CN210575845U - Solar cell test equipment - Google Patents

Abstract

The utility model relates to a solar cell test equipment, it includes: the testing device comprises a first testing base, a second testing base, a testing line group, a current collecting substrate and a voltage collecting column assembly, wherein the second testing base is positioned below the first testing base; a plurality of voltage collecting column assemblies are arranged in the installation area of the current collecting substrate, the arrangement direction of the voltage collecting column assemblies is parallel to the axis direction of the current collecting substrate, and the upper end surfaces of the voltage collecting columns are flush with the upper surface of the installation area. The utility model discloses test equipment can test to complete no main grid battery piece, is the face contact between the battery back and the current collection base plate, and the atress homogeneity is good, has reduced because of the test group pushes down the solar cell that causes and the risk probability that lobe of a leaf or hidden splitting appears, and work efficiency is high.

Description

Solar cell test equipment

Technical Field

The utility model belongs to the technical field of solar cell, in particular to solar cell test equipment.

Background

At present, in order to prepare a high-efficiency solar cell, people continuously improve the photoelectric conversion efficiency of the solar cell through various methods, a solar cell without a main grid is developed, and the front surface and the back surface of the solar cell without the main grid are only provided with confluence thin grid lines, so that the illuminated area is improved, and the photoelectric conversion efficiency of the solar cell is improved.

In the preparation process of the solar cell, the measurement of electrical performance parameters is a very important link for measuring the quality of the performance of the solar cell. At present, in order to collect electrical performance parameter measurement of a solar cell, a plurality of copper columns are generally arranged on a copper platform to be in contact with the back surface of the solar cell, and current is collected through the copper columns, so that the reliability of ohmic contact can be improved, and the contact resistance can be reduced. However, the back surface of the solar cell is supported by the copper column, the contact area of the back surface and the copper column is small, when the back surface is pressed by matching with a front tester of the solar cell, the cell is easy to crack or is hidden to crack, and the current and voltage collecting effect is limited.

SUMMERY OF THE UTILITY MODEL

The utility model provides a solve above-mentioned technical problem and provide a solar cell test equipment, it can solve present solar cell back and lean on the copper post to support, and the copper post is little with solar cell area of contact, and the during operation causes solar cell to appear lobe of a leaf or latent splitting easily, and collects the limited technical problem of effect.

The utility model provides an above-mentioned technical problem's technical scheme as follows: a solar cell testing apparatus, comprising: a first test base, a second test base positioned below the first test base, a test line set, a current collecting substrate and a voltage collecting column assembly,

the bottom of the first test base is fixedly provided with the test line group, the top of the second test base is fixedly provided with the current collecting substrate, the current collecting substrate corresponds to the test line group, and the current collecting substrate is arc-shaped and is provided with a top mounting area;

the current collecting substrate is characterized in that a plurality of voltage collecting column assemblies are arranged in the mounting area of the current collecting substrate at intervals, the arrangement direction of the voltage collecting column assemblies is parallel to the axis direction of the current collecting substrate, and the upper end surfaces of the voltage collecting columns are flush with the upper surface of the mounting area.

The utility model has the advantages that:

(1) the utility model discloses the test line group can contact with the thin grid line of no main grid solar cell to form a plurality of cross contact points, and solar cell's electric current and voltage directly pass through cross contact point and pass to the detection line, and rethread test line passes to the detector, has greatly increased test effect;

(2) when the testing equipment works, the back surface of the battery is in surface contact with the current collecting substrate, the uniformity of the stress between the back surface of the battery and the current collecting substrate is good, and the risk probability of cracking or hidden cracking of the solar battery caused by the pressing of the testing line group is greatly reduced;

(3) the utility model forms surface contact between the current collecting substrate and the back of the battery, which can improve the current collecting rate;

(4) under the matching of the voltage collecting column assembly and the current collecting substrate, the test board of the utility model can collect current and voltage simultaneously, thus improving the accuracy of the test;

(5) the utility model discloses test equipment can test to complete no main grid battery piece, and work efficiency is high, does not have the slow problem of battery sorting beat.

On the basis of the technical scheme, the utility model discloses can also do following improvement.

Furthermore, a plurality of mounting through holes penetrating through the current collection substrate are formed in the upper surface of the mounting area of the current collection substrate, and the mounting through holes are arranged at intervals along the axis direction of the current collection substrate; voltage collection post subassembly with the mounting hole one-to-one, voltage collection post subassembly includes that voltage collection post and fixed cover establish insulating external member on the voltage collection post lateral wall, voltage collection post and insulating external member are all fixed to be set up in the mounting hole, the up end of voltage collection post up end and insulating external member all with the upper surface of installation area flushes.

The beneficial effect of adopting the further scheme is that: the voltage collection column can avoid the current collection substrate to influence the voltage collection column through the insulation sleeve, so that the collection stability of current and voltage is improved, and the test efficiency is improved.

Furthermore, the voltage collecting column is a copper column, an aluminum column, a silver-plated copper column, a gold-plated copper strip or a copper-beryllium alloy column.

The beneficial effect of adopting the further scheme is that: the gold-plated copper column has the advantages of wear resistance, low resistivity and the like, and can reduce the electric energy loss during testing, thereby improving the detection effect.

