CN210863881U - Improved generation segmentation return circuit resistance tester - Google Patents
Improved generation segmentation return circuit resistance tester Download PDFInfo
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- CN210863881U CN210863881U CN201921011676.5U CN201921011676U CN210863881U CN 210863881 U CN210863881 U CN 210863881U CN 201921011676 U CN201921011676 U CN 201921011676U CN 210863881 U CN210863881 U CN 210863881U
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Abstract
The utility model discloses an improved generation segmentation return circuit resistance tester, include: constant current source, regulating unit, voltage sampling unit, current sampling unit, AD converting circuit, single chip microcomputer controller unit, the positive pole of constant current source is connected with the first junction of resistance under test, the negative pole of constant current source is connected with the fourth junction of resistance under test, the constant current source constitutes current loop with resistance under test, and the output of current sampling unit is connected to AD converting circuit's second input, the output of voltage sampling unit with be connected to AD converting circuit's first input, AD converting circuit's output is connected to single chip microcomputer controller unit's input. The utility model discloses an adjusting unit's design has increased the test node when loop resistance tests, utilizes the adjusting unit in the fourth contact unsettled, has realized the detection whether good to the contact of binding clip, the utility model provides high detection efficiency, the practicality is strong.
Description
Technical Field
The utility model relates to a test technical field, more specifically relates to an improved generation segmentation return circuit resistance tester.
Background
The loop resistance of the power equipment is an important parameter for representing whether the connection of the conductive loop is good or not, and the value of the loop resistance directly influences the current carrying capacity and the short-circuit current breaking capacity during normal operation, so that the loop resistance tester becomes a commonly used test instrument for a power system. In the use of the current loop resistance tester, due to the problems of single test contact, poor contact and the like of the tester, the working efficiency of workers is seriously influenced because the junction clamp contact of a test wire needs to be changed for many times by using personnel, and the problem is most obvious in the maintenance and the overhaul of the disconnecting switch equipment of 110kV or more in a transformer substation. During the isolator maintenance of staff carrying out 110kV and above, because the binding clip contact failure of test voltage line leads to discharging to and change the binding clip contact and confirm the isolator point that generates heat, need to climb on the isolator framework many times and operate, cause duplicative work, wasted a large amount of operating time, and increased the potential safety hazard of the operation of ascending a height.
SUMMERY OF THE UTILITY MODEL
The utility model discloses an overcome the defect that whether the circuit resistance testing arrangement test contact among the above-mentioned prior art is single, can't detect the binding clip contact good, detection efficiency is low, provide an improved generation segmentation return circuit resistance tester.
In order to solve the technical problem, the technical scheme of the utility model as follows:
an improved segmented loop resistance tester, comprising: a constant current source, a regulating unit, a voltage sampling unit, a current sampling unit, an AD conversion circuit and a singlechip controller unit,
the anode of the constant current source is connected with the first node of the tested resistor, the cathode of the constant current source is connected with the fourth node of the tested resistor, the constant current source and the tested resistor form a current loop, the first contact of the adjusting unit is connected with the anode of the constant current source, the second contact of the adjusting unit is connected with the second node of the tested resistor, the third contact of the adjusting unit is connected with the third node of the tested resistor, the fixed end of the variable contact of the adjusting unit is electrically connected with the input end of the current sampling unit, the output end of the current sampling unit is connected to the second input end of the AD conversion circuit, the fixed end of the variable contact of the adjusting unit is connected with the anode of the input end of the voltage sampling unit, the cathode of the input end of the voltage sampling unit is connected to the fourth node of the tested resistor, and the output end of the voltage sampling unit is connected to the first input end of the AD conversion circuit, and the output end of the AD conversion circuit is connected to the input end of the singlechip controller unit.
