CN208607165U - Compound inspection equipment - Google Patents
Compound inspection equipment Download PDFInfo
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- CN208607165U CN208607165U CN201820699551.5U CN201820699551U CN208607165U CN 208607165 U CN208607165 U CN 208607165U CN 201820699551 U CN201820699551 U CN 201820699551U CN 208607165 U CN208607165 U CN 208607165U
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Abstract
The utility model relates to a kind of compound inspection equipment, which includes multiple inspection channels and an at least array sweeping X-ray machine.Each array sweeping X-ray machine is configured to issue a mutually independent X-ray pencil beam and an X-ray fladellum.The target to be checked that X-ray pencil beam is suitable for checking in channel one carries out back scattering scanning.X-ray fladellum is suitable for checking another target to be checked in channel carries out transmission scan.
Description
Technical field
The utility model relates to compound inspection equipment, relate more specifically to compound using the binary channels of x-ray imaging technology
Check equipment.
Background technique
On the one hand, the penetrability of X-ray transmission imaging technique is good, and spatial resolution is high, especially to copper, Tie Denggao atomic number
Number substance reaction is sensitive, imaging clearly, and it is good to debate knowledge effect.Therefore, X-ray transmission imaging technique is to luggage, article etc.
Safety inspection in be widely used.However, the dose of radiation of X-ray transmission imaging technique is big, have centainly to human body
Harm, thus should not be used in the general inspection of human body.
On the other hand, back scattering imaging technology use flying-spot scanner mode, can be scattered back according to human body come X-ray believe
Number imaging, without penetrating human body, single absorbed dose is small, and safety is good, and more sensitive to light body substance, especially to drugs,
The low atomic numbers dangerous material such as explosive have good Effect on Detecting.Therefore, back scattering imaging technology is applied to more and more widely
In the field of safety check of human body, cargo and vehicle etc..
Fig. 6 schematically shows existing back scattering and transmits the compound overall structure and application method for checking equipment.
This compound inspection equipment usually checks that channel 4 and a whole set of transmission check that channel 6 is composed by a whole set of back scattering.It connects down
Come by taking most typical people, object sorting as an example, this compound inspection equipment is illustrated.
In this compound inspection equipment, flying spot X-ray machine 1 and backscatter detector 2 are fixed in transport mechanism 3.Flying spot X
Ray machine 1 issues X-ray pencil beam.The detection of backscatter detector 2 is scattered back the signal come by human body 5 for being imaged.X-ray pen shape
Beam, which often rotates a circle, just completes a column scan.By the translation of transport mechanism 3, X-ray pencil beam is completed by column to human body 5
Scanning single side.Then, so that human body 5 is turned round 180 ° and complete the scanning of the other side to human body 5 in the same way, it is thus complete
The bilateral of adult body 5 scans comprehensively.In addition, the X-ray that Transmission X ray machine 7 issues is modulated into fladellum by front collimation device 8.Thoroughly
It penetrates detector 11 and detects the X-ray signal after penetrating luggage 9 for being imaged.Pass through the translation of transmission mechanism 10, Transmission X ray machine 7
Comprehensive scanning to luggage 9 is completed layer by layer.
In the prior art, in order to realize people, object sorting, or in order to realize to the same target to be checked with back scattering and
Transmission two ways is detected, a whole set of back scattering equipment and a whole set of emissive devices combine use sometimes.Knot
Fruit, the space occupied and weight of the equipment after combining are big, at high cost, and dismounting and use are all inconvenient.Particularly, due to this
The volume of the component of unit equipment is bigger and disperses, so increasing machine adds difficulty, driving power consumption and X-ray leakage hidden danger
Deng.In addition, human body can be generated by synchronizing inspection to human body and luggage, article using separate unit or two transmission-type X-ray machines
It is potentially hazardous, thus hinder being widely used for this inspection equipment being directly composed.
Utility model content
[technical purpose]
In order to solve the above-mentioned technical problem other technical problems for and hereinafter referring to and be made that the utility model.