Furthermore, a plurality of voltage test probes are further arranged on the upper surface of the current collecting substrate, the voltage test probes are uniformly and symmetrically distributed on two sides of the installation area, and each voltage test probe has a preset up-down moving stroke. Further, the voltage test probe is a spring test probe.

The beneficial effect of adopting the further scheme is that: when the voltage test probe is pressed down by the solar cell, the spring test probe is matched with the arc-shaped current collecting substrate, so that the spring test probe can be ensured to be always contacted with the back surface of the solar cell, and the contact between the back surface of the solar cell and the current collecting substrate is not influenced.

And the adsorption component is embedded in the second test base, is in contact with the current collection substrate and adsorbs the back surface of the solar cell.

The beneficial effect of adopting the further scheme is that: solar cell is fixed through adsorption component to prevent that solar cell from removing, influencing the test effect.

Furthermore, the adsorption component comprises a plurality of adsorption holes penetrating through the current collection substrate and a vacuum channel arranged in the second test base and communicated with the adsorption holes, and the vacuum channel is provided with an external interface communicated to the side face of the second test base. Furthermore, the plurality of adsorption holes are uniformly and symmetrically distributed on two sides of the installation area.

The beneficial effect of adopting the further scheme is that: the vacuum channel is convenient to install, can adsorb the back of the solar cell through connecting the adsorption holes, and is convenient to operate, simple and practical.

Further, the current collecting substrate is a copper collecting substrate, an aluminum collecting substrate, a silver-plated copper collecting substrate, a gold-plated copper collecting substrate or a beryllium copper alloy collecting substrate. Further, the voltage collecting column is a copper collecting substrate.

The beneficial effect of adopting the further scheme is that: the current collecting substrate has the advantages of wide production raw material source, simplicity and easiness in obtaining, can effectively reduce the manufacturing cost, and can meet different testing requirements.

Further, the first test base is a through structure and is provided with a first inner side wall and a first outer side wall which are opposite to each other, and a second inner side wall and a second outer side wall which are opposite to each other, wherein the first inner side wall and the second inner side wall are arranged oppositely;

a plurality of first return spring assemblies are uniformly distributed on the first inner side wall of the first test base, and a plurality of second return spring assemblies are uniformly distributed on the second inner side wall of the first test base;

a plurality of first fastening adjusting components are uniformly distributed on the first outer side wall of the first test base, and a plurality of first fastening adjusting components are uniformly distributed on the second outer side wall of the first test base;

a first rolling shaft corresponding to the first return spring assembly and a second rolling shaft corresponding to the second return spring assembly are arranged below the first side surface of the first test base, the first rolling shaft and the second rolling shaft are arranged oppositely, the first rolling shaft is fixedly connected with the first side surface of the first test base through a support A, and the second rolling shaft is fixedly connected with the first side surface of the first test base through a support B;

the test wire groups are uniformly arranged between the first rolling shaft and the second rolling shaft at intervals, each test wire group is provided with a plurality of test wires, the first end of each test wire rounds the first rolling shaft and turns, then the test wire passes through the first reset spring assembly to be fixedly connected with the first fastening adjusting assembly, and the test wire passing through the first reset spring assembly is fixedly connected with the first reset spring assembly through the locking piece; and the second end of each test wire bypasses a second roller for turning and then passes through a second reset spring assembly to be fixedly connected with a second fastening adjusting assembly, and the test wire passing through the second reset spring assembly is fixedly connected with the second reset spring assembly through a locking piece.

The beneficial effect of adopting the further scheme is that:

(1) the first rolling shaft and the second rolling shaft of the utility model can play a role in buffering the deformation of the test wire, thereby reducing the deformation loss of the test wire, reducing the maintenance rate and increasing the test device;

(2) the first return spring assembly and the second return spring assembly of the utility model can more flexibly adjust the deformation state of the test wire, thereby providing convenience for the repeated use of the test device and reducing the deformation loss of the test wire;

(3) the utility model discloses a cooperation of first roller bearing, second roller bearing, first reset spring subassembly and second reset spring subassembly can make the atress on the test wire more even, stable, helps the abundant contact of test wire and thin grid line, has strengthened test effect.

Further, the first reset spring assembly comprises a first fixed seat, a first threading column and a first spring, the side wall of the first fixed seat is fixedly connected with the first inner side surface of the first test base, the first fixed seat is provided with a first accommodating groove with an opening and a first through hole penetrating through the first fixed seat, and the axes of the first through hole and the first accommodating groove are collinear and communicated; the first threading column is of a hollow structure with an opening of part A and an opening of part B, the section diameter length of the part A of the first threading column is larger than the inner diameter length of the first through hole, and the part B of the first threading column sequentially passes through the first accommodating groove and the first through hole and freely moves up and down along the extension direction of the first through hole; the first spring is sleeved on the first threading column and is positioned in the first accommodating groove;

the second reset spring assembly comprises a second fixed seat, a second threading column and a second spring, the side wall of the second fixed seat is fixedly connected with the second inner side surface of the first test base, a second accommodating groove with an opening and a second through hole penetrating through the second fixed seat are formed in the second fixed seat, and the axes of the second through hole and the second accommodating groove are collinear and communicated; the second threading column is of a hollow structure with a part C opening and a part D opening, the section diameter length of the part C of the second threading column is larger than the inner diameter length of the second through hole, and the part D of the second threading column sequentially passes through the second accommodating groove and the second through hole and freely moves up and down along the direction of the second through hole; the second spring is sleeved on the second wire penetrating column and is located in the second accommodating groove.

