CN210923778U - Equipment fault test switching circuit - Google Patents
Equipment fault test switching circuit Download PDFInfo
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- CN210923778U CN210923778U CN201921844423.6U CN201921844423U CN210923778U CN 210923778 U CN210923778 U CN 210923778U CN 201921844423 U CN201921844423 U CN 201921844423U CN 210923778 U CN210923778 U CN 210923778U
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Abstract
The utility model discloses an equipment failure test switching circuit can include signal transmitter, relay circuit, load conversion circuit, first connector and second connector, and signal transmitter is connected with the relay circuit electricity, and load conversion circuit and relay circuit are connected, and first connector and second connector all are connected with the relay circuit electricity. The utility model discloses can test the back at the equipment to be tested through special environment, let conventional test equipment detect this equipment to be tested rapidly, make conventional test equipment can detect out this equipment to be tested's short-term trouble.
Description
Technical Field
The utility model relates to an electric field especially relates to an equipment failure test switching circuit.
Background
Currently, the prior art can obtain that after a special environment (such as a high temperature, a low temperature, a high pressure, and the like) is tested by simulating the equipment, whether the equipment has a fault is detected by a conventional testing device.
However, since the device subjected to the special environment examination may have a short-time fault, there is a long time interval from the time the current device is subjected to the special environment examination to the time the current device is detected by the conventional testing device, and the short-time fault may disappear within the time interval, so that the conventional testing device cannot detect the short-time fault of the device. For example, when a certain device is heated to a high temperature of 60 degrees centigrade, an index parameter in the device is abnormal, but before the device is detected by a conventional testing device, the temperature of the device is reduced to 30 degrees centigrade, the index parameter is recovered to be normal, and thus the detection result of the conventional testing device on the device cannot find that the index parameter is abnormal at 60 degrees centigrade.
SUMMERY OF THE UTILITY MODEL
In view of the above, the present invention provides an apparatus failure test switching circuit that overcomes or at least partially solves the above problems, and is characterized by the following:
an equipment failure test switching circuit comprising: the relay circuit comprises a signal transmitter 100, a relay circuit 200, a load conversion circuit 300, a first connector 400 and a second connector 500, wherein the signal transmitter 100 is electrically connected with the relay circuit 200, the load conversion circuit 300 is electrically connected with the relay circuit 200, and the first connector 400 and the second connector 500 are both electrically connected with the relay circuit 200;
the relay circuit 200 includes four switching units 210, each switching unit 210 including a single-pole double-throw switch, wherein the single-pole double-throw switch includes: four pins of the first connector 400 are electrically connected with the first movable contacts of the four switch units 210, respectively, the first fixed contacts of two switch units 210 of the four switch units 210 are electrically connected with the signal transmitter 100, the first fixed contacts of the other two switch units 210 are electrically connected with the load conversion circuit 300, and the four second fixed contacts of each switch unit 210 are electrically connected with four pins of the second connector 500, respectively;
the four moving contacts in the relay circuit 200 act simultaneously and identically.
Optionally, the device failure test switching circuit further includes:
the first connector 400 is matched with an interface of a device to be tested, the second connector 500 is matched with an interface of a conventional testing device, and other pins except four pins electrically connected with the movable contacts of the four switch units 210 in the first connector 400 are respectively and electrically connected with other pins except four pins electrically connected with the second fixed contacts of the four switch units 210 in the second connector 500.
Optionally, the relay circuit 200 further includes: a switch 230 and an exciting coil 220 are switched,
one end of the switch 230 is connected to one end of the excitation coil 220, the other end of the switch 230 is connected to the positive pole of the power supply, and the other end of the excitation coil 220 is connected to the negative pole of the power supply;
when the switch 230 is closed, the movable contact in each switch unit 210 is electrically connected to the first fixed contact, and when the switch 230 is opened, the movable contact in each switch unit 210 is electrically connected to the second fixed contact.
Alternatively, the signal transmitter 100 comprises two interfaces,
the first fixed contacts of two switch units 210 of the four switch units 210 are electrically connected to two interfaces of the signal transmitter 100, respectively.
