CN209486244U - A kind of high-reliability automatic chip test machine - Google Patents
A kind of high-reliability automatic chip test machine Download PDFInfo
- Publication number
- CN209486244U CN209486244U CN201822048405.9U CN201822048405U CN209486244U CN 209486244 U CN209486244 U CN 209486244U CN 201822048405 U CN201822048405 U CN 201822048405U CN 209486244 U CN209486244 U CN 209486244U
- Authority
- CN
- China
- Prior art keywords
- chip
- mainframe
- component
- protective cover
- test machine
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 44
- 230000001681 protective effect Effects 0.000 claims abstract description 33
- 239000000428 dust Substances 0.000 claims abstract description 10
- 238000000034 method Methods 0.000 claims abstract description 8
- 238000001514 detection method Methods 0.000 claims description 7
- 230000000694 effects Effects 0.000 claims description 5
- 230000003319 supportive effect Effects 0.000 claims description 3
- 230000017525 heat dissipation Effects 0.000 claims description 2
- 238000013461 design Methods 0.000 description 3
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 235000013399 edible fruits Nutrition 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model provides a kind of high-reliability automatic chip test machine, including mainframe and is set to mainframe top for carrying chip rack, chip testing frame, vertical guide component, cross slide way component and the suction nozzle head assembly that can be moved in parallel on cross slide way component of chip to be tested；There is master control system component in mainframe installed inside, and the mainframe external front face is provided with signal display and several control buttons, mainframe side position is provided with the external interface connecting plate for connecting external function device；It further include being set to the mainframe top, the protective cover for being protected to test process; the protective cover front is connected with can be relative to the transparent dust cover that protective cover is pivoted; in actual application; suction nozzle head assembly can reach any position on working face by vertical guide component, cross slide way component; high degree of automation; and protective cover can effectively improve equipment operational safety degree, service performance is excellent.
Description
[technical field]
The utility model relates to chip testing machine equipment technical field, more particularly to it is a kind of reasonable in design, use effect
Fruit high-reliability automatic chip test machine outstanding.
[background technique]
Chip testing machine equipment is the more universal test equipment of chip production industry, and current general chip testing machine is all
It needing manually specifically to be placed and detected, intelligence, the degree of automation are not high enough, and production detection efficiency is relatively low, with
The continuous development and progress of science and technology, requirement of all trades and professions to production efficiency be also gradually increased, in order to better improve chip
The various aspects of performance of test machine, those skilled in the art have carried out a large amount of research and development and experiment, from the specific configuration portion of test machine
It is divided into hand to improve and improve, and achieves preferable achievement.
[utility model content]
To overcome the problems of prior art, the utility model provides a kind of reasonable in design, and using effect is prominent
High-reliability automatic chip test machine out.
The scheme that the utility model solves technical problem is to provide a kind of high-reliability automatic chip test machine, including host
Frame and be set to the mainframe top for carry chip to be tested chip rack, for detection chip chip survey
Try frame, vertical guide component, the cross slide way component being set on the vertical guide component and can be in cross slide way component
On the suction nozzle head assembly that moves in parallel；There is master control system component in the mainframe installed inside, and outside the mainframe
Front is provided with signal display and several control buttons, is provided at mainframe side position for connecting external function
The external interface connecting plate of equipment；It further include being set to the mainframe top, the protection for being protected to test process
Cover, which is connected with can be relative to the transparent dust cover that protective cover is pivoted；The signal display, control are pressed
Button, external interface connecting plate and master control system component are electrically connected；It is provided in cross slide way component one end for driving this
The first driving motor that cross slide way component moves on vertical guide component；Nozzle head component internal is provided with for driving this
The second driving motor that suction nozzle head assembly moves on cross slide way component；Suction nozzle head assembly lower part is connected with for drawing
It is placed at least two suction nozzles of the chip to be tested on chip rack；First driving motor, the second driving motor with
Master control system component is electrically connected.
Preferably, multiple chip testing units for being tested chip are installed on the chip testing frame；It should
Chip testing unit and master control system component are electrically connected.
Preferably, the diagonal position in the mainframe lower part four is separately provided for playing a supportive role and height is adjustable
Whole support rod；Non-slip mat is connected in each support rod bottom.
