CN208383936U - A kind of circuit yoke plate test bracket - Google Patents
A kind of circuit yoke plate test bracket Download PDFInfo
- Publication number
- CN208383936U CN208383936U CN201821165734.5U CN201821165734U CN208383936U CN 208383936 U CN208383936 U CN 208383936U CN 201821165734 U CN201821165734 U CN 201821165734U CN 208383936 U CN208383936 U CN 208383936U
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- circuit
- test
- yoke plate
- plate
- veneer
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Abstract
The utility model discloses a kind of circuit yoke plate test brackets, including pedestal, the side of the pedestal upper end is fixedly installed with vertical plate, pressing handle is hinged on front side of the vertical plate, the lower end of the pressing handle is connected with arc drive rod, the one end of the arc drive rod far from pressing handle is connected with push rod by free bearing, and the push rod is equipped with crossover sub far from one end of free bearing.The utility model using the card slot in yoke plate circuit carriers, carries out mechanical location one by one to the veneer circuit on yoke plate circuit and switches, so that tested single board and single circuit plate is tested probe and be accurately positioned due to testing probe structure using single circuit plate.This structure compares existing product, due to the problem of single-board testing probe quantity is few, and there is no poor contacts, substantially increase the efficiency of validity test, and channel selecting is carried out to the veneer on tested yoke plate circuit without control circuit, so that entire test bracket is more succinct effective, cost is lower.
Description
Technical field
The utility model relates to circuit test instrument fields, and in particular to a kind of circuit yoke plate test bracket.
Background technique
In-circiut tester, abbreviation ICT, i.e. automatic on-line tester are the PCBA of hyundai electronics enterprise indispensability
The test equipment of (Printed-Circuit Board Assembly, printed circuit-board assembly) production, test equipment pass through needle
Probe on bed test fixture or IC fixture is aligned with the measuring point on circuit-under-test plate, is applied by probe to circuit-under-test plate and is surveyed
Trial signal, then measurement response, the correctness that the component on test board and conducting wire connect one by one, also referred to as interior circuit test
Method.The purpose of test is to prevent repeated problem to make more qualified product, reduces product repair rate, improves effect
Rate.In the prior art, since the area of some circuit boards is smaller, many small circuit boards can be prefabricated into circuit yoke plate into
Row test carries out channel switching to the single circuit board on yoke plate circuit using the control circuit on test bracket, in this way can be with
Working efficiency is improved, but there is also some shortcomings and defect:
1, due to testing probe using circuit yoke plate, the stylus of each veneer is pressed in test in circuit-under-test plate
On, stylus quantity is too many, causes measuring point poor contact, can not validity test；
2, it needs control circuit to carry out channel selecting to the veneer on tested yoke plate circuit, tests one by one, control circuit
Structure is complicated, at high cost.
Utility model content
In view of the foregoing deficiencies of prior art, the purpose of this utility model is to provide a kind of circuit yoke plate test branch
Frame causes measuring point poor contact for solving number of probes in the prior art more, and controling circuit structure is complicated, at high cost asks
Topic.
In order to achieve the above objects and other related objects, the utility model provides a kind of circuit yoke plate test bracket, including
Pedestal, the side of the pedestal upper end are fixedly installed with vertical plate, and pressing handle, the pressing hand are hinged on front side of the vertical plate
The lower end of handle is connected with arc drive rod, and the arc drive rod is connected with by free bearing far from one end of pressing handle and is pushed away
Bar, the push rod are equipped with crossover sub far from one end of free bearing, and the front side of the crossover sub is equipped with test probe fixed plate, institute
It states through test probe is equipped in test probe fixed plate, the root of the test probe passes through test signal cable connecting test
System, the pedestal upper end are fixedly installed with yoke plate circuit carriers, offer several positioning cards in the yoke plate circuit carriers
Slot, each locating groove are mounted on veneer circuit, are interconnected to form tested yoke plate between the adjacent veneer circuit
Circuit.
