CN209486246U - A kind of testing piece and test device for SMD power device - Google Patents
A kind of testing piece and test device for SMD power device Download PDFInfo
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- CN209486246U CN209486246U CN201920091647.8U CN201920091647U CN209486246U CN 209486246 U CN209486246 U CN 209486246U CN 201920091647 U CN201920091647 U CN 201920091647U CN 209486246 U CN209486246 U CN 209486246U
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- power device
- guided mode
- testing piece
- test
- smd power
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Abstract
The utility model discloses a kind of testing piece and test device for SMD power device, test device includes Test bench, positioning guided mode and two pairs of testing pieces；It positions guided mode to be arranged on Test bench by an elastomeric element, positioning has a groove on guided mode, for limiting the width direction of SMD power device；Two pairs of testing pieces are mounted on Test bench, and a pair of of testing piece is respectively set in the two sides of positioning guided mode, and the strip protrusion of each pair of measuring head is oppositely arranged, the hierarchic structure that the strip protrusion of each pair of measuring head has is close to positioning guided mode setting, when being put into power device in positioning guided mode groove and applying pressure to orientation guided mode to the direction close to Test bench, it is in close contact the pin of power device and the cascaded surface of the hierarchic structure of two pairs of testing pieces.Power device fixation can be improved the positioning accuracy of product by the device.Using ambroin, there is preferable moisture-proof function, the test of product can be made more accurate.
Description
Technical field
The utility model relates to test device fields, and in particular to a kind of testing piece and survey for SMD power device
Trial assembly is set.
Background technique
Existing Test bench and testing piece: Test bench is pcb board, and moisture protection is generally to the requirement of production environment humidity
Height, it is ineffective when testing high current product.Testing piece: 1, hardness height be easy to cause product pin to upwarp；2, there is no product
The limit function of length direction, positioning is bad, be easy to cause material casting；3, measuring head is small, and service life is low, increases use cost.
Utility model content
The purpose of the utility model is to overcome the above-mentioned deficiencies in the presence of the prior art, provide a kind of for patch type
The testing piece and test device of power device.
In order to realize above-mentioned purpose of utility model, the utility model provides following technical scheme:
A kind of testing piece for SMD power device, comprising: measuring head and testing piece ontology；The measuring head setting
In one end of the testing piece ontology, in the strip protrusion that the edge of the measuring head is formed；Wherein, the strip protrusion
End on length direction is formed with step structure, and the step surface of the step structure is for contacting SMD power device
Pin.
Preferably, at least one of joint-cutting is formed along the width direction of the strip protrusion, by the strip protrusion
It is divided at least two mutually independent parts.
Preferably, the material of the strip protrusion is tungsten-copper alloy.
Preferably, the strip protrusion is welded on one end of the testing piece ontology, and to the strip protrusion
It is handled by craft of gilding.
Preferably, more than one mounting hole is provided on the testing piece ontology.
Preferably, the material of the testing piece ontology is beallon.
A kind of test device for SMD power device, comprising: Test bench, positioning guided mode and two pairs of testing pieces；
Wherein, the positioning guided mode is arranged on the Test bench by an elastomeric element, moreover, having on the positioning guided mode
One groove, for limiting the width direction of the SMD power device；Two pairs of testing pieces are fixedly mounted on the test
On pedestal, and a pair of testing piece, and the strip of each pair of measuring head is respectively set in the two sides of the positioning guided mode
Protrusion is oppositely arranged, and the hierarchic structure that the strip protrusion of each pair of measuring head has is arranged close to the positioning guided mode, when
The SMD power device is put into and to the direction close to Test bench to the orientation guided mode in the positioning guided mode groove
Apply pressure, is in close contact the pin of SMD power device and the cascaded surface of the hierarchic structure of two pairs of testing pieces.
Preferably, the material selection insulating materials of the Test bench and the positioning guided mode.
Preferably, a groove is provided on the Test bench, the strip protrusion of each pair of measuring head is set to institute
The top of groove is stated, the elastomeric element is set on the bottom surface of the groove.
Compared with prior art, the utility model has the beneficial effects that
1. testing piece uses joint-cutting technique, in the detection process, the indentation of SMD power device is used for patch type by equipment
After the test device of power device, the joint-cutting technique of testing piece can be improved the elasticity of testing piece, reduce the damage to testing piece.
2. the width for fixing SMD power device in the test device of SMD power device by positioning guided mode,
It is appeared on the stage the pin of the step face contact SMD power device of stage structure, is equivalent to patch by the strip protrusion of measuring head
The length direction of formula power device is limited, and SMD power device fixation can be improved the positioning accurate of product
Degree.
