CN208795688U - Dielectric film electrochemical impedance spectroscopy test device and electrochemical test system - Google Patents
Dielectric film electrochemical impedance spectroscopy test device and electrochemical test system Download PDFInfo
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- CN208795688U CN208795688U CN201821338207.XU CN201821338207U CN208795688U CN 208795688 U CN208795688 U CN 208795688U CN 201821338207 U CN201821338207 U CN 201821338207U CN 208795688 U CN208795688 U CN 208795688U
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Abstract
The utility model discloses a kind of dielectric film electrochemical impedance spectroscopy test device and electrochemical test systems, are related to electrolyte impedance spectrum the field of test technology, and the dielectric film electrochemical impedance spectroscopy test device includes: installation set, and the installation set is hollow structure；Clamp assemblies, the clamp assemblies are set in the installation set, the clamp assemblies include the opposite grain-clamping table laid for clamping the dielectric film, and the part of the grain-clamping table is exposed at the outside of the installation set, and is mounted on external tab in the exposed portion of two grain-clamping tables；Device for exerting, the device for exerting are set on one of them described grain-clamping table, are configured to drive the grain-clamping table mobile towards grain-clamping table described in another；Wherein, two grain-clamping tables are electric conductor.The utility model dielectric film electrochemical impedance spectroscopy test device and electrochemical test system are used to improve the accuracy of test data.
Description
Technical field
The utility model relates to electrolyte impedance spectrum the field of test technology more particularly to a kind of dielectric film electrochemical impedances
Compose test device and electrochemical test system.
Background technique
Countries in the world have put into very big strength, polymer dielectric in terms of the research of polymer dielectric in the past 20 years
It is many kinds of, but it is broadly divided into three classes: solvent-free polymer electrolytes, gel polymer electrolyte and porous polymer electrolysis
Matter.
Electrochemical impedance spectroscopy (Electrochemical impedance spectroscopy, abbreviation EIS) is research electricity
Most one of the powerful for the electrochemical process that pole/electrolyte interface occurs, electrochemical impedance spectroscopy are to apply one to electrolyte
(this ratio is the electrochemistry system to the ratio of the AC signal of the different small amplitude of frequency, Measuring Alternating Current Signal voltage and electric current
The impedance of system) with the variation of sine wave freuqency, it can analyze the electrochemistry mistake of electrode and inside battery by electrochemical impedance spectroscopy
Journey.Electrochemical workstation can measure the very wide impedance spectrum of frequency range, then simulate impedance value in conjunction with equivalent circuit, then
It carries out Conductivity Calculation and obtains electrolyte ion conductivity.From the viewpoint of practical, polymer dielectric will at least meet tool
There is higher ionic conductivity, battery can charge.Therefore in battery electrolyte carry out EIS analysis and research seem to
It closes important.
Currently, dielectric film is usually directly placed in battery case by polymer dielectric impedance spectrometry, by battery case
The technical issues of measuring, causing in this way is connect with the electrode of electrochemical workstation is: dielectric film and battery case are indirectly
It touches bad, makes dielectric film discontinuity, measurement error is larger, causes dielectric film Impedance measurement value bigger than normal, influences Europe
The accuracy of nurse internal resistance, and then reduce the accuracy judged battery analysis.
Utility model content
The embodiments of the present invention provide a kind of dielectric film electrochemical impedance spectroscopy test device and electro-chemical test system
System, main purpose are to make dielectric film during electrochemical impedance spectroscopy test, and dielectric film uniform force reduces impedance
Measurement error improves the accuracy of electrochemical impedance spectroscopy test.
In order to achieve the above objectives, the embodiments of the present invention adopt the following technical scheme that
A kind of dielectric film electrochemical impedance spectroscopy test device, comprising:
Installation set, the installation set are hollow structure；
Clamp assemblies, the clamp assemblies are set in the installation set, and the clamp assemblies include opposite lay for pressing from both sides
The grain-clamping table of the dielectric film is held, the part of the grain-clamping table is exposed at the outside of the installation set, and two grain-clamping tables
Exposed portion on be mounted on external tab；
Device for exerting, the device for exerting are set on one of them described grain-clamping table, are configured to drive the grain-clamping table
It is mobile towards grain-clamping table described in another；
Wherein, two grain-clamping tables are electric conductor.
Dielectric film electrochemical impedance spectroscopy test device provided by the embodiment of the utility model is laid relatively using two
Grain-clamping table clamps dielectric film, and it is mobile towards another grain-clamping table to drive one of grain-clamping table by device for exerting, and then to electricity
It solves plasma membrane and applies pressure, contact dielectric film with grain-clamping table well, uniform force improves the accurate of measured impedance value
Property, and the apparatus structure is simple, it is easy to operate.
