CN210691107U - Test equipment of LKJ host unit - Google Patents
Test equipment of LKJ host unit Download PDFInfo
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- CN210691107U CN210691107U CN201922149407.1U CN201922149407U CN210691107U CN 210691107 U CN210691107 U CN 210691107U CN 201922149407 U CN201922149407 U CN 201922149407U CN 210691107 U CN210691107 U CN 210691107U
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Abstract
The utility model provides a test equipment of LKJ host computer unit, including analog signal generator, digital signal generator and display, send the analog signal who generates to LKJ host computer unit and display through analog signal generator, analog signal is used for the analog signal input of the operational environment of emulation LKJ host computer unit; sending the generated digital signal to the LKJ host unit through the digital signal generator, wherein the digital signal is used for simulating the digital signal input of the running environment of the LKJ host unit; and the display displays the signals generated after the LKJ host unit processes the analog signals and the digital signals so as to observe the running state of the LKJ host unit, thereby realizing the purpose of testing the LKJ host unit.
Description
Technical Field
The utility model relates to a train equipment test technical field, the test equipment of a concretely design LKJ host computer unit.
Background
A train operation monitoring device (LKJ for short) is a component of a Chinese train operation control system and can protect train overspeed and assist locomotive drivers (including motor train unit drivers) to improve the operation capability. Currently, the LKJ includes an LKJ host, a display, a sensor, and the like installed on a train. An LKJ host unit (short for a master unit of an LKJ host) is an important unit for information processing and communication in LKJ, but at present, there is no device for testing the LKJ host unit.
SUMMERY OF THE UTILITY MODEL
In view of this, the embodiment of the present invention provides a test equipment for LKJ host unit to solve the problem that there is no equipment for testing the host of the LKJ system at present.
In order to achieve the above object, the embodiment of the present invention provides the following technical solutions:
a test device of an LKJ host unit comprises an analog signal generator, a digital signal generator and a display;
the analog signal generator is connected with a first input interface of the LKJ host unit and the display, and sends a generated analog signal to the first input interface and the display, wherein the analog signal is used for simulating the analog signal input of the running environment of the LKJ host unit;
the digital signal generator is connected with a second input interface of the LKJ host unit, and sends a generated digital signal to the second input interface, wherein the digital signal is used for simulating digital signal input of an operating environment of the LKJ host unit;
the display is further connected with an output interface of the LKJ host unit and used for displaying signals generated after the LKJ host unit processes the analog signals and the digital signals.
Further, the analog signal generator is connected with a first input interface of the LKJ host unit through a converter and a first transmission bus;
the converter is used for converting the signal format of the analog signal; the first transmission bus is connected with the converter and a first input interface of the LKJ host unit, and transmits the analog signals after signal format conversion to the first input interface.
Further, the converter is a controller area network converter;
the first transmission bus is a controller area network bus.
Further, the digital signal generator includes: a signal source and a signal interface board;
the signal source is used for generating the digital signal;
and the signal interface board is connected with a second input interface of the LKJ and used for sending the digital signal to the second input interface in a transmission mode corresponding to the signal interface board.
Further, the signal interface board comprises a parallel interface board and/or a serial interface board;
the parallel interface board is used for sending the digital signal to the second input interface in a parallel transmission mode;
and the serial interface board is used for sending the digital signal to the second input interface in a serial transmission mode.
Further, the signal interface board includes at least one parallel interface board and a serial interface board.
Furthermore, each parallel interface board communicates with a different input interface of the LKJ host unit, and each parallel interface board transmits a different digital signal.
Further, the equipment also comprises an oscilloscope, wherein the oscilloscope is connected with the digital signal generator and is used for displaying the digital signal.
Further, the device further comprises a power module, wherein the power module is used for supplying power to the analog signal generator, the digital signal generator and the display.
Further, the display comprises an oscilloscope and a display screen;
the oscilloscope is used for displaying a digital signal generated after the LKJ host unit processes the digital signal;
the display screen is used for displaying an analog signal generated after the LKJ host unit processes the analog signal;
the analog signal generator and the display screen are located in the same electronic device.
