CN209014034U - A kind of sensor aging carrier - Google Patents

Abstract

A kind of sensor aging carrier, carrier ontology including insulation, multiple test troughs arranged side by side are provided on the carrier body upper surface, test-strips outstanding are provided on the carrier ontology front side surface, the test-strips include the conductive test item and Insulation test item of consecutive intervals setting, the test slot tail offers the intercommunicating pore of connection conductive test item, is provided with connection conductive test item in the intercommunicating pore and tests the conducting wire of slot tail；When sensor is put into test trough, one end of the connecting terminal connecting wire of sensor.After external test equipment connection conductive test item, setting test parameter, which can be realized, carries out burn-in test to sensor.Sensor aging carrier can adapt to the assembly line test of degradation, and burn-in test efficiency and the degree of automation can be improved.

Description

A kind of sensor aging carrier

Technical field

The utility model relates to sensor processing and manufacturing technology, specially a kind of sensor aging carrier.

Background technique

Sensor is the device for detection device performance parameter, is had a wide range of applications in modern industry field.Sensing Device generally comprises the processing of circuit board PCB patch, the welding of remaining element of PCB, the initial assembling of current sensor, tune in production process The process flows such as examination, encapsulating, test, degradation, appearance shaping.

Degradation is important test technology in detection sensor production process, guarantees subsequent conditioning circuit plate and other rubber sections The necessary test of the quality of part.But existing burn-in test carrier can not adapt to efficient assembly line test, influence test effect Rate.

Based on this, the utility model devises specially a kind of sensor aging carrier, to solve the above problems.

Utility model content

The purpose of this utility model is to provide a kind of sensor aging carriers, to solve to mention in above-mentioned background technique Burn-in test carrier out can not adapt to efficient assembly line test, influence the problem of testing efficiency.

To achieve the above object, the utility model provides the following technical solutions: a kind of sensor aging carrier, including The carrier ontology of insulation, is provided with multiple test troughs arranged side by side on the carrier body upper surface, before the carrier ontology Test-strips outstanding are provided on side surface, the test-strips include the conductive test item and Insulation test of consecutive intervals setting Item, the test slot tail offer the intercommunicating pore of connection conductive test item, are provided with connection conductive test in the intercommunicating pore The conducting wire of item and test slot tail；When sensor is put into test trough, one end of the connecting terminal connecting wire of sensor.

Further, the test trough is arc groove or square groove.

Further, the intercommunicating pore includes being connected with each other the first intercommunicating pore and the second intercommunicating pore penetrated through, and described first Intercommunicating pore connection test slot tail, second intercommunicating pore are connected to conductive test item.

Further, it is smoothly connected between first intercommunicating pore and the second intercommunicating pore.

Further, the angle between first intercommunicating pore and the second intercommunicating pore is 90-150 degree.

Further, the angle between first intercommunicating pore and the second intercommunicating pore is 120-140 degree.

Further, it is provided with elastic clamping block in the test trough, is used for clamping sensor.

Further, the test trough is correspondingly arranged with conductive test item, before the conductive test item is located at test trough Immediately below side.

Compared with prior art, the utility model has the beneficial effects that a kind of sensor aging carrier, including insulation Carrier ontology, multiple test troughs arranged side by side, table on front side of the carrier ontology are provided on the carrier body upper surface Test-strips outstanding are provided on face, the test-strips include the conductive test item and Insulation test item of consecutive intervals setting, institute The intercommunicating pore that test slot tail offers connection conductive test item is stated, is provided with connection conductive test item and survey in the intercommunicating pore The conducting wire of experimental tank tail portion；When sensor is put into test trough, one end of the connecting terminal connecting wire of sensor.External test equipment After connecting conductive test item, setting test parameter, which can be realized, carries out burn-in test to sensor.So that carrier ontology and connection It can be relatively moved between brush in external test equipment, such brush can be spaced connection conductive test item, realize corresponding survey The test of sensor in experimental tank.The assembly line that sensor aging carrier in the technical program can adapt to degradation is surveyed Examination, can be improved burn-in test efficiency and the degree of automation.

Detailed description of the invention

In order to illustrate more clearly of the technical solution of the utility model embodiment, make required for being described below to embodiment Attached drawing is briefly described, it should be apparent that, the drawings in the following description are merely some embodiments of the present invention, For those of ordinary skill in the art, without creative efforts, it can also be obtained according to these attached drawings Other attached drawings.

Fig. 1 is the schematic front view of sensor aging carrier in the utility model embodiment；

Fig. 2 is the schematic cross-sectional view in the direction A-A in Fig. 1；

Fig. 3 is the schematic top plan view of sensor aging carrier in the utility model embodiment；

Fig. 4 is the schematic cross-sectional view in the direction B-B in Fig. 3.

In attached drawing, parts list represented by the reference numerals are as follows:

Carrier ontology 100, test trough 110, Insulation test item 120, conductive test item 130, the first intercommunicating pore 140, second Intercommunicating pore 150.

Specific embodiment

The following will be combined with the drawings in the embodiments of the present invention, carries out the technical scheme in the embodiment of the utility model Clearly and completely describe, it is clear that the described embodiments are only a part of the embodiments of the utility model, rather than whole Embodiment.Based on the embodiments of the present invention, those of ordinary skill in the art are without creative efforts All other embodiment obtained, fall within the protection scope of the utility model.

