CN211348012U - Pre-tilt sample table device for EBSD - Google Patents
Pre-tilt sample table device for EBSD Download PDFInfo
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- CN211348012U CN211348012U CN201920898230.2U CN201920898230U CN211348012U CN 211348012 U CN211348012 U CN 211348012U CN 201920898230 U CN201920898230 U CN 201920898230U CN 211348012 U CN211348012 U CN 211348012U
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Abstract
A pre-tilt sample table device for EBSD belongs to the technical field of laboratory EBSD analysis. The device comprises a sample table, a surface sample, a section sample and a sample seat; the sample table is a T-shaped table, a beam of the T-shaped table is a quadrangular prism, the length of the beam is 60-80 mm, the upper top surface of the beam is a 20-degree inclined surface, and the inclined surface in front of the beam is 70 degrees and forms a right angle with the upper top surface; a vertical beam is arranged at the vertical position of the center of the cross beam of the T-shaped table, and the vertical beam of the sample table is connected with the sample seat; a cross-section sample is arranged on the top surface of the beam of the sample table; a surface sample is arranged on the inclined plane right in front of the beam of the sample table. The advantage is that once only can place a plurality of surface or cross section samples that are used for EBSD analysis, the practicality is strong.
Description
Technical Field
The utility model belongs to the technical field of laboratory EBSD analysis, in particular to sample platform device that pretilts for EBSD.
Background
With the continuous development of Electron Back Scattering Diffraction (EBSD), the method is widely applied to the micro-orientation analysis in the field of materials. At present, the sample platform device of doing EBSD analysis usefulness is a sample platform that has 70 inclined planes, this sample platform is copper material, it is softer, easy damage, and the sample is difficult to fix, easy drift, especially the inclined plane area is too little, only 10mm size, can only install a sample at every turn and carry out EBSD analysis, if continue to analyze next sample, need take off the new sample of reinstallation again with the sample, greatly increased the experimental period, whole operation flow is too frequent, be unfavorable for the quick high-efficient analysis of sample.
The utility model provides a can once only place the sample platform device of a plurality of samples when EBSD analysis, improve analysis efficiency and provide better solution when carrying out EBSD analysis for the material field.
Disclosure of Invention
An object of the utility model is to provide a pretilt sample platform device for EBSD has solved the problem that can't place a plurality of samples when doing the EBSD analysis.
A pre-tilt sample stage device for EBSD comprises a sample stage 1, a surface sample 2, a cross-section sample 3 and a sample holder 4. The sample table 1 is a T-shaped table, a beam of the T-shaped table is a quadrangular prism, the length of the beam is 60-80 mm, the thickness of the beam is 7-10 mm, the upper top surface of the beam is a 20-degree inclined surface, and the inclined surface in front of the beam is 70 degrees and forms a right angle with the upper top surface; a vertical beam is arranged at the vertical position of the center of the cross beam of the T-shaped table, the vertical beam is a cuboid, the sum of the length of the vertical beam and the width of the cross beam is 40-45 mm, the width of the vertical beam is 7-10 mm, and the thickness of the vertical beam is consistent with that of the cross beam; the vertical beam of the sample table 1 is connected with the sample seat 4; a cross-section sample 3 is arranged on the top surface of the beam of the sample table 1; a surface sample 2 is arranged on the inclined plane right in front of the beam of the sample table 1.
The sample table 1 and the sample seat 4 are made of stainless steel;
the sample size length and width of the surface sample 2 and the cross section sample 3 are both 5-20 mm, and the thickness is less than or equal to 5 mm.
The working principle of the device is as follows: adhering an analysis surface sample 2 on a 70-degree inclined plane of a beam of a sample table 1 by using a conductive adhesive tape or adhering an analysis section sample 3 on a 20-degree inclined plane of the beam of the sample table 1 by using a conductive adhesive tape, wherein a plurality of samples can be placed at one time, then fixing the sample table 1 on a sample seat 4, and placing the sample table in a scanning microscope for EBSD analysis; and when the observation is finished and the sample is taken, the analysis sample is directly taken down from the sample table 1 and is placed in a drying cabinet for storage.
The utility model has the advantages that: a plurality of samples can be placed at one time, and a surface or section sample for EBSD analysis can be placed, so that the operation is simple and convenient, the operation is rapid, and the practicability is high.
Drawings
Fig. 1 is a three-dimensional combination diagram of a sample stage device. The device comprises a sample table 1, a surface sample 2, a section sample 3 and a sample seat 4.
