CN209559991U - A kind of quartz oscillator test device - Google Patents
A kind of quartz oscillator test device Download PDFInfo
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- CN209559991U CN209559991U CN201822056778.0U CN201822056778U CN209559991U CN 209559991 U CN209559991 U CN 209559991U CN 201822056778 U CN201822056778 U CN 201822056778U CN 209559991 U CN209559991 U CN 209559991U
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- pulley
- shaft coupling
- quartz oscillator
- test
- test device
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Abstract
A kind of quartz oscillator test device characterized by comprising pedestal, test platform, support plate, shaft coupling plate, shaft coupling pulley, track pulley；On the pedestal, it is provided with placement platform, micrometer pulley is provided in the placement platform；On the test platform, it is provided with positioning seat, is provided with wafer slots on the positioning seat；In the support plate, it is provided with knob；On the track pulley, it is provided with test circuit board, probe base, limited screw, high-frequency line connecting interface.By using the probe base to match with quartz oscillator to be measured, with it is traditional it is direct probe is welded on test circuit board compared with, guarantee that position is more accurate, and save the time of aligned position.
Description
Technical field
The utility model relates to quartz oscillator testing field more particularly to a kind of quartz oscillator test dresses
It sets.
Background technique
Quartz oscillator is referred to as crystal oscillator.In the production process of quartz oscillator, for the electricity for guaranteeing finished product
Performance is qualified, needs to carry out quartz oscillator on-line testing, traditional test device is directly will test probe welding
It is tested after testing circuit board, the accuracy of probe location cannot be completely secured, also can spend the time on aligned position.
Utility model content
In view of this, the purpose of this utility model is to provide a kind of quartz oscillator test devices.
In order to achieve the above objectives, the solution of the utility model is:
A kind of quartz oscillator test device, comprising: pedestal, test platform, support plate, shaft coupling plate, shaft coupling pulley,
Track pulley；
On pedestal, it is provided with placement platform, micrometer pulley is provided in placement platform；
On test platform, it is provided with positioning seat, is provided with wafer slots on positioning seat；
In support plate, it is provided with knob；
On track pulley, it is provided with test circuit board, probe base, limited screw, high-frequency line connecting interface；
One end of knob is connected with shaft coupling pulley.
The top of shaft coupling pulley is provided with shaft coupling plate.
Shaft coupling plate is connected with track pulley.
In 250B test macro outside the access of high-frequency line connecting interface.
Detailed description of the invention
It, below will be to use required in embodiment in order to illustrate more clearly of the technical solution of the utility model embodiment
Attached drawing be briefly described, it should be understood that the following drawings illustrates only some embodiments of the utility model, therefore should not be by
Regard the restriction to range as, for those of ordinary skill in the art, without creative efforts, may be used also
To obtain other relevant attached drawings according to these attached drawings.
Fig. 1 is a kind of top view of quartz oscillator test device of the present invention
Fig. 2 is a kind of main view of quartz oscillator test device of the present invention
Fig. 3 is a kind of side view of quartz oscillator test device of the present invention
Fig. 4 is a kind of overall diagram of quartz oscillator test device of the present invention
Specific embodiment
A kind of quartz oscillator test device, comprising: pedestal, test platform, support plate, shaft coupling plate, shaft coupling pulley,
Track pulley；
On pedestal, it is provided with placement platform, micrometer pulley is provided in placement platform；
On test platform, it is provided with positioning seat, is provided with wafer slots on positioning seat；
In support plate, it is provided with knob；
On track pulley, it is provided with test circuit board, probe base, limited screw, high-frequency line connecting interface；
Pedestal, placement platform, test platform, support plate are alloy material；
It is more quasi- that micrometer can be such that probe aligns with pin；
The stroke that moves downward of limited screw has extreme lower position limitation, can be avoided stone caused by test probe excessively pushes
The damage of English crystal oscillator.
One end of knob is connected with shaft coupling pulley；
Shaft coupling pulley is eccentric sheave.
The top of shaft coupling pulley is provided with shaft coupling plate；
Knob drives shaft coupling pulley, shaft coupling pulley drive shaft coupling plate.
Shaft coupling plate is connected with track pulley；
Track pulley, also known as upper lower sheave；
There is connecting rod between shaft coupling plate and track pulley, track pulley is driven with this.