[technical solution]
One aspect according to the present utility model, provides a kind of compound inspection equipment, and the compound inspection equipment includes more
A inspection channel, detector and an at least array sweeping X-ray machine.Each array sweeping X-ray machine is configured to issue mutual
An independent X-ray pencil beam and an X-ray fladellum.The X-ray pencil beam is suitable for in an inspection channel
Target to be checked carry out back scattering scanning.The X-ray fladellum be suitable for another check channel in target to be checked into
Row transmission scan.
Preferably, the compound inspection equipment includes two inspection channels, detector and an array sweeping X-ray machine.Institute
It states array sweeping X-ray machine to be arranged between described two inspection channels, X described in the objective emission to be checked checked in channel to one
Ray pencil beam, and X-ray fladellum described in the objective emission to be checked in channel is checked to another.
Preferably, the back scattering scanning and the transmission scan carry out independently of each other and mutually without crosstalk.
Optionally, the back scattering scanning and the transmission scan carry out simultaneously, or do not carry out simultaneously.
Preferably, the subtended angle of the subtended angle of the X-ray pencil beam and the X-ray fladellum is to set independently of each other
's.The energy of the energy of the X-ray pencil beam and the X-ray fladellum is set independently of each other.The X-ray pen
The energy of the energy of the pencil of forms and the X-ray fladellum is identical or different.
Preferably, the subtended angle center line of the X-ray fladellum is with respect to the horizontal plane oliquely downward tilted a certain angle.Phase
Ying Di checks that the bottom in channel and the side opposed with the array sweeping X-ray machine are provided with transmission and visit in described another
Survey device.
Optionally, the array sweeping X-ray machine is generated respectively using the same high voltage power supply or different high voltage power supplies
The X-ray pencil beam and the X-ray fladellum.
Preferably, one inspection channel and described another check that channel is located on the same horizontal plane.
Preferably, the compound inspection equipment further includes carrying on the back scattered detector and transmission detectors.The array sweeping X-ray machine
Detector is dissipated positioned at one the same side for checking the target to be checked in channel with described carry on the back.The array sweeping X-ray machine and
Described another of transmission detectors separation checks the two sides of the target to be checked in channel.The transmission detectors are arranged to
I shape or L shape.
Preferably, the compound inspection equipment is open or enclosed.
Other side according to the present utility model provides a kind of compound inspection equipment.The compound inspection equipment includes
First inspection channel, the second inspection channel, an X being arranged between the first inspection channel and second inspection channel
Ray generator and corresponding detector.The X-ray emitter includes: the first X-ray tube and flying-spot scanner mechanism,
Be configured to issue X-ray pencil beam, the X-ray pencil beam be suitable for it is described first check channel in target to be checked into
Row back scattering scanning；And second X-ray tube and front collimation device, it is configured to issue X-ray fladellum, the X-ray
Fladellum is suitable for checking that described second, the target to be checked in channel carries out transmission scan.
Optionally, during carrying out back scattering scanning or transmission scan to target to be checked, the target to be checked is opposite
It is mobile relative to the target to be checked in the compound inspection equipment movement or the compound inspection equipment.
Optionally, two or more compound inspection equipment cascadings are got up or are combined use, so that mesh to be checked
Once inspection can be completed without returning or overturning by the compound inspection equipment in mark.
[technical effect]
In the compound inspection equipment of binary channels of the utility model, separate unit array sweeping X-ray machine can be simultaneously emitted by relatively
An independent X-ray pencil beam and an X-ray fladellum.X-ray pencil beam is for target to be checked in an inspection channel
Back scattering scanning.Transmission scan of the X-ray fladellum for target to be checked in another inspection channel.Both scan operations
Between mutually not crosstalk.With by the usage mode phase that combines of conventional a whole set of back scattering equipment and a whole set of emissive devices
Than the compound inspection equipment of the binary channels of the utility model can reach same scan efficiency, can but save at least a set of X-ray
Machine and its peripheral mechanism.