Fig. 1-4 is please referred to, the utility model provides a kind of technical solution: a kind of sensor aging carrier, including it is exhausted The carrier ontology 100 of edge is provided with multiple test troughs 110 arranged side by side, the carrier on 100 upper surface of carrier ontology Test-strips outstanding are provided on 100 front side surface of ontology, the test-strips include the conductive test item 130 of consecutive intervals setting With Insulation test item 120,110 tail portion of test trough offers the intercommunicating pore of connection conductive test item 130, in the intercommunicating pore It is provided with the conducting wire of connection conductive test item 130 and 110 tail portion of test trough；When sensor is put into test trough 110, sensor is connect One end of line terminals connecting wire.After external test equipment (not shown) connection conductive test item 130, test parameter is set It can be realized and burn-in test is carried out to sensor.So that the brush on carrier ontology 100 and the external test equipment of connection is (in figure not Show) between can relatively move, such brush can be spaced connection conductive test item 130, realize and senses in corresponding test trough 110 The test of device.Sensor aging carrier in the technical program can adapt to the assembly line test of degradation, Ke Yiti High burn-in test efficiency and the degree of automation.

It should be noted that the nouns of locality such as " upper surface ", " front side surface " are the descriptions carried out with reference to Fig. 1, cannot function as Restriction to the utility model.

Further, the test trough 110 is arc groove or square groove.

Further, the intercommunicating pore includes the first intercommunicating pore 140 and the second intercommunicating pore 150 for being connected with each other perforation, institute The first intercommunicating pore 140 connection 110 tail portion of test trough is stated, second intercommunicating pore 150 is connected to conductive test item 130.

Further, the first intercommunicating pore 140 and the second intercommunicating pore 150, first intercommunicating pore are passed through in order to facilitate conducting wire 140 and second are smoothly connected between intercommunicating pore 150, and conducting wire is avoided to be stuck in the connection of the first intercommunicating pore 140 and the second intercommunicating pore 150 Place.

Further, the angle between first intercommunicating pore 140 and the second intercommunicating pore 150 is 90-150 degree.

Further, the angle between first intercommunicating pore 140 and the second intercommunicating pore 150 is 120-140 degree.

Further, in order to improve testing efficiency and test quality, it is provided with elastic clamping block in the test trough 110, is used In clamping sensor during the test, avoid opening a way.

Further, the test trough 110 is correspondingly arranged with conductive test item 130, and the conductive test item 130, which is located at, to be surveyed Immediately below the front side of experimental tank 110, the path of conducting wire installation can be shortened in this way, save conducting wire dosage.

In the description of this specification, the description of reference term " one embodiment ", " example ", " specific example " etc. means Particular features, structures, materials, or characteristics described in conjunction with this embodiment or example are contained at least one of the utility model In embodiment or example.In the present specification, schematic expression of the above terms be not necessarily referring to identical embodiment or Example.Moreover, particular features, structures, materials, or characteristics described can be in any one or more embodiment or examples In can be combined in any suitable manner.

The preferred embodiment in the utility model disclosed above is only intended to help to illustrate the utility model.Preferred embodiment is simultaneously There is no the details that detailed descriptionthe is all, also not limiting the utility model is only the specific embodiment.Obviously, according to this theory The content of bright book can make many modifications and variations.These embodiments are chosen and specifically described to this specification, is in order to preferably The principles of the present invention and practical application are explained, so that skilled artisan be enable to better understand and utilize this Utility model.The utility model is limited only by the claims and their full scope and equivalents.

Claims (8)

1. a kind of sensor aging carrier, which is characterized in that the carrier ontology (100) including insulation, the carrier ontology (100) it is provided with multiple test troughs arranged side by side (110) on upper surface, is arranged on carrier ontology (100) front side surface There are test-strips outstanding, the test-strips include the conductive test item (130) and Insulation test item (120) of consecutive intervals setting, Test trough (110) tail portion offers the intercommunicating pore of connection conductive test item (130), is provided with connection in the intercommunicating pore and leads The conducting wire of electrical measurement strip (130) and test trough (110) tail portion；When sensor is put into test trough (110), the connecting terminal of sensor One end of connecting wire.

2. a kind of sensor aging carrier according to claim 1, it is characterised in that: the test trough (110) is Arc groove or square groove.

3. a kind of sensor aging carrier according to claim 1, it is characterised in that: the intercommunicating pore includes mutual The first intercommunicating pore (140) and the second intercommunicating pore (150) of perforation are connected, first intercommunicating pore (140) is connected to test trough (110) Tail portion, second intercommunicating pore (150) are connected to conductive test item (130).

4. a kind of sensor aging carrier according to claim 3, it is characterised in that: first intercommunicating pore (140) it is smoothly connected between the second intercommunicating pore (150).

5. a kind of sensor aging carrier according to claim 4, it is characterised in that: first intercommunicating pore (140) angle between the second intercommunicating pore (150) is 90-150 degree.

6. a kind of sensor aging carrier according to claim 5, it is characterised in that: first intercommunicating pore (140) angle between the second intercommunicating pore (150) is 120-140 degree.

7. a kind of sensor aging carrier according to claim 1 to 6, it is characterised in that: the test Slot is provided with elastic clamping block in (110), is used for clamping sensor.

8. a kind of sensor aging carrier according to claim 1 to 6, it is characterised in that: the test Slot (110) is correspondingly arranged with conductive test item (130), under the conductive test item (130) is located at the front side of test trough (110) just Side.