The utility model discloses an exert the constant current source at the both ends of being surveyed resistance, select the back through regulating unit adjustment contact, utilize voltage sampling unit to gather the resistance both ends voltage that inserts the return circuit, utilize current sampling unit return current, voltage and electric current pass through AD converting circuit and insert singlechip control chip input, the utility model discloses in the regulating unit with the unsettled reference contact of regarding as of fourth contact, when the regulation end adjustment of variable contact is when the fourth contact, the regulating unit is the state of opening circuit with the resistance that awaits measuring, and voltage acquisition value is zero, and return circuit voltage value is zero promptly, when the regulation end of variable contact and first contact or second contact or during arbitrary third contact connection, if voltage acquisition value is zero, then demonstrate the return circuit resistance test node contact failure who corresponds the connection with the contact, the binding clip contact failure promptly.
In this scheme, the current sampling unit includes: the current sensor JLB-11, the amplifier U4B, the amplifier U4B, the amplifier U5, the resistor R15, the resistor R16, the resistor R12, the resistor R11 and the capacitor C1;
the current sampling unit is specifically connected as follows: the fixed end of the variable contact of the adjusting unit is connected to the primary side input end of a current sensor JLB-11, the output end of the current sensor JLB-11 is connected to the non-inverting input end of an amplifier U4B, the inverting input end of the amplifier U4B is connected to the output end of the amplifier U4B, the positive power supply input end of the amplifier U4B is connected to a positive 12V power supply, the negative power supply input end of the amplifier U4B is connected to a negative 12V power supply, the output end of the amplifier U4B is connected to one end of a resistor R15, the other end of a resistor R15 is respectively connected to one end of a resistor R16 and one end of a capacitor C1, the other end of the capacitor C1 is grounded, the other end of the resistor R16 is connected to the positive input end of an amplifier U5, the directional input end of the amplifier U5 is respectively connected to one end of a resistor R12 and one end of a resistor R11, the other end of the, the positive power supply input end of the amplifier U5 is connected with a positive 12V power supply, the negative power supply input end of the amplifier U5 is connected with a negative 12V power supply, and the output end of the amplifier U5 is connected with the second input end AIN2 of the AD conversion circuit.
In this scheme, the voltage sampling unit includes: the amplifier U1A, the amplifier U2B, the amplifier U2, the resistor R1, the resistor R2, the resistor R3, the resistor R4, the resistor R5, the resistor R6 and the resistor R7;
the voltage sampling unit is specifically connected as follows:
the fixed end of the variable contact of the adjusting unit is connected to the positive input end of an amplifier U1A, the negative input end of the amplifier U1A is connected to one end of a resistor R1 and one end of a resistor R2, the other end of the resistor R2 is connected to the output end of an amplifier U1A, the other end of the resistor R1 is connected to the negative input end of an amplifier U2B and one end of a resistor R3, the other end of the resistor R3 is connected to the output end of an amplifier U2B, the output end of the amplifier U1A is connected to one end of a resistor R4, the other end of the resistor R4 is connected to one end of a resistor R5 and the negative input end of an amplifier U2, the other end of the resistor R5 is connected to the output end of an amplifier U2, the positive input end of the amplifier U2B is connected to the negative pole of a constant current source, the output end of the amplifier U2B is connected to one end of a resistor R6, the other end of the resistor, the other end of the resistor R7 is grounded, the output end of the amplifier U2 is connected to the first input end AIN1 of the AD conversion circuit, the positive power input ends of the amplifiers U1A and U2B are connected to a positive 15V power supply, the negative power input ends of the amplifiers U1A and U2B are connected to a negative 15V power supply, the positive power input end of the amplifier U2 is connected to a positive 12V power supply, and the negative power input end of the amplifier U2 is connected to a negative 12V power supply.
In the scheme, the AD conversion circuit adopts a conversion chip AD 7714.