In addition, the compound array sweeping X-ray machine checked in equipment of the binary channels of the utility model is from X-ray source with regard to complete
At radiation protection, without adding peripheral auxiliary device.Therefore, the compound inspection equipment of the binary channels of the utility model can generation
For conventional a set of flying spot X-ray machine and a set of Transmission X ray machine.In this way, not only can simplify system design, reduce using difficulty simultaneously
And reduce cost, can also substantially reduce the space occupied of X-ray machine itself He whole equipment, be conducive to x-ray imaging equipment to
Miniaturization, intelligent and integrated direction are developed, and have a good application prospect and economic benefit.
In addition, if the compound inspection equipment application of the binary channels of the utility model is passed through in the same target to be checked
Single pass timesharing or can obtain to highlight and the transmission image of high-density matter and highlight the backscatter images of light body substance simultaneously,
Scan efficiency and detection effect thus are improved, can efficiently and quickly complete comprehensive examination to target to be checked.
Detailed description of the invention
It is hereinafter retouched in more detail based on exemplary embodiment and in conjunction with attached drawing for the ease of understanding the utility model,
State the utility model.The same or similar component is indicated using the same or similar appended drawing reference in the accompanying drawings.It should be understood that
, attached drawing is only illustrative, and the size and ratio of the component in attached drawing are not necessarily accurate.
Fig. 1 is the compound total structure and application method for checking equipment of the binary channels of embodiment according to the present utility model
Schematic diagram.
Fig. 2 is the schematic diagram of the construction of the array sweeping X-ray machine of embodiment according to the present utility model.
Fig. 3 is the cross-sectional view along the cutting plane A-A interception in Fig. 2.
Fig. 4 a and Fig. 4 b are the schematic diagrames of the angular relationship between two X-ray beams.
Fig. 5 is to check that equipment cascading gets up the signal of the state used for the binary channels of the embodiments of the present invention is compound
Figure.
Fig. 6 is back scattering in the prior art and the signal for transmiting the compound overall structure and application method for checking equipment
Figure.
Specific embodiment
Fig. 1 is the compound total structure and application method for checking equipment of the binary channels of embodiment according to the present utility model
Schematic diagram.The compound inspection equipment utilization separate unit array sweeping X ray machine of the binary channels generates an X-ray pencil beam and an X is penetrated
Line fladellum, so as to check that the target to be checked in channel carries out back scattering scanning and transmission scan respectively to two simultaneously.
The compound inspection equipment of the binary channels of the present embodiment mainly includes host 20, carries on the back scattered channel 30 and transmission channels 40.It is main
Machine 20 is the compound core component for checking equipment of the binary channels.Host 20 includes array sweeping X-ray machine 21, preceding collimator 22, back
It dissipates detector 23 and console 25,26 sum number of control module adopts module 27.Carrying on the back scattered channel 30 includes transport mechanism 32.Right
When the scattered target 31 (such as human body) of back is checked, carries on the back scattered target 31 and be placed in transport mechanism 32 and with transport mechanism 32
It is mobile.Transmission channels 40 include transmission detectors 42 and transport mechanism 43.It is checked to transmission goal 41 (such as luggage)
When, transmission goal 41 is placed in transport mechanism 43 and as transport mechanism 43 is mobile.
When checking target to be checked, array sweeping X-ray machine 21 and back dissipate detector 23 and dissipate target 31 positioned at back
The same side, and be located on fixed collet 24.Transmission goal 41 in transport mechanism 43 is placed in from array sweeping X-ray machine 21
It is passed through between transmission detectors 42.Array sweeping X-ray machine 21 generate an X-ray pencil beam, for carry on the back dissipate target 31 into
Row back scattering scanning, while an X-ray fladellum is generated, for carrying out transmission scan to transmission goal 41.X-ray pen shape
Shape is (angle [alpha] being described later on) at a certain angle between the subtended angle center line of beam and the subtended angle center line of X-ray fladellum
To avoid crosstalk.
By taking the flying spot shown in FIG. 1 rotated counterclockwise as an example.When X-ray pencil beam along carry on the back dissipate target 31 from
On when scanning through a column down, the X-ray fladellum of the other side of array sweeping X-ray machine 21 completes one to transmission goal 41 simultaneously
A cross-sectional scans.Since the subtended angle center line of X-ray pencil beam and the subtended angle center line of X-ray fladellum are in rotation round direction
Upper difference certain angle, so that not having signal cross-talk between back scattering scan operation and transmission scan operation.