Preferably, be additionally provided with inside the mainframe for real-time sensor device internal temperature temperature sensor and
For improving the radiator fan of equipment internal heat dissipating performance；The mainframe side position is also provided with thermal vias, radiator fan
It is arranged close to thermal vias.
Preferably, it is offered on the chip rack multiple for placing the chip placing groove of chip to be tested.
Preferably, the protective cover front has been additionally provided with the grating assembly of certain safeguard protection effect；The grating assembly
It is electrically connected with master control system component.
Preferably, the nozzle head component internal is provided with the driving cylinder for driving each suction nozzle to move up and down.
Preferably, the protective cover is connect with mainframe top working face clamp-close type；And inside the protective cover also
It is provided with the third driving motor for driving dust cover to rotate around protective cover.
Compared with prior art, a kind of high-reliability automatic chip test machine of the utility model passes through while mainframe is arranged
11 and 11 top of mainframe is set to for the chip rack 2, the core for detection chip that carry chip to be tested
Built-in testing frame 118, vertical guide component 115, the cross slide way component 116 being set on the vertical guide component 115 and
The suction nozzle head assembly 117 that can be moved in parallel on cross slide way component 116, in 11 installed inside master control system group of mainframe
Part, in 11 external front face setting signal display screen 112 of mainframe and several control buttons 113, in 11 side portion of mainframe
External interface connecting plate 114 for connecting external function device be arranged in position, in conjunction with being set to 11 top of mainframe, be used for survey
The protective cover 12 that examination process is protected, and can be pivoted relative to protective cover 12 in the connection of 12 front of protective cover transparent anti-
Dust hood 121, in actual application, suction nozzle head assembly 117 can pass through vertical guide component 115, cross slide way component 116 reaches
Any position on working face, high degree of automation, and protective cover 12 can effectively improve equipment operational safety degree, use
Function admirable.
[Detailed description of the invention]
Fig. 1 and Fig. 2 is a kind of stereoscopic-state structural schematic diagram of high-reliability automatic chip test machine of the utility model.
[specific embodiment]
To make the purpose of this utility model, technical solution and advantage are more clearly understood, with reference to the accompanying drawings and embodiments,
The present invention will be further described in detail.It should be appreciated that specific embodiment described herein is used only for explaining this
Utility model is not used to limit this utility model.
Please refer to Fig. 1 and Fig. 2, a kind of high-reliability automatic chip test machine 1 of the utility model include mainframe 11 and
It is set to chip rack 2 of 11 top of mainframe for carrying chip to be tested, the chip testing for detection chip
Frame 118, vertical guide component 115, the cross slide way component 116 being set on the vertical guide component 115 and can be in cross
The suction nozzle head assembly 117 moved in parallel on guide rail assembly 116；There is master control system group in 11 installed inside of mainframe
Part, and 11 external front face of mainframe is provided with signal display 112 and several control buttons 113, in mainframe 11
Side position is provided with the external interface connecting plate 114 for connecting external function device；It further include being set to the mainframe
11 tops, the protective cover 12 for being protected to test process, which is connected with can be relative to protective cover 12
The transparent dust cover 121 being pivoted；The signal display 112, control button 113, external interface connecting plate 114 and master control
System component processed is electrically connected；It is provided in 116 one end of cross slide way component for driving the cross slide way component 116 vertical
The first driving motor moved on guide assembly 115；Suction nozzle head assembly 117 is internally provided with for driving the suction nozzle head assembly
117 the second driving motors moved on cross slide way component 116；117 lower part of suction nozzle head assembly is connected with for drawing
It is placed at least two suction nozzles 1171 of the chip to be tested on chip rack 2；First driving motor, the second driving electricity
Machine and master control system component are electrically connected.
The application passes through while mainframe 11 is arranged and is set to 11 top of mainframe for carrying core to be tested
The chip rack 2 of piece, vertical guide component 115, is set to and described vertically leads the chip testing frame 118 for detection chip
Cross slide way component 116 on rail assembly 115 and the suction nozzle head assembly 117 that can be moved in parallel on cross slide way component 116,
In 11 installed inside master control system component of mainframe, in 11 external front face setting signal display screen 112 of mainframe and several
The external interface connecting plate 114 for connecting external function device is arranged at 11 side position of mainframe in a control button 113,
In conjunction be set to 11 top of mainframe, the protective cover 12 for being protected to test process, and 12 front of protective cover connect
Can be relative to the transparent dust cover 121 that protective cover 12 is pivoted, in actual application, suction nozzle head assembly 117 can be by perpendicular
Guide rail assembly 115, cross slide way component 116 reach any position on working face, high degree of automation, and protective cover 12
Equipment operational safety degree can be effectively improved, service performance is excellent.