In this scheme, AD converting circuit and single chip controller unit include: the circuit comprises a singlechip control chip, an AD conversion chip AD7714, a capacitor C2, a capacitor C3, a capacitor C4, a capacitor C5, a resistor R8, a resistor R9, a resistor R10, a diode D3, a crystal oscillator Z2 and an optical coupler 6N 137;
the connection circuit of the AD conversion circuit and the singlechip control unit is specifically as follows:
the 8 pins of the AD conversion chip AD7714, namely the second input end AIN2 of the AD conversion circuit, are connected to the output end of the amplifier U5, the 7 pins of the AD conversion chip AD7714, namely the first input end AIN1 of the AD conversion circuit, are connected to the output end of the amplifier U2, the 12 pins, 11 pins and 5 pins of the AD conversion chip AD7714 are connected to a positive 5V power supply, the 5 pins of the AD conversion chip AD7714 are simultaneously connected to one end of a capacitor C3 and one end of a capacitor C2, the other end of the C7 and the other end of a capacitor C2 are grounded, the 1 pin, 22 pin, 20 pin and 6 pin of the AD conversion chip AD7714 are correspondingly connected to the 16 pin, 17 pin, 20 pin and 14 pin of a singlechip control chip respectively, the 17 pin, 18 pin, 14 pin, 13 pin, 24 pin, 19 pin and 4 pin of the AD conversion chip AD7714 are grounded, the 15 pin of the AD conversion chip AD7714 is respectively connected to one end of a resistor R8 and the cathode of a diode, the anode of the diode D3 is grounded, the other end of the resistor R8 is connected to a positive 5V power supply, the pins 2 of the AD conversion chip AD7714 are respectively connected to one end of the crystal oscillator Z2 and one end of the capacitor C5, the other end of the capacitor C5 is grounded and is simultaneously connected to one end of the capacitor C4, the other end of the capacitor C4 is connected to the other end of the crystal oscillator Z2, the pin 21 of the AD conversion chip AD7714 is connected to the cathode of the optical coupler 6N137, the anode of the optical coupler 6N137 is connected to one end of the resistor R8, the other end of the resistor R9 is connected to a positive 3.3V power supply, the enable pins of the optical coupler 6N137 are respectively connected to one end of the resistor R10 and the pin 50 of the monolithic computer control chip, and the other end of the resistor R.
In the scheme, the single chip microcomputer control chip is an STM32F103RBT6 chip.
In this scheme, single chip microcomputer controller unit still includes crystal oscillator circuit and auxiliary circuit, crystal oscillator circuit and auxiliary circuit include:
a resistor R11, a crystal oscillator Y1, a diode D2, a battery BT1, a capacitor C10, a capacitor C9, a capacitor C8, a capacitor C7, a capacitor C6,
The concrete connection is as follows: the 5 pins of the singlechip control chip are respectively connected to one end of a resistor R11, one end of a crystal oscillator Y1 and one end of a capacitor C6, the other end of the resistor R11, the other end of the crystal oscillator Y1 and the 6 pins of the singlechip control chip are connected to one end of a capacitor C7, and the other end of the capacitor C6 and the other end of the capacitor C7 are both grounded;
the pin 1 of the singlechip control chip is connected to the cathode of a diode D2, the anode of the diode D2 is connected to the anode of a battery BT1, and the cathode of the battery BT1 is grounded;
the 32 feet, the 48 feet, the 64 feet, the 19 feet and the 13 feet of the singlechip control chip are all connected to one end of a capacitor C10, one end of the capacitor C10 is connected to a positive 3.3V power supply, the other end of the capacitor C10 is connected to the 31 feet, the 47 feet, the 63 feet, the 18 feet and the 12 feet of the singlechip control chip respectively, and the other end of the capacitor C10 is grounded simultaneously.
Compared with the prior art, the utility model discloses technical scheme's beneficial effect is:
the utility model discloses an adjusting unit's design has increased the test node when loop resistance tests, utilizes the adjusting unit in the fourth contact unsettled, has realized the detection whether good to the contact of binding clip, the utility model provides high detection efficiency, the practicality is strong.
Drawings
Fig. 1 is a schematic diagram of an improved segmented loop resistance tester.
Fig. 2 is a schematic diagram of a current sampling circuit.
Fig. 3 is a schematic diagram of a voltage sampling circuit.
Fig. 4 is a schematic circuit diagram of the connection between the AD converter circuit and the single chip microcomputer control chip.
Fig. 5 is a schematic diagram of the working connection of an improved segmented loop resistance tester.