The beneficial effect of adopting the further scheme is that: can reset the test wire after contact solar cell warp through first spring and second spring, simple structure facilitates the use, has avoided manual regulation test wire tension.

Furthermore, the first fastening adjustment assembly comprises a first positioning seat and a first positioning piece, a first threading through hole penetrating through the first positioning seat is formed in the first positioning seat, one side wall of the first positioning seat is fixedly connected with the first outer side surface of the first test base, a first wire pressing hole is formed in the other side wall, far away from the first outer side surface of the first test base, of the first positioning seat, and the first wire pressing hole penetrates through the first positioning seat and is vertically communicated with the first threading through hole; the first positioning piece is matched with the first wire pressing hole, and the end part of the first positioning piece penetrates through the first wire pressing hole and then presses the test wire penetrating through the first threading through hole;

the second fastening adjusting assembly comprises a second positioning seat and a second positioning piece, a second threading through hole penetrating through the second positioning seat is formed in the second positioning seat, one side wall of the second positioning seat is fixedly connected with the second outer side surface of the first test base, a second wire pressing hole is formed in the other side wall, far away from the second outer side surface of the first test base, of the second positioning seat, and the second wire pressing hole penetrates through the second positioning seat and is vertically communicated with the second threading through hole; the second positioning piece is matched with the second wire pressing hole, and the end of the second positioning piece presses the test wire passing through the second threading through hole after passing through the second wire pressing hole.

The beneficial effect of adopting the further scheme is that: the test wire passing through the first wire pressing hole can be fixed or loosened through the first positioning piece; can fix or loosen the test wire that passes the second line ball hole through the second setting element, can conveniently adjust test wire tension like this, easy operation, simple to operate.

Furthermore, the first positioning piece, the second positioning piece, the first wire pressing holes and the second wire pressing holes are all in multiple numbers, and the multiple first wire pressing holes are distributed in parallel along the extending direction of the first threading through hole; the plurality of second wire pressing holes are distributed in parallel along the extending direction of the second threading through hole; the first positioning pieces correspond to the first wire pressing holes one to one, and the second positioning pieces correspond to the second wire pressing holes one to one.

The beneficial effect of adopting the further scheme is that: the plurality of first line pressing holes and the plurality of second line pressing holes can realize fine adjustment of the test line; meanwhile, the first positioning pieces and the second positioning pieces can play a certain safety protection role on the device, and the test wire is prevented from sliding.

Further, the first fastening adjustment assembly further comprises a first test wire clamping sleeve, the first test wire clamping sleeve is sleeved on the test wire, and when the first test wire clamping sleeve penetrates through the first threading through hole along with the test wire, the first positioning piece presses the test wire clamping sleeve;

the second fastening adjustment assembly further comprises a second test line clamping sleeve, the second test line clamping sleeve is arranged on the test line in a sleeved mode, the second test line clamping sleeve penetrates through the second threading through hole along with the test line, and the second positioning piece presses the test line clamping sleeve.

The beneficial effect of adopting the further scheme is that: through first test wire centre gripping cover utensil and second test wire centre gripping cover utensil can make things convenient for first setting element to push down the test wire and the second setting element pushes down the test wire respectively to improve and mediate efficiency, convenient operation.

Further, the first positioning piece and the second positioning piece are both positioning bolts or positioning screws.

Further, the test wire is at least one of a copper wire, a silver wire and a gold-plated copper wire. Further, the test wire is a gold-plated copper wire.

The beneficial effect of adopting the further scheme is that: the gold-plated copper wire test wire has the advantages of wear resistance, low resistivity and the like, and can reduce the electric energy loss during testing, thereby improving the detection effect.

Drawings

FIG. 1 is a schematic view of the front view structure of the testing device of the present invention;

3 FIG. 32 3 is 3 a 3 schematic 3 view 3 of 3 the 3 cross 3- 3 sectional 3 structure 3 of 3 the 3 testing 3 device 3 of 3 the 3 present 3 invention 3 along 3 the 3 A 3- 3 A 3 direction 3; 3

Fig. 3 is a schematic top view of the second testing base, the current collecting base plate and the voltage collecting column assembly of the present invention;

FIG. 4 is a schematic view of the cross-sectional structure of the present invention along the B-B direction;

FIG. 5 is a schematic view of the cross-sectional structure of the present invention along the C-C direction;

fig. 6 is a schematic top view of the first test base and the test wire set according to the present invention;

fig. 7 is a schematic diagram of a right-view structure of the first test base and the test cord set according to the present invention;

fig. 8 is a schematic structural view of a first return spring assembly of the present invention;

fig. 9 is a schematic view of the first threading post structure of the present invention.

