CN210427726U - Test panel is surveyed to chip based on ATE test machine - Google Patents
Test panel is surveyed to chip based on ATE test machine Download PDFInfo
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- CN210427726U CN210427726U CN201920893997.6U CN201920893997U CN210427726U CN 210427726 U CN210427726 U CN 210427726U CN 201920893997 U CN201920893997 U CN 201920893997U CN 210427726 U CN210427726 U CN 210427726U
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Abstract
The utility model discloses a chip test panel based on ATE test machine, include: a circuit board and a component socket; a socket group; patch type socket; externally connecting a signal wiring column group; a power supply wiring terminal; the components and parts possesses the utensil of inserting is used for connecting the components and parts that await measuring, inserts row group and includes a plurality of rows of inserting, and external signal terminal group is including a plurality of external signal terminal, and every of inserting the row is participated in and is included: the patch type socket comprises a first terminal, a second terminal, a third terminal, a fourth terminal, a fifth terminal, a sixth terminal, a seventh terminal, an eighth terminal and a ninth terminal, wherein even-numbered pins of a socket are connected with pins of a component socket, the first terminal is connected with signal pins of a patch type socket, and the third terminal is connected with power pins of the patch type socket; the fifth terminal is connected with the ground pin of the patch type socket; the seventh terminal is connected with the power supply wiring terminal, and the ninth terminal is connected with the external signal wiring terminal. The utility model provides the high commonality.
Description
Technical Field
The utility model relates to a microelectronics technical field especially relates to a chip test panel based on ATE test machine.
Background
With the development of microelectronic device technology, various electronic devices have been widely used in various fields such as aerospace, military industry, scientific research, general electronics, and the like. Ate (automatic Test equipment) is automatic Test equipment, which is an integrated circuit Test system, used for IC testing.
The main purpose of integrated circuit testing (IC testing) is to distinguish between a qualified chip and an unqualified chip, and to ensure the quality and reliability of the product. With the rapid development of integrated circuits, the scale of the integrated circuits is getting larger, the requirements on the quality and reliability of the circuits are further improved, the testing method of the integrated circuits is also getting more difficult, and when the integrated circuits are tested, the testing plate is used as a carrier of electronic devices in the test, and plays a very important role in the functional test and the parameter test of the electronic devices.
However, the requirements of devices with different voltages, different pin sequences, different loads and different packaging forms for carrying out large-scale integrated circuit tests on electronic devices cannot be met in the original test device, the test is time-consuming, the test device is not universal, and the test cost is very high.
SUMMERY OF THE UTILITY MODEL
For solving the technical problem who proposes in the background art, the utility model discloses the first aspect provides a chip test panel based on ATE test machine, include: the circuit board and set up in on the circuit board:
a component inserter;
a socket group;
patch type socket;
externally connecting a signal wiring column group;
a power supply wiring terminal;
wherein, the components and parts possesses the components and parts that are used for connecting awaiting measuring, row group is inserted including a plurality of rows of inserting, external signal terminal group is including a plurality of external signal terminal, every of inserting the row is participated in and is included: the patch type socket comprises a first terminal, a second terminal, a third terminal, a fourth terminal, a fifth terminal, a sixth terminal, a seventh terminal, an eighth terminal and a ninth terminal, wherein even-numbered pins of the socket are connected with pins of the component socket, the first terminal is connected with signal pins of the patch type socket, and the third terminal is connected with power pins of the patch type socket; the fifth terminal is connected with the ground pin of the patch type socket; the seventh terminal is connected with the power wiring terminal, the ninth terminal is connected with the external signal wiring terminal, the power wiring terminal is used for providing access of an external power supply, and the external signal wiring terminal is used for providing access of an external signal.
Preferably, the patch type socket is two in number and is respectively located on two sides of the component socket.
Preferably, the number of the socket groups is two, and the two socket groups are respectively located on two sides of the component socket.
Preferably, the number of the external signal terminal column groups is two, and the two external signal terminal column groups are respectively located on one side of the two socket groups.
Preferably, each said socket group includes 48 socket, each said external signal terminal post group includes 48 external signal terminal posts, the ninth terminal of 48 socket with 48 external signal terminal posts are connected in one-to-one correspondence.
Preferably, the model number of the component plug-in is DIP 48.
The utility model has the advantages as follows:
technical scheme has realized when carrying out the large-scale integrated circuit test to the components and parts that await measuring, participate in the selection through each to the components and parts that await measuring and apply different signals, the selection is applyed different voltages, the selection is applyed different loads, in order to realize many voltage rails, many signals, the chip test of many loads, the commonality and the specialty of circuit board have been improved, can effectively utilize current testing arrangement to seek the maximize of test ability, a new road has been opened up to internal large-scale integrated circuit test system, produced fund cost and time cost when having reduced the test, let integrated circuit design flow system more high-efficient.
Drawings
The following describes embodiments of the present invention in further detail with reference to the accompanying drawings.