At the end of the single stroke of transport mechanism 32, complete to the scanning single side for carrying on the back scattered target 31.If necessary to right
It carries on the back and dissipates the progress bilateral scanning of target 31, then need transport mechanism 32 to carry the scattered target 31 of back and return again to once, to be dissipated to back
The other side of target 31 is scanned.It should be noted that making to carry on the back scattered target 31 and turn over when transport mechanism 32 starts backstroke
Turn 180 °, so as to carry on the back the other side for dissipating target 31 towards array sweeping X-ray machine 21.Unlike this, in the list of transport mechanism 43
The scanning of the gross section to transmission goal 41 can be completed at the end of secondary stroke.When being scanned to target to be checked, two
Detector 23 and 42 senses corresponding X-ray signal respectively.Console 25 is adopted module 27 and is communicated with control module 26 and number,
Then data analysis and process is carried out, corresponding backscatter images and transmission image are ultimately generated.
Further, the scattered channel 30 of host 20, back and transmission channels 40 can be independent from each other device, can also be by group
In the same cover plate.In addition, the scattered channel 30 of host 20, back and transmission channels 40 may be on the same horizontal plane,
It can be arranged to other spatial relations.
Further, the compound inspection equipment of the binary channels of the present embodiment carries out electrical traces in its bottom or headspace
Deng operation, while relevant coupling arrangement and clamp device are set.
Further, array sweeping X-ray machine 21 and back dissipate detector 23 and dissipate the same side of target 31 (in Fig. 1 positioned at back
For right side).For disposing the transport mechanism 43 of transmission goal 41 between array sweeping X-ray machine 21 and transmission detectors 42.
Further, it carries on the back the scattered reception of detector 23 and is scattered back the X-ray signal come, transmission detectors 42 from scattered target 31 is carried on the back
Receive the X-ray signal across transmission goal 41.
Further, console 25 is adopted module 27 and is communicated with control module 26 and number.After receiving inspection instruction,
Control module 26 makes array sweeping X-ray machine 21 be simultaneously emitted by X-ray pencil beam and X-ray fladellum, starts 32 He of transport mechanism
Transport mechanism 43, triggering number adopt module 27 to collect backscatter signal and transmission signal, then will be collected into signal and be sent to control
Platform 25 processed, to carry out data analysis and process, ultimately generate target 31 to be checked backscatter images and target to be checked 41 it is saturating
Penetrate image.It is then possible to carry out manually looking into view to backscatter images generated and transmission image or be carried out certainly by software
Dynamic identification, to differentiate whether there is or not dangerous material and suitably be identified and alarm.
Further, control module 76 can control initial position, the rotation side of X-ray pencil beam and X-ray fladellum
To and the scan period.In the present embodiment, transport mechanism 32 and transport mechanism 43 start simultaneously.Target 31 is dissipated to back completing
Scanning single side and to the scanning of the gross section of transmission goal 41 after, transport mechanism 32 and 43 all stop movement.It is passing
Send mechanism 32 stop it is mobile after, making to carry on the back scattered target 31 and overturning 180 ° (for example, in the case where carrying on the back that dissipate target 31 be human body, makes
Human body turns round 180 °), then make to carry on the back scattered target 31 as transport mechanism 32 returns, thus completes to the other side for carrying on the back scattered target 31
Scanning.
Further, in this embodiment array sweeping X-ray machine 21 integrated in single X-ray tube flying spot light source and
One fan-beam light source.The X-ray tube is identical with energy by two target spots and generation direction respectively after connecting high voltage power supply
An or different X-ray pencil beams and an X-ray fladellum.