In the drawings, the components represented by the respective reference numerals are listed below:

1. a first test base; 11. a first inner side wall; 12. a second inner side wall; 13. a first outer side wall; 14. a second exterior sidewall;

2. a second test base;

3. a current collecting substrate; 31. an installation area; 32. mounting a through hole;

4. a voltage collector column assembly; 41. a voltage collection column; 42. an insulating sleeve member;

5. an adsorption component; 51. an adsorption hole; 52. a vacuum channel; 53. an external interface;

6. a first return spring assembly; 61. a first fixed seat; 62. a first accommodating groove; 63. a first through hole; 64. a first threading post; 65. part A; 66. part B; 67. a first spring;

7. a second return spring assembly; 71. a second fixed seat; 72. a second accommodating groove; 73. a second through hole; 74. a second threading post; 75. a moiety C; 76. a moiety D; 77. a second spring;

8. a first fastening adjustment assembly; 81. a first positioning seat; 82. a first threading through hole; 83. a first wire pressing hole; 84. a first positioning member;

9. a second fastening adjustment assembly; 91. a second positioning seat; 92. a second threading through hole; 93. a second wire pressing hole; 94. a second positioning member;

100. a voltage test probe;

101. a first roller;

102. a second roller;

103. a locking member;

104. a first test line clamping sleeve;

105. a second test line clamping sleeve;

106. a bracket A;

107. a bracket B;

108. a support member;

109. a solar cell sheet;

110. a test line group; 111. a test line;

118. a wire.

Detailed Description

The principles and features of the present invention are described below in conjunction with the following drawings, the examples given are only intended to illustrate the present invention and are not intended to limit the scope of the present invention.

In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, but do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be construed as limiting the present invention. Furthermore, the terms "first", "second", etc. are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first," "second," etc. may explicitly or implicitly include one or more of that feature. In the description of the invention, unless otherwise specified, "a plurality" means two or more.

In the description of the present invention, it should be noted that unless otherwise explicitly stated or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the creation of the present invention can be understood by those of ordinary skill in the art through specific situations.

The present invention will be further described with reference to the accompanying drawings 1-9:

in a first mode

The present invention provides a solar cell testing apparatus, which combines fig. 1 to 9, and includes: a first test base 1, a second test base 2 located below the first test base 1, a test line group 110, a current collecting substrate 3, and a voltage collecting column assembly 4, wherein,

the bottom of the first test base 1 is fixedly provided with the test line group 110, the top of the second test base 2 is fixedly provided with the current collecting substrate 3, the current collecting substrate 3 corresponds to the test line group 110, and the current collecting substrate 3 is arc-shaped and is provided with a top mounting area 31;

the installation area 31 of the current collection substrate 3 is provided with a plurality of voltage collection column assemblies 4 at intervals, the arrangement direction of the voltage collection column assemblies 4 is parallel to the axis direction of the current collection substrate 3, and the upper end surfaces of the voltage collection columns 41 are flush with the upper surface of the installation area 31.

The solar cell 109 can solve the technical problems that the back surface of the solar cell 109 is supported by the copper column at present, the contact area between the copper column and the solar cell 109 is small, the solar cell 109 is prone to cracking or hidden cracking during working, and the collecting effect is limited.

The testing equipment can test the complete non-main-grid battery plate, the working efficiency is high, the sorting beat of the battery is not slow, the back surface of the battery is in surface contact with the current collecting substrate 3 when the testing equipment works, the stress uniformity between the back surface of the battery and the current collecting substrate is good, and the risk probability of cracking or hidden cracking of the solar battery 109 caused by pressing down of the testing line group 110 is greatly reduced; the current collecting substrate 3 is in surface contact with the back surface of the battery, and the current collecting rate can be improved.

In addition, the test wire group 110 of the present embodiment can contact with the thin grid lines of the solar cells 109 without main grid, and form a plurality of cross contacts, and the current and voltage of the solar cells 109 are directly transmitted to the test wire through the cross contacts and then transmitted to the detector through the test wire 111, thereby greatly increasing the test effect; under voltage collecting column subassembly 4 and the cooperation of current collection base plate 3, the utility model discloses the testboard can collect electric current and voltage simultaneously, has improved the accuracy of test.

In order to improve the test effect, a plurality of mounting through holes 32 penetrating through the current collecting substrate 3 are formed in the upper surface of the mounting region 31 of the current collecting substrate 3, and the mounting through holes 32 are arranged at intervals along the axial direction of the current collecting substrate 3; voltage collection post subassembly 4 with installation through-hole 32 one-to-one, voltage collection post subassembly 4 includes that voltage collection post 41 and fixed cover are established insulation external member 42 on the 41 lateral wall of voltage collection post, voltage collection post 41 and insulation external member 42 are all fixed to be set up in the installation through-hole 32, the up end of voltage collection post 41 up end and insulation external member 42 all with the upper surface of installation area 31 flushes.

In this way, the voltage collecting column 41 can prevent the current collecting substrate 3 from affecting the voltage collecting column 41 through the insulating sleeve 42, so that the current and voltage collecting stability is improved, and the test efficiency is improved.

The voltage collecting column 41 is a copper column, an aluminum column, a silver-plated copper column, a gold-plated copper strip or a copper-beryllium alloy column. Specifically, the voltage collecting pillars 41 of this embodiment are gold-plated copper pillars. The gold-plated copper column has the advantages of wear resistance, low resistivity and the like, and can reduce the electric energy loss during testing, thereby improving the detection effect.

It is understood that, in order to improve the fixing stability and match the shape of more batteries, supports 108 are further provided at both side edges of the upper surface of the current collecting substrate 3, respectively, and the top ends of the supports 108 are flush with the upper surface of the mounting region 31.

It should be noted that the form of the test apparatus of the present embodiment is very diverse, and several alternatives are provided below.

Mode two

The difference between this mode and the first mode is that, with reference to fig. 1 to 9, a plurality of voltage test probes 100 are further disposed on the upper surface of the current collecting substrate 3, the voltage test probes 100 are uniformly and symmetrically distributed on two sides of the mounting region 31, and each voltage test probe 100 has a predetermined up-down moving stroke.