Optionally, the load converting circuit 300 includes: the double-pole three-throw switch 310 comprises a first movable contact group, a first fixed contact group, a second fixed contact group and a third fixed contact group, wherein the first movable contact group comprises a second movable contact 311 and a third movable contact 312, the first fixed contact group comprises a third fixed contact 313 and a fourth fixed contact 314, the second fixed contact group comprises a fifth fixed contact 315 and a sixth fixed contact 316, the third fixed contact group comprises a seventh fixed contact 317 and an eighth fixed contact 318,
the second movable contact 311 and the third movable contact 312 are electrically connected to a first fixed contact in the relay circuit 200, respectively, the second movable contact 311 is electrically connected to one end of the first resistor 320, the other end of the first resistor 320 is electrically connected to the sixth fixed contact 316 and the eighth fixed contact 318, respectively, the sixth fixed contact 316 is electrically connected to one end of the second resistor 330, and the other end of the second resistor 330 is electrically connected to the fourth fixed contact 314 and the seventh fixed contact 317, respectively.
Optionally, the signal transmitter 100 includes a power interface 130.
Optionally, the first connector 400 is a 35-core socket, and the 35-core socket includes 35 pins.
Optionally, the second connector 500 is a 35-core plug, and the 35-core plug includes 35 pins.
Optionally, the device failure test switching circuit further includes: the voltage of the transformer 600 is varied by the voltage of the transformer,
the power output terminal of the transformer 600 is electrically connected to the signal transmitter 100.
Optionally, the power output terminal of the transformer 600 is further electrically connected to the relay circuit 200.
By the technical scheme, the utility model provides a device failure test switching circuit can include signal transmitter 100, relay circuit 200, load conversion circuit 300, first connector 400 and second connector 500, signal transmitter 100 with relay circuit 200 electricity is connected, load conversion circuit 300 with relay circuit 200 electricity is connected, first connector 400 and second connector 500 all with relay circuit 200 electricity is connected; the relay circuit 200 includes four switching units 210, each switching unit 210 including a single-pole double-throw switch, wherein the single-pole double-throw switch includes: four pins of the first connector 400 are electrically connected with the first movable contacts of the four switch units 210, respectively, the first fixed contacts of two switch units 210 of the four switch units 210 are electrically connected with the signal transmitter 100, the first fixed contacts of the other two switch units 210 are electrically connected with the load conversion circuit 300, and the four second fixed contacts of each switch unit 210 are electrically connected with four pins of the second connector 500, respectively; the four moving contacts in the relay circuit 200 act simultaneously and identically. The utility model discloses can test the back at the equipment to be tested through special environment, let conventional test equipment detect this equipment to be tested rapidly, make conventional test equipment can detect out this equipment to be tested's short-term trouble.
The above description is only an overview of the technical solutions of the present invention, and in order to make the technical means of the present invention more clearly understood, the present invention may be implemented according to the content of the description, and in order to make the above and other objects, features, and advantages of the present invention more obvious and understandable, the following detailed description of the present invention is given.
Drawings
Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the invention. Also, like reference numerals are used to refer to like parts throughout the drawings. In the drawings:
fig. 1 is a schematic diagram illustrating an apparatus failure test switching circuit according to an embodiment of the present invention;
fig. 2 is a schematic diagram illustrating another device failure test switching circuit provided by an embodiment of the present invention;
fig. 3 is a schematic diagram illustrating the numbering of pins of a first connector according to an embodiment of the present invention;
fig. 4 is a schematic diagram illustrating the numbering of pins of a second connector according to an embodiment of the present invention;
fig. 5 is a schematic diagram illustrating another device failure test switching circuit provided by an embodiment of the present invention;
fig. 6 is a schematic diagram illustrating another device failure test switching circuit provided by an embodiment of the present invention;
fig. 7 is a schematic diagram illustrating another device failure test switching circuit provided by an embodiment of the present invention;
fig. 8 is a schematic diagram illustrating another device failure test switching circuit provided by an embodiment of the present invention;
fig. 9 shows a schematic diagram of another device failure test switching circuit provided by an embodiment of the present invention.
Detailed Description
Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.
