CN210780681U - Auxiliary test tool and test system for reducing component power repeatability test - Google Patents
Auxiliary test tool and test system for reducing component power repeatability test Download PDFInfo
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- CN210780681U CN210780681U CN201922194800.2U CN201922194800U CN210780681U CN 210780681 U CN210780681 U CN 210780681U CN 201922194800 U CN201922194800 U CN 201922194800U CN 210780681 U CN210780681 U CN 210780681U
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Abstract
The utility model discloses a reduce subassembly power repeatability test's auxiliary test frock and test system, auxiliary test frock includes frock casing, contact subassembly, first positive circuit and first negative pole circuit, the contact subassembly includes contact A, contact B, contact C, contact D, contact E and contact F, contact A contact B and contact C parallel connection to first positive circuit, contact D contact E and contact F parallel connection to first negative pole circuit. The utility model discloses four test circuits (two positive poles: electric current, voltage, two negative poles: electric current, voltage) that draw forth the power tester independently connect, can guarantee the test resistance change of front end and rear end like this to isolate current-voltage when testing, the data stability when guaranteeing the test, thereby reach accurate test effect, can not cause the subassembly because of the kickdown that current-voltage fluctuates and cause.
Description
Technical Field
The utility model relates to a solar cell field, concretely relates to reduce supplementary test fixture and test system of repeated shape test of subassembly power.
Background
In the power test procedure of the photovoltaic module, in order to save labor and avoid the problem of manual repeated wire plugging and unplugging, an auxiliary test tool is mostly installed on the photovoltaic module, and a probe of the test equipment is automatically contacted with a conductive metal sheet on the auxiliary test tool, so that the electric connection with a corresponding joint of the photovoltaic module is realized, and the wiring operation before the test is finished.
In the prior art, an electronic load (tester) for testing and a circuit for testing are spliced through a positive electrode and a negative electrode and then connected to the positive electrode and the negative electrode of a photovoltaic assembly, during testing, due to factors such as current and voltage transmission, contact resistance and series resistance, two data can be directly separated out through the filtering function of the electronic load, the effect of accurate testing is achieved, after an auxiliary testing tool and a probe are added, interference uncertainty in current and voltage transmission is increased due to oxidation of a contact surface, contact area and the like, the tested data is suddenly changed, and downshifting of the photovoltaic assembly is generated.
Disclosure of Invention
The utility model aims at providing an auxiliary test frock and test system for reducing repeated shape test of subassembly power can effectively avoid the power fluctuation of subassembly when power test, the problem of falling the shelves, gathers through small batch volume data at present, can reduce the subassembly power repeatability to within 0.1% very (get rid of under the power repeatability prerequisite of board itself).
In order to achieve the above purpose, the utility model adopts the technical scheme that: the utility model provides a reduce supplementary test fixture of subassembly power repeatability test, includes frock casing, contact subassembly, first positive pole circuit and first negative pole circuit, the contact subassembly includes contact A, contact B, contact C, contact D, contact E and contact F, contact A contact B and contact C parallel connection to first positive pole circuit, contact D contact E and contact F parallel connection to first negative pole circuit.
Further, the contact a, the contact B, the contact C, the contact D, the contact E, and the contact F are all copper sheets.
Further, the contact a, the contact B, and the contact C are connected in parallel to the first positive line through an MC4 connector.
Further, the contact D, the contact E, and the contact F are connected in parallel to the first negative line through an MC4 connector.
Further, the tool shell is provided with a clamping groove matched with the photovoltaic assembly frame, and an anti-skid material is arranged in the clamping groove.
The utility model also provides a reduce test system of subassembly power repeatability test, include:
the auxiliary test tool is used for testing the test position;
a photovoltaic module including a second positive electrode line and a second negative electrode line;
the power tester comprises a test circuit, a power supply and a control circuit, wherein the test circuit of the power tester is provided with a positive current contact, a positive voltage contact, a negative current contact and a negative voltage contact;
the test circuit of the other tester is provided with a positive electrode contact and a negative electrode contact, the positive electrode contact is connected with a probe C through a third positive electrode circuit, and the negative electrode contact is connected with a probe D through a third negative electrode circuit;
during power test, the first positive line is connected with the second positive line, the first negative line is connected with the second negative line, the probe A is connected with the contact A, the probe B is connected with the contact B, the probe E is connected with the contact E, the probe F is connected with the contact F, the photovoltaic assembly, the auxiliary test tool and a test circuit of the power tester form a Kelvin bridge, and the photovoltaic assembly is a tested resistor;
during other tests, the first positive circuit is connected with the second positive circuit, the first negative circuit is connected with the second negative circuit, the probe C is connected with the contact C, and the probe D is connected with the contact D.
