CN210720591U - SMD resistor test fixture suitable for different sizes - Google Patents
SMD resistor test fixture suitable for different sizes Download PDFInfo
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- CN210720591U CN210720591U CN201921013471.0U CN201921013471U CN210720591U CN 210720591 U CN210720591 U CN 210720591U CN 201921013471 U CN201921013471 U CN 201921013471U CN 210720591 U CN210720591 U CN 210720591U
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Abstract
A surface mount resistor testing tool suitable for different sizes relates to the technical field of electronic element performance testing. It contains base, positive electrode, negative electrode, busbar, closing device, slide bar, connecting rod, accommodate the lead screw, be equipped with the positive electrode and the negative electrode that a plurality of groups set up side by side on the base, the positive electrode passes through the busbar and connects in parallel, all is equipped with closing device between every group positive and negative electrode, be equipped with the sliding tray on the base between negative electrode and the positive electrode, the negative electrode below is equipped with the slide bar, the slide bar slides with the sliding tray cooperation, connect through the connecting rod between two adjacent negative electrodes, base one side is equipped with accommodate the lead screw, accommodate the lead screw and base threaded connection, accommodate the lead screw tip and connecting rod connection. The relative position of the negative electrode and the positive electrode can be adjusted through the adjusting screw rod, the chip resistor testing device can adapt to different specifications of chip resistors for testing, is flexible to adjust, and improves the working efficiency of chip resistor testing.
Description
Technical Field
The utility model relates to an electronic component capability test technical field, concretely relates to SMD resistor test fixture suitable for not unidimensional.
Background
In order to ensure the quality and reliability of products, multiple experiments such as temperature characteristic, medium voltage resistance, power treatment, aging and the like need to be carried out on the products in the production process of the chip resistor. It is conventional to weld the product to a glass fiber panel and then perform various tests. The method causes damage to products, cannot be recycled and the like. In addition, in the dielectric withstand voltage test process of the chip high-voltage resistor, the alternating voltage of 900V needs to be applied to the surface and the electrodes at two ends of the resistor, and because the chip resistor is small in size, a special clamp needs to be used to ensure safety in the process of increasing the voltage. But no ideal special clamp exists in the current dielectric withstand voltage test.
The distance between the positive electrode and the negative electrode of the conventional chip resistor testing tool is fixed and unchanged, so that one testing tool can only test one type of chip resistor, inconvenience is brought to use, and the working efficiency is influenced.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to prior art's defect and not enough, provide a SMD resistor test fixture suitable for not unidimensional, it can solve present SMD resistor test fixture's positive electrode and the distance of negative electrode are fixed unchangeable for a test fixture can only test the SMD resistor of a type, has brought inconvenience for the use, has influenced work efficiency's defect.
In order to achieve the above purpose, the utility model adopts the following technical scheme: it contains base, positive electrode, negative electrode, busbar, closing device, slide bar, connecting rod, accommodate the lead screw, be provided with the positive electrode and the negative electrode that a plurality of groups set up side by side on the base, the positive electrode passes through the busbar and connects in parallel, all is provided with closing device between every group positive and negative electrode, be provided with the sliding tray on the base between negative electrode and the positive electrode, the below of negative electrode is provided with the slide bar, slide bar and sliding tray cooperation sliding connection, connect through the connecting rod between two adjacent negative electrodes, one side of base is provided with accommodate the lead screw, accommodate the lead screw and base threaded connection, accommodate the lead screw's tip and connecting rod fixed connection.
Furthermore, the sliding grooves are respectively and vertically arranged with the positive electrode and the negative electrode, and the sliding grooves are flush with the centers of the positive electrode and the negative electrode.
Further, the sliding rod is in clearance fit sliding connection with the sliding groove.
Further, the base is an insulating base.
Furthermore, the compressing device comprises a compression spring piece and a locking clamping piece, the compression spring piece is arranged between the positive electrode and the negative electrode, one end of the compression spring piece is hinged to the base, the compression spring is arranged at the central position of the lower end face of the compression spring piece, the locking clamping piece is arranged at the other end of the compression spring piece, and the locking clamping piece is rotatably connected with the base through a rotating screw.