As shown in fig. 1, an embodiment of the present invention provides an apparatus failure test switching circuit, which may include: the relay circuit comprises a signal transmitter 100, a relay circuit 200, a load conversion circuit 300, a first connector 400 and a second connector 500, wherein the signal transmitter 100 is electrically connected with the relay circuit 200, the load conversion circuit 300 is electrically connected with the relay circuit 200, and the first connector 400 and the second connector 500 are both electrically connected with the relay circuit 200.
The signal transmitter 100 of the present embodiment may be a ZPW · F type uninsulated transmitter. Signal transmitter 100 may be used as a signal source for transmitting a high voltage high power frequency shifted test signal. Alternatively, at least one of the frequency, waveform and output level electrical signals of the test signal transmitted by the signal transmitter 100 may be the same as the signal transmitted by the device to which the first connector is connected in this embodiment. In the present embodiment, the ZPW · F type uninsulated transmitter facilitates switching of the frequency of the transmitted test signal, and has a large output power and is easy to use.
The relay circuit 200 may include four switching units 210, each switching unit 210 including a single pole double throw switch, wherein the single pole double throw switch includes: four pins of the first connector 400 are electrically connected to the first moving contacts of the four switch units 210, respectively, the first fixed contacts of two switch units 210 of the four switch units 210 are electrically connected to the signal transmitter 100, the first fixed contacts of the other two switch units 210 are electrically connected to the load converting circuit 300, and the four second fixed contacts of each switch unit 210 are electrically connected to the four pins of the second connector 500, respectively.
In order to distinguish the first movable contact, the first fixed contact and the second fixed contact of the different switch units 210, letters A, B, C and D are identified as distinctions on fig. 1. As shown in fig. 1, the first movable contact 211A, the first fixed contact 212A, and the second fixed contact 213A are located in one switching unit 210. Specifically, four pins of the first connector 400 are connected to the first movable contact 211A, the first movable contact 211B, the first movable contact 211C, and the first movable contact 211D, respectively. The first fixed contact 212A and the first fixed contact 212B are electrically connected to the signal transmitter 100. The first fixed contact 212C and the first fixed contact 212D are electrically connected to the load conversion circuit 300. The second fixed contact 213A, the second fixed contact 213B, the second fixed contact 213C, and the second fixed contact 213D are electrically connected to four pins of the second connector 500, respectively.
The four moving contacts in the relay circuit 200 act simultaneously and identically.
Specifically, the four movable contacts in the relay circuit 200 may be connected to the first fixed contacts corresponding to the movable contacts at the same time, or connected to the second fixed contacts corresponding to the movable contacts at the same time. For example, the present embodiment may simultaneously connect the first movable contact 211A with the first fixed contact 212A, the first movable contact 211B with the first fixed contact 212B, the first movable contact 211C with the first fixed contact 212C, and the first movable contact 211D with the first fixed contact 212D.
When the four movable contacts are connected with the first fixed contacts corresponding to the movable contacts, the device connected to the first connector 400 can be tested in a simulated special environment, and in this embodiment, after the test, the movable contacts are quickly connected with the second fixed contacts corresponding to the movable contacts, so that the device connected to the first connector 400 is detected by the test device connected to the second connector 500.
The embodiment of the utility model provides an equipment failure test switching circuit, can include signal transmitter 100, relay circuit 200, load conversion circuit 300, first connector 400 and second connector 500, signal transmitter 100 with relay circuit 200 electricity is connected, load conversion circuit 300 with relay circuit 200 electricity is connected, first connector 400 and second connector 500 all with relay circuit 200 electricity is connected; the relay circuit 200 includes four switching units 210, each switching unit 210 including a single-pole double-throw switch, wherein the single-pole double-throw switch includes: four pins of the first connector 400 are electrically connected with the first movable contacts of the four switch units 210, respectively, the first fixed contacts of two switch units 210 of the four switch units 210 are electrically connected with the signal transmitter 100, the first fixed contacts of the other two switch units 210 are electrically connected with the load conversion circuit 300, and the four second fixed contacts of each switch unit 210 are electrically connected with four pins of the second connector 500, respectively; the four moving contacts in the relay circuit 200 act simultaneously and identically. The utility model discloses can test the back at the equipment to be tested through special environment, let conventional test equipment detect this equipment to be tested rapidly, make conventional test equipment can detect out this equipment to be tested's short-term trouble.