Furthermore, the test system comprises a plurality of other testers, during other tests, the probes C of different testers are connected with the contact C in a mutually switched mode, and the probes D of different testers are connected with the contact D in a mutually switched mode.
Further, the other tester is an EL performance tester.
Further, the other tester is an insulation performance tester.
Further, the other tester is a pressure resistance tester.
Because of the application of the technical scheme, compared with the prior art, the utility model has the following advantages: the utility model discloses a reduce supplementary test frock and test system of subassembly power repeatability test, four test circuit (two positive poles: electric current, voltage, two negative poles: electric current, voltage) that the power tester draws forth independently connect alone, can guarantee like this that the test resistance of front end and rear end changes to separate current-voltage when testing, the data stability when guaranteeing the test, thereby reach accurate test effect, can not cause the subassembly because of the downshift that the fluctuation of current-voltage caused.
Drawings
Fig. 1 is a schematic view of an auxiliary testing tool disclosed in the present invention;
FIG. 2 is a schematic diagram of a testing system of the present disclosure;
FIG. 3 is a Wheatstone bridge diagram;
fig. 4 is a kelvin bridge diagram.
Wherein: 110. a tool shell; 120. a contact assembly; 121. a contact A; 122. a contact B; 123. a contact C; 124. a contact D; 125. a contact E; 126. a contact F; 130. a first positive electrode line; 140. a first negative electrode line; 210. a second positive electrode line; 220. a second negative electrode line; 310. a positive current line; 311. a probe A; 320. a positive voltage line; 321. a probe B; 330. a negative current line; 331. a probe E; 340. a negative voltage line; 341. a probe F; 410. a third positive electrode line; 420. a third negative electrode line; 411. a probe C; 421. and (4) a probe D.
Detailed Description
The invention will be further described with reference to the accompanying drawings and examples:
referring to fig. 1, as shown in the figure, an auxiliary test tool for reducing the power repeatability of a component includes a tool housing 110, a contact assembly 120, a first positive line 130, and a first negative line 140, the contact assembly 120 includes a contact a121, a contact B122, a contact C123, a contact D124, a contact E125, and a contact F126, the contact a121, the contact B122, and the contact C123 are connected in parallel to the first positive line 130, and the contact D124, the contact E125, and the contact F126 are connected in parallel to the first negative line 140.
In a preferred embodiment of the present embodiment, the contact a121, the contact B122, the contact C123, the contact D124, the contact E125, and the contact F126 are all copper sheets.
In the preferred embodiment of the present embodiment, the contact a121, the contact B122, and the contact C123 are connected in parallel to the first positive line 130 through an MC4 connector (not shown).
In the preferred embodiment of this embodiment, contact D124, contact E125, and contact F126 are connected in parallel to the first negative line 140 via an MC4 connector (not shown).
In the preferred embodiment of this embodiment, the fixture housing 110 is provided with a clamping groove (not shown) matched with the frame of the photovoltaic module, and the clamping groove is provided with an anti-slip material.
Referring to fig. 2, a test system for reducing power repeatability tests of a component, as shown in the figure, includes:
the auxiliary test tool is used for testing the test position;
a photovoltaic module (not shown) including a second positive electrode line 210 and a second negative electrode line 220;
the power tester (not shown in the figure) is provided with a test circuit which is provided with a positive current contact, a positive voltage contact, a negative current contact and a negative voltage contact, wherein the positive current contact is connected with a probe A311 through a positive current circuit 310, the positive voltage contact is connected with a probe B321 through a positive voltage circuit 320, the negative current contact is connected with a probe E331 through a negative current circuit 330, and the negative voltage contact is connected with a probe F341 through a negative voltage circuit 340;
at least one other tester (not shown), the testing circuit of the other tester having a positive contact and a negative contact, the positive contact being connected to a probe C411 through a third positive line 410, the negative contact being connected to a probe D421 through a third negative line 420;
during power test, the first positive line 130 is connected with the second positive line 210, the first negative line 140 is connected with the second negative line 220, the probe A311 is connected with the contact A121, the probe B321 is connected with the contact B122, the probe E331 is connected with the contact E125, the probe F341 is connected with the contact F126, the photovoltaic module, the auxiliary test tool and the test circuit of the power tester form a Kelvin bridge, and the photovoltaic module is a tested resistor;
during other tests, the first positive line 130 is connected to the second positive line 210, the first negative line 140 is connected to the second negative line 220, the probe C411 is connected to the contact C123, and the probe D421 is connected to the contact D124.