Optionally, a grain-clamping table in two grain-clamping tables includes that the first clamping ontology and part are exposed at the installation
Support base outside set；Another described grain-clamping table includes that the second clamping ontology and part are exposed at leading outside the installation set
Electric column, the first clamping ontology and the opposite laying of the second clamping ontology, the external tab are mounted on the support base
In the exposed portion of the conductive column, the device for exerting is set on the conductive column.
Further, the first clamping ontology and the second clamping ontology can cover the folder of the dielectric film
Hold face.
Optionally, first is arranged with absolutely between the first clamping ontology and the second clamping ontology and the installation set
Edge casing.
Optionally, the second insulating sleeve is arranged between the conductive column and the device for exerting.
Further, second insulating sleeve is provided with convex edge close to one end of the second clamping ontology, described to apply
The end of pressure device is withstood on the convex edge.
Optionally, the device for exerting is at least partly exposed at outside the installation set, and the top of the device for exerting
Lower than the top of the conductive column.
Optionally, the support base and the device for exerting are threadedly coupled with the installation set.
Optionally, the central axes of two grain-clamping tables and the central axes of the device for exerting are located at same straight line
On.
On the other hand the utility model additionally provides a kind of electrochemical test system, which includes above-mentioned
The dielectric film electrochemical impedance spectroscopy test device；Electrochemical workstation, the electrochemical workstation and the external pole
Ear electrical connection.
Electrochemical test system provided by the embodiment of the utility model, due to using dielectric film electrochemistry described above
The accuracy of test data also can be improved in impedance spectrum test device, provides reliable data for the Impedance Analysis of battery.
Detailed description of the invention
Fig. 1 is a kind of structural representation of dielectric film electrochemical impedance spectroscopy test device provided by the embodiment of the utility model
Figure；
Fig. 2 is a kind of use state of dielectric film electrochemical impedance spectroscopy test device provided by the embodiment of the utility model
Figure；
Fig. 3 be using a kind of dielectric film electrochemical impedance spectroscopy test device provided by the embodiment of the utility model with it is existing
The impedance Nyquist comparison diagram tested of electrochemical impedance spectroscopy test device；
Fig. 4 be using a kind of dielectric film electrochemical impedance spectroscopy test device provided by the embodiment of the utility model with it is existing
The impedance Nyquist comparison diagram tested of electrochemical impedance spectroscopy test device；
Fig. 5 be using a kind of dielectric film electrochemical impedance spectroscopy test device provided by the embodiment of the utility model with it is existing
The impedance Nyquist comparison diagram tested of electrochemical impedance spectroscopy test device.
Specific embodiment
The utility model embodiment dielectric film electrochemical impedance spectroscopy test device and electrochemistry are surveyed with reference to the accompanying drawing
Test system is described in detail.
In the description of the present invention, it should be understood that term " center ", "upper", "lower", "front", "rear",
The orientation or positional relationship of the instructions such as "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outside" is based on attached drawing institute
The orientation or positional relationship shown, is merely for convenience of describing the present invention and simplifying the description, rather than indication or suggestion is signified
Device or element must have a particular orientation, be constructed and operated in a specific orientation, therefore should not be understood as to this is practical
Novel limitation.
Term " first ", " second " be used for descriptive purposes only and cannot be understood as indicating or suggesting relative importance or
Implicitly indicate the quantity of indicated technical characteristic." first " is defined as a result, the feature of " second " can be expressed or imply
Ground includes one or more of the features.In the description of the present invention, unless otherwise indicated, the meaning of " plurality " is two
It is a or more than two.
The terms "and/or", only a kind of incidence relation for describing affiliated partner, indicates that there may be three kinds of passes
System, for example, A and/or B, can indicate: individualism A exists simultaneously A and B, these three situations of individualism B.In addition, herein
Middle character "/" typicallys represent the relationship that forward-backward correlation object is a kind of "or".
Referring to Figures 1 and 2, the utility model embodiment provides a kind of dielectric film electrochemical impedance spectroscopy test device,
Comprising: installation set 1, the installation set is 1 hollow structure；Clamp assemblies, the clamp assemblies are set in the installation set 1,
The clamp assemblies include the opposite grain-clamping table laid for clamping the dielectric film 8, and the part of the grain-clamping table is exposed at institute
The outside of installation set 1 is stated, and is mounted on external tab 4 in the exposed portion of two grain-clamping tables；Device for exerting 5, it is described to apply
Pressure device 5 is set on one of them described grain-clamping table, is configured to that the grain-clamping table is driven to move towards grain-clamping table described in another
It is dynamic；Wherein, two grain-clamping tables are electric conductor.