Detailed Description
The drawings are for illustrative purposes only and are not to be construed as limiting the patent;
for the purpose of better illustrating the embodiments, certain features of the drawings may be omitted, enlarged or reduced, and do not represent the size of an actual product;
it will be understood by those skilled in the art that certain well-known structures in the drawings and descriptions thereof may be omitted.
The technical solution of the present invention will be further explained with reference to the accompanying drawings and examples.
Example 1
As shown in fig. 1, an improved segmented loop resistance tester comprises: a constant current source, a regulating unit, a voltage sampling unit, a current sampling unit, an AD conversion circuit and a singlechip controller unit,
the anode of the constant current source is connected with the first node of the tested resistor, the cathode of the constant current source is connected with the fourth node of the tested resistor, the constant current source and the tested resistor form a current loop, the first contact of the adjusting unit is connected with the anode of the constant current source, the second contact of the adjusting unit is connected with the second node of the tested resistor, the third contact of the adjusting unit is connected with the third node of the tested resistor, the fixed end of the variable contact of the adjusting unit is electrically connected with the input end of the current sampling unit, the output end of the current sampling unit is connected to the second input end of the AD conversion circuit, the fixed end of the variable contact of the adjusting unit is connected with the anode of the input end of the voltage sampling unit, the cathode of the input end of the voltage sampling unit is connected to the fourth node of the tested resistor, and the output end of the voltage sampling unit is connected to the first input end of the AD conversion circuit, and the output end of the AD conversion circuit is connected to the input end of the singlechip controller unit.
It should be noted that the utility model discloses can be at single chip microcomputer controller unit connection indicating unit, like display screen indicating circuit for show single chip microcomputer controller unit's processing result, single chip microcomputer controller unit can also set up reputation indicating circuit (like bee calling organ and LED pilot lamp) and be used for the warning suggestion of binding clip contact failure simultaneously. And simultaneously the utility model discloses in can also communicate interface unit and single chip microcomputer controller unit connection for the outside is through communication interface historical test data.
The constant current source is applied to the two ends of the resistance to be measured, and after the contact is adjusted and selected by the adjusting unit, the voltage sampling unit is used for collecting the voltage at two ends of the resistor connected into the loop, the current sampling unit is used for sampling the loop current, the voltage and the current are connected to the input end of the singlechip control chip through an A/D conversion circuit, the fourth contact is suspended in the air as the reference contact in the adjusting unit of the utility model, when the adjusting end of the variable contact is adjusted on the fourth contact, the adjusting unit and the resistor to be tested are in an open circuit state, the voltage acquisition value is zero, namely, the loop voltage value is zero, when the adjusting end of the variable contact is connected with the first contact or the second contact or any third contact, if the voltage acquisition value is zero, the contact point is indicated to be in poor contact with the loop resistance test node correspondingly connected with the contact point, namely the contact point of the jointing clamp is in poor contact, and the tester gives an alarm prompt.
As shown in fig. 2, in this scheme, the current sampling unit includes: the current sensor JLB-11, the amplifier U4B, the amplifier U4B, the amplifier U5, the resistor R15, the resistor R16, the resistor R12, the resistor R11 and the capacitor C1;
the current sampling unit is specifically connected as follows: the fixed end of the variable contact of the adjusting unit is connected to the primary side input end of a current sensor JLB-11, the output end of the current sensor JLB-11 is connected to the non-inverting input end of an amplifier U4B, the inverting input end of the amplifier U4B is connected to the output end of the amplifier U4B, the positive power supply input end of the amplifier U4B is connected to a positive 12V power supply, the negative power supply input end of the amplifier U4B is connected to a negative 12V power supply, the output end of the amplifier U4B is connected to one end of a resistor R15, the other end of a resistor R15 is respectively connected to one end of a resistor R16 and one end of a capacitor C1, the other end of the capacitor C1 is grounded, the other end of the resistor R16 is connected to the positive input end of an amplifier U5, the directional input end of the amplifier U5 is respectively connected to one end of a resistor R12 and one end of a resistor R11, the other end of the, the positive power supply input end of the amplifier U5 is connected with a positive 12V power supply, the negative power supply input end of the amplifier U5 is connected with a negative 12V power supply, and the output end of the amplifier U5 is connected with the second input end AIN2 of the AD conversion circuit.