In a preferred embodiment of this embodiment, the test system includes a plurality of other testers, and during other tests, the probe C411 of a different tester is connected to the contact C123 in a switching manner, and the probe D421 of a different tester is connected to the contact D124 in a switching manner.
In a preferred embodiment of this embodiment, the other tester is an EL performance tester.
In a preferred embodiment of this embodiment, the other tester is an insulation performance tester.
In a preferred embodiment of this embodiment, the other tester is a withstand voltage tester.
Kelvin Four-wire sensing, also known as Four-terminal sensing (4T sensing), Four-wire sensing or 4-point probe method, is an electrical impedance measurement technique that uses separate current and voltage sensing electrodes for current carrying and voltage sensing, enabling more accurate measurements than conventional two-terminal (2T) sensing. Kelvin four wire testing is used for some ohmmeters and impedance analyzers and in the wiring configuration of precision strain gauges and resistance thermometers. And can also be used to measure the sheet resistance of the film. The key advantage of four wire sensing is the separate current and voltage electrodes, eliminating the impedance of wiring and contact resistance.
A wheatstone bridge is a bridge circuit proposed by wheatstone in 1843. The device consists of four resistors and a galvanometer, RN is a precision resistor, and RX is a resistor to be tested (a circuit diagram is shown in figure 1). After the circuit is completed, R1, R2 and RN are adjusted so that the current in the galvanometer is zero and the bridge is balanced, when RX is RIRN/R2. RX ═ 12> nRn' ″ was obtained by the crossover measurement method (positions of RN and RX were swapped, RI and R2 were not changed).
The special contradiction of wheatstone bridge to low resistance measurement: the resistance measured by a wheatstone bridge (single bridge) is generally between 10 Ω and 1210' > Ω, and is a medium resistance. If a single bridge is used to measure the low resistance, the additional resistors R 'and R "(lead resistor, terminal contact resistor, etc.) and RX are directly connected in series, while the magnitudes of R' and R" are equivalent to the magnitude of the measured resistor RX and cannot be ignored, and the resistor RN is also a small resistor, so that the value of RX cannot be accurately obtained by using the formula RX of the single bridge to measure the resistor RIRN/R2.
The Kelvin bridge is a variation of a Wheatstone bridge and can provide quite high accuracy when measuring resistors with small resistance values, wherein R1, R2, R3 and R4 are all adjustable resistors, RX is a measured low resistor, RN is a low-value standard resistor, compared with the Wheatstone single bridge, the Kelvin bridge is improved greatly in two points, namely a bridge arm consisting of R2 and R4 is added to ①, a two-end connection method is changed from a two-end connection method to a four-end connection method for ② RN and RX, wherein P1P2 forms the measured low resistor RX, P3P4 is the standard low resistor RN, P1P2 and P3P4 are commonly called voltage contacts, and C1C2 and C3C4 are called current contacts.
The design idea is as follows: the wiring resistance and the contact resistance of the RN and the RX are skillfully transferred to the power supply internal resistance and the bridge arm resistance with large resistance value (as shown in the following figure), and the influence of the additional resistance is eliminated by setting R1R4 to R2R3 and R' to be approximately equal to 0, so that the accuracy in measuring the low resistance is ensured. Specifically, to ensure the balance condition of the dual bridge, there may be two design modes:
ensure that R3/R1 is R4/R2: a. selecting the ratio of two groups of bridge arms as M-R3/R1-R2/R4, making RN into a variable standard resistor, and adjusting RN to balance the bridge; b. selecting RN as a standard resistor with a certain fixed resistance value and selecting R1 as R2 as a certain value, and jointly adjusting R3 and R4 to balance the bridge.
