CN208848874U - Wafer processing device - Google Patents

Wafer processing device Download PDF

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Publication number
CN208848874U
CN208848874U CN201821708777.3U CN201821708777U CN208848874U CN 208848874 U CN208848874 U CN 208848874U CN 201821708777 U CN201821708777 U CN 201821708777U CN 208848874 U CN208848874 U CN 208848874U
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CN
China
Prior art keywords
wafer
processing device
arm
reaction chamber
wafer processing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201821708777.3U
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Chinese (zh)
Inventor
潘东林
高英哲
张文福
刘家桦
叶日铨
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Huaian Imaging Device Manufacturer Corp
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Huaian Imaging Device Manufacturer Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Priority to CN201821708777.3U priority Critical patent/CN208848874U/en
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Publication of CN208848874U publication Critical patent/CN208848874U/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Abstract

The utility model relates to technical field of manufacturing semiconductors more particularly to a kind of wafer processing devices.The wafer processing device includes: reaction chamber;First transfer chamber has the first mechanical arm, handles for wafer to be transmitted in the reaction chamber from the external world;Second transfer chamber is located at the opposite sides of the reaction chamber with first transfer chamber, has the second mechanical arm, for will be through the reaction chamber treated the wafer transfer to the external world.The utility model reduces the contaminated probability of wafer, improves the yield of semiconductor product.