Specifically, two grain-clamping tables are respectively the first grain-clamping table 2 and the second grain-clamping table 3, the device for exerting 5 is arranged
On second grain-clamping table 3, it is mobile towards 2 direction of the first grain-clamping table that second grain-clamping table 3 is driven by pressure, and then make electricity
The surface of solution plasma membrane 8 is contacted with the first grain-clamping table 2 and the second grain-clamping table 3 respectively, due to the first grain-clamping table 2 and the second grain-clamping table 3
The pressure acted on dielectric film 8 is uniform, uniformly avoids so that dielectric film 8 is contacted with grain-clamping table in the part of contact surface
There is the phenomenon that gap or excessive compression, the increase of measured impedance value can be directly resulted in if there is gap, utilizes electricity
Solution plasma membrane 8 is uniformly contacted with grain-clamping table, improves the accuracy of test result, in this way can by accurate test data
The electrochemical impedance spectroscopy of accurate analysis dielectric film, to provide advantageous number to performance evaluations such as the impedance spectrums of battery
According to.
In some embodiments, referring to Fig.1, first grain-clamping table 2 includes that the first clamping ontology 201 and part are exposed at institute
State the support base 202 outside installation set 1.Wherein, the structure of support base 202 and the first clamping ontology 201 has a variety of, shows
Example, the support base 202 can be cylindric, prism-shaped or other shapes, but in order to save processing cost, preferably
It is cylindric, and the support base 202 of cylindrical-shaped structure has a ladder platform, one end of installation set 1 can withstand on the ladder platform
On, to keep the part of support base 202 exposed, and external tab 4 is mounted in the exposed portion of support base 202, convenient for
Electrochemical workstation electrical connection, external tab 4 may be mounted at the side or bottom surface in exposed portion, be preferably located on side,
Facilitate operation in this way, support base 202 is electric conductor, selected from one of the materials such as stainless steel, copper is gold-plated；First clamping ontology
201 structure similarly have it is a variety of, for example, cylindric, prism-shaped or other shapes, for the purposes of saving processing cost,
And be adapted with the surface texture of the dielectric film 8, it is preferably cylindric, because the dielectric film 8 after cutting is cylinder
Shape；Meanwhile first clamping ontology 201 in need the surface contacted with dielectric film 8 smooth, coefficient of friction is small；First clamping ontology
201 be also electric conductor, and material can be same or different with the support base 202, when it is implemented, the support base 202 can
With identical as the first clamping 201 material of ontology, and it is in integral structure, is integrally formed design.
In some embodiments, referring to Fig.1, second grain-clamping table 3 includes that the second clamping ontology 301 and part are exposed at institute
The conductive column 302 outside installation set 1, the first clamping ontology 201 and the opposite laying of the second clamping ontology 301 are stated, the
The outer diameter of two clamping ontologies 301 is greater than the outer diameter of the conductive column 302, and the device for exerting 5 is set in the conductive column 302
On.Wherein, in order to guarantee that grain-clamping table is uniform to the active force of dielectric film 8, the second clamping ontology 301 and the first clamping ontology
201 structure is identical, needs the surface contacted with dielectric film 8 also smooth in the second clamping ontology 301, coefficient of friction is also smaller.
It is exemplary, the contour line for the clamping face that the contour line of the clamping face of dielectric film 8 clamps ontology 201 beyond first,
Equally, the contour line of clamping face of the contour line of the clamping face of dielectric film 8 beyond the second clamping ontology 301, if dielectric film 8
Clamping face contour line without departing from first clamping ontology 201 clamping face contour line or second clamping ontology 301 clamping
When the contour line in face, in clamping process, can directly it be connect for the first clamping ontology 201 and the second clamping ontology 301 of electric conductor
It touches and short circuit phenomenon occurs, if the clamping face that the contour line of the clamping face of dielectric film 8 clamps ontology 201 well beyond first
The contour line of the clamping face of contour line or the second clamping ontology 301, is also easy to cause dielectric film 8 to crimp, and then contact
Property it is poor, the impedance spectrum error of test will be bigger than normal, it is preferred that the area of the clamping face of dielectric film 8 be equal to first clamping this
The area of the clamping face of the area of the clamping face of body 201 and the second clamping ontology 301, wherein clamping face is the table being in contact
Face.
