CN210059046U - Test system and electronic product production line system - Google Patents
Test system and electronic product production line system Download PDFInfo
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- CN210059046U CN210059046U CN201920809717.9U CN201920809717U CN210059046U CN 210059046 U CN210059046 U CN 210059046U CN 201920809717 U CN201920809717 U CN 201920809717U CN 210059046 U CN210059046 U CN 210059046U
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Abstract
The utility model discloses a test system and electronic product production line system, wherein the test system is used for testing the voltage state of the electronic product, the test system comprises a test device, a main controller and an interception device; the test device is connected with the main controller, and the main controller is connected with the intercepting equipment; the main controller is used for sending a test instruction to the test device when the electronic product is determined to move to a test station; the test device is used for receiving the test instruction sent by the main controller, testing the electronic product according to the test instruction and sending a test result to the main controller so that the main controller judges whether to send an interception instruction to the interception equipment or not according to the test result; the interception equipment is used for receiving the interception instruction sent by the test device and intercepting the electronic product according to the product identification. The utility model discloses technical scheme accomplishes to prevent staying mistake proofing completely, avoids appearing unqualified electronic product and flows into the risk in market.
Description
Technical Field
The utility model relates to an electronic product technical field, in particular to test system and electronic product production line system.
Background
The television product comprises a plurality of electronic devices and circuits, and in order to test whether the insulation degree of the produced television product is qualified or not and ensure the personal safety of a user, an alternating current/direct current high-voltage test is carried out during the production of the whole television, and products which are not subjected to the high-voltage test are intercepted and removed. At present, a high-voltage test of a television is carried out by using a high-voltage tester, the television starts to carry out the high-voltage test when arriving at a test station, a prompting lamp at the station is turned on to prompt a test result after the test is finished, a prompting green lamp is turned on to indicate that the test is OK, and a prompting red lamp is turned on to indicate that the test is poor. And the staff moves out the bad television for maintenance by observing the state of the prompting lamp. However, the method of removing the bad television by the personnel cannot completely prevent the dead and the mistake, and has the risk that the bad television is missed to be moved to the market.
SUMMERY OF THE UTILITY MODEL
The utility model aims at providing a test system and electronic product production line system aims at preventing that bad machine from leaking to remove, promotes the effect of preventing slow-witted mistake proofing.
In order to achieve the above object, the present invention provides a testing system for testing the voltage status of an electronic product, including a testing device, a master controller and an intercepting device; the test device is connected with the main controller, and the main controller is connected with the intercepting equipment;
the main controller is used for detecting whether the electronic product moves to a test station or not, and sending a test instruction to the test device if the electronic product is determined to move to the test station, wherein the test instruction is used for triggering the test device to work and comprises a product identifier of the electronic product;
the testing device is used for receiving the testing instruction sent by the main controller, determining the electronic product to be tested according to the product identification and testing the electronic product; after the electronic product is tested, obtaining a test result corresponding to the electronic product, and sending the test result to the main controller, so that the main controller judges whether to send an interception instruction to the interception equipment or not according to the test result;
the intercepting equipment is used for receiving the intercepting instruction sent by the testing device and intercepting the electronic product according to the product identification.
Preferably, the test system further comprises a transmission member, a test station and an interception station are arranged on the transmission member, the test station is located in the middle of the transmission member, and the interception station is located at the tail end of the transmission member; the test device is arranged on the test station, and the interception equipment is arranged on the interception station;
and the main controller is used for controlling the intercepting equipment to intercept the electronic product after confirming that the electronic product moves to the intercepting station and judging that a judgment result sent by the testing device is in a bad state.
Preferably, the testing device comprises a high-voltage tester and a high-voltage testing state acquisition device electrically connected with the high-voltage tester, and the high-voltage testing state acquisition device is electrically connected with the main controller; the high-voltage tester is arranged on the testing station, and the high-voltage testing state acquisition device and the high-voltage tester are arranged at intervals;
the main controller is used for sending a test instruction to the high-voltage tester after confirming that the electronic product moves to the test station;
the high-voltage tester is used for detecting the voltage state of the electronic product after receiving the test instruction and sending a test result to the high-voltage test state acquisition device;
and the high-voltage test state acquisition device is used for outputting a judgment result according to the test result sent by the high-voltage tester and sending the judgment result to the main controller.
Preferably, the test system further comprises an in-place sensor arranged on the test station, and the in-place sensor is electrically connected with the high-voltage test state acquisition device;
the in-place sensor is used for detecting whether the electronic product moves to a testing station or not, and transmitting an in-place signal to the high-voltage testing state acquisition device if the electronic product is determined to move to the testing station;
and the high-voltage test state acquisition device is used for controlling the high-voltage tester to detect the voltage state of the electronic product according to the in-place signal.