Preferably, multiple chip testing units for being tested chip are installed on the chip testing frame 118；
The chip testing unit and master control system component are electrically connected.
Preferably, the diagonal position in 11 lower part of mainframe four is separately provided for playing a supportive role and height can
The support rod 111 of adjustment；Non-slip mat is connected in each 111 bottom of support rod.Reasonable in design, reliability is high.
Preferably, be additionally provided with inside the mainframe 11 temperature sensor for real-time sensor device internal temperature with
And the radiator fan for improving equipment internal heat dissipating performance；The 11 side position of mainframe is also provided with thermal vias, heat dissipation
Fan is arranged close to thermal vias.
Preferably, it is offered on the chip rack 2 multiple for placing the chip placing groove of chip to be tested.
Preferably, 12 front of protective cover has been additionally provided with the grating assembly of certain safeguard protection effect；The grating group
Part and master control system component are electrically connected.
Preferably, the suction nozzle head assembly 117 is internally provided with the driving gas for driving each suction nozzle 1171 to move up and down
Cylinder.
Preferably, the protective cover 12 is connect with 11 top working face clamp-close type of mainframe；And in the protective cover 12
Inside is additionally provided with the third driving motor for driving dust cover 121 to rotate around protective cover 12.
Compared with prior art, a kind of high-reliability automatic chip test machine 1 of the utility model passes through while host is arranged
Frame 11 and 11 top of mainframe is set to for carrying the chip rack 2 of chip to be tested, for detection chip
Chip testing frame 118, vertical guide component 115, the cross slide way component 116 that is set on the vertical guide component 115 with
And the suction nozzle head assembly 117 that can be moved in parallel on cross slide way component 116, in 11 installed inside master control system group of mainframe
Part, in 11 external front face setting signal display screen 112 of mainframe and several control buttons 113, in 11 side portion of mainframe
External interface connecting plate 114 for connecting external function device be arranged in position, in conjunction with being set to 11 top of mainframe, be used for survey
The protective cover 12 that examination process is protected, and can be pivoted relative to protective cover 12 in the connection of 12 front of protective cover transparent anti-
Dust hood 121, in actual application, suction nozzle head assembly 117 can pass through vertical guide component 115, cross slide way component 116 reaches
Any position on working face, high degree of automation, and protective cover 12 can effectively improve equipment operational safety degree, use
Function admirable.
Above-described the utility model embodiment, does not constitute the restriction to scope of protection of the utility model.It is any
Modifications, equivalent substitutions and improvements made within spirit of the present utility model and principle etc., should be included in the utility model
Claims within.
Claims (8)
1. a kind of high-reliability automatic chip test machine, it is characterised in that: including mainframe and be set on the mainframe
Portion be used for carry chip to be tested chip rack, for detection chip chip testing frame, vertical guide component, be set to
Cross slide way component on the vertical guide component and the suction nozzle head assembly that can be moved in parallel on cross slide way component；?
The mainframe installed inside has master control system component, and if the mainframe external front face be provided with signal display and
Dry control button, is provided with the external interface connecting plate for connecting external function device at mainframe side position；Also wrap
It includes and is set to the mainframe top, the protective cover for being protected to test process, which is connected with can phase
The transparent dust cover being pivoted for protective cover；The signal display, control button, external interface connecting plate and main control
System component is electrically connected；It is provided in cross slide way component one end for driving the cross slide way component in vertical guide component
First driving motor of upper movement；Nozzle head component internal is provided with for driving the suction nozzle head assembly in cross slide way component
The second mobile driving motor；Suction nozzle head assembly lower part be connected with for draw be placed in it is to be tested on chip rack
At least two suction nozzles of chip；First driving motor, the second driving motor and master control system component are electrically connected.
2. a kind of high-reliability automatic chip test machine as described in claim 1, it is characterised in that: on the chip testing frame
It is installed on multiple chip testing units for being tested chip；The chip testing unit and master control system component are electrical
Connection.