The second approach is used for the QJ19 model single-double bridge used in this experiment.
Ensure that R' ≈ 0: and connecting Rx and RN by using a short thick wire.
Calculation of kelvin test RX:
the bridges are balanced by adjusting R1, R2, R3, R4. Here, Ig is 0, I1 is I3, I2 is I4, I5 is I6, VB is VD, and the three formulae are solved simultaneously
Kelvin test unary linear regression method:
the calculation formula of the known resistance is R ═ ρ l/S.
Let x ≡ l, y ≡ R, and set a unary linear regression equation y ═ a + bx, where b ≡ ρ/S. B is obtained from a calculation formula of the unary linear regression method, and the resistivity ρ is obtained.
Calculation of resistance uncertainty in kelvin test experiments.
The calculation formula is RX-R1R/R2. The measurement is only carried out once, if errors caused by numerical value changes of R1 and R2 in the measurement process are ignored, the uncertainty is only B-type components, and the uncertainty caused by the error of the bridge instrument and the uncertainty caused by the sensitivity of the bridge instrument are synthesized.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (10)
1. The utility model provides a reduce supplementary test fixture of subassembly power repeatability test, includes frock casing, contact subassembly, first positive pole circuit and first negative pole circuit, its characterized in that, the contact subassembly includes contact A, contact B, contact C, contact D, contact E and contact F, contact A contact B and contact C parallel connection to first positive pole circuit, contact D contact E and contact F parallel connection to first negative pole circuit.
2. The auxiliary test tool of claim 1, wherein the contact A, the contact B, the contact C, the contact D, the contact E and the contact F are all copper sheets.
3. The auxiliary test tool of claim 1, wherein the contact a, the contact B, and the contact C are connected in parallel to the first positive line through an MC4 connector.
4. The auxiliary test tool of claim 1, wherein the contact D, the contact E, and the contact F are connected in parallel to the first negative line through an MC4 connector.
5. The auxiliary test tool according to claim 1, wherein the tool shell is provided with a clamping groove matched with the photovoltaic module frame, and an anti-skid material is arranged in the clamping groove.
6. A test system for reducing power repeatability tests of a component, comprising:
the auxiliary test tool of any one of claims 1 to 5;
a photovoltaic module including a second positive electrode line and a second negative electrode line;
the power tester comprises a test circuit, a power supply and a control circuit, wherein the test circuit of the power tester is provided with a positive current contact, a positive voltage contact, a negative current contact and a negative voltage contact;
the test circuit of the other tester is provided with a positive electrode contact and a negative electrode contact, the positive electrode contact is connected with a probe C through a third positive electrode circuit, and the negative electrode contact is connected with a probe D through a third negative electrode circuit;
during power test, the first positive line is connected with the second positive line, the first negative line is connected with the second negative line, the probe A is connected with the contact A, the probe B is connected with the contact B, the probe E is connected with the contact E, the probe F is connected with the contact F, the photovoltaic assembly, the auxiliary test tool and a test circuit of the power tester form a Kelvin bridge, and the photovoltaic assembly is a tested resistor;
during other tests, the first positive circuit is connected with the second positive circuit, the first negative circuit is connected with the second negative circuit, the probe C is connected with the contact C, and the probe D is connected with the contact D.
7. The test system of claim 6, wherein the test system includes a plurality of other testers, and during other tests, probes C of different ones of the other testers are switched to connect with the contact C, and probes D of different ones of the other testers are switched to connect with the contact D.
8. The test system of claim 6, wherein the other tester is an EL performance tester.
9. The test system of claim 6, wherein the other tester is an insulation tester.
10. The test system for reducing the power repeatability of the assembly according to claim 6, wherein the other tester is a voltage endurance tester.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111650537A (en) * | 2020-06-17 | 2020-09-11 | 东莞华贝电子科技有限公司 | Auxiliary detection circuit, device, main board and terminal equipment |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111650537A (en) * | 2020-06-17 | 2020-09-11 | 东莞华贝电子科技有限公司 | Auxiliary detection circuit, device, main board and terminal equipment |
| CN111650537B (en) * | 2020-06-17 | 2022-04-15 | 东莞华贝电子科技有限公司 | Auxiliary detection circuit, device, main board and terminal equipment |
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