Furthermore, the compression spring piece is of an arch structure, a lantern ring fixedly connected with the compression spring piece is arranged at the left end of the compression spring piece, a rotating shaft is arranged inside the lantern ring, rotating shaft seats are arranged at two ends of the rotating shaft, and the rotating shaft seats are fixed on the base.
The utility model discloses a theory of operation: during the use, when the SMD resistor of different specifications is tested to needs, through rotatory accommodate the lead screw, accommodate the relative base motion in-process of lead screw drives the connecting rod motion, the connecting rod drives the slide bar and slides in the sliding tray, make the negative electrode can slide the adjustment in the position of positive electrode relatively, thereby can adapt to the SMD resistor of different specifications, after the adjustment, place the SMD resistor at the positive electrode, between the negative electrode, cover the top at SMD resistor with the pressure spring piece, rotate the locking clamping piece and cover the locking clamping piece in the top that compresses tightly spring piece one end, the pressure spring who compresses tightly the spring piece lower surface compresses tightly, just can be stable push down SMD resistor and test, and the operation is simple, and convenient to use.
After the technical scheme is adopted, the utility model discloses beneficial effect does: the device is simple in structure, reasonable in design and simple in operation, and can adjust the relative positions of the negative electrode and the positive electrode through the adjusting screw rod, so that the device is suitable for testing and using the chip resistors with different specifications, the pressing device is simple in operation and flexible in adjustment, and the working efficiency of testing the chip resistors can be effectively improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without inventive exercise.
Fig. 1 is a front view of the present invention;
FIG. 2 is a top view corresponding to FIG. 1;
fig. 3 is a schematic structural diagram of the pressing device of the present invention.
Description of reference numerals: the device comprises a base 1, a positive electrode 2, a negative electrode 3, a conductive strip 4, a pressing device 5, a sliding rod 6, a connecting rod 7, an adjusting screw rod 8, a sliding groove 11, a pressing spring piece 51, a locking clamping piece 52, a pressing spring 53, a rotating screw 54, a rotating shaft 55 and a rotating shaft seat 56.
Detailed Description
Referring to fig. 1 to fig. 3, the technical solution adopted by the present embodiment is: the testing device comprises a base 1, a positive electrode 2, a negative electrode 3, conductive strips 4, a pressing device 5, a sliding rod 6, a connecting rod 7 and an adjusting screw rod 8, wherein a plurality of groups of the positive electrode 2 and the negative electrode 3 which are arranged side by side are arranged on the base 1, the positive electrode 2 is connected in parallel through the conductive strips 4, the pressing device 5 is arranged between the positive electrode and the negative electrode of each group, a sliding groove 11 is arranged on the base 1 between the negative electrode 3 and the positive electrode 2, the sliding rod 6 is arranged below the negative electrode 3, the sliding rod 6 is matched and slidably connected with the sliding groove 11, the two adjacent negative electrodes 3 are connected through the connecting rod 7, the adjusting screw rod 8 is arranged on one side of the base 1, the adjusting screw rod 8 is in threaded connection with the base 1, the end part of the adjusting screw rod 8 is fixedly connected with the connecting rod 7, when, the adjusting screw rod 8 drives the connecting rod 7 to move in the process of moving relative to the base 1, and the connecting rod 7 drives the sliding rod 6 to slide in the sliding groove 11, so that the negative electrode 3 can slide and adjust relative to the position of the positive electrode 2, and the chip resistors with different specifications can be adapted.
The sliding grooves 11 are respectively perpendicular to the positive electrodes 2 and the negative electrodes 3, and the sliding grooves 11 are flush with the centers of the positive electrodes 2 and the negative electrodes 3, so that the negative electrodes 3 can be flush with the positive electrodes 2 in the sliding process along the sliding grooves 11.
The sliding rod 6 is in clearance fit sliding connection with the sliding groove 11, so that the sliding rod 6 can stably slide in the sliding groove 11.
The base 1 is an insulating base, and the base adopts the insulating base to improve the safety of the test tool in use.
The pressing device 5 comprises a pressing spring piece 51 and a locking clamping piece 52, the pressing spring piece 51 is arranged between the positive electrode 2 and the negative electrode 3, one end of the pressing spring piece 51 is hinged with the base 1, a pressing spring 53 is arranged at the central position of the lower end face of the pressing spring piece 51, the locking clamping piece 52 is arranged at the other end of the pressing spring piece 51, and the locking clamping piece 52 is rotatably connected with the base 1 through a rotating screw 54.
The pressing spring piece 51 is of an arch structure, a lantern ring fixedly connected with the pressing spring piece 51 is arranged at the left end of the pressing spring piece 51, a rotating shaft 55 is arranged inside the lantern ring, rotating shaft seats 56 are arranged at two ends of the rotating shaft 55, and the rotating shaft seats 56 are fixed on the base 1.
When the chip resistors with different specifications are required to be tested, the adjusting screw rod 8 is rotated, the adjusting screw rod 8 drives the connecting rod 7 to move in the process of moving relative to the base 1, the connecting rod 7 drives the sliding rod 6 to slide in the sliding groove 11, so that the negative electrode 3 can slide and adjust relative to the position of the positive electrode 2, the adjusting screw rod can adapt to the chip resistors with different specifications, after the adjustment is finished, the chip resistors are placed between the positive electrode 2 and the negative electrode 3, the pressing spring piece 51 covers the chip resistors, the locking clamping piece 52 is rotated to cover the locking clamping piece 52 above one end of the pressing spring piece 51, the pressing spring 53 on the lower surface of the pressing spring piece 51 is pressed, the chip resistors can be stably pressed for testing, the operation is simple, and the use is convenient.
The above description is only for the purpose of illustrating the technical solutions of the present invention and not for the purpose of limiting the same, and other modifications or equivalent replacements made by those of ordinary skill in the art to the technical solutions of the present invention should be covered within the scope of the claims of the present invention as long as they do not depart from the spirit and scope of the technical solutions of the present invention.
Claims (6)
1. The utility model provides a SMD resistor test fixture suitable for not unidimensional which characterized in that: it contains base, positive electrode, negative electrode, busbar, closing device, slide bar, connecting rod, accommodate the lead screw, be provided with the positive electrode and the negative electrode that a plurality of groups set up side by side on the base, the positive electrode passes through the busbar and connects in parallel, all is provided with closing device between every group positive and negative electrode, be provided with the sliding tray on the base between negative electrode and the positive electrode, the below of negative electrode is provided with the slide bar, slide bar and sliding tray cooperation sliding connection, connect through the connecting rod between two adjacent negative electrodes, one side of base is provided with accommodate the lead screw, accommodate the lead screw and base threaded connection, accommodate the lead screw's tip and connecting rod fixed connection.
2. The SMD resistor test tool suitable for different sizes of claim 1, wherein: the sliding grooves are respectively and vertically arranged with the positive electrode and the negative electrode, and the sliding grooves are flush with the centers of the positive electrode and the negative electrode.
3. The SMD resistor test tool suitable for different sizes of claim 1, wherein: the sliding rod is in clearance fit sliding connection with the sliding groove.
4. The SMD resistor test tool suitable for different sizes of claim 1, wherein: the base is an insulating base.
5. The SMD resistor test tool suitable for different sizes of claim 1, wherein: the pressing device comprises a pressing spring piece and a locking clamping piece, the pressing spring piece is arranged between the positive electrode and the negative electrode, one end of the pressing spring piece is hinged to the base, a pressing spring is arranged at the central position of the lower end face of the pressing spring piece, the locking clamping piece is arranged at the other end of the pressing spring piece, and the locking clamping piece is rotatably connected with the base through a rotating screw.
6. The SMD resistor test tool suitable for different sizes of claim 5, wherein: the clamp spring piece is of an arch structure, the left end of the clamp spring piece is provided with a lantern ring fixedly connected with the clamp spring piece, a rotating shaft is arranged inside the lantern ring, rotating shaft seats are arranged at two ends of the rotating shaft, and the rotating shaft seats are fixed on the base.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921013471.0U CN210720591U (en) | 2019-06-29 | 2019-06-29 | SMD resistor test fixture suitable for different sizes |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921013471.0U CN210720591U (en) | 2019-06-29 | 2019-06-29 | SMD resistor test fixture suitable for different sizes |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN210720591U true CN210720591U (en) | 2020-06-09 |
Family
ID=70964214
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201921013471.0U Active CN210720591U (en) | 2019-06-29 | 2019-06-29 | SMD resistor test fixture suitable for different sizes |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN210720591U (en) |
-
2019
- 2019-06-29 CN CN201921013471.0U patent/CN210720591U/en active Active
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