Optionally, as shown in fig. 2, another device failure test switching circuit provided in the embodiment of the present invention may further include:
the first connector 400 is matched with an interface of a device to be tested, the second connector 500 is matched with an interface of a conventional testing device, and other pins except four pins electrically connected with the movable contacts of the four switch units 210 in the first connector 400 are respectively and electrically connected with other pins except four pins electrically connected with the second fixed contacts of the four switch units 210 in the second connector 500.
Alternatively, the first connector 400 may be a 35-core socket, the 35-core socket including 35 pins.
The numbering of the pins in the first connector 400 may be as shown in fig. 3. Referring to fig. 2 and 3, the pins of the first connector 400, numbered 401, 402, 403 and 404, are electrically connected to the relay circuit 200. Specifically, the pin 401 is connected to the first movable contact 211B, the pin 402 is connected to the first movable contact 211A, the pin 403 is connected to the first movable contact 211C, and the pin 404 is connected to the first movable contact 211D.
Alternatively, the second connector 500 may be a 35-core plug, the 35-core plug including 35 pins.
The numbering of the pins in the second connector 500 may be as shown in fig. 4. Referring to fig. 2 and 4, the pins of the second connector 500, numbered 501, 502, 503 and 504, are connected to the relay circuit 200. Specifically, the pin 501 is connected to the second fixed contact 213B, the pin 502 is connected to the second fixed contact 213A, the pin 503 is connected to the second fixed contact 213C, and the pin 501 is connected to the second fixed contact 213D.
The device to be tested in this embodiment may be a lightning protection analog network disk. The first connector 400 may be a 35-core receptacle that mates with an interface of a lightning protection analog network board. It is understood that the first connector 400 can be matched according to the interface of the device to be tested to be connected, and the embodiment is not further limited herein.
The conventional test device in this embodiment is a device capable of detecting a device to be tested. The second connector 500 may be a 35-core plug that mates with the interface of conventional test equipment. Optionally, the conventional test equipment can be a BT-01U type ZPW-2000A frequency shift equipment complete machine test system.
This embodiment can connect the other pins of the first connector 400 than the pin connected to the relay circuit 200 to the other pins of the second connector 500 than the pin connected to the relay circuit 200. As shown in fig. 2 to 4, the number of pins of the first connector 400 and the second connector 500 is 25, and the pins numbered 405 to 432 in the first connector 400 are connected to the pins numbered 505 to 532 in the second connector 500, respectively. The pins numbered 433, 434, and 435 in the first connector and the pins numbered 533, 534, and 535 in the second connector shown in fig. 2 may be spare pins. It is understood that the number of pin connections of the first connector 400 and the second connector 500 may be determined according to actual needs, and one of them is shown in fig. 2. In this embodiment, the pins of the first connector 400 are connected to the pins of the second connector 500, so that the device under test connected to the first connector 400 is tested by the conventional test equipment connected to the second connector after being tested in a special environment.
Optionally, as shown in fig. 5, the relay circuit 200 in another device failure testing switching circuit provided in the embodiment of the present invention may further include: a switch 230 and an exciting coil 220 are switched,
one end of the switch 230 is connected to one end of the excitation coil 220, the other end of the switch 230 is connected to the positive electrode of the power supply, and the other end of the excitation coil 220 is connected to the negative electrode of the power supply.
The present embodiment can control the action of the movable contact in the switch unit 210 by controlling the closing of the switch 230 to energize or de-energize the exciting coil 220. For example, when the switch 230 is closed, the first movable contact of each switch unit 210 is connected with the first fixed contact, and when the switch 230 is open, the first movable contact of each switch unit 210 is connected with the second fixed contact.
When the switch 230 is closed, the movable contact in each switch unit 210 is electrically connected to the first fixed contact, and when the switch 230 is opened, the movable contact in each switch unit 210 is electrically connected to the second fixed contact. The technician can conveniently and rapidly use the conventional test equipment to detect the equipment to be tested just after being tested in the special environment through the change-over switch 230 of the embodiment, and can detect the short-time fault of the equipment to be tested in some special environments.
Alternatively, as shown in fig. 6, the signal transmitter 100 in another device failure test switching circuit provided by the embodiment of the present invention may include two interfaces,
the first fixed contacts of two switch units 210 of the four switch units 210 are electrically connected to two interfaces of the signal transmitter 100, respectively.