In 250B test macro outside the access of high-frequency line connecting interface；
250B test macro can measure the electrical properties such as RLD2, RR, FL, DLD2 and FDLD of quartz oscillator automatically.
The following will be combined with the drawings in the embodiments of the present invention, carries out the technical scheme in the embodiment of the utility model
Clearly and completely describe, it is clear that the described embodiments are only a part of the embodiments of the utility model, rather than whole
Embodiment.Based on the embodiments of the present invention, those of ordinary skill in the art are in the premise for not making creative work
Under every other embodiment obtained, fall within the protection scope of the utility model.
It should be noted that in the absence of conflict, the feature in the embodiments of the present invention and embodiment can
To be combined with each other.
The utility model is described in further detail in the following with reference to the drawings and specific embodiments, but not as the utility model
It limits.
Embodiment 1
As shown in Figs 1-4, micrometer pulley placement platform 7 is fixed on pedestal 1, in the upper of micrometer pulley placement platform 7
Side is provided with test platform 2；Pedestal 1, micrometer pulley placement platform 7 between test platform 2, are fixed by four positioning long columns；
It is fixed with positioning seat 8 on test platform 2, wafer slots 9 are provided on positioning seat 8；Support plate 3 is fixed on pedestal 1；Support plate
Knob 10 and track pulley 6 are installed on 3；One end of knob 10 is connected with shaft coupling pulley 4；The top of shaft coupling pulley 4 is provided with
Shaft coupling plate 5；Test circuit board 11, probe base 12, limited screw 13, high-frequency line connecting interface 14 are provided on track pulley 6；Connection
Axillare 5 and track pulley 6 are moved up and down by connecting rod.
The above is only the utility model preferred embodiments, are not intended to limit the embodiments of the present invention and protection
Range should can appreciate that all with the utility model specification and diagramatic content institute to those skilled in the art
The equivalent replacement made and obviously change obtained scheme, the protection scope of the utility model should all be included in
It is interior.
Claims (5)
1. a kind of quartz oscillator test device characterized by comprising pedestal, test platform, support plate, shaft coupling plate,
Shaft coupling pulley, track pulley；
On the pedestal, it is provided with placement platform, micrometer pulley is provided in the placement platform；
On the test platform, it is provided with positioning seat, is provided with wafer slots on the positioning seat；
In the support plate, it is provided with knob；
On the track pulley, it is provided with test circuit board, probe base, limited screw, high-frequency line connecting interface.
2. a kind of quartz oscillator test device as described in claim 1, which is characterized in that one end of the knob and institute
Shaft coupling pulley is stated to be connected.
3. a kind of quartz oscillator test device as described in claim 1, which is characterized in that the shaft coupling pulley it is upper
Side, is provided with the shaft coupling plate.
4. a kind of quartz oscillator test device as described in claim 1, which is characterized in that the shaft coupling plate and the rail
Road pulley is connected.
5. a kind of quartz oscillator test device as described in claim 1, which is characterized in that the high-frequency line connecting interface
In 250B test macro outside access.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822056778.0U CN209559991U (en) | 2018-12-07 | 2018-12-07 | A kind of quartz oscillator test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822056778.0U CN209559991U (en) | 2018-12-07 | 2018-12-07 | A kind of quartz oscillator test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209559991U true CN209559991U (en) | 2019-10-29 |
Family
ID=68301400
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201822056778.0U Active CN209559991U (en) | 2018-12-07 | 2018-12-07 | A kind of quartz oscillator test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN209559991U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109470964A (en) * | 2018-12-07 | 2019-03-15 | 杭州鸿星电子有限公司 | A kind of quartz oscillator test device |
-
2018
- 2018-12-07 CN CN201822056778.0U patent/CN209559991U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109470964A (en) * | 2018-12-07 | 2019-03-15 | 杭州鸿星电子有限公司 | A kind of quartz oscillator test device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP01 | Change in the name or title of a patent holder |
Address after: No. 2880, Moganshan Road, Liangzhu street, Yuhang District, Hangzhou, Zhejiang 310000 Patentee after: Hongxing Technology (Group) Co.,Ltd. Address before: No. 2880, Moganshan Road, Liangzhu street, Yuhang District, Hangzhou, Zhejiang 310000 Patentee before: HANGZHOU HOSONIC ELECTRONICS Co.,Ltd. |
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| CP01 | Change in the name or title of a patent holder |