Therefore, the voltage can be tested more quickly through the voltage test probe 100, the installation and arrangement are quick, and the maintenance is convenient; the voltage test probes 100 are disposed at both sides of the mounting region 31 to help collect the voltage of the rear surface of the solar cell 109 more comprehensively.

Further, the voltage test probe 100 is a spring test probe. When the voltage test probe 100 is pressed down by the solar cell 109, the spring test probe is matched with the arc-shaped current collecting substrate 3, so that the spring test probe can be ensured to be always in contact with the back surface of the solar cell 109, and the contact between the back surface of the solar cell 109 and the current collecting substrate 3 is not influenced. Still further, the spring test probe is a Coaxial probe of the Coaxial holder of the Puxishi industry or a conventional spring probe.

Mode III

The difference between this mode and the first mode is that, with reference to fig. 1 to 9, the test bench further includes an absorption component 5, and the absorption component 5 is embedded in the base, and contacts with the current collecting substrate 3 and absorbs the back surface of the solar cell 109.

In this way, the solar cell 109 is fixed by the adsorption member 5, so that the solar cell 109 is prevented from moving and affecting the test effect.

The adsorption assembly 5 includes a plurality of adsorption holes 51 penetrating through the current collecting substrate 3, and a vacuum channel 52 disposed in the base and communicating with the adsorption holes 51, wherein the vacuum channel 52 has an external interface 53 communicating with a side surface of the base.

Thus, the vacuum channel 52 is convenient to install, can adsorb the back of the solar cell 109 through the connecting adsorption hole 51, is convenient to operate, and is simple and practical.

In order to improve the suction effect, the suction holes 51 are uniformly and symmetrically distributed on both sides of the mounting region 31.

In this way, the uniform and symmetrical arrangement of the adsorption holes 51 enables the adsorption force to be more uniform, thereby improving the fixing effect.

It will be appreciated that the voltage collector column assembly 4 and the voltage test probe 100 are connected to the voltage test unit by test lines 111; the current collecting substrate 3 is connected with the current testing component through a testing line 111; the above connection methods are all prior art.

Mode IV

The difference between this mode and the first mode is that, with reference to fig. 1 to 9, the first test base 1 is a through structure, and has a first inner sidewall 11 and a first outer sidewall 13 which are opposite to each other, and a second inner sidewall 12 and a second outer sidewall 14 which are opposite to each other, and the first inner sidewall 11 and the second inner sidewall 12 are opposite to each other;

a plurality of first return spring assemblies 6 are uniformly distributed on a first inner side wall 11 of the first test base 1, and a plurality of second return spring assemblies 7 are uniformly distributed on a second inner side wall 12 of the first test base;

a plurality of first fastening adjusting components 8 are uniformly arranged on a first outer side wall 13 of the first test base 1, and a plurality of first fastening adjusting components 8 are uniformly arranged on a second outer side wall 14 of the first test base;

a first roller 101 corresponding to the first return spring assembly 6 and a second roller 102 corresponding to the second return spring assembly 7 are arranged below the first side surface of the first test base 1, the first roller 101 and the second roller 102 are arranged oppositely, the first roller 101 is fixedly connected with the first side surface of the first test base 1 through a support A106, and the second roller 102 is fixedly connected with the first side surface of the first test base 1 through a support B107;

the test wire groups 110 are uniformly arranged between the first roller 101 and the second roller 102 at intervals, the test wire group 110 is provided with a plurality of test wires 111, a first end of each test wire 111 rounds the first roller 101 and turns direction, then passes through the first return spring assembly 6 to be fixedly connected with the first fastening adjustment assembly 8, and the test wire 111 passing through the first return spring assembly 6 is fixedly connected with the first return spring assembly 6 through the locking piece 103; the second end of each test wire 111 rounds the second roller 102 and turns, and then passes through the second return spring assembly 7 to be fixedly connected with the second fastening adjusting assembly 9, and the test wire 111 passing through the second return spring assembly 7 is fixedly connected with the second return spring assembly 7 through the locking piece 103.

In this mode, the first roller 101 and the second roller 102 can buffer the deformation of the test line 111, thereby reducing the deformation loss of the test line 111, reducing the maintenance rate, and increasing the number of test devices; first reset spring subassembly 6 and second reset spring subassembly 7 can be more nimble adjust the 111 deformation state of test wire, provide convenience for testing arrangement's repetitious usage to reduce the deformation loss of test wire 111.

In addition, this mode is through the cooperation of first roller 101, second roller 102, first reset spring subassembly 6 and second reset spring subassembly 7, can make the atress on the test wire 111 more even, stable, helps the abundant contact of test wire 111 with thin grid line, has strengthened the test effect.

It is understood that the test wire 111 is at least one of a copper wire, an aluminum wire, a silver-plated copper wire, a gold-plated copper wire, or a beryllium copper wire. Further, the test wire 111 is a gold-plated copper wire.

It will also be appreciated that the above-described locking member 103 for securing the test wire 111 and the first return spring assembly 6/second return spring assembly 7 is well known in the art. Specifically, the locking piece 103 adopted by the present embodiment is a cold wire terminal, the test wire 111 is fixed in the cold wire terminal, and the connecting end of the cold wire terminal is fixed to the connecting groove on the first return spring assembly 6/the second return spring assembly 7, so that the test wire 111 is fixed to the first return spring assembly 6/the second return spring assembly 7.