It is exemplary, it is arranged between the first clamping ontology 201 and the second clamping ontology 301 and the installation set 1
There is the first insulating sleeve 6.Exemplary, the internal diameter of the first insulating sleeve 6 and the first clamping ontology 201 and described second clamp ontology
301 outer diameter is all the same, and the first insulating sleeve 6 can make the first clamping ontology 201, second clamping ontology 301 and dielectric film 8
The central axes of three are located on the same line.In the specific implementation, since installation set 1 may be conductor, the first insulating sleeve 6
It effectively prevent being that short circuit occurs now between the first clamping ontology 201 of conductor and the second clamping ontology 301 and installation set 1
As on the other hand, when the second clamping ontology 301 is mobile towards the first clamping 201 direction of ontology, guaranteeing the second clamping ontology 301
It acts on dielectric film 8 vertically, and then makes dielectric film uniform force.First insulating sleeve 6 can be polytetrafluoroethyl-ne
The isolation materials such as alkene, polyetherimide, polypropylene.
Specifically, the height of the first insulating sleeve 6, which is less than or equal to the first clamping ontology 201 and second, clamps ontology 301
The sum of height is prevented from exhausted by first when device for exerting 5 drives the second grain-clamping table 3 mobile towards 3 direction of the first grain-clamping table in this way
Edge casing 6 prevents, and influences the clamping to dielectric film.
In some embodiments, the second insulating sleeve 7 is arranged between the conductive column 302 and the device for exerting 5,
Since in actual use, the device for exerting 5 may also be electric conductor, and device for exerting 5 is contacted with conductive column 302 in order to prevent
Short circuit occurs and designs the second insulating sleeve 7, wherein the second insulating sleeve 7 is with the conductive column 302 and device for exerting 5
Clearance fit.Second insulating sleeve 7 can be the isolation materials such as polytetrafluoroethylene (PTFE), polyetherimide, polypropylene
In order to promote device for exerting 5 while drive the second insulating sleeve 7, conductive column 302 and the second clamping 301 court of ontology
8 direction of dielectric film is mobile, and referring to Fig.1, second insulating sleeve 7 is arranged close to one end of the second clamping ontology 301
There is convex edge 701, the end of the device for exerting 5 is withstood on the convex edge 701.Can also prevent in this way be electric conductor pressure
Device 5 contacts generation short circuit with the second clamping ontology 301.
Exemplary, the device for exerting 5 is at least partly exposed at outside the installation set 1, and the top of the device for exerting 5
End is lower than the top of the conductive column 302, prevents device for exerting 5 from contacting in moving process with conductive column 302 and conductive.
In some embodiments, referring to Fig.1, the support base 202 and the device for exerting 5 with the installation set 1
It is threadedly coupled.When specific pressure, device for exerting 5 is rotated, device for exerting 5 is moved along the axial direction of installation set 1, and then is pushed
Second insulating sleeve 7, conductive column 302 and the second clamping ontology 301 are mobile towards 8 direction of dielectric film, to make the second clamping
Ontology 301 acts on the surface of dielectric film 8.Installation set 1 can also limit the position of the first insulating sleeve 6, prevent from shaking, shadow
Ring pressure.
The utility model embodiment additionally provides a kind of electrochemical test system, and the electrochemical test system includes above-mentioned
The dielectric film electrochemical impedance spectroscopy test device, electrochemical workstation, the electrochemical workstation and the electrolyte
The external tab of membrane electrochemical impedance spectrum test device is electrically connected.Specifically, one of them external tab 4 and electrochemical workstation
Working electrode connection, another external tab 4 connect electrode and reference electrode with electrochemical workstation.
When specifically carrying out electrochemical impedance spectroscopy test, dielectric film 8 is clamped in dielectric film electrochemical impedance spectroscopy and is surveyed
Trial assembly is set, and due to 8 uniform force of dielectric film in test, improves the accuracy of impedance spectrum test data.
It is following by multiple impedance Nyquist comparison diagrams to the dielectric film tested using the electrochemical test system
Impedance and the impedance for the dielectric film tested using existing electrochemical impedance spectroscopy test device are illustrated:
A kind of dry state aluminium polymer is electrolysed using the test device of the disclosure and using other existing test devices
Plasma membrane carries out impedance value test under the same conditions, and measured impedance value comparison is as shown in figure 3, pass through impedance Nyquist
Comparison diagram (wherein, abscissa is measured impedance value) is apparent from, impedance measured by the test device using the disclosure
Value is significantly less than using impedance value measured by other test devices, it follows that, disclosure test device can reduce influence
The increased extraneous factor of measured impedance value, makes measured value closer to true value.
Using the test device of the disclosure and using other existing test devices to a kind of pore type lighium polymer electricity
Solution plasma membrane carries out impedance value test under the same conditions, and measured impedance value comparison is as shown in figure 4, pass through the impedance
Nyquist comparison diagram is apparent from, and impedance value measured by the test device using the disclosure is also significantly less than using other surveys
Measured impedance value is set in trial assembly.