Fig. 1 shows a schematic structural diagram of a chip test board based on an ATE tester according to an embodiment of the present invention.
In the figure: 100. a circuit board; 101. patch type socket; 102. a component inserter; 103. a socket group; 104. externally connecting a signal wiring column group; 105. and a power supply wiring terminal.
Detailed Description
In order to explain the present invention more clearly, the present invention will be further described with reference to the preferred embodiments and the accompanying drawings. Similar parts in the figures are denoted by the same reference numerals. It is to be understood by persons skilled in the art that the following detailed description is illustrative and not restrictive, and is not to be taken as limiting the scope of the invention.
For solving the problem that proposes in the background art, fig. 1 shows the utility model discloses a structural schematic diagram that chip survey test panel based on ATE test machine that an embodiment provided, as shown in fig. 1, the chip surveys test panel and includes the circuit board and sets up on the circuit board: the device comprises a component socket, a socket group, a patch type socket, an external signal wiring column group and a power supply wiring column.
Specifically, wherein, the components and parts plug tool is used for connecting the components and parts that await measuring, row of inserting group is including a plurality of rows of inserting, external signal terminal group is including a plurality of external signal terminal, every of row of inserting is participated in and is included: the patch type socket comprises a first terminal, a second terminal, a third terminal, a fourth terminal, a fifth terminal, a sixth terminal, a seventh terminal, an eighth terminal and a ninth terminal, wherein even-numbered pins of the socket are connected with pins of a component socket, the first terminal is connected with signal pins of the patch type socket, and the third terminal is connected with power pins of the patch type socket; the fifth terminal is connected with the ground pin of the patch type socket; the seventh terminal is connected with the power wiring terminal, the ninth terminal is connected with the external signal wiring terminal, the power wiring terminal is used for providing access of an external power supply, and the external signal wiring terminal is used for providing access of an external signal.
Technical scheme has realized when carrying out the large-scale integrated circuit test to the components and parts that await measuring, participate in the selection through each to the components and parts that await measuring and apply different signals, the selection is applyed different voltages, the selection is applyed different loads, in order to realize many voltage rails, many signals, the chip test of many loads, the commonality and the specialty of circuit board have been improved, can effectively utilize current testing arrangement to seek the maximize of test ability, a new road has been opened up to internal large-scale integrated circuit test system, produced fund cost and time cost when having reduced the test, let integrated circuit design flow system more high-efficient.
Further, in this embodiment, the number of patch type socket is two, two the patch type socket is located the both sides of components and parts plug-in fitting respectively.
In this embodiment, two SMD socket seats are located the both sides of components and parts plug-in components, can conveniently lay wire, reduce the circuit loss, need explain that the quantity of SMD socket seat can be set for by oneself by the user, its concrete numerical value the utility model discloses do not prescribe a limit, SMD socket seat is participated in including 100, and every is participated in and all has its function that corresponds, and when testing components and parts that await measuring, the pin that needs to use mainly has three types: the power supply pin with the function of the power supply is connected with the third terminal of the patch board, the pin with the function of the ground is connected with the fifth terminal, and the signal pin with the function of the signal channel is connected with the first terminal.
Furthermore, the number of the socket groups is two, and the two socket groups are respectively located on two sides of the component socket.
Specifically, in this embodiment, two are inserted row group and are located the both sides of components and parts insertion tool, can conveniently lay wire, reduce the line loss, need explain that the quantity of inserting row group can be set for by oneself by the user, its specific numerical value the utility model discloses do not restrict.
Furthermore, the number of the external signal wiring column groups is two, and the two external signal wiring column groups are respectively positioned on one side of the two socket groups.
Specifically, every external signal terminal group is connected with the ninth terminal that corresponds the row of inserting group, and every external signal terminal group provides the access of different external signals, and in this embodiment, two external signal terminal groups are located one side of two row of inserting groups respectively, can conveniently lay wire, reduce the line loss, need explain that the quantity of external signal terminal group can be set for by oneself by the user, its specific numerical value the utility model discloses do not prescribe a limit.
Furthermore, every the row of inserting group includes 48 rows of inserting, every external signal terminal post group includes 48 external signal terminal posts, 48 ninth terminals of row of inserting with 48 external signal terminal post one-to-one are connected.
Furthermore, the type of the component socket may be DIP48, taking the component socket of the type DIP48 as an example, the number of pins of the component socket of the type DIP48 is 48, and the component to be tested of 48 pins can be plugged in, and it should be specially explained that 48 pins of the component socket of the type DIP48 correspond to different 48 signal channels, so that pins of the signal channels corresponding to each pin are different.
In order to further facilitate wiring, in the specific implementation of the embodiment, a layered wiring is adopted to distinguish a power line and a ground line, a layered wiring is adopted to distinguish a signal channel line and an external signal channel line of a tester, and a double-layer wiring and a nearby wiring are adopted to reduce line consumables and avoid lead voltage arcing.