Description

Wafer processing device
Technical field
The utility model relates to technical field of manufacturing semiconductors more particularly to a kind of wafer processing devices.
Background technique
With the continuous development of semiconductor processing technology, IC circuit level is higher and higher, the crucial ruler of semiconductor product It is very little to be gradually reduced, the control of pollutant is required also higher and higher.IC is formed on wafer, this is subjected to many technique Step, each processing step require to carry out in specific wafer processing chamber, in many cases, these wafer-process chambers Room requires to be maintained in the environment of vacuum or intimate vacuum, could carry out normal process to wafer.Therefore, in crystalline substance In round treatment process, during wafer is transferred to another processing chamber housing from a processing chamber housing, atmosphere is needed to transmit Mould group (Atmosphere Transfer Module, ATM), gas lock (Airlock), vacuum transmission module (Vacuum Transfer Module, VTM), the same specification transport chamber of front end open-type or front end open-type universal cavity (Front Opening Unified Pod, FOUP) etc. synergistic effect realize.
Wafer has to before the processing chamber housing for entering per pass technique through over cleaning, with remove crystal column surface particle, The pollutants such as organic matter, metal, natural oxide, therefore, how to reduce the pollution of crystal column surface is that semiconductor technology developed An important ring in journey.Metallic pollution is a well-known problem in semi-conductor industry, and is including polysilicon gate It is especially universal in the formation process of CMOS transistor.When being performed etching to the polysilicon layer with crystallographic surface defects, etching Defect area cannot be passed through completely, so that leading to the generation of the polysilicon isolated island of polysilicon lines short circuit.
In actual operation process, wafer is transmitted to the wafer inside reaction chamber and after having handled certainly from the external world Reaction chamber is transmitted to the external world and requires by multiple transmitting steps, and untreated wafer with processed wafer same It is transported in one space, so that the probability that crystal column surface is contaminated with metals greatly increases, affects the yield of semiconductor product.
Therefore, the contaminated probability of wafer how is reduced, the yield of semiconductor product is improved, is skill urgently to be resolved at present Art problem.
Utility model content
The utility model provides a kind of wafer processing device, for solving existing wafer processing device in transmission wafer mistake The problem of wafer contamination is easily led in journey.
To solve the above-mentioned problems, the utility model provides a kind of wafer processing device, comprising:
Reaction chamber;
First transfer chamber has the first mechanical arm, carries out for wafer to be transmitted in the reaction chamber from the external world Processing;
Second transfer chamber is located at the opposite sides of the reaction chamber with first transfer chamber, has the second machine Tool arm, for will be through the reaction chamber treated the wafer transfer to the external world.
Preferably, further includes:
First demarcation plate, between the reaction chamber and first transfer chamber, for the reaction chamber to be isolated With first transfer chamber;
Second demarcation plate, between the reaction chamber and second transfer chamber, for the reaction chamber to be isolated With second transfer chamber.
Preferably, first mechanical arm is identical as the second mechanical arm structure;The first mechanical arm packet Include support column and supporting table;The support column extends along the vertical direction;The supporting table is located at the top of the support column, is used for Carry the wafer.
Preferably, first mechanical arm further includes controller and the first driver;First driver connects institute Controller is stated, supporting table described in the first order-driven for issuing according to the controller surrounds first axle rotation, described First axle extends along the vertical direction and is overlapped with the axis of the support column.
Preferably, first mechanical arm further includes the second driver;Second driver connects the controller, Elevating movement is carried out along the vertical direction for support column described in the second order-driven according to the controller.
Preferably, first mechanical arm further includes the track extended along first level direction, the first level side To vertical with the vertical direction;The bottom of the support column is connect with the track, and the support column can be along the rail Road sliding.
Preferably, first mechanical arm further includes the arm ontology being located on the support table, the arm ontology For clamping the wafer.
Preferably, the arm ontology includes supporting part and the first clamp arm and second for being respectively positioned on the supporting part surface Clamp arm;First clamp arm and second clamp arm for clamping the wafer for being placed in the supporting part surface jointly.
Preferably, first clamp arm is fixed on the supporting part surface;Second clamp arm is connect with the supporting part, And can on the supporting part surface along the second horizontal motion, second horizontal direction simultaneously with the first level side To vertical with the vertical direction.
Preferably, the supporting part extends along second horizontal direction, and its end is connect with the supporting table;It is described Arm ontology further includes third driver;The third driver connects the controller, for driving the supporting part to surround Second axis rotation, the second axis pass through the center of the supporting part and extend along second horizontal direction.
Wafer processing device provided by the utility model, the opposite sides of reaction chamber be respectively set the first transfer chamber and Second transfer chamber, and it is respectively arranged with a mechanical arm in first transfer chamber and second transfer chamber, it is to be processed The wafer that wafer is sent to the reaction chamber and has handled through first transfer chamber is exported through second transfer chamber, is kept away Exempt from wafer to be processed and processed wafer is located in the same space, reduces the contaminated probability of wafer, partly led to improve The yield of body product.
Detailed description of the invention
Attached drawing 1 is the positive structure diagram of wafer processing device in specific embodiment of the present invention;
Attached drawing 2 is the overlooking structure diagram of wafer processing device in specific embodiment of the present invention;
Attached drawing 3 is the overlooking structure diagram of arm ontology in specific embodiment of the present invention;
Attached drawing 4 is the positive structure diagram of arm ontology in specific embodiment of the present invention.
Specific embodiment
It elaborates with reference to the accompanying drawing to the specific embodiment of wafer processing device provided by the utility model.
Present embodiment provides a kind of wafer processing device, and attached drawing 1 is in specific embodiment of the present invention The positive structure diagram of wafer processing device, attached drawing 2 are that wafer processing device is bowed in specific embodiment of the present invention Depending on structural schematic diagram.
As shown in Figure 1 and Figure 2, the wafer processing device that present embodiment provides includes: reaction chamber 10;First passes Defeated room 11 has the first mechanical arm, handles for wafer to be transmitted in the reaction chamber 10 from the external world;Second passes Defeated room 12 is located at the opposite sides of the reaction chamber 10 with first transfer chamber 11, has the second mechanical arm, uses In will be through the reaction chamber 10 treated the wafer transfer to the external world.