Preferably, the veneer circuit is equipped with and the test one-to-one test point of probe.
Preferably, the position of the veneer circuit can carry out free switching by locating groove.
Preferably, the shape of the yoke plate circuit carriers matches with tested yoke plate circuit.
Compared with prior art, the utility model has the beneficial effects that due to testing probe structure, benefit using single circuit plate
With the card slot in yoke plate circuit carriers, mechanical location one by one is carried out to the veneer circuit on yoke plate circuit and is switched, tested single board is made
It is accurately positioned with single circuit plate test probe.This structure compares existing product, since single-board testing probe quantity is few, no
There are problems that poor contact, substantially increases the efficiency of validity test, and without control circuit on tested yoke plate circuit
Veneer carry out channel selecting so that entire test bracket more it is succinct effectively, cost is lower.
Detailed description of the invention
The utility model is described in further detail with specific embodiment with reference to the accompanying drawing.
Fig. 1 is a kind of structural schematic diagram of circuit yoke plate test bracket provided by the utility model；
Fig. 2 is the structural schematic diagram of the veneer circuit in the utility model.
Wherein, appended drawing reference is described as follows: pedestal 1, pressing handle 3, arc drive rod 4, push rod 5, turns vertical plate 2
Changing-over head 6, test probe 8, test signal cable 9, test macro 10, yoke plate circuit carriers 11, is determined at test probe fixed plate 7
Position card slot 12, veneer circuit 13, test point 14, tested yoke plate circuit 15.
Specific embodiment
Embodiments of the present invention are illustrated by particular specific embodiment below, those skilled in the art can be by this explanation
Content disclosed by book easily understands other advantages and effect of the utility model.
Please refer to Fig. 1-2.It should be clear that this specification structure depicted in this specification institute accompanying drawings, ratio, size etc., only to match
The revealed content of specification is closed, so that those skilled in the art understands and reads, being not intended to limit the utility model can
The qualifications of implementation, therefore do not have technical essential meaning, the tune of the modification of any structure, the change of proportionate relationship or size
It is whole, in the case where not influencing the effect of the utility model can be generated and the purpose that can reach, it should all still fall in the utility model institute
The technology contents of announcement obtain in the range of capable of covering.Meanwhile in this specification it is cited as "upper", "lower", "left", "right",
The term of " centre " and " one " etc. is merely convenient to being illustrated for narration, rather than to limit the enforceable range of the utility model,
Its relativeness is altered or modified, under the content of no substantial changes in technology, when being also considered as the enforceable scope of the utility model.
Refering to fig. 1-2, the utility model provides a kind of circuit yoke plate test bracket, including pedestal 1, and the one of 1 upper end of pedestal
Side is fixedly installed with vertical plate 2, and the front side of vertical plate 2 is hinged with pressing handle 3, and the lower end of pressing handle 3 is connected with arc drive rod
4, arc drive rod 4 is connected with push rod 5 by free bearing far from one end of pressing handle 3, and push rod 5 is set far from one end of free bearing
There is crossover sub 6, the front side of crossover sub 6 is equipped with test probe fixed plate 7, tests in probe fixed plate 7 through equipped with test
Pressing handle 3 is pressed or lifted to probe 8 when needing to test circuit, and 4 meeting of arc drive rod is so that test probe is solid
Probe 8 is up and down and latched position for fixed board 7 and test, and the root of test probe 8 passes through test 9 connecting test of signal cable
System 10, by test macro 10 detect veneer circuit 13 whether function is normal, test probe 8 be it is flexible, when press by
After pressing handle 3, head can be contacted with the test point 14 on veneer circuit 13, and 1 upper end of pedestal is fixedly installed with yoke plate electricity
Road bracket 11 offers several locating grooves 12, Mei Geding for installing tested yoke plate circuit 15 in yoke plate circuit carriers 11
Position card slot 12 is mounted on veneer circuit 13, and the position of veneer circuit 13 can carry out free switching by locating groove 12, and
Ensure test point 14 and test the accurate positioning of probe 8, is interconnected to form tested yoke plate circuit between adjacent veneer circuit 13
15。
Veneer circuit 13 is equipped with and the test one-to-one test point 14 of probe 8.