3. on the one hand the structure of strip protrusion top bar form is carried out for the length direction to SMD power device
Limit, in addition also can be reduced the damage to SMD power device, prevents the pin of SMD power device in the detection process
It is upwarped because detector is really up to the mark.
4. the structure of the stepped form being in contact with SMD power device pin in test both sides of head setting, is being tested
There is the stress for the pin that can reduce SMD power device in the process, to keep the test of product more accurate, yields is higher.
And after the damage of the step surface of a step structure, by exchange and can reuse the position of two testing pieces,
Save the cost.
5. the material of Test bench and positioning guided mode is all made of ambroin, there is preferable moisture-proof function, can make to produce
The test of product is more accurate.
Detailed description of the invention
Fig. 1 is a kind of structural schematic diagram of testing piece for SMD power device.
Fig. 2 is a kind of structural schematic diagram of test device for SMD power device.
Wherein, 1- testing piece ontology, 2- measuring head, the step surface of 3- step structure, 4- joint-cutting, 5- strip protrusion, 6-
Mounting hole, 7- Test bench, the groove of 8- Test bench, 9- positioning guided mode, the 10- positioning fixing groove of guided mode, 11- testing piece,
12- conductor wire.
Specific embodiment
The utility model is described in further detail below with reference to test example and specific embodiment.But it should not be by this
The range for being interpreted as the above-mentioned theme of the utility model is only limitted to embodiment below, all to be realized based on the content of the present invention
Technology belongs to the scope of the utility model.
Embodiment 1
The utility model, for the testing piece and test device of SMD power device, as shown in Figure 1, being used for patch type
The testing piece of power device, comprising: measuring head 2 and testing piece ontology 1；One end of testing piece ontology 1 is arranged in measuring head 2,
The strip protrusion 5 that the edge of measuring head 2 is formed；Wherein, the end on raised 5 length directions of strip is formed with Step-edge Junction
Structure, and the step surface 3 of step structure is used to contact the pin of SMD power device.It is equivalent to the length direction to product to be measured
It is limited, product fixation to be measured can be improved the positioning accuracy of product.
In specific implementation process, it is provided with step structure in the two sides of strip protrusion 5, measuring head uses step structure
Structure in addition also can be reduced to SMD power on the one hand for being limited to the length direction of SMD power device
The damage of device prevents the pin of SMD power device from upwarping in the detection process because detector is really up to the mark.
In the structure for the stepped form of test both sides of head setting being in contact with SMD power device pin, testing
Cheng Zhongyou can reduce the stress of the pin of SMD power device, to keep the test of product more accurate, yields is higher.And
And after the damage of the step surface of a step structure, by exchange and can reuse the position of two testing pieces, save
About cost.
In this testing piece, the width direction along strip protrusion forms at least one of joint-cutting 4, by 5 points of strip protrusion
At least two mutually independent parts are segmented into, the direction of the joint-cutting 4 of formation is consistent with the length direction of testing piece ontology 1.In this reality
In novel, the length of joint-cutting 4 is 9mm, width 0.3mm, and strip protrusion 5 is cut into three parts, and testing piece uses
Joint-cutting technique, in the detection process, after the indentation of SMD power device is used for the test device of SMD power device by equipment,
The joint-cutting technique of testing piece can be improved the elasticity of testing piece, reduce the damage to testing piece.
There are four mounting holes 6 for setting on testing piece ontology 1, for being installed in Test bench.
The material of testing piece is beallon, and the material of strip protrusion is tungsten-copper alloy, and strip protrusion is welded on survey
One end of test piece ontology, and pass through the processing of craft of gilding to strip protrusion.
As shown in Fig. 2, being used for the test device of SMD power device, comprising: Test bench 7, positioning guided mode 9 and two pairs
Testing piece 11；Guided mode 9 is positioned by an elastomeric element, is arranged on Test bench 7, moreover, there is a groove on positioning guided mode
8, for limiting the width direction of SMD power device；Two pairs of testing pieces 11 are fixedly mounted on Test bench 7, and are being positioned
A pair of of testing piece 11 is respectively set in the two sides of guided mode 9, and the strip protrusion 5 of each pair of measuring head is oppositely arranged, each pair of measuring head
The hierarchic structure that has of strip protrusion 5 be arranged close to positioning guided mode 9, when being put into SMD power in positioning guided mode groove 8
Device, and to close to Test bench 7 direction to orientation guided mode 9 apply pressure, make SMD power device pin and two pairs
The cascaded surface of the hierarchic structure of testing piece 11 is in close contact.