Fig. 2 is the schematic diagram of the construction of the array sweeping X-ray machine of embodiment according to the present utility model.Specifically, should
Array sweeping X-ray machine mainly includes flying spot light source 100, fan-beam light source 200, anode handle 300 and shell 400.Flying spot light source 100 wraps
Include the first cathode 50 and the first anode 60.The first anode 60 includes flying spot module 61 and the first target spot 62.The connection of first cathode 50
To the cathode and filament supply of negative high voltage power source.Anode handle 300 is grounded (anode of negative high voltage power source).Fan-beam light source 200 includes
Second cathode 70 and second plate 80.Second plate 80 includes collimator 81 and the second target spot 82.The inside of anode handle 300 is set
It is equipped with cable hole 301.The top of anode handle 300 is embedded with seal nipple 302.The side of anode handle 300 is connected in shell 400
The cable in portion, the other side of anode handle 300 are connected to the cable outside shell 400.Shell 400 is for fixing flying spot light source 100
With fan-beam light source 200, and shell 400 inside keep vacuum.
The X-ray fladellum generated from the first target spot 62 is modulated into dynamic by the aperture 612 on protection rotating cylinder 611
State pencil beam.The X-ray beam generated from the second target spot 82 is modulated into a sector by the collimating slit 811 in collimator 81
Beam.
As shown in Fig. 2, flying spot module 61 is approximately equivalent to an outer-rotor structure.Specifically, in armature core 615
Several armature winding 614 of upper coiling, and armature core 615 is set in one end (being left end in Fig. 2) of anode handle 300.
It protects on the inner wall of rotating cylinder 611 and is fastened with several permanent magnets 613, and these permanent magnets 613 are evenly distributed state.Protection
One end (being right end in Fig. 2) of rotating cylinder 611 is set on the outer wall of bearing 617.Using sleeve 618 by bearing 617 and accordingly
Position limiting structure support fix.The side (being right side in Fig. 2) of armature core 615 is arranged in driver 616.In energization
Afterwards, the constantly commutation of armature winding 614 is powered and forms rotating excitation field, magnetic field caused by the rotating excitation field and permanent magnet 613
Interaction, thus driving protection rotating cylinder 611 rotates.In this way, the rotary motion by aperture 612 is produced the first target spot 62
Raw X-ray fladellum is modulated into the continuous pencil beam of dynamic.
The material for constituting protection rotating cylinder 611 and collimator 81 is preferably tungsten or tungsten alloy.Constitute the material of anode handle 300
Preferably copper or copper alloy.In this way, radiation protection is completed from X-ray source, so that array sweeping X-ray machine 21 is light small
Ingeniously.
Next the characteristic that X-ray fladellum is generated inside the array sweeping X-ray machine 21 of the present embodiment is illustrated.
Fig. 3 is the cross-sectional view along the cutting plane A-A interception in Fig. 2.Fig. 3 shows the section of collimator 81 and its with
Relative positional relationship between two target spots 82.
Fig. 4 a and Fig. 4 b are the schematic diagrames of the angular relationship between X-ray beam.As shown in fig. 4 a, the first target spot 62 and second
The target surface of target spot 82 is along radially staggered angled.It connects in flying spot light source 100 with the both ends of fan-beam light source 200 identical
Or after different high voltage power supplies, corresponding X-ray beam can be generated respectively on the target surface of the first target spot 62 and the second target spot 82.
Plane where generated two X-ray beams is parallel radially.Preferably, the subtended angle center line of the two X-ray beams
It is staggered into angle [alpha] (as shown in Figure 4 b) and their own subtended angle size can be independently adjusted.It is understood that
Spatially, angle [alpha] is the angle (α=0 ° or 180 ° the case where except) between two different surface beelines.
Further, angle [alpha] ≠ 180 °, i.e. X-ray pencil beam and X-ray fladellum are not in symmetric relation.Certainly, angle
α can also be equal to 180 ° or other any angles.
In addition, the center line of the subtended angle of X-ray fladellum 22 is with respect to the horizontal plane biased to lower section, can effectively increase in this way
Expose thoroughly space (referring to Fig. 1).
Further, the filament of the first cathode 50, the filament of the second cathode 70, the first target spot 62 and the second target spot 82
Center can be located on (that is, coaxially to each other) same horizontal linear, can also be arranged to other spatial relations.
Further, the quantity of the aperture 612 protected on rotating cylinder 61 can be one or more.It is set when on protection rotating cylinder 61
When being equipped with multiple apertures 612, these apertures 612 can be evenly distributed on the circumferencial direction of protection rotating cylinder 61, can also not
It is evenly distributed.