Preferably, the transmission part is further provided with an off-position station, and the off-position station is located between the test station and the interception station; the test system also comprises an off-position sensor arranged on the off-position station, and the off-position sensor is electrically connected with the high-voltage test state acquisition device;
the off-position sensor is used for detecting whether the electronic product moves to the off-position station or not, and transmitting an off-position signal to the high-voltage test state acquisition device if the electronic product is confirmed to move to the off-position station;
and the high-voltage test state acquisition device is used for transmitting a judgment result to the main controller.
Preferably, the test system further comprises a prompt red light and a prompt green light which are arranged on the transmission part, and the prompt red light and the prompt green light are both connected with the high-voltage test state acquisition device;
the high-voltage test state acquisition device is used for controlling the prompting red light to be on when the test result is determined to be in a bad state; and if the judgment result is in a normal state, controlling the prompting green light to be on.
Preferably, the test system further comprises a scanning gun for scanning a product code of the electronic product, the scanning gun is arranged on the transmission member, and the scanning gun is electrically connected with the test device;
and the scanning gun is used for scanning the product code of the electronic product and transmitting the product code information to the high-voltage test state acquisition device before the electronic product moves to the test station.
Preferably, the test system further comprises a network module, the test device is in signal connection with the network module, and the network module is in signal connection with the master controller.
Preferably, the network module is a WiFi module, a bluetooth module or a 4G module.
The utility model discloses an electronic product production line system that still provides, including as above test system.
The technical scheme of the utility model is that the test device is connected with the main controller, and the main controller is connected with the interception equipment; after the electronic product moves to a test station, the main controller sends a test instruction to the test device, and the test device detects the voltage state of the electronic product and sends a judgment result to the main controller; the main controller controls the intercepting equipment to intercept the electronic product when the judgment result is in a bad state; so set up, the electronic product of bad state need not to rely on the artifical method of removing, just can repair the electronic product that has the problem once more, accomplishes to prevent staying mistake proofing completely, avoids appearing unqualified electronic product and flows into the risk in market.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the structures shown in the drawings without creative efforts.
FIG. 1 is a schematic flow chart of an embodiment of a test system of the present invention;
fig. 2 is a schematic structural diagram of an embodiment of the testing system of the present invention.
The reference numbers illustrate:
the objects, features and advantages of the present invention will be further described with reference to the accompanying drawings.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.
It should be noted that all the directional indicators (such as upper, lower, left, right, front and rear … …) in the embodiment of the present invention are only used to explain the relative position relationship between the components, the motion situation, etc. in a specific posture (as shown in the drawings), and if the specific posture is changed, the directional indicator is changed accordingly.
In addition, the descriptions related to "first", "second", etc. in the present invention are for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicit ly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In addition, the technical solutions in the embodiments may be combined with each other, but it must be based on the realization of those skilled in the art, and when the technical solutions are contradictory or cannot be realized, the combination of the technical solutions should not be considered to exist, and is not within the protection scope of the present invention.
The utility model provides a test system.
In the embodiment of the present invention, referring to fig. 1 and 2, the test system is used for testing the voltage state of an electronic product, and the test system includes a test device 10, a master controller 20 and an interception device 30; the testing device 10 is connected with the main controller 20, and the main controller 20 is connected with the intercepting equipment 30;
the main controller 20 is configured to detect whether the electronic product moves to a test station, and send a test instruction to the test apparatus 10 if it is determined that the electronic product moves to the test station, where the test instruction is used to trigger the test apparatus 10 to operate, and the test instruction includes a product identifier of the electronic product;
the testing device 10 is configured to receive the testing instruction sent by the main controller 20, determine that the electronic product is an electronic product to be tested according to the product identifier, and test the electronic product; after the electronic product is tested, obtaining a test result corresponding to the electronic product, and sending the test result to the main controller 20, so that the main controller 20 judges whether to send an interception instruction to the interception device 30 according to the test result;
the intercepting equipment 30 is configured to receive the intercepting instruction sent by the testing apparatus 10, and intercept the electronic product according to the product identifier.