As shown in fig. 3, in this embodiment, the voltage sampling unit includes: the amplifier U1A, the amplifier U2B, the amplifier U2, the resistor R1, the resistor R2, the resistor R3, the resistor R4, the resistor R5, the resistor R6 and the resistor R7;
the voltage sampling unit is specifically connected as follows:
the fixed end of the variable contact of the adjusting unit is connected to the positive input end of an amplifier U1A, the negative input end of the amplifier U1A is connected to one end of a resistor R1 and one end of a resistor R2, the other end of the resistor R2 is connected to the output end of an amplifier U1A, the other end of the resistor R1 is connected to the negative input end of an amplifier U2B and one end of a resistor R3, the other end of the resistor R3 is connected to the output end of an amplifier U2B, the output end of the amplifier U1A is connected to one end of a resistor R4, the other end of the resistor R4 is connected to one end of a resistor R5 and the negative input end of an amplifier U2, the other end of the resistor R5 is connected to the output end of an amplifier U2, the positive input end of the amplifier U2B is connected to the negative pole of a constant current source, the output end of the amplifier U2B is connected to one end of a resistor R6, the other end of the resistor, the other end of the resistor R7 is grounded, the output end of the amplifier U2 is connected to the first input end AIN1 of the AD conversion circuit, the positive power input ends of the amplifiers U1A and U2B are connected to a positive 15V power supply, the negative power input ends of the amplifiers U1A and U2B are connected to a negative 15V power supply, the positive power input end of the amplifier U2 is connected to a positive 12V power supply, and the negative power input end of the amplifier U2 is connected to a negative 12V power supply.
In the scheme, the AD conversion circuit adopts a conversion chip AD 7714.
As shown in fig. 4, in this scheme, the AD conversion circuit and the single chip controller unit include: the circuit comprises a singlechip control chip, an AD conversion chip AD7714, a capacitor C2, a capacitor C3, a capacitor C4, a capacitor C5, a resistor R8, a resistor R9, a resistor R10, a diode D3, a crystal oscillator Z2 and an optical coupler 6N 137;
the connection circuit of the AD conversion circuit and the singlechip control unit is specifically as follows:
the 8 pins of the AD conversion chip AD7714, namely the second input end AIN2 of the AD conversion circuit, are connected to the output end of the amplifier U5, the 7 pins of the AD conversion chip AD7714, namely the first input end AIN1 of the AD conversion circuit, are connected to the output end of the amplifier U2, the 12 pins, 11 pins and 5 pins of the AD conversion chip AD7714 are connected to a positive 5V power supply, the 5 pins of the AD conversion chip AD7714 are simultaneously connected to one end of a capacitor C3 and one end of a capacitor C2, the other end of the C7 and the other end of a capacitor C2 are grounded, the 1 pin, 22 pin, 20 pin and 6 pin of the AD conversion chip AD7714 are correspondingly connected to the 16 pin, 17 pin, 20 pin and 14 pin of a singlechip control chip respectively, the 17 pin, 18 pin, 14 pin, 13 pin, 24 pin, 19 pin and 4 pin of the AD conversion chip AD7714 are grounded, the 15 pin of the AD conversion chip AD7714 is respectively connected to one end of a resistor R8 and the cathode of a diode, the anode of the diode D3 is grounded, the other end of the resistor R8 is connected to a positive 5V power supply, the pins 2 of the AD conversion chip AD7714 are respectively connected to one end of the crystal oscillator Z2 and one end of the capacitor C5, the other end of the capacitor C5 is grounded and is simultaneously connected to one end of the capacitor C4, the other end of the capacitor C4 is connected to the other end of the crystal oscillator Z2, the pin 21 of the AD conversion chip AD7714 is connected to the cathode of the optical coupler 6N137, the anode of the optical coupler 6N137 is connected to one end of the resistor R8, the other end of the resistor R9 is connected to a positive 3.3V power supply, the enable pins of the optical coupler 6N137 are respectively connected to one end of the resistor R10 and the pin 50 of the monolithic computer control chip, and the other end of the resistor R.