Specifically, the first fixed contact 212A may be electrically connected to the interface 110 of the signal transmitter 100, and the first fixed contact 212B may be electrically connected to the interface 120 of the signal transmitter 100, so that the signal transmitter 100 may transmit the test signal to the relay circuit 200.
Optionally, as shown in fig. 7, the signal transmitter 100 in another device failure test switching circuit provided in the embodiment of the present invention may further include a power interface 130.
It is understood that signal transmitter 100 may include a power interface 130 for accessing a power source.
Optionally, as shown in fig. 8, the load converting circuit 300 in another device failure testing switching circuit provided in the embodiment of the present invention may include: the double-pole-three-throw switch 310 comprises a first movable contact group, a first fixed contact group, a second fixed contact group and a third fixed contact group, wherein the first movable contact group comprises a second movable contact 311 and a third movable contact 312, the first fixed contact group comprises a third fixed contact 313 and a fourth fixed contact 314, the second fixed contact group comprises a fifth fixed contact 315 and a sixth fixed contact 316, and the third fixed contact group comprises a seventh fixed contact 317 and an eighth fixed contact 318.
The second movable contact 311 and the third movable contact 312 are electrically connected to a first fixed contact in the relay circuit 200, respectively, the second movable contact 311 is electrically connected to one end of the first resistor 320, the other end of the first resistor 320 is electrically connected to the sixth fixed contact 316 and the eighth fixed contact 318, respectively, the sixth fixed contact 316 is electrically connected to one end of the second resistor 330, and the other end of the second resistor 330 is electrically connected to the fourth fixed contact 314 and the seventh fixed contact 317, respectively.
The first resistor 320 and the second resistor 330 of the present embodiment may each be a high power resistor of 200 Ω and 200W. When the second movable contact 311 is electrically connected to the third fixed contact 313 and the third movable contact 312 is electrically connected to the fourth fixed contact 314, the first resistor 320 is connected in series with the second resistor 330, and the output resistance of the load conversion circuit 300 is 400 Ω. When the second movable contact 311 is electrically connected to the fifth fixed contact 315 and the third movable contact 312 is electrically connected to the sixth fixed contact 316, the first resistor 320 is disconnected from the second resistor 330, and the output resistance of the load conversion circuit 300 is equal to the first resistor 320, i.e. 200 Ω. When the second movable contact 311 is electrically connected to the seventh fixed contact 317 and the third movable contact 312 is electrically connected to the eighth fixed contact 318, the first resistor 320 is connected in parallel with the second resistor 330, and the output resistance of the load conversion circuit 300 is 100 Ω.
Optionally, as shown in fig. 9, another device failure test switching circuit provided in the embodiment of the present invention may further include: the voltage of the transformer 600 is varied by the voltage of the transformer,
the power output terminal of the transformer 600 is electrically connected to the signal transmitter 100.
Optionally, the power output terminal of the transformer 600 is further electrically connected to the relay circuit 200.
Specifically, the transformer may include a power switch 610, a fuse 620, and a dc output sub-module 630. The dc output sub-module 630 may convert 220V ac power to dc power to provide power to the signal transmitter 100 and the relay circuit 200.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity from another entity without necessarily requiring or implying any actual such relationship or order between such entities. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, article, or apparatus that comprises the element.
All the embodiments in the present specification are described in a related manner, and the same and similar parts among the embodiments may be referred to each other, and each embodiment focuses on the differences from the other embodiments.
The above description is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention shall fall within the protection scope of the present invention.
Claims (10)
1. An equipment failure test switching circuit, comprising: the relay circuit comprises a signal transmitter (100), a relay circuit (200), a load conversion circuit (300), a first connector (400) and a second connector (500), wherein the signal transmitter (100) is electrically connected with the relay circuit (200), the load conversion circuit (300) is electrically connected with the relay circuit (200), and the first connector (400) and the second connector (500) are both electrically connected with the relay circuit (200);
the relay circuit (200) comprises four switching units (210), each switching unit (210) comprising a single pole double throw switch, wherein the single pole double throw switch comprises: four pins of the first connector (400) are electrically connected with the first movable contacts of four switch units (210) respectively, the first fixed contacts of two switch units (210) in the four switch units (210) are electrically connected with the signal transmitter (100), the first fixed contacts of the other two switch units (210) are electrically connected with the load conversion circuit (300), and the four second fixed contacts in each switch unit (210) are electrically connected with four pins of the second connector (500) respectively;
the four movable contacts in the relay circuit (200) act simultaneously and act the same.