Specifically, the connecting line of the power pin of the patch type socket and the third terminal of the socket group can be arranged on the first surface of the chip test board, the connecting line of the power terminal and the seventh terminal is arranged on the first surface of the chip test board, the connecting line of the ground wire and the fifth terminal of the socket group is arranged on the second surface of the chip test board, the connecting line of the external signal terminal and the ninth terminal of the socket group is arranged on the first surface of the chip test board, the signal channel line connecting the signal pin of the patch type socket and the first terminal of the socket group is arranged on the second surface of the chip test board, and the connecting line connecting the pin of the component inserter and the even number pin of the socket is arranged on the first surface of the chip test board.
Furthermore, the chip testing board provided by the embodiment further comprises a jumper cap, wherein the jumper cap is used for short-circuiting the pins correspondingly connected with the component plug-in and the pins corresponding to multi-voltage power supply and multi-signal transmission in the socket group.
When the chip test board provided by the embodiment is used, the two groups of patch type socket are connected with the test machine mother board, the test machine mother board also has a socket base corresponding to the corresponding pin, and the patch type socket and the socket base are fully matched, so that power supply and signal exchange of the test machine to the chip test board are realized.
Furthermore, in this embodiment, the operation of defining the excitation applied to any pin can be performed, the range of the device to be tested by the tester can be expanded, the inherent one-to-one special chip test board mode can be broken, the universality and feasibility of the chip test board can be improved, and the cost and period of the chip test can be reduced.
Specifically, in the embodiment, a signal or a power supply or a ground to be added to each pin is selected through the jumper cap, after the selection is finished, the chip test board is connected with the motherboard of the test machine through the patch type socket, the power supply and the signal waveform corresponding to the test machine are set, the external power supply and the external signal are connected, the component to be tested is placed on the component socket corresponding to the test machine, the external power supply and the external signal are connected, and the component to be tested is placed on the component socket for testing.
Furthermore, after the components and parts to be tested are changed, the pin definition can be changed by changing the position of the jumper cap, the chip test board does not need to be replaced, and one board is multipurpose, so that the purpose of universality of the chip test board in the embodiment is achieved.
Obviously, the above embodiments of the present invention are only examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention, and it is obvious for those skilled in the art to make other variations or changes based on the above descriptions, and all the embodiments cannot be exhausted here, and all the obvious variations or changes that belong to the technical solutions of the present invention are still in the protection scope of the present invention.
Claims (6)
1. A chip test board based on an ATE tester is characterized by comprising: the circuit board and set up in on the circuit board:
a component inserter;
a socket group;
patch type socket;
externally connecting a signal wiring column group;
a power supply wiring terminal;
wherein, the components and parts possesses the components and parts that are used for connecting awaiting measuring, row group is inserted including a plurality of rows of inserting, external signal terminal group is including a plurality of external signal terminal, every of inserting the row is participated in and is included: the patch type socket comprises a first terminal, a second terminal, a third terminal, a fourth terminal, a fifth terminal, a sixth terminal, a seventh terminal, an eighth terminal and a ninth terminal, wherein even-numbered pins of the socket are connected with pins of the component socket, the first terminal is connected with signal pins of the patch type socket, and the third terminal is connected with power pins of the patch type socket; the fifth terminal is connected with the ground pin of the patch type socket; the seventh terminal is connected with the power wiring terminal, the ninth terminal is connected with the external signal wiring terminal, the power wiring terminal is used for providing access of an external power supply, and the external signal wiring terminal is used for providing access of an external signal.
2. The chip test board according to claim 1, wherein the number of the patch socket is two, and the two patch sockets are respectively located on two sides of the component socket.
3. The chip testing board according to claim 1, wherein the number of the socket groups is two, and the two socket groups are respectively located at two sides of the component socket.
4. The chip testing board according to claim 3, wherein the number of the external signal connecting post groups is two, and the two external signal connecting post groups are respectively located at one side of the two socket groups.
5. The chip test board according to claim 1, wherein each of the socket groups comprises 48 sockets, each of the external signal post groups comprises 48 external signal posts, and ninth terminals of the 48 sockets are connected to the 48 external signal posts in a one-to-one correspondence.
6. The chip test board according to claim 1, wherein the component socket is DIP 48.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920893997.6U CN210427726U (en) | 2019-06-14 | 2019-06-14 | Test panel is surveyed to chip based on ATE test machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920893997.6U CN210427726U (en) | 2019-06-14 | 2019-06-14 | Test panel is surveyed to chip based on ATE test machine |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN210427726U true CN210427726U (en) | 2020-04-28 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201920893997.6U Active CN210427726U (en) | 2019-06-14 | 2019-06-14 | Test panel is surveyed to chip based on ATE test machine |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN210427726U (en) |
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2019
- 2019-06-14 CN CN201920893997.6U patent/CN210427726U/en active Active
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