Using the test device of the disclosure and using other existing test devices to a kind of gel state lighium polymer electricity
Solution plasma membrane carries out impedance value test under the same conditions, and measured impedance value comparison is as shown in figure 5, pass through the impedance
Nyquist comparison diagram is apparent from, and impedance value measured by the test device using the disclosure is equally significantly less than using other
Impedance value measured by test device.
It is obtained by above three comparison diagram, using the dielectric film electrochemical impedance spectroscopy test device or electrification of the disclosure
The impedance value of dielectric film can more accurately be measured by learning test macro, improve the accuracy of Impedance Analysis.
In the description of this specification, particular features, structures, materials, or characteristics can be real in any one or more
Applying can be combined in any suitable manner in example or example.
Above description is only a specific implementation of the present invention, but the protection scope of the utility model is not limited to
In this, anyone skilled in the art within the technical scope disclosed by the utility model, can readily occur in variation
Or replacement, it should be covered within the scope of the utility model.Therefore, the protection scope of the utility model should be with the power
Subject to the protection scope that benefit requires.
Claims (10)
1. a kind of dielectric film electrochemical impedance spectroscopy test device characterized by comprising
Installation set, the installation set are hollow structure；
Clamp assemblies, the clamp assemblies are set in the installation set, and the clamp assemblies include opposite lay for clamping
State the grain-clamping table of dielectric film, the part of the grain-clamping table is exposed at the outside of the installation set, and two grain-clamping tables is outer
External tab is mounted in dew portion；
Device for exerting, the device for exerting are set on one of them described grain-clamping table, are configured to drive the grain-clamping table towards another
An outer grain-clamping table is mobile；
Wherein, two grain-clamping tables are electric conductor.
2. dielectric film electrochemical impedance spectroscopy test device according to claim 1, which is characterized in that two clampings
The support base that a grain-clamping table in platform includes the first clamping ontology and is partially exposed at outside the installation set；
The conductive column that another described grain-clamping table includes the second clamping ontology and is partially exposed at outside the installation set；
Wherein, the first clamping ontology and the opposite laying of the second clamping ontology, the external tab are mounted on the branch
In the exposed portion for supportting seat and the conductive column, the device for exerting is set on the conductive column.
3. dielectric film electrochemical impedance spectroscopy test device according to claim 2, which is characterized in that first clamping
Ontology and the second clamping ontology can cover the clamping face of the dielectric film.
4. dielectric film electrochemical impedance spectroscopy test device according to claim 2, which is characterized in that first clamping
The first insulating sleeve is arranged between ontology and the second clamping ontology and the installation set.
5. dielectric film electrochemical impedance spectroscopy test device according to claim 2, which is characterized in that the conductive column with
The second insulating sleeve is arranged between the device for exerting.
6. dielectric film electrochemical impedance spectroscopy test device according to claim 5, which is characterized in that second insulation
Casing is provided with convex edge close to one end of the second clamping ontology, and the end of the device for exerting is withstood on the convex edge.
7. dielectric film electrochemical impedance spectroscopy test device according to claim 2, which is characterized in that the device for exerting
Be at least partly exposed at outside the installation set, and the top of the device for exerting be lower than the conductive column top.
8. dielectric film electrochemical impedance spectroscopy test device according to claim 2, which is characterized in that the support base and
The device for exerting is threadedly coupled with the installation set.
9. dielectric film electrochemical impedance spectroscopy test device according to claim 1, which is characterized in that two clampings
The central axes of platform and the central axes of the device for exerting are located on the same line.
10. a kind of electrochemical test system characterized by comprising
Dielectric film electrochemical impedance spectroscopy test device as described in any one of claims 1 to 9；
Electrochemical workstation, the electrochemical workstation are electrically connected with the external tab.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201821338207.XU CN208795688U (en) | 2018-08-20 | 2018-08-20 | Dielectric film electrochemical impedance spectroscopy test device and electrochemical test system |
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| CN201821338207.XU CN208795688U (en) | 2018-08-20 | 2018-08-20 | Dielectric film electrochemical impedance spectroscopy test device and electrochemical test system |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111141953A (en) * | 2019-12-17 | 2020-05-12 | 武汉工程大学 | Alternating current impedance testing device and method for insulating hollow fiber membrane |
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2018
- 2018-08-20 CN CN201821338207.XU patent/CN208795688U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111141953A (en) * | 2019-12-17 | 2020-05-12 | 武汉工程大学 | Alternating current impedance testing device and method for insulating hollow fiber membrane |
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