CN210690787U - Electric control lock fault detection system - Google Patents
Electric control lock fault detection system Download PDFInfo
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- CN210690787U CN210690787U CN201921112002.4U CN201921112002U CN210690787U CN 210690787 U CN210690787 U CN 210690787U CN 201921112002 U CN201921112002 U CN 201921112002U CN 210690787 U CN210690787 U CN 210690787U
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Abstract
The utility model relates to an electric control lock fault detection system, including controller, power, NMOS pipe and switch circuit, the grid of NMOS pipe links to each other with the first control output of controller, and the drain electrode links to each other with the power negative pole of the internal coil of electric control lock, and the controller gathers the on-off state of electric control lock at the collection end; the switch circuit is connected between the power supply and the power supply anode of the internal coil, and the control end of the switch circuit is connected with the second control output end of the controller; the first detection end of the controller is connected between the output end of the switch circuit and the positive electrode of the power supply, and the second detection end of the controller is connected between the negative electrode of the power supply and the drain electrode of the NMOS tube; the controller receives an unlocking instruction and outputs a signal indicating whether the electric control lock is in fault or not according to signals at the acquisition end, the first detection end and the second detection end. The utility model is used for realize electric control lock fault detection.
Description
Technical Field
The utility model relates to a from carrying cabinet door accuse technical field, concretely relates to electric control lock fault detection system for electric control lock in carrying cabinet door body certainly.
Background
The principle of a lock control circuit of an electric control lock in an existing self-lifting cabinet door body is shown in fig. 1, a lock control plate 1 is connected with an electric control lock 2 through a wire guide plate or a cable 3, specifically, the lock control plate 1 collects a state switch K of the electric control lock 2 to detect the opening/closing of the cabinet door, a power supply anode of an internal coil in the electric control lock 2 is connected with a power supply VCC in the lock control plate 1, a power supply cathode is grounded through an NMOS tube Q2, in the unlocking process, if the power supply anode of the internal coil in the electric control lock 2 is short-circuited, the wire guide plate or the cable 3 is easily burnt, if the power supply cathode is short-circuited to the ground, both the wire guide plate and the internal coil are easily burnt, so that the unlocking cannot be performed, and the specific position of the lock short-circuited cannot be judged in the conventional existing lock control circuit shown in fig. 1, a measuring tool such as a multimeter is.
SUMMERY OF THE UTILITY MODEL
The utility model provides an electric control lock fault detection system for be provided with switch circuit between the power positive pole and the power of electric control lock inner coil, realize the anodal break-make electric control of electric control lock power, and the signal that the controller detected through the signal and first sense terminal and the second sense terminal of gathering the end collection, realize electric control lock fault detection.
In order to realize the technical purpose, the utility model provides a following technical scheme realizes:
a fault detection system for an electric control lock comprises a controller, a power supply and an NMOS (N-channel metal oxide semiconductor) tube, wherein a grid electrode of the NMOS tube is connected with a first control output end of the controller, a drain electrode of the NMOS tube is connected with a power supply negative electrode of an internal coil of the electric control lock, and the controller collects the on-off state of the electric control lock at a collection end; it is characterized in that the electric control lock fault detection system further comprises: the switch circuit is connected between the power supply and the power supply anode of the internal coil, and the control end of the switch circuit is connected with the second control output end of the controller; the first detection end of the controller is connected between the output end of the switch circuit and the positive electrode of the power supply, and the second detection end of the controller is connected between the negative electrode of the power supply and the drain electrode of the NMOS tube; and the controller receives an unlocking instruction and outputs a signal indicating whether the electric control lock is in fault or not according to signals at the acquisition end, the first detection end and the second detection end.
In order to avoid that the power supply is directly short-circuited to ground and is pulled dead when the switching circuit fails, the electric control lock fault detection system as described above further comprises a self-restoring fuse connected between the power supply and the switching circuit.
As an embodiment of the switch circuit, the switch circuit is a low-level conducting switch circuit, an input terminal of the switch circuit is connected to the power supply through the self-recovery fuse, and an output terminal of the switch circuit is connected between the first detection terminal and the positive electrode of the power supply.
As an embodiment of the switch circuit turned on at a low level, the switch circuit is a PMOS transistor, a gate of the PMOS transistor is connected to the second control output terminal of the controller, a source of the PMOS transistor is connected to the power supply through the self-healing fuse, and a drain of the PMOS transistor is connected between the first detection terminal and the power supply positive electrode of the internal coil.
According to the electric control lock fault detection system, the controller further comprises a diode, the anode of the diode is connected between the drain electrode of the NMOS transistor and the negative electrode of the power supply of the internal coil, and the negative electrode of the diode is connected between the output end of the switch circuit and the positive electrode of the power supply of the internal coil.
The electric control lock fault detection system further comprises a lock control plate, and the controller, the switch circuit and the NMOS tube are respectively arranged on the lock control plate.
The electric control lock fault detection system further comprises a display module connected with the controller and a display screen connected with the display module, and the display module is used for displaying electric control lock fault information and facilitating maintenance personnel to check electric control lock fault conditions.
According to the fault detection system for the electric control lock, the lock shell of the electric control lock is grounded.
Compared with the prior art, the utility model provides an electric control lock fault detection system has following advantage and beneficial effect: be connected with switch circuit between the power of the inner coil of power and electric control lock anodal, through switching on or turn-off of control switch circuit, realize the anodal on-off control of power of electric control lock inner coil, and the controller detects whether there is the trouble in the electric control lock through the signal of the on-off state of gathering the end collection and the signal that first detection end and second detection end department detected, realizes electric control lock fault detection, the maintenance of the maintenance personal of being convenient for.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the embodiments of the present invention or the description of the prior art will be briefly described below, and it is obvious that the drawings described below are some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
FIG. 1 is a schematic diagram of a lock control circuit of an electric control lock in the prior art;
fig. 2 is a schematic diagram of an embodiment of the electric control lock fault detection system of the present invention;
fig. 3 is the flow chart of the fault detection of the embodiment of the electric control lock fault detection system of the utility model.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.
As shown in fig. 1, in the prior art, an NMOS transistor Q2 is used, when a power supply positive pole of an internal coil of an electric control lock 2 is shorted to ground, a conducting board or a cable 3 is easily burned out, the conducting board or the cable 3 is burned out and cannot be electrically controlled to unlock, when a power supply negative pole of the internal coil of the electric control lock 2 is shorted to ground, the conducting board or the cable 3 and the internal coil are easily burned out, and the internal coil is burned out and can cause that both the electric control and the structure cannot unlock. And the lock control circuit in the prior art can not detect the fault position of the electric control lock 2, which is not beneficial to maintenance of maintenance personnel. And the micro-control switch K in the electric control lock 2 has the limitation of mechanical service life times and electrical service life times, and the switch state misjudgment can be caused by the error of an internal structural part.
In order to solve the above technical problem, the present embodiment provides a fault detection system for an electric control lock, including a controller (for example, an MCU chip, not shown), a power supply VCC, an NMOS transistor Q2 and a switch circuit, where a gate G of the NMOS transistor Q2 is connected to a first control output terminal IO2 of the controller, a source S is grounded, a drain D is connected to a power supply negative electrode of an internal coil of the electric control lock 2, and the controller collects a switching state of the electric control lock 2 at a collection terminal IO 1; the switch circuit is connected between a power supply VCC and the power supply anode of the internal coil, and the control end of the switch circuit is connected with a second control output end IO3 of the controller; a first detection end IO4 of the controller is connected between the output end of the switch circuit and the positive electrode of the power supply, and a second detection end IO5 of the controller is connected between the negative electrode of the power supply and the drain D of the NMOS transistor Q2; the controller receives an unlocking instruction and outputs a signal indicating whether the electric control lock 2 is in fault or not according to signals at the acquisition end IO1, the first detection end IO4 and the second detection end IO 5.
In this embodiment, when unlocking, the controller receives an unlocking instruction, outputs a level signal at the first control output terminal IO2 or the second control output terminal IO3, controls the on or off of the switch circuit or the NMOS transistor Q2, collects potentials at the first detection terminal IO4 and the second detection terminal IO5, and detects a fault of the electric control lock 2 according to the switch state collected by the collection terminal IO1 and the potentials at the two detection terminals. In this embodiment, for example, when the controller receives an unlocking instruction and the cabinet door is in an open state, the switch state collected by the collection terminal IO1 is a high level, and when the cabinet door is in a closed state, the switch state collected by the collection terminal IO1 is a low level.
In this embodiment, in order to avoid burning out the circuit when the lock is short-circuited, in this embodiment, the on-time of the switch circuit and the on-time of the NMOS transistor Q2 are limited, when the controller receives an unlock command, the on-time of the switch circuit is equal to the on-time of the NMOS transistor Q2, the time of collecting the potential at the a point at the first detection end IO4, and the time of collecting the potential at the B point at the second detection end IO5, for example, the on-time of the switch circuit is controlled to be 400ms, and the time of applying a high level to the gate G of the NMOS transistor Q2 is 200ms, so that when the electrically controlled lock 2 is short-circuited, the longest on-time is 400ms, the conducting wire board or the cable 3 or the internal coil is not burned, and when the electrically controlled lock 2 has no fault, the longest on-time is 200.
As shown in fig. 2, in order to implement the self-checking function of the electric control lock 2, in this embodiment, the switch circuit is a low-level conducting switch circuit, for example, a PMOS transistor Q1, a gate G of which is connected to the second control output IO3 of the controller, a source S of which is connected to a power supply VCC (in this embodiment, VCC is 12V), and a drain D of which is connected to the positive power supply of the internal coil.
With reference to fig. 2 and 3, the process of detecting a fault of the electric controlled lock 2 is described: (1) when the controller receives an unlocking instruction, the second control output end IO3 outputs a low level to enable the PMOS tube Q1 to be conducted, the power supply anode of the internal coil is communicated with the power supply VCC, the level at the point A is VCC at the moment, namely 12V (marked as a first high level), and if the power supply anode of the internal coil and the power supply cathode cable are not in fault, the point B is also communicated with the power supply VCC through the internal coil and the PMOS tube Q1; (2) the first detection end IO4 of the controller collects the potential of the point A, the second detection end IO5 collects the potential of the point B, if the potential of the point A is 0V, the potential of the point A represents that the positive electrode of a power supply of an internal power supply is short to the ground (marked as a fault one), at the moment, the second control output end IO3 can be controlled to output a high level, and the PMOS tube Q1 is turned off; if the potential of the point A is 12V, the power supply positive cable of the internal coil has no problem; (3) when the potential of the point a is 12V, if the potential of the point B is 0V, it indicates that the power supply negative electrode of the internal coil is short-circuited to ground (denoted as fault two), at this time, the second control output terminal IO3 may be controlled to output a high level, so that the PMOS transistor Q1 is turned off, but if the potential of the point B is 12V (denoted as second high level, since the NMOS transistor Q2 is not controlled to be turned on at this time, no current passes through the internal coil, there is no voltage drop in the internal coil, and the potential of the point B is equal to the potential of the point a), it indicates that the electric control latch 2 has no short-circuit problem, and at this time, the; (4) under the condition that the NMOS transistor Q2 is conducted, at this time, if the potential at the point B is pulled down to 0V from 12V, it indicates that the electric control lock has a disconnection fault (marked as fault three), at this time, the first control output end IO2 can be controlled to output a low level and the second control output end IO3 outputs a high level, so that the NMOS transistor Q2 and the PMOS transistor Q1 are both turned off, and if the potential at the point B is lowered to about 0.2V-0.4V (marked as low level, the voltage is the voltage drop of the NMOS transistor Q2) from 12V, it indicates that the electric control lock 2 has no fault; (5) if the switch state collected by the collection end IO1 is opened when the electric control lock 2 is free of faults, the electric control lock 2 is normal, at the moment, the first control output end IO2 can be controlled to output low level, the second control output end IO3 can be controlled to output high level, the NMOS tube Q2 and the PMOS tube Q1 are both turned off, and the switch state is continuously detected until the cabinet door is closed; if the on-off state collected by the collection end IO1 is off when the electric control lock 2 has no fault, it indicates that the lock on-off state detection function fault or the electric control lock 2 itself structure fault (recorded as fault four) causes the door to be unable to be opened, at this moment, the first control output end IO2 can be controlled to output low level and the second control output end IO3 to output high level, so that the NMOS tube Q2 and the PMOS tube Q1 are both turned off, and on the bottom, the lock on-off state detection function fault or the electric control lock itself structure fault, further field confirmation by maintenance personnel is needed. For the sake of safety, the lock shell of the electric control lock 2, the cabinet body of the express delivery cabinet and the ground of the fault detection system are respectively connected with the ground.
For the convenience of maintenance personnel knows the concrete trouble of automatically controlled lock 2, when detecting to have trouble one, trouble two, trouble three or trouble four, can show the fault information of automatically controlled lock, specifically, the controller can show fault information on the display screen through the display module that links to each other with the controller to maintenance personnel look over, or can upload the trouble that produces to long-range commodity circulation monitoring terminal, be convenient for centralized management commodity circulation express delivery cabinet, thereby grasp the state of express delivery cabinet.
All the electric control locks 2 share the power source VCC, and in the prior art, as shown in FIG. 1, when the electric control locks 2 are short-circuited, the power source VCC can be directly dead, so that all the cabinets cannot work; in order to avoid the situation that the power supply VCC is dead pulled and the wire guide plate or the cable 3 or the internal coil is burnt out when the lock is in short circuit, as shown in FIG. 2, a self-recovery fuse F is connected between the power supply VCC and the PMOS tube Q1, and a PMOS tube Q1 is connected between the self-recovery fuse F and the power supply positive electrode of the internal coil of the electric control lock 2 and the power supply VCC, when one electric control lock 2 is in short circuit fault, normal use of other electric control locks 2 cannot be caused.