In the scheme, the single chip microcomputer control chip is an STM32F103RBT6 chip.
In this scheme, single chip microcomputer controller unit still includes crystal oscillator circuit and auxiliary circuit, crystal oscillator circuit and auxiliary circuit include:
a resistor R11, a crystal oscillator Y1, a diode D2, a battery BT1, a capacitor C10, a capacitor C9, a capacitor C8, a capacitor C7, a capacitor C6,
The concrete connection is as follows: the 5 pins of the singlechip control chip are respectively connected to one end of a resistor R11, one end of a crystal oscillator Y1 and one end of a capacitor C6, the other end of the resistor R11, the other end of the crystal oscillator Y1 and the 6 pins of the singlechip control chip are connected to one end of a capacitor C7, and the other end of the capacitor C6 and the other end of the capacitor C7 are both grounded;
the pin 1 of the singlechip control chip is connected to the cathode of a diode D2, the anode of the diode D2 is connected to the anode of a battery BT1, and the cathode of the battery BT1 is grounded;
the 32 feet, the 48 feet, the 64 feet, the 19 feet and the 13 feet of the singlechip control chip are all connected to one end of a capacitor C10, one end of the capacitor C10 is connected to a positive 3.3V power supply, the other end of the capacitor C10 is connected to the 31 feet, the 47 feet, the 63 feet, the 18 feet and the 12 feet of the singlechip control chip respectively, and the other end of the capacitor C10 is grounded simultaneously.
The procedure of example 1 was used as follows:
as shown in FIG. 5, when the isolating switch of 110kV or above is used to perform maintenance and repair work, after the testing line is first used to connect the conductive loop of the isolating switch, the jointing clamp joints of the testing current line are the two ends (i.e. B point and M point) of the isolating switch, and the jointing clamp joints of the testing voltage line comprise three points of easy-heating points (wiring board, connecting point of military cap and conductive arm, and connecting point of isolating switch contact finger) of the isolating switch, wherein B point is the first node, C point is the second node, D point is the third node, M point is the fourth node in FIG. 5,
connecting the adjusting unitsA first contact point connected to the positive electrode of the constant current source,
a second contact of the regulating unit is connected,
a third contact of the regulating unit is connected,
the testing device is connected to the negative electrode of the constant current source, before testing, the adjusting end of the variable contact of the adjusting unit is adjusted to the first contact, the second contact and the third contact, whether the junction clamps of the corresponding B point, C point and D point are in normal contact or not is judged, after the testing is finished, the power supply is switched on to start testing, the first contact is switched on by selecting the whole set of resistance measuring function, the whole set of resistance of the isolating switch is measured, and whether the isolating switch has the defect that the disconnecting switch generates heat due to overlarge resistance or not is judged; if the heating defect exists, the function of measuring the segmented resistance is selected, the contact selection of the switch selector is automatically adjusted, and the segmented loop resistance measurement is carried out on three easily-heating points of the isolating switch, so that the accurate position of the heating point of the isolating switch is determined according to the resistance values of the three segments.
The same or similar reference numerals correspond to the same or similar parts;
the terms describing positional relationships in the drawings are for illustrative purposes only and are not to be construed as limiting the patent;
it is obvious that the above embodiments of the present invention are only examples for clearly illustrating the present invention, and are not limitations to the embodiments of the present invention. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. Any modification, equivalent replacement, and improvement made within the spirit and principle of the present invention should be included in the protection scope of the claims of the present invention.
Claims (7)
1. An improved segmented loop resistance tester, comprising: a constant current source, a regulating unit, a voltage sampling unit, a current sampling unit, an AD conversion circuit and a singlechip controller unit,
the anode of the constant current source is connected with the first node of the tested resistor, the cathode of the constant current source is connected with the fourth node of the tested resistor, the constant current source and the tested resistor form a current loop, the first contact of the adjusting unit is connected with the anode of the constant current source, the second contact of the adjusting unit is connected with the second node of the tested resistor, the third contact of the adjusting unit is connected with the third node of the tested resistor, the fixed end of the variable contact of the adjusting unit is electrically connected with the input end of the current sampling unit, the output end of the current sampling unit is connected to the second input end of the AD conversion circuit, the fixed end of the variable contact of the adjusting unit is connected with the anode of the input end of the voltage sampling unit, the cathode of the input end of the voltage sampling unit is connected to the fourth node of the tested resistor, and the output end of the voltage sampling unit is connected to the first input end of the AD conversion circuit, and the output end of the AD conversion circuit is connected to the input end of the singlechip controller unit.