In this embodiment, when the electronic product is driven to the testing station 41 by the transmission device in the production line system, the testing device 10 immediately performs a voltage test on the electronic product, and sends a determination result after the test to the main controller 20; in order to facilitate the main controller 20 to control the detected electronic product to perform further actions, the main controller 20 obtains the product identifier of the electronic product to mark the test result of the electronic product, so as to avoid confusion of the test results of a plurality of electronic products. The main controller 20 then determines whether to control the intercepting device 30 to perform the intercepting action according to the determination result. Specifically, when the main controller 20 receives a determination result that the electronic product is in a bad state, the main controller 20 controls the intercepting equipment 30 to intercept the electronic product on the transmission device and transmit the electronic product to a repair station or a position to be repaired, so that the electronic product with a problem is repaired, and the electronic product which is unqualified is prevented from flowing into the market and affecting the sale of the brand product. When the judgment result received by the main controller 20 is in a qualified state, the main controller 20 does not perform other control, so that the electronic product in the qualified state is directly transferred to the packaging station along with the transmission device. In this embodiment, the connection between the intercepting equipment 30 and the main controller 20 is set as a main invention point, and thus, after the testing device 10 detects the electronic product in time, the main controller 20 can further control whether the intercepting equipment 30 is controlled according to the judgment result sent by the testing device 10, and the purpose that the electronic product in a bad state is automatically intercepted by the intercepting equipment 30 can be achieved, complete fool-proofing is achieved, and the electronic product in a bad state is prevented from flowing into the electronic product. The testing station is a position on the transmission member 40 corresponding to the testing device 10.
Preferably, the testing system further comprises a transmission piece 40, wherein a testing station 41 and an intercepting station 42 are arranged on the transmission piece 40, the testing station 41 is located at the middle position of the transmission piece 40, and the intercepting station 42 is located at the tail end position of the transmission piece 40; the testing device 10 is arranged on the testing station 41, and the intercepting equipment 30 is arranged on the intercepting station 42; the main controller 20 is configured to control the intercepting equipment 30 to intercept the electronic product when it is determined that the electronic product moves to the intercepting station and a determination result sent by the testing device 10 is in a bad state.
In this embodiment, when the electronic product moves to the intercepting station 42 and the determination result sent by the main controller 20 in the testing apparatus 10 is a bad state, the main controller 20 controls the intercepting device 30 to intercept the electronic product. The driving device is a driving member 40, and a testing station 41 is disposed at a front end position of a driving path of the intercepting station 42, so that the testing device 10 performs a voltage test on the electronic product first. The intercepting station 42 is the position of the transmission member 40 corresponding to the intercepting apparatus 30.
The technical scheme of the utility model is that the test device 10 is connected with the main controller 20, and the main controller 20 is connected with the interception equipment 30; after the electronic product moves to the test station 41, the main controller 20 sends a test instruction to the test device 10, and the test device 10 detects a voltage state of the electronic product and sends a judgment result to the main controller 20; the main controller 20 controls the intercepting equipment 30 to intercept the electronic product when the judgment result is in a bad state; so set up, the electronic product of bad state need not to rely on the artifical method of removing, just can repair the electronic product that has the problem once more, accomplishes to prevent staying mistake proofing completely, avoids appearing unqualified electronic product and flows into the risk in market.
Further, referring to fig. 1 and 2, the testing device 10 includes a high voltage tester 11 and a high voltage testing state collecting device 12 electrically connected to the high voltage tester 11, wherein the high voltage testing state collecting device 12 is electrically connected to the main controller 20; the high-voltage tester 11 is arranged on the testing station 41, and the high-voltage testing state acquisition device 12 and the high-voltage tester 11 are arranged at intervals; the main controller 20 is configured to send a test instruction to the high-voltage tester 11 after confirming that the electronic product moves to the test station; the high-voltage tester 11 is configured to detect a voltage state of the electronic product after receiving the test instruction, and send a test result to the high-voltage test state acquisition device 12; the high-voltage test state acquisition device 12 is configured to output a judgment result according to the test result sent by the high-voltage tester 11, and send the judgment result to the master controller 20.
In this embodiment, the testing device 10 is mainly used for testing the high-voltage state of the electronic product, the high-voltage tester 11 of the testing device 10 tests the high-voltage state of the electronic product located on the testing station 41, and after the high-voltage tester 11 completes the test, the test result of the high-voltage test is transmitted to the high-voltage test state acquisition device 12; the high voltage test state acquisition device 12 analyzes the test result into a judgment result, and sends the judgment result to the main controller 20, so that the main controller 20 controls the interception device 30 to intercept according to the judgment result.
Further, referring to fig. 1 and 2, the testing system further includes an in-position sensor 50 disposed on the testing station 41, wherein the in-position sensor 50 is electrically connected to the high-voltage testing state collecting device 12; the in-place sensor 50 is used for detecting whether the electronic product moves to a test station or not, and transmitting an in-place signal to the high-voltage test state acquisition device 12 if the electronic product is determined to move to the test station;
and the high-voltage test state acquisition device 12 is used for controlling the high-voltage tester 11 to detect the voltage state of the electronic product according to the in-place signal.