In order to improve the resetting effect, as shown in fig. 8, the first resetting spring assembly 6 includes a first fixing seat 61, a first threading post 64 and a first spring 67, a side wall of the first fixing seat 61 is fixedly connected to a first inner side surface of the first test base 1, the first fixing seat 61 is provided with a first receiving groove 62 having an opening and a first through hole 63 penetrating through the first fixing seat 61, and axes of the first receiving groove 62 and the first through hole 63 are collinear and communicated; the first threading column 64 is a hollow structure with an opening of a part 65 and an opening of a part B66, the sectional diameter length of the part a 65 of the first threading column 64 is greater than the inner diameter length of the first through hole 63, and the part B66 of the first threading column 64 sequentially passes through the first accommodating groove 62 and the first through hole 63 and freely moves up and down along the extending direction of the first through hole 63; the first spring 67 is sleeved on the first wire passing column 64, and the first spring 67 is located in the first accommodating groove 62;

as shown in fig. 8, the second return spring assembly 7 includes a second fixing seat 71, a second threading post 74 and a second spring 77, a side wall of the second fixing seat 71 is fixedly connected to a second inner side surface of the first test base 1, the second fixing seat 71 is provided with a second receiving groove 72 having an opening and a second through hole 73 penetrating through the second fixing seat 71, and axes of the second receiving groove 72 and the second through hole 73 are collinear and communicated; the second threading pillar 74 is a hollow structure with an opening of a C part 75 and an opening of a D part 76, the cross-sectional diameter length of the C part 75 of the second threading pillar 74 is greater than the inner diameter length of the second through hole 73, and the D part 76 of the second threading pillar 74 sequentially passes through the second accommodating groove 72 and the second through hole 73 and moves up and down freely along the direction of the second through hole 73; the second spring 77 is sleeved on the second wire passing column 74, and the second spring 77 is located in the second receiving groove 72.

Like this, can reset the test wire 111 who contacts after solar cell 109 warp through first spring 67 and second spring 77, simple structure facilitates the use, has avoided manual regulation test wire 111 tension.

It should be noted that, since the first return spring assembly 6 and the second return spring assembly 7 have the same structure, the structural view of the second return spring assembly 7 can refer to fig. 8 and 9.

The above-mentioned support a106 and support B107 are prior art and can be realized by those skilled in the art. Here, we also present a specific structure, in which the support a106 is composed of two opposite first support bars, between which the first roller 101 is arranged; the support B107 is composed of two opposite second support bars, and the second roller 102 is disposed between the two second support bars.

It should be noted that the form of the first fastening adjustment assembly 8 and the second fastening adjustment assembly 9 of the present embodiment are various and we provide several alternative embodiments below.

Mode five

The difference between the present embodiment and the fourth embodiment is that, as shown in fig. 6 and fig. 7, the first fastening adjustment assembly 8 includes a first positioning seat 81 and a first positioning member 84, a first threading through hole 82 penetrating through the first positioning seat 81 is formed in the first positioning seat 81, one side wall of the first positioning seat 81 is fixedly connected to the first outer side surface of the first test base 1, a first wire pressing hole 83 is formed in the other side wall of the first positioning seat 81, which is far away from the first outer side surface of the first test base 1, and the first wire pressing hole 83 penetrates through the first positioning seat 81 and is vertically communicated with the first threading through hole 82; the first positioning piece 84 is matched with the first wire pressing hole 83, and after the end part of the first positioning piece 84 passes through the first wire pressing hole 83, the test wire 111 passing through the first threading through hole 82 is pressed;

as shown in fig. 6 and 7, the second fastening adjustment assembly 9 includes a second positioning seat 91 and a second positioning part 94, the second positioning seat 91 is provided with a second threading through hole 92 penetrating through the second positioning seat 91, a side wall of the second positioning seat 91 is fixedly connected to a second outer side surface of the first test base 1, another side wall of the second positioning seat 91, which is far away from the second outer side surface of the first test base 1, is provided with a second wire pressing hole 93, and the second wire pressing hole 93 penetrates through the second positioning seat 91 and is vertically communicated with the second threading through hole 92; the second positioning element 94 is matched with the second wire pressing hole 93, and after the end of the second positioning element 94 passes through the second wire pressing hole 93, the test wire 111 passing through the second threading through hole 92 is pressed.

Thus, the test wire 111 passing through the first wire hole 83 can be fixed or released by the first positioning member 84; can fix or loosen the test wire 111 that passes through second wire pressing hole 93 through second setting element 94, can conveniently adjust test wire 111 tension like this, easy operation, simple to operate.

The first positioning element 84 and the second positioning element 94 are both positioning bolts or positioning screws.

It should be understood that the test wire 111 is fixedly connected to the first threading post 64 through the locking member 103 after passing through the hollow structure of the first threading post 64; the test wire 111 is fixed to the second threading post 74 through a locking member 103 after passing through the hollow structure of the second threading post 74.