It is possible to further control and use X-ray pen caused by array sweeping X-ray machine 21 respectively as desired
The pencil of forms and X-ray fladellum.
Further, the same high pressure can be used in the flying spot light source 100 of array sweeping X-ray machine 21 and fan-beam light source 200
Power supply generates two identical or different X-ray beams of energy, also can be used two identical or different high voltage power supplies of parameter
The identical or different X-ray beam of two energy is generated respectively.According to target property to be checked, two X-rays can be neatly adjusted
The output dose of beam.
Further, in the present invention, two Conventional X-ray tubes be can use and cooperate flying-spot scanner mechanism and
Front collimation device generates an X-ray pencil beam and an X-ray fladellum.
Further, the compound inspection equipment of the binary channels of the utility model can be open or enclosed, not by
The limitation of the auxiliary parts such as casing, backboard or top cover.
Further, in the compound inspection equipment of the binary channels of the utility model, the position of array sweeping X ray machine, X are penetrated
The not special limitation such as subtended angle and energy of harness, but can suitably be set according to practical situations.
It is possible to further the subtended angle characteristic according to transmission X-ray in the additionally installed transmission in the bottom of transmission channels
Detector, so that detection effect can be improved in this way with existing transmission detectors group is at L-shaped or other shapes of transmission detectors
Rate.
Further, it is fixed the above description is that host 20 and carries on the back the target to be checked dissipated in channel 30 and transmission channels 40
31,41 mode mobile with respective transport mechanism.It is understood that the mode of other relative motions can also be used.
Further, the utility model is suitable for the occasion of people, object sorting, wherein back scattering part is used for the inspection of human body
It surveys, detection of the transmissive portion for luggage, article etc..Alternatively, it is also possible to which back scattering part is used for human testing；In this feelings
Under condition, if it find that suspicion object, then recycle transmissive portion to be rechecked.Certainly, target to be checked is not limited to mentioned above
These objects, be also possible to animal, cargo or vehicle etc..
A channel is combined into it is possible to further which scattered channel and transmission channels will be carried on the back.In this manner it is achieved that same
Target to be checked is simultaneously or back scattering detection and transmission detection are completed in timesharing, to improve detectability.
Further, the embodiments of the present invention are only illustrated by taking the compound inspection equipment of binary channels as an example.However,
The compound inspection equipment of the utility model is not limited to this.It, can be by the compound inspection of above-mentioned binary channels as another embodiment
Equipment is cascaded, and multiple inspection channels is consequently formed, as shown in Figure 5.In this case, it is formed by and checks in channel
A part of channel to be checked can bilateral (such as front and back of human body to be checked shown in fig. 5) to the same target to be checked it is same
When (or timesharing) complete back scattering detection and/or transmission detection.In this way, target to be checked is usually only necessary to run-down (that is, to be checked
Target is without returning or overturning) bilateral scanning can be completed.It is understood that each transmission channels can independently make
With comprehensive transmission scan to target to be checked can be completed by single sweep operation.Further it will be understood that shown in Fig. 5
The quantity in the channel used of cascading up is merely exemplary, rather than restrictive.In practical applications, compound inspection equipment
User/operator can according to need suitably to increase or reduce the quantity in the channel used that cascades up.
It has been carried out in detail above with reference to technical purpose, technical solution and technical effect of the specific embodiment to the utility model
Thin explanation.Place near the steps is answered to understand, above-described embodiment is merely exemplary, rather than restrictive.In the essence of the utility model
Within mind and principle, it is practical new that any modification, equivalent substitution, improvement and etc. that those skilled in the art makes are comprised in this
Within the protection scope of type.
Claims (11)
1. a kind of compound inspection equipment, including multiple inspection channels and an at least array sweeping X-ray machine,
It is characterized in that, each array sweeping X-ray machine is configured to issue a mutually independent X-ray pencil beam and one
X-ray fladellum, the target to be checked that the X-ray pencil beam is suitable for checking in channel one carry out back scattering scanning, institute
X-ray fladellum is stated to be suitable for checking another target to be checked in channel carries out transmission scan.
2. compound inspection equipment according to claim 1, wherein
The compound inspection equipment includes two inspection channels and an array sweeping X-ray machine, and
The array sweeping X-ray machine is arranged between described two inspection channels, to the target to be checked checked in channel a hair
The X-ray pencil beam is penetrated, and checks X-ray fladellum described in the objective emission to be checked in channel to another.
3. compound inspection equipment according to claim 1 or 2, wherein
The back scattering scanning and the transmission scan carry out independently of each other and mutually without crosstalk.
4. compound inspection equipment according to claim 3, wherein
The back scattering scanning and the transmission scan are carried out simultaneously or are not carried out simultaneously.
5. compound inspection equipment according to claim 1, wherein
The subtended angle of the subtended angle of the X-ray pencil beam and the X-ray fladellum is set independently of each other, and
The energy of the energy of the X-ray pencil beam and the X-ray fladellum is set independently of each other, the X-ray
The energy of the energy of pencil beam and the X-ray fladellum is identical or different.
6. compound inspection equipment according to claim 1, wherein
The subtended angle center line of the X-ray fladellum with respect to the horizontal plane tilts downwards an angle.
7. compound inspection equipment according to claim 1, wherein
The array sweeping X-ray machine generates the X-ray pen using the same high voltage power supply or different high voltage power supplies respectively
The pencil of forms and the X-ray fladellum.
8. compound inspection equipment according to claim 1, wherein
The multiple inspection channel is located on the same horizontal plane.
9. compound inspection equipment according to claim 1, wherein
The compound inspection equipment further includes carrying on the back scattered detector and transmission detectors,
The array sweeping X-ray machine and described carry on the back dissipate the same of to be checked target of the detector in one inspection channel
Side, and
The array sweeping X-ray machine and described another of transmission detectors separation check two of the target to be checked in channel
Side, the transmission detectors are arranged to I shape or L shape.
10. compound inspection equipment according to claim 1, wherein
The compound inspection equipment is open or enclosed.
11. a kind of compound inspection equipment, including the first inspection channel, the second inspection channel, setting check channel described first
An X-ray emitter and corresponding detector between second inspection channel,
It is characterized in that, the X-ray emitter includes:
First X-ray tube and flying-spot scanner mechanism are configured to issue X-ray pencil beam, and the X-ray pencil beam is suitable for
Check that described first, the target to be checked in channel carries out back scattering scanning；And
Second X-ray tube and front collimation device, be configured to issue X-ray fladellum, the X-ray fladellum be suitable for pair
Described second checks that the target to be checked in channel carries out transmission scan.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820699551.5U CN208607165U (en) | 2018-05-10 | 2018-05-10 | Compound inspection equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820699551.5U CN208607165U (en) | 2018-05-10 | 2018-05-10 | Compound inspection equipment |
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| CN208607165U true CN208607165U (en) | 2019-03-15 |
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| CN201820699551.5U Active CN208607165U (en) | 2018-05-10 | 2018-05-10 | Compound inspection equipment |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108426899A (en) * | 2018-05-10 | 2018-08-21 | 同方威视技术股份有限公司 | Compound inspection equipment and compound inspection method |
| WO2019214724A1 (en) * | 2018-05-10 | 2019-11-14 | 同方威视技术股份有限公司 | X-ray generator for hybrid scanning, hybrid examination apparatus, and examination method |
-
2018
- 2018-05-10 CN CN201820699551.5U patent/CN208607165U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108426899A (en) * | 2018-05-10 | 2018-08-21 | 同方威视技术股份有限公司 | Compound inspection equipment and compound inspection method |
| WO2019214724A1 (en) * | 2018-05-10 | 2019-11-14 | 同方威视技术股份有限公司 | X-ray generator for hybrid scanning, hybrid examination apparatus, and examination method |
| US11467105B2 (en) | 2018-05-10 | 2022-10-11 | Nuctech Company Limited | Combined scanning x-ray generator, composite inspection apparatus, and inspection method for hybrid |
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