Wherein, the reaction chamber 10 can be the reaction chamber for carrying out backside of wafer etching technics, at this point, the reaction There is the sucker 101 for carrying the wafer and the pipeline for transmitting photoresist to the crystal column surface in chamber 10 102.Specifically, first transfer chamber 11 can be located at the reaction chamber 10 front end, first mechanical arm from Load port 15 obtains wafer to be processed, and by inside wafer transfer to be processed to the reaction chamber 10, carries out the back side The process such as etching.Correspondingly, second transfer chamber 12 can be located at the rear end of the reaction chamber 10, second machine Tool arm obtains the wafer handled through the reaction chamber 10 inside the reaction chamber 10, and should treated wafer biography Transport to unloader port 16.Present embodiment is by being respectively completed being put into for wafer in the opposite end of the reaction chamber 10 With the process of taking-up, avoids wafer to be processed and processed wafer from being located in the same space, reduce the contaminated probability of wafer, from And improve the yield of semiconductor product.
In order to be further reduced the contaminated probability of wafer, it is preferred that the wafer-process dress that present embodiment provides It sets further include: the first demarcation plate 13, it is described anti-for being isolated between the reaction chamber 10 and first transfer chamber 11 Answer chamber 10 and first transfer chamber 11;Second demarcation plate 14 is located at the reaction chamber 10 and second transfer chamber 12 Between, for the reaction chamber 10 and second transfer chamber 12 to be isolated.Wherein, first demarcation plate 13 can be according to need Closure or openness are wanted, to control whether the reaction chamber 10 is connected to first transfer chamber 11;Second demarcation plate 14 also can according to need closure or openness, thus control whether the reaction chamber 10 is connected to second transfer chamber 12, To further improve the using flexible of the wafer processing device.
In this specific implementation embodiment, the structure of first mechanical arm and second mechanical arm can phase Together, it can also be different, those skilled in the art can select according to actual needs.In order to be further simplified at the wafer Manage the structure of device, it is preferred that first mechanical arm is identical as the second mechanical arm structure;First manipulator Arm includes support column 111 and supporting table 112;The support column 111 extends along the vertical direction;The supporting table 112 is located at described The top of support column 111, for carrying the wafer.It is furthermore preferred that first mechanical arm further includes controller and first Driver;First driver connects the controller, described in the first order-driven for being issued according to the controller Supporting table 112 surrounds first axle rotation, and the first axle extends along the vertical direction and the axis with the support column 111 It is overlapped.
Preferably, first mechanical arm further includes the second driver;Second driver connects the controller, Elevating movement is carried out along the vertical direction for support column 111 described in the second order-driven according to the controller.
Preferably, first mechanical arm further includes the track 114 extended along first level direction, the first level Direction is vertical with the vertical direction;The bottom of the support column 111 is connect with the track 114, and 111 energy of the support column It is enough to be slided along the track 114.
Specifically, as shown in Figure 1 and Figure 2, along Z-direction extension, (the i.e. described vertical direction is Z axis to the support column 111 Direction), the first level direction is Y direction.The supporting table 112 can be rotated along the first axle, so as to Drive the wafer rotation being located in the supporting table 112;The support column 111 can carry out elevating movement along Z-direction, thus Drive the wafer elevating being located in the supporting table 112;Meanwhile the support column 111 can be on the track 114 along Y-axis Direction movement, so that the wafer being located in the supporting table 112 be driven to move along the y axis.By the track 114, described The cooperation of support column 111 and the supporting table 112, can be adjusted flexibly the position of the wafer, to further improve institute State the degree of automation of the first mechanical arm.
Attached drawing 3 is the overlooking structure diagram of arm ontology in specific embodiment of the present invention, and attached drawing 4 is that this is practical The positive structure diagram of arm ontology in novel specific embodiment.As shown in Figure 3, Figure 4, it is preferred that described first is mechanical Arm further includes the arm ontology 113 in the supporting table 112, and the arm ontology 113 is for clamping the wafer 30. It is furthermore preferred that the arm ontology 113 includes supporting part 31 and 32 He of the first clamp arm for being respectively positioned on 31 surface of supporting part Second clamp arm 33;First clamp arm 32 is with second clamp arm 33 for clamping the institute for being placed in 31 surface of supporting part jointly State wafer 30.
Present embodiment clamps the crystalline substance with second clamp arm 33 using the first clamp arm 32 being oppositely arranged jointly Circle, compared to tradition machinery arm in such a way that vacuum suction acts on fixed wafer, present embodiment passes through mechanical folder It holds to fix wafer, on the one hand reduces the dependence to vacuum suction, reduce the cost of mechanical arm;On the other hand it also mentions The high safety of mechanical arm transmission wafer, avoids wafer from sliding in transmission process.Wherein, first clamp arm 32 and institute The concrete shape of the second clamp arm 33 is stated, those skilled in the art can be set according to actual needs.In order in stable holding wafer While, prevent plowing from wafer, it is preferred that the contact surface of first clamp arm 32 and second clamp arm 33 and the wafer 30 It is arc.
Preferably, first clamp arm 32 is fixed on 31 surface of supporting part;Second clamp arm 33 and the carrying Portion 31 connects, and can on 31 surface of supporting part along the second horizontal motion, second horizontal direction simultaneously with institute It states first level direction and the vertical direction is vertical.
Specifically, second horizontal direction can be X-direction, along the x axis by second clamp arm 33 Movement, the adjustable arm ontology 113 is applied to the chucking power on the wafer 30, so as to realize to various sizes The firm clamping of wafer avoids the offset of the wafer 30.
Preferably, the supporting part 31 extends along second horizontal direction, and its end and the supporting table 112 connect It connects;The arm ontology 113 further includes third driver;The third driver connects the controller, described for driving Supporting part 31 surrounds second axis rotation, and the second axis passes through the center of the supporting part 31 and along the second level side To extension.
Specifically, the supporting part 31 can be around the second axis rotation extended along the x axis, to realize Overturning to the wafer 30 for being located at 31 surface of supporting part, consequently facilitating the wafer 30 after overturning is transmitted to institute Reaction chamber 10 is stated, (such as back-etching technique) is handled to the back side of the wafer 30.Wherein, the back of the wafer 30 Face refers to, is formed with the wafer 30 or surface that the front of pre-formed device architecture is opposite.
The wafer processing device that present embodiment provides, is respectively set the first transmission in the opposite sides of reaction chamber Room and the second transfer chamber, and it is respectively arranged with a mechanical arm in first transfer chamber and second transfer chamber, wait locate The wafer that the wafer of reason is sent to the reaction chamber and has handled through first transfer chamber is defeated through second transfer chamber Out, it avoids wafer to be processed and processed wafer from being located in the same space, reduces the contaminated probability of wafer, to improve The yield of semiconductor product.
The above is only the preferred embodiment of the utility model, it is noted that for the common skill of the art Art personnel can also make several improvements and modifications without departing from the principle of this utility model, these improvements and modifications Also it should be regarded as the protection scope of the utility model.