In the embodiment, when the electronic product is driven to the testing station 41 on the transmission member 40, the in-place sensor 50 senses the existence of the electronic product, and then transmits an in-place signal to the high-voltage testing state collecting device 12; and after the high-voltage test state acquisition device 12 detects the in-place signal, controlling the high-voltage tester 11 to detect the voltage state of the electronic product. Therefore, the automation of the test process of the test system can be directly improved, and the test efficiency of the test system is also improved.
Further, referring to fig. 1 and 2, an off-position station 43 is further disposed on the transmission member 40, and the off-position station 43 is located between the testing station 41 and the intercepting station 42; the test system further comprises an off-position sensor 60 arranged on the off-position station 43, and the off-position sensor 60 is electrically connected with the high-voltage test state acquisition device 12;
the off-position sensor 60 is configured to detect whether the electronic product moves to the off-position station, and transmit an off-position signal to the high-voltage test state acquisition device 12 if it is determined that the electronic product moves to the off-position station;
the high-voltage test state acquisition device 12 is configured to transmit a determination result to the main controller 20.
In this embodiment, the off-position station 43 is disposed between the testing station 41 and the intercepting station 42, and when the electronic product is tested in the high-voltage state and is transmitted to the off-position station 43, the off-position sensor 60 on the off-position station 43 senses the existence of the electronic product, and then the off-position sensor 60 sends an off-position signal to the high-voltage testing state acquisition device 12; after the high voltage test state acquisition device 12 detects the off-position signal, the high voltage test state acquisition device 12 sends a judgment result to the main controller 20 in time, and the main controller 20 determines whether to control the interception device 30 to intercept according to the judgment result. By such arrangement, the high voltage test state acquisition device 12 can send the judgment result to the main controller 20 in time, so as to improve the operation automation of the high voltage test state acquisition device 12. The off-position station 43 is any position between the position of the drive line body corresponding to the testing device 10 and the position of the drive line body corresponding to the intercepting equipment 30, and is mainly determined according to the actual running speed of the main controller 20 and the transmission speed of the drive line body 40.
Further, referring to fig. 1 and 2, the testing system further includes a prompting red light 70 and a prompting green light 80 disposed on the transmission member 40, and both the prompting red light 70 and the prompting green light 80 are connected to the high-voltage testing state collecting device 12; the high-voltage test state acquisition device 12 is used for controlling the prompting red light 70 to be on when the test result is determined to be in a bad state; and if the judgment result is in a normal state, controlling the prompting green lamp 80 to be on. In this embodiment, in order to conveniently remind the staff that there is the bad electronic product of high-voltage state to further let the staff keep track of to the electronic product on the transmission piece 40, further avoid the risk that bad electronic product flows into the market.
Further, referring to fig. 1 and 2, the testing system further includes a scanning gun 90 for scanning a product code of the electronic product, the scanning gun 90 is disposed on the transmission member 40, and the scanning gun 90 is electrically connected to the testing device 10; the scanning gun 90 is configured to scan a product code of the electronic product and transmit product code information to the high voltage test state acquisition device 12 before the electronic product moves to the test station 41. In this embodiment, the electronic product on the transmission member 40 is scanned by the scanning gun 90 and the product code corresponding to the electronic product is acquired, and then the product code of the electronic product is sent to the high voltage test state acquisition device 12, so that the high voltage test state acquisition device 12 can correspond to the product code of the electronic product, and the main controller 20 is convenient for storing and sorting the high voltage state and the product code data of the electronic product.
Further, referring to fig. 1 and 2, the test system further includes a network module 100, the test apparatus 10 is in signal connection with the network module 100, and the network module 100 is in signal connection with the master controller 20. In this embodiment, the network module 100 is used to connect the testing device 10 and the master controller 20, so that the testing device 10 can send the judgment result to the master controller 20 conveniently, and the testing speed of the testing system is further increased. Preferably, the network module is a WiFi module, a bluetooth module or a 4G module.
The utility model discloses still provide an electronic product production line system, this electronic product production line system includes test system, and this test system's concrete structure refers to above-mentioned embodiment, because this electronic product production line system has adopted the whole technical scheme of above-mentioned all embodiments, consequently has all beneficial effects that the technical scheme of above-mentioned embodiment brought at least, and the repeated description is no longer given here.
The above only is the preferred embodiment of the present invention, not limiting the scope of the present invention, all the equivalent structure changes made by the contents of the specification and the drawings under the inventive concept of the present invention, or the direct/indirect application in other related technical fields are included in the patent protection scope of the present invention.
Claims (10)
1. A test system is characterized by comprising a test device, a main controller and an interception device; the test device is connected with the main controller, and the main controller is connected with the intercepting equipment;
the main controller is used for detecting whether an electronic product moves to a test station or not, and if the electronic product is determined to move to the test station, sending a test instruction to the test device, wherein the test instruction is used for triggering the test device to work, and the test instruction comprises a product identifier of the electronic product;
the testing device is used for receiving the testing instruction sent by the main controller, determining the electronic product to be tested according to the product identification and testing the electronic product; after the electronic product is tested, obtaining a test result corresponding to the electronic product, and sending the test result to the main controller, so that the main controller judges whether to send an interception instruction to the interception equipment or not according to the test result;
the intercepting equipment is used for receiving the intercepting instruction sent by the testing device and intercepting the electronic product according to the product identification.
2. The test system of claim 1, further comprising a drive member having a test station and an intercept station, the test station being located at a middle position of the drive member and the intercept station being located at an end position of the drive member; the test device is arranged on the test station, and the interception equipment is arranged on the interception station;
and the main controller is used for controlling the intercepting equipment to intercept the electronic product after confirming that the electronic product moves to the intercepting station and judging that a judgment result sent by the testing device is in a bad state.
3. The test system of claim 2, wherein the test device comprises a high voltage tester and a high voltage test state acquisition device electrically connected to the high voltage tester, the high voltage test state acquisition device being electrically connected to the master; the high-voltage tester is arranged on the testing station, and the high-voltage testing state acquisition device and the high-voltage tester are arranged at intervals;
the main controller is used for sending a test instruction to the high-voltage tester after confirming that the electronic product moves to the test station;
the high-voltage tester is used for detecting the voltage state of the electronic product after receiving the test instruction and sending a test result to the high-voltage test state acquisition device;
and the high-voltage test state acquisition device is used for outputting a judgment result according to the test result sent by the high-voltage tester and sending the judgment result to the main controller.
4. The test system of claim 3, further comprising an in-place sensor disposed on the test station, the in-place sensor being electrically connected to the high voltage test condition acquisition device;
the in-place sensor is used for detecting whether the electronic product moves to a testing station or not, and transmitting an in-place signal to the high-voltage testing state acquisition device if the electronic product is determined to move to the testing station;
and the high-voltage test state acquisition device is used for controlling the high-voltage tester to detect the voltage state of the electronic product according to the in-place signal.
5. The test system according to claim 4, wherein the transmission member is further provided with an off-position station, and the off-position station is positioned between the test station and the intercepting station; the test system also comprises an off-position sensor arranged on the off-position station, and the off-position sensor is electrically connected with the high-voltage test state acquisition device;
the off-position sensor is used for detecting whether the electronic product moves to the off-position station or not, and transmitting an off-position signal to the high-voltage test state acquisition device if the electronic product is confirmed to move to the off-position station;
and the high-voltage test state acquisition device is used for transmitting a judgment result to the main controller.
6. The test system of claim 3, further comprising a red light and a green light disposed on the transmission member, wherein the red light and the green light are both connected to the high voltage test condition acquisition device;
the high-voltage test state acquisition device is used for controlling the prompting red light to be on when the test result is determined to be in a bad state; and if the judgment result is in a normal state, controlling the prompting green light to be on.
7. The test system of claim 6, further comprising a scan gun for scanning a product code of the electronic product, the scan gun being disposed on the transmission, the scan gun being electrically connected to the test device;
and the scanning gun is used for scanning the product code of the electronic product and transmitting the product code information to the high-voltage test state acquisition device before the electronic product moves to the test station.
8. The test system of claim 1, further comprising a network module, the test device in signal connection with the network module, the network module in signal connection with the master.
9. The test system of claim 8, wherein the network module is a WiFi module or a bluetooth module or a 4G module.
10. An electronic product production line system comprising the test system of any one of claims 1 to 9.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201920809717.9U CN210059046U (en) | 2019-05-30 | 2019-05-30 | Test system and electronic product production line system |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201920809717.9U CN210059046U (en) | 2019-05-30 | 2019-05-30 | Test system and electronic product production line system |
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| CN210059046U true CN210059046U (en) | 2020-02-14 |
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| CN201920809717.9U Active CN210059046U (en) | 2019-05-30 | 2019-05-30 | Test system and electronic product production line system |
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