate 22a is disposed above the fixing frame 21 and is connected to the fixing frame 21 through the fixing screw 22b to fix the test probe 23; the test probe 23 is mounted on the fixing frame 21 by the fixing screw 22b and the fixing piece 22a, so that the test probe 23 can be detached and stored when not used for a long time, and the probe is prevented from being damaged carelessly.
In this embodiment, the test platform 3 is provided with a guide sleeve 31, and is slidably connected with the guide post 43 through the guide sleeve 31; when the test platform 3 moves up and down, the guide sleeve 31 is connected with the guide post 43, so that the movement smoothness is improved.
In this embodiment, the upper fixing plate 44 is further provided with a pressing screw 44a arranged vertically downward for pressing the upper die 52 and the lower die 51; after the sample is installed, the upper die 52 and the lower die 51 are pressed tightly by adjusting the pressing screw 44a, so that the test probe 23 is ensured to be stable in the test process, and the accuracy of the test result is improved.
In this embodiment, a cushion block 11 is further disposed between the mounting base 1 and the testing platform 3, and a cushion rubber pad 12 is disposed on the upper portion of the cushion block 11; the cushion block 11 and the buffer rubber cushion 12 are arranged at the lower part of the test platform 3, so that the test platform 3 is guaranteed, the test probe 23 cannot be damaged by the test platform 3, and the safety of the test probe 23 is further guaranteed.
The working principle is as follows: during operation, place the sample respectively in last mould 52 and below station department, and will go up mould 52 and lower mould 51 stack setting, test probe 23 is located simultaneously, between the sample of lower mould 51, after inputing corresponding high position parameter according to the thickness of sample, drive ball screw 41 with the help of servo motor 42 and rotate the whole lift of drive test platform 3, after test platform 3 moves to predetermined height, screw up set screw 32, fix test platform 3 on guide pillar 43, compress tightly last mould 52 and lower mould 51 through housing screw 44a simultaneously, ensure normal contact between the sample, and start the coefficient of thermal conductivity test process, receive and pass back data through the side probe.
The above description is only for the preferred embodiment of the present invention, and for those skilled in the art, there are variations on the detailed description and the application scope according to the idea of the present invention, and the content of the description should not be construed as a limitation to the present invention.
Claims (6)
1. The utility model provides an automatic over-and-under type HOTDISK thermal constant analysis appearance sample platform which characterized in that: the testing device comprises an installation base, a probe assembly, a testing platform and a height adjusting assembly, wherein the height adjusting assembly comprises a ball screw, a servo motor, a guide pillar and an upper fixing plate, the ball screw and the guide pillar are vertically arranged on the upper portion of the installation base, the upper fixing plate is arranged on the upper portions of the ball screw and the guide pillar, the servo motor is arranged on the lower portion of the installation base and is in driving connection with the ball screw, and the testing platform is movably connected with the ball screw and the guide pillar respectively; the upper part of the test platform is also provided with a test fixture for fixing a product; the probe assembly comprises a fixing frame, a fixing assembly and a test probe, the fixing frame is located on the side of the test platform and fixedly connected with the upper portion of the mounting base, the test probe is fixedly connected with the upper portion of the fixing frame through the fixing assembly, one end of the test probe extends even into the test fixture, and the other end of the test probe is electrically connected with an external test system through a transmission lead.
2. The automatic lifting type HOTDISK thermal constant analyzer sample stage of claim 1, wherein: the test fixture comprises a lower die and an upper die stacked above the lower die, wherein stations for fixing products are arranged on the upper portion of the lower die and the lower portion of the lower die.
3. The automatic lifting type HOTDISK thermal constant analyzer sample stage of claim 1, wherein: the fixed assembly comprises a fixed sheet and a fixed screw, the fixed sheet is arranged above the fixed frame and is connected with the fixed frame through the fixed screw so as to fix the test probe.
4. The automatic lifting type HOTDISK thermal constant analyzer sample stage of claim 1, wherein: the test platform is provided with a guide sleeve which is in sliding connection with the guide pillar.
5. The automatic lifting type HOTDISK thermal constant analyzer sample stage of claim 1, wherein: and the upper fixing plate is also provided with a vertical downward pressing screw rod for pressing the upper die and the lower die.
6. The automatic lifting type HOTDISK thermal constant analyzer sample stage of claim 1, wherein: the mounting base with still be equipped with a cushion between the test platform, the upper portion of cushion is equipped with the buffering cushion.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921664730.6U CN211402214U (en) | 2019-10-08 | 2019-10-08 | Automatic over-and-under type HOTDISK thermal constant analysis appearance sample platform |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921664730.6U CN211402214U (en) | 2019-10-08 | 2019-10-08 | Automatic over-and-under type HOTDISK thermal constant analysis appearance sample platform |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN211402214U true CN211402214U (en) | 2020-09-01 |
Family
ID=72217359
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201921664730.6U Active CN211402214U (en) | 2019-10-08 | 2019-10-08 | Automatic over-and-under type HOTDISK thermal constant analysis appearance sample platform |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN211402214U (en) |
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2019
- 2019-10-08 CN CN201921664730.6U patent/CN211402214U/en active Active
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| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP02 | Change in the address of a patent holder | ||
| CP02 | Change in the address of a patent holder |
Address after: 518000 Building 11A, Building 11, Qiaochengfang, 4080 Qiaoxiang Road, Gaofa Community, Shahe Street, Nanshan District, Shenzhen, Guangdong Province Building 11B, Building 11, Qiaochengfang, 4080 Qiaoxiang Road, Gaofa Community, Shahe Street, Nanshan District, Shenzhen Patentee after: SHENZHEN BORNSUN INDUSTRIAL Co.,Ltd. Address before: 518110 102a, Room 102, floor 5, building 1, Haomai hi tech park, No. 387, Huating Road, Langkou community, Dalang street, Longhua District, Shenzhen, Guangdong Patentee before: SHENZHEN BORNSUN INDUSTRIAL Co.,Ltd. |
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| CP01 | Change in the name or title of a patent holder | ||
| CP01 | Change in the name or title of a patent holder |
Address after: 518000 Building 11A, Building 11, Qiaochengfang, 4080 Qiaoxiang Road, Gaofa Community, Shahe Street, Nanshan District, Shenzhen, Guangdong Province Building 11B, Building 11, Qiaochengfang, 4080 Qiaoxiang Road, Gaofa Community, Shahe Street, Nanshan District, Shenzhen Patentee after: Shenzhen Boen New Materials Co.,Ltd. Address before: 518000 Building 11A, Building 11, Qiaochengfang, 4080 Qiaoxiang Road, Gaofa Community, Shahe Street, Nanshan District, Shenzhen, Guangdong Province Building 11B, Building 11, Qiaochengfang, 4080 Qiaoxiang Road, Gaofa Community, Shahe Street, Nanshan District, Shenzhen Patentee before: SHENZHEN BORNSUN INDUSTRIAL Co.,Ltd. |