As shown in fig. 1 and 2, since a reverse electromotive force is generated when the electric control lock 2 is powered off, in order to discharge the reverse electromotive force, a diode D1 is connected between the positive power supply electrode and the negative power supply electrode of the internal coil of the electric control lock 2, the positive electrode of the diode D1 is connected between the drain D of the NMOS transistor Q2 and the negative power supply electrode of the internal coil, and the negative electrode is connected between the drain D of the PMOS transistor Q1 and the positive power supply electrode of the internal coil. And as shown in fig. 1 and fig. 2, the controller (for example, an MCU chip), the PMOS transistor Q1, the self-recovery fuse F, NMOS, the transistor Q2 and the diode D1 are all disposed on the lock control board 1, the lock control board 1 and the electric control lock 2 can be electrically connected through a wire board or a cable 3, and the controller collects the on-off state of the micro control switch K inside the electric control lock 2 through a communication cable. And the fault detection of the cable of the electric control lock 2 is realized by detecting the potential of the point A and the potential of the point B, so that whether the microswitch K is damaged or misjudged can be monitored, and the reliability of the state detection of the microswitch K of the electric control lock 2 is improved.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present invention in its corresponding aspects.
Claims (8)
1. A fault detection system for an electric control lock comprises a controller, a power supply and an NMOS (N-channel metal oxide semiconductor) tube, wherein a grid electrode of the NMOS tube is connected with a first control output end of the controller, a drain electrode of the NMOS tube is connected with a power supply negative electrode of an internal coil of the electric control lock, and the controller collects the on-off state of the electric control lock at a collection end; it is characterized in that the electric control lock fault detection system further comprises:
the switch circuit is connected between the power supply and the power supply anode of the internal coil, and the control end of the switch circuit is connected with the second control output end of the controller;
the first detection end of the controller is connected between the output end of the switch circuit and the positive electrode of the power supply, and the second detection end of the controller is connected between the negative electrode of the power supply and the drain electrode of the NMOS tube;
and the controller receives an unlocking instruction and outputs a signal indicating whether the electric control lock is in fault or not according to signals at the acquisition end, the first detection end and the second detection end.
2. An electric control lock fault detection system according to claim 1 further comprising a self-restoring fuse connected between the power supply and the switching circuit.
3. An electric control lock fault detection system according to claim 2, wherein the switch circuit is a low-level conducting switch circuit, an input terminal of the switch circuit is connected to the power supply through the self-recovery fuse, and an output terminal of the switch circuit is connected between the first detection terminal and the positive pole of the power supply.
4. An electric control lock fault detection system according to claim 3, wherein the switch circuit is a PMOS transistor, a gate of the PMOS transistor is connected to the second control output terminal of the controller, a source of the PMOS transistor is connected to the power supply through the self-healing fuse, and a drain of the PMOS transistor is connected between the first detection terminal and a power supply positive electrode of the internal coil.
5. An electric control lock fault detection system according to any one of claims 1 to 4, wherein the controller further comprises a diode having an anode connected between the drain of the NMOS tube and a negative power supply terminal of the internal coil, and a negative terminal connected between the output of the switching circuit and a positive power supply terminal of the internal coil.
6. The electric control lock fault detection system according to any one of claims 1 to 4, further comprising a lock control board, wherein the controller, the switch circuit and the NMOS tube are respectively disposed on the lock control board.
7. The electric control lock fault detection system according to any one of claims 1 to 4, further comprising a display module connected to the controller and a display screen connected to the display module for displaying electric control lock fault information.
8. An electrically controlled lock fault detection system according to any of claims 1 to 4 wherein the lock housing of the electrically controlled lock is grounded.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921112002.4U CN210690787U (en) | 2019-07-16 | 2019-07-16 | Electric control lock fault detection system |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921112002.4U CN210690787U (en) | 2019-07-16 | 2019-07-16 | Electric control lock fault detection system |
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| CN210690787U true CN210690787U (en) | 2020-06-05 |
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| CN201921112002.4U Active CN210690787U (en) | 2019-07-16 | 2019-07-16 | Electric control lock fault detection system |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110244168A (en) * | 2019-07-16 | 2019-09-17 | 青岛海信商用显示股份有限公司 | A kind of electric control lock fault detection system and detection method |
| CN113721091A (en) * | 2021-08-16 | 2021-11-30 | 北京京东乾石科技有限公司 | Access control module testing device and testing method thereof |
-
2019
- 2019-07-16 CN CN201921112002.4U patent/CN210690787U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110244168A (en) * | 2019-07-16 | 2019-09-17 | 青岛海信商用显示股份有限公司 | A kind of electric control lock fault detection system and detection method |
| CN110244168B (en) * | 2019-07-16 | 2021-05-25 | 青岛海信商用显示股份有限公司 | Electric control lock fault detection system and detection method |
| CN113721091A (en) * | 2021-08-16 | 2021-11-30 | 北京京东乾石科技有限公司 | Access control module testing device and testing method thereof |
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