2. The improved segmented loop resistance tester as recited in claim 1, wherein said current sampling unit comprises: the current sensor JLB-11, the amplifier U4B, the amplifier U5, the resistor R15, the resistor R16, the resistor R12, the resistor R11 and the capacitor C1;
the current sampling unit is specifically connected as follows: the fixed end of the variable contact of the adjusting unit is connected to the primary side input end of a current sensor JLB-11, the output end of the current sensor JLB-11 is connected to the non-inverting input end of an amplifier U4B, the inverting input end of the amplifier U4B is connected to the output end of the amplifier U4B, the positive power supply input end of the amplifier U4B is connected to a positive 12V power supply, the negative power supply input end of the amplifier U4B is connected to a negative 12V power supply, the output end of the amplifier U4B is connected to one end of a resistor R15, the other end of a resistor R15 is respectively connected to one end of a resistor R16 and one end of a capacitor C1, the other end of the capacitor C1 is grounded, the other end of the resistor R16 is connected to the positive input end of an amplifier U5, the directional input end of the amplifier U5 is respectively connected to one end of a resistor R12 and one end of a resistor R11, the other end of the, the positive power supply input end of the amplifier U5 is connected with a positive 12V power supply, the negative power supply input end of the amplifier U5 is connected with a negative 12V power supply, and the output end of the amplifier U5 is connected with the second input end AIN2 of the AD conversion circuit.
3. The improved segmented loop resistance tester as recited in claim 1, wherein said voltage sampling unit comprises: the amplifier U1A, the amplifier U2B, the amplifier U2, the resistor R1, the resistor R2, the resistor R3, the resistor R4, the resistor R5, the resistor R6 and the resistor R7;
the voltage sampling unit is specifically connected as follows:
the fixed end of the variable contact of the adjusting unit is connected to the positive input end of an amplifier U1A, the negative input end of the amplifier U1A is connected to one end of a resistor R1 and one end of a resistor R2, the other end of the resistor R2 is connected to the output end of an amplifier U1A, the other end of the resistor R1 is connected to the negative input end of an amplifier U2B and one end of a resistor R3, the other end of the resistor R3 is connected to the output end of an amplifier U2B, the output end of the amplifier U1A is connected to one end of a resistor R4, the other end of the resistor R4 is connected to one end of a resistor R5 and the negative input end of an amplifier U2, the other end of the resistor R5 is connected to the output end of an amplifier U2, the positive input end of the amplifier U2B is connected to the negative pole of a constant current source, the output end of the amplifier U2B is connected to one end of a resistor R6, the other end of the resistor, the other end of the resistor R7 is grounded, the output end of the amplifier U2 is connected to the first input end AIN1 of the AD conversion circuit, the positive power input ends of the amplifiers U1A and U2B are connected to a positive 15V power supply, the negative power input ends of the amplifiers U1A and U2B are connected to a negative 15V power supply, the positive power input end of the amplifier U2 is connected to a positive 12V power supply, and the negative power input end of the amplifier U2 is connected to a negative 12V power supply.
4. The improved segmented loop resistance tester as claimed in claim 1, wherein said AD conversion circuit employs a conversion chip AD 7714.
5. The improved segmented loop resistance tester as recited in any one of claims 1-4, wherein the AD conversion circuit and the SCM controller unit comprises: the circuit comprises a singlechip control chip, an AD conversion chip AD7714, a capacitor C2, a capacitor C3, a capacitor C4, a capacitor C5, a resistor R8, a resistor R9, a resistor R10, a diode D3, a crystal oscillator Z2 and an optical coupler 6N 137;
the AD conversion circuit and the singlechip control unit are specifically connected as follows:
the 8 pins of the AD conversion chip AD7714, namely the second input end AIN2 of the AD conversion circuit, are connected to the output end of the amplifier U5, the 7 pins of the AD conversion chip AD7714, namely the first input end AIN1 of the AD conversion circuit, are connected to the output end of the amplifier U2, the 12 pins, 11 pins and 5 pins of the AD conversion chip AD7714 are connected to a positive 5V power supply, the 5 pins of the AD conversion chip AD7714 are simultaneously connected to one end of a capacitor C3 and one end of a capacitor C2, the other end of the C7 and the other end of a capacitor C2 are grounded, the 1 pin, 22 pin, 20 pin and 6 pin of the AD conversion chip AD7714 are correspondingly connected to the 16 pin, 17 pin, 20 pin and 14 pin of a singlechip control chip respectively, the 17 pin, 18 pin, 14 pin, 13 pin, 24 pin, 19 pin and 4 pin of the AD conversion chip AD7714 are grounded, the 15 pin of the AD conversion chip AD7714 is respectively connected to one end of a resistor R8 and the cathode of a diode, the anode of the diode D3 is grounded, the other end of the resistor R8 is connected to a positive 5V power supply, the pins 2 of the AD conversion chip AD7714 are respectively connected to one end of the crystal oscillator Z2 and one end of the capacitor C5, the other end of the capacitor C5 is grounded and is simultaneously connected to one end of the capacitor C4, the other end of the capacitor C4 is connected to the other end of the crystal oscillator Z2, the pin 21 of the AD conversion chip AD7714 is connected to the cathode of the optical coupler 6N137, the anode of the optical coupler 6N137 is connected to one end of the resistor R8, the other end of the resistor R9 is connected to a positive 3.3V power supply, the enable pins of the optical coupler 6N137 are respectively connected to one end of the resistor R10 and the pin 50 of the monolithic computer control chip, and the other end of the resistor R.
6. An improved segmented loop resistance tester as claimed in claim 5, wherein said single chip microcomputer control chip is STM32F103RBT6 chip.
7. The improved segmented loop resistance tester as recited in claim 6, wherein the single chip controller unit further comprises a crystal oscillator circuit and an auxiliary circuit, the crystal oscillator circuit and the auxiliary circuit comprising:
a resistor R11, a crystal oscillator Y1, a diode D2, a battery BT1, a capacitor C10, a capacitor C9, a capacitor C8, a capacitor C7, a capacitor C6,
The concrete connection is as follows: the 5 pins of the singlechip control chip are respectively connected to one end of a resistor R11, one end of a crystal oscillator Y1 and one end of a capacitor C6, the other end of the resistor R11, the other end of the crystal oscillator Y1 and the 6 pins of the singlechip control chip are connected to one end of a capacitor C7, and the other end of the capacitor C6 and the other end of the capacitor C7 are both grounded;
pins 3 of the singlechip control chip are respectively connected to one end of a crystal oscillator Y2 and one end of a capacitor C8, the other end of the capacitor C8 is grounded, pins 4 of the singlechip control chip are respectively connected to the other end of the crystal oscillator Y2 and one end of a capacitor C9, and the other end of the capacitor C9 is grounded;
the pin 1 of the singlechip control chip is connected to the cathode of a diode D2, the anode of the diode D2 is connected to the anode of a battery BT1, and the cathode of the battery BT1 is grounded;
the 32 feet, the 48 feet, the 64 feet, the 19 feet and the 13 feet of the singlechip control chip are all connected to one end of a capacitor C10, one end of the capacitor C10 is connected to a positive 3.3V power supply, the other end of the capacitor C10 is connected to the 31 feet, the 47 feet, the 63 feet, the 18 feet and the 12 feet of the singlechip control chip respectively, and the other end of the capacitor C10 is grounded simultaneously.
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| CN110187186A (en) * | 2019-06-28 | 2019-08-30 | 广东电网有限责任公司 | A kind of modified segmentation circuit resistance tester |
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