2. The device fail test switching circuit of claim 1, further comprising:
the first connector (400) is matched with an interface of equipment to be tested, the second connector (500) is matched with an interface of conventional test equipment, and other pins except four pins electrically connected with movable contacts of four switch units (210) in the first connector (400) are respectively and electrically connected with other pins except four pins electrically connected with second fixed contacts of the four switch units (210) in the second connector (500).
3. The device failure test switching circuit of claim 1, wherein the relay circuit (200) further comprises: a switch (230) and an excitation coil (220),
one end of the change-over switch (230) is connected with one end of the excitation coil (220), the other end of the change-over switch (230) is connected with the positive pole of a power supply, and the other end of the excitation coil (220) is connected with the negative pole of the power supply;
when the change-over switch (230) is closed, the movable contact in each switch unit (210) is electrically connected with the first fixed contact, and when the change-over switch (230) is opened, the movable contact in each switch unit (210) is electrically connected with the second fixed contact.
4. The device failure test switching circuit according to claim 1, wherein the signal transmitter (100) comprises two interfaces,
the first fixed contacts of two switch units (210) of the four switch units (210) are respectively electrically connected with two interfaces of the signal transmitter (100).
5. The device failure test switching circuit of claim 1, wherein the load conversion circuit (300) comprises: the double-pole three-throw switch comprises a double-pole three-throw switch (310), a first resistor (320) and a second resistor (330), wherein the double-pole three-throw switch (310) comprises a first movable contact group, a first fixed contact group, a second fixed contact group and a third fixed contact group, the first movable contact group comprises a second movable contact (311) and a third movable contact (312), the first fixed contact group comprises a third fixed contact (313) and a fourth fixed contact (314), the second fixed contact group comprises a fifth fixed contact (315) and a sixth fixed contact (316), the third fixed contact group comprises a seventh fixed contact (317) and an eighth fixed contact (318),
the second movable contact (311) and the third movable contact (312) are electrically connected with a first fixed contact in the relay circuit (200) respectively, the second movable contact (311) is electrically connected with one end of the first resistor (320), the other end of the first resistor (320) is electrically connected with the sixth fixed contact (316) and the eighth fixed contact (318) respectively, the sixth fixed contact (316) is electrically connected with one end of the second resistor (330), and the other end of the second resistor (330) is electrically connected with the fourth fixed contact (314) and the seventh fixed contact (317) respectively.
6. The device fail test switching circuit of claim 1, wherein the signal transmitter (100) comprises a power interface (130).
7. The device fail-test switching circuit of claim 1, wherein the first connector (400) is a 35-core socket, the 35-core socket including 35 pins.
8. The device fail-test switching circuit of claim 1, wherein the second connector (500) is a 35-core plug, the 35-core plug including 35 pins.
9. The device fail test switching circuit of claim 1, further comprising: a transformer for transforming the voltage of the power source,
the power output end of the transformer (600) is electrically connected with the signal transmitter (100).
10. The device failure test switching circuit of claim 9, wherein the power output of the transformer (600) is further electrically connected to the relay circuit (200).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921844423.6U CN210923778U (en) | 2019-10-30 | 2019-10-30 | Equipment fault test switching circuit |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921844423.6U CN210923778U (en) | 2019-10-30 | 2019-10-30 | Equipment fault test switching circuit |
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| CN210923778U true CN210923778U (en) | 2020-07-03 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111968344A (en) * | 2020-07-31 | 2020-11-20 | 中国铁道科学研究院集团有限公司 | Signal interface detection equipment and method for railway earthquake early warning monitoring system |
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2019
- 2019-10-30 CN CN201921844423.6U patent/CN210923778U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111968344A (en) * | 2020-07-31 | 2020-11-20 | 中国铁道科学研究院集团有限公司 | Signal interface detection equipment and method for railway earthquake early warning monitoring system |
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