The test equipment for the LKJ host unit comprises an analog signal generator, a digital signal generator and a display, wherein a generated analog signal is sent to the LKJ host unit and the display through the analog signal generator, and the analog signal is used for simulating the analog signal input of the running environment of the LKJ host unit; sending the generated digital signal to the LKJ host unit through the digital signal generator, wherein the digital signal is used for simulating the digital signal input of the running environment of the LKJ host unit; and the display displays the signals generated after the LKJ host unit processes the analog signals and the digital signals so as to observe the running state of the LKJ host unit, thereby realizing the purpose of testing the LKJ host unit.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.
Fig. 1 is a structural diagram of a testing apparatus of an LKJ host unit according to an embodiment of the present invention;
fig. 2 is a schematic diagram of the connection of the analog signal generator 130 to the LKJ host unit in fig. 1;
fig. 3 is a schematic structural diagram of the digital signal generator 110 in fig. 1;
fig. 4 is a structural diagram of a testing apparatus of an LKJ host unit according to an embodiment of the present invention;
fig. 5 and 6 are line charts of the signal interface board and the interface board of the LKJ host unit in fig. 4.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
In this application, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
The LKJ system has two main functions: a monitoring function and a recording function. The monitoring function is that the monitoring train operates according to a specified control mode, and the monitoring train starts a braking device when the speed of the monitoring train exceeds the speed allowed by safe driving. The recording function is capable of recording the date, time, mileage coordinates, changes in locomotive conditions, operating status, keys, maintainer/driver inputs, whistle operations by the driver, main power-off operations by the locomotive, system self-checking, operation disclosure control, point information, and the like.
The LKJ system consists of an LKJ host unit (LJK processor), a BTM (reserved and responder transmission module), a DMI (driver display unit), locomotive signals, peripheral equipment (comprising an isolating switch, a power circuit breaker, a track circuit sensor, a responder antenna, a speed sensor and an analog quantity sensor), and expansion interface equipment (LAIS, TAX, other ATP and the like). The LKJ master unit, as an important functional unit, receives different types of signals (including digital signals and analog signals) input by other functional units in the LKJ system, analyzes and processes the input signals, and outputs corresponding feedback signals to the other functional units, so that the other functional units execute corresponding operations, such as data recording, data display, train braking and other functions according to the feedback signals. According to LKJ host computer unit to input signal handle and output feedback signal's job features, the utility model provides a can be through simulation LKJ host computer unit's input signal (including digital signal and analog signal) to show the output signal of LKJ host computer unit and whether normal test equipment of operating condition with the judgement LKJ host computer unit.
Referring to fig. 1, a schematic structural diagram of a testing apparatus 001 of an LKJ host unit according to an embodiment of the present invention is shown, including an analog signal generator 130, a digital signal generator 110, and a display 120.
The analog signal generator 130 is connected to the first input interface of the LKJ host unit and to the display 120, and the analog signal generator 130 transmits the generated analog signal to the first input interface and the display 120, the analog signal being used for simulating the analog signal input of the operating environment of the LKJ host unit.
It should be noted that the first input interface is a type of interface, i.e., an input interface for analog signals. Meanwhile, the first input interface is not a limitation on the number of interfaces, and the first input interface may include one or more input interfaces for analog signals, where the number of interfaces is not specifically limited.
The digital signal generator 110 is connected to the second input interface of the LKJ host unit, and the digital signal generator 110 transmits the generated digital signal to the second input interface, where the digital signal is used to simulate the digital signal input of the operating environment of the LKJ host unit.
The digital signal generator 110 is used to generate and input discrete digital signals to the LKJ host unit, and the digital signal generator 110 may be implemented in various ways: it can be a circuit formed by connecting logic elements or relays, or a square wave signal source, etc. It should be noted that the second input interface represents a type of interface, i.e., an input interface for digital signals. Meanwhile, the second input interface may include one or more input interfaces for digital signals, and the number of the interfaces is not particularly limited.
The display 120 is further connected to an output interface of the LKJ host unit, and is configured to display a signal generated by the LKJ host unit after processing the analog signal and the digital signal.
In this embodiment, the display 120 includes at least one display screen, and the input signal and the output signal of the LKJ host unit (i.e., the signal generated by the LKJ host unit processing the analog signal and the digital signal) may be displayed on one display screen or may be displayed on different display screens. The signal can also have a plurality of display forms on the display screen: the property value of the signal may be displayed in the form of a numerical value, or the change of the signal with time (e.g., a waveform diagram of the signal) may be displayed in the form of a graph. Here, the display form of the input signal and the output signal of the LKJ host unit on the display 120 is not limited. Two implementations of the display 120 are described below:
in one implementation, the display 120 is a display screen of an upper computer, an input signal and an output signal of the LKJ host unit are simultaneously displayed on the display screen of the upper computer, and the input signal and the output signal can be visually compared to test whether the LKJ host unit is normal, the input signal is an analog signal generated by the analog signal generator 130 and a digital signal generated by the digital signal generator 110, the output signal is a signal generated by the LKJ host unit after processing the analog signal and the digital signal, when the display screen displays these signals, the analog signal and the digital signal can be displayed in different areas, for example, the analog signal generated by the analog signal generator 130 and the signal generated by the LKJ host unit after processing the analog signal are displayed in a first area, the digital signal generated by the digital signal generator 130 and the signal generated by the LKJ host unit after processing the digital signal are displayed in a second area, the processing of the LKJ host unit is checked in each area in a targeted mode, and whether the working state of the LKJ host unit is normal under the analog signals and the digital signals is judged.
In another implementation, the display 120 includes an oscilloscope and a display screen. The oscilloscope is used for displaying input digital signals and/or output digital signals of the LKJ host unit; the display screen is used for displaying input analog signals and/or output analog signals of the LKJ host unit. The display screen and the analog signal generator may be located in the same electronic device, for example, an upper computer with the display screen, and the oscilloscope is a display device independent from the electronic device.
The output interface of the LKJ host unit includes an interface for outputting a digital signal and/or an interface for outputting an analog signal, that is, the LKJ host unit can output signals generated by processing the analog signal and the digital signal by the LKJ host unit through the same output interface, or the LKJ host unit outputs a signal generated by processing the analog signal through one output interface, and the LKJ host unit outputs a signal generated by processing the digital signal through the other output interface. The input interface and the output interface of the LKJ host unit in this embodiment may be the same physical interface, and the physical interface may receive a signal to the LKJ host unit or may transmit a signal generated by the LKJ host unit. The output interface of the LKJ host unit may be the same physical interface as the first input interface, or the output interface may be the same physical interface as the second input interface, and the relationship between the output interface, the first input interface, and the second input interface and the number of these interfaces in this example are not limited in this embodiment.
In the embodiment, the test equipment of the LKJ host unit sends the generated analog signal to the LKJ host unit and the display through the analog signal generator, and the analog signal is used for simulating the analog signal input of the operating environment of the LKJ host unit; sending the generated digital signal to the LKJ host unit through the digital signal generator, wherein the digital signal is used for simulating the digital signal input of the running environment of the LKJ host unit; and the display displays the signals generated after the LKJ host unit processes the analog signals and the digital signals so as to observe the running state of the LKJ host unit, thereby realizing the purpose of testing the LKJ host unit.
One way of connecting the analog signal generator 130 of fig. 1 to the LKJ host unit is described below.
Referring to fig. 2, a schematic diagram of the connection between the analog signal generator 130 and the LKJ host unit is shown, in which the analog signal generator 130 is connected to the first input interface of the LKJ host unit through the converter 140 and the first transmission bus.
The converter 140 is used for converting the signal format of the analog signal; the first transmission bus connects the converter 140 with the first input interface of the LKJ host unit, converts the analog signal output by the analog signal generator 130 into a format (for example, CAN bus serial input or VEM bus parallel input) suitable for the first input interface of the LKJ host unit, and transmits the analog signal after the signal format conversion to the first input interface. The transmission protocol of the first transmission bus is adapted to the format of the signal converted by the converter 140, for example:
in one embodiment, the converter 140 is a Controller Area Network (CAN) converter; the first transmission bus is a Controller Area Network (CAN) bus. Other embodiments are not described one by one.
The converter 140 and the analog signal generator 130 may also communicate with each other through, but not limited to, a first transmission bus, for example, the analog signal generator 130 sends the analog signal to the converter through the first transmission bus.
One embodiment of the digital signal generator 110 of fig. 1 is described below.
Referring to fig. 3, a schematic diagram of the digital signal generator 110 is shown, which includes: a signal source 112 and a signal interface board 111.
A signal source 112 for generating a digital signal. The signal source 112 may, but is not limited to, generate a digital signal of a particular waveform, such as a digital signal of a particular waveform including, but not limited to, a square wave signal, a series of level signals, etc., and the signal source 112 may adjust the properties of the digital signal it outputs to mimic different types of digital signals in the operating environment of the LKJ host unit, wherein the properties include, but are not limited to, the voltage value, duty cycle, and/or frequency of the digital signal to enable adjustment of the digital signal through adjustment of these properties.
The signal interface board 111 is connected to the second input interface of the LKJ host unit, and is configured to send a digital signal to the second input interface of the LKJ host unit in a transmission manner corresponding to the signal interface board 111.
The signal interface board 111 includes a parallel interface board and/or a serial interface board. The parallel interface board is used for sending digital signals to a second input interface of the LKJ host unit in a parallel transmission mode; and the serial interface board is used for sending the digital signal to the second input interface of the LKJ host unit in a serial transmission mode.
It should be noted that the number and type of the signal interface boards 111 can be flexibly set according to the path number requirement of the digital signal input by the LKJ host unit during testing and the characteristics of the input interface, which is not limited herein, for example, the signal interface board 111 may include three parallel interface boards and one serial interface board. Of course, the signal interface board 111 page can include only a parallel interface board or only a serial interface board. If a parallel interface board and/or a serial interface board in the signal interface boards send digital signals to the second input interface, an interface board which does not send the digital signals in the parallel interface board and/or the serial interface board can receive the digital signals processed by the LKJ host unit, and then the digital signals sent by the LKJ host unit are displayed through a display device connected with the interface board.
In one embodiment, the signal interface board 111 includes at least one parallel interface board, each parallel interface board communicates with a different input interface of the LKJ host unit, and each parallel interface board can transmit the same or different digital signals according to the test requirement, so as to satisfy the test requirement on the LKJ host unit by transmitting the same or different digital signals through the parallel interface board.
To facilitate viewing of the incoming digital signals, in one embodiment, the test equipment of the LKJ host unit further comprises an auxiliary display device for displaying the digital signals, such as an oscilloscope connected to the signal source 112, or a multimeter connected to the signal interface board 111, or the like.
The testing apparatus of the LKJ host unit further includes a power module, where the power module includes a power supply module for supplying power to the analog signal generator 130, the digital signal generator 110, and the display 120, and a specific circuit of the power module is not described in this embodiment, if at least two devices of the analog signal generator 130, the digital signal generator 110, and the display 120 use different voltages, the power supply module can output different voltages to corresponding devices in the testing apparatus of the LKJ host unit through different output interfaces, so as to meet requirements of the at least two devices of the analog signal generator 130, the digital signal generator 110, and the display 120 on different voltages.
For convenience of understanding, an application example of the present invention will be described below. The analog signal generator is an upper computer in the embodiment; the converter is a CAN converter; the display comprises a display screen of the upper computer and an oscilloscope; the digital signal generator comprises 3 parallel interface boards, 1 serial interface board and a signal source.
Please refer to fig. 4, which shows a schematic structural diagram of a testing apparatus of an LKJ host unit according to an embodiment of the present invention, the apparatus includes: the device comprises an upper computer, a CAN box, a signal source, an oscilloscope, a parallel interface board 1, a parallel interface board 2, a parallel interface board 3, a serial interface board and a power supply.
The upper computer can generate analog signals/data input into the LKJ host unit through the test software, and can test the communication function of the LKJ host unit. The upper computer test software sends a test data packet to the LKJ host unit, the LKJ host unit returns a feedback data packet corresponding to the test data packet after receiving the data packet for processing, and the upper computer can judge whether the communication function of the LKJ host unit is normal or not through analysis of the feedback data packet.
The CAN converter is used for converting the analog signals output by the upper computer into a format which CAN be transmitted by the CAN bus. The CAN converter in the embodiment is a USB-CAN-II, the input and output interface of the upper computer is a USB interface, and in other embodiments, the CAN converter CAN be replaced by other suitable types according to the interface type of the upper computer.
As CAN be seen from fig. 4, the CAN converter is connected to the LKJ host unit via two CAN buses, including a CAN-1 bus connected to the C96 host board and a CAN-2 bus connected to F48. Wherein, C96 and F48 are interface boards of LKJ host unit, and a plurality of input interfaces and output interfaces are arranged on the two host boards. In this embodiment, the connection modes between the two motherboards and the CAN-1 bus and the CAN-2 bus are shown in fig. 5 and 6, respectively. In other embodiments, the number of lanes of the CAN bus may be flexibly set according to the number of signals/data transmitted between different LKJ host units and the upper computer.
The signal source is used to generate a square wave signal (a mode of digital signal), the square wave signal is sent to the LKJ host unit through the parallel interface board 2, in this embodiment, the parallel interface board 2 inputs 4 pairs of the same square wave signal to the LKJ host unit, and the attribute for providing the square wave signal is as follows: frequency 5kHz, duty cycle 50%, amplitude 5 Vp-p. In other embodiments, the number of paths of the square wave signals input to the LKJ host unit and the attribute value of the square wave signal may be adaptively modified according to different test scenarios, which is not limited herein. In other embodiments, the 4 pairs of square wave signals may also be different signals.
After the LKJ host unit processes the square wave signal input from the parallel interface board 2, the square wave signal output by the LKJ host unit is connected to an oscilloscope through the serial interface board, and the oscilloscope displays the square wave signal output by the LKJ host unit. In this embodiment, there are 4 pairs of interfaces outputting square wave signals. In other embodiments, the square wave signal input to the LKJ host unit can also be transmitted to the oscilloscope for display, so that the attribute of the input square wave signal can be conveniently checked, and meanwhile, a tester can conveniently judge whether the working state of the LKJ host unit is normal or not according to the comparison result of the output square wave signal and the input square wave signal.
In the implementation, the data bus a occupies 15 lines and is connected to 8 data interfaces D, 4 address bus interfaces a, 1 chip selection signal interface CS, 1 read-write control signal interface RW, and 1 ground of the parallel interface board respectively. The data bus B is similar.
In this embodiment, the parallel interface board 1 and the parallel interface board 3 are connected to a 5V power supply, the LKJ host unit is connected to 24V for supplying power to the interface board of the LKJ host unit, and the signal source and the upper computer also need a 220V power supply. Fig. 5 and fig. 6 are specific connection diagrams of the signal interface board and the interface board of the LKJ host unit in fig. 4.
The specific test procedure of this example is as follows:
firstly, an upper computer sends analog signals/data to an interface board C96 of an LKJ host unit through test software, and square wave signals generated by a signal source are sent to the LKJ host unit through a parallel interface board;
and then acquiring the output signals after analysis processing from the LKJ host unit, and finally comparing the two groups of signals (the input signals and the output signals) so as to detect whether the LKJ host unit is normal. The input signal includes an analog signal and a digital signal.
In this application embodiment, the testing equipment of the LKJ host unit can simulate the input signal of the LKJ host unit in the operating environment of the LKJ system through the upper computer and the signal source, display the output signal of the LKJ host unit through the display screen and the oscilloscope of the upper computer, and finally obtain whether the communication function and the signal processing function of the LKJ host unit are normal or not by observing and comparing the input signal and the output signal, so as to realize the detection purpose of the communication recording unit.
The embodiments in the present specification are described in a progressive manner, and the same and similar parts among the embodiments are referred to each other, and each embodiment focuses on the differences from the other embodiments. In particular, the system or system embodiments are substantially similar to the method embodiments and therefore are described in a relatively simple manner, and reference may be made to some of the descriptions of the method embodiments for related points. The above-described system and system embodiments are only illustrative, wherein the units described as separate parts may or may not be physically separate, and the parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment. One of ordinary skill in the art can understand and implement it without inventive effort.
Those of skill would further appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, computer software, or combinations of both, and that the various illustrative components and steps have been described above generally in terms of their functionality in order to clearly illustrate this interchangeability of hardware and software. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the implementation. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (10)
1. The test equipment of the LKJ host unit is characterized by comprising an analog signal generator, a digital signal generator and a display;
the analog signal generator is connected with a first input interface of the LKJ host unit and the display, and sends a generated analog signal to the first input interface and the display, wherein the analog signal is used for simulating the analog signal input of the running environment of the LKJ host unit;
the digital signal generator is connected with a second input interface of the LKJ host unit, and sends a generated digital signal to the second input interface, wherein the digital signal is used for simulating digital signal input of an operating environment of the LKJ host unit;
the display is further connected with an output interface of the LKJ host unit and used for displaying signals generated after the LKJ host unit processes the analog signals and the digital signals.
2. The test apparatus of claim 1, wherein the analog signal generator is connected to a first input interface of the LKJ host unit through a converter and a first transmission bus;
the converter is used for converting the signal format of the analog signal; the first transmission bus is connected with the converter and a first input interface of the LKJ host unit, and transmits the analog signals after signal format conversion to the first input interface.
3. The test apparatus of claim 2, wherein the converter is a controller area network converter;
the first transmission bus is a controller area network bus.
4. The test apparatus of claim 1, wherein the digital signal generator comprises: a signal source and a signal interface board;
the signal source is used for generating the digital signal;
and the signal interface board is connected with a second input interface of the LKJ and used for sending the digital signal to the second input interface in a transmission mode corresponding to the signal interface board.
5. The test device of claim 4, wherein the signal interface board comprises a parallel interface board, and/or a serial interface board;
the parallel interface board is used for sending the digital signal to the second input interface in a parallel transmission mode;
and the serial interface board is used for sending the digital signal to the second input interface in a serial transmission mode.
6. The test apparatus of claim 5, wherein the signal interface board comprises at least a parallel interface board and a serial interface board.
7. The test apparatus of claim 6, wherein each parallel interface board communicates with a different input interface of the LKJ host unit, and wherein each parallel interface board transmits a different digital signal.
8. The test apparatus of claim 1, further comprising an oscilloscope coupled to the digital signal generator for displaying the digital signal.
9. The test apparatus of claim 1, further comprising a power module including circuitry for powering the analog signal generator, the digital signal generator, and the display.
10. The test apparatus of claim 1, wherein the display comprises an oscilloscope and a display screen;
the oscilloscope is used for displaying a digital signal generated after the LKJ host unit processes the digital signal;
the display screen is used for displaying an analog signal generated after the LKJ host unit processes the analog signal;
the analog signal generator and the display screen are located in the same electronic device.
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| CN201922149407.1U CN210691107U (en) | 2019-12-04 | 2019-12-04 | Test equipment of LKJ host unit |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111679650A (en) * | 2020-06-08 | 2020-09-18 | 中车洛阳机车有限公司 | Simple method for testing performance of LKJ2000 type train operation monitoring and recording device |
| CN111722025A (en) * | 2020-06-15 | 2020-09-29 | 广东高电计量检测有限公司 | Low pressure nuclear phase ware detection device |
| CN112687091A (en) * | 2020-12-31 | 2021-04-20 | 哈尔滨市科佳通用机电股份有限公司 | Locomotive signal code sending remote control device, locomotive signal testing system and locomotive signal testing method |
-
2019
- 2019-12-04 CN CN201922149407.1U patent/CN210691107U/en active Active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111679650A (en) * | 2020-06-08 | 2020-09-18 | 中车洛阳机车有限公司 | Simple method for testing performance of LKJ2000 type train operation monitoring and recording device |
| CN111722025A (en) * | 2020-06-15 | 2020-09-29 | 广东高电计量检测有限公司 | Low pressure nuclear phase ware detection device |
| CN111722025B (en) * | 2020-06-15 | 2023-09-29 | 广东高电计量检测有限公司 | Low-voltage phase detector detection device |
| CN112687091A (en) * | 2020-12-31 | 2021-04-20 | 哈尔滨市科佳通用机电股份有限公司 | Locomotive signal code sending remote control device, locomotive signal testing system and locomotive signal testing method |
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