Claims (10)

1. a kind of wafer processing device characterized by comprising
Reaction chamber;
First transfer chamber has the first mechanical arm, handles for wafer to be transmitted in the reaction chamber from the external world;
Second transfer chamber is located at the opposite sides of the reaction chamber with first transfer chamber, has the second manipulator Arm, for will be through the reaction chamber treated the wafer transfer to the external world.
2. wafer processing device according to claim 1, which is characterized in that further include:
First demarcation plate, between the reaction chamber and first transfer chamber, for the reaction chamber and institute to be isolated State the first transfer chamber;
Second demarcation plate, between the reaction chamber and second transfer chamber, for the reaction chamber and institute to be isolated State the second transfer chamber.
3. wafer processing device according to claim 1, which is characterized in that first mechanical arm and second machine Tool arm structure is identical;First mechanical arm includes support column and supporting table;The support column extends along the vertical direction;Institute The top that supporting table is located at the support column is stated, for carrying the wafer.
4. wafer processing device according to claim 3, which is characterized in that first mechanical arm further includes controller With the first driver;First driver connects the controller, and the first instruction for being issued according to the controller is driven The supporting table is moved around first axle rotation, the first axle extends along the vertical direction and the axis with the support column It is overlapped.
5. wafer processing device according to claim 4, which is characterized in that first mechanical arm further includes the second drive Dynamic device;Second driver connects the controller, for support column described in the second order-driven according to the controller Elevating movement is carried out along the vertical direction.
6. wafer processing device according to claim 5, which is characterized in that first mechanical arm further includes along first The track that horizontal direction extends, the first level direction are vertical with the vertical direction;The bottom of the support column with it is described Track connection, and the support column can be slided along the track.
7. wafer processing device according to claim 6, which is characterized in that first mechanical arm further includes being located at institute The arm ontology in supporting table is stated, the arm ontology is for clamping the wafer.
8. wafer processing device according to claim 7, which is characterized in that the arm ontology include supporting part and The first clamp arm and the second clamp arm positioned at the supporting part surface;First clamp arm and second clamp arm for clamping jointly It is placed in the wafer on the supporting part surface.
9. wafer processing device according to claim 8, which is characterized in that first clamp arm is fixed on the supporting part Surface;Second clamp arm is connect with the supporting part, and can be on the supporting part surface along the second horizontal motion, institute It is vertical with the first level direction and the vertical direction simultaneously to state the second horizontal direction.
10. wafer processing device according to claim 9, which is characterized in that the supporting part is along the second level side To extension, and its end is connect with the supporting table;The arm ontology further includes third driver;The third driver connects The controller is connect, for driving the supporting part around second axis rotation, the second axis passes through the supporting part Center and along second horizontal direction extend.
CN201821708777.3U 2018-10-19 2018-10-19 Wafer processing device Expired - Fee Related CN208848874U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201821708777.3U CN208848874U (en) 2018-10-19 2018-10-19 Wafer processing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201821708777.3U CN208848874U (en) 2018-10-19 2018-10-19 Wafer processing device

Publications (1)

Publication Number Publication Date
CN208848874U true CN208848874U (en) 2019-05-10

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201821708777.3U Expired - Fee Related CN208848874U (en) 2018-10-19 2018-10-19 Wafer processing device

Country Status (1)

Country Link
CN (1) CN208848874U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113140483A (en) * 2021-03-03 2021-07-20 上海璞芯科技有限公司 Wafer conveying method and wafer conveying platform

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113140483A (en) * 2021-03-03 2021-07-20 上海璞芯科技有限公司 Wafer conveying method and wafer conveying platform

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Granted publication date: 20190510