Mode six

The present embodiment is different from the fourth embodiment in that, as shown in fig. 6 and 7, the number of the first positioning members 84, the second positioning members 94, the first thread holes 83, and the number of the second thread holes 93 are all plural, and the plural first thread holes 83 are distributed in parallel along the extending direction of the first threading through hole 82; a plurality of the second wire pressing holes 93 are distributed in parallel along the extending direction of the second threading through hole 92; the first positioning parts 84 correspond to the first wire pressing holes 83 one to one, and the second positioning parts 94 correspond to the second wire pressing holes 93 one to one.

In this way, the plurality of first pressure wire holes 83 and the plurality of second pressure wire holes 93 enable fine adjustment of the test wire 111; meanwhile, the first positioning parts 84 and the second positioning parts 94 can play a certain safety protection role on the device, so that the test wire 111 is prevented from sliding.

Mode seven

The difference between this mode and the fifth mode is that, as shown in fig. 6 and 7, the first fastening adjustment assembly 8 further includes a first test wire 111 clamping sleeve, the first test wire 111 clamping sleeve is sleeved on the test wire 111, and when the first test wire 111 clamping sleeve passes through the first threading through hole 82 along with the test wire 111, the first positioning member 84 presses the test wire 111 clamping sleeve;

the second fastening adjustment assembly 9 further includes a second test line 111 clamping sleeve, the second test line 111 clamping sleeve is sleeved on the test line 111, and when the second test line 111 clamping sleeve passes through the second threading through hole 92 along with the test line 111, the second positioning element 94 presses the test line 111 clamping sleeve.

Therefore, the first test line 111 clamping sleeve and the second test line 111 clamping sleeve can respectively facilitate the first positioning part 84 to press the test line 111 and the second positioning part 94 to press the test line 111, so that the adjusting efficiency is improved, and the operation is convenient.

The working principle and the steps are as follows:

(1) the first test base 1 and the test line group 110 are installed and debugged, the second test base 2, the current collecting base plate 3 and the voltage collecting column assembly 4 are installed and debugged, and then the solar cell 109 to be tested is placed between the first test base 1 and the second test base 2;

(2) the second test base 2 is lifted, so that the voltage collecting column assembly 4 at the top of the second test base 2 is in contact with the back surface of the solar cell 109 to be tested;

(3) lowering the first test base 1 to enable the test line group 110 at the bottom of the first test base 1 to be in contact with the front surface of the solar cell 109 to be tested;

(4) and starting the tester respectively connected with the test wire group 110, the current collecting substrate 3 and the voltage collecting column assembly 4, and completing the test.

It will be understood that the means for controlling the raising of the second test base 2 and the lowering of the first test base 1 described above are all known to the person skilled in the art.

The above description is only for the preferred embodiment of the present invention, and is not intended to limit the present invention, and any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention should be included within the protection scope of the present invention.

Claims (10)

1. A solar cell, comprising: a first test base (1), a second test base (2) positioned below the first test base (1), a test line group (110), a current collecting substrate (3) and a voltage collecting column assembly (4), wherein,

the bottom of the first test base (1) is fixedly provided with the test line group (110), the top of the second test base (2) is fixedly provided with the current collecting substrate (3), the current collecting substrate (3) corresponds to the test line group (110), and the current collecting substrate (3) is arc-shaped and is provided with a top mounting area (31);

the current collection substrate is characterized in that a plurality of voltage collection column assemblies (4) are arranged in the installation area (31) of the current collection substrate (3) at intervals, the arrangement direction of the voltage collection column assemblies (4) is parallel to the axis direction of the current collection substrate (3), and the upper end surfaces of the voltage collection columns (41) are flush with the upper surface of the installation area (31).

2. The solar cell according to claim 1, wherein the mounting region (31) of the current collecting substrate (3) has a plurality of mounting through holes (32) formed on the upper surface thereof, the mounting through holes (32) penetrating through the current collecting substrate (3), and the mounting through holes (32) are arranged at intervals along the axial direction of the current collecting substrate (3); voltage collection post subassembly (4) with installation through-hole (32) one-to-one, voltage collection post subassembly (4) are established including voltage collection post (41) and fixed cover insulating external member (42) on voltage collection post (41) lateral wall, voltage collection post (41) and insulating external member (42) all are fixed to be set up in installation through-hole (32), the up end of voltage collection post (41) up end and insulating external member (42) all with the upper surface of installation area (31) flushes.

3. Solar cell according to claim 2, characterized in that the voltage collecting pillars (41) are copper pillars, aluminum pillars, silver-plated copper pillars, gold-plated copper strips or copper beryllium alloy pillars.

4. The solar cell according to any one of claims 1 to 3, wherein the current collecting substrate (3) is further provided at an upper surface thereof with a plurality of voltage testing probes (100), the plurality of voltage testing probes (100) are uniformly and symmetrically distributed at both sides of the mounting region (31), and each of the voltage testing probes (100) has a predetermined up-and-down moving stroke.

5. Solar cell according to any of claims 1 to 3, characterized in that it further comprises an adsorption element (5), said adsorption element (5) being embedded in said second test base (2) in contact with the current collection substrate (3) and adsorbing the back of the solar cell (109).

6. Solar cell according to claim 5, characterized in that the suction assembly (5) comprises a plurality of suction holes (51) extending through the current collecting substrate (3), a vacuum channel (52) arranged in the second test base (2) and communicating with the suction holes (51), the vacuum channel (52) having an external interface (53) communicating with the side of the second test base (2).