The shape of yoke plate circuit carriers 11 matches with tested yoke plate circuit 15.
To sum up, the utility model is due to testing probe structure using single circuit plate, using the card slot in yoke plate circuit carriers,
Mechanical location one by one is carried out to the veneer circuit on yoke plate circuit to switch, and so that tested single board and single circuit plate is tested probe and is carried out standard
Determine position.This structure compares existing product, due to the problem of single-board testing probe quantity is few, and there is no poor contacts, significantly
The efficiency of validity test is improved, and channel selecting is carried out to the veneer on tested yoke plate circuit without control circuit, so that
Entire test bracket is more succinct effective, and cost is lower.So the utility model effectively overcomes various shortcoming in the prior art
And there is high industrial utilization value.
The above-described embodiments merely illustrate the principles and effects of the present invention, and is not intended to limit the present invention.It is any ripe
The personage for knowing this technology all without departing from the spirit and scope of the present invention, carries out modifications and changes to above-described embodiment.Cause
This, institute is complete without departing from the spirit and technical ideas disclosed in the present invention by those of ordinary skill in the art such as
At all equivalent modifications or change, should be covered by the claims of the present invention.
Claims (4)
1. a kind of circuit yoke plate test bracket, which is characterized in that including pedestal (1), the fixed peace in the side of pedestal (1) upper end
Equipped with vertical plate (2), pressing handle (3) is hinged on front side of the vertical plate (2), the lower end of pressing handle (3) is connected with arc
Shape drive rod (4), the arc drive rod (4) are connected with push rod (5) by free bearing far from one end of pressing handle (3),
The push rod (5) is equipped with crossover sub (6) far from one end of free bearing, and it is solid that the front side of the crossover sub (6) is equipped with test probe
Fixed board (7), through test probe (8) is equipped on the test probe fixed plate (7), the root of test probe (8) passes through
Signal cable (9) the connecting test system (10) of test, pedestal (1) upper end is fixedly installed with yoke plate circuit carriers (11), institute
It states in yoke plate circuit carriers (11) and offers several locating grooves (12), each locating groove (12) is mounted on veneer
Circuit (13) is interconnected to form tested yoke plate circuit (15) between the adjacent veneer circuit (13).
2. a kind of circuit yoke plate test bracket according to claim 1, it is characterised in that: set on the veneer circuit (13)
Have and the one-to-one test point (14) of test probe (8).
3. a kind of circuit yoke plate test bracket according to claim 1, it is characterised in that: the position of the veneer circuit (13)
Free switching can be carried out by locating groove (12) by setting.
4. a kind of circuit yoke plate test bracket according to claim 1, it is characterised in that: the yoke plate circuit carriers (11)
Shape match with tested yoke plate circuit (15).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821165734.5U CN208383936U (en) | 2018-07-23 | 2018-07-23 | A kind of circuit yoke plate test bracket |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821165734.5U CN208383936U (en) | 2018-07-23 | 2018-07-23 | A kind of circuit yoke plate test bracket |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208383936U true CN208383936U (en) | 2019-01-15 |
Family
ID=64961296
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201821165734.5U Active CN208383936U (en) | 2018-07-23 | 2018-07-23 | A kind of circuit yoke plate test bracket |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN208383936U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114252660A (en) * | 2021-12-03 | 2022-03-29 | 苏州清越光电科技股份有限公司 | Testing device |
-
2018
- 2018-07-23 CN CN201821165734.5U patent/CN208383936U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114252660A (en) * | 2021-12-03 | 2022-03-29 | 苏州清越光电科技股份有限公司 | Testing device |
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