3. a kind of high-reliability automatic chip test machine as described in claim 1, it is characterised in that: the mainframe lower part four
A diagonal position is separately provided for playing a supportive role and the support rod of height-adjustable；It is connected in each support rod bottom
Non-slip mat.
4. a kind of high-reliability automatic chip test machine as described in any one of claims 1 to 3 claim, feature
It is: is additionally provided with inside the mainframe for the temperature sensor of real-time sensor device internal temperature and is set for improving
The radiator fan of standby internal heat dissipating performance；The mainframe side position is also provided with thermal vias, and radiator fan is logical close to heat dissipation
Hole setting.
5. a kind of high-reliability automatic chip test machine as described in claim 1, it is characterised in that: on the chip rack
It offers multiple for placing the chip placing groove of chip to be tested.
6. a kind of high-reliability automatic chip test machine as described in claim 1, it is characterised in that: the protective cover front is also
It has been provided with the grating assembly of certain safeguard protection effect；The grating assembly and master control system component are electrically connected.
7. a kind of high-reliability automatic chip test machine as described in claim 1, it is characterised in that: in the suction nozzle head assembly
Portion is provided with the driving cylinder for driving each suction nozzle to move up and down.
8. a kind of high-reliability automatic chip test machine as described in claim 1, it is characterised in that: the protective cover and host
The connection of frame top working face clamp-close type；And it is additionally provided with inside the protective cover for driving dust cover to rotate around protective cover
Third driving motor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822048405.9U CN209486244U (en) | 2018-12-07 | 2018-12-07 | A kind of high-reliability automatic chip test machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822048405.9U CN209486244U (en) | 2018-12-07 | 2018-12-07 | A kind of high-reliability automatic chip test machine |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209486244U true CN209486244U (en) | 2019-10-11 |
Family
ID=68117801
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201822048405.9U Expired - Fee Related CN209486244U (en) | 2018-12-07 | 2018-12-07 | A kind of high-reliability automatic chip test machine |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN209486244U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112607396A (en) * | 2020-12-25 | 2021-04-06 | 深圳市智晟威自动化科技有限公司 | Screening buffer memory machine |
-
2018
- 2018-12-07 CN CN201822048405.9U patent/CN209486244U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112607396A (en) * | 2020-12-25 | 2021-04-06 | 深圳市智晟威自动化科技有限公司 | Screening buffer memory machine |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN209486244U (en) | A kind of high-reliability automatic chip test machine | |
| CN203929412U (en) | A kind of class mechanical property comprehensive test machine | |
| CN204974511U (en) | Pencil finished product testing equipment | |
| CN208240362U (en) | Telescopic equipment protection cover | |
| CN208026655U (en) | A kind of verifying attachment of refrigerator shelf glass | |
| CN208350264U (en) | A kind of automobile center console key press detection device | |
| CN207501882U (en) | A kind of object dimensional data acquisition device based on image | |
| CN205899488U (en) | Efficient computer radiator | |
| CN210516235U (en) | Operation and maintenance testing device for virtualization software storage hard disk | |
| CN204065219U (en) | Disk-shaped cell checkout equipment | |
| CN209707258U (en) | A kind of smart terminal product screen anti-pressure ability detection device | |
| CN209247912U (en) | A kind of auto parts and components Electromagnetic Compatibility test device | |
| CN109613701A (en) | A kind of VR equipment and its front cover device | |
| CN211293002U (en) | Wire rod detection device | |
| CN203344597U (en) | Dustproof device of density board carving machine | |
| CN218066462U (en) | Protective housing for deep displacement monitor | |
| CN220622584U (en) | 45-degree inclined hole type multilayer circuit board | |
| CN212807402U (en) | Shallow geothermal data acquisition device | |
| CN219478286U (en) | Data storage device for on-line monitoring | |
| CN210221142U (en) | Data processing device for function tester | |
| CN211928105U (en) | Boundary scanning test fixture for server mainboard | |
| CN217112224U (en) | High-voltage GIS gas monitoring device | |
| CN204128963U (en) | A kind of glossiness measuring equipment | |
| CN213780869U (en) | Automatic plug module of CPU | |
| CN205656208U (en) | Battery module tests rack |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20191011 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |