CN208477016U - A kind of circuit of multichannel resistance measurement - Google Patents
A kind of circuit of multichannel resistance measurement Download PDFInfo
- Publication number
- CN208477016U CN208477016U CN201821204555.8U CN201821204555U CN208477016U CN 208477016 U CN208477016 U CN 208477016U CN 201821204555 U CN201821204555 U CN 201821204555U CN 208477016 U CN208477016 U CN 208477016U
- Authority
- CN
- China
- Prior art keywords
- multichannel
- oxide
- semiconductor
- circuit
- adc
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
Abstract
The utility model relates to a kind of circuits of multichannel resistance measurement, which is characterized in that including MCU, ADC, DAC, instrument amplifier, current-limiting resistance R, constant-current source metal-oxide-semiconductor, channel switching metal-oxide-semiconductor, simulant electronic switch and TP calibrating terminal;Described ADC, DAC are connect with the MCU, and the constant-current source metal-oxide-semiconductor is connect respectively with the current-limiting resistance R, the DAC and channel switching metal-oxide-semiconductor connection;The TP calibrating terminal switches metal-oxide-semiconductor with the channel and the simulant electronic switch is connect;The instrument amplifier is connect with the simulant electronic switch and the ADC.The utility model realizes multichannel resistance test, and at low cost;It can be applied to various multichannel resistance test scenes, improve practicability.
Description
Technical field
The utility model relates to resistance measurement fields, more specifically refer to a kind of circuit of multichannel resistance measurement.
Background technique
In today of scientific and technical high development, Modern Precision Measurement Technology plays a national development particularly significant
Effect.If being difficult to design and manufacture out the product of function admirable, more talking without advanced measuring technique and measurement means
The not upper modern high-new sophisticated technology of development, therefore, each industrially developed country of the world all takes much count of and develops modern precision measurement
Technology.
Existing, resistance measurement is single-path testing mostly, is unable to satisfy the resistance test scene applied to various wire rods etc.
In;Even if there is multichannel resistance measurement, still, test complex and costly.
Utility model content
The purpose of the utility model is to overcome the defects of the prior art, provide a kind of circuit of multichannel resistance measurement.
To achieve the above object, the utility model uses following technical scheme:
A kind of circuit of multichannel resistance measurement, including MCU, ADC, DAC, instrument amplifier, current-limiting resistance R, constant-current source
Metal-oxide-semiconductor, channel switching metal-oxide-semiconductor, simulant electronic switch and TP calibrating terminal;Described ADC, DAC are connect with the MCU, institute
State constant-current source metal-oxide-semiconductor connect respectively with the current-limiting resistance R, the DAC and the channel switching metal-oxide-semiconductor connection;The TP is surveyed
Examination terminal switches metal-oxide-semiconductor with the channel and the simulant electronic switch is connect;The instrument amplifier and the simulation electronic
Switch is connected with the ADC.
Its further technical solution are as follows: the model STM32F407 of the MCU is completed for the control and processing of data
Control to the ADC and DAC, and the switching of measurement and sampling channel.
Its further technical solution are as follows: the model AD5761R of the DAC is controlled for exporting stable voltage signal
The size of current of the constant-current source metal-oxide-semiconductor;The constant-current source metal-oxide-semiconductor, for generating constant-current source;The current-limiting resistance R, for pair
Constant-current source carries out current limliting.
Its further technical solution are as follows: the channel switches metal-oxide-semiconductor, for realizing the measurement of multichannel.
Its further technical solution are as follows: the simulant electronic switch switches for sampling to multichannel voltage, by described
MCU switches over control.
Its further technical solution are as follows: the quantity of the multichannel is 2-6.
Its further technical solution are as follows: the instrument amplifier for amplifying sampled voltage signal, and is sent to
The ADC is sampled.
Its further technical solution are as follows: the model ADS1115 of the ADC, for the both end voltage to measured resistance into
Row sampling.
Its further technical solution are as follows: the precision of the sampling is more than or equal to 16bit.
Its further technical solution are as follows: the TP calibrating terminal includes TP+ and TP-;Test the both ends TP+ and TP-
Test voltage is transmitted to the instrument amplifier and amplified by voltage, is then delivered to the ADC and is carried out sampling analysis.
The beneficial effect of the utility model compared with prior art is: realizing multichannel resistance test, and at low cost;It can answer
For various multichannel resistance test scenes, practicability is improved.
The utility model is further described in the following with reference to the drawings and specific embodiments.
Detailed description of the invention
Fig. 1 is the block diagram of the circuit of multichannel resistance measurement;
Fig. 2 is the schematic diagram of constant-current source circuit;
Fig. 3 is the circuit diagram of current-limiting resistance R;
Fig. 4 is the circuit diagram of constant-current source metal-oxide-semiconductor;
Fig. 5 is the circuit diagram of TP calibrating terminal;
Fig. 6 is the circuit diagram of simulant electronic switch;
Fig. 7 is the circuit diagram of simulant electronic switch;
Fig. 8 is the circuit diagram of instrument amplifier and ADC;
Fig. 9 is the circuit diagram of instrument amplifier.
Specific embodiment
In order to more fully understand the technology contents of the utility model, combined with specific embodiments below to the skill of the utility model
Art scheme is further described and illustrates, but not limited to this.
Such as Fig. 1 to specific embodiment shown in Fig. 9, the utility model discloses a kind of circuit of multichannel resistance measurement,
Including MCU, ADC, DAC, instrument amplifier, current-limiting resistance R, constant-current source metal-oxide-semiconductor, channel switching metal-oxide-semiconductor, simulant electronic switch,
And TP calibrating terminal;ADC, DAC are connect with MCU, and constant-current source metal-oxide-semiconductor is connect respectively with current-limiting resistance R, DAC and channel is cut
Change metal-oxide-semiconductor connection;TP calibrating terminal switches metal-oxide-semiconductor with channel and simulant electronic switch is connect;Instrument amplifier and simulation electronic
Switch is connected with ADC.
Specifically, as shown in Figure 1, the model STM32F407 of MCU, is the core of entire circuit, the control for data
And processing, the main control completed to ADC and DAC, and the switching of measurement and sampling channel.
Wherein, the model AD5761R of DAC controls the electric current of constant-current source metal-oxide-semiconductor for exporting stable voltage signal
Size;Constant-current source metal-oxide-semiconductor, for generating constant-current source;Current-limiting resistance R, for carrying out current limliting to constant-current source.
Wherein, channel switches metal-oxide-semiconductor, for realizing the measurement of multichannel;Simulant electronic switch, for multichannel voltage
Sampling switching, switches over control by MCU.
Further, the number of channels of channel switching metal-oxide-semiconductor and simulant electronic switch can carry out spirit according to actual needs
Selection living.
Further, in the present embodiment, the quantity of multichannel is 2-6.
Wherein, instrument amplifier for amplifying sampled voltage signal, and is sent to ADC and is sampled.
Wherein, the model ADS1115 of ADC is mainly used for sampling the both end voltage of measured resistance.
Further, the precision of sampling is more than or equal to 16bit.
Wherein, TP calibrating terminal includes TP+ and TP-;The voltage for testing the both ends TP+ and TP-, is transmitted to instrument for test voltage
Table amplifier amplifies, and is then delivered to ADC and carries out sampling analysis;When metal-oxide-semiconductor once opening, just there is electric current to pass through tested electricity
It hinders to ground, forms a current loop, the voltage U at the both ends TP+ and TP- is sent to instrument amplifier and amplifies, and is then delivered to ADC
Sampling analysis.
Realize that the impedance to different wire rods is surveyed it is possible to further connect different connectors according to different testing requirements
Examination, such as TYPE-C.
The test philosophy of the utility model is as follows: assuming that measured resistance both ends end voltage is U1, flowing through electric current is Id, then
It has;
Formula 1:U1=I*Rt (Rt is product to be tested impedance)
Formula 2:U2=U1*Au (Au is amplifier magnification ratio)
Because electric current I can control DAC voltage by MCU and be calculated, the electricity of ADC is inputted by reading instrument amplifier
Pressure value U2, so that it may calculate the resistance R of product to be tested.
Specifically, as shown in Fig. 2 to Fig. 9, the specific implementation circuit of the utility model, circuit theory are described as follows:
As shown in Fig. 2, LDO power supply provides the reference power supply of stable 2.5V, by current-limiting resistance R1107, Q1107,
DAC and amplifier form constant-current source circuit;DAC output voltage, control Q1107 switch, it is ensured that electric current is constant are controlled by MCU.
Fig. 3 is the circuit diagram of current-limiting resistance R.
The circuit diagram of constant-current source metal-oxide-semiconductor as shown in Figure 4, Q1102-Q1106 are Measurement channel switching control MOS,
The switching of corresponding Measurement channel is completed by MCU control MOS.
The circuit diagram of TP calibrating terminal as shown in Figure 5;In the present embodiment, TP calibrating terminal uses TYPE-C connection
Device, CON1101, CON1102 are TYPE-C connector, for realizing four-wire system test.
The circuit diagram of simulant electronic switch as shown in Figure 6 to 7, U1101, U1102 are simulant electronic switch, are used for
Tested channel sample voltage switching control, operates control by MCU.
The circuit diagram of instrument amplifier and ADC as shown in Fig. 8 to Fig. 9, U1104, U1105 be instrument amplifier and
ADC, for being measured channel voltage measurement.
Wherein, for needing to measure the scene of multichannel resistance, metal-oxide-semiconductor is switched by MCU control channel and is made current flow through pair
It should be tested channel, while controlling the voltage at the corresponding tested both ends channel TP of simulant electronic switch sampling by MCU, so that it may be completed
The resistance measurement of corresponding channel.
The utility model uses 2 grades of MOS circuits, and level-one MOS is controlled for constant-current source, and another grade of MOS is for realizing multichannel
The channel of measurement switches, and metal-oxide-semiconductor through-current capability is strong, can satisfy the current needs of the resistance test of different scenes;Using simulation
Electronic switch switches for realizing the sampled voltage of the corresponding channel of multichannel measurement;TP point is replaced triumphant using connectors such as TYPE-C
Your literary test clip can realize the four-wire ohm measurement to various wire rods;Multichannel resistance test is realized, and at low cost;It can be applied to
Various multichannel resistance test scenes, improve practicability.
The above-mentioned technology contents that the utility model is only further illustrated with embodiment, in order to which reader is easier to understand,
But the embodiments of the present invention is not represented is only limitted to this, any technology done according to the utility model extends or recreation,
By the protection of the utility model.The protection scope of the utility model is subject to claims.
Claims (10)
1. a kind of circuit of multichannel resistance measurement, which is characterized in that including MCU, ADC, DAC, instrument amplifier, current-limiting resistance
R, constant-current source metal-oxide-semiconductor, channel switching metal-oxide-semiconductor, simulant electronic switch and TP calibrating terminal;Described ADC, DAC with it is described
MCU connection, the constant-current source metal-oxide-semiconductor is connect with the current-limiting resistance R, the DAC respectively and channel switching metal-oxide-semiconductor connects
It connects;The TP calibrating terminal switches metal-oxide-semiconductor with the channel and the simulant electronic switch is connect;The instrument amplifier and institute
Simulant electronic switch is stated to connect with the ADC.
2. a kind of circuit of multichannel resistance measurement according to claim 1, which is characterized in that the model of the MCU
STM32F407 completes the control to the ADC and DAC, and measurement and sampling channel for the control and processing of data
Switching.
3. a kind of circuit of multichannel resistance measurement according to claim 1, which is characterized in that the model of the DAC
AD5761R controls the size of current of the constant-current source metal-oxide-semiconductor for exporting stable voltage signal;The constant-current source metal-oxide-semiconductor,
For generating constant-current source;The current-limiting resistance R, for carrying out current limliting to constant-current source.
4. a kind of circuit of multichannel resistance measurement according to claim 1, which is characterized in that the channel switches MOS
Pipe, for realizing the measurement of multichannel.
5. a kind of circuit of multichannel resistance measurement according to claim 4, which is characterized in that the simulation electronic is opened
It closes, switches for being sampled to multichannel voltage, control is switched over by the MCU.
6. a kind of circuit of multichannel resistance measurement according to claim 5, which is characterized in that the quantity of the multichannel
For 2-6.
7. a kind of circuit of multichannel resistance measurement according to claim 1, which is characterized in that the instrument amplifier,
For amplifying sampled voltage signal, and it is sent to the ADC and is sampled.
8. a kind of circuit of multichannel resistance measurement according to claim 1, which is characterized in that the model of the ADC
ADS1115 is sampled for the both end voltage to measured resistance.
9. a kind of circuit of multichannel resistance measurement according to claim 8, which is characterized in that the precision of the sampling is big
In equal to 16bit.
10. a kind of circuit of multichannel resistance measurement according to claim 1, which is characterized in that the TP calibrating terminal
Including TP+ and TP-;Test voltage is transmitted to the instrument amplifier and put by the voltage for testing the both ends TP+ and TP-
Greatly, it is then delivered to the ADC and carries out sampling analysis.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201821204555.8U CN208477016U (en) | 2018-07-27 | 2018-07-27 | A kind of circuit of multichannel resistance measurement |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201821204555.8U CN208477016U (en) | 2018-07-27 | 2018-07-27 | A kind of circuit of multichannel resistance measurement |
Publications (1)
Publication Number | Publication Date |
---|---|
CN208477016U true CN208477016U (en) | 2019-02-05 |
Family
ID=65209151
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201821204555.8U Active CN208477016U (en) | 2018-07-27 | 2018-07-27 | A kind of circuit of multichannel resistance measurement |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN208477016U (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110376947A (en) * | 2019-07-26 | 2019-10-25 | 浙江中控技术股份有限公司 | A kind of multi channel signals switching circuit |
CN113791281A (en) * | 2021-08-24 | 2021-12-14 | 西安航天动力试验技术研究所 | Full resistance detection system of multichannel electric detonator control circuit |
-
2018
- 2018-07-27 CN CN201821204555.8U patent/CN208477016U/en active Active
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110376947A (en) * | 2019-07-26 | 2019-10-25 | 浙江中控技术股份有限公司 | A kind of multi channel signals switching circuit |
CN110376947B (en) * | 2019-07-26 | 2021-06-22 | 浙江中控技术股份有限公司 | Multichannel signal switching circuit |
CN113791281A (en) * | 2021-08-24 | 2021-12-14 | 西安航天动力试验技术研究所 | Full resistance detection system of multichannel electric detonator control circuit |
CN113791281B (en) * | 2021-08-24 | 2023-11-24 | 西安航天动力试验技术研究所 | Multichannel electric detonator control loop total resistance detection system |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN101119115B (en) | Multi-channel A/D conversion device and method | |
CN104360165A (en) | Multichannel resistance measuring device | |
CN208477016U (en) | A kind of circuit of multichannel resistance measurement | |
CN201662599U (en) | Photoelectric coupler detection device | |
CN103338429A (en) | Device and method for measuring impedance of loudspeaker | |
CN106990295A (en) | A kind of resistance measuring instrument and resistance measurement method | |
CN2874514Y (en) | Full automatic resistance corrector | |
CN2938573Y (en) | Multi-channel analog-digital conversion device | |
CN202836925U (en) | Multi-channel optical-add return loss tester | |
CN109031075A (en) | A kind of multi-thread core insulation automatic tester and system | |
CN201993457U (en) | Automatic calibrating apparatus for shunt | |
CN105785131A (en) | Testing device and method for low ohm chip resistors | |
CN202582775U (en) | Temperature measuring circuit | |
CN208921826U (en) | A kind of multi-thread core insulation automatic tester and system | |
CN202956211U (en) | Temperature rise test system | |
CN201421653Y (en) | Wireless data acquisition unit | |
CN207516439U (en) | Alternating current acquisition module and detection device | |
CN211123024U (en) | PCB branch current detection device and PCB detection system | |
CN103675470A (en) | N*M dimension resistor network measuring device | |
CN201548652U (en) | Polarity testing device of current transformer | |
CN113219316A (en) | Triode amplification factor test circuit based on negative feedback | |
CN201903576U (en) | Power cable recognition device based on soft sensor | |
CN214277239U (en) | Multi-path temperature measuring circuit of electric energy quality device | |
CN205982390U (en) | Adopt linear optical coupling to carry out device of high voltage DC sampling | |
CN206313997U (en) | Display device board exports audio detection device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
GR01 | Patent grant | ||
GR01 | Patent grant |