Fig. 2 is a two-dimensional front view of the sample stage apparatus.
Fig. 3 is a two-dimensional top view of the sample stage apparatus.
Fig. 4 is a two-dimensional left side view of the sample stage apparatus.
Detailed Description
Fig. 1-4 show a specific embodiment of the present invention.
A pre-tilt sample stage device for EBSD comprises a sample stage 1, a surface sample 2, a cross-section sample 3 and a sample holder 4. The sample table 1 is a T-shaped table, a beam of the T-shaped table is a quadrangular prism, the length of the beam is 60mm, the thickness of the beam is 7mm, the upper top surface of the beam is a 20-degree inclined surface, and the inclined surface in front of the beam is 70 degrees and forms a right angle with the upper top surface; a vertical beam is arranged at the vertical position of the center of the cross beam of the T-shaped table, the vertical beam is a cuboid, the sum of the length of the vertical beam and the width of the cross beam is 40mm, the width of the vertical beam is 10mm, and the thickness of the vertical beam is consistent with that of the cross beam; the vertical beam of the sample table 1 is connected with the sample seat 4; a cross-section sample 3 is arranged on the top surface of the beam of the sample table 1; a surface sample 2 is arranged on the inclined plane right in front of the beam of the sample table 1.
The sample table 1 and the sample seat 4 are made of stainless steel materials;
the sample dimensions of the surface sample 2 and the cross-sectional sample 3 were 10mm in length and width and 3mm in thickness.
The utility model discloses an auxiliary worker has special tweezers, electrically conductive sticky tape etc..
The working principle is as follows: adhering an analyzed surface sample 2 on a 70-degree inclined plane of a beam of a sample table 1 by using a conductive adhesive tape or adhering an analyzed cross-section sample 3 on a 20-degree inclined plane of the beam of the sample table 1 by using a conductive adhesive tape, wherein a plurality of samples can be placed at one time, then fixing the sample table 1 on a sample seat 4, and placing the sample seat in a scanning microscope for EBSD analysis; and when the observation is finished and the sampling is finished, directly taking the surface sample 2 and the section sample 3 off the sample table 1, and putting the samples into a drying cabinet for storage.
Claims (3)
1. A pre-tilt sample stage device for EBSD is characterized by comprising a sample stage (1), a surface sample (2), a cross-section sample (3) and a sample holder (4); the sample table (1) is a T-shaped table, a cross beam of the T-shaped table is a quadrangular prism, the length dimension of the cross beam is 60-80 mm, the thickness dimension of the cross beam is 7-10 mm, the upper top surface of the cross beam is a 20-degree inclined surface, and the inclined surface in front of the cross beam is 70 degrees and forms a right angle with the upper top surface; a vertical beam is arranged at the vertical position of the center of the cross beam of the T-shaped table, the vertical beam is a cuboid, the sum of the length of the vertical beam and the width of the cross beam is 40-45 mm, the width of the vertical beam is 7-10 mm, and the thickness of the vertical beam is consistent with that of the cross beam; the vertical beam of the sample table (1) is connected with the sample seat (4); a cross-section sample (3) is arranged on the top surface of the beam of the sample table (1); a surface sample (2) is arranged on the inclined plane right in front of the beam of the sample table (1).
2. Sample stage device according to claim 1, characterized in that the sample stage (1) and the sample holder (4) are made of stainless steel.
3. The sample stage device according to claim 1, wherein the sample dimensions of the surface sample (2) and the cross-section sample (3) are 5-20 mm in length and width and 5mm or less in thickness.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920898230.2U CN211348012U (en) | 2019-06-14 | 2019-06-14 | Pre-tilt sample table device for EBSD |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920898230.2U CN211348012U (en) | 2019-06-14 | 2019-06-14 | Pre-tilt sample table device for EBSD |
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| Publication Number | Publication Date |
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| CN211348012U true CN211348012U (en) | 2020-08-25 |
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| CN201920898230.2U Active CN211348012U (en) | 2019-06-14 | 2019-06-14 | Pre-tilt sample table device for EBSD |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112903393A (en) * | 2021-02-07 | 2021-06-04 | 哈尔滨工业大学 | Scanning electron microscope quasi-in-situ stretching based EBSD and DIC signal synchronous acquisition testing method |
-
2019
- 2019-06-14 CN CN201920898230.2U patent/CN211348012U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112903393A (en) * | 2021-02-07 | 2021-06-04 | 哈尔滨工业大学 | Scanning electron microscope quasi-in-situ stretching based EBSD and DIC signal synchronous acquisition testing method |
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