7. Solar cell according to any of claims 1 to 3, characterized in that the current collecting substrate (3) is a copper collecting substrate, an aluminium collecting substrate, a silver plated copper collecting substrate, a gold plated copper collecting substrate or a beryllium copper alloy collecting substrate.

8. Solar cell according to any of claims 1 to 3, characterized in that the first test base (1) is a through structure having opposite first inner (11) and first outer (13) side walls and opposite second (12) and second outer (14) side walls, the first inner side wall (11) being arranged opposite the second inner side wall (12);

a plurality of first reset spring assemblies (6) are uniformly distributed on a first inner side wall (11) of the first test base (1), and a plurality of second reset spring assemblies (7) are uniformly distributed on a second inner side wall (12) of the first test base;

a plurality of first fastening adjusting components (8) are uniformly distributed on a first outer side wall (13) of the first test base (1), and a plurality of first fastening adjusting components (8) are uniformly distributed on a second outer side wall (14) of the first test base;

a first roller (101) corresponding to the first reset spring assembly (6) and a second roller (102) corresponding to the second reset spring assembly (7) are arranged below the first side surface of the first test base (1), the first roller (101) and the second roller (102) are arranged oppositely, the first roller (101) is fixedly connected with the first side surface of the first test base (1) through a support A (106), and the second roller (102) is fixedly connected with the first side surface of the first test base (1) through a support B (107);

the test line group (110) is arranged between the first roller (101) and the second roller (102) at uniform intervals, the test line group (110) is provided with a plurality of test lines (111), the first end of each test line (111) rounds the first roller (101) and turns, then penetrates through the first return spring assembly (6) to be fixedly connected with the first fastening adjusting assembly (8), and the test line (111) penetrating through the first return spring assembly (6) is fixedly connected with the first return spring assembly (6) through the locking piece (103); and the second end of each test wire (111) bypasses the second roller (102) to change the direction and then passes through the second reset spring assembly (7) to be fixedly connected with the second fastening adjusting assembly (9), and the test wires (111) passing through the second reset spring assembly (7) are fixedly connected with the second reset spring assembly (7) through locking pieces (103).

9. The solar cell according to claim 8, wherein the first return spring assembly (6) comprises a first fixed seat (61), a first threading column (64) and a first spring (67), a side wall of the first fixed seat (61) is fixedly connected with a first inner side surface of the first test base (1), a first accommodating groove (62) with an opening and a first through hole (63) penetrating through the first fixed seat (61) are arranged on the first fixed seat (61), and axes of the first through hole (63) and the first accommodating groove (62) are collinear and communicated; the first threading column (64) is of a hollow structure with an opening of a part (65) A and an opening of a part B (66), the section diameter length of the part A (65) of the first threading column (64) is larger than the inner diameter length of the first through hole (63), and the part B (66) of the first threading column (64) sequentially passes through the first accommodating groove (62) and the first through hole (63) and freely moves up and down along the extending direction of the first through hole (63); the first spring (67) is sleeved on the first wire penetrating column (64), and the first spring (67) is located in the first accommodating groove (62);

the second reset spring assembly (7) comprises a second fixed seat (71), a second threading column (74) and a second spring (77), the side wall of the second fixed seat (71) is fixedly connected with the second inner side surface of the first test base (1), a second accommodating groove (72) with an opening and a second through hole (73) penetrating through the second fixed seat (71) are formed in the second fixed seat (71), and the axes of the second accommodating groove (72) and the second through hole (73) are collinear and communicated; the second threading column (74) is of a hollow structure with a C part (75) opening and a D part (76) opening, the section diameter length of the C part (75) of the second threading column (74) is larger than the inner diameter length of the second through hole (73), and the D part (76) of the second threading column (74) sequentially passes through the second accommodating groove (72) and the second through hole (73) and freely moves up and down along the direction of the second through hole (73); the second spring (77) is sleeved on the second threading column (74), and the second spring (77) is located in the second accommodating groove (72).

10. The solar cell according to claim 8, wherein the first fastening adjustment assembly (8) comprises a first positioning seat (81) and a first positioning member (84), a first threading through hole (82) penetrating through the first positioning seat (81) is formed in the first positioning seat (81), one side wall of the first positioning seat (81) is fixedly connected with the first outer side surface of the first test base (1), a first wire pressing hole (83) is formed in the other side wall of the first positioning seat (81) far away from the first outer side surface of the first test base (1), and the first wire pressing hole (83) penetrates through the first positioning seat (81) and is vertically communicated with the first threading through hole (82); the first positioning piece (84) is matched with the first wire pressing hole (83), and after the end part of the first positioning piece (84) penetrates through the first wire pressing hole (83), the test wire (111) penetrating through the first threading through hole (82) is pressed;

the second fastening adjusting assembly (9) comprises a second positioning seat (91) and a second positioning piece (94), a second threading through hole (92) penetrating through the second positioning seat (91) is formed in the second positioning seat (91), one side wall of the second positioning seat (91) is fixedly connected with the second outer side face of the first testing base (1), a second wire pressing hole (93) is formed in the other side wall, far away from the second outer side face of the first testing base (1), of the second positioning seat (91), and the second wire pressing hole (93) penetrates through the second positioning seat (91) and is vertically communicated with the second threading through hole (92); the second positioning part (94) is matched with the second wire pressing hole (93), and after the end part of the second positioning part (94) penetrates through the second wire pressing hole (93), the test wire (111) penetrating through the second threading through hole (92) is pressed.

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