And it is connected with conductor wire 12 in each testing piece 11, after power supply is connected, provides electric energy for testing piece, works as positioning
It is put into SMD power device in guided mode groove 8, and pressure is applied to orientation guided mode 9 close to the direction of Test bench 7, makes patch
The cascaded surface of the hierarchic structure of the pin of formula power device and two pairs of testing pieces 11 is in close contact, the hierarchic structure of testing piece 11
Cascaded surface electrification, detects the pin of SMD power device.
In the test device for SMD power device, pass through the width of the fixed SMD power device of positioning guided mode
Degree is appeared on the stage the pin of the step face contact SMD power device of stage structure by the strip protrusion of measuring head, is equivalent to pair
The length direction of SMD power device is limited, and SMD power device fixation can be improved determining for product
Position precision.
The material selection insulating materials of Test bench and positioning guided mode, such as engineering plastics, with preferable moisture-proof function,
The test of product can be made more accurate.
A groove 8 is provided on Test bench, the strip protrusion of each pair of measuring head is set to the top of groove, elastic portion
Part is set on the bottom surface of groove.So that testing piece has certain rebound space.
In specific implementation process, every built-in testing piece is located by connecting by the positioning pin of two Ф 2 with Test bench, then by two
The screw of M2.5 is fixed.
Claims (9)
1. a kind of testing piece for SMD power device characterized by comprising measuring head and testing piece ontology；It is described
One end of the testing piece ontology is arranged in measuring head, in the strip protrusion that the edge of the measuring head is formed；Wherein, described
End on strip projection length direction is formed with step structure, and the step surface of the step structure is for contacting patch type
The pin of power device.
2. a kind of testing piece for SMD power device according to claim 1, which is characterized in that along the strip
The width direction of shape protrusion forms at least one of joint-cutting, and the strip protrusion is divided at least two mutually independent portions
Point.
3. a kind of testing piece for SMD power device according to claim 1 or 2, which is characterized in that the length
The material of strip bulge is tungsten-copper alloy.
4. a kind of testing piece for SMD power device according to claim 3, which is characterized in that the strip
Protrusion is welded on one end of the testing piece ontology, and is handled by craft of gilding the strip protrusion.
5. a kind of testing piece for SMD power device according to claim 1, which is characterized in that the testing piece
More than one mounting hole is provided on ontology.
6. a kind of testing piece for SMD power device according to claim 1 or 5, which is characterized in that the survey
The material of test piece ontology is beallon.
7. a kind of test device for SMD power device characterized by comprising Test bench, positioning guided mode and two
To testing piece as claimed in any one of claims 1 to 6；Wherein, the positioning guided mode is arranged in described by an elastomeric element
On Test bench, moreover, there is a groove, for limiting the width side of the SMD power device on the positioning guided mode
To；Two pairs of testing pieces are fixedly mounted on the Test bench, and a pair is respectively set in the two sides of the positioning guided mode
The testing piece, and the strip protrusion of each pair of measuring head is oppositely arranged, the strip protrusion tool of each pair of measuring head
Some hierarchic structure is arranged close to the positioning guided mode, when be put into the positioning guided mode groove SMD power device and
To close to Test bench direction to the orientation guided mode application pressure, make SMD power device pin and two pairs of surveys
The cascaded surface of the hierarchic structure of test piece is in close contact.
8. a kind of test device for SMD power device according to claim 7, which is characterized in that the test
The material selection insulating materials of pedestal and the positioning guided mode.
9. a kind of test device for SMD power device according to claim 7 or 8, which is characterized in that described
A groove is provided on Test bench, the strip protrusion of each pair of measuring head is set to the top of the groove, the bullet
Property component is set on the bottom surface of the groove.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920091647.8U CN209486246U (en) | 2019-01-18 | 2019-01-18 | A kind of testing piece and test device for SMD power device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920091647.8U CN209486246U (en) | 2019-01-18 | 2019-01-18 | A kind of testing piece and test device for SMD power device |
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| Publication Number | Publication Date |
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| CN209486246U true CN209486246U (en) | 2019-10-11 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117434412A (en) * | 2023-09-28 | 2024-01-23 | 海信家电集团股份有限公司 | Testing device for power device |
-
2019
- 2019-01-18 CN CN201920091647.8U patent/CN209486246U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117434412A (en) * | 2023-09-28 | 2024-01-23 | 海信家电集团股份有限公司 | Testing device for power device |
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